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Journal articles on the topic 'Noncontact atomic force microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 13 February 2022

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1

Schwarz, Udo D. "Noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 3 (February 29, 2012): 172–73. http://dx.doi.org/10.3762/bjnano.3.17.

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2

SASAHARA, Akira, Hiroshi UETSUKA, Taka-aki ISHIBASHI, and Hiroshi ONISHI. "Noncontact Atomic Force Microscopy. Noncontact Atomic Force Microscope Topography of Adsorbed Organic Molecules." Hyomen Kagaku 23, no. 3 (2002): 186–93. http://dx.doi.org/10.1380/jsssj.23.186.

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3

Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy II." Beilstein Journal of Nanotechnology 5 (March 12, 2014): 289–90. http://dx.doi.org/10.3762/bjnano.5.31.

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4

Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy III." Beilstein Journal of Nanotechnology 7 (June 30, 2016): 946–47. http://dx.doi.org/10.3762/bjnano.7.86.

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5

Müller, F., A.-D. Müller, M. Hietschold, and S. Kämmer. "Detecting electrical forces in noncontact atomic force microscopy." Measurement Science and Technology 9, no. 5 (1998): 734–38. http://dx.doi.org/10.1088/0957-0233/9/5/002.

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6

Pérez, Rubén, Ricardo García, and Udo Schwarz. "High-resolution noncontact atomic force microscopy." Nanotechnology 20, no. 26 (2009): 260201. http://dx.doi.org/10.1088/0957-4484/20/26/260201.

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7

Seo, Yongho, Hwansung Choe, and Wonho Jhe. "Atomic-resolution noncontact atomic force microscopy in air." Applied Physics Letters 83, no. 9 (2003): 1860–62. http://dx.doi.org/10.1063/1.1606493.

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8

Sugawara, Yasuhiro, Hitoshi Ueyama, Takayuki Uchihashi, et al. "True atomic resolution imaging with noncontact atomic force microscopy." Applied Surface Science 113-114 (April 1997): 364–70. http://dx.doi.org/10.1016/s0169-4332(96)00877-x.

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9

Sasaki, Naruo, and Masaru Tsukada. "Effect of Microscopic Nonconservative Process on Noncontact Atomic Force Microscopy." Japanese Journal of Applied Physics 39, Part 2, No. 12B (2000): L1334—L1337. http://dx.doi.org/10.1143/jjap.39.l1334.

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10

Zhong, Qigang, Xuechao Li, Haiming Zhang, and Lifeng Chi. "Noncontact atomic force microscopy: Bond imaging and beyond." Surface Science Reports 75, no. 4 (2020): 100509. http://dx.doi.org/10.1016/j.surfrep.2020.100509.

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11

Zypman, Fredy. "Internal damping for noncontact atomic force microscopy cantilevers." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 28, no. 3 (2010): C4E24—C4E27. http://dx.doi.org/10.1116/1.3374736.

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12

Sasahara, Akira, Hiroshi Uetsuka, and Hiroshi Onishi. "Single-Molecule Analysis by Noncontact Atomic Force Microscopy." Journal of Physical Chemistry B 105, no. 1 (2001): 1–4. http://dx.doi.org/10.1021/jp003045v.

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13

Kolodziej, J. J., B. Such, M. Goryl, F. Krok, P. Piatkowski, and M. Szymonski. "Surface structure investigations using noncontact atomic force microscopy." Applied Surface Science 252, no. 21 (2006): 7614–23. http://dx.doi.org/10.1016/j.apsusc.2006.03.054.

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14

Rensen, W. H. J., N. F. van Hulst, A. G. T. Ruiter, and P. E. West. "Atomic steps with tuning-fork-based noncontact atomic force microscopy." Applied Physics Letters 75, no. 11 (1999): 1640–42. http://dx.doi.org/10.1063/1.124780.

