Relevant bibliographies by topics / Profilometry / Dissertations / Theses
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Dissertations / Theses on the topic 'Profilometry'

Author: Grafiati
Published: 4 June 2021
Last updated: 25 July 2025

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1

Fojtík, Tomáš. "Systém pro precizní 3D snímání spojitého povrchu nožní klenby." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2014. http://www.nusl.cz/ntk/nusl-220692.

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This thesis deals with the development of the user interface for the application of the method Phase shifting profilometry. First deals with the theoretical approach of this method, and describes the process of image segmentation and data processing using morphological operations. In the practical part of the user interface is designed for acquiring and processing data received in Matlab.
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2

Aumond, Bernardo Dantas 1972. "High precision profilometry." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/46102.

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3

Clark, Stephan Richard. "Optical reference profilometry." Diss., The University of Arizona, 2000. http://hdl.handle.net/10150/289168.

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The Optical Reference Profilometer is a new coordinate measurement machine (CMM) configuration that utilizes a special optical referencing frame to provide a highly stable and highly accurate surface measurement. This new referencing frame provides several mechanical advantages that make it possible to use lower precision mechanical components while still maintaining a high measurement accuracy. The Optical Reference Profilometer also provides a reduced measurement sensitivity to thermal variations of the system. With the addition a Super-Invar metering rod network, this CMM system is essentia
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4

Yang, Ho Soon. "Developments in stylus profilometry." Thesis, University College London (University of London), 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.342210.

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Aumond, Bernardo Dantas 1972. "High precision stereo profilometry." Thesis, Massachusetts Institute of Technology, 2001. http://hdl.handle.net/1721.1/88892.

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Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.<br>Includes bibliographical references (leaves 186-190).<br>Metrological data from sample surfaces can be obtained by using a variety of profilome try methods. Atomic Force Microscopy (AFM), which relies on contact inter-atomic forces to extract topographical images of a sample, is one such method that can be used on a wide range of surface types, with possible nanometer resolution (both vertical andlateral). However, AFM images are commonly distorted by convolution, which reduces metrological accurac
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6

Chiu, Cheng-Jung. "Data processing in nanoscale profilometry." Thesis, Massachusetts Institute of Technology, 1995. http://hdl.handle.net/1721.1/36677.

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Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1995.<br>Includes bibliographical references (p. 176-177).<br>New developments on the nanoscale are taking place rapidly in many fields. Instrumentation used to measure and understand the geometry and property of the small scale structure is therefore essential. One of the most promising devices to head the measurement science into the nanoscale is the scanning probe microscope. A prototype of a nanoscale profilometer based on the scanning probe microscope has been built in the Laboratory for Manufacturing a
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Sun, Wenyang. "Profilometry with volume holographic imaging." Thesis, Massachusetts Institute of Technology, 2006. http://hdl.handle.net/1721.1/35631.

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Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006.<br>Includes bibliographical references (p. 127-133).<br>High resolution, non-contact object profile measurement (profilometry) at long working distance is important in a number of application areas, such as precise parts manufacturing, optical element grounding and polishing, adversary target identification in military, terrace profiling, etc. The Volume Holographic (VH) lens is a novel optical element which process the incident light field in a 3D fashion. It has been shown with promising applicatio
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8

BELL, BERNARD WHITE JR. "DIGITAL HETERODYNE TOPOGRAPHY (MOIRE, CONTOURING, PROFILOMETRY)." Diss., The University of Arizona, 1985. http://hdl.handle.net/10150/187971.

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Digital heterodyne methods are employed in conjunction with periodic fringe projection to produce a fast automated surface relief measurement technique. A method of sampling the image with a solid state detector array which produces a moire fringe image free of the noise terms normally present with moire techniques is presented along with an extension to Whittaker-Shannon sampling theory to cover the moire aliasing phenomena. The limitations imposed on the surface slopes by the requirement that the properly moire sampled image spectra must be confined to a moire interval are given. Moire sampl
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Johnson, Max LeGrand Jr. "Characterization of geotechnical surfaces via stylus profilometry." Thesis, Georgia Institute of Technology, 2000. http://hdl.handle.net/1853/20705.

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10

Coggrave, Charles Russell. "Temporal phase unwrapping : development and application of real-time systems for surface profile and surface displacement measurement." Thesis, Loughborough University, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251061.

