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Journal articles on the topic 'Optical method ellipsometry'

Author: Grafiati

Published: 28 May 2022

Last updated: 31 July 2025

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1

Jin, Lianhua, Sota Mogi, Tsutomu Muranaka, Eiichi Kondoh, and Bernard Gelloz. "Characterization of thin films from reflection and transmission ellipsometric parameters." Japanese Journal of Applied Physics 61, no. 1 (2022): 018004. http://dx.doi.org/10.35848/1347-4065/ac42af.

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Abstract Spectroscopic ellipsometry is a powerful tool for the characterization of thin films/surfaces. To simultaneously extract optical constant and film thickness from ellipsometric parameters ψ and Δ, dispersion models of material’s refractive index and spectroscopic ellipsometry measurement have been often required. In this work, we propose an extraction method of optical parameters of thin films from the reflection and transmission ellipsometric parameters. This method necessitates neither spectroscopic information of ψ and Δ, nor dispersion models. Verification measurements were carried

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2

Zereay, Berhane Nugusse, Sándor Kálvin, György Juhász, et al. "Optical Calibration of a Multi-Color Ellipsometric Mapping Tool Fabricated Using Cheap Parts." Photonics 11, no. 11 (2024): 1036. http://dx.doi.org/10.3390/photonics11111036.

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We developed and applied a new calibration method to make more accurate measurements with our multi-color ellipsometric mapping tool made from cheap parts. Ellipsometry is an optical technique that measures the relative change in the polarization state of the measurement beam induced by reflection from or transmission through a sample. During conventional ellipsometric measurement, the data collection is relatively slow and measures one spot at a time, so mapping needs a long time compared with our new optical mapping equipment made by an ordinary color LED monitor and a polarization-sensitive

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3

Svitasheva, Svetlana. "Ellipsometry as Testing Method of Properties of Nano-Scale Films." Applied Mechanics and Materials 749 (April 2015): 146–54. http://dx.doi.org/10.4028/www.scientific.net/amm.749.146.

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Ellipsometry is power instrument for testing several properties of thin films. Advantage and attractiveness of these optical studies consist in that they are non-destructive and non-disturbing. High sensitivity to surface state allows us to monitoring properties of films beginning from atomic scale as in-situ and as ex situ. Ellipsometry give us information about film thickness, and film composition, and its surface morphology. From analysis of ellipsometric spectra it is possible get data about zone structure of semiconductor materials, such as energy of critical points, absorption edge locat

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Jahangirli Z. A., Mamedova I. A., Huseynova Sh. T., et al. "Ab initio calculations and experimental study of the electronic properties of CdGa-=SUB=-2-=/SUB=-S-=SUB=-4-=/SUB=- single crystals by spectral ellipsometry." Physics of the Solid State 64, no. 3 (2022): 339. http://dx.doi.org/10.21883/pss.2022.03.53190.211.

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The electronic properties of CdGa2S4 single crystals have been studied experimentally using spectral ellipsometry and theoretically from first principles using density functional theory (DFT). Using ellipsometric studies in the energy range of 0.7-6.5 eV, the imaginary and real parts of the dielectric function along and perpendicular to the optical axis, the dispersion of the refractive, extinction, and absorption coefficients are determined. The width of the direct band gap is estimated. The band structure, the origin of the energy states, the optical functions, and the partial densities of s

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5

Chen, Chia-Wei, Matthias Hartrumpf, Thomas Längle, and Jürgen Beyerer. "Measurement of ellipsometric data and surface orientations by modulated circular polarized light / Messung von ellipsometrischen Daten und Oberflächenorientierungen durch moduliertes zirkular polarisiertes Licht." tm - Technisches Messen 86, s1 (2019): 32–36. http://dx.doi.org/10.1515/teme-2019-0047.

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AbstractEllipsometry is a widely used optical method for the characterization of materials and thin films. However, only flat or nearly flat surfaces can be measured since small deviations of the angle of incidence might lead to significant experimental errors. In order to overcome the geometrical limitations of ellipsometry, the retroreflex ellipsometry developed at Fraunhofer IOSB is used. Based on this configuration, a new illumination method is proposed. When the sample is illuminated by modulated circular polarized light (LCP and RCP), the ellipsometric parameters (Ψ, Δ) and the tilted an

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Bednarski, Henryk, Barbara Hajduk, Paweł Jarka, and Pallavi Kumari. "Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO2 Substrates Determined via Spectroscopic Ellipsometry." Coatings 14, no. 2 (2024): 166. http://dx.doi.org/10.3390/coatings14020166.

