Relevant bibliographies by topics / Relaxory

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Academic literature on the topic 'Relaxory'

Author: Grafiati
Published: 4 June 2021
Last updated: 10 February 2022

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Journal articles on the topic "Relaxory"

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SHVARTSMAN, V. V., and A. L. KHOLKIN. "POLAR STRUCTURES OF PbMg1/3Nb2/3O3-PbTiO3 RELAXORS: PIEZORESPONSE FORCE MICROSCOPY APPROACH." Journal of Advanced Dielectrics 02, no. 02 (April 2012): 1241003. http://dx.doi.org/10.1142/s2010135x12410032.

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Relaxor ferroelectrics are one of the mysterious objects of the solid-state physics studied over 50 years. The physical properties of relaxors were mainly assessed by scattering and dielectric methods and revealed the importance of polarization correlations with the short-range order, so-called polarization nanoscale regions. This paper review recent progress achieved by using piezoresponse force microscopy (PFM) to analyze the spatial distribution of polarization and its evolution with time, temperature, and electric field for the most popular relaxor family: solid solutions between PbMg1/3Nb2/3O3 and PbTiO3 . The PFM technique has proved to be a powerful tool for the investigation of local properties of relaxors where optical techniques obviously fail because of their lack of resolution. The PFM study of relaxors clearly helps to understand the mechanism of polarization distribution and illustrates the importance of mesoscopic polarization patterns that were until now overlooked by major theories of the relaxor state.
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Blinc, R., B. Zalar, and Alan Gregorovic. "NMR and the local structure of relaxors." Science of Sintering 34, no. 1 (2002): 3–11. http://dx.doi.org/10.2298/sos0201003b.

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The relaxor transition in cubic perovskite relaxors (PMN, PSN and PST) and tungsten bronze relaxor (SBN) has been studied by NMR. The observed spectra are composed of a narrow -1/2 ? 1/2 central transition superimposed on a broad background due to satellite transitions. The chemical heterogeneity, responsible for relaxor properties, is reflected here in the structure of the central transition part. The latter is composed of two components, one due to ordered and the other due to disordered regions. Despite of the fact that the macroscopic symmetry does not change when relaxor transition occurs, a non-zero quadruple coupling constant determined from NMR clearly demonstrates the broken local symmetry.
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Bajpai, Parmendra Kumar. "Dielectric Relaxation Phenomena in some Lead and Non-Lead Based Ferroelectric Relaxor Materials: Recent Advances." Solid State Phenomena 189 (June 2012): 233–66. http://dx.doi.org/10.4028/www.scientific.net/ssp.189.233.

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Relaxors with general formula AA'BB'O3with different cationic distributions at A/B-sites have important device applications in capacitors, piezoelectric ultrasonic transducers, electrostrictive actuators, SAW substrates, etc. The doping or compositional changes in these ceramics can control the high electromechanical characteristics. Lead zirconate titanates (PZT) - based solid solutions exhibit excellent electrochemical properties and are widely used as actuators, transducers, ceramic filters, resonators, sensors and other electronic devices, due to their excellent piezoelectric properties. Although, there has been a concerted effort to develop leadfree piezoelectric ceramics, no effective alternative to PZT has yet been found; most other materials that possess high dielectric and piezoelectric coefficients still contain lead ions. Dielectric relaxation in these materials is of fundamental importance. Recently, new relaxor ferroelectric materials (Pb (B1/3Nb2/3)O3types) have been reported by our group in which the dielectric relaxation character is different from that observed in typical lead based relaxors. In the first part of the review, relaxor characteristics, strategies to synthesize phase pure lead based relaxors and dielectric relaxation phenomena are presented. Deviation of the frequency dependent susceptibility from Curie-Weiss law is analysed both in terms of Gaussian and Lorentzian formalisms. Lead based ferroelectric relaxor materials, due to environmental, health and social reasons are not preferred in devices and attempts are being made to eliminate the lead content from these materials. Sodium bismuth titanate (Na0.5Bi0.5TiO3, abbreviated as NBT), is considered to be one of the excellent candidates for lead-free piezoelectric material. However, pure NBT piezoelectric ceramics are difficult to pole due to its relatively large coercive field and high electrical conductivity. Therefore, many solid solutions of NBT with other ceramics are proposed to improve the relevant properties. In the second part of the review, relaxor behaviour of newly developed solid solutions of NBT is discussed. Finally, the future scope of research on these advance materials is presented.
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BOKOV, ALEXEI A., and ZUO-GUANG YE. "DIELECTRIC RELAXATION IN RELAXOR FERROELECTRICS." Journal of Advanced Dielectrics 02, no. 02 (April 2012): 1241010. http://dx.doi.org/10.1142/s2010135x1241010x.

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In this review the dielectric properties of relaxor ferroelectrics are discussed and compared with the properties of normal dielectrics and ferroelectrics. We try to draw a general picture of dielectric relaxation starting from a textbook review of the underlying concepts and pay attention to common behavior of relaxors rather than to the features observed in specific materials. We hope that this general approach is beneficial to those physicists, chemists, material scientists and device engineers who deal with relaxors. Based on the analysis of dielectric properties, a comprehensive definition of relaxors is proposed: relaxors are defined as ferroelectrics in which the maximum in the temperature dependence of static susceptibility occurs within the temperature range of dielectric relaxation, but does not coincide with the temperature of singularity of relaxation time or soft mode frequency.
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HLINKA, J. "DO WE NEED THE ETHER OF POLAR NANOREGIONS?" Journal of Advanced Dielectrics 02, no. 02 (April 2012): 1241006. http://dx.doi.org/10.1142/s2010135x12410068.