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11

Pennington, Timothy L. "Miniaturized 3--D Mapping System Using a Fiber Optic Coupler as a Young's Double Pinhole Interferometer." Diss., Virginia Tech, 2000. http://hdl.handle.net/10919/27993.

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Three--dimensional mapping has many applications including robot navigation, medical diagnosis and industrial inspection. However, many applications remain unfilled due to the large size and complex nature of typical 3--D mapping systems. The use of fiber optics allows the miniaturization and simplification of many optical systems. This research used a fiber optic coupler to project a fringe pattern onto an object to be profiled. The two outputs fibers of the coupler were brought close together to form the pinholes of a Young's Double Pinhole Interferometer. This provides the advantages of
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12

Hui, Tak-wai. "Solder paste inspection based on phase shift profilometry." Click to view the E-thesis via HKUTO, 2007. http://sunzi.lib.hku.hk/HKUTO/record/B39558411.

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Hui, Tak-wai, and 許德唯. "Solder paste inspection based on phase shift profilometry." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2007. http://hub.hku.hk/bib/B39558411.

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14

Deng, Fuqin, and 鄧輔秦. "Computational surface profilometry and its applications in semiconductor inspection." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2014. http://hdl.handle.net/10722/206340.

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Non-contact surface profilometry techniques, especially the phase-measuring profilometry, have been evolved dramatically over recent years. Besides the simple triangulation configuration with a fringe pattern projection system and digital imaging system, efficient computational surface profilometry techniques have also drawn tremendous attention from both academia and a wide range of applications. In the semiconductor industry, high-precision and high-speed, automated optical inspection systems are urgently needed to ensure high quality of semiconductor devices and yield improvement on the pro
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15

Berryman, Fiona. "Fourier transform profilometry for measuring back shape in scoliosis." Thesis, University of Wolverhampton, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.430997.

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16

Lindström, Tomas. "Characterization of interfaces by elastic light scattering and profilometry /." Uppsala : Acta universitatis upsaliensis, 1999. http://catalogue.bnf.fr/ark:/12148/cb392991128.

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17

Schwerdtfeger, Jan Vladimir. "Statistical heterogeneities of plastic deformation : an investigation based on surface profilometry." Thesis, University of Edinburgh, 2008. http://hdl.handle.net/1842/14363.

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In this Thesis we use atomic force microscopy (AFM) and scanning white light interferometry (Zygo) to investigate the spatial heterogeneity of plastic flow in crystalline materials. To this end we analyze one-dimensional surface profiles obtained from surface maps of deformed Alkali Halide single crystals. The Alkali Halides investigated were potassium chloride (KCI) and lithium fluoride (LiF), both of high purity. In the case of LiF also irradiation hardened LiF was investigated. For the deformed surfaces of the pure Alkali Halides we find self-affine behaviour with an exponent of about ζ=0.7
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18

Trail, Nicholas. "Imaging Profilometry For In Situ Measurement of Plasma Spray Coating Thickness." Diss., The University of Arizona, 2015. http://hdl.handle.net/10150/560844.

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Thermal Barrier Coatings (TBCs), and plasma spray coatings in general, require critical control over the deposited thickness to achieve reliable coating performance. Currently, the plasma spray industry quantifies thickness by sampling the part before and after TBC deposition. Approximate thickness is thus inferred from previous runs. However, process variability can allow errors to propagate in this result that leads to wasted time and resources, and can ultimately lead to non-reliant coatings. To this end, an in situ optical fringe profilometer is developed that enables coating thickness me
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19

Watts, Richard Adrian. "The optical response of metallic diffraction gratings." Thesis, University of Exeter, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361343.

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20

Yalla, Veeraganesh. "OPTIMAL PHASE MEASURING PROFILOMETRY TECHNIQUES FOR STATIC AND DYNAMIC 3D DATA ACQUISITION." UKnowledge, 2006. http://uknowledge.uky.edu/gradschool_diss/348.