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Ellipsometry is widely used to determine the thermo-optical properties of thin polymer films. However, if the thermo-optic coefficient (TOC) and the linear thermal expansion coefficient (LTEC) are to be used to determine the temperature coefficient of electronic polarizability (TCEP) in thin polymer films, their values must be determined with the greatest possible accuracy, as both have the opposite effect. In this article, we analyze changes in ellipsometric parameters resulting from changes in the thin film temperature in order to develop a data analysis method for temperature-dependent spec

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Ibrahimova, L. N., Kh N. Ahmadova, M. E. Aliyev, and Y. I. Aliyev. "Study of CdSe thin films using the spectroscopic ellipsometry method." Chalcogenide Letters 21, no. 12 (2024): 1035–39. https://doi.org/10.15251/cl.2024.2112.1035.

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In this research, we investigated the optical properties of CdSe thin films on glass substrates using spectroscopic ellipsometry. The samples were analysed using an M-2000 rotation compensator spectroscopic ellipsometer at room temperature, covering a photon energy range of 1.5-7.0 eV. We used an appropriate dispersion model to obtain the spectral dispersion of the optical constants. We calculated the thickness, dielectric permittivity (real and imaginary parts), refraction, and extinction coefficients of the thin layers. The results showed high transparency that varied with the size of the Cd

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Plikusienė, Ieva, Ernesta Bužavaitė-Vertelienė, Vincentas Mačiulis, Audrius Valavičius, Almira Ramanavičienė, and Zigmas Balevičius. "Application of Tamm Plasmon Polaritons and Cavity Modes for Biosensing in the Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Method." Biosensors 11, no. 12 (2021): 501. http://dx.doi.org/10.3390/bios11120501.

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Low-cost 1D plasmonic photonic structures supporting Tamm plasmon polaritons and cavity modes were employed for optical signal enhancement, modifying the commercially available quartz crystal microbalance with dissipation (QCM-D) sensor chip in a combinatorial spectroscopic ellipsometry and quartz microbalance method. The Tamm plasmon optical state and cavity mode (CM) for the modified mQCM-D sample obtained sensitivity of ellipsometric parameters to RIU of ΨTPP = 126.78 RIU−1 and ΔTPP = 325 RIU−1, and ΨCM = 264 RIU−1 and ΔCM = 645 RIU−1, respectively. This study shows that Tamm plasmon and ca

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9

Bazarov, Valerii V., V. F. Valeev, V. I. Nuzhdin, Yu N. Osin, G. G. Gumarov, and Andrey L. Stepanov. "Spectral Ellipsometry of Cobalt-Ions Implanted Silicon Surface." Solid State Phenomena 233-234 (July 2015): 526–29. http://dx.doi.org/10.4028/www.scientific.net/ssp.233-234.526.

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Monocrystalline silicon wafers implanted by cobalt ions with energy of 40 keV at a fluence range from 6.6×1012 to 2.5×1017 Co+-ion/cm2 were investigated by optical spectroscopic ellipsometry. By comparison of experimental data with modeling it is shown that the ellipsometric measurements are accurate and reliable method for monitoring of a low-dose ion implantation process.

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10

Pacheco, F., R. Palomino, G. Martínez, A. Mendoza-Galván, R. Rodriguez, and V. M. Castaño. "Optical Properties of Titania-Cobalt Nitrate Composite Thin Films." Advanced Composites Letters 5, no. 6 (1996): 096369359600500. http://dx.doi.org/10.1177/096369359600500603.

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Optical properties of titania thin films supported on silica plates and compounded with varying amounts of Co(II) from cobalt nitrate are reported. The ellipsometric characterization allows to model the spatial micro-structure of these thin film composites. The titania films were produced by the sol-gel method at room temperature and their thicknesses can be controlled by modifying the experimental conditions. The refractive index of the doped titania films was also determined by using ellipsometry.

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Finlayson, Chris E., Giselle Rosetta, and John J. Tomes. "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films." Applied Sciences 12, no. 10 (2022): 4888. http://dx.doi.org/10.3390/app12104888.

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The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of

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Gorokhov, E. B., K. N. Astankova, I. A. Azarov, V. A. Volodin, and A. V. Latyshev. "New method of porous Ge layer fabrication: structure and optical properties." Физика и техника полупроводников 52, no. 5 (2018): 517. http://dx.doi.org/10.21883/ftp.2018.05.45861.50.

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AbstractPorous germanium films were produced by selective removal of the GeO_2 matrix from the GeO_2<Ge–NCs> heterolayer in deionized water or HF. On the basis of Raman and infrared spectroscopy data it was supposed that a stable skeletal framework from agglomerated Ge nanoparticles (amorphous or crystalline) was formed after the selective etching of GeO_2<Ge–NCs> heterolayers. The kinetics of air oxidation of amorphous porous Ge layers was investigated by scanning ellipsometry. Spectral ellipsometry allowed estimating the porosity of amorphous and crystalline porous Ge layers, whi

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13

Filin, S. A., V. E. Rogalin, and I. A. Kaplunov. "CONTROL OF THE OPTICAL SURFACE PURITY OF THE ELEMENTS BY THE ELLIPSOMETRIC METHOD." Journal of Applied Spectroscopy 89, no. 3 (2022): 410–18. http://dx.doi.org/10.47612/0514-7506-2022-89-3-410-418.

