Academic literature on the topic 'Scanned electron microscopy. eng'

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Journal articles on the topic "Scanned electron microscopy. eng"

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Fisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.

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In the past decade a new family of image-forming devices has been developed, machines that do not use lenses and are collectively called scanned probe microscopes (SPM). The SPM family evolved from the scanning tunneling microscope (STM) developed by Binnig and Rohrer in the early 1980s. The tunneling microscope and subsequent probe microscopes, such as the atomic force microscope (AFM), are based on the precise positioning and scanning of a probe within nanometer distances of a surface. Sub-nanometer precision is accomplished using piezoelectric ceramics that change shape with applied electri
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McVitie, S., and U. Hartmann. "A study of the magnetic structure of magnetic force microscope tips using transmission electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 770–71. http://dx.doi.org/10.1017/s0424820100088166.

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Magnetic force microscopy (MFM) has become an important tool in the investigation of the micromagnetic structure of magnetic systems. The interaction of stray magnetic field from a sample with a sharp magnetic tip is measured as the tip is scanned across the surface of the sample. Characterisation of the tip-sample interaction is of paramount importance if the measured signal obtained by MFM is to be put on a quantitative basis. In this paper we describe the preliminary results obtained by studying MFM tips using the Lorentz techniques of transmission electron microscopy.The MFM tips were prep
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Tortonese, M., and F. J. Giessibl. "Atomic-Force Microscopy with piezoresistive cantilevers." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1064–65. http://dx.doi.org/10.1017/s0424820100173054.

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The atomic force microscope (AFM) works by measuring the deflection of a cantilever as it is scanned over a sample. A sharp tip at the end of the cantilever is responsible for the high lateral resolution achieved with the AFM. There are several ways to measure the deflection of the cantilever. The technique used to measure the deflection of the cantilever most often dictates the mechanical complexity and stability of the instrument. Electron tunneling, interferometry and capacitive sensors have been used successfully. The most common way to measure the cantilever deflection is by means of an o
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Wang, Bing Ying, Zhen Bo Hou, Wei Wang, and Bin Zhao. "Investigation of Gas Nitriding on Wear and Corrosion Behavior of 40Cr Steel." Advanced Materials Research 311-313 (August 2011): 674–78. http://dx.doi.org/10.4028/www.scientific.net/amr.311-313.674.

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The influence of gas nitriding on the wear and corrosion resistance of 40Cr steel was investigated. Gas nitriding experiments were carried out at 550°C for 2h and 10h. The microstructure and hardness gradient were observed and analyzed through metallurgical microscope and micro hardness tester. The polarization curves were scanned by the M398 Corrosion Integrated Test System. Using MG-200 high speed friction and wear testing machine did end mill test and calculated the wear rate. By scanning electron microscopy (SEM) observationing the worn surface morphologies. The results show that after dif
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He, Shiqin, Zeyang Cao, Jiajun Ma, Shuai Zeng, Pengfei Li, and Hui Wang. "Influence of Corrosion and Fatigue on the Bending Performances of Damaged Concrete Beams." Advances in Civil Engineering 2021 (May 24, 2021): 1–14. http://dx.doi.org/10.1155/2021/6693224.

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The durability of in-service reinforced concrete bridges will be greatly reduced under the action of corrosion and the repeated load such as vehicles. In this paper, six reinforced concrete beams were cast and subjected to sustained load test for one year, and then, the alternating test of corrosion and fatigue load were carried out with the damaged concrete beams. The long-term deflection, fatigue lifetime, failure modes, and crack growth were investigated under different corrosion and fatigue working conditions. The fracture section of steel bars was scanned by electron microscopy at the end
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Kolodkina, V. I., A. A. Arutyunov, A. A. Ovsyannikova, and S. A. Babichev. "MICROSTRUCTURE OF STOMATOLOGICAL MATERIAL "RESTAVRIN" BEFORE AND AFTER BACTERIAL COLONIZATION IN THE EXPERIMENT." Kuban Scientific Medical Bulletin 25, no. 5 (2018): 53–57. http://dx.doi.org/10.25207/1608-6228-2018-25-5-53-57.

