Journal articles on the topic 'Nonlinear theory of electromigration'
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Hruška, Vlastimil, Jana Svobodová, Martin Beneš, and Bohuslav Gaš. "A nonlinear electrophoretic model for PeakMaster: Part III. Electromigration dispersion in systems that contain a neutral complex-forming agent and a fully charged analyte. Theory." Journal of Chromatography A 1267 (December 2012): 102–8. http://dx.doi.org/10.1016/j.chroma.2012.06.086.
Full textLodder, A. "Electromigration theory unified." Europhysics Letters (EPL) 72, no. 5 (2005): 774–80. http://dx.doi.org/10.1209/epl/i2005-10306-9.
Full textGardner, D. S., J. D. Meindl, and K. C. Saraswat. "Interconnection and electromigration scaling theory." IEEE Transactions on Electron Devices 34, no. 3 (1987): 633–43. http://dx.doi.org/10.1109/t-ed.1987.22974.
Full textChristov, Ivan C. "Nonlinear waves in electromigration dispersion in a capillary." Wave Motion 71 (June 2017): 42–52. http://dx.doi.org/10.1016/j.wavemoti.2016.06.011.
Full textChen, Zhen, and Sandip Ghosal. "The nonlinear electromigration of analytes into confined spaces." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 468, no. 2146 (2012): 3139–52. http://dx.doi.org/10.1098/rspa.2012.0221.
Full textLandauer, Rolf. "Comment on Lodder's “exact” electromigration theory." Solid State Communications 72, no. 9 (1989): 867–68. http://dx.doi.org/10.1016/0038-1098(89)90416-x.
Full textSorbello, Richard S. "Corrections to Lodder's “exact” electromigration theory." Solid State Communications 76, no. 5 (1990): 747–49. http://dx.doi.org/10.1016/0038-1098(90)90129-y.
Full textRous, P. J., T. L. Einstein, and Ellen D. Williams. "Theory of surface electromigration on metals: application to self-electromigration on Cu(111)." Surface Science 315, no. 1-2 (1994): L995—L1002. http://dx.doi.org/10.1016/0039-6028(94)90532-0.
Full textMontemayor-Aldrete, J. A., C. Vázquez-Villanueva, P. Ugalde-Vélez, et al. "Non-equilibrium statistical theory for electromigration damage." Physica A: Statistical Mechanics and its Applications 387, no. 24 (2008): 6115–25. http://dx.doi.org/10.1016/j.physa.2008.06.045.
Full textVerbruggen, A. H. "Fundamental questions in the theory of electromigration." IBM Journal of Research and Development 32, no. 1 (1988): 93–98. http://dx.doi.org/10.1147/rd.321.0093.
Full textKandel, Daniel, and Efthimios Kaxiras. "Microscopic Theory of Electromigration on Semiconductor Surfaces." Physical Review Letters 76, no. 7 (1996): 1114–17. http://dx.doi.org/10.1103/physrevlett.76.1114.
Full textSorbello, Richard S. "Theory of the direct force in electromigration." Physical Review B 31, no. 2 (1985): 798–804. http://dx.doi.org/10.1103/physrevb.31.798.
Full textDubský, Pavel, Martin Dvořák, and Martin Ansorge. "Affinity capillary electrophoresis: the theory of electromigration." Analytical and Bioanalytical Chemistry 408, no. 30 (2016): 8623–41. http://dx.doi.org/10.1007/s00216-016-9799-y.
Full textCUMMINGS, L. J., G. RICHARDSON, and M. BEN AMAR. "Models of void electromigration." European Journal of Applied Mathematics 12, no. 2 (2001): 97–134. http://dx.doi.org/10.1017/s0956792501004326.
Full textRous, P. J. "Theory of surface electromigration on heterogeneous metal surfaces." Applied Surface Science 175-176 (May 2001): 212–17. http://dx.doi.org/10.1016/s0169-4332(01)00045-9.
Full textWu, Kang, and R. Mark Bradley. "Theory of electromigration failure in polycrystalline metal films." Physical Review B 50, no. 17 (1994): 12468–88. http://dx.doi.org/10.1103/physrevb.50.12468.
