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Journal articles on the topic 'Plural Scattering'

Author: Grafiati

Published: 4 June 2021

Last updated: 7 February 2022

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1

Kawrakow, I. "Electron transport: multiple and plural elastic scattering." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 108, no. 1-2 (January 1996): 23–34. http://dx.doi.org/10.1016/0168-583x(95)01046-7.

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2

Su, D. S., H. F. Wang, and E. Zeitler. "The influence of plural scattering on EELS elemental analysis." Ultramicroscopy 59, no. 1-4 (July 1995): 181–90. http://dx.doi.org/10.1016/0304-3991(95)00027-x.

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3

Egerton, R. F., and S. C. Cheng. "Elemental analysis of telatively thick specimens by EELS." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1248–49. http://dx.doi.org/10.1017/s0424820100130870.

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Core-loss spectra of thicker specimens are strongly influenced by plural scattering. Plural inelastic events increase the background Ib underneath an ionization edge by an amount dependent on t/λ, t being the specimen thickness and λ the total-inelastic mean free path. However, plural scattering also contributes to the integral core-loss signal Ic. In fact, if the latter were integrated over a sufficiently large energy window Δ, the signal/background ratio (SBR=IC/Ib) might be expected to be independent of t.Figure 1 shows K-edge signal/background ratios for elemental carbon and silicon, prese

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4

Giangrandi, S., K. Arstila, B. Brijs, T. Sajavaara, A. Vantomme, and W. Vandervorst. "Considerations about multiple and plural scattering in heavy-ion low-energy ERDA." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267, no. 11 (June 2009): 1936–41. http://dx.doi.org/10.1016/j.nimb.2009.03.105.

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5

Arstila, K., T. Sajavaara, and J. Keinonen. "Monte Carlo simulation of multiple and plural scattering in elastic recoil detection." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 174, no. 1-2 (March 2001): 163–72. http://dx.doi.org/10.1016/s0168-583x(00)00435-3.

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6

Bielajew, Alex F. "Plural and multiple small-angle scattering from a screened Rutherford cross section." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 86, no. 3-4 (April 1994): 257–69. http://dx.doi.org/10.1016/0168-583x(94)95288-4.

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7

Bauer, P., E. Steinbauer, and J. P. Biersack. "The width of an RBS spectrum: influence of plural and multiple scattering." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 64, no. 1-4 (February 1992): 711–15. http://dx.doi.org/10.1016/0168-583x(92)95563-7.

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8

FUJIHARA, Kento, Yusaku EMOTO, Hiroshi ITO, Naomi KANEKO, Hideyuki KANEKO, Hideyuki KAWAI, Atsushi KOBAYASHI, and Takahiro MIZUNO. "Evaluation of Position Resolution for a Prototype Whole-Body PET Detector Based on Suppressing Backgrounds by Compton Scattering." EPJ Web of Conferences 170 (2018): 09004. http://dx.doi.org/10.1051/epjconf/201817009004.

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Existing PET (Positron Emission Tomography) systems make clear images in demonstration (measuring small PET reagent in pure water), however images in real diagnosis become unclear. The authors suspected that this problem was caused by Compton scattering in a detector. When PET systems observe plural photomultiplier tube outputs, an original emission point is regarded as centroid of the outputs. However, even if plural emission in Compton scattering occur, these systems calculate original point in the same way as single emission. Therefore, the authors considered that rejecting Compton scatteri

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9

Luo, Suichu, and David C. Joy. "A new method for quantitative analysis of EELS." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 950–51. http://dx.doi.org/10.1017/s0424820100172486.

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Techniques to remove plural scattering from electron energy loss spectra (EELS) are important in bot hmicroanalysis and other quantitative applications of electron spectroscopy. The techniques used are either based on convolution, or Fourier transform deconvolution, methods, in which either the elastic scattering angular correction or both elastic and inelastic angular corrections are not included. In this work we propose a new method based on both angular and energy loss three-dimension Poisson statistics which includes elastic and inelastic mixed angular scattering correction in order to obt

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10

Narayan, Raman D., J. K. Weiss, and Peter Rez. "Highly Automated Electron Energy-Loss Spectroscopy Elemental Quantification." Microscopy and Microanalysis 20, no. 3 (April 10, 2014): 798–806. http://dx.doi.org/10.1017/s1431927614000567.