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Aim. This research was conducted to study the electron microscopic microstructure of the surface of the filling material «Restavrin» coated with the «Easy Glaze» sealant and without it before and after bacterial adhesion by scanning electron microscopy.Materials and methods. There was studied the microrelief of the plates preliminarily made from a polymeric nano-hybrid filling material («Restavrin», Technodent, Russia) with and without the sealant «Easy Glaze» and without it both in the initial state and after being placed in a medium with microorganisms. The material for microbiological exami
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Yang, Jon, Scott Montross, Jim Britton, Mengling Stuckman, Christina Lopano, and Circe Verba. "Microanalytical Approaches to Characterizing REE in Appalachian Basin Underclays." Minerals 10, no. 6 (2020): 546. http://dx.doi.org/10.3390/min10060546.

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The search for a reliable U.S. domestic source of rare earth elements (REE) is necessary to support the demand of advanced energy applications (e.g., catalysts, electronics, magnets). Sedimentary deposits may be sources for selectively recovering REE and critical metals—specifically the interbedded seat rock, or underclay, that underlies or forms the floor of a coal seam. This material is often a major component of coal waste fines and refuse and thus readily available. This study examines several Appalachian Basin underclays associated with actively mined coal seams as potential feedstocks fo
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Revel, Jean-Paul. "Prospects for scanned-probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 6–7. http://dx.doi.org/10.1017/s0424820100167767.

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In the last 50+ years the electron microscope and allied instruments have led the way as means to acquire spatially resolved information about very small objects. For the material scientist and the biologist both, imaging using the information derived from the interaction of electrons with the objects of their concern, has had limitations. Material scientists have been handicapped by the fact that their samples are often too thick for penetration without using million volt instruments. Biologists have been handicapped both by the problem of contrast since most biological objects are composed o
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McCormick, Kent L., Michael T. Woodside, Mike Huang, Paul L. McEuen, C. I. Duruoz, and J. S. Harris Jr. "Scanned potential microscopy of a two-dimensional electron gas." Physica B: Condensed Matter 249-251 (June 1998): 79–83. http://dx.doi.org/10.1016/s0921-4526(98)00071-4.

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Aloni, S., V. Altoe, A. Katan, F. Martin, and M. Salmeron. "Scanned Electron Diffraction Studies of Self-assembled Monolayers." Microscopy and Microanalysis 18, S2 (2012): 1600–1601. http://dx.doi.org/10.1017/s1431927612009853.

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Dissertations / Theses on the topic "Scanned electron microscopy. eng"

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Fernandes, Filho Romeu Belon. "Avaliação da rugosidade, corrosão e aderência bacteriana no titânio comercialmente puro após ação de fluoretos em diferentes períodos /." Araraquara : [s.n.], 2008. http://hdl.handle.net/11449/96194.

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Resumo: O objetivo deste estudo foi avaliar a rugosidade superficial e o processo de corrosão do titânio comercialmente puro (Ti cp), após simular períodos de contato com fluoretos de 5 (G5), 10 (G10), 15 (G15) e 20 (G20) anos, bem como avaliar a aderência de S. mutans nestas superfícies. Para cada respectivo período, discos de Ti cp foram previamente polidos e então imersos em solução fluoretada a 0,15% (1500 ppm, pH 5,3) ou em água destilada como controle (G0). A rugosidade média (Ra), rugosidade média quadrática (Rms) e a área superficial projetada (Área) foram avaliadas por microscopia de
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Ishi, Eduardo de Paula. "Eficácia do cloridrato de tetraciclina na remoção da smear layer e na exposição do colágeno da matriz dentinária /." Araraquara : [s.n.], 2007. http://hdl.handle.net/11449/104729.

