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Frank, Wiewandt Edward. "ARCHIVING THE DIGITAL IMAGE: TODAY'S BEST PRACTICES OF FILE PREPARATION." Bowling Green State University / OhioLINK, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=bgsu1131398443.
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Ainul, Azyan Zuliyanti Hanizan. "An investigation into the practicality of using a digital camera's RAW data in print publishing applications /." Link to online version, 2005. https://ritdml.rit.edu/dspace/handle/1850/1110.
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Pinheiro, Andr?a Santos. "Produ??o de gr?s porcelanato a partir de mat?rias-primas do Rio Grande do Norte e queima a g?s natural." Universidade Federal do Rio Grande do Norte, 2006. http://repositorio.ufrn.br:8080/jspui/handle/123456789/15578.
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Previous issue date: 2006-05-19The State of Rio Grande do Norte, Brazil, possess major deposits of feldspar, clay, kaolin and talc, all raw materials used in the production of porcelainized stoneware tiles. Conversely, state industries manufacture only low added value red ceramics. Porcelainized stoneware tiles is one of the noblest ceramics, depicting low water absorption (typically below of 0,5%), in addition to excellent staining resistance and mechanical strength. The present work aims at investigating the potential of local raw materials for the production of porcelainized stoneware tiles. To that end, these materials were characterized by X-ray fluorescence, X-ray diffraction, particle size analysis, thermal gravimetric analysis and thermal differential analysis. Admixtures containing different compositions were prepared and fired at three temperatures, 1150, 1200 and 1250?C for 30 min. After firing, tests samples were characterized by water absorption tests, linear retraction, dilatometric analysis, apparent porosity, apparent specific mass, flexural strength, and microstructural analysis by XRD and SEM. The results revealed that ceramics with porcelainized stoneware tiles characteristics could be produced from raw materials originated in the State of Rio Grande do Norte
O Rio Grande do Norte possui grandes jazidas de pegmatitos, argilas caulin?ticas e caulim, principais mat?rias-primas para a fabrica??o de gr?s porcelanato. No entanto, o RN produz apenas produtos de baixo valor agregado em rela??o ao porcelanato, uma das mais nobres cer?micas de revestimento, devido a sua baixa absor??o d??gua (tipicamente abaixo de 0,5%), al?m de apresentar excelentes caracter?sticas t?cnicas, destacando-se elevada resist?ncia mec?nica, ao risco e ao manchamento. O presente trabalho tem a finalidade de validar o potencial de mat?rias-primas do RN (feldspato, argila, caulim e talco beneficiado) para a produ??o de gr?s porcelanato. Para isso, foi feita a caracteriza??o das mat?rias primas por FRX, DRX, AG, ATG e ATD, elaborando-se cinco formula??es que foram queimadas em tr?s temperaturas: 1150, 1200 e 1250?C com 30 minutos de patamar. Ap?s a queima, os corpos-de-prova foram submetidos a ensaios de absor??o de ?gua, retra??o linear, porosidade aparente, massa espec?fica aparente, resist?ncia ? flex?o, DRX, MEV e an?lise dilatom?trica. Obteve-se para uma das misturas, propriedades compat?veis com as exigidas para um gr?s porcelanato
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Soares, Carlos Eduardo Alves. "Structural characterization and potential of the Adenanthera pavonina L. galactomannan as raw material to production of bioactive edible films." Universidade Federal do CearÃ, 2009. http://www.teses.ufc.br/tde_busca/arquivo.php?codArquivo=10939.
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CoordenaÃÃo de AperfeiÃoamento de Pessoal de NÃvel SuperiorIn this thesis work, bioactive edible films were produced by using a galactomannan-starch-nisi blend. The galactomannan from the endosperm of seeds of Adenanthera pavonina was extracted and the fine structure of the gum endospermic was studied by NMR techniques. The reason M / G (= 1.46) was determined and its structure is in agreement with those reported in the literature for galactomannans. Study of IR data supported the NMR data obtained in this work. This galactomannan showed rheological behavior typical of seed gums. Gelatinized corn starch was used to produce blends with the galactomannans. In rheological tests, the force applied to the flow curves to the dispersion of gelatinized corn starch and mixtures of starch-galactomannan did not adequately characterize these polymer systems in solution. The oscillatory tests, in turn, were more sensitive to detect differences between the different systems evaluated allowing for a more appropriate characterization. The construction of the sorption isotherms was an interesting approach to characterize edible films produced from blends of systems of polysaccharides and starch-galactomannan-nisin blend. Significant differences were detected in these films and have to relate the behavior of water to the structural arrangement of various edible films produced. The humidity was as dependent on key parameters measured in films such as temperature and content of glycerol. The hysteresis phenomenon was shown to the edible films of starch galactomannan blend. Finally, the mathematical model of sorption described by the G.A.B. equation is suggested as one that best represents the data obtained in experimental conditions tested here. Thermal stability curves obtained by DSC for galactomannan and edible films which produced without and with the antimicrobial agent nisin, led to associate the data with those obtained by aw,corroborating, in thecase of the film containing nisin, the antimicrobial contributes to an increased hydration of the edible film. The presence of nisin in edible films produced with the starchgalactomannan blend and glycerol reduced the growth of L. monocitogenes, reducing the number of colony-forming units and acting as a barrier to contamination. The study of action of nisin through the test of the inhibition zone and the bioassay enabled characterization of the edible films through the using of good techniques. Finally, more studies should be conducted to determine whether additional changes in the composition or the structure of the films could modify the antimicrobial activity due to inactivation of nisin or altering its release
Neste trabalho de Tese, filmes comestÃveis bioativos foram produzidos a partir da blenda galactomanana-amido-nisina. A galactomanana do endosperma de sementes de Adenanthera pavonina foi extraÃda e sua estrutura fina foi estudada atravÃs de tÃcnicas de RMN. Sua razÃo M/G (=1,46) determinada e sua estrutura estÃo de acordo com o que foi relatado na literatura para galactomananas. Estudo de IR corroboram os dados de RMN obtidos nesse trabalho. Essa galactomanana apresentou comportamento reolÃgico tÃpico de gomas de sementes. Amido de milho gelatinizado foi empregado para produzir blendas com a galactomanana. Nos testes reolÃgicos, o esforÃo aplicado para curvas de escoamento da dispersÃo de amido de milho gelatinizado e das misturas de galactomanana-amido nÃo permitiu caracterizar adequadamente esses sistemas de polÃmeros em soluÃÃo. Os ensaios oscilatÃrios, por sua vez, foram mais sensÃveis para detectar as diferenÃas entre os distintos sistemas avaliados permitindo uma caracterizaÃÃo de maneira mais adequada. A construÃÃo de isotermas de sorÃÃo foi numa abordagem interessante para caracterizar filmes comestÃveis produzidos a partir dos sistemas de blendas de polissacarÃdeos e do complexo galactomanana-amido-nisina. DiferenÃas significativas foram detectadas nesses filmes e permitiram relacionar o comportamento da Ãgua ao arranjo estrutural dos diferentes filmes comestÃveis produzidos. A umidade foi observada como dependente de importantes parÃmetros avaliados nos filmes, tais como a temperatura e o conteÃdo de glicerol. O fenÃmeno da histerese foi evidenciado para os filmes comestÃveis da blenda galactomanana-amido. Finalmente, o modelo matemÃtico de sorÃÃo descrito pela equaÃÃo G.A.B. à sugerido como aquele que melhor representa os dados obtidos nas condiÃÃes experimentais testadas aqui. As curvas de estabilidade tÃrmica obtidas por DSCl para a galactomanana e os filmes comestÃveis, produzidos sem o antimicrobiano e contendo a nisina, permitiram associar os dados de DSC aos obtidos pelas medias de aw, corroborando, no caso do filme contendo nisina, que o antimicrobiano contribui para uma maior hidrataÃÃo do filme comestÃvel. A presenÃa de nisina nos filmes comestÃveis produzidos com a blenda galactomanana-amido e glicerol reduziu o crescimento de L. monocitogenes, diminuindo o nÃmero de unidades formadoras de colÃnias e atuando como barreira para a contaminaÃÃo. O estudo da aÃÃo da nisina atravÃs do teste do halo de inibiÃÃo e do bioensaio permitiu caracterizar os filmes comestÃveis atravÃs do uso de tÃcnicas satisfatÃrias. Finalmente, mais estudos devem ser conduzidos a fim de determinar se mudanÃas adicionais na composiÃÃo ou na estrutura dos filmes poderiam modificar a atividade antimicrobiana devido à inativaÃÃo da nisina ou alterando sua liberaÃÃo
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Spring, Ted. "Uncertainty comparison of Digital Elevation Models derived from different image file formats." Thesis, Högskolan i Gävle, Avdelningen för Industriell utveckling, IT och Samhällsbyggnad, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-17193.
