Journal articles on the topic 'Power Electronics Reliability'
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Iannuzzo, Francesco, and Mauro Ciappa. "Reliability issues in power electronics." Microelectronics Reliability 58 (March 2016): 1–2. http://dx.doi.org/10.1016/j.microrel.2016.01.012.
Full textZhdanov, I. Y., and M. A. Ostapchuk. "Stand for passive thermal cycling tests of power semiconductor components in complex temperature." Superconductivity: Fundamental and Applied Research 6, no. 1 (2025): 74–81. https://doi.org/10.62539/2949-5644-2024-6-1-74-81.
Full textWhite, Robert V. "Advancing Power Electronics Reliability [White Hot]." IEEE Power Electronics Magazine 8, no. 2 (2021): 100–99. http://dx.doi.org/10.1109/mpel.2021.3075786.
Full textScheuermann, U. "Reliability challenges of automotive power electronics." Microelectronics Reliability 49, no. 9-11 (2009): 1319–25. http://dx.doi.org/10.1016/j.microrel.2009.06.045.
Full textJiao, Chaoqun, Juan Zhang, Zhibin Zhao, Zuoming Zhang, and Yuanliang Fan. "Research on Small Square PCB Rogowski Coil Measuring Transient Current in the Power Electronics Devices." Sensors 19, no. 19 (2019): 4176. http://dx.doi.org/10.3390/s19194176.
Full textPires, Igor Amariz, Rafael Atila Silva, Anderson Vagner Rocha, Matheus Pereira Porto, Thales Alexandre Carvalho Maia, and Braz de Jesus Cardoso Filho. "Oil Immersed Power Electronics and Reliability Enhancement." IEEE Transactions on Industry Applications 55, no. 4 (2019): 4407–16. http://dx.doi.org/10.1109/tia.2019.2915276.
Full textLu, Hua, Chris Bailey, and Chunyan Yin. "Design for reliability of power electronics modules." Microelectronics Reliability 49, no. 9-11 (2009): 1250–55. http://dx.doi.org/10.1016/j.microrel.2009.07.055.
Full textZeng, Jia Si, Yi Bo Gao, Feng Yang, et al. "Reliability Evaluation of Mid-Voltage DC Distribution Network with Multiple Topologies." Applied Mechanics and Materials 666 (October 2014): 112–18. http://dx.doi.org/10.4028/www.scientific.net/amm.666.112.
Full textHossein Rahimighazvini, Zeyad Khashroum, Maryam Bahrami, and Milad Hadizadeh Masali. "Power electronics anomaly detection and diagnosis with machine learning and deep learning methods: A survey." International Journal of Science and Research Archive 11, no. 2 (2024): 730–39. http://dx.doi.org/10.30574/ijsra.2024.11.2.0428.
Full textZacharias, Peter. "Design and Applications of Controllable Magnetic Devices in Power Electronic Circuits and Power Systems." Journal of Electronics and Advanced Electrical Engineering 1, no. 2 (2021): 6–14. http://dx.doi.org/10.47890/jeaee/2020/peterzacharias/11120007.
Full textFreitas, Luiz Carlos Gomes, Marcelo Godoy Simoes, and Paulo Peixoto Praça. "Power Electronics Converters for On-Board Electric Power Systems." Energies 16, no. 9 (2023): 3771. http://dx.doi.org/10.3390/en16093771.
Full textHozoji, Hiroshi, Fumiki Kato, So Tanaka, Jiro Shinkai, and Hiroshi Sato. "Power Electronics Packaging Materials for High Heat Reliability." Journal of The Japan Institute of Electronics Packaging 24, no. 3 (2021): 233–40. http://dx.doi.org/10.5104/jiep.24.233.
Full textGurav, Abhijit, John Bultitude, John McConnell, and Reggie Phillips. "Robust Reliability of Ceramic Capacitors for Power Electronics." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2018, HiTEC (2018): 000138–42. http://dx.doi.org/10.4071/2380-4491-2018-hiten-000138.
Full textFolayan G.B, Folayan G. B. "Reliability-Centric Review of FaultTolerant Control Systems in Power Electronics Applications." International Journal of Advances in Engineering and Management 7, no. 6 (2025): 299–305. https://doi.org/10.35629/5252-0706299305.
Full textMestha, Soumya Rani, and Pinto Pius A.J. "Investigation of reliability assessement in power electronics circuits using machine learning." International Journal of Power Electronics and Drive Systems (IJPEDS) 12, no. 1 (2021): 558. http://dx.doi.org/10.11591/ijpeds.v12.i1.pp558-566.
Full textSoumya, Rani Mestha, and Pius A.J. Pinto. "Investigation of reliability assessement in power electronics circuits using machine learning." International Journal of Power Electronics and Drive System (IJPEDS) 12, no. 1 (2021): 558–66. https://doi.org/10.11591/ijpeds.v12.i1.pp558-566.
