Academic literature on the topic 'Sampling oscilloscopes'
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Journal articles on the topic "Sampling oscilloscopes"
Tankeliun, Tomaš, Oleg Zaytsev, and Vytautas Urbanavičius. "Time-base Noise Reduction Method of Sampling Osciloscope." Mokslas - Lietuvos ateitis 9, no. 3 (July 4, 2017): 277–82. http://dx.doi.org/10.3846/mla.2017.1032.
Full textHenderson, D., and A. G. Roddie. "Calibration of fast sampling oscilloscopes." Measurement Science and Technology 1, no. 8 (August 1, 1990): 673–79. http://dx.doi.org/10.1088/0957-0233/1/8/002.
Full textDienstfrey, A., P. D. Hale, D. A. Keenan, T. S. Clement, and D. F. Williams. "Minimum-phase calibration of sampling oscilloscopes." IEEE Transactions on Microwave Theory and Techniques 54, no. 8 (August 2006): 3197–208. http://dx.doi.org/10.1109/tmtt.2006.879167.
Full textClement, T. S., P. D. Hale, D. F. Williams, C. M. Wang, A. Dienstfrey, and D. A. Keenan. "Calibration of sampling oscilloscopes with high-speed photodiodes." IEEE Transactions on Microwave Theory and Techniques 54, no. 8 (August 2006): 3173–81. http://dx.doi.org/10.1109/tmtt.2006.879135.
Full textGong, Peng Wei, Zhe Ma, Hong Mei Ma, and Chun Tao Yang. "Experimental Investigation of Terahertz Temporal Response of a Photoconductive Switch." Advanced Materials Research 571 (September 2012): 491–95. http://dx.doi.org/10.4028/www.scientific.net/amr.571.491.
Full textHenderson, D., A. G. Roddie, and A. J. A. Smith. "Recent developments in the calibration of fast sampling oscilloscopes." IEE Proceedings A Science, Measurement and Technology 139, no. 5 (1992): 254. http://dx.doi.org/10.1049/ip-a-3.1992.0044.
Full textLevitas, B. N., V. S. Roizentok, Ya M. Rossoskii, and �. I. Shapiro. "Improving the accuracy of amplitude measurements by sampling oscilloscopes." Measurement Techniques 29, no. 2 (February 1986): 127–31. http://dx.doi.org/10.1007/bf00868836.
Full textHale, Paul D., C. M. Wang, Dylan F. Williams, Kate A. Remley, and Joshua D. Wepman. "Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes." IEEE Transactions on Instrumentation and Measurement 55, no. 6 (December 2006): 2146–54. http://dx.doi.org/10.1109/tim.2006.880270.
Full textWang, C. M., P. D. Hale, and K. J. Coakley. "Least-squares estimation of time-base distortion of sampling oscilloscopes." IEEE Transactions on Instrumentation and Measurement 48, no. 6 (1999): 1324–32. http://dx.doi.org/10.1109/19.816156.
Full textD’Arco, Mauro, Ettore Napoli, and Efstratios Zacharelos. "Digital Circuit for Seamless Resampling ADC Output Streams." Sensors 20, no. 6 (March 14, 2020): 1619. http://dx.doi.org/10.3390/s20061619.
Full textDissertations / Theses on the topic "Sampling oscilloscopes"
Jin, Stone Qiaodan (Qiaodan Jordan). "An ARM-based sequential sampling oscilloscope." Thesis, Massachusetts Institute of Technology, 2014. http://hdl.handle.net/1721.1/100591.
Full textThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Cataloged from student-submitted PDF version of thesis.
Includes bibliographical references (page 141).
Sequential equivalent-time sampling allows a system to acquire repetitious waveforms with frequencies beyond the Nyquist rate. This thesis documents the prototype of a digital ARM-based sequential sampling oscilloscope with peripheral hardware and software. Discussed are the designs and obstacles of various analog circuits and signal processing methods. By means of sequential sampling, alongside analog and digital signal processing techniques, we are able to utilize a 3MSPS ADC for a capture rate of 24MSPS. For sinusoids between 6-12MHz, waveforms acquired display at least 10dB of SNR improvement for unfiltered signals and at least 60dB of SNR improvement for aggressively filtered signals.
by Qiaodan (Jordan) Jin Stone.
M. Eng.
Forsgren, Niklas. "Sampling Ocsilloscope On-Chip." Thesis, Linköping University, Department of Electrical Engineering, 2003. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-1563.
