Relevant bibliographies by topics / Reflection spectroscopy

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Reflection spectroscopy'

Author: Grafiati
Published: 28 May 2022
Last updated: 31 July 2025

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Journal articles on the topic "Reflection spectroscopy"

1

Mirabella, F. M. "Internal Reflection Spectroscopy." Applied Spectroscopy Reviews 21, no. 1-2 (1985): 45–178. http://dx.doi.org/10.1080/05704928508060428.

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Weightman, P., D. S. Martin, R. J. Cole, and T. Farrell. "Reflection anisotropy spectroscopy." Reports on Progress in Physics 68, no. 6 (2005): 1251–341. http://dx.doi.org/10.1088/0034-4885/68/6/r01.

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ATWATER, HARRY A., C. C. AHN, S. S. WONG, G. HE, H. YOSHINO, and S. NIKZAD. "ENERGY-FILTERED RHEED AND REELS FOR IN SITU REAL TIME ANALYSIS DURING FILM GROWTH." Surface Review and Letters 04, no. 03 (1997): 525–34. http://dx.doi.org/10.1142/s0218625x9700050x.

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Energy-filtered reflection high energy electron diffraction and reflection electron energy loss spectroscopy expand the usefulness of reflection high energy electron diffraction for quantitative structure determination and surface spectroscopy during film growth. Several implementations of energy-filtered reflection high energy electron diffraction are discussed, along with the progress and prospects for structure determination. New developments in parallel detection reflection electron energy loss spectroscopy (PREELS) enable the use of this method to obtain surface-spectroscopic information
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4

OSAWA, Masatoshi. "Total reflection Raman spectroscopy." Journal of the Spectroscopical Society of Japan 37, no. 3 (1988): 207–8. http://dx.doi.org/10.5111/bunkou.37.207.

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Brodsky, Anatol M., Lloyd W. Burgess, and Sean A. Smith. "Grating Light Reflection Spectroscopy." Applied Spectroscopy 52, no. 9 (1998): 332A—343A. http://dx.doi.org/10.1366/0003702981944995.

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ITO, Masatoki. "Infrared Reflection Absorption Spectroscopy." Hyomen Kagaku 13, no. 2 (1992): 88–95. http://dx.doi.org/10.1380/jsssj.13.88.

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Egawa, T., Y. Okimoto, R. Fukaya, et al. "Femtosecond Reflection Spectroscopy in La1.5Sr0.5CoO4." Acta Physica Polonica A 121, no. 2 (2012): 307–9. http://dx.doi.org/10.12693/aphyspola.121.307.

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Lilledahl, Magnus B., Olav A. Haugen, Marianne Barkost, and Lars O. Svaasand. "Reflection spectroscopy of atherosclerotic plaque." Journal of Biomedical Optics 11, no. 2 (2006): 021005. http://dx.doi.org/10.1117/1.2186332.

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Macdonald, B. F., J. S. Law, and R. J. Cole. "Azimuth-dependent reflection anisotropy spectroscopy." Journal of Applied Physics 93, no. 6 (2003): 3320–27. http://dx.doi.org/10.1063/1.1544645.

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Harrick, N. J. "Nanosampling via Internal Reflection Spectroscopy." Applied Spectroscopy 41, no. 1 (1987): 1–2. http://dx.doi.org/10.1366/0003702874868052.

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Dissertations / Theses on the topic "Reflection spectroscopy"

1

Anderson, Brian Benjamin. "Grating light reflection spectroscopy /." Thesis, Connect to this title online; UW restricted, 1996. http://hdl.handle.net/1773/8600.

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Maslin, Keith Alan. "Far infrared reflection spectroscopy of solids." Thesis, Royal Holloway, University of London, 1986. http://repository.royalholloway.ac.uk/items/9e8b5aa1-f65f-49de-b10b-18bded0da226/1/.