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Unmanned Aerial Systems (UAS) have become increasingly popular recently for surveying and mapping because of their efficiency in acquiring remotely sensed data in a short amount of time and the low cost associated with them. They are used to generate digital elevation models (DEM) derived from aerial photography for various purposes such as the documentation of cultural heritage sites, archaeological surveying or earthwork volume calculations. This thesis investigates the possible effects different file formats may have on the quality of elevation models. In this thesis, an UAS survey was simulated using a digital camera to produce six DEMs based on JPEG, TIFF and RAW format in Agisoft Photoscan by taking two sets of images of a city model, in different light conditions. Furthermore, a reference DEM was produced in Geomagic Studio using data from a Leica Nova MS50 Multistation. The DEMs were then compared in Geomagic Control. The results from the 3D comparison in Geomagic Control show that the standard deviation of all elevation models is 4 mm with the exception of the elevation model derived from raw-edited images taken with lighting, which has a standard deviation of nearly 6 mm. Also, all of the models have an average deviation of 0.4 mm or less. The significant deviations in all DEMs occur in areas where the multistation lacked vision of certain objects of the city model such as walls, or on the edges of the analysed area. Additionally, the georeferencing results from Photoscan show that the DEMs based on normal light condition images have slightly lower georeferencing errors than the DEMs with lighting. It has been concluded that it is difficult to say whether file formats have any noticeably effect on the uncertainty of digital elevation models.
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Skopek, Magdalena Anna. "X-ray structural studies of electroactive films." Thesis, University of Leicester, 2010. http://hdl.handle.net/2381/8644.
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This thesis describes X-ray studies (XANES, EXAFS and XAS) of the structures of electroactive film modified electrodes and their response to potential. To provide insight into the composition, structure and dynamics of the studied systems EXAFS was combined with other techniques: XPS, electrochemical methods and infrared spectroscopy. The electroactive materials studied were Prussian Blue (PB) and its cobalt and nickel derivatives, iridium oxide and polypyrrole/[P(Mo3O10)4]3- composite films. Selected electroactive materials were diverse, since the study was undertaken with the aim of providing the foundations for future experiments in the area of the dynamic in situ EXAFS research. For cobalt hexacyanoferrate films, cobalt was identified as the active redox site, based on clear evidence of changing bond lengths with potential. This suggests it will be an interesting candidate for future dynamic EXAFS study. The behaviour of PB films was found to be complicated to interpret because both redox sites are Fe-based and there exist additional interstitial iron species. In contrast to cobalt hexacyanoferrate, no significant changes could be observed in the Ni XAS data for the nickel derivative with Fe active redox sites. Polypyrrole/[P(Mo3O10)4]3- composite films showed changes in oxidation state of multiple Mo sites in XPS experiments. Nevertheless, they are not a promising material for a dynamic EXAFS because of the interpretational problems, similar to PB films. Iridium oxide films are another promising candidate. They were successfully characterized in in situ EXAFS configuration and changing bond lengths were observed as the potential (and thus Ir oxidation state) was changed. Additionally the thesis includes nanogravimetric observation of ion exchange characteristics of polypyrrole film p-doping in an ionic liquid. It is shown that polypyrrole film redox switching in the deep eutectic ionic liquid (Ethaline) involves a very different pattern of ion transfers to aqueous media. Ionic liquid in the reduced film provides a reservoir of choline cations whose transfer (in the opposite direction to anion doping) partly satisfies electroneutrality. Overall, the sites of redox activity were identified in a range of multi-site redox systems and structural changes were related to the injected charge. This static study is the first step in identifying systems suitable for X-ray synchrotron-based dynamic studies of electroactive film structure.
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Huang, Pao-Cheng. "Analysis of single-crystal semiconductor thin film structure by x-ray diffraction." Diss., Georgia Institute of Technology, 1990. http://hdl.handle.net/1853/20145.
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Neto, Narcizo Marques de Souza. "Perfis de ordem local e anisotropia magnética em filmes finos: A contribuição de espectroscopias de raios X em incidência rasante." Universidade de São Paulo, 2007. http://www.teses.usp.br/teses/disponiveis/43/43134/tde-11092007-153535/.
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Filmes finos magnéticos têm grande apelo em mídias de gravação com alta densidade de dados. As propriedades magnéticas desses filmes, que dependem da estrutura atômica do material, podem ser modificadas ou induzidas pela presença de interfaces internas. Para o entendimento e melhoramento dessas propriedades, torna-se necessário o uso de técnicas capazes de fornecer informações seletivamente em profundidade. Neste trabalho, acoplamos a espectroscopia de absorção de raios X (XAS) à uma geometria de incidência rasante, e assim usamos a variação da penetração dos raios X dentro do material em torno do ângulo crítico de reflexão total para obter informações resolvidas em profundidade sobre a ordem estrutural e magnética local. Desenvolvemos uma metodologia de medidas e de análise desta informação. Esta metodologia foi aplicada em filmes de FePt e CoPt que produzimos pela técnica de deposição catódica. Em filmes de FePt, uma análise quantitativa completa nos permitiu caracterizar a camada de oxidação da superfície. Em filmes de CoPt, observamos que a ordem química, responsável pela anisotropia perpendicular é parcialmente perdida em grandes profundidades além da superfície para filmes de espessura superior a 50 nm. A presença desta camada desordenada, confirmada por espalhamento ressonante de raios X, explica a incomum dependência em espessura das propriedades magnéticas do sistema estudado.Magnetic thin films have great appeal in recording media with high data density. The magnetic properties of these films, depending on the material atomic structure, may be modified or induced by the presence of intern interfaces. For the understanding and improving of these properties, becomes necessary the use of techniques able to provide in depth selective information. In this work, we put together the X-ray absorption spectroscopy (XAS) to a grazing incidence setup, and then we use the variation of X-ray penetration inside the material around the critical angle to get depth resolved information about the structural and magnetic local order. We developed a measurements and analysis methodology of this information. This methodology were applied in FePt and CoPt films which we produced by the magnetron sputtering technique In FePt films, a complete quantitative analysis allowed us characterize a surface oxidized layer. In CoPt films, we observed the chemical order, responsible for the perpendicular anisotropy, is partially lost in high depths away from the surface for films thicker than 50 nm. The presence of this disordered layer, confirmed by resonant magnetic X-ray scattering, explains the unconventional in depth dependence of the studied system magnetic properties.
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Warren, Andrew. "X-ray Scattering Investigations of Metallic Thin Films." Doctoral diss., University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5721.
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Nanometric thin films are used widely throughout various industries and for various applications. Metallic thin films, specifically, are relied upon extensively in the microelectronics industry, among others. For example, alloy thin films are being investigated for CMOS applications, tungsten films find uses as contacts and diffusion barriers, and copper is used often as interconnect material. Appropriate metrology methods must therefore be used to characterize the physical properties of these films. X-ray scattering experiments are well suited for the investigation of nano-scaled systems, and are the focus of this doctoral dissertation. Emphasis is placed on (1) phase identification of polycrystalline thin films, (2) the evaluation of the grain size and microstrain of metallic thin films by line profile analysis, and (3) the study of morphological evolution in solid/solid interfaces. To illustrate the continued relevance of x-ray diffraction for phase identification of simple binary alloy systems, Pt-Ru thin films, spanning the compositional range from pure Pt to pure Ru were investigated. In these experiments, a meta-stable extension of the HCP phase is observed in which the steepest change in the electronic work function coincides with a rapid change in the c/a ratio of the HCP phase. For grain size and microstrain analysis, established line profile methods are discussed in terms of Cu and W thin film analysis. Grain sizes obtained by x-ray diffraction are compared to transmission electron microscopy based analyses. Significant discrepancies between x-ray and electron microscopy are attributed to sub-grain misorientations arising from dislocation core spreading at the film/substrate interface. A novel "residual" full width half max parameter is introduced for examining the contribution of strain to x-ray peak broadening. The residual width is subsequently used to propose an empirical method of line profile analysis for thin films on substrates. X-ray reflectivity was used to study the evolution of interface roughness with annealing for a series of Cu thin films that were encapsulated in both SiO2 and Ta/SiO2. While all samples follow similar growth dynamics, notable differences in the roughness evolution with high temperature ex-situ annealing were observed. The annealing resulted in a smoothing of only one interface for the SiO2 encapsulated films, while neither interface of the Ta/SiO2 encapsulated films evolved significantly. The fact that only the upper Cu/SiO2 interface evolves is attributed to mechanical pinning of the lower interface to the rigid substrate. The lack of evolution of the Cu/Ta/SiO2 interface is consistent with the lower diffusivity expected of Cu in a Cu/Ta interface as compared to that in a Cu/SiO2 interface. The smoothing of the upper Cu/SiO2 interface qualitatively follows that expected for capillarity driven surface diffusion but with notable quantitative deviation.Ph.D.
