Relevant bibliographies by topics / Reconfigurable scan networks

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers

Academic literature on the topic 'Reconfigurable scan networks'

Author: Grafiati
Published: 14 March 2023
Last updated: 31 July 2025

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Journal articles on the topic "Reconfigurable scan networks"

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Baranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Reconfigurable Scan Networks." ACM Transactions on Design Automation of Electronic Systems 20, no. 2 (2015): 1–27. http://dx.doi.org/10.1145/2699863.

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Larsson, Erik, Zehang Xiang, and Prathamesh Murali. "Graceful Degradation of Reconfigurable Scan Networks." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29, no. 7 (2021): 1475–79. http://dx.doi.org/10.1109/tvlsi.2021.3076593.

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Cantoro, Riccardo, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, and Matteo Sonza Reorda. "Test of Reconfigurable Modules in Scan Networks." IEEE Transactions on Computers 67, no. 12 (2018): 1806–17. http://dx.doi.org/10.1109/tc.2018.2834915.

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Baranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Access Port Protection for Reconfigurable Scan Networks." Journal of Electronic Testing 30, no. 6 (2014): 711–23. http://dx.doi.org/10.1007/s10836-014-5484-2.

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Xu, Yizhen, Shouhong Chen, Jun Ma, Cuifeng Xu, and Ke Zeng. "Topology Modeling for Reconfigurable Scan Networks in IEEE 1687 Networks." Journal of Physics: Conference Series 2221, no. 1 (2022): 012055. http://dx.doi.org/10.1088/1742-6596/2221/1/012055.

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Abstract This paper designs an automatic generation method of Reconfigurable Scan Networks (RSNs) directed topology model combined with graph theory. By studying IEEE 1687 chains information, RSNs directed topology model is generated automatically based on the interconnections between on-chip instruments and the corresponding internal register length which are determined on standard Instrument Connectivity Language (ICL) script. The test and result analysis demonstrate the feasibility and effectiveness of the technology, which solves the inefficiency and high error rate of RSNs directed topolo
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Baranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Fine-Grained Access Management in Reconfigurable Scan Networks." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 34, no. 6 (2015): 937–46. http://dx.doi.org/10.1109/tcad.2015.2391266.

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Hajian, M., B. Kuijpers, K. Buisman, et al. "Passive and Active Reconfigurable Scan-Beam Hollow Patch Reflectarray Antennas." ISRN Communications and Networking 2012 (May 6, 2012): 1–10. http://dx.doi.org/10.5402/2012/290534.

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The design concept of passive and active reconfigurable reflectarray antennas has been proposed and tested. The antenna elements in the array are identical hollowed patches. In the first phase of study the slots are loaded with a SMD capacitor to set the required phase shift needed for array implementation. Simulations show promising results. Mounting a SMD capacitor in such a configuration can be considered as the first step in using capacitive loading on a slotted patch for active microstrip reflectarrays. It is shown that by adjusting the capacitance values it is possible to scan the beam.
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Cantoro, Riccardo, Aleksa Damljanovic, Matteo Sonza Reorda, and Giovanni Squillero. "A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks." IEEE Transactions on Computers 69, no. 1 (2020): 87–98. http://dx.doi.org/10.1109/tc.2019.2939125.

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Cantoro, Riccardo, Aleksa Damljanovic, Matteo Sonza Reorda, and Giovanni Squillero. "An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests." Journal of Circuits, Systems and Computers 28, supp01 (2019): 1940007. http://dx.doi.org/10.1142/s0218126619400073.

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Nowadays, many Integrated Systems embed auxiliary on-chip instruments whose function is to perform test, debug, calibration, configuration, etc. The growing complexity and the increasing number of these instruments have led to new solutions for their access and control, such as the IEEE 1687 standard. The standard introduces an infrastructure composed of scan chains incorporating configurable elements for accessing the instruments in a flexible manner. Such an infrastructure is known as Reconfigurable Scan Network or RSN. Since permanent faults affecting the circuitry can cause malfunction, i.
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Ghani, Arfan, Akinyemi Aina, Chan Hwang See, Hongnian Yu, and Simeon Keates. "Accelerated Diagnosis of Novel Coronavirus (COVID-19)—Computer Vision with Convolutional Neural Networks (CNNs)." Electronics 11, no. 7 (2022): 1148. http://dx.doi.org/10.3390/electronics11071148.

