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Relevant bibliographies by topics / Piezo Force Microscopy

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Journal articles

Academic literature on the topic 'Piezo Force Microscopy'

Author: Grafiati

Published: 6 September 2023

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Journal articles on the topic "Piezo Force Microscopy"

1

Xiao, Bailong. "Levering Mechanically Activated Piezo Channels for Potential Pharmacological Intervention." Annual Review of Pharmacology and Toxicology 60, no. 1 (2020): 195–218. http://dx.doi.org/10.1146/annurev-pharmtox-010919-023703.

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The mechanically activated Piezo channels, including Piezo1 and Piezo2 in mammals, function as key mechanotransducers for converting mechanical force into electrochemical signals. This review highlights key evidence for the potential of Piezo channel drug discovery. First, both mouse and human genetic studies have unequivocally demonstrated the prominent role of Piezo channels in various mammalian physiologies and pathophysiologies, validating their potential as novel therapeutic targets. Second, the cryo-electron microscopy structure of the 2,547-residue mouse Piezo1 trimer has been determine

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2

Moreland, John. "Tunneling stabilized magnetic-force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1034–35. http://dx.doi.org/10.1017/s0424820100151003.

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Magnetic force microscopy (MFM) can be done by making a simple change in conventional scanning tunneling microscopy (STM) where the usual rigid STM tip is replaced with a flexible magnetic tip. STM images acquired this way show both the topography and the magnetic forces acting on the flexible tip. The z-motion of the STM piezo tube scanner flexes the tip to balance the magnetic force so that the end of the tip remains a fixed tunneling distance from the sample surface. We present a review of some “tunneling-stabilized” MFM (TSMFM) images showing magnetic bit tracks on a hard disk, Bloch wall

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3

Fried, G., K. Balss, and P. W. Bohn. "Imaging Electrochemical Controlled Chemical Gradients Using Pulsed Force Mode Atomic Force Microscopy." Microscopy and Microanalysis 6, S2 (2000): 726–27. http://dx.doi.org/10.1017/s1431927600036126.

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The electrochemical formation of gradients in self assembled monolayers has been demonstrated recently [1]. The capacity to image these gradients provides useful information on the physical chemistry of electrochemical striping.Imaging chemical gradients requires the ability to sense the chemical moiety on the top of the self-assembled monolayer. This has been accomplished by derivatizing an atomic force microscope (AFM) tip with molecules selected to have specific interactions with the sample in a technique known as chemical force microscopy [2]. Typical tapping mode AFM is then used to image

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4

Wei, Yaocheng, Xuejun Zheng, Liang Chu, and Hui Dong. "Piezo-Phototronic Enhancement of Vertical Structure Photodetectors Based on 2D CsPbBr₃ Nanosheets." Journal of Nanoelectronics and Optoelectronics 17, no. 5 (2022): 769–74. http://dx.doi.org/10.1166/jno.2022.3250.

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Two-dimensional (2D) CsPbBr3 have received great interest in flexible photoelectric devices due to their excellent carrier mobility and tunable optical bandgap. However, it is unknown if the piezo-phototronic effects of a vertically structured 2D CsPbBr3 photodetector affect its photoelectric performance. Herein, we fabricated a vertical structure device based on 2D CsPbBr3 by using conductive atomic force microscopy and then probed its photoelectric performances under different forces. The photocurrent and on/off ratio under 450 nm laser illumination rise by up to 2.1 and 5.3 times, respectiv

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5

Graça, Sergio, Rogerio Colaço, and Rui Vilar. "Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials." Materials Science Forum 514-516 (May 2006): 1598–602. http://dx.doi.org/10.4028/www.scientific.net/msf.514-516.1598.

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When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-

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6

Miller, Nathaniel C., Haley M. Grimm, W. Seth Horne, and Geoffrey R. Hutchison. "Accurate electromechanical characterization of soft molecular monolayers using piezo force microscopy." Nanoscale Advances 1, no. 12 (2019): 4834–43. http://dx.doi.org/10.1039/c9na00638a.

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We report a new methodology for the electromechanical characterization of organic monolayers based on the implementation of dual AC resonance tracking piezo force microscopy (DART-PFM) combined with a sweep of an applied DC field under a fixed AC field.

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7

Calahorra, Yonatan, Michael Smith, Anuja Datta, Hadas Benisty, and Sohini Kar-Narayan. "Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique." Nanoscale 9, no. 48 (2017): 19290–97. http://dx.doi.org/10.1039/c7nr06714c.

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8

Sasaki, Michiko, and Masahiro Goto. "Piezoelectric effect of crystal nanodomains on the friction force." Journal of Vacuum Science & Technology B 40, no. 5 (2022): 052803. http://dx.doi.org/10.1116/6.0001881.

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Reduction and control of the friction force are important from the viewpoint of energy conservation, and novel approaches for achieving this are desirable. The friction force of the boron-doped zinc oxide (B-ZnO) coating on a stainless-steel type-440C substrate was moderated by controlling the B-ZnO crystal nanodomains' piezoelectric effect. The nanoscale and macroscale friction forces, as well as the B-ZnO coating's piezoelectric effect, were measured using lateral force microscopy, friction and wear meter, and piezo response microscopy devices, respectively. The distribution of the friction

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9

Zhang, Guitao, Xi Chen, Weihe Xu, Wei-Dong Yao, and Yong Shi. "Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy." AIP Advances 12, no. 3 (2022): 035203. http://dx.doi.org/10.1063/5.0081109.

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Nano-piezoelectric materials have drawn tremendous research interest. However, characterization of their piezoelectric properties, especially measuring the piezoelectric strain coefficients, remains a challenge. Normally, researchers use an AFM-based method to directly measure nano-materials’ piezoelectric strain coefficients. But, the extremely small piezoelectric deformation, the influence from the parasitic electrostatic force, and the environmental noise make the measurement results questionable. In this paper, a resonant piezo-force microscopy method was used to accurately measure the pie

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10

Mangamma, G., B. Ramachandran, T. N. Sairam, M. S. R. Rao, S. Dash, and A. K. Tyagi. "Imaging of Nanometric Ferroelectric Domains in BaTiO₃ Using Atomic Force Acoustic Microscopy and Piezo Force Microscopy." Journal of Advanced Microscopy Research 6, no. 1 (2011): 29–34. http://dx.doi.org/10.1166/jamr.2011.1056.

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