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This paper deals with possible experimental signatures of the so-called polar nanoregions in lead-based perovskite relaxors. It outlines both traditional and alternative approaches to these signatures. It is argued that the concept of polar nanoregions is useful but largely speculative. Polar nanoregions are compared with ferroelectric nanodomains. Qualitative explanation of the principal "relaxor" properties of PMN are discussed in both frameworks. It is argued that polarization as a vector may not be well defined at any nanometric region in PMN Crystal.
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Cowley, R. A., S. N. Gvasaliya, S. G. Lushnikov, B. Roessli, and G. M. Rotaru. "Relaxing with relaxors: a review of relaxor ferroelectrics." Advances in Physics 60, no. 2 (April 2011): 229–327. http://dx.doi.org/10.1080/00018732.2011.555385.

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Sekar, Michael M. A., Arvind Halliyal, and K. C. Patil. "Synthesis, characterization, and properties of lead-based relaxor ferroelectrics." Journal of Materials Research 11, no. 5 (May 1996): 1210–18. http://dx.doi.org/10.1557/jmr.1996.0155.

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Lead-based relaxor ferroelectrics such as Pb(Mg1/3Nb2/3)O3 (PMN), Pb(Zn1/3Nb2/3)O3 (PZN), and their solid solutions with BaTiO3 and PbTiO3 have been prepared by a solution combustion process which involves metal nitrates/oxalate and tetraformal trisazine (TFTA) at 350 °C. Thermal evolution of perovskite relaxors has been investigated at different temperatures of calcination using the powder x-ray diffraction method. Particles are fine and sinter-active at low temperature (1050 °C). Both particulate and dielectric properties are compared.
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KLEEMANN, WOLFGANG. "RANDOM FIELDS IN RELAXOR FERROELECTRICS — A JUBILEE REVIEW." Journal of Advanced Dielectrics 02, no. 02 (April 2012): 1241001. http://dx.doi.org/10.1142/s2010135x12410019.

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Substitutional charge disorder as in PbMg1/3Nb2/3O3 , structural cation vacancies as in Sr x Ba 1-x Nb 2 O 6 and isovalent substitution of off-centered cations as in BaTi 1-x Sn x O 3 and BaTi 1-x Zr x O 3 give rise to quenched electric random-fields (RF s ), which we proposed to be at the origin of the peculiar behavior of relaxor ferroelectrics 20 years ago. These are, e.g. a strong frequency dispersion of the dielectric response and an apparent lack of macroscopic symmetry breaking in the low temperature phase. Both are related to mesoscopic RF-driven phase transitions, which give rise to irregularly shaped quasi-stable polar nanoregions below the characteristic temperature T*, but above the global transition temperature Tc. Their co-existence with the paraelectric parent phase can be modeled by time-dependent field equations under the control of quenched RF s and stress-free strain (in the case of order parameter dimension n ≥ 2). Transitions into global polar order at Tc may occur in uniaxial relaxors as observed on the uniaxial relaxor ferroelectric Sr0.8Ba0.2Nb2O6 and come close to RF Ising model criticality. Re-entrant relaxor transitions as observed in solid solutions of Ba2Pr0.6Nd0.4(FeNb4)O15 are proposed to evidence the coexistence of distinct normal and relaxor ferroelectric phases within the framework of percolation theory.
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LI, Y. L., L. XIE, and J. ZHU. "POLAR NANOREGION IN RELAXOR FERROELECTRICS STUDIED BY ANALYTICAL ELECTRON MICROSCOPY." Journal of Advanced Dielectrics 02, no. 02 (April 2012): 1241008. http://dx.doi.org/10.1142/s2010135x12410081.

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Relaxor ferroelectrics have different properties from that of the normal ferroelectrics, such as dielectric properties with diffuse phase transition and frequency dispersion, specific heat, birefringence, elastic constants and Raman scattering, etc. It is considered that the different properties are related with the polar nanoregions in relaxors. In this work we briefly introduce how we use the high spatial resolution analytical electron microscopy and high resolution electron microscopy methods to investigate the polar nanoregion in Pb(Mg1/3Nb2/3)O3 (PMN), Pb(Mg1/3Nb2/3)O3–PbTiO3 (PMN–PT) and Ba ( Ti 1-x Sn x) O 3 (BTSn). The main experimental results1–10 are as mentioned in next three parts.
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Смирнова, Е., А. Сотников, Н. Зайцева, and H. Schmidt. "Акустические аномалии в твердых растворах SrTiO-=SUB=-3-=/SUB=--BiFeO-=SUB=-3-=/SUB=-." Физика твердого тела 60, no. 1 (2018): 107. http://dx.doi.org/10.21883/ftt.2018.01.45296.181.

