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Books on the topic 'Quality control Optical methods Automation x'

Author: Grafiati
Published: 10 December 2022
Last updated: 31 July 2025

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1

European, Congress on Optics (1st 1988 Hamburg Germany). In-process optical measurements: Proceedings. SPIE, 1989.

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2

R, Baker L., Caulfield H. J. 1936-, Sira Limited, Society of Photo-optical Instrumentation Engineers., Association nationale de la recherche technique., and International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (3rd : 1986 : Innsbruck, Austria), eds. Automatic optical inspection: 15-18 April 1986, Innsbruck, Austria. SPIE, 1986.

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3

M, Dawson Benjamin, Wilson Stephen S, Wu Frederick Y, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection II: 8-9 February 1994, San Jose, California. SPIE, 1994.

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4

W, Chen Michael J., Society of Photo-optical Instrumentation Engineers., and Carnegie-Mellon University. Center for Optical Data Processing., eds. Automated inspection and high speed vision architectures II: 10-11 November, 1988, Cambridge, Massachusetts. SPIE, 1989.

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5

Clist, Roger. Automated inspection 1992-93: FRST contract C08229, objective 1. Industrial Research, 1993.

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6

Y, Wu Frederick, Dawson Benjamin M, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection: 3-4 February 1993, San Jose, California. SPIE, 1993.

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7

Y, Wu Frederick, Wilson Stephen S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection III: 8-9 February 1995, San Jose, California. SPIE, 1995.

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8

Y, Wu Frederick, Ye Shenghua 1934-, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., and Guo jia zi ran ke xue ji jin wei yuan hui (China), eds. Automated optical inspection for industry: 6-7 November 1996, Beijing, China. SPIE, 1996.

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9

Tung-Shuen, Ho Anthony, Rao Sreenivas, Cheng Lee Ming, Society of Photo-optical Instrumentation Engineers., Society of Photo-optical Instrumentation Engineers. Singapore Chapter., and Institute of Physics Singapore, eds. Automatic inspection and novel instrumentation: 25-26 June 1997, Singapore. SPIE, 1997.

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10

Vision, '89 (1989 Chicago Ill ). Vision '89, April 24-27, 1989, Chicago, Illinois. Society of Manufacturing Engineers, 1989.

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11

G, Batchelor Bruce, Waltz Frederick M, and Society of Photo-optical Instrumentation Engineers., eds. Machine vision systems integration: Proceedings of a conference held 6-7 November 1990, Boston, Massachusetts. SPIE Optical Engineering Press, 1991.

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12

Tuczek, Hubertus C. Inspektion von Karosseriepressteilen auf Risse und Einschnürungen mittels Methoden der Bildverarbeitung. Springer, 1992.

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13

Lam, Edmund, and Philip R. Bingham. Image processing: Machine vision applications V : 25 January 2012, Burlingame, California, United States. Edited by IS & T--the Society for Imaging Science and Technology, SPIE (Society), and Electronic Imaging Science and Technology Symposium (2012 : Burlingame, Calif.). SPIE, 2012.

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14

Vision '90 (1990 Detroit, Mich.). Vision '90, November 12-15, 1990, Detroit, Michigan. Society of Manufacturing Engineers, 1990.

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15

Fofi, David. Image processing: Machine vision applications IV : 25-27 January 2011, San Francisco, California, United States. Edited by SPIE (Society) and IS & T--the Society for Imaging Science and Technology. SPIE, 2011.

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16

Fabrice, Mériaudeau, Niel Kurt S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XV: 29-30 January, 2007, San Jose, California, USA. SPIE, 2007.

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17

Fabrice, Mériaudeau, Niel Kurt S, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XIV: 16-17 January, 2006, San Jose, California, USA. SPIE, 2006.

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18

A, Ravishankar Rao, Chang Ning-San, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection VI: 27 January 1998, San Jose, California. SPIE, 1998.

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19

W, Tobin Kenneth, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection VIII: 24-26 January 2000, San Jose, California. SPIE, 2000.

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20

1970-, Price Jeffery Ray, Mériaudeau Fabrice, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection XII: 21-22 January, 2004, San Jose, California, USA. SPIE, 2004.

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21

1963-, Hunt Martin A., IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Machine vision applications in industrial inspection IX: 22-23 January 2001, San Jose, [California] USA. SPIE, 2001.

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22

Savage, Robert M. Automated inspection of soldered joints for surface mount technology. National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1993.

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23

Leuenberger, Rolf. Automatische Gewebeinspektion mit Hilfe neuronaler Netzwerke. Eidgenössische Technische Hochschule, 1996.

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24

Paner, Alexis. Implementation of an optical inspection system for higher quality product labels. 2012.

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25

Vernon, David. Machine Vision. Prentice Hall Europe (a Pearson Education company), 1991.

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26

Machine vision: Automated visual inspection and robot vision. Prentice Hall, 1991.

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27

Machine vision applications in industrial inspection VII: 25-26 January 1999, San Jose, California. SPIE, 1999.

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28

Fofi, David, and Kurt Niel. Image Processing: Machine Vision Applications III. SPIE, 2010.

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29

Fofi, David, and Kurt Niel. Image Processing: Machine Vision Applications - 29-31 January 2008, San Jose, California, USA. SPIE, 2008.

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