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15

Oral, Ahmet, Ralph A. Grimble, H. Özgür Özer, Peter M. Hoffmann, and John B. Pethica. "Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy." Applied Physics Letters 79, no. 12 (2001): 1915–17. http://dx.doi.org/10.1063/1.1389785.

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16

Miyahara, Y., T. Fujii, S. Watanabe, et al. "Lead zirconate titanate cantilever for noncontact atomic force microscopy." Applied Surface Science 140, no. 3-4 (1999): 428–31. http://dx.doi.org/10.1016/s0169-4332(98)00567-4.

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17

Burson, Kristen M., Mahito Yamamoto, and William G. Cullen. "Modeling noncontact atomic force microscopy resolution on corrugated surfaces." Beilstein Journal of Nanotechnology 3 (March 13, 2012): 230–37. http://dx.doi.org/10.3762/bjnano.3.26.

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Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~3

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18

Kang, Min, and Makoto Kaburagi. "Effect of temperature on noncontact atomic force microscopy images." Applied Surface Science 188, no. 3-4 (2002): 335–40. http://dx.doi.org/10.1016/s0169-4332(01)00947-3.

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19

Tsukada, M., N. Watanabe, M. Harada, and K. Tagami. "Theoretical simulation of noncontact atomic force microscopy in liquids." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 28, no. 3 (2010): C4C1—C4C4. http://dx.doi.org/10.1116/1.3430541.

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20

Martin, M., L. Roschier, P. Hakonen, et al. "Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy." Applied Physics Letters 73, no. 11 (1998): 1505–7. http://dx.doi.org/10.1063/1.122187.

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21

SASAHARA, Akira, and Hiroshi ONISHI. "Application of Noncontact Atomic Force Microscopy to Catalyst Research." Hyomen Kagaku 27, no. 6 (2006): 348–53. http://dx.doi.org/10.1380/jsssj.27.348.

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22

Mizuno, Taichi, Hirotaka Hosoi, Agus Subagyo, et al. "Noncontact Atomic Force Microscopy Observation of Fe3O4(001) Surface." Japanese Journal of Applied Physics 51, no. 8S3 (2012): 08KB03. http://dx.doi.org/10.7567/jjap.51.08kb03.

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23

Sasaki, Naruo, and Masaru Tsukada. "New Method for Noncontact Atomic Force Microscopy Image Simulations." Japanese Journal of Applied Physics 38, Part 1, No. 1A (1999): 192–94. http://dx.doi.org/10.1143/jjap.38.192.

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24

Leggett, Graham. "Book review: Noncontact atomic force microscopy (nanoscience and technology)." Journal of Analytical Atomic Spectrometry 19, no. 5 (2004): 16N. http://dx.doi.org/10.1039/b405513f.

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25

Sasaki, N., M. Tsukada, R. Tamura, K. Abe, and N. Sato. "Dynamics of the cantilever in noncontact atomic force microscopy." Applied Physics A: Materials Science & Processing 66, no. 7 (1998): S287—S291. http://dx.doi.org/10.1007/s003390051147.

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26

Ueyama, H., Y. Sugawara, and S. Morita. "Stable operation mode for dynamic noncontact atomic force microscopy." Applied Physics A: Materials Science & Processing 66, no. 7 (1998): S295—S297. http://dx.doi.org/10.1007/s003390051149.

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27

Jacobse, Peter, Marc-Etienne Moret, Robertus Klein Gebbink, and Ingmar Swart. "Tracking On-Surface Chemistry with Atomic Precision." Synlett 28, no. 19 (2017): 2509–16. http://dx.doi.org/10.1055/s-0036-1590867.