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AbstractThe results of acoustic investigations of solid solutions SrTiO_3−BiFeO_3 in the temperature range from 100 to 650 K have been presented. The measurements of the velocity and attenuation of the longitudinal ultrasonic mode at a frequency of 10 MHz were carried out by the pulse-echo method. The observed anomalies in velocity and attenuation correlate with the maxima of the dielectric constant in the temperature range of the relaxor state. In addition, the attenuation peaks in the temperature range 400–600 K, which define Burns and T* temperatures, which are characteristic of relaxors, have been identified. The obtained results have allowed the clarifying of the phase diagram of the solid solution system SrTiO_3−BiFeO_3.
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Dissertations / Theses on the topic "Relaxory"

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Nahime, Bacus de Oliveira [UNESP]. "Estabilização da fase perovskita e propriedades estruturais de filmes finos relaxores do sistema PLZT." Universidade Estadual Paulista (UNESP), 2016. http://hdl.handle.net/11449/138275.

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Programa de Capacitação dos Servidores do Instituto Federal de Educação, Ciência e Tecnologia Goiano
Filmes finos de Pb0,91La0,09(Zr0,65Ti0,35)O3 (PLZT) foram preparados sobre substratos Pt/TiO2/SiO2/Si(100), usando um método químico baseado no processo Pechini, com objetivo de estudar a supressão da fase pirocloro e a estabilização da fase perovskita. Pós de PLZT preparados por reação do estado sólido foram utilizados como principal fonte de íons Pb2+, La2+, Zr4+ e Ti4+ pela dissolução em solução ácida. A obtenção de resinas poliméricas estáveis com diferentes excessos de chumbo foi possível preparando-se separadamente as resinas de PLZT e PbO seguido de posterior mistura e homogeneização à temperatura ambiente.
Pb0,91La0,09(Zr0,65Ti0,35)O3 (PLZT) thin films were prepared on Pt/TiO2/SiO2/Si(100) substrates by using a chemical method based on Pechini process to study the pyrochlore phase suppression and to stabilizing the perovskite phase. PLZT powders prepared by solid state reaction were used as source of Pb2+, La2+, Zr4+ and Ti4+ ions by its dissolution in acid solution.
Programa de Capacitação dos Servidores do Instituto Federal de Educação, Ciência e Tecnologia Goiano, aprovado pela Resolução nº 028/2010 de 23/11/2010
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Nahime, Bacus de Oliveira. "Estabilização da fase perovskita e propriedades estruturais de filmes finos relaxores do sistema PLZT /." Ilha Solteira, 2016. http://hdl.handle.net/11449/138275.

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Orientador: Eudes Borges de Araújo
Resumo: Filmes finos de Pb0,91La0,09(Zr0,65Ti0,35)O3 (PLZT) foram preparados sobre substratos Pt/TiO2/SiO2/Si(100), usando um método químico baseado no processo Pechini, com objetivo de estudar a supressão da fase pirocloro e a estabilização da fase perovskita. Pós de PLZT preparados por reação do estado sólido foram utilizados como principal fonte de íons Pb2+, La2+, Zr4+ e Ti4+ pela dissolução em solução ácida. A obtenção de resinas poliméricas estáveis com diferentes excessos de chumbo foi possível preparando-se separadamente as resinas de PLZT e PbO seguido de posterior mistura e homogeneização à temperatura ambiente.
Abstract: Pb0,91La0,09(Zr0,65Ti0,35)O3 (PLZT) thin films were prepared on Pt/TiO2/SiO2/Si(100) substrates by using a chemical method based on Pechini process to study the pyrochlore phase suppression and to stabilizing the perovskite phase. PLZT powders prepared by solid state reaction were used as source of Pb2+, La2+, Zr4+ and Ti4+ ions by its dissolution in acid solution.
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Freire, Rafael Luiz Heleno [UNESP]. "Síntese e propriedades físicas de filmes ferroelétricos do sistema PLZT." Universidade Estadual Paulista (UNESP), 2012. http://hdl.handle.net/11449/91956.

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
O titanato zirconato de chumbo dopado com lantânio, dado convencionalmente pela fórmula estequiométrica Pb1− x Lax ( Zry ; Ti1− y ) 1− x / 4 O3 , com x = 0,09 e y = 0,65, também conhecido como PLZT 9/65/35, é um importante sistema ferroelétrico relaxor devido as suas propriedades dielétricas, elétricas e eletroóticas. Sendo um ferroelétrico, exibe, também, propriedades tais como piezo e piroeletricidade, dependendo apenas das proporções em que são preparados. Logo, esse sistema é bastante interessante para uma gama de aplicações tecnológicas. Na forma de filmes finos, a composição PLZT 9/65/35 tem sido amplamente estudada e preparada pelos mais diversos métodos. Neste trabalho propõe-se a síntese de filmes finos ferroelétricos da composição PLZT 9/65/35 pelo método dos precursores óxidos, a fim de se compreender a dinâmica dos processos de cristalização e, também, avaliar suas propriedades físicas, como permissividade elétrica e histerese ferroelétrica. A intenção, assim, é colaborar com as informações presentes na literatura sobre as propriedades de filmes finos de PLZT 9/65/35
The lead zirconate titanate doped with lanthanum, conventionally given by stoichiometric formula Pb1− x Lax ( Zry ; Ti1− y ) 1− x / 4 O3 , with x=0,09 and y=0,65, also known as PLZT 9/65/35, is an important relaxor ferroelectric system due to its dielectric, electrical and electrooptical properties. Being a ferroelectric material exhibits also properties such as piezo- and piroelectricity, depending upon the extent to which they are prepared. Therefore, this system is very interesting for a range of technological applications. In the thin films format, the composition PLZT 9/65/35 has been widely studied and prepared by several methods. In this project it is proposed the synthesis of thin films of such material by the oxide precursor method in order to understand the dynamics of crystallization process and also to evaluate their physical properties like electrical permittivity and ferroelectric hysteresis. The intention, thus, is collaborate with the information presented in the literature about the properties of PLZT 9/65/35 thin films
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Tavernor, Andrew. "Modelling relaxor ferroelectrics." Thesis, University of Leeds, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305874.