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Phase measuring Profilometry (PMP) is an important technique used in 3D data acquisition. Many variations of the PMP technique exist in the research world. The technique involves projecting phase shifted versions of sinusoidal patterns with known frequency. The 3D information is obtained from the amount of phase deviation that the target object introduces in the captured patterns. Using patterns based on single frequency result in projecting a large number of patterns necessary to achieve minimal reconstruction errors. By using more than one frequency, that is multi-frequency, the error is red
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21

Widjanarko, Taufiq. "Hyperspectral interferometry for single-shot profilometry and depth-resolved displacement field measurement." Thesis, Loughborough University, 2011. https://dspace.lboro.ac.uk/2134/8349.

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A new approach to the absolute measurement of two-dimensional optical path differences is presented in this thesis. The method, which incorporates a white light interferometer and a hyperspectral imaging system, is referred to as Hyperspectral Interferometry. A prototype of the Hyperspectral Interferometry (HSI) system has been designed, constructed and tested for two types of measurement: for surface profilometry and for depth-resolved displacement measurement, both of which have been implemented so as to achieve single shot data acquisition. The prototype has been shown to be capable of perf
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22

Zhang, Hong. "The phase shifting technique and its application in 3-D fringe projection profilometry." Thesis, Liverpool John Moores University, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.310141.

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23

Eisenburger, Michael Gregor Walter. "Studies on dental erosion and attrition using a new ultrasonication and profilometry technique." Thesis, University of Bristol, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.247553.

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24

Neeley, Alexandra. "Characterizing the Localized Corrosion of AA7075-T6 and AA2024-T3 by Optical Profilometry." The Ohio State University, 2012. http://rave.ohiolink.edu/etdc/view?acc_num=osu1330391114.

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25

Murthy, M. S. Narasimha. "A study of the application of phase mapped profilometry for measuring optic disc topography." Thesis, University of Aberdeen, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.484245.

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26

Taudt, Ch, T. Baselt, B. Nelsen, et al. "Evaluation of the thermal stability of a low-coherence interferometer for precision surface profilometry." SPIE, 2017. https://tud.qucosa.de/id/qucosa%3A34883.

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Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high standards in manufacturing and quality control. Appropriate surface topography measurement technologies should therefore deliver nm accuracy in the axial dimension under typical industrial conditions. This work shows the characterization of a dispersion-encoded low-coherence interferometer for the purpose of fast and robust surface topography measurements. The key component of the interferometer is an element with known dispersion. This dispersive element delivers a controlled phase variation in
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27

Ersvik, Erik, and Roj Khalid. "Milling in hardened steel - a study of tool wear in conventional- and dynamic milling." Thesis, Uppsala universitet, Tillämpad materialvetenskap, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255646.

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Milling is a commonly used machining process where a rotating cutter removes material from the workpiece. In recent years, attention has been turned towards so called dynamic milling methods which differ from the conventional way of milling. Dynamic milling normally uses, as opposed to the conventional way, more of the axial cutting edge, smaller radial depth of cut, significantly higher cutting speed and feed per tooth. The method has demonstrated potential to save both time and money under specific circumstances, for manufacturing companies.This thesis was conducted at ISCAR Sverige AB in Up
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28

Vacula, Daniel. "Automatizace metody měření povrchových struktur reflexním digitálním holografickým mikroskopem." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2010. http://www.nusl.cz/ntk/nusl-228893.

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Reflected-light digital holographic microscope developed at IPE FME BUT uses off-axis holography principle and low spatial and temporal coherence illumination. Microscope allows reconstruction of the image amplitude and the image phase, which can be handled in real time. The only limiting factors are imaging speed of the detector and computer performance when processing holograms. Reconstruction of image phase and amplitude allows high-resolution profilometric measurements in the vertical axis direction. This thesis deals with the automatization of profilometric measurement method proposed in
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29

Bilmont, Marsha F. "FURTHER INVESTIGATIONS INTO SURFACE STRUCTURE AND THE BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION (LIGHT-SCATTER, ROUGHNESS, PROFILOMETRY)." Thesis, The University of Arizona, 1985. http://hdl.handle.net/10150/275398.

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30

Xu, Wu-Xian, and 許武憲. "Optical heterodyne profilometry." Thesis, 1996. http://ndltd.ncl.edu.tw/handle/03673622042849909740.