Full textLodder, A. "On Sorbello's corrections to the new electromigration theory." Solid State Communications 79, no. 2 (1991): 147–48. http://dx.doi.org/10.1016/0038-1098(91)90079-b.
Full textDas, Siddhartha, and Suman Chakraborty. "Transport and Separation of Charged Macromolecules under Nonlinear Electromigration in Nanochannels." Langmuir 24, no. 15 (2008): 7704–10. http://dx.doi.org/10.1021/la703892q.
Full textDekker, J. P., A. Lodder, and J. van Ek. "Theory for the electromigration wind force in dilute alloys." Physical Review B 56, no. 19 (1997): 12167–77. http://dx.doi.org/10.1103/physrevb.56.12167.
Full textLodder, A. "Clarification of the direct-force controversy in electromigration theory." Solid State Communications 79, no. 2 (1991): 143–46. http://dx.doi.org/10.1016/0038-1098(91)90078-a.
Full textBauer, C. L., and W. W. Mullins. "On the theory of steady‐state electromigration in thin films." Applied Physics Letters 61, no. 25 (1992): 2987–89. http://dx.doi.org/10.1063/1.108011.
Full textGebauer, Petr. "Theory of electrophoretic focusing on an inverse electromigration dispersion profile." ELECTROPHORESIS 41, no. 7-8 (2020): 471–80. http://dx.doi.org/10.1002/elps.201900229.
Full textJones, W. "Linear response theory of the electromigration driving force in liquid alloys." Philosophical Magazine B 58, no. 6 (1988): 593–602. http://dx.doi.org/10.1080/13642818808211459.
Full textLi, L. H., V. Dasika, D. Heskett, and W. H. Tang. "Optical microscopy imaging method for detection of electromigration: Theory and experiment." physica status solidi (a) 204, no. 5 (2007): 1589–95. http://dx.doi.org/10.1002/pssa.200622455.
Full textBarsi, Christopher, and Jason W. Fleischer. "Nonlinear Abbe theory." Nature Photonics 7, no. 8 (2013): 639–43. http://dx.doi.org/10.1038/nphoton.2013.171.
Full textGlad, S. Torkel. "Nonlinear system theory." Automatica 23, no. 4 (1987): 545–46. http://dx.doi.org/10.1016/0005-1098(87)90085-9.
Full textKang, Seokwon, Seondo Park, and Yun Daniel Park. "Nonlinear flexural response of a suspended Au nanobeam structure undergoing an electromigration-lead breakdown." AIP Advances 10, no. 9 (2020): 095301. http://dx.doi.org/10.1063/5.0020550.
Full textLin, Minghui, and Cemal Basaran. "Electromigration induced stress analysis using fully coupled mechanical–diffusion equations with nonlinear material properties." Computational Materials Science 34, no. 1 (2005): 82–98. http://dx.doi.org/10.1016/j.commatsci.2004.10.007.
Full textLinares, Felipe, Ademir Pastor, and Marcia Scialom. "Existence of solutions for the surface electromigration equation." Nonlinearity 34, no. 8 (2021): 5213–33. http://dx.doi.org/10.1088/1361-6544/abfae6.
Full textBradley, R. M., and Kang Wu. "Crack propagation in a dynamic fuse model of electromigration." Journal of Physics A: Mathematical and General 27, no. 2 (1994): 327–33. http://dx.doi.org/10.1088/0305-4470/27/2/017.
Full textChiappinelli, Raffaele. "Nonlinear Rayleigh Quotients and Nonlinear Spectral Theory." Symmetry 11, no. 7 (2019): 928. http://dx.doi.org/10.3390/sym11070928.
Full textNARUKAWA, Yasuo. "Nonlinear Utility Theory/Cumurative Prospect Theory." Journal of Japan Society for Fuzzy Theory and Intelligent Informatics 16, no. 4 (2004): 296–302. http://dx.doi.org/10.3156/jsoft.16.296.
Full textGhosal, S., and Z. Chen. "Electromigration dispersion in a capillary in the presence of electro-osmotic flow." Journal of Fluid Mechanics 697 (March 9, 2012): 436–54. http://dx.doi.org/10.1017/jfm.2012.76.
