Academic literature on the topic 'Optical thin films'

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Journal articles on the topic "Optical thin films"

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Nakayama, T., H. Murotani, and T. Harada. "Optical characteristics and mechanical properties of optical thin films on weathered substrates." Chinese Optics Letters 11, S1 (2013): S10301. http://dx.doi.org/10.3788/col201311.s10301.

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Kryuchyn, A. A. "High-speed optical recording in vitreous chalcogenide thin films." Semiconductor Physics Quantum Electronics and Optoelectronics 17, no. 4 (November 10, 2014): 389–93. http://dx.doi.org/10.15407/spqeo17.04.389.

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Al-dujayli, Sundus M. A., and Nathera A. Al- Tememee. "Optical study of effect of thiourea on CdS thin films." Indian Journal of Applied Research 3, no. 3 (October 1, 2011): 336–40. http://dx.doi.org/10.15373/2249555x/mar2013/114.

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Krupka, Oksana, Vitaliy Smokal, Sergey Studzinsky, Nikolay Davidenko, and Angelina Biitseva. "Electro-Optical Properties in Thin Films of New Azobenzene Polymers." Chemistry & Chemical Technology 9, no. 2 (May 15, 2015): 137–41. http://dx.doi.org/10.23939/chcht09.02.137.

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Studenyak, I. P. "Optical studies of as-deposited and annealed Cu7GeS5I thin films." Semiconductor Physics Quantum Electronics and Optoelectronics 19, no. 2 (July 6, 2016): 192–96. http://dx.doi.org/10.15407/spqeo19.02.192.

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Babichuk, I. S. "Thin films of Cu2ZnSnS4 for solar cells: optical and structural properties." Functional materials 20, no. 2 (June 25, 2013): 186–91. http://dx.doi.org/10.15407/fm20.02.186.

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Lysiuk, V. O. "Optical properties of ion implanted thin Ni films on lithium niobate." Semiconductor Physics Quantum Electronics and Optoelectronics 14, no. 1 (February 28, 2011): 59–61. http://dx.doi.org/10.15407/spqeo14.01.059.

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Boltovets, P. M. "Effect of microwave radiation on optical characteristics of thin gold films." Semiconductor Physics Quantum Electronics and Optoelectronics 14, no. 2 (June 30, 2011): 209–12. http://dx.doi.org/10.15407/spqeo14.02.209.

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Vuichyk, M. V. "Morphologic and optical characterization of ZnO:Co thin films grown by PLD." Semiconductor Physics Quantum Electronics and Optoelectronics 17, no. 1 (March 31, 2014): 80–84. http://dx.doi.org/10.15407/spqeo17.01.080.

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Peng, Qian, Yadong Qiao, and Yang Liu. "Temperature-dependent optical properties of low-loss plasmonic SrMoO3 thin films." Chinese Optics Letters 21, no. 5 (2023): 053601. http://dx.doi.org/10.3788/col202321.053601.

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Dissertations / Theses on the topic "Optical thin films"

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Yamamoto, Kiyoshi. "Optical theory applied to thin films." Case Western Reserve University School of Graduate Studies / OhioLINK, 1994. http://rave.ohiolink.edu/etdc/view?acc_num=case1061392348.

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Logan, Randy. "Optical metrology of thin films." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/46094.

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Geddis, Demetris Lemarcus. "Single fiber bi-directional OE links using 3D stacked thin film emitters and detectors." Diss., Available online, Georgia Institute of Technology, 2004:, 2003. http://etd.gatech.edu/theses/available/etd-04082004-180141/unrestricted/geddis%5Fdemetris%5Fl%5F200312%5Fphd.pdf.

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Baker, Christopher Charles. "Electroluminescent Thin Films for Integrated Optics Applications." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1054903604.

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Edström, Curt. "Wet etching of optical thin films." Thesis, Tekniska Högskolan, Högskolan i Jönköping, JTH, Kemiteknik, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:hj:diva-13988.