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The field of on-surface synthesis has seen a tremendous development in the past decade as an exciting new methodology towards atomically well-defined nanostructures. A strong driving force in this respect is its inherent compatibility with scanning probe techniques, which allows one to ‘view’ the reactants and products at the single-molecule level. In this article, we review the ability of noncontact atomic force microscopy to study on-surface chemical reactions with atomic precision. We highlight recent advances in using noncontact atomic force microscopy to obtain mechanistic insight into re

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28

FUKUI, Ken-ichi, and Yasuhiro IWASAWA. "Noncontact Atomic Force Microscopy. Dynamic Behavior of Atoms and Molecules on TiO2(110) and CeO2(111) Observed by Noncontact Atomic Force Microscopy." Hyomen Kagaku 23, no. 3 (2002): 141–48. http://dx.doi.org/10.1380/jsssj.23.141.

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29

MORITA, Seizo, Yoshiaki SUGIMOTO, and Masayuki ABE. "Research and Development of Noncontact Atomic Force Microscopy with Atomic Resolution." Hyomen Kagaku 31, no. 1 (2010): 19–24. http://dx.doi.org/10.1380/jsssj.31.19.

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30

Caciuc, V., and H. Hölscher. "Ab initiosimulation of atomic-scale imaging in noncontact atomic force microscopy." Nanotechnology 20, no. 26 (2009): 264006. http://dx.doi.org/10.1088/0957-4484/20/26/264006.

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31

Abe, Masayuki, Yasuhiro Sugawara, Yasuyuki Hara, Kazuyoshi Sawada, and Seizo Morita. "Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy." Japanese Journal of Applied Physics 37, Part 2, No. 2A (1998): L167—L169. http://dx.doi.org/10.1143/jjap.37.l167.

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32

Patera, Laerte L., Zhiyu Zou, Carlo Dri, Cristina Africh, Jascha Repp, and Giovanni Comelli. "Imaging on-surface hierarchical assembly of chiral supramolecular networks." Physical Chemistry Chemical Physics 19, no. 36 (2017): 24605–12. http://dx.doi.org/10.1039/c7cp01341h.

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33

LIU, Meng-Xi, Shi-Chao LI, Ze-Qi ZHA, and Xiao-Hui QIU. "Research Progress and Applications of qPlus Noncontact Atomic Force Microscopy." Acta Physico-Chimica Sinica 33, no. 1 (2017): 183–97. http://dx.doi.org/10.3866/pku.whxb201609282.

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34

SUGAWARA, Yasuhiro, Yoshitaka NAITOH, Masami KAGESHIMA, and Yan Jun LI. "Development of Noncontact Atomic Force Microscopy Operating at Low Temperatures." Journal of the Vacuum Society of Japan 51, no. 12 (2008): 789–95. http://dx.doi.org/10.3131/jvsj2.51.789.

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35

Giessibl, Franz J., and Marco Tortonese. "Self-oscillating mode for frequency modulation noncontact atomic force microscopy." Applied Physics Letters 70, no. 19 (1997): 2529–31. http://dx.doi.org/10.1063/1.118910.

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36

Yang, Kai-Ming, Jen-Yang Chung, Ming-Feng Hsieh, and Deng-Sung Lin. "Apparent Topographic Height Variations Measured by Noncontact Atomic Force Microscopy." Japanese Journal of Applied Physics 46, no. 7A (2007): 4395–402. http://dx.doi.org/10.1143/jjap.46.4395.

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37

Macpherson, Julie V., and Patrick R. Unwin. "Noncontact Electrochemical Imaging with Combined Scanning Electrochemical Atomic Force Microscopy." Analytical Chemistry 73, no. 3 (2001): 550–57. http://dx.doi.org/10.1021/ac001072b.

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38

Aoki, Takaaki, Yoshiyuki Sowa, and Toshio Yanagida. "Noncontact Surface Force Microscopy of Protein Molecules." ChemPhysChem 4, no. 12 (2003): 1361–64. http://dx.doi.org/10.1002/cphc.200300796.

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39

Wilder, Kathryn, Calvin F. Quate, Dennis Adderton, Robert Bernstein, and Virgil Elings. "Noncontact nanolithography using the atomic force microscope." Applied Physics Letters 73, no. 17 (1998): 2527–29. http://dx.doi.org/10.1063/1.122504.