Full textCrosby, Kevin M., R. Mark Bradley, and Hervé Boularot. "Electromigration-induced void drift and coalescence: Simulations and a dynamic scaling theory." Physical Review B 56, no. 14 (1997): 8743–51. http://dx.doi.org/10.1103/physrevb.56.8743.
Full textKuusi, Tuomo, and Giuseppe Mingione. "Vectorial nonlinear potential theory." Journal of the European Mathematical Society 20, no. 4 (2018): 929–1004. http://dx.doi.org/10.4171/jems/780.
Full textIshibashi, Yoshihiro, and Hiroshi Orihara. "Theory of nonlinear response." Ferroelectrics 156, no. 1 (1994): 185–90. http://dx.doi.org/10.1080/00150199408215948.
Full textMorita, Akio. "Theory of nonlinear response." Physical Review A 34, no. 2 (1986): 1499–504. http://dx.doi.org/10.1103/physreva.34.1499.
Full textZhang, Cun-Hui. "A Nonlinear Renewal Theory." Annals of Probability 16, no. 2 (1988): 793–824. http://dx.doi.org/10.1214/aop/1176991788.
Full textAndrushkevich, V. S., Yu G. Gamayunov, and E. V. Patrusheva. "A nonlinear clinotron theory." Journal of Communications Technology and Electronics 55, no. 3 (2010): 330–36. http://dx.doi.org/10.1134/s1064226910030125.
Full textBauchau, O. A., and C. H. Hong. "Nonlinear Composite Beam Theory." Journal of Applied Mechanics 55, no. 1 (1988): 156–63. http://dx.doi.org/10.1115/1.3173622.
Full textBaños, Alfonso. "Nonlinear quantitative feedback theory." International Journal of Robust and Nonlinear Control 17, no. 2-3 (2006): 181–202. http://dx.doi.org/10.1002/rnc.1104.
Full textIshibashi, Yoshihiro. "Theory of nonlinear response." Ferroelectrics 236, no. 1 (2000): 71–79. http://dx.doi.org/10.1080/00150190008016042.
Full textO'Regan, Donal. "Nonlinear operator approximation theory." Numerical Functional Analysis and Optimization 19, no. 5-6 (1998): 587–92. http://dx.doi.org/10.1080/01630569808816847.
Full textAdams, David R. "Weighted nonlinear potential theory." Transactions of the American Mathematical Society 297, no. 1 (1986): 73. http://dx.doi.org/10.1090/s0002-9947-1986-0849468-4.
Full textKerswell, R. R. "Nonlinear Nonmodal Stability Theory." Annual Review of Fluid Mechanics 50, no. 1 (2018): 319–45. http://dx.doi.org/10.1146/annurev-fluid-122316-045042.
Full textPrasad, Phoolan. "A nonlinear ray theory." Wave Motion 20, no. 1 (1994): 21–31. http://dx.doi.org/10.1016/0165-2125(94)90029-9.
Full textBöhmer, Klaus, and Robert Schaback. "A nonlinear discretization theory." Journal of Computational and Applied Mathematics 254 (December 2013): 204–19. http://dx.doi.org/10.1016/j.cam.2013.03.029.
Full textNorouzzadeh, A., R. Ansari, and M. Darvizeh. "From nonlinear micromorphic to nonlinear micropolar shell theory." Applied Mathematical Modelling 100 (December 2021): 689–727. http://dx.doi.org/10.1016/j.apm.2021.07.041.
Full textMahadevan, Mohan, and R. Mark Bradley. "Phase field model of surface electromigration in single crystal metal thin films." Physica D: Nonlinear Phenomena 126, no. 3-4 (1999): 201–13. http://dx.doi.org/10.1016/s0167-2789(98)00276-0.
Full textKang, S. H., and E. Shin. "A three-dimensional nonlinear analysis of electromigration-induced resistance change and Joule heating in microelectronic interconnects." Solid-State Electronics 45, no. 2 (2001): 341–46. http://dx.doi.org/10.1016/s0038-1101(00)00245-8.
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