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Melo, Michael de [UNESP]. "Structural and local physical properties of relaxor ferroelectric thin films." Universidade Estadual Paulista (UNESP), 2017. http://hdl.handle.net/11449/151761.

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Polycrystalline thin films of Pb0.91La0.09Zr0.65Ti0.35O3 (PLZT9/65/35) and Sr0.75Ba0.25Nb2O6 (SBN75) were prepared by the chemical polymeric routine in order to investigate their physical properties at the macro- and nanoscale. X-ray diffraction (XRD), piezoresponse force microscopy (PFM), and scanning electron microscopy (SEM) were used as investigative tools. PLZT9/65/35 and SBN75 thin films have exhibited perovskite and tungsten bronze crystal structure at room temperature, as it was expected in this nominal composition for these relaxor ferroelectric materials. In addition, Rietveld method of the crystalline structure has revealed the thickness dependence of the crystallite size, grain size, and microstrain. The transition temperature of SBN thin film showed to shift to lower temperatures, suggesting the presence of a higher defect concentration, such as oxygen vacancies, chemical disorder, and lattice defects in this film. SEM has exhibited the porosity features in both thin films and has confirmed the existence of chemical elements (such as oxygen, niobium, lanthanum, strontium, platinum, silicon and barium) in film surface and near the substrate. Ferroelectric properties have been investigated by PFM and the results have suggested a thickness and crystallite size dependence of the piezoelectric response. Also in this work, the dynamic of ferroelectric domain switching and the induced domain relaxation were studied using the switching spectroscopy PFM (SS-PFM) in both relaxor systems as a function of variable DC applied voltages and pulse durations.
Filmes policristalinos de Pb0,91La0,09Zr0,65Ti0,35O3 (PLZT9/65/35) e de Sr0,75Ba0,25Nb2O6 (SBN75) foram preparados por uma rotina química polimérica para investigarmos as suas propriedades em nano- e macroescala. Difração de raios-X (DRX), microscopia de força atômica de piezoresposta (PFM), e microscopia eletrônica de varredura (SEM), foram utilizados como ferramentas investigativas. Os filmes finos de PLZT9/65/35 e de SBN75 exibiram estrutura peroviskita e tungstênio bronze, respectivamente, conforme esperado à temperatura ambiente e na composição nominal para estes materiais ferroelétricos relaxores. Além disso, o refinamento de Rietveld da estrutura revelou a dependência do tamanho do cristalito e do microstrain com a espessura. A temperatura de transição de fase do filme de SBN mostrou um deslocamento para valores menores de temperatura, sugerindo a presença de concentração de defeitos, tais como vacâncias de oxigênio, desordem química e defeitos de rede, maior no filme de SBN. Microscopia eletrônica de varredura (SEM) exibiu o caráter poroso de ambos os filmes. Propriedades ferroelétricas desses filmes foram investigados por meio da técnica de PFM. A piezoresposta mostrou ter uma dependência em função do tamanho do cristalito e da espessura. Neste trabalho, a dinâmica de reversão de domínios ferroelétricos e a relaxação de domínios induzidos foram estudados por meio do uso da espectroscopia de chaveamento (SS-PFM) em ambos os sistemas em função da tensão DC e do tempo de duração do pulso.
CNPq: 232241/2014-7
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Nealon, Thomas Anthony. "The properties of ferroelectric relaxors." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329982.

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Nahas, Yousra. "Gauge theory for relaxor ferroelectrics." Phd thesis, Ecole Centrale Paris, 2013. http://tel.archives-ouvertes.fr/tel-01003357.

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Concomitantly with lattice disorder, there is a discrepancy between local and global scales in relaxor ferroelectrics, in that structural distortions occurring at the local scale are not reflected in the average global structure which remains cubic. There is an absence of direct implementation of the local symmetry in the modeling of relaxors, despite its considerable, but often unacknowledged, ability to encode local features. Central to the thesis is an explicit account for local gauge symmetry within the first-principles-derived effective Hamiltonian approach. The thesis thus aims to consider how an extended symmetry allowing independent transformations at different points in space can effectively bridge local features and macroscopical properties. An underlying question the thesis also seeks to answer is whether the disorder-induced non-trivial interplay between local and global scales can be described from a topological point of view
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Melo, Michael de. "Structural and local physical properties of relaxor ferroelectric thin films /." Ilha Solteira, 2017. http://hdl.handle.net/11449/151761.