Doctorate
Materials Science Engineering
Engineering and Computer Science
Materials Science and Engineering
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Clarke, John. "X-ray scattering from thin films and interfaces." Thesis, Durham University, 1999. http://etheses.dur.ac.uk/4499/.
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The non-destructive study and characterisation of thin films and their interfaces, on an atomic scale, is a crucially important area of study in many areas of science and technology. In this thesis both high angle and grazing incidence x-ray scattering techniques have been used to study the effect of depositing thin films on surfaces with a periodic roughness, as well as studying the structure of laterally modulated surfaces themselves. High angle diffraction measurements of the out-of-plane size of Co crystallites and the crystalline texture of the Ag lattice, in a series of CoAg granular fihns, has allowed a consistent growth mechanism for the Co grains to be deduced. In grazing incidence scattering studies of this series of thin, granular films it was observed that the diffuse scatter was offset from the specular condition and the position of this offset was seen to vary, sinusoidally, upon rotation of the sample. This led to the conclusion that the growth techniques employed had caused a regular step-bunching of the Si (111) substrate. As step-bunching of surfaces can affect greatly the properties of thin films deposited on them, the ability to characterise the substrate after growth is extremely important. In spin-valves deposited on rough, tiled, silicon oxide substrates, the presence of strong interference fringes in the off-specular scatter demonstrated that vertically conformal roughness dominated the system and this was seen to result in the degradation of the magnetic sensitivity of the samples. Conversely, an enhancement in the photoluminescence from thin polymer films deposited on laterally modulated substrates led to a series of studies being made on such structures. In order to obtain information on the lateral period of such structures, as well as their roughness and thickness, existing scattering theories have been modified and a semi-kinematical code of the coherent scatter has been developed.
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Knowles, Kim. "A cinematic artist : the films of Man Ray." Thesis, University of Edinburgh, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.491608.
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Man Ray was one of the most innovative and diverse artists of the early twentieth-century. His oeuvre incorporates painting, drawing, photography, sculpture, poetry and film. Yet, his activity in the realms of the moving image remains undervalued and his role as a film-maker is generally overlooked, despite the fact that his films represent the greatest contribution to the development of French avant-garde cinema of the 1920s. Furthermore, when his films are discussed they are generally restricted to the discourses of Dada and Surrealism, leaving unexplored many vital areas, including how his approach to the cinema relates to early avant-garde film theory, and the exploration of the different ways he creates links between film and the other arts, notably photography. This thesis examines the four films made by Man Ray during the 1920's - Le Retour a la raison (1923), Emak Bakia (1926), L Etoile de mer (1928) and Les Mysteres du Chateau du De (1929) - and assesses them within the context of his wider artistic concerns. It represents one of the first studies to provide an integrated approach to these films, which looks for emerging patterns and similarities from one work to another. Whilst it explores their placement within the Dada and Surrealist movements, it ultimately attempts to take analysis beyond these parameters in order to uncover previously unexplored formal concerns, such as the interaction between movement and light and the tension between abstraction and figuration. Man Ray's initial intention to put his photographic compositions into movement can be seen as one of the strongest forces in his cinematic work and constitutes the central focus of this study. The central question to be asked is: can Man Ray's cinema be seen in terms of a unified approach that transcends the concerns of both Dada and Surrealism? The main argument to be developed is that there is a creative and visual consistency that can be uncovered from these works that demonstrates an extensive interest in the possibilities of film as an art and which paves the way for future developments in experimental cinema.
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Timonen, T. (Tero). "X-ray diffraction studies of VO₂ thin films." Master's thesis, University of Oulu, 2014. http://jultika.oulu.fi/Record/nbnfioulu-201410281952.
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Abstract. The aim of this work is to investigate the effect of strain in vanadium dioxide (VO₂) thin films. Vanadium dioxide undergoes a metal-insulator transition involving radical changes in the electrical conductivity, and strain is one of the parameters which can influence the transition characteristics. In form of a thin film, vanadium dioxide is subjected to strain which arises from the lattice mismatch between the substrate and the film. To study the effect of strain, a set of vanadium dioxide thin films with thickness from 20 to 240 nm were grown using pulsed laser deposition method, and the structure of the films were characterized using X-ray diffraction. The surface morphology of the thin films was also examined using atomic force microscopy.
In the insulating state, the films were composed of both M₁ and M₂ phases of vanadium dioxide. The transition was observed to be controlled by M₂ phase in films which were thinner than 100 nm and by M₁ phase in thicker films. The presence of M₂ phase was caused by strain. The metal-insulator transition occurred at much wider temperature range in thinner films which were more strained than the thicker films showing more abrupt transitions. The relaxation of the strain in thicker films resulted in misorientation of the crystallites and caused the surface roughness to increase with the film thickness.VO₂ ohutkalvojen röntgendiffraktiotutkimuksia. Tiivistelmä. Tämän työn tarkoituksena on tutkia venymän vaikutusta vanadiinidioksidi (VO₂) ohutkalvoissa. Vanadiinidioksidissa ilmenevä metalli-eriste transitio aiheuttaa suuria muutoksia aineen sähkönjohtavuudessa ja venymän on huomattu vaikuttavan transition ominaisuuksiin. Ohutkalvomuodossa vanadiinidioksidiin kohdistuu venymä, joka aiheutuu kalvon ja substraatin hilavakioiden epäsovituksesta. Venymästä aiheutuvien vaikutusten selvittämiseksi eri paksuisia (20–240 nm) vanadiinidioksidi ohutkalvoja valmistettiin pulssilaserkasvatuksella ja niiden rakennetta karakterisoitiin röntgendiffraktiolla. Myös ohutkalvojen pinnanmuotoa tutkittiin atomivoimamikroskopian avulla.
Eristetilassa kalvot koostuivat vanadiinioksidin M₁ ja M₂ faaseista, ja M₂ faasin huomattiin kontrolloivan transitiota kalvoissa, jotka olivat ohuempia kuin 100 nm, kun taas paksuimmissa kalvoissa transitiota kontrolloi M₁ faasi. M₂ faasin mukanaolo johtui venymästä. Metalli-eriste transitio tapahtui laajemmalla lämpötila-alueella ohuimmissa kalvoissa, joissa venyminen oli suurempaa kuin paksummissa kalvoissa. Paksuimmissa kalvoissa transitio olikin paljon voimakkaampi. Venymän relaksoituminen paksuimmissa kalvoissa johti kiteiden kallistumiseen aiheuttaen sen, että pinnan karheus kasvoi kalvon paksuuden mukana.
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Nahle, A. H. "Electrochemical and X-ray studies on surface films on metals." Thesis, University of Southampton, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.233841.
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DHAR, MEGHNA. "USER-SPACE, CUSTOM FILE SYSTEM FOR PROXY SERVERS." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1060370727.
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Tingstrom, Daniel. "Cheetah: An Economical Distributed RAM Drive." ScholarWorks@UNO, 2006. http://scholarworks.uno.edu/td/323.
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Current hard drive technology shows a widening gap between the ability to store vast amounts of data and the ability to process. To overcome the problems of this secular trend, we explore the use of available distributed RAM resources to effectively replace a mechanical hard drive. The essential approach is a distributed Linux block device that spreads its blocks throughout spare RAM on a cluster and transfers blocks using network capacity. The presented solution is LAN-scalable, easy to deploy, and faster than a commodity hard drive. The specific driving problem is I/O intensive applications, particularly digital forensics. The prototype implementation is a Linux 2.4 kernel module, and connects to Unix based clients. It features an adaptive prefetching scheme that seizes future data blocks for each read request. We present experimental results based on generic benchmarks as well as digital forensic applications that demonstrate significant performance gains over commodity hard drives.
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Souza, Nicolas-Raphaël Louis de. "Study of poly(styrene) films by neutron and x-ray reflectometry." [S.l. : Amsterdam : s.n.] ; Universiteit van Amsterdam [Host], 2006. http://dare.uva.nl/document/24504.
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Bassi, Andrea Li. "X-ray and light scattering from nanostructured thin films." Thesis, Durham University, 2000. http://etheses.dur.ac.uk/4631/.
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The object of this thesis is the study of nanostructured thin films using inelastic fight scattering and elastic x-ray scattering techniques. Their use in combination with other techniques is a powerful tool for the investigation of nanostructured materials. X-ray, Raman and Brillouin characterisation of cluster-assembled carbon films, promising for applications in the field of catalysis, hydrogen storage and field emission, is here presented. X-ray reflectivity (XRR) provided a measure of the density. Raman spectroscopy showed that the local bonding in these amorphous films depends on the size distribution of the clusters and that it is possible to select the cluster size in order to grow films with tailored properties. Brillouin scattering provided a characterisation at the mesoscopic scale and an estimate of the elastic constants, revealing a very soft material. XRR was employed to study density, layering and roughness of a wide range of amorphous carbon films grown with different techniques. Some films possess an internal layering due to plasma instabilities in the deposition apparatus. By comparing XRR with Electron Energy Loss Spectroscopy, a unique value for the electron "effective mass" was deduced and a general relationship between sp(^3)-content and density was found. XRR and H effusion were used to determine the hydrogen content. A study of the size-dependent melting temperature in tin nanoparticle thin films was undertaken with a combined use of X-Ray Diffraction (XRD) and light scattering. A redshift in the position of a Rayleigh peak in the temperature-dependent Brillouin measurements was shown to be related to the melting of the nanoparticles and explained by an effective medium model. XRD also provided information on the low-level of stress in the particles. Low-frequency Raman scattering was used to study the behaviour of the acoustic modes of a single particle as a function of temperature.