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The possibility of controlling the chemical purity of the surface of optical elements by the ellipsometric method has been analyzed. The rationale of the possibility of measuring the parameters of contaminating films on the optical surface of elements by the ellipsometric method has been given simplification has been shown of the process of determining the thickness of the contaminating film while expanding the possibility of its measurement on an optical element made of different materials. Ellipsometric studies of freshly polished and used metal mirrors made of copper and copper alloy

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14

Hansen, Poul-Erik, and Lauryna Siaudinyte. "A virtual microscope for simulation of Nanostructures." EPJ Web of Conferences 266 (2022): 10004. http://dx.doi.org/10.1051/epjconf/202226610004.

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Light-matter interplay is widely used for analyzing the topology of surfaces on small scales for use in areas such as nanotechnology, nanoelectronics, photonics, and advanced materials. Conventional optical microscope imaging methods are limited in resolution to a value comparable to the wavelength, the so-called Abbe limit, and cannot be used to measure nano-sized structures. Scatterometry is an optical method that can measure structures smaller than the wavelength. However, the relative uncertainties of the structure dimensions measured with scatterometry increase with decreasing structure s

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15

Ahmadova, Kh N., L. N. Ibrahimova, and Kh O. Sadiq. "Study of optıcalparameters of CdSethin-layersystems." TRANSACTIONS OF AZERBAIJAN NATIONAL ACADEMY OF SCIENCES PHYSICS AND ASTRONOMY XLV, no. 2 (2025): 74–77. https://doi.org/10.70784/azip.4.2025.02.074.

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The optical parameters of CdSe thin films prepared on glass substrates were studied by the Spectroscopic Ellipsometry method. The prepared samples were measured at room temperature in the photon energy range of 1.5-7.0 eV on the M-2000 rotation-compensated Spectroscopic Ellipsometer. The spectral dispersion of optical constants was obtained using the appropriate dispersion model. The thickness and dielectric permittivity (real and imaginary parts) of the obtained thin film samples were found from the constructed optical model. Depending on the size of the CdSe thin films, high transparency was

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16

Hwang, Inseung, Daniel S. Jeon, Adolfo Muñoz, Diego Gutierrez, Xin Tong, and Min H. Kim. "Sparse ellipsometry." ACM Transactions on Graphics 41, no. 4 (2022): 1–14. http://dx.doi.org/10.1145/3528223.3530075.

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Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully calibrated in lab conditions, and in very long acquisition times, usually in the order of a few days per object. Recent techniques allow to capture polarimetric spatially-varying reflectance information, but limited to a single view, or to cover all view directions, but limited to spherical objects made of a single homogeneous material. We present sparse ellips

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17

Zavalistyi, O. I., O. V. Makarenko, V. A. Odarych, and A. L. Yampolskyi. "The Structure of Oxide Film on the Porous Silicon Surface." Ukrainian Journal of Physics 65, no. 1 (2020): 75. http://dx.doi.org/10.15407/ujpe65.1.75.

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A prolonged stay of porous silicon in the air environment gives rise to structural changes in its surface layer, and the standard single-layer model is not sufficiently accurate to describe them. In this work, the structure of the near-surface layer in porous silicon is studied using the polygonal ellipsometry method. A combined approach is proposed to analyze the angular ellipsometry data for the parameters ф and Δ. It consists in the application of the multilayer medium model and the matrix method, while simulating the propagation of optical radiation in this medium in order to obtain the th

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18

Kim, Soo Min, Syed Dildar Haider Naqvi, Min Gu Kang, Hee-eun Song, and SeJin Ahn. "Optical Characterization and Prediction with Neural Network Modeling of Various Stoichiometries of Perovskite Materials Using a Hyperregression Method." Nanomaterials 12, no. 6 (2022): 932. http://dx.doi.org/10.3390/nano12060932.

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Quaternary perovskite solar cells are being extensively studied, with the goal of increasing solar cell efficiency and securing stability by changing the ratios of methylammonium, formamidinium, I3, and Br3. However, when the stoichiometric ratio is changed, the photoelectric properties reflect those of different materials, making it difficult to study the physical properties of the quaternary perovskite. In this study, the optical properties of perovskite materials with various stoichiometric ratios were measured using ellipsometry, and the results were analyzed using an optical simulation mo

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19

Pan, Xiao Yu, Lin Jun Wang, Jian Huang, et al. "Optical Parameters of Diamond Films Determined by Spectroscopic Ellipsometry Method." Advanced Materials Research 347-353 (October 2011): 3468–71. http://dx.doi.org/10.4028/www.scientific.net/amr.347-353.3468.