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AbstractA model-based fitting algorithm for electron energy-loss spectroscopy spectra is introduced, along with an intuitive user-interface. As with Verbeeck & Van Aert, the measured spectrum, rather than the single scattering distribution, is fit over a wide range. An approximation is developed that allows for accurate modeling while maintaining linearity in the parameters that represent elemental composition. Also, a method is given for generating a model for the low-loss background that incorporates plural scattering. Operation of the user-interface is described to demonstrate the ease

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11

Egerton, R. F. "Developments in the processing of electron energy-loss spectra." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 80–83. http://dx.doi.org/10.1017/s0424820100125385.

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Because the total-inelastic mean free path is generally comparable to the specimen thickness, energy-loss spectra recorded in a TEM contain appreciable contributions from plural (or multiple) scattering, which imparts no additional information but may distort or submerge characteristic features. Happily, the single-scattering spectrum S(E) can be derived from a recorded spectrum by the method of Fourier-log deconvolution; if j(f) and z(f) are the Fourier transforms of the recorded data J(E) and of the zero-loss peak Z(E), the Fourier transform s(f) of the single-scattering distribution S(E) is

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12

Johnston, P. N., R. D. Franich, I. F. Bubb, M. El Bouanani, D. D. Cohen, N. Dytlewski, and R. Siegele. "The effects of large angle plural scattering on heavy ion elastic recoil detection analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163 (March 2000): 314–17. http://dx.doi.org/10.1016/s0168-583x(99)00977-5.

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13

Egerton, R. F., and Z. L. Wang. "Plural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting aperture." Ultramicroscopy 32, no. 2 (February 1990): 137–47. http://dx.doi.org/10.1016/0304-3991(90)90032-h.

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14

Luo, Suichu, John R. Dunlap, Richard W. Williams, and David C. Joy. "Local thickness determination by Electron Energy Loss Spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 944–45. http://dx.doi.org/10.1017/s0424820100172450.

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In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we

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15

Kitamura, Toshiaki. "Numerical Analysis of Ridged-Circular Nanoaperture for Near-Field Optical Disk." ISRN Optics 2013 (October 29, 2013): 1–6. http://dx.doi.org/10.1155/2013/543960.

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A ridged-circular nanoaperture is investigated through three-dimensional (finite-difference time-domain) FDTD method. The motion equations of free electrons are inserted to analyze a metallic material. The electromagnetic field distributions of optical near-field around the aperture are investigated. The phase change disk illuminated by a near-field optical light through a ridged-circular nanoaperture is also analyzed. The far-field scattering patterns from the phase change disk and the crosstalk characteristics between plural marks are studied.

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16

Moore, K. T., E. A. Stach, J. M. Howe, D. C. Elbert, and D. R. Veblen. "A Tilting Procedure to Enhance Compositional Contrast and Reduce Residual Bragg Contrast in EFTEM Imaging of Planar Interfaces." Microscopy and Microanalysis 6, S2 (August 2000): 156–57. http://dx.doi.org/10.1017/s1431927600033274.

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When acquiring energy-filtered TEM (EFTEM) images of a crystalline material, the detrimental effects of diffraction contrast can often be seen in raw energy-filtered images (EFI) (i.e., pre-edge and post-edge images), jump-ratio images and elemental maps as residual diffraction contrast. Residual diffraction contrast occurs in raw EFI because of plural scattering (i.e., inelastic-elastic and elastic-inelastic electron scattering) and in jump-ratio images and elemental maps because background removal procedures often are unable to completely account for intensity changes due to dynamical effect

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17

Wang, Y. Y., Z. Shao, R. Ho, A. V. Somlyo, and A. P. Somlyo. "Quantitative EELS mapping of biological thin sections." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1568–69. http://dx.doi.org/10.1017/s0424820100132479.

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X-ray microanalysis and electron energy loss spectroscopy are reliable methods for determining at high spatial resolution the local composition of biological materials. EELS imaging, although potentially more sensitive than X-ray analysis, is complicated by the large background of EELS spectra. The conventional power law fitting of the EELS background can only be used for analysis of high concentrations and/or very thin sections (t< 0.3 λ) and it is not reliable for mapping low elemental concentrations. For the detection of low elemental concentrations at high spatial resolution, the backgr

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18

Leapman, R. D., and C. R. Swyt. "Quantitative Electron Energy Loss Mapping." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 404–5. http://dx.doi.org/10.1017/s0424820100118898.