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40

Güthner, Peter. "Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 4 (1996): 2428. http://dx.doi.org/10.1116/1.588873.

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41

Kim, W. J., and U. D. Schwarz. "Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 28, no. 3 (2010): C4A1—C4A7. http://dx.doi.org/10.1116/1.3294709.

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42

YAMADA, Hirofumi. "Noncontact Atomic Force Microscopy. Structures and Electrical Properties of Organic Molecular Films Investigated by Non-contact Atomic Force Microscopy." Hyomen Kagaku 23, no. 3 (2002): 166–77. http://dx.doi.org/10.1380/jsssj.23.166.

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43

Morita, Seizo, and Yasuhiro Sugawara. "Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy." Applied Surface Science 140, no. 3-4 (1999): 406–10. http://dx.doi.org/10.1016/s0169-4332(98)00563-7.

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44

Howland, R. S., D. F. Oot, R. Nowroozi-Esfahani, G. J. Maclay, and P. J. Hesketh. "Non-contact atomic-force microscopy for soft surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 516–17. http://dx.doi.org/10.1017/s0424820100148411.

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The atomic force microscope (AFM) was invented in the mid-1980s, in response to strong interest in the high resolution, real-space surface imaging capabilities of the scanning tunneling microscope (STM). The AFM provides one real benefit that the STM cannot: it is able to image insulating surfaces. As a result, the AFM can operate on a wider variety of samples; it also can image samples in air, where many conductors oxidize rapidly, and in solution. Essentially no surface preparation is necessary. Historically, however, even the AFM has had limitations. Until recently, the contact forces exert

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45

Kishimoto, Shohei, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara. "Study of oxidized Cu(110) surface using noncontact atomic force microscopy." Surface Science 602, no. 13 (2008): 2175–82. http://dx.doi.org/10.1016/j.susc.2008.04.030.

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46

Rasmussen, Morten K., Kristoffer Meinander, Flemming Besenbacher, and Jeppe V. Lauritsen. "Noncontact atomic force microscopy study of the spinel MgAl2O4(111) surface." Beilstein Journal of Nanotechnology 3 (March 6, 2012): 192–97. http://dx.doi.org/10.3762/bjnano.3.21.

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Based on high-resolution noncontact atomic force microscopy (NC-AFM) experiments we reveal a detailed structural model of the polar (111) surface of the insulating ternary metal oxide, MgAl2O4 (spinel). NC-AFM images reveal a 6√3×6√3R30° superstructure on the surface consisting of patches with the original oxygen-terminated MgAl2O4(111) surface interrupted by oxygen-deficient areas. These observations are in accordance with previous theoretical studies, which predict that the polarity of the surface can be compensated by removal of a certain fraction of oxygen atoms. However, instead of isolat

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47

Lübbe, Jannis, Matthias Temmen, Sebastian Rode, Philipp Rahe, Angelika Kühnle, and Michael Reichling. "Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 4 (January 17, 2013): 32–44. http://dx.doi.org/10.3762/bjnano.4.4.

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The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh

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48

Štich, I., J. Tóbik, R. Pérez, K. Terakura, and S. H. Ke. "Tip–surface interactions in noncontact atomic force microscopy on reactive surfaces." Progress in Surface Science 64, no. 3-8 (2000): 179–91. http://dx.doi.org/10.1016/s0079-6816(00)00015-0.

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49

Sasahara, Akira, Hiroshi Uetsuka, Taka-aki Ishibashi, and Hiroshi Onishi. "A needle-like organic molecule imaged by noncontact atomic force microscopy." Applied Surface Science 188, no. 3-4 (2002): 265–71. http://dx.doi.org/10.1016/s0169-4332(01)00936-9.

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50

Müllera, A. D., F. Müllera, J. Middekea, et al. "Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode." Microelectronics Reliability 42, no. 9-11 (2002): 1685–88. http://dx.doi.org/10.1016/s0026-2714(02)00212-3.

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