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Orientador: Eudes Borges de Araújo
Resumo: Polycrystalline thin films of Pb0.91La0.09Zr0.65Ti0.35O3 (PLZT9/65/35) and Sr0.75Ba0.25Nb2O6 (SBN75) were prepared by the chemical polymeric routine in order to investigate their physical properties at the macro- and nanoscale. X-ray diffraction (XRD), piezoresponse force microscopy (PFM), and scanning electron microscopy (SEM) were used as investigative tools. PLZT9/65/35 and SBN75 thin films have exhibited perovskite and tungsten bronze crystal structure at room temperature, as it was expected in this nominal composition for these relaxor ferroelectric materials. In addition, Rietveld method of the crystalline structure has revealed the thickness dependence of the crystallite size, grain size, and microstrain. The transition temperature of SBN thin film showed to shift to lower temperatures, suggesting the presence of a higher defect concentration, such as oxygen vacancies, chemical disorder, and lattice defects in this film. SEM has exhibited the porosity features in both thin films and has confirmed the existence of chemical elements (such as oxygen, niobium, lanthanum, strontium, platinum, silicon and barium) in film surface and near the substrate. Ferroelectric properties have been investigated by PFM and the results have suggested a thickness and crystallite size dependence of the piezoelectric response. Also in this work, the dynamic of ferroelectric domain switching and the induced domain relaxation were studied using the switching spectroscopy PFM (SS-PFM) in both r... (Resumo completo, clicar acesso eletrônico abaixo)
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Kiselev, Dmitry. "Piezoresponse force microscopy of ferroelectric relaxors." Doctoral thesis, Universidade de Aveiro, 2010. http://hdl.handle.net/10773/3609.