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The optical properties of a selection of crystalline solids have been studied in the far infrared by dispersive Fourier transform spectroscopy. This technique allows both the amplitude and phase to be determined without any approximation. The measurements were performed on a modified Michelson interferometer, in which one of the mirrors is replaced with the sample to obtain the dispersive interferogram. The instrument was improved by replacing the stepper motor drive with a hydraulic piston and a high precision linear bearing. Sampling control was obtained by monitoring the cosine fringes from
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Miyoshi, Yasuyuki. "Development of point-contact Andreev reflection spectroscopy." Thesis, Imperial College London, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.441970.

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El-Gohary, Ahmed Ramadan. "Far infrared reflection spectroscopy of layered semiconductors." Thesis, Royal Holloway, University of London, 1989. http://repository.royalholloway.ac.uk/items/f2362bc6-d941-472f-bf1e-2249df3ca6e7/1/.

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The optical properties of a selection of layered semiconductor samples have been studied in the far-infrared by reflection dispersive Fourier transform spectroscopy (DFTS) and attenuated total reflection (ATR) spectroscopy in DFTS the reference mirror in a two-beam Michelson interferometer is replaced with the sample to obtain a dispersive interferogram. This technique allows both the amplitude and phase to be measured directly. The amplitude and phase reflectivities of a variety of epitaxial layers (including a GaAs/AlAs superlattice)on GaAs substrates are presented. The measurements on the e
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Wang, Yang. "CdS Reflection Coefficient Determination via Photocurrent Spectroscopy." Bowling Green State University / OhioLINK, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=bgsu1219593815.

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Tarof, Lawrence E. (Lawrence Edward) Carleton University Dissertation Engineering Electrical. "Epitaxial layer thickness measurements using reflection spectroscopy." Ottawa, 1989.

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7

Lane, Paul David. "Nanoscale surface modification studied by reflection anisotropy spectroscopy." Thesis, University of Edinburgh, 2009. http://hdl.handle.net/1842/5660.

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The development and control of nanoscale properties is a major goal in science and technology; for the development of such technologies it is important that there are experimental techniques which allow the monitoring of development processes in real time and in a range of environments. With this in mind much effort has been invested in the development of surface sensitive optical probes. One such technique, reflection anisotropy spectroscopy (RAS), has been applied successfully to a number of different problems since its development in the mid 1980’s. RAS as a surface specific technique is ve
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Sieberhagen, Rheinhardt Hendrik. "Optical characterization of semiconductors using photo reflection spectroscopy." Diss., Pretoria : [s.n.], 2002. http://upetd.up.ac.za/thesis/available/etd-11242005-142711/.

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Tojo, Satoshi. "Attenuated total reflection spectroscopy on alkali-metal atoms." 京都大学 (Kyoto University), 2003. http://hdl.handle.net/2433/148543.

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Kniffin, Gabriel Paul. "Model-Based Material Parameter Estimation for Terahertz Reflection Spectroscopy." PDXScholar, 2010. https://pdxscholar.library.pdx.edu/open_access_etds/241.

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Many materials such as drugs and explosives have characteristic spectral signatures in the terahertz (THz) band. These unique signatures imply great promise for spectral detection and classification using THz radiation. While such spectral features are most easily observed in transmission, real-life imaging systems will need to identify materials of interest from reflection measurements, often in non-ideal geometries. One important, yet commonly overlooked source of signal corruption is the etalon effect - interference phenomena caused by multiple reflections from dielectric layers of packagin
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Books on the topic "Reflection spectroscopy"

1

Milosevic, Milan. Internal reflection and ATR spectroscopy. Wiley, 2012.

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2

Milosevic, Milan. Internal reflection and ATR spectroscopy. Wiley, 2012.

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3

Mirabella, Francis M. Internal reflection spectroscopy: Review and supplement. Edited by Harrick N. J. Harrick Scientific Corporation, 1985.

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Milosevic, Milan. Internal Reflection and ATR Spectroscopy. John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118309742.

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Klockenkämper, R. Total-reflection X-ray fluorescence analysis. Wiley, 1997.

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6

Räty, Jukka, Kai-Erik Peiponen, and Toshimitsu Asakura. UV-Visible Reflection Spectroscopy of Liquids. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-540-45093-1.