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Diamond film can be used as optical window materials, mask materials and coating materials of optical device and solar cells. Diamond films with different thickness were prepared by HFCVD method. Raman scattering measurement, SEM and AFM show a good diamond character. Optical parameters in infrared region, such as refractive index (n) and extinction coefficient (k) of diamond films with different thickness were determined by spectroscopic ellipsometry method with a proper fitting model.

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GAO, SHANG, JIE LIAN, ZHAOZONG SUN, XIAO WANG, PING LI, and QINGHAO LI. "AN EFFECTIVE-SUBSTRATE METHOD TO INVESTIGATE AN IRON NATIVE OXIDE LAYER ON AN IRON SUBSTRATE BY SPECTROSCOPIC ELLIPSOMETRY." Modern Physics Letters B 27, no. 07 (2013): 1350044. http://dx.doi.org/10.1142/s0217984913500449.

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An effective-substrate method was presented to obtain the optical constants of an iron native oxide layer with unknown optical constants and film thickness on an iron substrate with unknown optical constants by using spectroscopic ellipsometry (SE). "Thick" iron films were deposited on silicon wafer by magnetron sputtering and were exposed to air at room temperature. They were measured by spectroscopic ellipsometry during this procedure at different time points from ten minutes to seven months. Pseudo optical constants were calculated from the initially measured data and were introduced into t

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Khan, F. U., M. Zubair, M. Z. Ansar, M. K. Alamgir, and S. Nadeem. "Effect of Annealing Temperature on the Structural and Optical Properties of TiO₂ Thin Film Prepared by Sol-gel Method." Journal of Scientific Research 8, no. 3 (2016): 267–72. http://dx.doi.org/10.3329/jsr.v8i3.27195.

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The effect of annealing temperatures on the surface morphology and optical properties of titanium dioxide (TiO2) thin films deposited by spin coating on Silicon substrate was studied. The TiO2 thin films deposited onto silicon substrates were annealed at different temperatures. The structural and optical properties were studied using scanning electron microscopy (SEM), X-ray diffraction technique (XRD) and optical ellipsometer. The results indicated that the structural properties of the TiO2 thin films were changed with the increase in annealing temperature. The SEM investigation showed that a

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Yu, Wanpei, Changcai Cui, Huihui Li, Subiao Bian, and Xi Chen. "FDTD-Based Study on Equivalent Medium Approximation Model of Surface Roughness for Thin Films Characterization Using Spectroscopic Ellipsometry." Photonics 9, no. 9 (2022): 621. http://dx.doi.org/10.3390/photonics9090621.

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Spectroscopic ellipsometry (SE) is an effective method to measure the optical constants of thin film materials which is very sensitive to the surface topography of thin films. When performing ellipsometric measurements of the optical constants of solid materials with rough surfaces, the equivalent medium approximation (EMA) model is often used to characterize the surface topography. The EMA model is determined by two parameters of equivalent thickness dEMA and the void volume fraction f. In most applications, the void volume fraction parameter f is always set to an empirical 50% without any in

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Janicek, Petr, Stanislav Slang, Karel Palka, and Miroslav Vlcek. "Spectroscopic ellipsometry characterization of spin-coated Ge25S75 chalcogenide thin films." Pure and Applied Chemistry 89, no. 4 (2017): 437–49. http://dx.doi.org/10.1515/pac-2016-1019.

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AbstractSpectroscopic ellipsometry study on spin-coated non-toxic Ge25S75 thin films annealed at different temperatures were conducted. Multi sample analysis with two sets of samples spin-coated onto soda-lime glass and onto silicon wafers was utilized. Optical constants (refractive index n and extinction coefficient k) of these films were determined from ellipsometric data recorded over a wide spectral range (0.05–6 eV). Different parametrization of Ge25S75 complex dielectric permittivity which consists of a Tauc-Lorentz or Cody-Lorentz oscillator describing the short wavelength absorption ed

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El Hachemi, Mohamed, Nikhar Khanna, and Emanuele Barborini. "Spectroscopic Ellipsometry and Wave Optics: A Dual Approach to Characterizing TiN/AlN Composite Dielectrics." Crystals 15, no. 2 (2025): 143. https://doi.org/10.3390/cryst15020143.

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In this paper, we present a method for retrieving the optical properties of a nano-designed TiN/AlN composite dielectric, using spectroscopic ellipsometry for experimental measurements and wave optics simulations for numerical analysis. Composite cermets have gained attention for solar–thermal energy conversion, but their fundamental optical properties are not well understood. While characterizing uniformly deposited layers is generally straightforward, the process becomes more complex for nanoparticulate composites. The refractive index is essential for investigating and tuning the optical ch

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Hajduk, Barbara, Henryk Bednarski, Bożena Jarząbek, Henryk Janeczek, and Paweł Nitschke. "P3HT:PCBM blend films phase diagram on the base of variable-temperature spectroscopic ellipsometry." Beilstein Journal of Nanotechnology 9 (April 5, 2018): 1108–15. http://dx.doi.org/10.3762/bjnano.9.102.

