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1

Gerard, Clergue, ed. Rasterelektronenmikroskopie des Auges =: L'oeil--vu au microscope électronique à balayage = Scanning electron microscopy of the eye. Stuttgart: Thieme-Stratton, 1985.

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2

Sarid, Dror. Exploring scanning probe microscopy with Mathematica. New York: Wiley, 1997.

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3

Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998.

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4

Scanning electron microscopy: Physics of image formation and microanalysis. Berlin: Springer-Verlag, 1985.

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5

Scanning electron microscopy and x-ray microanalysis. Englewood Cliffs, N.J: PTR Prentice Hall, 1993.

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6

Schilling, Doris. Ferroelektrische Polymere als mögliche Datenspeicher: Elektronenstrahlpolung und Abbildung gepolter Bereiche in PVDF und VDF/TrFE-Kopolymeren mit dem Rasterelektronenmikroskop. Konstanz: Hartung-Gorre, 1988.

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7

Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert Vlg., Renningen, 2002.

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8

Reimer, L., and G. Pfefferkorn. Raster-Elektronenmikroskopie. Springer London, Limited, 2013.

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9

Knell, Guido. Optimierung von magnetisch-elektrostatischen Detektor-Objektivlinsen für die Niederspannungs-Rasterelektronenmikroskopie. 1999.

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10

Pollen: Illustrations and Scanning Electronmicrographs. Springer, 1988.

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11

Sarid, Dror. Exploring Scanning Probe Microscopy with MATHEMATICA. 2nd ed. Wiley-VCH, 2007.

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12

Tovey, N. Keith, Boggs Sam Jr, David H. Krinsley, and Kenneth Pye. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. Cambridge University Press, 2010.

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13

Krinsley, David H., Jr Sam Boggs, N. Keith Tovey, and Kenneth Pye. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. Cambridge University Press, 2005.

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14

Tovey, N. Keith, Boggs Sam Jr, David H. Krinsley, and Kenneth Pye. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. Cambridge University Press, 2011.

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15

Konrad, Paul. Rasterelektronenmikroskop (Rem) Bruchflachenanalyse an Magnesiumdrahten Zur Beweisfuhrung Von Spannungsrisskorrosion. GRIN Verlag GmbH, 2017.

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16

Reimer, Ludwig. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences). Springer, 1986.

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17

Eggert, Frank. Standardfreie Elektronenstrahl-Mikroanalyse (mit dem EDX im Rasterelektronenmikroskop) (German Edition). Books On Demand, 2005.

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18

Resch, Heide. Das Randverhalten von Mod-Füllungen aus hybrid- und inhomogenen Mikrofüller-Komposits vor und nach Temperaturwechselbelastungen in vitro: Quantitative Randanalyse im Rasterelektronenmikroskop. 1986.

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