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Cadó, Ronan Gorski. "SÍNTESE E CARACTERIZAÇÃO DE NANOCOMPÓSITOS POLIMÉRICOS COM PROPRIEDADES DE ATENUAÇÃO PARA O USO EM PROTEÇÃO RADIOLÓGICA." Centro Universitário Franciscano, 2016. http://www.tede.universidadefranciscana.edu.br:8080/handle/UFN-BDTD/553.
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Ionizing radiations with X-rays energy range offer risk to human health and might be source of interference on sensitive devices. The increased use of ionizing radiations causes the need of development of new materials for radiological protection. The main goal of this study is to determine the attenuation properties of X-rays in polymeric nanocomposites with insertion of metal oxides. To obtain the nanocomposite, lead, cooper and tungsten oxides were synthesized. The oxides were characterized by X-ray diffraction, infrared spectroscopy and zeta potential with different pH. The synthesized oxides have average crystallite size between 25 and 55 nm. Polymeric films were made by dissolving polyamide 6.6 pellets in different combinations of formic acid / chloroform, determining by stress-strain tests that the combination 75/25 (%/%) of the reagents had better condition for the polymeric film use as fabric. The oxides were dispersed on the polymer solution for homogenization, obtaining polymer nanocomposites with 0.2 g, 0.08 g and 0.02 g of PbO, 0.2 g, 0.08 g and 0.02 g of CuO and 0.2 g of WO3.The nanocomposites were evaluated by X-ray diffraction, showing diffraction peaks in the amorphous region of the polymer film. The attenuation of X-rays was measured with the aid of an ionization chamber, varying the voltage of the X-ray tube (kV), and the time of exposure (mAs). The results showed attenuation of 26% compared to the polymeric film, in combination kV/mAs 40/10 and 13.11% in 100/10, for the nanocomposite with higher amounts of PbO. The nanocomposite with WO3 showed attenuation of 21,78% and 11,5% compared to the polymeric film, in the combinations 40/10 and 100/10, respectively. The nanocomposite of CuO with the larger amount of the oxide, showed attenuation of 10.11% and 4.5%, compared to the polymeric film, in combinations of 40/10 and 100/10, respectively. These results suggest that the nanocomposites produced has great potential for application in radiological protection.
As radiações ionizantes com energias na faixa dos raios X oferecem riscos para a saúde humana e podem ser fontes de interferência em equipamentos sensíveis. O aumento do uso das radiações ionizantes ocasiona na necessidade do desenvolvimento de novos materiais para uso em proteção radiológica. Este estudo tem por objetivo determinar as propriedades de atenuação dos raios X em nanocompósitos poliméricos com inserção de óxidos metálicos. Para a obtenção dos nanocompósitos, foram sintetizados óxidos de chumbo, de cobre e de tungstênio. Os óxidos foram caracterizados por difração de raios X, espectroscopia de infravermelho e por potencial zeta em diferentes pH. Os óxidos sintetizados possuem tamanho de cristalito médio entre 25 e 55 nm. Foram produzidos filmes poliméricos a partir da dissolução de grãos de poliamida 6.6 em diferentes combinações de ácido fórmico/clorofórmio, determinando por ensaios de tensãodeformação que a combinação 75/25 (%/%) dos reagentes apresentou melhor condição para o do filme polimérico como tecido. Os óxidos foram dispersos na solução polimérica para homogeneização, obtendo nanocompósitos poliméricos com 0,2 g, 0,08g e 0,02 g de PbO, 0,2 g, 0,08g e 0,02 g de CuO e 0,2 g de WO3. Os nanocompósitos foram avaliados por difração de raios X, apresentando picos de difração na região amorfa do filme polimérico. A atenuação dos raios X foi avaliada com auxílio de uma câmara de ionização, variando as condições de tensão do tubo de raios X (kV) e do tempo de exposição (mAs). Os resultados obtidos demonstraram atenuação de 26% em relação ao filme polimérico, na combinação kV/mAs 40/10 e 13,11% na 100/10, para o nanocompósito com maior quantidade de PbO. O nanocompósito de WO3 apresentou atenuação em relação ao filme polimérico de 21,78% e 11,5% nas combinações 40/10 e 100/10, respectivamente. O nanocompósito de CuO com maior quantidade de CuO apresentou atenuação em relação ao filme polimérico de 10,11% e 4,5%, nas combinações 40/10 e 100/10. Estes resultados sugerem aos nanocompósitos produzidos um grande potencial para aplicação em proteção radiológica.
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Nesdoly, Mark Timothy Alexander. "X-ray sensitivity and x-ray induced charge transport changes in stabilized amorphous selenium films." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 2000. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape4/PQDD_0031/NQ63904.pdf.
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García, Moral Daniel Jesús. "Remote File Access System for Generic Ericsson Processor Boards : File transfer service, Random Access Memory-based file system and secure file transfer solution research." Thesis, KTH, Skolan för informations- och kommunikationsteknik (ICT), 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-53448.
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Generic Ericsson Processor boards are general purpose hardware platforms which provide generic processing services. They support the Unified Extensible Firmware Interface Specification. They have several network interfaces available and they are connected to Ericsson’s laboratory network. Several servers are also connected to this network. These boards require periodic firmware upgrades. They also require acquiring new firmware components and data files. Currently, an application to download or upload files from and to Ericsson’s laboratory servers when an Operating System has not already been booted does not exist. Therefore, the files have to be transferred to USB drives which are connected later to the boards in order to transfer the files. This is a time consuming operation which decreases Ericsson’s productivity. In addition, although Generic Ericsson Processor boards have an optional solid-state drive as secondary storage, Ericsson wants to be able to operate without it. This is because this secondary storage is not always available and Ericsson does not want to use it when the Generic Ericsson Processor boards are operating before an Operating System has been loaded. They prefer to use Random Access Memory storage. This project is focused on studying possible solutions for those two problems. Several file transfer protocols are analyzed. Several file system solutions mounted on Random Access Memory are also explored. A Trivial File Transfer Protocol client application and a Random Access Memory Disk driver prototype are designed, implemented and tested. They are tailored to work on a pre-boot environment, when the boards have not booted an Operating System yet, in Ericsson’s laboratory network. Finally, a secure file transfer protocols’ study is developed. This study will be used to assess Ericsson on the optimal secure file transfer protocol choice in order to implement possible secure future versions of the system.
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Peters, Joost Frederik. "Resonant soft x-ray scattering studies of the magnetic nanostructure of stripe domains." [S.l. : Amsterdam : s.n] ; Universiteit van Amsterdam [Host], 2003. http://dare.uva.nl/document/70348.
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Waterfield, Price Noah. "Domains and functionality in multiferroic BiFeO3 films." Thesis, University of Oxford, 2017. https://ora.ox.ac.uk/objects/uuid:e8a8f8ff-8510-4fdf-93f4-0037cebc0210.
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For over half a century, the technological promise of spins manipulable by a small voltage has captivated the interest of experimental and theoretical researchers alike. However, if thin-film multiferroics are to be incorporated into future data storage devices, a much greater understanding of their behaviour and how they differ from their bulk counterparts is required. In this thesis, we probe the fundamental multiferroic properties of BiFeO3 films through a combination of state-of-the-art diffraction and microscopy techniques. We investigate the coupling between magnetic, ferroelectric, and structural order, with a focus on domains, and how the domain structure may be manipulated in order to tailor the multiferroic properties of the material. Using non-resonant magnetic x-ray scattering (NXMS) and neutron diffraction, we study the magnetic and structural properties of (111)pc-oriented BiFeO3 films. Contrary to the general belief that to they grow as a rhombohedral monodomain, we find that they comprise a sub-micron texture of monoclinic domains. The magnetic structure is found to be intimately coupled to the structure, resulting in the propagation vector being locked to the monoclinic b-axis. This magnetoelastic coupling opens up a route to strain-engineer the magnetic domains via epitaxial strain. By growing BiFeO3 films on a lower-symmetry, TbScO3 substrate, we are able to engineer a magnetic, structural and ferroelectric monodomain, coherent over the entire film, constituting an increase in the domain size by over five orders of magnitude. We directly demonstrate the coupling between ferroelectric and magnetic order parameters of the cycloidal magnetic structure. Using NXMS polarimetry to measure directly the magnetic polarity, we show that upon switching the ferroelectric polarisation, the magnetic polarity switches accordingly---a major rearrangement of the magnetic structure, with each spin rotating by 90 degrees on average. This goes counter to idea that magnetic and ferroelectric order parameters are only weakly coupled in type-I multiferroics. Finally, using photoemission electron microscopy we are able to directly image the sub-micron magnetostructural domain structure. We further show that there is a strong interfacial coupling between the magnetostructural domains of BiFeO3 with a ferromagnetic overlayer. The BiFeO3 domains are found to impose a uniaxial anisotropy in the overlayer, opening up a route to control ferromagnetic domains.