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Orientador: Mirian Aparecida Onofre<br>Banca: Márcio Zaffalon Casati<br>Banca: Fabio André dos Santos<br>Banca: Carlos Rossa Júnior<br>Banca: José Eduardo Cezar Sampaio<br>Resumo: A remoção da smear layer e a exposição da matriz colágena da dentina de superfícies radiculares desprovidas de sua inserção conjuntiva tem o potencial de auxiliar o tratamento e/ou a regeneração periodontal. O objetivo deste estudo in vitro foi avaliar, por meio de microscopia eletrônica de varredura, a remoção da smear layer e a exposição da matriz colágena da dentina produzidas pela aplicação de cloridrato de tetra
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Cardwell, Drew. "Investigation of electrically-active defects in AlGaN/GaN high electron mobility transistors by spatially-resolved spectroscopic scanned probe techniques." The Ohio State University, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=osu1373894407.

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Porto, Thiago Soares. "Estudo dos procedimentos utilizados para obtenção de microrretenções na superfície interna da porcelana : avaliação por meio de testes de rugosimetria e microscopia eletrônica de varredura /." Araraquara : [s.n.], 2006. http://hdl.handle.net/11449/89669.

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Orientador: Welingtom Dinelli<br>Co^orientador:<br>Banca: José Roberto Cury Saad<br>Banca: Mânio de Carvalho Tibúrcio<br>Resumo: O objetivo deste estudo foi avaliar a superfície interna de dois sistemas cerâmicos, após diferentes tratamentos de superfície, avaliação essa feita por meio de rugosimetria e microscopia eletrônica de varredura. Foram utilizadas as seguintes cerâmicas: IPS Empress II (Ivoclar-Vivadent Alemanha) e InCeram Alumina (Vita Zahnfabrick - Alemanha). Foram confeccionadas 50 amostras em forma de pastilha para cada sistema cerâmico de acordo com as especificações dos fabrican
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Sanches, Juliana. "Efeito de injúrias mecânicas na qualidade pós-colheita de abacates /." Jaboticabal : [s.n.], 2006. http://hdl.handle.net/11449/105275.

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Orientador: José Fernando Durigan<br>Banca: Ben Hur Mattiuz<br>Banca: Paulo Ademar Martins Leal<br>Banca: Josalba Vidigal de Castro<br>Banca: José Flávio Diniz Nantes<br>Resumo: O objetivo deste trabalho foi avaliar os efeitos de injúrias mecânicas, por impacto, compressão e corte, na fisiologia de abacates, através de análises físicas, químicas, bioquímicas e sensoriais, tomografia de ressonância magnética e microscopia eletrônica de varredura. O impacto foi aplicado nos lados opostos do fruto e provocados por queda livre de 2,00 m; a compressão, submetendo-os a pesos de 117,6 N, por 24 horas
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Volanti, Diogo Paschoalini. "Morfologias de óxido de cobre (II) na mesoescala : síntese hidrotérmica assistida por micro-ondas, mecanismo de crescimento e atividade catalítica na reação de desidrogenação do etanol /." Araraquara : [s.n.], 2011. http://hdl.handle.net/11449/102564.

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Orientador: Elson Longo da Silva<br>Coorientador: Marcelo Ornaghi Orlandi<br>Banca: José maria Corrêa Bueno<br>Banca: Daniela Coelho de Oliveira<br>Banca: Reginaldo Muccillo<br>Banca: Juan Andrés<br>Resumo: O trabalho que se apresenta centra-se no estudo investigativo do crescimento de cristais de óxido de cobre (II), CuO, com cristais organizados em diferentes formas semelhantes à ouriços-do-mar, fibras, e nanobastões, com controle fino da morfologia e cristalizados pelo método hidrotérmico assistido por micro-ondas. Esses materiais foram previamente caracterizados por difração de raios X (DR
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Isola, José Geraldo Meirelles Palma. "Morfologia, ultraestrutura e morfometria do tegumento da paca (Cuniculus paca) /." Jaboticabal : [s.n.], 2010. http://hdl.handle.net/11449/89040.