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碩士<br>國立交通大學<br>光電工程研究所<br>84<br>We utilized the principle which foci are different for parallel polarized beam and vertical polarized beam passing through birefringent lens ;the beamwhich it is focused on the sample surface and acts astest beam ; the other beam which is collimated and illuminates a small area on the sample surface and acts as reference beam . since E-O modulated , there is frequency difference between the two orthogonal linear polarized beams , then it measured phase chang
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Chen, Yo-Wei, and 陳佑威. "Shadow Moire Profilometry." Thesis, 2010. http://ndltd.ncl.edu.tw/handle/51260091131506415658.

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碩士<br>國立中興大學<br>機械工程學系所<br>98<br>When the specimen was examined through the grating, the lines of the grating were observed, as well as the changes of the grating’s shadow according to the specimen’s profilometry. The lines and shadows from the grating together produced a moire fringe pattern; it is called a shadow moire pattern. The method of calculating the profilometry using the moire is called the shadow moire. This research was to measure a specimen’s profilometry using the phase shift technique according to shadow moire. 　　This research proposes that using the flatbed scanner to record
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Tsai, Cheng-Yu, and 蔡政育. "Profilometry Using Depth from Defocus." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/29267095306990575864.

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碩士<br>國立中興大學<br>機械工程學系所<br>99<br>In this paper, three dimension shape is recovered by blurring images, the blurring images can be adjusted by three camera parameters, namely focal length, aperture diameter, distance between the lens and the image detector plane, in this study, we get the defocusing images by adjusting the image detector plane, and then calculate the wavelet coefficient power spectrum of two different defocusing images recover three dimension shape, the relationship with differences in size of the power spectrum and the degree of blur, the fluctuation of surface will affect the
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Chen, Shang-Fang, and 陳聖芳. "THE STUDY OF HETERODYNE PROFILOMETRY." Thesis, 1993. http://ndltd.ncl.edu.tw/handle/73557680103167163553.

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碩士<br>中原大學<br>機械工程研究所<br>81<br>Measuring surface profile can not only know the smoothness of surface ，but also know the surface roughness if sampling points are more enough and sensitivity is high enough．There are many applications such as mirrors coatings、polishing、 friction、 lubrication and so on． Heterodyne profilometry has the advantages of high sensitivity and excellent spatial resolution and non-contact measurement．This paper uses heterodyne profilometry to measure surface profile．The
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34

Wu, Zhong-Ying, and 吳忠穎. "Phase-measuring profilometry of 3D objects." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/92162403252672758663.

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碩士<br>國立交通大學<br>顯示科技研究所<br>94<br>The application of surface profile measurement is very extensive, such as product testing, reverse engineering, and so on, while how to make the measurement fast and accurate has been crucial. In this paper, we deduce the surface profile of a 3D diffuse object by measurement of the phase distribution across the image of a projected grating deformed by the surface. As a detailed evaluation, we first simulated the experimental structure by using MATLAB software, and explored possible error produced by the corresponding approach. Finally, we have built up the syst
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Chen, Wei-jen, and 陳煒仁. "Projected Fringe Profilometry using Diffractive Elements." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/82055859832032318124.

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碩士<br>國立中山大學<br>材料科學研究所<br>94<br>A technique using diffractive elements for finding the absolute shape of a large-scale object is proposed. An accurate projected fringe profilometry can be built by applying the holographic technique in this system. The advantages of using the presented technique for projected fringe profilemetry are : (1) a large depth of field ; (2) very low fringe distortion ; (3) a compact design for the measurement system ; (4) high accuracy ; (5) fast measurement speed.
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HSU, CHIA-YU, and 許嘉佑. "Mask optimization for fringe projection profilometry." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/22y48v.

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碩士<br>國立高雄應用科技大學<br>光電與通訊工程研究所<br>106<br>In this paper, a mask using image processing is proposed to extract the fringe region in the depth of field of the system in the fringe projection profilometry. This mask can more accurately obtain the edge of the object in the image. This mask algorithm is used to explore the help of fringe message control for various fringe projection profilometry. It is also proposed to use the fringe mask to search for fringe information in the near-focus area. A fringe mask that matches the fringe depth of field to increase measurement speed. The range of the focal
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37

Helg, Tina Louise. "Novel Interferometric Techniques in Profilometry and Spectrometry." 2000. http://hdl.handle.net/2292/603.