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Doutoramento em Ciência e Engenharia de Materiais
Nesta tese, ferroeléctricos relaxor (I dont know uf the order is correct) de base Pb das familias (Pb,La)(Zr,Ti)O3 (PLZT), Pb(Mg1/3,Nb2/3)O3-PbTiO3 (PMN-PT), Pb(Zn1/3,Nb2/3)O3-PbTiO3 (PZN-PT) foram investigados e analisados. As propriedades ferroeléctricas e dieléctricas das amostras foram estudadas por métodos convencionais de macro e localmente por microscopia de força piezoeléctrica (PFM). Nos cerâmicos PLZT 9.75/65/35 o contraste da PFM à escala nanometrica _ foi investigado em função do tamanho e orientação dos grãos. Apurou-se que a intensidade do sinal piezoeléctrico das nanoestruturas diminui com o aumento da temperatura e desaparece a 490 K (La mol. 8%) e 420 K (9,5%). Os ciclos de histerese locais foram obtidos em função da temperatura. A evolução dos parâmetros macroscópicos e locais com a temperatura de superfície sugere um forte efeito de superfície nas transições de fase ferroeléctricas do material investigado. A rugosidade da parede de domínio é determinada por PFM para a estrutura de domínio natural existente neste ferroeléctrico policristalino. Além disso, os domínios ferroeléctricos artificiais foram criados pela aplicação de pulsos eléctricos à ponta do condutor PFM e o tamanho de domínio in-plane foi medido em função da duração do pulso. Todas estas experiências levaram à conclusão de que a parede de domínio em relaxors do tipo PZT é quase uma interface unidimensional. O mecanismo de contraste na superfície de relaxors do tipo PLZT é medido por PFMAs estruturas de domínio versus evolução da profundidade foram estudadas em cristais PZN-4,5%PT, com diferentes orientações através da PFM. Padrões de domínio irregulares com tamanhos típicos de 20-100 nm foram observados nas superfícies com orientação <001> das amostras unpoled?. Pelo contrário, os cortes de cristal <111> exibem domínios regulares de tamanho mícron normal, com os limites do domínio orientados ao longo dos planos cristalográficos permitidos. A existência de nanodomínios em cristais com orientação <001> está provisoriamente (wrong Word) atribuída à natureza relaxor de PZN-PT, onde pequenos grupos polares podem formar-se em coindições de zero-field-cooling (ZFC). Estes nanodomínios são considerados como os núcleos do estado de polarização oposta e podem ser responsáveis pelo menor campo coercitivo para este corte de cristal em particular. No entanto, a histerese local piezoelétrica realizada pelo PFM à escala nanométrica indica uma mudança de comportamento de PZN-PT semelhante para ambas as orientações cristalográficas investigadas. A evolução das estruturas de domínio com polimento abaixo da superfície do cristal foi investigada. O domínio de ramificações e os efeitos de polarização de triagem após o polimento e as medições de temperatura têm sido estudados pela PFM e pela análise SEM. Além disso, verificou-se que a intensidade do sinal piezoeléctrico a partir das estruturas de nanodomínio diminui com o aumento da temperatura, acabando por desaparecer aos 430 K (orientaçáo <111>) e 470 K (orientação <100>). Esta diferença de temperatura nas transições de fase local em cristais de diferentes orientações é explicada pelo forte efeito de superfície na transição da fase ferroelétrica em relaxors.A comutação da polarização em relaxor ergódico e nas fases ferroeléctricas do sistema PMN-PT foram realizadas pela combinação de três métodos, Microscopia de Força Piezoeléctrica, medição de um único ponto de relaxamento eletromecânico e por ultimo mapeamento de espectroscopia de tensão. A dependência do comportamento do relaxamento na amplitude e tempo da tensão de pulso foi encontrada para seguir um comportamento logarítmico universal com uma inclinação quase constante. Este comportamento é indicativo da progressiva população dos estados de relaxamento lento, ao contrário de uma relaxação linear na presença de uma ampla distribuição do tempo de relaxamento. O papel do comportamento de relaxamento, da não-linearidade ferroeléctrica e da heterogeneidade espacial do campo na ponta da sonda de AFM sobre o comportamento do ciclo de histerese é analisada em detalhe. Os ciclos de histerese para ergódica PMN- 10%PT são mostrados como cineticamente limitados, enquanto que no PMN, com maior teor de PT, são observados verdadeiros ciclos de histerese ferroeléctrica com viés de baixa nucleação.
In this thesis, Pb-based relaxor ferroelectrics of the (Pb,La)(Zr,Ti)O3 (PLZT), Pb(Mg1/3,Nb2/3)O3-PbTiO3 (PMN-PT), Pb(Zn1/3,Nb2/3)O3-PbTiO3 (PZN-PT) families were investigated and analyzed. Ferroelectric and dielectric properties of the samples were studied by conventional macroscopic methods and locally by piezoresponse force microscopy (PFM). In PLZT 9.75/65/35 ceramics the nanoscale PFM contrast was investigated as a function of grain size and grain orientation. It was found that the intensity of piezoresponse signal from nanodomain structure decreases with temperature and it disappears at 490 K (La mol. 8%) and 420 K (9.5%). Local hysteresis loops were obtained as a function of temperature. The evolution of the macroscopic and local parameters with temperature suggests strong surface effect on ferroelectric phase transition in the investigated materials. The domain wall roughness is determined with PFM for the natural domain structure existing in this polycrystalline ferroelectric. Besides, artificial ferroelectric domains were created by application of voltage pulses to the conducting PFM tip, and the in-plane domain size was measured as a function of pulse duration. All these experiments result in the conclusion that the domain wall in PZT-type relaxors is quasi one-dimensional interface. The mechanism of the surface contrast in PLZT-type relaxors is uncovered by PFM. Domain structures vs. depth evolution was studied in PZN-4.5%PT crystals with different orientation via PFM. Irregular domain patterns with the typical sizes 20-100 nm were observed on the (001)-oriented surfaces of unpoled samples. On the contrary, (111) crystal cuts exhibit normal micron-size regular domains with the domain boundaries directed along allowed crystallographic planes. The existence of nanodomains in (001)-oriented crystals is tentatively attributed to the relaxor nature of PZN-PT where small polar clusters may form under zero-field-cooling (ZFC) conditions. These nanodomains are considered as the nuclei of the opposite polarization state and can be responsible for the smaller coercive field for this particular crystal cut. However, local piezoelectric hysteresis performed by PFM on the nanometer scale indicates similar switching behavior of PZN-PT for both investigated crystallographic orientations. Evolution of the domain structures with polishing below the crystal surface has been investigated. The domain branching and polarization screening effects after polishing and temperatures measurements have been studied by PFM and SEM analysis. In addition, it was found what the intensity of piezoresponse signal from nanodomain structures decreases with temperature and finally disappears at 430 K (<111> orientation) and 470 K (<100> orientation). This difference of the temperature of local phase transitions for crystals of different orientaions is explained by strong surface effect on ferroelectric phase transition in relaxors. Polarization switching in ergodic relaxor and ferroelectric phases in the PMNPT system is studied using Piezoresponse Force Microscopy, single point electromechanical relaxation measurements, and voltage spectroscopy mapping. The dependence of relaxation behavior on voltage pulse amplitude and time was found to follow a universal logarithmic behavior with a nearly constant slope. This behavior is indicative of the progressive population of slow relaxation states, as opposed to a linear relaxation in the presence of a broad relaxation time distribution. The role of relaxation behavior, ferroelectric non-linearity, and the spatial inhomogeneity of the tip field on hysteresis loop behavior is analyzed in detail. The hysteresis loops for ergodic PMN-10%PT are shown to be kinetically limited, while in PMN with larger PT content, true ferroelectric hysteresis loops with low nucleation biases are observed.
FCT - SFRH/BD/22391/2005
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Liu, Tieqi. "Electromechanical Behavior of Relaxor Ferroelectric Crystals." Diss., Georgia Institute of Technology, 2004. http://hdl.handle.net/1853/4881.