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In this work we present an in-depth study of the how the composition of poly(3-hexylthiophene) (P3HT):[6,6]-phenyl-C61-butyric acid methyl ester (PCBM) blend films influences their phase transitions using variable-temperature spectroscopic ellipsometry. We demonstrate that this non-destructive method is a very sensitive optical technique to investigate the phase transitions and to determine the glass transition temperatures and melting crystallization points of the P3HT:PCBM blend films. By analyzing the influence of the temperature T on the raw ellipsometric data, we have identified a high se

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Kawabata, Shuichi. "Alignment method for rotating analyzer ellipsometry." Journal of the Optical Society of America A 4, no. 4 (1987): 664. http://dx.doi.org/10.1364/josaa.4.000664.

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Pantelić, N., A. Piruska, and Carl J. Seliskar. "Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy." Materials Science Forum 518 (July 2006): 431–38. http://dx.doi.org/10.4028/www.scientific.net/msf.518.431.

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A chemically selective film, usually of optical quality, is a key component of optical and electrochemical sensors. We have examined the dynamics of various thin selective films by spectroscopic ellipsometry and attenuated total reflectance (ATR) spectroscopy. Spectroscopic ellipsometry provided a non-invasive method for measurement of optical constants (n(λ), refractive index; k(λ), extinction coefficient) and thicknesses of thin selective films which were conditioned in time by solvent and penetrant mass transport. The methods we have developed allowed us to characterize film dynamic respons

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Akashev L.A., Makhnev A.A., Kochakov V.D., Vladimirov A.P., and Druzhinin A.V. "Optical properties of linear-chain carbon film deposited on a steel sample." Optics and Spectroscopy 130, no. 5 (2022): 633. http://dx.doi.org/10.21883/eos.2022.05.54451.2650-21.

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The optical constants of a linear chain carbon (LCC) film in the spectral range from 248 to 1100 nm (1.13-5.0 eV with a step of 0.1 eV) were obtained by the Beatty ellipsometric method, and its thickness was determined. The LCC film was deposited on a pre-polished mirror surface of a massive steel sample using the technology of pulsed carbon plasma with ion stimulation. It was found that in the measured range of the spectrum the refractive index of the film varies from 2.35 to 2.73, and the value of k varies from a value close to zero to 1.02. The effective film thickness is determined to be d

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Grundmann, Jana, Bernd Bodermann, Elena Ermilova, et al. "Optical and tactile measurements on SiC sample defects." Journal of Sensors and Sensor Systems 13, no. 1 (2024): 109–21. http://dx.doi.org/10.5194/jsss-13-109-2024.

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Abstract. In power electronics, compound semiconductors with large bandgaps, like silicon carbide (SiC), are increasingly being used as material instead of silicon. They have a lot of advantages over silicon but are also intolerant of nanoscale material defects, so that a defect inspection with high accuracy is needed. The different defect types on SiC samples are measured with various measurement methods, including optical and tactile methods. The defect types investigated include carrots, particles, polytype inclusions and threading dislocations, and they are analysed with imaging ellipsomet

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Wang, Linjun, Jianmin Liu, Ling Ren, Qingfeng Su, Weimin Shi, and Yiben Xia. "Effect of Carbon Concentration on the Optical Properties of Nanocrystalline Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition Method." Journal of Nanoscience and Nanotechnology 8, no. 5 (2008): 2534–39. http://dx.doi.org/10.1166/jnn.2008.18285.

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With reducing diamond grain size to nano-grade, the increase of grain boundaries and non-diamond phase will result in the change of the optical properties of chemical vapor deposition (CVD) diamond films. In this paper, the structure, morphology and optical properties of nanocrystalline diamond (NCD) films, deposited by hot-filament chemical vapor deposition (HFCVD) method under different carbon concentration, are investigated by SEM, Raman scattering spectroscopy, as well as optical transmission spectra and spectroscopic ellipsometry. With increasing the carbon concentration during the film d

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El-Nasser, H. M. "Morphology and Spectroscopic Ellipsometry of PMMA Thin Films." Applied Physics Research 9, no. 2 (2017): 5. http://dx.doi.org/10.5539/apr.v9n2p5.