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The work in this thesis is in the fields of profilometry and Fourier transform spectrometry. Deformation measurement of diffuse objects by phase stepping was achieved by thermal frequency drift in a HeNe laser. The system was easy to construct, required no specialised components, was immune to the effects of piezo-actuator hysteresis, and was capable of producing phase maps in which noise was less than 1/20λ. A method was proposed for measuring absolute surface profile by scanning frequency over the range of a white light source. The coincidence technique of coherence radar was used to measure
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38

李勇民. "Microscopic surface profilometry by fringe projection method." Thesis, 2004. http://ndltd.ncl.edu.tw/handle/34740978605374358701.

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碩士<br>國立中興大學<br>機械工程學系<br>92<br>This paper describes the usage of fringe projection method and triangulation principle for three dimension surface profile measurement of micro component. In this method, Gray-code and Phase-shifting cosinusoidal pattern are projected onto micro-component surface by a programmable liquid crystal display (LCD) and a stereo microscope. The Gray-code method is exploited to detect discontinuities of the surface, whereas Phase-shifting technique allows the measurement of fine surface details. This system use mathematical model of mapping function to compensate variou
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Wang, Chun-Chieh, and 王俊杰. "Noninterferometric Widefield Optical Profilometry and Its Applications." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/37172490109641910506.

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博士<br>國立中正大學<br>物理所<br>95<br>This thesis introduces the study of membrane dynamics of living cells by using “non-inteferometric widefield optical profilometry (NIWOP).” NIWOP obtains surface topography without contacting and scanning the sample surface. It is also compatible to fluorescence labeling techniques. Therefore, it is very suitable for the study on cell membrane dynamics and cell physiology. The principle of NIWOP is based on widefield optical sectioning microscopy (WOSM) and differential confocal microscopy (DCM). The former achieves optical sectioning ability by projecting a high-s
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Song, Chun-Hung, and 宋俊宏. "Profilometry of spherical lens using flash interferometry." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/26452047685312807509.

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碩士<br>國立中興大學<br>機械工程學系所<br>99<br>The spherical lens elements have played an important role in the applications of current optical products up to now. Therefore, it is significant for the performance of the entire optical systems to enhance the detection of the surface profile of the spherical lens and to improve the manufacturing precision of the optical systems. After several years’ development in techniques for the measurement of the surface profile of the spherical lens, the phase shifting methods have commonly been used in high precision measurement. However, there are some obstacles to th
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Huang, Jun-shan, and 黃俊善. "Projected Fringe Profilometry for dynamic micro-scale measurements." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/2dgpz5.

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碩士<br>國立中山大學<br>材料科學研究所<br>95<br>A novel technique using projected fringe profilometry with pulsed illuminations for finding the absolute shape of a dynamic object, which is vibrating with high frequency, is proposed. The proposed method can accurately describe the observed 3D shape at a sequence of time. Even though the tested object vibrates up to 10K-Hz, the proposed method can accurately describe the observed 3D shape at any specific time. Depth accuracy better than one part in ten thousandths of the field of view can be achieved even with excessive image noises. Furthermore, the light sou
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Chang, Yi-Wei, and 張奕威. "Research on Multi-wavelength Differential Confocal Surface Profilometry." Thesis, 2013. http://ndltd.ncl.edu.tw/handle/52nj68.

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博士<br>國立臺北科技大學<br>機電科技研究所<br>101<br>This study presents a novel Multi-wavelength Differential Confocal surface profilometer using broadband light source, dispersion chromatic objective and two color line CCD devices. Optical confocal microscopy for surface profilometry has become extremely important due to its high longitudinal measurability range and excellent vertical resolution. In this study, the system was developed to establish a multi-wavelength line chromatic confocal mathematical model and generate accurate wavelength-to-depth conversion for in-situ 3-D profile measurement without the
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43

Huang, Bo-Chin, and 黃柏欽. "Projected Fringe Profilometry Techniques Using for Specular Surfacess." Thesis, 2015. http://ndltd.ncl.edu.tw/handle/ftzh38.

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碩士<br>國立中山大學<br>材料與光電科學學系研究所<br>103<br>A fringe projection method for specular is presented. For specular objects, only part of the refracted light can be detected by a CCD camera. Thus, the typical projected fringe profilometry cannot be used for specular surfaces. In the proposed method, a fringe pattern is posited in front of the specular surface. A virtual image therefore is produced behind the specular surface. Fringes on the virtual image are deformed by topography of the specular place the object. Thus, phase of the deformed fringes is desirable to retrieve the profile of the specular s
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44

Liao, Chu-Chin, and 廖至欽. "Calibration of a Digital Fringe 3-D Profilometry." Thesis, 2004. http://ndltd.ncl.edu.tw/handle/67448594469344297003.

