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Relevant bibliographies by topics / Radiation hardening techniques

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Journal articles

Academic literature on the topic 'Radiation hardening techniques'

Author: Grafiati

Published: 4 June 2021

Last updated: 8 February 2022

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Journal articles on the topic "Radiation hardening techniques"

1

Camplani, Alessandra, Seyedruhollah Shojaii, Hitesh Shrimali, Alberto Stabile, and Valentino Liberali. "CMOS IC radiation hardening by design." Facta universitatis - series: Electronics and Energetics 27, no. 2 (2014): 251–58. http://dx.doi.org/10.2298/fuee1402251c.

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Design techniques for radiation hardening of integrated circuits in commercial CMOS technologies are presented. Circuits designed with the proposed approaches are more tolerant to both total dose and to single event effects. The main drawback of the techniques for radiation hardening by design is the increase of silicon area, compared with a conventional design.

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Yu, Fa-Xin, Jia-Rui Liu, Zheng-Liang Huang, Hao Luo, and Zhe-Ming Lu. "Overview of Radiation Hardening Techniques for IC Design." Information Technology Journal 9, no. 6 (2010): 1068–80. http://dx.doi.org/10.3923/itj.2010.1068.1080.

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Banteywalu, Solomon, Baseem Khan, Valentijn De Smedt, and Paul Leroux. "A Novel Modular Radiation Hardening Approach Applied to a Synchronous Buck Converter." Electronics 8, no. 5 (2019): 513. http://dx.doi.org/10.3390/electronics8050513.

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Radiation and extreme temperature are the main inhibitors for the use of electronic devices in space applications. Radiation challenges the normal and stable operation of DC-DC converters, used as power supply for onboard systems in satellites and spacecrafts. In this situation, special design techniques known as radiation hardening or radiation tolerant designs have to be employed. In this work, a module level design approach for radiation hardening is addressed. A module in this sense is a constituent of a digital controller, which includes an analog to digital converter (ADC), a digital pro

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Dressendorfer, Paul V. "Effects of radiation on microelectronics and techniques for hardening." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 40-41 (April 1989): 1291–94. http://dx.doi.org/10.1016/0168-583x(89)90642-3.

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Mateos-Angulo, S., M. San-Miguel-Montesdeoca, D. Mayor-Duarte, S. L. Khemchandani, and J. del Pino. "SET analysis and radiation hardening techniques for CMOS LNA topologies." Semiconductor Science and Technology 33, no. 8 (2018): 085010. http://dx.doi.org/10.1088/1361-6641/aacff2.

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Agakhanyan, T. M. "Circuit-Design Techniques of Radiation Hardening for Monolithic Op Amps." Russian Microelectronics 33, no. 3 (2004): 183–87. http://dx.doi.org/10.1023/b:rumi.0000026176.67053.bb.

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Wang, Bi, Zhaohao Wang, Chunyan Hu, Yuanfu Zhao, Youguang Zhang, and Weisheng Zhao. "Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry." IEEE Transactions on Magnetics 54, no. 11 (2018): 1–5. http://dx.doi.org/10.1109/tmag.2018.2830701.

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8

Braga, Leo H. C., Suzana Domingues, Milton F. Rocha, et al. "Layout techniques for radiation hardening of standard CMOS active pixel sensors." Analog Integrated Circuits and Signal Processing 57, no. 1-2 (2008): 129–39. http://dx.doi.org/10.1007/s10470-008-9183-8.

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Zolotarev, S. A., P. S. Savenia, K. A. Zhukov, and M. A. Sednina. "Method of non-destructive control of thickness and internal defectivity of the walls of metal pipe." «System analysis and applied information science», no. 3 (September 25, 2020): 28–33. http://dx.doi.org/10.21122/2309-4923-2020-3-28-33.

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The possibility of an accurate estimation of the pipe wall thickness measured directly from the reconstructed image of the pipe, reconstructed from only a few X-ray projections made in a limited viewing angle, is discussed. Since the effects of radiation scattering and X-ray beam hardening distort up to 50 % of the primary radiation, ignoring these effects leads to blurred images, strong artifacts, and inaccurate sizing. A computerized technique has been developed that takes into account the contribution of scattered radiation and the hardening of the X-ray beam. Iterative Bayesian reconstruct

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Matsubara, E., and P. Georgopoulos. "Diffuse scattering measurements with synchrotron radiation: instrumentation and techniques." Journal of Applied Crystallography 18, no. 6 (1985): 377–83. http://dx.doi.org/10.1107/s0021889885010585.

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The analysis of diffuse scattering from single crystalline specimens in the reflection mode has generally been acknowledged as a very powerful means of obtaining structural information on local atomic arrangements in disordered alloys, intermetallics and ceramics. However, owing to the low intensities encountered and the large number of measurements required for such an analysis, experiments have been extremely time consuming and few have been attempted. Synchrotron radiation makes it possible to conduct such experiments in a matter of hours and much higher quality data can be obtained than in

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