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Relevant bibliographies by topics / Parasitic aberrations

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Academic literature on the topic 'Parasitic aberrations'

Author: Grafiati

Published: 4 June 2021

Last updated: 18 February 2022

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Journal articles on the topic "Parasitic aberrations"

1

Batson, P. E. "Control of parasitic aberrations in multipole optics." Journal of Electron Microscopy 58, no. 3 (March 5, 2009): 123–30. http://dx.doi.org/10.1093/jmicro/dfp015.

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2

Batson, PE. "Control of Parasitic Aberrations in Multipole Corrector Optics." Microscopy and Microanalysis 14, S2 (August 2008): 830–31. http://dx.doi.org/10.1017/s1431927608088430.

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3

de Kerckhove, D. G., M. B. H. Breese, D. N. Jamieson, and G. W. Grime. "Characterisation of lens aberrations and parasitic fields using beam rocking." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 158, no. 1-4 (September 1999): 81–84. http://dx.doi.org/10.1016/s0168-583x(99)00309-2.

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4

Radlička, Tomáš. "Correction of parasitic aberrations of hexapole corrector using differential algebra method." Ultramicroscopy 204 (September 2019): 81–90. http://dx.doi.org/10.1016/j.ultramic.2019.05.006.

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Martin, F. W., and R. Goloskie. "Experimental compensation of parasitic octopole aberrations in small-bore quadrupole lenses." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 104, no. 1-4 (September 1995): 59–63. http://dx.doi.org/10.1016/0168-583x(95)00400-9.

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Ozaki, T., Y. H. Hisaoka, and H. Murakami. "Approximation formula for parasitic aberrations due to mechanical defects of an electrostatic deflector." Microelectronic Engineering 21, no. 1-4 (April 1993): 217–20. http://dx.doi.org/10.1016/0167-9317(93)90059-e.

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Thust, A., and C. L. Jia. "Atomic Structure Determination Using the Focal-Series Reconstruction Technique." Microscopy and Microanalysis 7, S2 (August 2001): 286–87. http://dx.doi.org/10.1017/s1431927600027501.

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During the last five years the technique focal-series reconstruction has evolved to a powerful tool for investigating materials science problems in high-resolution transmission electron microscopy. Compared to the conventional interpretation of one single high-resolution image, the quantum mechanical electron wave function at the exit plane of the object (exit-plane wave function, EPW) is in many cases a better starting point for the materials analysis. The retrieval of the EPW is achieved on a routine basis by applying automated numerical procedures to a series of images taken from the same specimen area at different objective lens defocus values. The application of the reconstruction procedure allows one to remove numerically all the well known instrumental artifacts, such as nonlinear contrast formation or delocalisation effects due to spherical aberration and other parasitic aberrations. The reconstructed EPW gives thus direct insight into the atomic structure in the case of sufficiently thin objects and renders tedious image simulations of complicated defects unnecessary in many cases.

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8

Yavor, M. I., and A. S. Berdnikov. "Parasitic aberrations in static sector field mass analyzers and their correction. Part 1. First order approximation." International Journal of Mass Spectrometry and Ion Processes 128, no. 3 (October 1993): 149–56. http://dx.doi.org/10.1016/0168-1176(93)87063-x.

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Martin, F. W., and R. Goloskie. "Simultaneous compensation of 2nd-order parasitic aberrations in both principal sections of an achromatic quadrupole lens doublet." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 30, no. 3 (March 1988): 242–47. http://dx.doi.org/10.1016/0168-583x(88)90004-3.

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Carlino, Elvio, Francesco Scattarella, Liberato Caro, Cinzia Giannini, Dritan Siliqi, Alessandro Colombo, and Davide Galli. "Coherent Diffraction Imaging in Transmission Electron Microscopy for Atomic Resolution Quantitative Studies of the Matter." Materials 11, no. 11 (November 19, 2018): 2323. http://dx.doi.org/10.3390/ma11112323.