Full textSignal-integrity degradation from such factors as supply and substrate noise and cross talk between interconnects restricts the performance advances in Very Large Scale Integration (VLSI). To avoid this and to keep the signal-integrity, accurate measurements of the on-chip signal must be performed to get an insight in how the physical phenomenon affects the signals.
High-speed digital signals can be taken off chip, through buffers that add delay. Propagating a signal through buffers restores the signal, which can be good if only information is wanted. But if the waveform is of importance, or if an analog signal should be measured the restoration is unwanted. Analog buffers can be used but they are limited to some hundred MHz. Even if the high-speed signal is taken off chip, the bandwidth of on-chip signals is getting very high, making the use of an external oscilloscope impossible for reliable measurement. Therefore other alternatives must be used.
In this work, an on-chip measuring circuit is designed, which makes use of the principle of a sampling oscilloscope. Only one sample is taken each period, resulting in an output frequency much lower than the input frequency. A slower signal is easier to take off-chip and it can easily be processed with an ordinary oscilloscope.
Stridfelt, Arvid. "High Speed On-Chip Measurment Circuit." Thesis, Linköping University, Department of Electrical Engineering, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-2764.
Full textThis master thesis describes a design exploration of a circuit capable of measuring high speed signals without adding significant capacitive load to the measuring node.
It is designed in a 0.13 CMOS process with a supply voltage of 1.2 Volt. The circuit is a master and slave, track-and-hold architecture incorporated with a capacitive voltage divider and a NMOS source follower as input buffer to protect the measuring node and increase the input voltage range.
This thesis presents the implementation process and the theory needed to understand the design decisions and consideration throughout the design. The results are based on transistor level simulations performed in Cadence Spectre.
The results show that it is possible to observe the analog behaviour of a high speed signal by down converting it to a lower frequency that can be brought off-chip. The trade off between capacitive load added to the measuring node and input bandwidth of the measurment circuit is also presented.
Badenhorst, J. "Metrology and modelling of high frequency probes." Thesis, Link to the online version, 2008. http://hdl.handle.net/10019/808.
Full textSajjadian, Farnad. "A 10MHz flash analog-to-digital converter system for digital oscilloscope and signal processing applications." 1985. http://hdl.handle.net/2097/27577.
Full textHung, Shr-Hsiung, and 洪士雄. "A High-Speed Real-Time Electro-Optic Sampling Oscilloscope Based on a Frequency-Discriminated and Delay-Time-Tunable Laser Source." Thesis, 2002. http://ndltd.ncl.edu.tw/handle/87627794202981771832.
Full text大同大學
光電工程研究所
90
A novel real-time electro-optic sampling oscilloscope system with a delay-time tunable pulsed laser source is demonstrated. A voltage-controlled digital electronic phase shifter (DEPS) integrated with the pulsed laser is employed to substitute the opto-mechanic delay line for continuous tuning the delay-time of optical pulse-train in the EOS system. The maximum scanning speed, delay-time, tuning responsivity, and resolution of the DEPS are 100 point/sec, 3.56 ns (1.78 periods), 0.508 ns/volt, and 0.2 ps, respectively. This system further benefits the advantages of frequency tracking to free-running signals with suppressed timing-jitter. The SSB phase noise at 1 kHz offset from the carrier of the VCO phase-locked to the RFS can still be as low as —90 dBc/Hz. However, the probe beam 3dB pulsewidth of GSLD was 18 ps. The SSB phase noise of the GSLD was -70 dBc/Hz at 100Hz which is similar to the VCO SSB phase noise offset from the carrier frequency, and the timing jitter of GSLD will saturate to 1.2 ps as the frequency offset from carrier over 1 kHz. By using this system, the waveforms of microwave signals generated from a frequency synthesizer, and frequency divider are real-time sampled by showing on a sample oscilloscope. The main advantage of the real-time EOS oscilloscope is the decreasing in sampling time, which eventually prevents sampling distortion caused by the fluctuation in both the power and pulsewidth of GSLD during long-term operation.
Books on the topic "Sampling oscilloscopes"
Commerce, Department of. The Impact of Internal Sampling Circuitry on the Phase Error of the Nose to Nose Oscilloscope Calibration. CreateSpace Independent Publishing Platform, 2014.
Find full textBook chapters on the topic "Sampling oscilloscopes"
Herres, David. "Sampling, Memory Depth, and Bandwidth." In Oscilloscopes: A Manual for Students, Engineers, and Scientists, 129–54. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-53885-9_5.