Full textV., Bharatidevi. "Applications of Transformers in Electronics: Advancements and Innovations." Recent Trends in Thermodynamics and Thermal Energy System 1, no. 1 (2025): 1–4. https://doi.org/10.5281/zenodo.14849668.
Full textBrewer, Roger. "High Reliability Electronics for Demanding Aircraft Applications – An Overview." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2016, HiTEC (2016): 000011–17. http://dx.doi.org/10.4071/2016-hitec-11.
Full textKirti, Jawalbankar*, and obula Reddy Prof.K.Chandra. "DIFFERENT METHODS FOR DG ANTI-ISLANDING PROTECTION." INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY 5, no. 4 (2016): 772–76. https://doi.org/10.5281/zenodo.50406.
Full textCalleja, Hugo, and Freddy Chan. "Reliability: A Neglected Topic in the Power Electronics Curricula." Journal of Power Electronics 10, no. 6 (2010): 660–66. http://dx.doi.org/10.6113/jpe.2010.10.6.660.
Full textDababneh, Amer B., Ben Goerdt, Timothy Marler, and Ibrahim T. Ozbolat. "A Virtual Prognostic Tool for Nuclear Power Electronics Reliability." Computer-Aided Design and Applications 11, no. 2 (2013): 228–38. http://dx.doi.org/10.1080/16864360.2014.846097.
Full textJyotsana, Kaiwart, and Huddar Anupama. "Power quality improvement in power electronics systems using machine learning." i-manager's Journal on Circuits and Systems 11, no. 1 (2023): 34. http://dx.doi.org/10.26634/jcir.11.1.19492.
Full textPersons, Ryan, and Paul Gundel. "Print Copper on Ceramic for High Reliability Electronics." International Symposium on Microelectronics 2015, no. 1 (2015): 000330–35. http://dx.doi.org/10.4071/isom-2015-wp12.
Full textYan, Haowei. "Recent Advancements and Application Of Z-Source Inverters." Highlights in Science, Engineering and Technology 81 (January 26, 2024): 1–13. http://dx.doi.org/10.54097/q2bks263.
Full textBlaabjerg, Frede, and Michael M. Pecht. "Special Issue on Robust Design and Reliability of Power Electronics, IEEE Transactions on Power Electronics, May 2015." IEEE Transactions on Power Electronics 30, no. 5 (2015): 2373–74. http://dx.doi.org/10.1109/tpel.2014.2376271.
Full textOKABE, Nagatoshi, Mitsuyoshi TSUTSUMI, and Xia ZHU. "Testing Method and Reliability Design of Reliability Estimation in Mounting Power Electronics Semiconductor." Proceedings of the 1992 Annual Meeting of JSME/MMD 2002 (2002): 253–54. http://dx.doi.org/10.1299/jsmezairiki.2002.0_253.
Full textPang, Y., E. Scott, J. D. van Wyk, and Z. Liang. "Assessment of Some Integrated Cooling Mechanisms for an Active Integrated Power Electronics Module." Journal of Electronic Packaging 129, no. 1 (2006): 1–8. http://dx.doi.org/10.1115/1.2429703.
Full textTan, Yangyang, Jun Liu, Sichang Xu, Peng Zhong, Qi Zhang, and Lin Hu. "Operational reliability evaluation of PV inverter considering relative humidity and its application on power system." E3S Web of Conferences 185 (2020): 01050. http://dx.doi.org/10.1051/e3sconf/202018501050.
Full textWassick, Thomas A. "Electromigration in Lead – Free Solder: A Power IC Perspective." International Symposium on Microelectronics 2013, no. 1 (2013): 000753–57. http://dx.doi.org/10.4071/isom-2013-wp61.
Full textGupta, Priyanka, Gurulakshmi A.B, Ginni Nijhawan, Praveen, Lalit Kumar Tyagi, and Raghad Ahmed Hussien. "A review on Machine Learning Enhanced Predictive Maintenance for Electric Vehicle Power Electronics: A Pathway to Improved Reliability and Longevity." E3S Web of Conferences 505 (2024): 03017. http://dx.doi.org/10.1051/e3sconf/202450503017.
Full textDrobnik, Joe, and Praveen Jain. "Electric and Hybrid Vehicle Power Electronics Efficiency, Testing and Reliability." World Electric Vehicle Journal 6, no. 3 (2013): 719–30. http://dx.doi.org/10.3390/wevj6030719.
Full textKhazaka, R., L. Mendizabal, D. Henry, and R. Hanna. "Survey of High-Temperature Reliability of Power Electronics Packaging Components." IEEE Transactions on Power Electronics 30, no. 5 (2015): 2456–64. http://dx.doi.org/10.1109/tpel.2014.2357836.
Full textTeixeira, Tiago M. L., and Juan Bevan. "Product Development of High Power Electronics for High Reliability Applications." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2017, HiTEN (2017): 000213–17. http://dx.doi.org/10.4071/2380-4491.2017.hiten.213.