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The intensity of a characteristic electron energy loss spectroscopy (EELS) image does not, in general, directly reflect the elemental concentration. In fact, the raw core loss image can give a misleading impression of the elemental distribution. This is because the measured core edge signal depends on the amount of plural scattering which can vary significantly from region to region in a sample. Here, we show how the method for quantifying spectra due to Egerton et al. can be extended to maps.

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19

Corstens, J. M., W. Knulst, O. J. Luiten, and M. J. van der Wiel. "An efficient method for calculating plural scattering of relativistic electrons in thin foils and multilayers." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 222, no. 3-4 (August 2004): 437–44. http://dx.doi.org/10.1016/j.nimb.2004.04.163.

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20

Sölkner, G., and P. Schattschneider. "A computational test for the removal of plural scattering from angle-resolved energy loss spectra." Journal of Microscopy 137, no. 3 (March 1985): 275–80. http://dx.doi.org/10.1111/j.1365-2818.1985.tb02584.x.

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21

Egerton, R. F., and S. H. Liou. "A remarkable property of the angular distribution of plural inelastic scattering, with benign consequences for the deconvolution of electron energy-loss spectra." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 380–81. http://dx.doi.org/10.1017/s0424820100153877.

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Electrons which have been inelastically scattered two or more times during passage through a thin specimen are known to be distributed more broadly in angle than those which are scattered only once. However, the literature contains no simple guide or analytical formula for the plural-scattering angular distribution. We decided to calculate this distribution by two-dimensional self-convolution of the single-scattering angular distribution, taking the latter to be a Lorentzian function: with characteristic angle ΘE and with an abrupt cut-off of the intensity at scattering angle Θ = Θc.The result

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22

Thomas, P. J., and P. A. Midgley. "Image-spectroscopy – II. The removal of plural scattering from extended energy-filtered series by Fourier deconvolution." Ultramicroscopy 88, no. 3 (August 2001): 187–94. http://dx.doi.org/10.1016/s0304-3991(01)00078-x.

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23

Egerton, R. F., and S. C. Cheng. "Thickness Measurement by EELS." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 398–99. http://dx.doi.org/10.1017/s0424820100118862.

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Electron energy-loss spectroscopy offers a rapid method of estimating the local thickness of a TEM specimen. The best-known procedure requires only measurement of the integrated intensity IO under the zero-loss peak and of the integral It under the whole spectrum (up to some suitable energy loss Δ). The thickness t is obtained from the formula:where λ(β) is the mean free path for inelastic scattering up to some angle β which is determined by the collection aperture (e.g. objective aperture in CTEM). In agreement with previous work we find that Eq. (1) is applicable over a wide range of thickne

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24

Bilde-Soerensen, J. B. "Hints To Correct For Skirt Effects From Plural Scattering When Doing EDS In A Low-Vacuum SEM." Microscopy Today 6, no. 3 (April 1998): 28. http://dx.doi.org/10.1017/s1551929500066864.

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25

Hunt, J. A., A. J. Strutt, and D. B. Williams. "Quantitative light-element analysis using parallel EELS." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 722–23. http://dx.doi.org/10.1017/s0424820100087926.

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Electron energy-loss spectrometry (EELS) is theoretically superior to x-ray emission spectrometry (XES) for light element microanalysis. The x-ray fluorescence yield decreases proportional to Z4, thus dramatically reducing characteristic x-ray production. However, the ionization cross section increases and so EELS becomes more efficient as Z decreases. Despite these advantages light element microanalysis using XES is often preferred to EELS. There are two major reasons why EELS is not more widespread. First, very thin specimens are needed to minimize plural scattering so quantification can pro

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26

Thomas, P. J., and P. A. Midgley. "Image-Spectroscopy: New Developments and Applications." Microscopy and Microanalysis 5, S2 (August 1999): 618–19. http://dx.doi.org/10.1017/s143192760001641x.