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The paper focuses on the development of electron coherent diffraction imaging in transmission electron microscopy, made in the, approximately, last ten years in our collaborative research group, to study the properties of materials at atomic resolution, overcoming the limitations due to the aberrations of the electron lenses and obtaining atomic resolution images, in which the distribution of the maxima is directly related to the specimen atomic potentials projected onto the microscope image detector. Here, it is shown how augmented coherent diffraction imaging makes it possible to achieve quantitative atomic resolution maps of the specimen atomic species, even in the presence of low atomic number atoms within a crystal matrix containing heavy atoms. This aim is achieved by: (i) tailoring the experimental set-up, (ii) improving the experimental data by properly treating parasitic diffused intensities to maximize the measure of the significant information, (iii) developing efficient methods to merge the information acquired in both direct and reciprocal spaces, (iv) treating the dynamical diffused intensities to accurately measure the specimen projected potentials, (v) improving the phase retrieval algorithms to better explore the space of solutions. Finally, some of the future perspectives of coherent diffraction imaging in a transmission electron microscope are given.

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Dissertations / Theses on the topic "Parasitic aberrations"

1

Breese, Mark B. H. "The correction of parasitic sextupole aberrations in magnetic quadrupole lenses." Thesis, University of Salford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291670.

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Horák, Michal. "Studium elektronově optických systémů s porušenou rotační symetrií." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2015. http://www.nusl.cz/ntk/nusl-231782.

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This thesis deals with computing of the magnetic lens with a perturbed pole piece due to manufacturing imperfections. Two possible ways of calculation are discussed - the perturbation theory and 3D computing. Three methods for evaluating axial multipole field functions from 3D fields are introduced. Beam spots in the image plane and aberration coefficients are computed and results obtained by the application of perturbation theory are compared to results evaluated from 3D simulations. Consequently, a suitability of using the perturbation theory is discussed.

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Books on the topic "Parasitic aberrations"

1

Breese, Mark B. H. The correction of parasiitic sextupole aberrations in magnetic quadropole lenses. Salford: University of Salford, 1990.

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Book chapters on the topic "Parasitic aberrations"

1

Hawkes, P. W., and E. Kasper. "Parasitic Aberrations." In Principles of Electron Optics, 470–79. Elsevier, 1996. http://dx.doi.org/10.1016/b978-012333340-7/50210-6.

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2

Hawkes, Peter, and Erwin Kasper. "Parasitic Aberrations." In Principles of Electron Optics, 521–43. Elsevier, 2018. http://dx.doi.org/10.1016/b978-0-08-102256-6.00031-6.

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3

Tekwani, B. L., and O. P. Shukla. "Aberrations in Cytochrome P-450 and Mixed Function Oxidase System During Parasitic Diseases." In Biological Oxidation Systems, 85–98. Elsevier, 1990. http://dx.doi.org/10.1016/b978-0-12-584551-9.50011-1.

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4

Yavor, M. I. "Methods for Calculation of Parasitic Aberrations and Machining Tolerances in Electron Optical Systems." In Advances in Electronics and Electron Physics Volume 86, 225–81. Elsevier, 1993. http://dx.doi.org/10.1016/s0065-2539(08)60156-0.

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Conference papers on the topic "Parasitic aberrations"

1

Iliopoulos, Athanasios, John G. Michopoulos, and John C. Hermanson. "Composite Material Testing Data Reduction to Adjust for the Systematic 6-DoF Testing Machine Aberrations." In ASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/detc2012-71119.

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This paper describes a data reduction methodology for eliminating the systematic aberrations introduced by the unwanted behavior of a multiaxial testing machine, into the massive amounts of experimental data collected from testing of composite material coupons. The machine in reference is a custom made 6-DoF system called NRL66.3 and developed at the NAval Research Laboratory, that consists of multiple sets of hexapod configurations essentially forming a recursive synthesis of multiple parallel mechanisms. Hexapod linkages, the grips, and other deformable parts of the machine absorb energy. This is manifested in an either reversible or irreversible manner, thus introducing a parasitic behavior that is undesirable from the perspective of our ultimate goal of the material constitutive characterization. The data reduction focuses both on the kinematic (pose of the grip) and the reaction (forces and moments) that are critical input quantities of the material characterization process. The kinematic response is reduced by exploitation of the kinematics of the dots used for full field measurements. A correction transformation is identified by solving an inverse problem that minimizes the known displacements at the grips as given by the full field measurements and those given by the machine’s displacement sensors. A Procrustes problem formalism was introduced to exploit a known material behavior tested by the testing machine. Consequently, a correction transformation was established and was applied on the load cell data of the machine in order to eliminate the spurious responses appearing in the force and moment data.

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