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The morphology and optical properties of PMMA thin films deposited on silicon substrates were investigated. The spin coated films were characterized by atomic force microscopy and spectroscopic ellipsometry. Regardless that, the samples were deposited at different coating speeds, the surface structures of all PMMA thin films were consistent, and found to be relatively smooth, with a mean grain size in the range of 13-25 nm. The refractive index as well as the extinction coefficient of the films was determined using spectroscopic ellipsometry data over the wavelength range 380-750 nm. For this

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Svitasheva, S. N., and George A. Pozdnyakov. "Monitoring Technological Conditions for Preparing DLC Films in Supersonic Flow of Hydrocarbon Plasma." Key Engineering Materials 538 (January 2013): 281–84. http://dx.doi.org/10.4028/www.scientific.net/kem.538.281.

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Properties of diamond-like carbon films deposited by a new method in a supersonic flow of hydrocarbon plasma generated by a disk-type magneto-hydro-dynamic accelerator were studied. Two methods are used for optical and structural characterization of diamond-like carbon films: nondestructive spectroscopic ellipsometry and Raman spectroscopy.

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Isik, Mehmet, and Nizami Gasanly. "Optical characterization of Ga2SeS layered crystals by transmission, reflection and ellipsometry." Modern Physics Letters B 29, no. 18 (2015): 1550088. http://dx.doi.org/10.1142/s0217984915500888.

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Optical properties of [Formula: see text] crystals grown by Bridgman method were investigated by transmission, reflection and ellipsometry measurements. Analysis of the transmission and reflection measurements performed in the wavelength range of 400–1100 nm at room temperature indicated the presence of indirect and direct transitions with 2.28 eV and 2.38 eV band gap energies. Ellipsometry measurements were carried out in the 1.2–6.0 eV spectral region to get information about optical constants, real and imaginary parts of the pseudodielectric function. Moreover, the critical point (CP) analy

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Ahmadova, Kh N. "Spectroscopic ellipsometric investigation of optical parameters of oil-water thin multiple systems." International Journal of Modern Physics B 34, no. 08 (2020): 2050058. http://dx.doi.org/10.1142/s0217979220500587.

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To determine the optical parameters of crude oil and seawater systems, we carried out spectral investigations using the ellipsometry method, which is a highly sensitive and accurate optical method for studying the surfaces and interfaces of various media. This method is based on studying the change in the polarization state of reflected light after its interaction with the surface of interfaces of these media. Crude oil and seawater from different regions of Caspian Sea were accessed by spectroscopic ellipsometry over the 200–1700 nm spectral range at room-temperature. Optical constants and di

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Králik, Martin, Matej Goraus, and Emil Pinčík. "Optical properties of electrochemically etched N-type silicon wafers for solar cell applications." Journal of Electrical Engineering 71, no. 6 (2020): 406–12. http://dx.doi.org/10.2478/jee-2020-0055.

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Abstract The presented experiments and studies are intended for photovoltaic applications of crystalline silicon. This work deals with chemical treatment of the surface of n-type silicon wafers with different resistivity to reduce their reflectivity. Chemical surface treatment of silicon is an alternative method to using the antireflection layer. Optical losses caused by the reflection of light from the surface of the solar cells significantly reduce their efficiency. The investigated samples were prepared by the electrochemical etching method in the solution based on hydrofluoric acid and eth

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Choudapur, V. H., S. B. Kapatkar, and A. B. Raju. "Structural and Optoelectronic Properties of Zinc Sulfide Thin Films Synthesized by Co-Precipitation Method." Acta Chemica Iasi 27, no. 2 (2019): 287–302. http://dx.doi.org/10.2478/achi-2019-0018.

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Abstract Wide bandgap Zinc Sulfide nanocrystals are prepared by a simple co-precipitation method at different precursor concentrations. The influence of sulphur concentration in Zinc sulfide on morphological, optical and electric properties is found to be significant. The Zinc Sulfide nanomaterial was prepared using low-cost starting materials and deionised water as the solvent. As synthesized Zinc Sulfide nanocrystals were analyzed using X-ray diffraction (XRD), Energy Dispersive Spectroscopy (EDS) analysis, UV-Visible Spectrophotometry, Photoluminescence (PL), Scanning electron Microscopy (S

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Dramstad, Thorn A., Zhihao Wu, and Aaron M. Massari. "Sum frequency generation as a proxy for ellipsometry: Not just a phase." Journal of Chemical Physics 156, no. 11 (2022): 110901. http://dx.doi.org/10.1063/5.0076252.

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Infrared refractive indices of organic materials are typically resolved through IR ellipsometry. This technique takes advantage of optical interference effects to solve the optical constants. These are the same effects that complicate the analysis of coherent spectroscopy experiments on thin films. Vibrational sum frequency generation is an interface-specific coherent spectroscopy that requires spectral modeling to account for optical interference effects to uncover interfacial molecular responses. Here, we explore the possibility of leveraging incident beam geometries and sample thicknesses t

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Käseberg, Tim, Jana Grundmann, Johannes Dickmann, Stefanie Kroker, and Bernd Bodermann. "Imaging Mueller matrix ellipsometry setup for optical nanoform metrology." EPJ Web of Conferences 238 (2020): 06006. http://dx.doi.org/10.1051/epjconf/202023806006.