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Resumo: Considerando-se a falta de informações detalhadas sobre a morfologia da paca e dada a importância do tegumento comum, descreveu-se a morfologia, morfometria e a ultraestrutura da pele de oito pacas (Cuniculus paca) machos e fêmeas, mediante a análise comparativa de segmentos cutâneos das regiões cervical, dorsal, medial do carpo e coxins palmares e plantares. Observaram-se macroscopicamente as características da pelagem. Parte dos segmentos das regiões cutâneas foi analisado à microscopia de luz e parte, à microscopia eletrônica de varredura. Mensuraram-se as espessuras da derme, epide
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Nozaki, Denise Nakada 1972. "Estudos biológicos e moleculares de begomovirus infectando pimentão (Capsicum annuum) no Estado de São Paulo /." Botucatu : [s.n.], 2007. http://hdl.handle.net/11449/105407.

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Resumo: Os vírus pertencentes ao gênero Begomovirus da família Geminiviridae são transmitidos pela mosca-branca Bemisia tabaci Gennadius, atualmente constituem um dos problemas fitossanitários mais sérios em diversas culturas. A mosca-branca encontra-se disseminada em todas as principais regiões produtoras de hortaliças do Brasil. No estado de São Paulo, em 2005, plantas de pimentão mostrando sintomas de deformação dos frutos, folhas e mosaico foliar, apresentaram-se infectadas por begomovírus. Até então, no Brasil, a infecção de pimentão por vírus deste gênero havia sido verificada apenas nos
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Souza, Niélli Caetano de. "Avaliação da influência da técnica de fotopolimerização da resina composta e diferentes materiais protetores pulpares na formação de fendas /." Araraquara : [s.n.], 2007. http://hdl.handle.net/11449/101378.

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Resumo: O objetivo deste estudo foi avaliar a influência da fotopolimerização gradual no deslocamento de materiais protetores pulpares em função da contração de polimerização da resina composta através da formação de microfendas nas interfaces: estrutura dental/material protetor pulpar/ resina composta. Cavidades classe V, com dimensões padronizadas foram preparadas nas faces V e L de 20 terceiros molares humanos, divididos em 4 grupos de acordo com o material protetor pulpar e técnica de fotopolimerização: (1) Ketac Molar Easymix, 3M ESPE - (IVQ) + Fotopolimerização convencional - 850mW/cmø p
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Conti, Elaine Cristina Guerbach. "Estudo da interface titânio/porcelana, com três porcelanas de ultra baixa fusão, empregando-se microscopia eletrônica de varredura e dilatometria /." Araraquara : [s.n.], 2002. http://hdl.handle.net/11449/89679.

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Resumo: O objetivo deste trabalho foi caracterizar química e metalograficamente o Ti.c.p. antes e após a fundição por Plasma-Skull, e estudar as interfaces entre esse metal e as porcelanas Vitatitankeramik, Triceram e Noritake TI22, empregando-se M.E.V., EDS, Mapeamento Elementar e Dilatometria. Trinta e cinco placas nas dimensões de 25mm x 3mm x 1mm foram fundidas pela máquina nacional Discovery - Plasma, EDG Equipamentos, sendo 5 amostras empregadas para a análise química e metalográfica e as 30 restantes, utilizadas para aplicação das porcelanas, sendo divididas em 3 grupos de 10 placas cad
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Books on the topic "Scanned electron microscopy. eng"

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Ash, Eric. Scanned Image Microscopy (Rank Prize Funds Opto-Electronics Biennial Symposia). Academic Press, 1997.

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Ash, Eric. Scanned Image Microscopy (Rank Prize Funds Opto-Electronics Biennial Symposia). Academic Press, 1997.

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Book chapters on the topic "Scanned electron microscopy. eng"

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Krishnan, Kannan M. "Scanning Electron Microscopy." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0010.

