Books on the topic 'Optics in industrial inspection'

Optical techniques for industrial inspection. Boston: Academic Press, 1988.

Harding, Kevin G., Peisen S. Huang, and Tōru Yoshizawa. Optical metrology and inspection for industrial applications: 18-20 October 2010. Edited by SPIE (Society), Zhongguo guang xue xue hui, Beijing gong ye xue yuan, Zhongguo ke xue ji shu xie hui, Guo jia zi ran ke xue ji jin wei yuan hui (China), and China. Guo jia ke xue ji shu bu. Bellingham, Wash: SPIE, 2010.

Don, Braggins, European Physical Society, European Federation for Applied Optics., Society of Photo-optical Instrumentation Engineers., and Association nationale de la recherche technique., eds. Industrial inspection II: 12-13 March 1990, the Hague, the Netherlands. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1990.

Lehmann, Peter H. Optical measurement systems for industrial inspection VI: 15-18 June 2009, Munich, Germany. Edited by SPIE Europe, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik, and SPIE (Society). Bellingham, Wash: SPIE, 2009.

Osten, Wolfgang, Peter H. Lehmann, and Kay Gastinger. Optical measurement systems for industrial inspection VII: 23-26 May 2011, Munich, Germany. Bellingham, Wash: SPIE, 2011.

R, Martin R., ed. Computer vision, models, and inspection. Singapore: World Scientific, 1992.

Smith, M. L. Surface inspection techniques: Using the integration of innovative machine vision and graphical modeling techniques. London: Professional Engineering, 2001.

name, No. Smart structures and materials 2003: Industrial and commercial applications of smart structures technologies : 4-6 March 2003, San Diego, California, USA. Bellingham, Washington: SPIE, 2003.

Vision '90 (1990 Detroit, Mich.). Vision '90, November 12-15, 1990, Detroit, Michigan. Dearborn, Mich: Society of Manufacturing Engineers, 1990.

Vision, '89 (1989 Chicago Ill ). Vision '89, April 24-27, 1989, Chicago, Illinois. Dearborn, Mich. (1 SME Dr., Dearborn 48121): Society of Manufacturing Engineers, 1989.

Loughlin, C. Sensors for industrial inspection. Dordrecht: Kluwer Academic Publishers, 1993.

Loughlin, C. Sensors for Industrial Inspection. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-2730-1.

Loughlin, C. Sensors for Industrial Inspection. Dordrecht: Springer Netherlands, 1993.

Leuenberger, Rolf. Automatische Gewebeinspektion mit Hilfe neuronaler Netzwerke. Zürich: Eidgenössische Technische Hochschule, 1996.

Erko, A. I. Diffraction X-ray optics. Philadelphia, PA: Institute of Physics Pub., 1996.

Dlamini, E. L. B. Labour inspection, industrial relations, and the industrial court in Swaziland. [S.l: s.n., 1988.

Clay, Jones, ed. Industrial wastewater source control: An inspection guide. Lancaster, Pa: Technomic Pub. Co., 1992.

Ultrafast optics. Hoboken, N.J: Wiley, 2009.

Lorenz, Peter G. The science of remote visual inspection (RVI): Technology, applications, equipment. Lake Success, NY: Olympus Corp., 1990.

Małgorzata, Kujawińska, Osten Wolfgang, European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Optical measurement systems for industrial inspection: 16-17 June, 1999, Munich, Germany. Bellingham, Washington: SPIE, 1999.

Osten, Wolfgang. Optical Measurements Systems for Industrial Inspection IV. SPIE-International Society for Optical Engine, 2005.

Lehmann, Peter. Optical Measurement Systems for Industrial Inspection X. SPIE, 2018.

Lehmann, Peter. Optical Measurement Systems for Industrial Inspection IX. SPIE, 2015.

Christophe, Gorecki, ed. Microsystems metrology and inspection: 15-16 June 1999, Munich, Germany. Bellingham, Wash., USA: SPIE, 1999.

A, Marszalec Elzbieta, Trucco Emanuele, European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Polarization and color techniques in industrial inspection: 17-18 June 1999, Munich, Germany. Bellingham, Wash., USA: SPIE, 1999.

Yoshizawa, Toru, Song Zhang, and Sen Han. Optical Metrology and Inspection for Industrial Applications III. SPIE, 2015.

Yoshizawa, Toru, Song Zhang, and Sen Han. Optical Metrology and Inspection for Industrial Applications IV. SPIE, 2017.

G, Cielo Paolo, ed. Selected papers on optical techniques for industrial inspection. Bellingham, Wash: SPIE Optical Engineering Press, 1997.