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Relaxor ferroelectric PZN-xPT and PMN-xPT single crystals exhibit extraordinary electromechanical properties. They are under development for applications in sensors, actuators and transducers. The polarization switching and phase transition behavior of PZN-4.5%PT and PMN-32%PT single crystals under external loading has been investigated. Experimental investigation elucidates the polarization switching and phase transition behavior of relaxor ferroelectric crystals at different orientation cuts under combined temperature, electric field and stress loading. These crystals exhibit strong orientation dependence of electromechanical properties, and the applied fields all affect the poling and phase states of the crystals. Based on experimental investigation, crystal variant modeling was developed to compute the piezoelectric properties of multi-domain crystals at different orientation cuts from a set of properties for the single domain. Thermodynamics and work-energy analysis of field induced phase transitions in these single crystals sheds light on the phase transition mechanism of ferroelectric crystals. Fracture behavior of relaxor single crystals under non-uniform electric fields at a partial electrode edge has also been measured and analyzed.
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Books on the topic "Relaxory"

1

Șain, Emil. Relaxare. București: Editura Eminescu, 1986.

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Patrick, Fanning, ed. The daily relaxer. Oakland, CA: New Harbinger Publications, 1997.

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Lacroix, Nitya. Savoir se relaxer. Saint-Laurent, Québec: Trécarré, 1998.

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Goh, Wei C. Sol-gel processing of relaxor ferroelectric materials. Manchester: UMIST, 1996.

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Marriott, Susannah. 1001 solutions naturelles pour relaxer. Saint-Constant, Québec: Broquet, 2009.

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Fang, Huajing. Novel Devices Based on Relaxor Ferroelectric PMN-PT Single Crystals. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-4312-8.

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Relaxer: [des stratégies pour apprivoiser notre stress]. 2nd ed. Montréal: Éditions Logiques, 1999.

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Davrou, Yves. Comment relaxer vos enfants: 7 à 14 ans. Paris: Retz, 1985.

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Cahier de gribouillages géométrie: Plus de 1000 exercices pour se relaxer. Paris: Éditions Contre-dires, 2015.

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Méditation pour débutants: Techniques pour développer sa conscience, son attention et sa capacité de relaxer. Varennes, Québec, Canada: Éditions Pochette, 2015.

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Book chapters on the topic "Relaxory"

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Cross, L. E. "Relaxor Ferroelectrics." In Piezoelectricity, 131–55. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-68683-5_5.

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Bokov, Alexei A., and Zuo-Guang Ye. "Reentrant Phenomena in Relaxors." In Nanoscale Ferroelectrics and Multiferroics, 729–64. Chichester, UK: John Wiley & Sons, Ltd, 2016. http://dx.doi.org/10.1002/9781118935743.ch23.

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Kleemann, Wolfgang. "Glassy Phenomena in Relaxor Ferroelectrics." In Mesoscopic Phenomena in Multifunctional Materials, 249–69. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-55375-2_10.

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Mamin, R. F. "New Ideas in Relaxor Theory." In Defects and Surface-Induced Effects in Advanced Perovskites, 419–24. Dordrecht: Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-011-4030-0_43.

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Kleemann, Wolfgang, and Jan Dec. "Relaxor Ferroelectrics and Related Cluster Glasses." In Frustrated Materials and Ferroic Glasses, 119–52. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-96914-5_5.

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Cong, Shen, Ting-ting Qu, Cai-hong Lu, Ke Tong, and Na Li. "Nonlinearity in Relaxor-Type Ferroelectrics Ceramics." In Springer Proceedings in Physics, 47–55. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-13-5947-7_6.

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Vakulenko, Aleksandr, Sergei Vakhrushev, and Ekaterina Koroleva. "Infralow Frequency Dielectric Spectroscopy of PMN Relaxor." In Springer Proceedings in Physics, 45–53. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-58868-7_6.

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Peräntie, Jani, Tatiana Correia, Juha Hagberg, and Antti Uusimäki. "Electrocaloric Effect in Relaxor Ferroelectric-Based Materials." In Electrocaloric Materials, 47–89. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40264-7_3.

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Shvartsman, V. V., W. Kleemann, D. A. Kiselev, I. K. Bdikin, and A. L. Kholkin. "Polar Structures in Relaxors by Piezoresponse Force Microscopy." In Scanning Probe Microscopy of Functional Materials, 345–83. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-1-4419-7167-8_12.

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Qui, Zhilun, Ruzhong Zuo, Chengxiang Ji, and Longtu Li. "Functionally Gradient Relaxor Dielectric Composites with X7R Characteristics." In Recent Developments in Electronic Materials and Devices, 145–52. 735 Ceramic Place, Westerville, Ohio 43081: The American Ceramic Society, 2012. http://dx.doi.org/10.1002/9781118371107.ch15.

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Conference papers on the topic "Relaxory"

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Blinc, Robert. "Dynamics of relaxors." In The 11th williamsburg workshop on fundamental physics of ferroelectrics. AIP, 2001. http://dx.doi.org/10.1063/1.1399694.

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Narahari Achar, B. N., and John W. Hanneken. "Damping in a Fractional Relaxor-Oscillator Driven by a Harmonic Force." In ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/detc2005-84345.