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A scanning electron microscope (SEM) focuses an electron beam to a sharp probe, with its diameter, which depends on the acceleration voltage and the aberration coefficients of the probe-forming lens, determining SEM resolution. This electron beam is scanned over the specimen and signals arising from a variety of beam-specimen interactions are recorded to form images using different detectors positioned in the specimen chamber. Secondary electrons, detected with the Everton-Thornley detector, reveal the topography and electrical properties; back-scattered electrons provide information about the average atomic number and local crystallography of the specimen. Ferromagnetic materials alter the trajectory of secondary (Type I) and back-scattered (Type II) electrons to provide magnetic contrast. The magnetic polarization of the secondary electrons can also be analyzed directly (SEMPA) to image domains. The electron beam also excites characteristic X-rays for chemical microanalysis. Luminescent specimens produce light (Cathodoluminescence); these photons provide information on the electronic structure, particularly the defect states, of the specimen. Environmental SEMs, with differential pumping, image the specimen in a gaseous environment and/or under hydration for biological materials. A SEM combined with a focused ion beam (FIB) column is used for nano-fabrication, including preparation of electron-transparent TEM specimens.
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"Towards scanned neutral particle microscopy: developing neutral particle analogues of charged particle lenses." In Electron Microscopy and Analysis 2001. CRC Press, 2001. http://dx.doi.org/10.1201/9781482289510-129.

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Krishnan, Kannan M. "Transmission and Analytical Electron Microscopy." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0009.

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Transmission electron microscopy provides information on all aspects of the microstructure — structural, atomic, chemical, electronic, magnetic, etc. — at the highest spatial resolution in physical and biological materials, with applications ranging from fundamental studies to process metrology in the semiconductor industry. Developments in correcting electron-optical aberrations have improved TEM resolution to sub-Å levels. Coherent Bragg scattering (diffraction), incoherent Rutherford scattering (atomic mass), and interference (phase) are some contrast mechanisms in TEM. For phase contrast, optimum imaging is observed at the Scherzer defocus. Magnetic domains are imaged in Fresnel, Foucault, or differential phase contrast (DPC) modes. Off-axis electron holography measures phase shifts of the electron wave, and is affected by magnetic and electrostatic fields of the specimen. In scanning-transmission (STEM) mode, a focused electron beam is scanned across the specimen to sequentially form an image; a high-angle annular dark field detector gives Z-contrast images with elemental specificity and atomic resolution. Series of (S)TEM images, recorded every one or two degrees about a tilt axis, over as large a tilt-range as possible, are back-projected to reconstruct a 3D tomographic image. Inelastically scattered electrons, collected in the forward direction, form the energy-loss spectrum (EELS), and reveal the unoccupied local density of states, partitioned by site symmetry, nature of the chemical species, and the angular momentum of the final state. Energy-lost electrons are imaged by recording them, pixel-by-pixel, as a sequence of spectra (spectrum imaging), or by choosing electrons that have lost a specific energy (energy-filtered TEM). De-excitation processes (characteristic X-ray emission) are detected by energy dispersive methods, providing compositional microanalysis, including chemical maps. Overall, specimen preparation methods, even with many recent developments, including focused ion beam milling, truly limit applications of TEM.
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"about chemical bonding and molecular structure. This information can be used to detect th e types of organic materials present on the surface. 4.3.2.2. Raman spectroscopy (RS) [7, 8] It is used to examine the energy levels of molecules that cannot be well character-ized via infrared spectroscopy. Th e two techniques, however, are complimentary. In the RS, a sample is irradiated with a strong monochromatic light source (usu-ally a laser). Most of the radiation will scatter or "reflect off' the sample at the same energy as the incoming laser radiation. However, a small amount will scat-ter from the sample at a wavelength slightly shifted from the original wavelength. It is possible to study the molecular structure or determine the chemical identity of the sample. It is quite straightforward to identify compounds by spectral library search. Due to extensive library spectral information, the unique spectral finger-print of every compound, and the ease with which such analyses can be per-formed, the RS is a very useful technique for various applications. An important application of the RS is the rapid, nondestructive characterization of diamond, diamond-like, and amorphous-carbon films. 4.3.2.3. Scanning electron microscopy (SEM) / energy dispersive X-ra y analysis (EDX) [7, 8] The SEM produce s detailed photographs that provide important information about the surface structure and morphology of almost any kind of sample. Image analy-sis is often the first and most important step in problem solving and failure analy-sis. With SEM, a focused beam of high-energy electrons is scanned over the sur-face of a material, causing a variety of signals, secondary electrons, X-rays, photons, etc. - each of which may be used to characterize the material with re-spect to specific properties . The signals are used to modulate the brightness on a CRT display, thereb y providing a high-resolution map of the selected material property. It is a surface imaging technique, but with Energy Dispersive X-ray (EDX) it can identify elements in the near-surface region. This technique is most useful for imaging particles. 4.3.2.4. X-ray fluorescence (XRF) [7, 8] Incident X-rays are used to excite surface atoms. The atoms relax through the emission of an X-ray with energy characteristic of the parent atoms and the inten-sity proportional to the amount of the element present. It is a bulk or "total mate-rials" characterization technique for rapid, simultaneous, and nondestructive analysis of elements having an atomic number higher than that of boron. Tradi-tional bulk analysis applications include identifying metals and alloys, detecting trace elements in liquids, and identifying residues and deposits. 4.3.2.5. Total-reflection X-ray fluorescence (TXRF) [7, 8] It is a special XRF technique that provides extremely sensitive measures of the elements present in a material's outer surface. Applications include searching for metal contamination in thin films on silicon wafers and detecting picogram-levels o f arsenic, lead, mercury and cadmium on hazardous, chemical fume hoods." In Surface Contamination and Cleaning. CRC Press, 2003. http://dx.doi.org/10.1201/9789047403289-9.