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Evaluation of the wet etching properties of several different thin film oxidesgrown by physical vapour deposition was performed in this work. MgO, Al2O3,SiO2, TiO2, HfO2 ZrO2 and Y2O3 were coated on two types of substrates; Si andborosilicate glass and etching tests were performed in different etchingsolutions. MgF2 thin films have also been evaluated. Important aspects of the choice of the thin films was taken into account in orderto match to good optical properties such as refractive index (n), extinction coefficient (k) and optical thickness (TP) as well as good chemical properties in the wet etching process. A description is made of the physics of optical filters and how a combination of different oxides stacked onto each other can create interference filters. A description of the manufacturing process of the thin films where physical vapour deposition (PVD) was used is presented. Thermal shift of the optical spectra caused by porous coatings was investigated and analyses of the thin films by ellipsometry, surface profilometry and transmission spectrophotometry have been performed. The wet etching properties were evaluated by monitoring the transmission insituon transparent borosilicate glass substrates. A method of how to measure the wet etching rate for different thin films is described. A computer software was used to calculate the Pourbaix diagrams in order to understand the chemical behaviour of the etching solutions. The pH can have a significant impact on the etching behaviour. In case of TiO2, it can be dissolved in an alkaline solution of H2O2. The catalytically process behind this is evaluated. Etching rate for both Y2O3 andSiO2 were matched by adjusting the etchant concentration as a case example. The group IVB oxides are difficult to etch. The catalytic etching of TiO2 with peroxide is slow but detectable. Al2O3, Y2O3 and MgO are reasonably easy to etch but have too low refractive indices to be useful in multilayer optical filters. The In-situ etching instrument was found to be very useful for measuring etching rates.
Utvärdering av våtkemiska egenskaper för flera olika oxidtunnfilmer utfördes idetta arbete på tunnfilmer av MgO, Al2O3, SiO2, TiO2, HfO2 ZrO2 and Y2O3 vakuumdeponerade på både kiselwafers och borosilikatglas. Etstester gjordes med ett flertal etslösningar. Även MgF2-tunnfilmer utvärderades. Både optiska och kemiska egenskaper togs i beaktande vid utvärderingen av tunnfilmerna. De optiska lagar som gäller för tunnfilmer redovisas, bl a hur kombinationer av olika oxider kan skapa interferrensfilter. En beskrivning av tillverkningsprocessen varvid PVD användes presenteras. Termiskt skift av det optiska transmissionsspektrat orsakat av porositet undersöktes. Analyser av tunnfilmerna med ellipsometri, profilometri och transmissions spektroskopi utfördes. Våtetsningsegenskaperna utvärderades genom att mäta in-situ vid etsprocessen på transparenta borosilikatglassubstrat. Metoden för att mäta etshastigheten för olika oxider är beskriven. Datorberäkningar av pourbaixdiagram användes för att skapa en förståelse av de kemiska egenskaperna för etslösningarna. Etsegenskaperna påverkas till stordel av lösningens pH. TiO2 kan etsas i basisk lösning av peroxid. Denna process utvärderades, likaså utvärderades etshasigheten för Y2O3 och SiO2 för att erhålla matchande par avoxider som en fallstudie. Grupp IVB oxiderna är mycket svåra att etsa. Katalytisk etsning av TiO2 med peroxid är detekterbar men långsam. Al2O3, Y2O3 och MgO är förhållandevis enkla att etsa men har för låga brytningsindex för att var praktiskt använbara i optiska multilagerfilter. In-situ etsinstrumentet befanns vara ett utmärkt verktyg för att mäta etshastigheten för tunnfilmer.
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Favorskiy, Igor. "Optical pumping in Silicon thin films." Phd thesis, Ecole Polytechnique X, 2013. http://pastel.archives-ouvertes.fr/pastel-00950979.

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Grâce à un long temps de vie de spin, le silicium est un matériau prometteur pour l'électronique de spin. Mais les approches classiques d'étude de la dynamique de spin basées sur la luminescence polarisée ne peuvent pas être utilisées dans ce matériau à cause du faible couplage spin-orbite et du gap indirect. Dans ce travail, nous avons étudié la polarisation de spin des électrons de conduction créée en condition de pompage optique par spectroscopie de photoémission. La surface du silicium est activée en affinité négative par dépôt de césium et d'oxygène de sorte que les électrons photoexcités avec une énergie proche du gap peuvent émis dans le vide. Nous utilisons un laser accordable qui permet de mesurer systématiquement le spectre de polarisation pour des énergies d'excitation allant du seuil d'absorption jusqu'à la bande Gamma2- au-dessus du gap direct. Nous avons obtenus les spectres de polarisation à partir de couches minces SOI d'épaisseurs différentes. A partir de ces résultats, nous déterminons la valeur de paramètres importants de la structure de bande comme le gap direct ou l'énergie du couplage spin-orbite. Cependant, contrairement aux prédictions, lorsque l'épaisseur de la couche de silicium diminue jusqu'à des valeurs inférieures à la longueur de diffusion de spin, la polarisation en spin des électrons émis reste proche de zéro (-0.4%), remettant en cause l'interprétation directe des valeurs théoriques de la polarisation initiale égale à -20%. Une approche théorique a donc été développée sur la base d'un modèle ab initio de structure de bande pour déterminer les spectres de polarisation en spin. Ces calculs sont encore en cours, mais les résultats déjà obtenus sur la structure électronique du silicium sous contrainte indiquent une piste intéressante pour les études futures.
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Rycroft, Ian M. "Electric, magnetic and optical properties of thin films, ultra thin films and multilayers." Thesis, University of Reading, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.318142.