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Mikhailov, I. F., A. A. Baturin, Ye A. Bugaev, A. I. Mikhailov, and S. S. Borisova. "Metal Films as Mass Standard Samples in the Nano-Gram Range." Thesis, Sumy State University, 2013. http://essuir.sumdu.edu.ua/handle/123456789/35167.
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Attestation of magnetron sputtered films as mass standards is presented. Homogeneous, long-lived
metal films were measured by different methods for comparison. The accuracy of the order 1 ng was found
to be provided by application of the metal film standards for element analysis by X-ray fluorescent method.
Keywords: Thin Films, Nano-Standards, Magnetron Sputtering, X-ray Reflectometry, X-ray Fluorescent
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35167
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Torres, Morales Bernat. "Raó, plaer i bona vida en el "Fileb" de Plató." Doctoral thesis, Universitat de Barcelona, 2013. http://hdl.handle.net/10803/104111.
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La tesis es una lectura y comentario de un dialogo de Platón, el Filebo. La tradición interpretativa siempre ha considerado al Filebo como diálogo complejo en si mismo y difícil de situar en el Corpus Platonicum (Frede 1993, 1997); la presente tesis pretende realizar una interpretación del diálogo que permita entenderlo como todo y mejorar o completar así las interpretaciones anteriores. Este proyecto forma parte de los trabajos ya presentados por el grupo de investigación Hermenéutica, Platonismo y Modernidad (HP&M) de la Universidad de Barcelona (Monserrat 1999; Ibáñez 2007; véase también Notomi 1999). La metodología del trabajo es también la propia del grupo de investigación HP&M (cf. Monserrat 2002); esta metodología consiste en el tratamiento de cada diálogo como un texto autónomo que puede ser entendido desde si mismo. La referencia a fuentes externas o a otros diálogos debe hacerse siempre posteriormente al intento de entender el texto desde si mismo. La comprensión del texto se consigue a su tiempo analizando en detalle la relación entre acción dramática i argumentación que constituye cada diálogo; solo así se podrá mantener unido aquello que Platón nos ofreció unido. Entender un diálogo de forma completa y desde él mismo debe ser el primer paso para intentar entender la obra de Platón como un todo (Gonzalez 1995; Rosen 1999).
La tesis se divide en tres partes, la primer ofrece un amplio examen del estado de la cuestión de los comentarios sobre el Filebo antiguos y contemporáneos y se centra posteriormente en analizar algunas interpretaciones, como la de H. G. Gadamer, E. Voegelin o la del autor de la única traducción catalana del diálogo, M. Balasch. La segunda parte ofrece una traducción catalana del diálogo en su integridad (a partir principalmente de la edición de Burnet 1901) acompañado de notas, a las que sigue un análisis de la estructura del diálogo (dividido en siete partes o secciones) y también de sus características matemáticas o geométricas (proporciones entre partes del diálogo, etc.). Finalmente, en la tercera parte de la tesis se ofrecen diversos comentarios sobre pasajes significativos del diálogo, como son la escena inicial del mismo (Filebo 11a-12b), la escena central (Filebo 38c-39c) y un pasaje relevante de la parte final del diálogo (Filebo 47d-50e).
Las conclusiones del trabajo confirman en primer lugar la validez del método de lectura indicado, a través del cual es posible obtener una interpretación del conjunto del diálogo entendido de forma autónoma. Con respecto a la tradición interpretativa se constata la tendencia generalizada en encontrar en el Filebo doctrinas o teorías que pretender hacer coherente una supuesta evolución del pensamiento de Platón y el lugar que en ella ocupa el Filebo, pero a menudo esta búsqueda de doctrinas y teorías impide la visión de diálogo como todo, eludiendo elementos dramáticos relevantes sin los cuales una lectura del conjunto del texto se hace imposible o en todo caso inconsistente. Las conclusiones también permiten dar razón del objetivo, el método y el motor que mueve al diálogo en su conjunto. Así, se constata que el objetivo del Filebo es ofrecer (de forma progresiva i a través de una serie de desplazamientos) un imagen del ser humano (como ser que goza y razona) situado en el todo y, al mismo tiempo, de la dificultad de captar esta imagen situada entre lo divino y lo animal. El método o camino para conseguir este objetivo es el mismo enunciado por Sócrates en 16b4 i ss., esto es, el camino más bello (también denominado método dialéctico), el cual permite determinar unidades en la multiplicidad de la realidad y también en la vida humana misma. Es este el método que seguirá el conjunto del diálogo hasta su final. Finalmente, hemos constatado que el motor que mantiene al diálogo en movimiento es la tensión entre aquello ilimitado por una parte, y lo que intenta, con dificultades, imponer límites mediante un lógos, un discurso, por el otro.
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Robinson, K. S. "X-ray photoelectron spectroscopic studies of sputter ion plated films." Thesis, University of Newcastle Upon Tyne, 1986. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.371258.
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Nichols, P. "The cinema of lost films : Ray Bradbury and the screen." Thesis, University of Liverpool, 2017. http://livrepository.liverpool.ac.uk/3009310/.
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This thesis examines the fiction and screenwriting of Ray Bradbury (1920-2012), the American author best known for novels and short stories in the genres of science fiction and fantasy. Bradbury’s screenwriting has previously received little critical attention, but is examined here in an archival study of four of his extended film-making projects, two of which came to fruition in completed films, and two of which remain unproduced. Moby Dick (John Huston, 1956) is a strong work of structural adaptation from Herman Melville’s novel, and the experience of adapting it is shown to have had a significant impact on Bradbury’s own work in prose fiction and radio drama. The development of Something Wicked This Way Comes (Jack Clayton, 1983), a film based on Bradbury’s own novel, is traced through multiple pathways of adaptation, revealing Bradbury as an effective story analyst and self-adapter. The conflict of authority between screenwriter and film director is shown to be a manifestation of Ian W. Macdonald’s concept of ‘the screen idea’ as the controlling force in film production. Bradbury’s un-filmed screenplays for The Martian Chronicles (1961, 1963-5, 1978, 1997) are found to have developed a grand narrative displaying Bradbury’s philosophy of humankind’s place in the cosmos. His novel Fahrenheit 451 (1953) is shown to be a fundamentally cinematic fiction, and the film adaptation by François Truffaut (1966) is revealed to have stimulated Bradbury’s own re-vision of the work for stage and screen. The serial re-composition of prose works as cross-media re-visions is proven to be central to Bradbury’s working method. Self-adaptation is considered as a challenge to established theories of adaptation, such as Linda Hutcheon’s A Theory of Adaptation (2006).
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DeRose, Guy Arthur. "X-ray absorption fine structure strain determination in thin films." Case Western Reserve University School of Graduate Studies / OhioLINK, 1992. http://rave.ohiolink.edu/etdc/view?acc_num=case1060005230.
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Erdy, Christine. "Self-Assembled Host-Guest Thin Films for Functional Interfaces." Thesis, Virginia Tech, 2008. http://hdl.handle.net/10919/36049.
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The functionalization of surfaces has received attention because the process allows the design and tailoring of substrate surfaces with a new or improved function.
â Host-guestâ thin film complexes are composed of â hostâ molecules attached the substrate surface, either through physisorption or covalent bonds, with cavities for the inclusion of desired â guestâ molecules for the functionalization of the surface. Two methods for fabricating functional â host-guestâ thin films were investigated: Langmuir-Blodgett (LB) deposition and self-assembly monolayer (SAM). Langmuir films were created at the air-water interface using octadecanesulfonic acid (C18S) as the amphiphilic â hostâ molecules separated by hydrophilic guanidinium (G) spacer molecules, which created a cavity allowing the inclusion of desired â guestâ molecules. Surface pressure-area isotherms of the (G)C18S, with and without guests, are characterized by the lift-off molecular areas and are use to determine the proper deposition surface pressure. â Host-guestâ Langmuir films are deposited onto silicon substrates using the LB deposition technique. The LB films were then subjected to stability testing using different solvents over increasing periods of time. Grazing-angle incidence X-ray diffraction (GIXD), specular X-ray reflectivity (XRR) and transfer ratio measurements were used to characterize the crystallinity, film thickness, overall film stability and film coverage. The GIXD data revealed that the crystallinity of the deposited film varies with the â guestâ molecules and can be disrupted by the functional group on the â guestâ molecule through hydrogen bonding. After modeling the XRR data using StochFit, it was discovered that the more polar solvent, tetrahydrofuran (THF), removed the film completely while the nonpolar solvent, hexane, compacted the thin film and increased the electron density. With transfer ratios around 0.95 to 1.05, the deposited films were homogenous.