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We designed, realized, and characterised an imaging Mueller matrix ellipsometry setup for the pixelwise measurement of the Mueller matrices in microscope images. Our setup is capable of performing measurements in reflection as well as in transmission in a broad range of angles of incidence for wavelengths between 400 nm and 700 nm. We compared measurements of specially designed nanostructured samples with AFM and SEM measurements as well as with numerical simulations using the finite element method.

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Tahir, Muhammad, Zaheer Hussain Shah, Muhammad Imran, Bilal Ramzan, Saira Riaz, and Shahzad Naseem. "Impact of Basic Bath on Optical and Electrical Characteristics of Zinc Sulfide (ZnS) Thin Films." Scientific Inquiry and Review 8, no. 1 (2024): 75–93. http://dx.doi.org/10.32350/sir.81.05.

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Zinc Sulfide (ZnS) thin films have attracted the research community because of their recognition in optoelectronic devices. An electroless, application-oriented, CBD (chemical bath deposition) method is typically applied for the deposition of ZnS thin films deposited on a glass substrate with pH 8. Deposition temperature is varied as 25℃, 50℃, 75℃, 100℃, and 125℃. In this study, ZnS thin films and X-ray diffraction (XRD) Variable Angle Spectroscopic Ellipsometry was used. XRD analysis confirmed the hexagonal structure of deposited ZnS thin films at all temperatures. Ellipsometric results showe

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Tanooka, Daisuke. "Difference–Sum Generalized Ellipsometry Method for Thin Films with Small Optical Anisotropy." Japanese Journal of Applied Physics 48, no. 11 (2009): 112403. http://dx.doi.org/10.1143/jjap.48.112403.

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Nosidlak, Natalia, Piotr Dulian, Dariusz Mierzwiński, and Janusz Jaglarz. "The Determination of the Electronic Parameters of Thin Amorphous Organic Films by Ellipsometric and Spectrophotometric Study." Coatings 10, no. 10 (2020): 980. http://dx.doi.org/10.3390/coatings10100980.

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The aim of this work was the determination of the basic optical parameters and electronic structure of conjugated polymer films by two commonly used techniques—spectrophotometry and ellipsometry. Poly(3-hexylthiophene (P3HT) and poly(3-octylthiophene (P3OT) conductive polymers films deposited on a glass substrate by the spin-coating technique showed very comparable surface structures composed of grains of similar sizes and shapes. X-ray tests confirmed that the polythiophene layers are amorphous, which confirmed the correctness of the choice of the optical models used. Selected optical models

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Dittrich, Arne, Frank Heinemeyer, Chencheng Xu, and Rolf Reineke-Koch. "Realization of a cost-effective thermochromic solar absorber with a high emittance change based on VO₂ and an infrared transparent intermediate layer." AIP Advances 12, no. 3 (2022): 035118. http://dx.doi.org/10.1063/5.0063702.

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In this study, we present a thermochromic solar absorber coating that reaches a high thermal emittance change by using a thin, optically switching VOx film located on an infrared transparent interlayer (spacer) of Si or Ge with an optical thickness of λ/4 (for λ = 7 μm). Using this so-called “lambda/4-concept,” temperature-dependent reflection measurements in the spectral range between 2500 and 50 000 nm from an absorber with a 450 nm Si spacer and a VOx film oxidized from a 30-nm-thick V display an overall increase in emittance from ε(25 °C) = 12.2% to ε(150 °C) = 55.1%, resulting in a change

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Liao, P. C., W. S. Ho, Y. S. Huang, and K. K. Tiong. "Characterization of sputtered iridium dioxide thin films." Journal of Materials Research 13, no. 5 (1998): 1318–26. http://dx.doi.org/10.1557/jmr.1998.0187.

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Iridium dioxide (IrO2) thin films, deposited on Si substrates by reactive rf sputtering method under various conditions, were characterized by atomic force microscopy (AFM), x-ray diffraction (XRD), electrical-conductivity, spectrophotometry, ellipsometry and Raman scattering measurements. The average grain sizes of the films were estimated by AFM. A grain boundary scattering model was used to fit the relation between the average grain size and electrical resistivity. The optical and dielectric constants were determined by the ellipsometry measurements. The results of the electrical and optica

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Cuscó, Ramon, Tomohiro Yamaguchi, Elias Kluth, Rüdiger Goldhahn, and Martin Feneberg. "Optical properties of corundum-structured In₂O₃." Applied Physics Letters 121, no. 6 (2022): 062106. http://dx.doi.org/10.1063/5.0096844.