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It is shown that the so called fractional Relaxor-Oscillator, characterized by an index of fractional order, alpha, exhibits interesting relaxation-oscillation characteristics when subjected to a sinusoidal forcing. For the range of values 0 &lt; alpha &lt;1, the system exhibits some characteristics of a regular relaxor, and for the range 1 &lt; alpha &lt;2, some characteristics of a damped harmonic oscillator. But in the dynamic response to a sinusoidal forcing, there are characteristic features which have no parallel either in the regular relaxor or the damped harmonic oscillator. The system is characterized by a frequency dependent “relaxation time constant” in the range 0&lt; alpha &lt;1, and an associated phase lag. In the range 1 &lt; alpha &lt;2, there is a frequency dependent damping parameter and an associated phase lag. The two phase lags approach each other in the limit (alpha approaching 1) from either side of 1. Furthermore, there is a different power-law tail associated with each of these cases.
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Vakhrushev, S. B. "Structure of Nanodomains in Relaxors." In Fundamental Physics of Ferroelectrics 2003. AIP, 2003. http://dx.doi.org/10.1063/1.1609940.

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Leschhorn, Andreas, and Herbert Kliem. "A feedback model for relaxors." In 2016 IEEE International Conference on Dielectrics (ICD). IEEE, 2016. http://dx.doi.org/10.1109/icd.2016.7547767.

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Chao, Lambert K., Eugene V. Colla, and Michael B. Weissman. "Barkhausen noise in relaxor ferroelectrics." In SPIE's First International Symposium on Fluctuations and Noise, edited by Michael B. Weissman, Nathan E. Israeloff, and A. Shulim Kogan. SPIE, 2003. http://dx.doi.org/10.1117/12.497075.

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Hom, Craig L., and Natarajan Shankar. "Constitutive model for relaxor ferroelectrics." In 1999 Symposium on Smart Structures and Materials, edited by Vasundara V. Varadan. SPIE, 1999. http://dx.doi.org/10.1117/12.350068.

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Liu, Tieqi, and Christopher S. Lynch. "Behavior of relaxor single crystals." In SPIE's 9th Annual International Symposium on Smart Structures and Materials, edited by Christopher S. Lynch. SPIE, 2002. http://dx.doi.org/10.1117/12.474970.

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Das, Rutuparna, and R. N. P. Choudhary. "Lead-free relaxor ferroelectric: Y2NiMnO6." In DAE SOLID STATE PHYSICS SYMPOSIUM 2018. AIP Publishing, 2019. http://dx.doi.org/10.1063/1.5112849.

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Tkachuk, A. "Anti-ferrodistortive Nanodomains in PMN Relaxor." In Fundamental Physics of Ferroelectrics 2003. AIP, 2003. http://dx.doi.org/10.1063/1.1609938.

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Hellwig, Holger. "Micro-Brillouin investigations of relaxor ferroelectrics." In Fundamental Physics of Ferroelectrics 2003. AIP, 2003. http://dx.doi.org/10.1063/1.1609939.

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Reports on the topic "Relaxory"

1

Shrout, Thomas R., and Sei-Joo Jang. Relaxor Ferroelectrics for Electrostrictive Transducer. Fort Belvoir, VA: Defense Technical Information Center, January 1992. http://dx.doi.org/10.21236/ada248671.

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Harmer, Martin P., and Donald M. Smyth. Nanostructure and Defect Chemistry of Relaxor Ferroelectrics. Fort Belvoir, VA: Defense Technical Information Center, July 1988. http://dx.doi.org/10.21236/ada207217.

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Smith, Ralph C., and Craig L. Hom. A Temperature-Dependent Hysteresis Model for Relaxor Ferroelectrics. Fort Belvoir, VA: Defense Technical Information Center, January 2000. http://dx.doi.org/10.21236/ada452005.

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J. Toulouse. Nanoscopic Study of the Polarization-Strain Coupling in Relaxor Ferroelectric and the Search for New Relaxor Materials for Transducer and Optical Applications. Office of Scientific and Technical Information (OSTI), May 2007. http://dx.doi.org/10.2172/908152.

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Petuskey, William. DURIP 00 Thermal Analysis and Potentiostatic Instuments for Relaxor Ferroelectric Research. Fort Belvoir, VA: Defense Technical Information Center, August 2001. http://dx.doi.org/10.21236/ada388766.

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Mitchell, Wayne, Josh Kallman, Allen Toreja, Brian Gallagher, Ming Jiang, and Dan Laney. Developing a Learning Algorithm-Generated Empirical Relaxer. Office of Scientific and Technical Information (OSTI), March 2016. http://dx.doi.org/10.2172/1248278.

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Hagood, Nesbitt W., and IV. Relaxor Ferroelectric Single Crystal Based Hybrid Actuator for Underwater Acoustic Noise Generation. Fort Belvoir, VA: Defense Technical Information Center, May 2002. http://dx.doi.org/10.21236/ada417716.

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Zipparo, Michael J. Application of Bonded Multilayer Technology to Relaxor-Based Single Crystals for Imaging Transducer Applications. Fort Belvoir, VA: Defense Technical Information Center, November 2001. http://dx.doi.org/10.21236/ada397041.

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Hoover, B. D., B. A. Tuttle, W. R. Olson, D. M. Goy, R. A. Brooks, and C. F. King. Evaluation of field enforced antiferroelectric to ferroelectric phase transition dielectrics and relaxor ferroelectrics for pulse discharge capacitors. Office of Scientific and Technical Information (OSTI), September 1997. http://dx.doi.org/10.2172/537385.

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