The second method used was self-assembly monolayers, which differs from Langmuir films in that they are created by a spontaneous chemical synthesis from immersing a substrate into a solution containing an active surfactant. Octadecyltrichlorosilane (OTS) was used initially as a molecule to study the self-assembled monolayer procedure. To study a â host-guestâ self-assembled monolayer system, a compound is being synthesized from 9-bromoanthracene. This compound would already contain the cavity necessary for the inclusion of â guestâ molecules. The solution that contained OTS was composed of a 4:1 mixture of anhydrous octadecane: chloroform. Silicon substrates with a deposited oxide layer were hydroxylated for the surfactant binding chemical reaction to occur. The OTS SAMs were exposed to the same stability tests as the LB films. Surface contact angle measurements were taken of the OTS SAMs before and after the stability tests. The contact angle prior to the stability tests was 110° (±2°). The contact angle after immersion in THF was 101° (±2°) while the contact angle resulting from immersion in hexane was 105° (±2°). From the contact angle measurements, the degradation of the OTS SAMs was less extensive than that of the (G)C18S LB films.Master of Science
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Price, Allen C. "Coherent soft x-ray dynamic light scattering from smectic-A liquid crystals /." Thesis, Connect to this title online; UW restricted, 1999. http://hdl.handle.net/1773/9677.
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Filonenko, Olga. "Structural Investigations of Thin Chromium Disilicide Films on Silicon." Doctoral thesis, Universitätsbibliothek Chemnitz, 2005. http://nbn-resolving.de/urn:nbn:de:swb:ch1-200500426.
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In der vorliegenden Arbeit wurden Röntgentechniken benutzt um die Struktur von dünnen (etwa 40 nm) CrSi2-Schichten, die unter UHV-Bedingungen mittels reaktive Koabscheidung und template-Verfahren auf Si(001) hergestellt wurden, zu charakterisieren. Die Ergebnisse wurden mit TEM-, SEM- und RBS-Untersuchungen korreliert und ergänzt.
Die XRD-Analysen zeigen, dass die beiden Abscheideverfahren immer zur Bildung der CrSi2-Phase führen, wobei die Kristallite mit einer bevorzugten Orientierungsbeziehung CrSi2(001)[100] || Si(001)[110] wachsen. Im ersten Teil der Arbeit wurde die Cr-Si-Koabscheidung benutzt um die Prozessparameter zu bestimmen, die zum Wachstum epitaktischer Schichten führen können. Die Strukturuntersuchungen zeigen, dass nur bei einer Substrattemperatur von 700°C nahezu geschlossene Schichten mit Kristalliten, welche lateral eine Größe bis zu 300 nm haben und neben der bevorzugten noch andere Orientierungen zum Substrat aufweisen, entstehen.
Als zweite Herstellungsmethode wurde das template-Verfahren verwendet, wo die Cr-Si-Koabscheidung auf ein vorher in-situ präpariertes ultradünnes CrSi2-template erfolgt. Die Morphologie und die Stärke der bevorzugten Orientierung der CrSi2-Schichten sind stark von der template-Dicke abhängig. Die Abscheidung auf CrSi2-templates, welche aus einer Cr-Schicht mit nominaler Dicker von 0,35 nm bis 0,52 nm entstehen, führt zum Wachstum weitgehend geschlossener, homogener und epitaktischer CrSi2-Schichten. Ein Modell, das den Einfluss der template-Dicke auf die Qualität der CrSi2-Schichten erklären kann, wird vorgeschlagen.
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Курбатов, Денис Ігорович, Денис Игоревич Курбатов, Denys Ihorovych Kurbatov, Олексій Володимирович Климов, Алексей Владимирович Климов, Oleksii Volodymyrovych Klymov, Анатолій Сергійович Опанасюк, et al. "Substructural Features of Zn1-xMnxTe Solid Solution Thin Films." Thesis, Sumy State University, 2012. http://essuir.sumdu.edu.ua/handle/123456789/35057.
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The substructural characteristics of Zn1-xMnxTe films deposited by closed space vacuum sublimation
method under various condensation conditions are investigated. Sizes of the coherent scattering domain
size, microdeformation degree, staking fault defects’ concentration in the condensates, the averaged dislocation
density at the subgrain boundaries and in their bulk as well as the total dislocation concentration
are determined by the physical broadening of the X-ray lines using the Cauchy and gauss approximations
and the threefold function convolution method. The calculations are compared with data for undoped ZnTe.
It is found out that the Mn-doping causes some degradation of structural characteristics of the condensates
compared with undoped layers.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/35057
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Escobar, Vivian Montardo. "Estudo da transição cristalográfica em filme fino de VO2 por difração de raios-x." Universidade Federal de Santa Maria, 2011. http://repositorio.ufsm.br/handle/1/9216.
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Coordenação de Aperfeiçoamento de Pessoal de Nível SuperiorIn one sample, X-Ray diffractions have been measured as a function of the temperature, in order to follow the crystallographic transition experienced by VO2 near 68ºC. The results have been analysed with the aide of a software based in the Rietveld structure refinement method. Below the critical temperature, the material is in a monoclinic M1 phase, with the V-V dimers parallel to the substrate. Near transition temperature, is has been identified a coexistence of the M1 and R phases, separated by a M2 region. The coexistence occurs inside individual grains. In contrast with the M1 and R phases, frequently identified in the VO2 transition, this is the first time the M2 phase is reported in < 011 > textured polycrystalline films of VO2 deposited by magnetron sputtering. A comparison between the M1 and R peaks width, at room temperature and (95ºC) respectively, shows the M1 phase is under inhomogeneous stress. Although in average those stresses are tensile, an important fraction of the sample is under compressive stress, what could explain the presence of the M2 phase.
Características estruturais e morfológicas de filmes de óxido de vanádio depositados pela técnica de magnetron sputtering reativo foram determinadas por difração de RX. Os filmes estudados, isentos de qualquer contaminação com outras estequiometrias, são constituídos de grãos relativamente grandes e estão fortemente texturizados com a direção < 011 > praticamente perpendicular ao substrato. Em uma amostra foram extraídos difratogramas em função da temperatura para acompanhar a transição cristalográfica que o VO2 sofre próximo a temperatura de 68ºC. Os resultados obtidos para as diferentes temperaturas foram analizados com o auxílio de um software baseado no método Rietveld de refinamento de estruturas. Para temperaturas abaixo da temperatura crítica para a transição, o material apresentou-se na fase monoclínica M1 com os dímeros de vanádio alinhados paralelos ao substrato. Na faixa de temperaturas que compreende a transição, há uma coexistência das fases M1 e R separadas por uma monoclínica M2. Esta coexistência ocorre dentro de grãos individuais da amostra. Ao contrário das fases M1 e R, que normalmente são identificadas na transição do VO2, esta é a primeira vez em que a fase M2 é observada em filmes finos policristalinos depositados por sputtering com textura < 011 >. A comparação entre as larguras dos picos da fase M1 (temperatura ambiente) e da fase rutila R (95ºC) mostra que a fase M1 está sujeita a estresses não homogêneos. Embora na média esse estresse seja tênsil, uma parte apreciável dos cristais se mostra sob estresse compressivo, parte esta que explica o surgimento da fase M2.
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Gålnander, Björn. "Thin Films and Deposition Processes Studied by Soft X-Ray Spectroscopy." Doctoral thesis, Uppsala University, Department of Materials Science, 2001. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-1095.
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This thesis deals with studies of thin films using soft x-ray emission spectroscopy. Thin films are frequently used in optical, semiconductor and magnetic applications, and along with the development of thin film deposition techniques, there is a growing need for thin film characterisation and production control. Soft x-ray spectroscopy provides elemental as well as chemical bonding information and has the advantage of being relatively insensitive to electric and magnetic fields. It may thus be used in-situ during deposition for monitoring sputtering deposition.
Thin films of TiVN were reactively co-sputtered using two targets, and soft x-ray spectroscopy and optical emission spectroscopy were used to determine the film composition in-situ. These measurements were compared with ex-situ elemental analysis as well as with computer simulations. The results agree qualitatively and indicate that soft x-ray spectroscopy can be used for in-situ determination of film composition. In another study, the composition of chromium nitride was studied in-situ under varying deposition conditions. The fraction of different stoichiometric phases in the deposited films as a function of nitrogen flow was determined in-situ.