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The optical properties of a single-phase corundum-structured In2O3 epilayer grown by a mist chemical vapor deposition method have been studied. Raman scattering measurements on a c face and on a lateral face reveal all of the seven Raman-active modes of the corundum structure, with good adherence to the Raman selection rules. Three out of the four infrared-active modes are observed in the spectroscopic ellipsometry measurements. The phonon frequencies obtained from Raman and ellipsometry measurements are in excellent agreement with density functional perturbation theory calculations. No trace

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Xu Peng, 徐鹏, 刘涛 Liu Tao, 王林梓 Wang Linzi, 李国光 Li Guoguang, 熊伟 Xiong Wei, and 荣健 Rong Jian. "Calibration Method for Single Wavelength Ellipsometry Using Standard Samples." Acta Optica Sinica 33, no. 4 (2013): 0412002. http://dx.doi.org/10.3788/aos201333.0412002.

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Tarasov, Ivan, Zakhar Popov, Maxim Visotin, Ivan Yakovlev, and Sergey Varnakov. "Effect of chemical ordering on optical properties of Fe3Si epitaxial films." EPJ Web of Conferences 185 (2018): 03014. http://dx.doi.org/10.1051/epjconf/201818503014.

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Optical characteristics (electron energy loss function, optical conductivity σ, permittivity ε, refractive index n, extinction coefficient k, and absorption coefficient α) of a 30 nm thick epitaxial Fe3Si iron silicide films grown at different silicon substrate temperature (26, 100, 200, 300 ˚C) were determined within E = 0.74–6.46 eV photon energy range using spectroscopic ellipsometry technique. The experimental data are compared to the optical characteristics calculated in the framework of the density functional theory using the GGA–PBE approximation. Variations of the optical characteristi

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Kosyrev, Nikolay N., Vladimir N. Zabluda, and Olga A. Maximova. "In Situ Mueller-Matrix Magneto-Ellipsometry." Solid State Phenomena 245 (October 2015): 55–59. http://dx.doi.org/10.4028/www.scientific.net/ssp.245.55.

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We develop the method for determining the Mueller matrix elements using standard photometric ellipsometer. Small ellipsometer design changes give an opportunity to completely determine all elements of the Mueller matrix. It is shown how the values of Mueller matrix elements can be obtained from the measurements at different azimuthal positions of optical units.

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Narica, Pavels, Svetlana Pan’kova, Vladimir Solovyev, Alexander Vanin, and Mikhail Yanikov. "OPTICAL PROPERTIES OF LASER-COLOURING MARKED STAINLESS STEEL." ENVIRONMENT. TECHNOLOGIES. RESOURCES. Proceedings of the International Scientific and Practical Conference 3 (June 16, 2021): 242–44. http://dx.doi.org/10.17770/etr2021vol3.6516.

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Laser colour-marking method often displace conventional marking techniques. Complicated technology of laser-induced periodic surface structure creation on stainless steel samples allows changing their surface morphology and optical properties, which were studied in this work by atomic force microscopy (AFM), laser scanning microscopy, reflectance spectroscopy and ellipsometry. Reflectance spectra of the samples demonstrate reflectance maxima correlate with the visible colours of the samples and with the extrema in the non-monotonic spectral dependences of the derivative of real part of complex

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Lu, Xin Miao, Yi Qun Wu, and Yang Wang. "Antimony Bismuth Alloy Films: Preparation, Optical and Thermal Properties." Materials Science Forum 663-665 (November 2010): 227–30. http://dx.doi.org/10.4028/www.scientific.net/msf.663-665.227.

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Antimony bismuth alloy films were deposited on Si and K9 glass substrates by magnetron-control sputtering method. The structure of the film was studied with x-ray diffraction (XRD). The thermal property of the film was researched by differential scanning calorimetry (DSC). The optical constants of the films including refractive index (n) and extinction coefficients (k) are measured by ellipsometry, and the dielectric constants (=r+ii), absorption coefficients  were also calculated.

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Azarenkov, Mykola, Oleksii A. Haluza, Alexander V. Gapon, and Volodymyr V. Lytvynenko. "Optical Parameters of Aluminum Alloy Samples Irradiated by High Current Relativistic Electron Beams." East European Journal of Physics, no. 4 (December 2, 2023): 298–302. http://dx.doi.org/10.26565/2312-4334-2023-4-38.

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The aluminum alloys D16, D16AT are widely used as construction materials in the aircraft industry. Questions connected with the enhancement of the properties of the construction elements made of the alloys through surface modification are of great interest now. The objects of the study in our paper are the samples of the aluminum alloy D16AT subjected to irradiation by high-current relativistic electron beams. Leaving aside the material science aspects, in this work we focused on modeling the optical properties of the samples. The problem is relevant because optical methods for surface analysi

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