Full textBayerer, Reinhold. "Advanced packaging yields higher performance and reliability in power electronics." Microelectronics Reliability 50, no. 9-11 (2010): 1715–19. http://dx.doi.org/10.1016/j.microrel.2010.07.016.
Full textIshizaki, T., A. Kuno, A. Tane, et al. "Reliability of Cu nanoparticle joint for high temperature power electronics." Microelectronics Reliability 54, no. 9-10 (2014): 1867–71. http://dx.doi.org/10.1016/j.microrel.2014.07.113.
Full textArifujjaman, Md, M. T. Iqbal, and J. E. Quaicoe. "Reliability analysis of grid connected small wind turbine power electronics." Applied Energy 86, no. 9 (2009): 1617–23. http://dx.doi.org/10.1016/j.apenergy.2009.01.009.
Full textNovak, M., A. Sangwongwanich, and F. Blaabjerg. "Monte Carlo-Based Reliability Estimation Methods for Power Devices in Power Electronics Systems." IEEE Open Journal of Power Electronics 2 (2021): 523–34. http://dx.doi.org/10.1109/ojpel.2021.3116070.
Full textPaul, Arun Kumar. "Experimental exploration of functional integrity, functional reliability and reliability of modern power electronics equipments." International Journal of Power Electronics 3, no. 4 (2011): 374. http://dx.doi.org/10.1504/ijpelec.2011.040803.
Full textFan, Guangyu, Christine Labarbera, Ning-Cheng Lee, and Colin Clark. "Shear Strength and Thermomechanical Reliability of Sintered Ag Joints Containing low CTE Non-metal Additives for Die Attach." International Symposium on Microelectronics 2018, no. 1 (2018): 000167–72. http://dx.doi.org/10.4071/2380-4505-2018.1.000167.
Full textXiao, Mingxin. "Application of Power Electronics Technology in Renewable Energy Systems." Studies in Social Science Research 5, no. 2 (2024): p157. http://dx.doi.org/10.22158/sssr.v5n2p157.
Full textKaessner, Stefan, Markus G. Scheibel, Stefan Behrendt, Bianca Boettge, Christoph Berthold, and Klaus G. Nickel. "Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging." Journal of Microelectronics and Electronic Packaging 15, no. 3 (2018): 132–39. http://dx.doi.org/10.4071/imaps.661015.
Full textKaessner, S., M. G. Scheibel, S. Behrendt, B. Boettge, and K. G. Nickel. "Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging." International Symposium on Microelectronics 2018, no. 1 (2018): 000425–33. http://dx.doi.org/10.4071/2380-4505-2018.1.000425.
Full textChow, T. Paul. "SiC Bipolar Power Devices." MRS Bulletin 30, no. 4 (2005): 299–304. http://dx.doi.org/10.1557/mrs2005.77.
Full textBouchetob, Elaid, and Bouchra Nadji. "Boosting Reliability." International journal of electrical and computer engineering systems 15, no. 4 (2024): 313–20. http://dx.doi.org/10.32985/ijeces.15.4.2.
Full textYuan, Cadmus, René Kregting, Willem van Driel, Sander Gielen, An Xiao, and G. Q. (Kouchi) Zhang. "Overview on Thermal and Mechanical Challenges of High Power RF Electronic Packaging." International Symposium on Microelectronics 2011, no. 1 (2011): 000418–29. http://dx.doi.org/10.4071/isom-2011-tp6-paper4.
Full textZhou, Gangyi. "Research on the Reliability Methods of SiC MOSFET Power Devices." Applied and Computational Engineering 140, no. 1 (2025): 90–99. https://doi.org/10.54254/2755-2721/2025.21535.
Full textSawan, Mohamad, B. Gosselin, J. Coulombe, A. E. Ayoub, A. Chaudhuri, and F. Leporé. "Implantable Electronics for the Recovery of Neuromuscular Functions." Advances in Science and Technology 57 (September 2008): 204–9. http://dx.doi.org/10.4028/www.scientific.net/ast.57.204.
Full textSHENAI, KRISHNA. "THE PERFECT POWER SEMICONDUCTOR SWITCH FOR 21st CENTURY GLOBAL ENERGY ECONOMY." Journal of Circuits, Systems and Computers 22, no. 10 (2013): 1340020. http://dx.doi.org/10.1142/s0218126613400203.
Full textDhameliya, Niravkumar. "Power Electronics Innovations: Improving Efficiency and Sustainability in Energy Systems." Asia Pacific Journal of Energy and Environment 9, no. 2 (2022): 71–80. http://dx.doi.org/10.18034/apjee.v9i2.752.
Full textPalmer, David W. "Test Structures as a Way to Evaluate Packaging Reliability." MRS Bulletin 18, no. 12 (1993): 55–58. http://dx.doi.org/10.1557/s0883769400039105.
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