Full textAndrews, J. R. "Comparison of Sampling Oscilloscopes with ∼35 ps Transition Durations." In Picosecond Electronics and Optoelectronics II, 64–66. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-72970-6_14.
Full textTsuchiya, Y., M. Koishi, and K. Kinoshita. "A New Sampling Optical Oscilloscope Based on Streak Camera Technology." In Laser/Optoelektronik in der Technik / Laser/Optoelectronics in Engineering, 270–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-83174-4_59.
Full textHickman, Ian. "Sampling oscilloscopes." In Oscilloscopes, 88–114. Elsevier, 2000. http://dx.doi.org/10.1016/b978-075064757-1/50007-2.
Full textHickman, Ian. "Digital sampling oscilloscopes." In Digital Storage Oscilloscopes, 84–102. Elsevier, 1997. http://dx.doi.org/10.1016/b978-075062856-3/50009-x.
Full text"SAMPLING OSCILLOSCOPES, SPECTRUM ANALYZERS, AND PROBES." In Planar Microwave Engineering, 613–29. Cambridge University Press, 2004. http://dx.doi.org/10.1017/cbo9780511812941.020.
Full textConference papers on the topic "Sampling oscilloscopes"
Humphreys, David, and Muhammad Akmal. "Channel timebase errors for Digital Sampling Oscilloscopes." In 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012). IEEE, 2012. http://dx.doi.org/10.1109/cpem.2012.6251032.
Full textSmith, Andrew J. A., Alan G. Roddie, Peter D. Woolliams, and Matthew R. Harper. "Aberration measurement of fast pulse generators using sampling oscilloscopes." In 56th ARFTG Conference Digest. IEEE, 2000. http://dx.doi.org/10.1109/arftg.2000.327444.
Full textBourlis, G., T. Avgitas, A. Leisos, I. Manthos, A. Tsirigotis, and S. E. Tzamarias. "A Data Acquisition System based on high sampling rate oscilloscopes." In PCI '16: 20th Pan-Hellenic Conference on Informatics. New York, NY, USA: ACM, 2016. http://dx.doi.org/10.1145/3003733.3003760.
Full textRadtke, Maciej, Katarzyna Opalska, and Tomasz Starecki. "Thermal instability of sampling moment in wide-band digitizing oscilloscopes." In SPIE Proceedings, edited by Ryszard S. Romaniuk. SPIE, 2006. http://dx.doi.org/10.1117/12.674853.
Full textBishop, Charles. "Effects of averaging to reject unwanted signals in Digital Sampling Oscilloscopes." In 2010 IEEE AUTOTESTCON. IEEE, 2010. http://dx.doi.org/10.1109/autest.2010.5613545.
Full textXu Qinghua, Lin Maoliu, and Zhang Zhe. "Minimum phase response reconstruction of sampling oscilloscopes based on the NTN calibration." In 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008). IEEE, 2008. http://dx.doi.org/10.1109/cpem.2008.4574963.
Full textNelson, Michael. "A New Technique for Low-Jitter Measurements Using Equivalent-Time Sampling Oscilloscopes." In 56th ARFTG Conference Digest. IEEE, 2000. http://dx.doi.org/10.1109/arftg.2000.327422.
Full textWaivio, Nathan. "High frequency sampling oscilloscopes used for vector network analysis: Synthetic vector network analyzer." In 2010 IEEE AUTOTESTCON. IEEE, 2010. http://dx.doi.org/10.1109/autest.2010.5613606.
Full textSmith, Andrew J. A., Alan G. Roddie, and Peter D. Woolliams. "Electro-optic sampling of coplanar to coaxial transitions to enhance the calibration of fast oscilloscopes." In 56th ARFTG Conference Digest. IEEE, 2000. http://dx.doi.org/10.1109/arftg.2000.327439.
Full textBoaventura, Alirio S., Dylan F. Williams, Paul D. Hale, and Gustavo Avolio. "An Approach for Characterizing the Frequency Response of Sampling-Oscilloscopes Using a Large-Signal Network Analyzer." In 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019. IEEE, 2019. http://dx.doi.org/10.1109/mwsym.2019.8700742.
Full textReports on the topic "Sampling oscilloscopes"
Williamson, Steven. 5-Picosecond Photoconductive Sampling Oscilloscope. Fort Belvoir, VA: Defense Technical Information Center, April 1995. http://dx.doi.org/10.21236/ada294709.
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