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The ability of modern TEMs to acquire a series of energy filtered images opens up new possibilities in energy loss compositional analysis. In particular, an electron spectroscopic imaging (ESI) series may be treated as a 2-D array of spectra whose resolution is dictated by the step size of the image series, as illustrated in Fig (a). This allows standard spectroscopic analysis techniques to be used on the extracted ‘image-spectra’, such as the removal of plural scattering by deconvolution. Examples of this are given in Fig (b) and (c), which show how Fourier-log and Fourier-ratio deconvolution

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27

Fisk Johnson, H., and M. S. Isaacson. "An efficient analytical method for calculating the angular and energy distribution of electrons which have undergone plural scattering in amorphous materials." Ultramicroscopy 26, no. 3 (January 1988): 271–94. http://dx.doi.org/10.1016/0304-3991(88)90227-6.

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28

Bruley, J. "Applications of Multi-Variate Statistical Analysis of Spectrum Images to Microelectronic Devices." Microscopy and Microanalysis 7, S2 (August 2001): 1158–59. http://dx.doi.org/10.1017/s143192760003186x.

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It is not uncommon for an electrical failure in a microelectronic device to be traced back to an individual resistive contact, such as a W contact lined by TiN to the underlying metal silicide [1]. Identifying the root cause of the defective cell then requires the capability of extracting interfacial chemistry and microstructure with near atomic resolution, which is achieved by recording EELS and EDX data either along 1-d lines or from 2-d arrays. EELS data are characterized by intrinsically low signal-to-background ratios and plural inelastic-scattering effects, which presents a challenge to

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29

Joy, David C. "Ultra-high resolution backscattered imaging." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1284–85. http://dx.doi.org/10.1017/s042482010013105x.

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A recent paper by Ogura displays backscattered electron (BSE) images from a bulk, layered structure of AlAs/GaAs with repeat spacings of the order of 10nm. Typically BSE images are thought of as being inherently limited in resolution to a level which is of the order of a fraction of the Bethe range of the incident electrons, which for the beam energy and specimen used in these experiments would be of the order of 5 μm. The purpose of this paper is, therefore, to examine the conditions required for the nanometer level resolution achieved in this case.Backscattered electrons can be grouped into

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30

Lu, Yun, and Joy David C. "Evaluation of particle effects in bremsstrahlung and in quantitative energy-dispersive x-ray microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1678–79. http://dx.doi.org/10.1017/s0424820100133023.

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The magnitude and the spectral form of bremsstrahlung signal contains much information about the target and is significantly influenced by the surface irregularities. By computer modelling, it is possible to extract the information to perform more accurate quantitative x-ray microanalysis for specimens with special geometries. In this research, bremsstrahlung spectra obtained from electron beams striking at selected locations of spherical particles were investigated by Monte Carlo simulations and experimental observations. The effects of surface geometries and the x-ray path lengths in the spe

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31

Kundmann, Michael K., and Gronsky Ronald. "Plasmon lineshape analysis in EELS of semiconductors." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 500–501. http://dx.doi.org/10.1017/s042482010010456x.

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Many materials display plasmon peaks in their low-loss EELS spectra. The plasmon peak shape, energy, and linewidth are characteristic of each material and are sensitive to the outer-shell electron density and details of the electronic band and energy-level structures. As these properties are a function not only of the composition but also the structure and chemistry of a sample, plasmon spectroscopy can potentially become a materials characterization tool which goes beyond the elemental analyses provided by EDXS and ionization-edge EELS. However, analysis of plasmon spectra requires considerab

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32

Kugimoto, Daisuke, Aoi Taniguchi, Masaki Kinoshita, and Isamu Akiba. "Effect of Molecular Architecture on Associating Behavior of Star-Like Amphiphilic Polymers Consisting of Plural Poly(ethylene oxide) and One Alkyl Chain." Polymers 13, no. 3 (January 31, 2021): 460. http://dx.doi.org/10.3390/polym13030460.

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Associating behavior of star-like amphiphilic polymers consisting of two or three poly(ethylene oxide) (PEO) chains and one stearyl chain (C18) was investigated. Although the aggregation number (Nagg) of linear analogue of amphiphilic polymers monotonically decreased with increasing number-average molecular weight of PEO (Mn,PEO), the Nagg of micelles of star-like amphiphilic polymers with Mn,PEO = 550 g/mol was smaller than that with Mn,PEO = 750 g/mol, whereas that with Mn,PEO ≥ 750 g/mol showed general Mn,PEO dependence. Small-angle X-ray scattering analyses revealed that the occupied area

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33

Du, Ming, Zichao (Wendy) Di, Dogˇa Gürsoy, R. Patrick Xian, Yevgenia Kozorovitskiy, and Chris Jacobsen. "Upscaling X-ray nanoimaging to macroscopic specimens." Journal of Applied Crystallography 54, no. 2 (February 19, 2021): 386–401. http://dx.doi.org/10.1107/s1600576721000194.