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Kiisk, Valter. "Optical investigation of metal-oxide thin films /." Online version, 2006. http://dspace.utlib.ee/dspace/bitstream/10062/115/1/kiiskvalter.pdf.

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Hudson, Andrew James. "Optical applications of ultra-thin organic films." Thesis, University of Oxford, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316871.

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Cooke, Simon J. "Optical devices incorporating ultra-thin organic films." Thesis, University of Oxford, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.314837.

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Books on the topic "Optical thin films"

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Macleod, H. A. Thin film optical filters. 4th ed. Boca Raton: Taylor & Francis, 2010.

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Rancourt, James D. Optical thin films: Users' handbook. New York: McGraw-Hill, 1987.

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Heavens, O. S. Optical properties of thin solid films. New York: Dover Publications, 1991.

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Macleod, H. A. Thin-film optical filters. 4th ed. Boca Raton: Taylor & Francis, 2010.

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Macleod, H. A. Thin-film optical filters. 2nd ed. N.Y: Macmillan Pub. Co., 1986.

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Macleod, H. A. Thin-film optical filters. 4th ed. Boca Raton: Taylor & Francis, 2010.

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1934-, Hummel Rolf E., Guenther Karl H, and Wissmann P. 1936-, eds. Handbook of optical properties. Boca Raton: CRC Press, 1995.

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F, Kajzar, and Swalen Jerome Douglas, eds. Organic thin films for waveguiding nonlinear optics. Amsterdam: Gordon & Breach, 1996.

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A, Alterovitz Samuel, and Lewis Research Center, eds. Optical dispersion relations for "diamondlike" carbon films. Cleveland, Ohio: Lewis Research Center, 1989.

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Willey, Ronald R. Practical design and production of optical thin films. New York: M. Dekker, 1996.

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Book chapters on the topic "Optical thin films"

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Nedelcu, Nicoleta. "Optical Analysis and Chemical Properties." In Thin Films, 89–120. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-06616-0_5.

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Nedelcu, Nicoleta. "Types of Optical Coating Systems." In Thin Films, 1–31. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-06616-0_1.

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Chipman, Russell A., Wai-Sze Tiffany Lam, and Garam Young. "Thin Films." In Polarized Light and Optical Systems, 479–506. Boca Raton : Taylor & Francis, CRC Press, 2019. | Series: Optical sciences and applications of light: CRC Press, 2018. http://dx.doi.org/10.1201/9781351129121-13.

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Stenzel, Olaf. "Thin Films, Substrates, and Multilayers." In Optical Coatings, 81–113. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-54063-9_4.

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Truong, V. V., and S. Tanemura. "Optical Properties of Thin Films." In Optical Properties of Condensed Matter and Applications, 297–323. Chichester, UK: John Wiley & Sons, Ltd, 2006. http://dx.doi.org/10.1002/0470021942.ch13.

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Escoubas, Ludovic, and Francois Flory. "Optical Thin Films for Micro-Components." In Optical Interference Coatings, 231–55. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-540-36386-6_10.

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Martínez-Duart, J. M., R. J. Martín-Palma, G. García-Ayuso, A. Gutiérrez-Llorente, and O. Sánchez-Garrido. "Protective Coatings for Optical Systems." In Protective Coatings and Thin Films, 523–51. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-011-5644-8_42.

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Rigneault, Hervé. "Optical Thin Films for Spontaneous Emission Control." In Optical Interference Coatings, 455–78. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-540-36386-6_18.

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Mwema, Fredrick Madaraka, Tien-Chien Jen, and Lin Zhu. "Thin Films for Electronic, Spintronics, and Optical Applications." In Thin Film Coatings, 183–93. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003202615-9.

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Duran, Hatice, K. H. Aaron Lau, Petra J. Cameron, Antonis Gitsas, Martin Steinhart, and Wolfgang Knoll. "Nanostructured Optical Waveguides for Thin-Film Characterization." In Functional Polymer Films, 695–721. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527638482.ch21.