Wolfgang, Osten, ed. Optical inspection of microsystems. Boca Raton, FL: Taylor & Francis, 2006.

Hui, Wei Guang, Liu S. 1963-, China Optics & Optoelectronic Manufacturers Association., Zhongguo wu li xue hui., and Society of Photo-optical Instrumentation Engineers., eds. Instruments for optics and optoelectronic inspection and control: 8-10 November 2000, Beijing, China. Bellingham, Wash., USA: SPIE, 2000.

Osten, Wolfgang. Optical Inspection of Microsystems, Second Edition. Taylor & Francis Group, 2019.

Osten, Wolfgang. Optical Inspection of Microsystems, Second Edition. Taylor & Francis Group, 2019.

Osten, Wolfgang. Optical Inspection of Microsystems, Second Edition. Taylor & Francis Group, 2019.

Optical Inspection of Microsystems Second Edition. Taylor & Francis Group, 2019.

Osten, Wolfgang. Optical Inspection of Microsystems, Second Edition. Taylor & Francis Group, 2019.

1934-, Ye Shenghua, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., and Chinese Optics & Optoelectronic Manufacturers Association., eds. Automated optical inspection for industry: theory, technology, and applications II: 16-19 September, 1998, Beijing, China. Bellingham, Washington: SPIE, 1998.

(Editor), Hans J. Tiziani, and Pramod K. Rastogi (Editor), eds. Laser Metrology and Inspection (Europto). Society of Photo Optical, 1999.

Wolfgang, Osten, Jüptner Werner P. O, Kujawińska Małgorzata, Society of Photo-optical Instrumentation Engineers., European Optical Society, and Wissenschaftliche Gesellschaft Lasertechnik, eds. Optical measurement systems for industrial inspection II: Application in industrial design : 18-19 June, 2001, Munich, Germany. Bellingham, Washington: SPIE, 2001.

Wolfgang, Osten, Creath Katherine, Kujawińska Małgorzata, Society of Photo-optical Instrumentation Engineers., European Optical Society, and Wissenschaftliche Gesellschaft Lasertechnik, eds. Optical measurement systems for industrial inspection III: 23-26 June 2003, Munich, Germany. Bellingham, Wash: SPIE, 2003.

Optical measurement systems for industrial inspection V: 18-22 June 2007, Munich, Germany. Bellingham, Wash: SPIE, 2007.

G, Cielo Paolo, Society of Photo-optical Instrumentation Engineers., and National Research Council Canada, eds. Optical techniques for industrial inspection, 4-6 June 1986, Québec City, Canada. Bellingham, Wash: SPIE--the International Society for Optical Engineering, 1986.

M, Brown Gordon, Harding Kevin G, Stahl H. Philip, and Society of Photo-optical Instrumentation Engineers., eds. Industrial applications of optical inspection, metrology, and sensing: 19-20 November 1992, Boston, Massachusetts. Bellingham, Wash., USA: SPIE, 1993.

Don, Braggins, European Physical Society, and European Federation for Applied Optics., eds. Industrial inspection: Proceedings, ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany. Bellingham, Wash., U.S.A: SPIE, 1989.

G, Harding Kevin, Stahl H. Philip, and Society of Photo-optical Instrumentation Engineers., eds. Industrial optical sensors for metrology and inspection: 31 October-1 November 1994, Boston, Massachusetts. Bellingham, Wash: SPIE, 1995.

J, Tiziani Hans, Rastogi P. K, European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Laser metrology and inspection: 14-15 June 1999, Munich, Germany. Bellingham, Wash., USA: SPIE, 1999.

Christophe, Gorecki, and Centre national de la recherche scientifique (France), eds. Optical inspection and micromeasurements: 10-14 June 1996, Besançon, France. Bellingham, Wash: SPIE--International Society for Optical Engineering, 1996.

Christophe, Gorecki, European Optical Society, Society of Photo-optical Instrumentation Engineers., and Commission of the European Communities. Directorate-General for Science, Research, and Development., eds. Optical inspection and micromeasurements II: 16-19 June 1997, Munich, FRG. Bellingham, Wash: SPIE, 1997.

Y, Wu Frederick, Dawson Benjamin M, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection: 3-4 February 1993, San Jose, California. Bellingham, Wash., USA: SPIE, 1993.

M, Dawson Benjamin, Wilson Stephen S, Wu Frederick Y, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection II: 8-9 February 1994, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.

A, Ravishankar Rao, Chang Ning-San, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection VI: 27 January 1998, San Jose, California. Bellingham, Wash., USA: SPIE, 1998.