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Upscaling X-ray nanoimaging to macroscopic specimens has the potential for providing insights across multiple length scales, but its feasibility has long been an open question. By combining the imaging requirements and existing proof-of-principle examples in large-specimen preparation, data acquisition and reconstruction algorithms, the authors provide imaging time estimates for howX-ray nanoimaging can be scaled to macroscopic specimens. To arrive at this estimate, a phase contrast imaging model that includes plural scattering effects is used to calculate the required exposure and correspondi

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34

Bayraktar, Sevi. "Choreographies of Dissent and the Politics of Public Space in State-of-Emergency Turkey." Performance Philosophy 5, no. 1 (November 30, 2019): 90–108. http://dx.doi.org/10.21476/pp.2019.51269.

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This article investigates a recent period in which dissenting activism has been shifted in Istanbul under the state of emergency (2016-2018). Based on an ethnography conducted with activists in feminist and LGBTQI+ demonstrations, anti-emergency decree vigils, and the Presidential Referendum protests, the study discusses how activists resist and undermine mobilization of violence through using the hegemonic tools of repression tactically, and choreographically. By employing Hannah Arendt’s concepts of “politics” and “isolation,” I examine that state agencies like the police forcefully disperse

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35

Scomoroscenco, Cristina, Mircea Teodorescu, Adina Raducan, Miruna Stan, Sorina Nicoleta Voicu, Bodgan Trica, Claudia Mihaela Ninciuleanu, et al. "Novel Gel Microemulsion as Topical Drug Delivery System for Curcumin in Dermatocosmetics." Pharmaceutics 13, no. 4 (April 7, 2021): 505. http://dx.doi.org/10.3390/pharmaceutics13040505.

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Gel microemulsion combines the advantages of the microemulsion, which can encapsulate, protect and deliver large quantities of active ingredients, and the gel, which is so appreciated in the cosmetic industry. This study aimed to develop and characterize new gel microemulsions suitable for topical cosmetic applications, using grape seed oil as the oily phase, which is often employed in pharmaceuticals, especially in cosmetics. The optimized microemulsion was formulated using Tween 80 and Plurol® Diisostearique CG as a surfactant mix and ethanol as a co-solvent. Three different water-soluble po

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36

"Fourier deconvolution of electron energy-loss spectra." Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences 398, no. 1815 (April 9, 1985): 395–404. http://dx.doi.org/10.1098/rspa.1985.0041.

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Electron energy-loss spectroscopy (e. e. l. s.) performed with an electron microscope can be used to obtain plasmon spectra, near-edge fine structure and extended electron energy-loss fine structure (ex. e. l. f. s.), as well as to do chemical analysis on truly microscopic samples. However, the very strength of the electron–electron interaction gives rise to significant and sometimes predominant plural scattering effects. To obtain consistent and reliable estimates of the single scattering distributions these effects must be accounted for. In this paper, two Fourier-transform deconvolution met

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37

Buck, Edgar C., Brady D. Hanson, Judah I. Friese, Matt Douglas, and Bruce K. McNamara. "Evidence for Neptunium Incorporation into Uranium (VI) Phases." MRS Proceedings 824 (2004). http://dx.doi.org/10.1557/proc-824-cc9.3.

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AbstractThis paper examines the ability of electron energy-loss spectroscopy (EELS) combined with transmission electron microscopy (TEM) to detect both low concentrations of Np in a U matrix and to provide evidence for incorporation of Np in U(VI) phases. The case for U(VI) secondary minerals acting as solubility-controlling phases for Np in repository performance assessment models has not been fully established. Direct evidence for incorporation, rather than sorption, continues to be difficult to obtain. Detection of Np with TEM-EELS is hampered by the occurrence of a plural (multiple) scatte

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38

Rusz, Ján, Hans Lidbaum, Stefano Rubino, Björgvin Hjörvarsson, Peter M. Oppeneer, Olle Eriksson, and Klaus Leifer. "Influence of plural scattering on the quantitative determination of spin and orbital moments in electron magnetic chiral dichroism measurements." Physical Review B 83, no. 13 (April 6, 2011). http://dx.doi.org/10.1103/physrevb.83.132402.

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