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Räty, Jukka. UV-Visible Reflection Spectroscopy of Liquids. Springer Berlin Heidelberg, 2004.

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8

M, Mirabella Francis, ed. Internal reflection spectroscopy: Theory and applications. Marcel Dekker, 1993.

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9

Klockenkämper, Reinhold. Total-reflection X-ray fluorescence analysis and related methods. John Wiley and Sons, 2014.

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10

Wang, Zhong Lin. Reflection electron microscopy and spectroscopy for surface analysis. Cambridge University Press, 1996.

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Book chapters on the topic "Reflection spectroscopy"

1

de Fornel, Frédärique. "Internal-Reflection Spectroscopy." In Springer Series in Optical Sciences. Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-540-48913-9_7.

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Suëtaka, W., and John T. Yates. "Internal Reflection Spectroscopy." In Surface Infrared and Raman Spectroscopy. Springer US, 1995. http://dx.doi.org/10.1007/978-1-4899-0942-8_3.

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Gooch, Jan W. "Reflection–Absorption Spectroscopy." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_9860.

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Gooch, Jan W. "Internal Reflection Spectroscopy." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_6417.

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Robles-Kelly, Antonio, and Cong Phuoc Huynh. "Reflection Geometry." In Imaging Spectroscopy for Scene Analysis. Springer London, 2013. http://dx.doi.org/10.1007/978-1-4471-4652-0_9.

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6

Hayden, Brian E. "Reflection Absorption Infrared Spectroscopy." In Vibrational Spectroscopy of Molecules on Surfaces. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4684-8759-6_7.

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Suëtaka, W., and John T. Yates. "Infrared External Reflection Spectroscopy." In Surface Infrared and Raman Spectroscopy. Springer US, 1995. http://dx.doi.org/10.1007/978-1-4899-0942-8_2.

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Hasegawa, Takeshi. "Infrared External-Reflection Spectroscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_47.

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Yoshinobu, Jun. "Infrared Reflection–Absorption Spectroscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_48.

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Bambi, Cosimo. "X-Ray Reflection Spectroscopy." In Black Holes: A Laboratory for Testing Strong Gravity. Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-4524-0_8.

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Conference papers on the topic "Reflection spectroscopy"

1

Smeesters, Lien. "Towards a non-destructive and sensitive food quality inspection using broadband diffuse reflection spectroscopy and machine learning." In Applied Industrial Spectroscopy. Optica Publishing Group, 2024. https://doi.org/10.1364/ais.2024.aw3a.3.

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Diffuse reflection spectroscopy (400nm–1700nm) offers a non-destructive and accurate food quality and safety evaluation. Optimal results are achieved after co-optimization of the spectroscopic measurement procedure and machine learning analysis, showing classification performances exceeding 92%.
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Tricanji, Claudia, Steven van den Berg, and Lien Smeesters. "Characterization of different dietary fibers with Near-Infrared spectroscopy and wavelength ratio analysis." In Applied Industrial Spectroscopy. Optica Publishing Group, 2024. https://doi.org/10.1364/ais.2024.atu1g.4.

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We demonstrate that near-infrared (NIR) reflection spectroscopy combined with a wavelength ratio analysis allows for consistent distinguishing different types of dietary fibers. This non-destructive dietary fiber analysis is promising for improved nutritional labeling.
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Amarasinghe, Yasith, Vincent Goumarre, Martin Lahn Henriksen, Mogens Hinge, and Pernille Klarskov. "THz Reflection Spectroscopy for Linear Scanning of Plastics." In 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). IEEE, 2024. http://dx.doi.org/10.1109/irmmw-thz60956.2024.10697907.

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Haddad, Dhia, Najoua Essoukri Ben Amara, and Olfa Kanoun. "Generalization of Reflection Modeling in Complex Cable Structure with Impedance Mismatches." In 2024 International Workshop on Impedance Spectroscopy (IWIS). IEEE, 2024. https://doi.org/10.1109/iwis63047.2024.10847249.