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碩士<br>國立臺北科技大學<br>自動化科技研究所<br>92<br>An effective calibration method has been successfully developed to significantly increase the accuracy of 3-D surface measurement using digital fringe projection and phase-shifting method. In digital fringe projection, the image intensity and distribution of the sinusoidal fringe patterns projected on the measured surface may be affected by lens distortions and image aberrations. The phase difference calculated by the phase shift principle can be influenced by this problem and become nonlinear to the optical phase difference (OPD) existing between the surfac
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45

Lee, Cheng-He, and 李承和. "The Application of Homography in Line Laser Profilometry." Thesis, 2015. http://ndltd.ncl.edu.tw/handle/87436853005040559394.

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碩士<br>國立中興大學<br>機械工程學系所<br>103<br>The purposeof this studydevelop a novel non-contact measurement system of three-dimensional and calibration.Line laser triangulation measurement method which architecture is line lasers, cameras, measurement.This method can utilize thetriangular geometry, through digital images to measure the objects in space coordinate information.First, we set up a camera calibration model to get the cameracoordinates and image coordinates and world coordinates betweenrelationship of coordinate conversion.Again we have to make line laser tothin and filtering, finally, we dir
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Hou, Cheng-Cheng, and 侯政呈. "Single interference fringe image phase retrieval in profilometry." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/91289977709934925358.

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碩士<br>國立中興大學<br>機械工程學系所<br>102<br>The present study employs a single interference pattern phase retrieval to collect data on surface profilometry. Since single im- ages have fewer environmental constraints than a multi-step phase shift method, it is possible to glean phase data from the interfer- ence pattern generated by this method using phase measurement techniques. This data can subsequently be converted into a surface profilometry of an object. However, calculating the phase through the Fourier transform method results in frequency leakage, if the edges of the interference pattern lack su
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47

Chang, Chia-Yuan, and 張家源. "White Light Phase Shifting Interferometry for Surface Profilometry." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/72572170054195677152.

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TSAI, YU-NAN, and 蔡佑男. "Three-Dimension Profilometry of a Plaster Tooth-Model." Thesis, 2002. http://ndltd.ncl.edu.tw/handle/59227992653725981789.

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碩士<br>中原大學<br>機械工程研究所<br>90<br>Abstract The application of the three dimensional measurement has been widely used in the industry. Currently, three-dimensional digital scanning technique has shown different faces and significance in various fields, such as multimedia model construction, digital preservation of cultural art etc. But, the application in the medical field is still waiting to be developed. In this research, using non-contact optical measurement, along with high-order polynomial three-dimension space mapping function technique, five-axial movement, 3-D coordinates conversion, and s
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LIN, YI-AN, and 林奕安. "Amplitude extraction method for 2D pattern projection profilometry." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/d4a739.

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碩士<br>國立高雄應用科技大學<br>光電與通訊工程研究所<br>106<br>In this paper, Amplitude extraction method is proposed. Projection and capture of images using a common optical axis path with a shallow depth of field lens. The object is sampled at each separation distance. Use filtered background image and fringe phase. The curve of the fringe changes with the depth of field of the lens. Then use the smoothing filter on the image to smooth the curve, obtain the amplitude without noise, and then use the amplitude of all the sampled images of the object to be tested, and use the quadratic function to find the maximum a
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Chen, Chao-nan, and 陳昭男. "Research of Chromatic Confocal Three-dimensional Surface Profilometry." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/7ndgd6.

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碩士<br>國立臺北科技大學<br>自動化科技研究所<br>97<br>An on-line 3-D surface profilometer for micro surface profiles with a long range and high resolution measurement was successfully developed using innovative slit-scan multi-wavelength confocal microscopy. In conventional confocal microscopy, vertical scanning of the object’s surface by either stage depth movement or shifting of the objective lens is extremely time consuming, thus resulting in unacceptable efficiency for on-line inspection. To overcome this, in this research, a multi-wavelength confocal microscope employing a broadband light source in combina
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