The thesis also deals with the angular dependence of soft x-ray emission spectroscopy. The angular dependence of the emission was measured and compared to simulations for layered samples consisting of different transition metals, one sample consisting of Fe(50Å)/Cu(100Å)/V(100Å)/Si and another set of samples consisting of Fe(XÅ)/V(100Å)/MgO, where X = 25, 50 and 100 Å. The measured angular variation can be described qualitatively by calculations including refractive effects. For measurements below the critical angle of reflection, only the top layer corresponding to the evanescent wave region of 20-50 Å is probed, whereas for larger grazing angles the probe depth reaches thousands of Å. This demonstrates the feasibility of using the angular dependence as a way of studying composition and layer thickness of thin films.
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Canli, Sedat. "Thickness Analysis Of Thin Films By Energy Dispersive X-ray Spectroscopy." Master's thesis, METU, 2010. http://etd.lib.metu.edu.tr/upload/12612822/index.pdf.
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EDS is a tool for quantitative and qualitative analysis of the materials. In electron microscopy, the energy of the electrons determines the depth of the region where the X-rays come from. By varying the energy of the electrons, the depth of the region where the X-rays come from can be changed. If a thin film is used as a specimen, different quantitative ratios of the elements for different electron energies can be obtained. Unique thickness of a specific film on a specific substrate gives unique energy-ratio diagram so the thickness of a thin film can be calculated by analyzing the fingerprints of the energy-ratio diagram of the EDS data obtained from the film.
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Suominen, Fuller Marina L. "Chemistry of surface films from ZDDP by x-ray absorption spectroscopy." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ32306.pdf.
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Canning, Gregory William. "Soft X-ray spectroscopic studies of surface films from oil additives." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp03/MQ39807.pdf.
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Gålnander, Björn. "Thin films and deposition processes studied by soft X-ray spectroscopy /." Uppsala : Acta Universitatis Upsaliensis : Univ.-bibl. [distributör], 2001. http://publications.uu.se/theses/91-554-5006-7/.
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Eastwood, David Samuel. "Grazing incidence X-ray scattering from magnetic thin films and nanostructures." Thesis, Durham University, 2009. http://etheses.dur.ac.uk/27/.
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Grazing incidence scattering of synchrotron x-rays has been used to characterize the structure of magnetic thin films and periodic nanostructures. The combined metal and metal oxide films have been chosen to clarify the effects of growth processing techniques in technologically important magnetic and magnetoresistive thin film materials, and have particular relevance to the magnetic tunnel junction (MTJ) class of magnetic sensor. Co/Al2O3 thin films and Co/MgO multilayer thin films have been characterized using x-ray reflectivity and diffuse scatter analysis to explain how preparatory oxidation of the lower ferromagnet in an MTJ can reduce Néel interlayer coupling and improve the consistency of magnetoresistance. Measurements reveal differing effects for Al2O3 and MgO tunnel barrier materials. In Co/Al2O3 systems, preoxidation is found to reduce significantly chemical interdiffusion at the interface between the two layers, implying a more uniform oxidation of the barrier layer. In Co/MgO multilayers, an increased in-plane correlation length of the inherited interface roughness is seen after preoxidation. This implies that preoxidation suppresses the short wavelength undulations on both sides of the tunnel barrier that cause Néel coupling. Grazing incidence in-plane diffraction measurements on epitaxial Fe/MgO/Fe [001] and Fe/Au/MgO/Fe [001] films during annealing to 600 K have shown that, in both cases, the MgO lattice is initially strained towards being commensurate with the iron and gold layers, but relaxes after annealing towards a typical bulk MgO lattice. The iron and gold layers display linear thermal expansion at rates consistent with the bulk material. These in-plane lattice measurements demonstrate how the strain and strain dispersion in an epitaxial MgO barrier layer can be relieved under controlled annealing conditions. Finally, patterned thin film surfaces with submicron periodic symmetries have been studied by grazing incidence x-ray scattering. A novel semi-kinematical theory has been developed into a numerical algorithm capable of simulating the scatter from a wide range of arbitrary and disordered nanoscale arrays. This has allowed key structural parameters including array periodicity, symmetry and array coherence lengths to be extracted from experimental data.
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Beal, Mark S. "Soft X-ray and polarised neutron scattering of magnetic thin films." Thesis, University of York, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.434133.
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Kravchenko, Grygoriy A. "Crack patterns in thin films and X-ray optics thermal deformations." [Tampa, Fla] : University of South Florida, 2008. http://purl.fcla.edu/usf/dc/et/SFE0002770.
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Jall, Hutokshi Jamshed. "Raj Kapoor and Hindi Films: Catalysts of Political Socialization in India." DigitalCommons@Robert W. Woodruff Library, Atlanta University Center, 1994. http://digitalcommons.auctr.edu/dissertations/3399.
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This dissertation seeks to describe and analyze Raj Kapoor and Hindi films as direct and latent catalysis of political socialization in India. The main objective of this study is to portray that Raj Kapoor as an actor, director and producer of Hindi films endeavors not only to entertain people but makes them socially conscious by capturing the socioeconomic scenario in the aftermath of the partition of India in 1947, and socializes them to love each other, live in peace, and consequently, contribute towards the resurgence of a reformed, united and vibrant India.
In order to defend the objective of the thesis, films in which Raj Kapoor established himself as an actor or a creator were reviewed and analyzed, and extensive fieldwork was undertaken in Bombay.
The National Film Archive of India, Pune and the Price Gilbert Library, Atlanta provided secondary sources of information. The framework of analysis combines Gabriel Almond, G. Bingham owell and Sidney Verba's model of political socialization with Karl Deutsch's theory of communication and the New Left paradigm.
This dissertation, in the final analysis seeks to establish that Raj Kapoor and Hindi films are capable of assisting the Indian state in the process of nation-building by instilling a buoyant sense of nationalism, and invoking universal values of nonviolence, love, unity, peace and friendship in the individual, national and international spheres.
The significance of this research is unique as it seeks to establish the importance of Hindi film artists who contribute directly or indirectly in shaping the attitude, values and beliefs of the Indian people. Perhaps, this research work is path breaking as it seeks to analytically point out and reiterate the importance of love and nonviolence in the realm of politics, and in improving the quality of everyday life via Hindi films and artists like Raj Kapoor.
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Yeo, Inhwan. "New methods for improving x-ray film in-phantom dosimetry for megavoltage photon radiotherapy." Diss., Georgia Institute of Technology, 1996. http://hdl.handle.net/1853/17615.
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Ferreira, Ernando Silva. ""Filmes finos de brometo de tálio (TlBr) produzidos por spray pyrolysis"." Universidade de São Paulo, 2005. http://www.teses.usp.br/teses/disponiveis/59/59135/tde-04082005-183118/.
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Neste trabalho é apresentado o estudo de alguns dos principais parâmetros envolvidos na fabricação de filmes finos de brometo de tálio (TlBr) por meio da técnica de spray pyrolysis. Investigamos a possibilidade desta técnica vir a se tornar um método alternativo para fabricação de filmes finos de TlBr com qualidade adequada para a confecção de dispositivos detectores de radiação de altas energias, como raios-X e raios-γ. O tempo de fabricação e a qualidade dos filmes eram limitados pelo problema da formação de gotas dágua na parte superior da câmara de deposição, o que resultava na incidência destas gotas sobre os filmes, posteriormente. O problema foi resolvido por meio de um sistema de aquecimento extrínseco ao equipamento. A investigação dos parâmetros citados se deu pela variação dos fluxos de nitrogênio e da solução de TlBr, pelas variações da posição dos substratos no porta substrato, da temperatura e do grau de saturação das soluções. As propriedades cristalinas e estruturais dos filmes foram verificadas pela técnica de difração de raios-X e por microscopia eletrônica de varredura, respectivamente. Os resultados mostram que o pico de intensidade dos planos cristalinos preferenciais dos filmes tendem a se tornar mais intensos para soluções saturadas, fabricados com baixo fluxo de nitrogênio e a temperaturas próximas de 100oC. No entanto, dependendo da posição dos filmes sobre o porta-substrato, a intensidade dos picos, assim como a rugosidade superficial, variam significativamente. Com efeito, conseguimos estender o processo de deposição para qualquer tempo desejado, o que implica, a princípio, em filmes mais espessos e de melhor qualidade.This work presents the results about the investigation of the importance of some of the main parameters related to the fabrication of thin films of thallium bromide (TlBr) using the spray pyrolysis technique. We evaluated the possibilities for the future use of this technique in the development of high quality TlBr thin films to be used as high-energy radiation (such as X- and gamma rays) detectors. The total deposition time as well as the quality of the films were limited due to the formation of water droplets at the inner part of the top surface of the deposition chamber. These droplets would eventually fall over the substrates damaging the sample. This problem was solved by the use of an external heating system. The investigated deposition parameters were: nitrogen and solution flows, substrate position on top of the substrate holder, deposition temperature and composition of the solution. The crystalline and structural properties of the thin films were investigated by X-ray diffraction and Scanning Electron Microscopy. According to the results obtained from the diffraction experiments, the crystalline peaks increase with the saturation of the solution, low nitrogen flow and deposition temperatures close to 100oC. Nevertheless, the substrate position can also influence the crystallinity and amount of deposited material. In summary, we optimized the deposition parameters for the development of thick and high quality films that could be used for the development of sensors in the future.