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Lowry, Seth N., Brad D. Price, Ian D. Hartley, Mark R. A. Shegelski, and Matt Reid. "Terahertz Reflection Imaging of Concealed Interfaces." In Applied Industrial Spectroscopy. OSA, 2021. http://dx.doi.org/10.1364/ais.2021.aw5g.3.

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Laun, T., M. Muenzer, U. Wenzel, S. Princz, and M. Hessling. "Cartilage Analysis by Reflection Spectroscopy." In European Conference on Biomedical Optics. OSA, 2015. http://dx.doi.org/10.1364/ecbo.2015.95372b.

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Laun, T., M. Muenzer, U. Wenzel, S. Princz, and M. Hessling. "Cartilage analysis by reflection spectroscopy." In European Conferences on Biomedical Optics, edited by J. Quincy Brown and Volker Deckert. SPIE, 2015. http://dx.doi.org/10.1117/12.2196660.

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Tobin, Mark J., Keith R. Bambery, Danielle E. Martin, et al. "Attenuated Total Reflection FTIR Microspectroscopy at the Australian Synchrotron." In Fourier Transform Spectroscopy. OSA, 2016. http://dx.doi.org/10.1364/fts.2016.ftu2e.5.

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Sudduth, Amanda S. M., Benjamin S. Goldschmidt, Edward B. Samson, Paul J. D. Whiteside, and John A. Viator. "Total internal reflection photoacoustic detection spectroscopy." In SPIE BiOS, edited by Alexander A. Oraevsky and Lihong V. Wang. SPIE, 2011. http://dx.doi.org/10.1117/12.875313.

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Fitch, Michael J., Caroline Dodson, Yunqing Chen, Haibo Liu, X. C. Zhang, and Robert Osiander. "Terahertz reflection spectroscopy for explosives detection." In Defense and Security, edited by R. Jennifer Hwu, Dwight L. Woolard, and Mark J. Rosker. SPIE, 2005. http://dx.doi.org/10.1117/12.604763.

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Reports on the topic "Reflection spectroscopy"

1

Thorsos, Eric I. Terahertz Reflection Spectroscopy for Identification of Explosive Devices. Defense Technical Information Center, 2012. http://dx.doi.org/10.21236/ada573590.

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Cocks, J. F. C., P. A. Butler, and K. J. Cann. Spectroscopy of reflection-asymmetric nuclei using multinucleon transfer reactions. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/414386.

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Kniffin, Gabriel. Model-Based Material Parameter Estimation for Terahertz Reflection Spectroscopy. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.241.

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R Castelli, P Persans, W Strohmayer, and V Parkinson. Optical Reflection Spectroscopy of Thick Corrosion Layers on 304 Stainless Steel. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/881303.

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Greenwood, Margaret S., and Salahuddin Ahmed. Investigating Ultrasonic Diffraction Grating Spectroscopy and Reflection Techniques for Characterizing Slurry Properties. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/895839.

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Greenwood, Margaret S., Leonard J. Bond, Lloyd Burgess, and Anatol Brodsky. Investigating Ultrasonic Diffraction Grating Spectroscopy and Reflection Techniques for Characterizing Slurry Properties. Office of Scientific and Technical Information (OSTI), 2002. http://dx.doi.org/10.2172/834771.

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Greenwood, Margaret S., Leonard J. Bond, Lloyd Burgess, and Anatol Brodsky. Investigating Ultrasonic Diffraction Grating Spectroscopy and Reflection Techniques for Characterizing Slurry Properties. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/834772.

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Greenwood, Margaret S., and Lloyd Burgess. Investigating Ultrasonic Diffraction Grating Spectroscopy and Reflection Techniques for Characterizing Slurry Properties. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/839322.

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Burgess, L. W., and A. M. Brodsky. Investigating Ultrasonic Diffraction Grating Spectroscopy and Reflection Techniques for Characterizing Slurry Properties. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/861452.

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Takaura, Norikatsu. Synchrotron Radiation Total Reflection X-ray Fluorescence Spectroscopy for Microcontamination Analysis on Silicon Wafer Surfaces. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/784854.

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