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Conference papers on the topic "Optical thin films"

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Jäger, Matthias, S. Lecomte, U. Gubler, Ch Bosshard, P. Gunter, L. Gobbi, and F. Diederich. "Reversible structuring of optical waveguides using optical switch molecules." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.suc3.

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Tsutsumi, Naoto, Masanori Imamura, Yoshiki Ikeyama, Jun Yamamoto, and Wataru Sakai. "Optical anisotropy of all optically induced x(2) polar structures." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sae13.

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Welker, David, Dennis W. Garvey, C. D. Breckon, and Mark G. Kuzyk. "Single-mode electrooptic polymer optical fiber." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sac1.

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Gao, Renyuan, and A. F. Garito. "Rare earth doped polymer optical amplifiers." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sua1.

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Shirk, James, Steven R. Flom, Richard G. S. Pong, Dawn D. Dominguez, Arthur W. Snow, Heino Heckmann, and Michael Hanack. "Nonlinear optical properties of phthalocyanine aggregates." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sud4.

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Friedrich, Lars, Tomas Pliska, Mingguo Liu, George I. Stegeman, Seung-Han Park, and Andreas Feldner. "Linear optical properties of p-toluene-sulfonate (PTS)." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sae2.

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Hayden, L., and Won-Kook Kim. "Fully atomistic modeling of a poled nonlinear optical polymer." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sud8.

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Flom, Steven, J. R. Lindle, F. J. Bartoli, Mingguo Liu, and George I. Stegeman. "Nonlinear optical properties of pTS near the band edge." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sud5.

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Van Elshocht, Sven, Thierry Verbiest, Martti Kauranen, Andre Persoons, Liang Ma, Hua Cheng, Kwon Y. Musick, Lin Pu, and K. U. Leuven. "Nonlinear optical study of chiral 1,1-binaphthyl based helical polymers." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.fc5.

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Heflin, James, C. Figura, P. J. Neyman, M. A. Murray, R. M. Davis, D. Marciu, and M. Miller. "Novel approaches to ionically self-assembled nonlinear optical thin films." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sad1.

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Reports on the topic "Optical thin films"

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Henager, C. H. Jr, and W. T. Pawlewicz. Thermal conductivities of thin, sputtered optical films. Office of Scientific and Technical Information (OSTI), May 1991. http://dx.doi.org/10.2172/10108496.

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Henager, C. H. Jr, and W. T. Pawlewicz. Thermal conductivities of thin, sputtered optical films. Office of Scientific and Technical Information (OSTI), May 1991. http://dx.doi.org/10.2172/6109768.

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Schmid, Ansgar. Micro-Raman Analysis of Dielectric Optical Thin Films. Fort Belvoir, VA: Defense Technical Information Center, January 1988. http://dx.doi.org/10.21236/ada191228.

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Chow, A. F., A. I. Kingon, O. Auciello, and D. B. Poker. Investigation of optical loss mechanisms in oxide thin films. Office of Scientific and Technical Information (OSTI), May 1995. http://dx.doi.org/10.2172/86955.

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Green, Peter F. Brush-Coated Nanoparticle Polymer Thin Films: structure-mechanical-optical properties. Office of Scientific and Technical Information (OSTI), August 2014. http://dx.doi.org/10.2172/1167194.

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Hrubesh, L. W., and J. F. Poco. Thin aerogel films for optical, thermal, acoustic, and electronic applications. Office of Scientific and Technical Information (OSTI), September 1994. http://dx.doi.org/10.2172/161530.

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Siegman, G. I. Intensity Dependent Refractive Index Effects in Optical Fibers and Thin Films. Fort Belvoir, VA: Defense Technical Information Center, November 1990. http://dx.doi.org/10.21236/ada253231.

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Miller, Michael B. Ionic Self-Assembled Monolayer (ISAM) Nonlinear Optical Thin Films and Devices. Fort Belvoir, VA: Defense Technical Information Center, May 1998. http://dx.doi.org/10.21236/ada345555.

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Bobbitt, Jonathan. Optical-based spectroscopic methods for measuring chemical, optical, and physical properties of thin polymer waveguide films. Office of Scientific and Technical Information (OSTI), December 2017. http://dx.doi.org/10.2172/1417984.

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Wayner, Jr, P., M. Sujanani, and A. Liu. Microcomputer enhanced optical investigation of spreading and evaporative processes in ultra thin films. Office of Scientific and Technical Information (OSTI), January 1990. http://dx.doi.org/10.2172/5077921.

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