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Rigby, Jane Rebecca. "X-ray and Infrared Diagnostics of Star Formation and Black Hole Accretion in Galaxies." Diss., Tucson, Arizona : University of Arizona, 2006. http://etd.library.arizona.edu/etd/GetFileServlet?file=file:///data1/pdf/etd/azu%5Fetd%5F1457%5F1%5Fm.pdf&type=application/pdf.
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Li, Kaile. "Defects at surface and interface of crystals : theoretical and x-ray scattering analysis /." free to MU campus, to others for purchase, 2002. http://wwwlib.umi.com/cr/mo/fullcit?p3074422.
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Hariyadi. "Preparation of LB films of alkyl-amine complexes and their optical ellipsometric and X-ray mirror properties." Thesis, University of Essex, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.265024.
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Schierle, Enrico. "Antiferromagnetism in thin films studied by resonant magnetic soft x-ray scattering." [S.l.] : [s.n.], 2007. http://www.diss.fu-berlin.de/2007/176/index.html.
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Kipgen, Lalminthang [Verfasser]. "X-Ray Investigation of Ultra-Thin Spin-Crossover Molecular Films / Lalminthang Kipgen." Berlin : Freie Universität Berlin, 2019. http://d-nb.info/1187244244/34.
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Miyazaki, Tsukasa. "Structural Studies on Thin Polymer Films by X-ray and Neutron Reflectivity." 京都大学 (Kyoto University), 2003. http://hdl.handle.net/2433/148548.
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Batista, Pessoa Walter. "Probing chalcogenide films by advanced X-ray metrology for the semiconductor industry." Thesis, Université Paris-Saclay (ComUE), 2018. http://www.theses.fr/2018SACLS330/document.
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Les nouveaux matériaux de type chalcogénures (à base de S, Se, Te) font l’objet d’un intérêt croissant, non seulement pour les applications mémoires avancées, photonique et photovoltaïque, mais également autour des matériaux dichalcogénures innovants à base de métaux de transition (MoS₂, WS₂, ..). Les propriétés de ces matériaux, réalisés sous forme d’alliages binaires ou ternaires, avec ou sans dopage, dépendent fortement de leur composition, du profil de composition dans ces couches très fines, ainsi que des conditions de surface et d’interface (préparation, passivation). La maîtrise des propriétés de ces couches fines, déposées par voie chimique (CVD) ou par co-pulvérisation cathodique magnétron, doit s’appuyer sur des nouveaux protocoles de caractérisation aux incertitudes optimisées et compatibles avec un contrôle de fabrication en ligne. Dans cette thèse, nous présentons les performances de protocoles de métrologie spécifiquement développés pour l’analyse de couches minces de chalcogénures. Ces protocoles, qui s’appuient essentiellement sur les techniques non destructives de spectroscopie de photoélectrons (XPS) et de fluorescence X (XRF), ont été optimisés pour la caractérisation surfacique des couches ultrafines, l’analyse quantitative de la composition des matériaux complexes à base de tellure ou de soufre, et la mesure du profil de composition dans des couches et empilements < 50 nm. Dans un premier temps, nous présentons l’étude par XPS quasi in situ des propriétés de surface des matériaux Ge, Sb, Te ainsi que de leurs composés binaires et ternaires. Nous mettons en évidence l’évolution de la surface après remise à l’air puis vieillissement, et nous comparons l’efficacité de stratégies d’encapsulation in situ de couches minces à base de Te et Se. Nous démontrons ensuite les performances de protocoles d’analyses par XRF à dispersion de longueur d’onde (WDXRF) et XPS pour la quantification précise de la composition chimique de composés Ge-Sb-Te (de 1 à 200 nm) et de couches ultrafines de dichalcogénures à base de métaux de transition (MoS₂, WS₂). L’analyse combinée WDXRF/XPS permet de mesurer l’évolution avec la composition des facteurs de sensibilité relative des composantes Ge3d, Te4d et Sb4d, et par conséquent d’améliorer la précision de mesure par XPS de la composition des matériaux à changement de phase de type GexSbyTez. Nous soulignons également l’influence des effets de matrice sur la capacité de la WDXRF à l’analyse quantitative de l’azote dans des matériaux Ge-Sb-Te. Nous évaluons la possibilité d’un étalonnage de la WDXRF fondé sur des analyses par faisceaux d’ions spécifiques, ce qui permet in fine un suivi en ligne de couches GeSbTeN dans une fenêtre procédé donnée. Enfin, nous présentons deux stratégies de caractérisation non destructive du profil de composition dans des couches minces de chalcogénures. D’une part, nous démontrons que la combinaison des techniques de XRF en géométrie d'incidence rasante (GIXRF) et de réflectométrie X (XRR) permet une mise en évidence non ambiguë de faibles variations dans les procédés de dépôts, voire de phénomènes de diffusion dans des empilements de 10 nm d'épaisseur. L'utilisation de substrats multicouches en lieu et place du silicium permet d’optimiser la distribution en profondeur du champ d'ondes stationnaires, ce qui conduit à une amélioration nette de la sensibilité des stratégies XRR / GIXRF. D’autre part, nous montrons l’adéquation de protocoles fondés sur l’analyse XPS résolue en angle pour la caractérisation du profil de composition dans des couches nanométriques de GeTe et Ge₂Sb₂Te₅, ce qui permet une étude fine des premières étapes de dépôt de ces matériauxChalcogenide materials are compounds based on S, Se, and Te elements from group VI of the periodic table. They are receiving an extensive interest not only for applications in resistive memories (PCRAM and CBRAM), photonics and photovoltaics but also in the development of new 2-D materials (e.g. spintronics applications). Chalcogenide materials are already present in the semiconductor roadmaps and it is already replacing flash memories (e.g. phase change material and ovonic threshold switch in new random access memory). For the next technology nodes, chalcogenide properties can be scaled by tuning the chemical composition or by reducing the film thickness. Nonetheless, it also means that their properties become more tightly influenced by the chemical composition, the surface/interface effects and the depth-profile composition. Hence, dedicated metrology protocols must be developed, first to assist the optimization of chalcogenide materials processes in cleanroom environment, then to allow non-destructive process monitoring with industry-driven uncertainties. In this PhD thesis, we developed metrology protocols based on X-ray techniques, dedicated to thin chalcogenides materials and fully compatible with inline monitoring. First, we used quasi in-situ X-ray Photoelectron Spectroscopy (XPS) to characterize the surface of Ge, Sb, Te thin materials and compounds, and to study the composition-dependent evolution of the surface after air break and ageing. The efficiency of in situ capping strategies to protect Te-based and Se-based thin layered materials from ageing was also investigated. Secondly, we demonstrated the ability of improved metrology strategies based on in-line Wavelength Dispersive X-ray Fluorescence (WDXRF) and XPS to accurately quantify the chemical composition of Ge-Sb-Te compounds (from 1 to 200 nm) and ultrathin 2D transition metal dichalcogenides (MoS₂, WS₂). Combined WDXRF/XPS analysis was used to determine refined values of composition-dependent relative sensitivity factors for Te4d, Sb4d and Ge3d that allow for XPS-based metrology of PCRAM materials with mastered accuracy. We pointed the need for in-depth study of the significant matrix effects that alter the ability of WDXRF to quantify Nitrogen in Ge-Sb-Te materials: ion beam analysis was carefully investigated as possible input for WDXRF calibration, and a WDXRF protocol was established for inline monitoring of N-doped Ge-Sb-Te films in a specific process window. Finally, we investigated two ways to non-destructively characterize the in-depth chemical distribution in thin chalcogenide films: we demonstrated that the combination of XRF in grazing incidence geometry (GIXRF) and X-ray reflectometry (XRR) was able to unambiguously reveal small process differences along with process-induced diffusion in 10 nm-thick stackings. We showed that the use of multilayered substrate instead of silicon allowed fine-tuning of the depth-dependent X-ray standing wave field, resulting in improved sensitivity of XRR/GIXRF strategies. We also developed an angle-resolved XPS protocol for the evaluation of the first deposition steps of GeTe and Ge₂Sb₂Te₅ films, revealing the process-dependent elemental distribution as a function of the film growth. Therefore, in this work we not only elaborated advanced metrology protocols for the development of new chalcogenide films but also metrological solutions for the next technology nodes (28 nm and below), since current in-line metrology tools reach their detection limits