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Early detection and diagnosis of COVID-19, as well as the exact separation of non-COVID-19 cases in a non-invasive manner in the earliest stages of the disease, are critical concerns in the current COVID-19 pandemic. Convolutional Neural Network (CNN) based models offer a remarkable capacity for providing an accurate and efficient system for the detection and diagnosis of COVID-19. Due to the limited availability of RT-PCR (Reverse transcription-polymerase Chain Reaction) tests in developing countries, imaging-based techniques could offer an alternative and affordable solution to detect COVID-
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Dissertations / Theses on the topic "Reconfigurable scan networks"

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Baranowski, Rafal [Verfasser], and Hans-Joachim [Akademischer Betreuer] Wunderlich. "Reconfigurable scan networks : formal verification, access optimization, and protection / Rafal Baranowski. Betreuer: Hans-Joachim Wunderlich." Stuttgart : Universitätsbibliothek der Universität Stuttgart, 2014. http://d-nb.info/1048558843/34.

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CANTORO, RICCARDO. "New techniques for functional testing of microprocessor based systems." Doctoral thesis, Politecnico di Torino, 2017. http://hdl.handle.net/11583/2680228.

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Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Con
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Book chapters on the topic "Reconfigurable scan networks"

1

Bertossi, Alan A., and Alessandro Mei. "Optimal Segmented Scan and Simulation of Reconfigurable Architectures on Fixed Connection Networks." In High Performance Computing — HiPC 2000. Springer Berlin Heidelberg, 2000. http://dx.doi.org/10.1007/3-540-44467-x_5.

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Conference papers on the topic "Reconfigurable scan networks"

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Lylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Robust Reconfigurable Scan Networks." In 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2022. http://dx.doi.org/10.23919/date54114.2022.9774770.

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Baranowski, Rafal, Michael A. Kochte, and Hans-Joachim Wunderlich. "Securing Access to Reconfigurable Scan Networks." In 2013 22nd Asian Test Symposium (ATS). IEEE, 2013. http://dx.doi.org/10.1109/ats.2013.61.

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Kochte, Michael A., Rafal Baranowski, Marcel Schaal, and Hans-Joachim Wunderlich. "Test Strategies for Reconfigurable Scan Networks." In 2016 IEEE 25th Asian Test Symposium (ATS). IEEE, 2016. http://dx.doi.org/10.1109/ats.2016.35.

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Lylina, Natalia, Ahmed Atteya, Pascal Raiola, Matthias Sauer, Bernd Becker, and Hans-Joachim Wunderlich. "Security Compliance Analysis of Reconfigurable Scan Networks." In 2019 IEEE International Test Conference (ITC). IEEE, 2019. http://dx.doi.org/10.1109/itc44170.2019.9000114.

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Cantoro, Riccardo, Marco Palena, Paolo Pasini, and Matteo Sonza Reorda. "Test Time Minimization in Reconfigurable Scan Networks." In 2016 IEEE 25th Asian Test Symposium (ATS). IEEE, 2016. http://dx.doi.org/10.1109/ats.2016.58.

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Ull, Dominik, Michael Kochte, and Hans-Joachim Wunderlich. "Structure-Oriented Test of Reconfigurable Scan Networks." In 2017 IEEE 26th Asian Test Symposium (ATS). IEEE, 2017. http://dx.doi.org/10.1109/ats.2017.34.

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Lylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Online Periodic Test of Reconfigurable Scan Networks." In 2022 IEEE 31st Asian Test Symposium (ATS). IEEE, 2022. http://dx.doi.org/10.1109/ats56056.2022.00026.

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Brandhofer, Sebastian, Michael A. Kochte, and Hans-Joachim Wunderlich. "Synthesis of Fault-Tolerant Reconfigurable Scan Networks." In 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2020. http://dx.doi.org/10.23919/date48585.2020.9116525.

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Lylina, Natalia, Chih-Hao Wang, and Hans-Joachim Wunderlich. "Testability-Enhancing Resynthesis of Reconfigurable Scan Networks." In 2021 IEEE International Test Conference (ITC). IEEE, 2021. http://dx.doi.org/10.1109/itc50571.2021.00009.

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Thiemann, Benjamin, Linus Feiten, Pascal Raiola, Bernd Becker, and Matthias Sauer. "On Integrating Lightweight Encryption in Reconfigurable Scan Networks." In 2019 IEEE European Test Symposium (ETS). IEEE, 2019. http://dx.doi.org/10.1109/ets.2019.8791543.

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