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Conference papers on the topic "Scanned electron microscopy. eng"

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Dewolf, T., D. Cooper, N. Bernier, et al. "Investigation of Switching Mechanism in HfO2-Based Oxide Resistive Memories by In-Situ Transmission Electron Microscopy and Electron Energy Loss Spectroscopy." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0371.

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Abstract Forming and breaking a nanometer-sized conductive area are commonly accepted as the physical phenomenon involved in the switching mechanism of oxide resistive random access memories (OxRRAM). This study investigates a state-of-the-art OxRRAM device by in-situ transmission electron microscopy (TEM). Combining high spatial resolution obtained with a very small probe scanned over the area of interest of the sample and chemical analyses with electron energy loss spectroscopy, the local chemical state of the device can be compared before and after applying an electrical bias. This in-situ
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Kasano, Hideaki, and Chiaki Miyasaka. "Experimental Study on Impact-Induced Damage in CFRP Laminated Composites With Scanned Image Microscopy." In ASME 2003 Pressure Vessels and Piping Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/pvp2003-1860.

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An objective of this article is to investigate the initiation and propagation mechanisms of the impact-induced interior damage with scanned image microscopy. Impact tests by an air-gun type of apparatus were undertaken on a series of CFRP laminated specimens having different ply orientations such as [06/θ10/06]. The tests were conducted under the conditions of the same impact velocity of 60m/s and same impact energy level of two Joule for two steel balls (i.e., impactor) of different diameters. A mechanical scanning acoustic reflection microscope (pulse-wave mode) revealed the delamination at
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Kasano, Hideaki, and Chiaki Miyasaka. "Transverse Impact of CFRP Laminates Under Static Load of Axial Compression With Scanned Image Microscopy." In ASME 2003 Pressure Vessels and Piping Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/pvp2003-1863.

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The effect of an initial compressive load on the impact-induced damage of Carbon Fiber Reinforced Plastic (CFRP) laminated composites was experimentally studied. Four kinds of test specimens having laminate configurations of (06/θ10/06) were employed, wherein their ply angles (denoted as “θ”) are 30°, 45°, 60°, and 90°. The test specimens were statically loaded, and under the load, they were impacted with an air-gun type of impact apparatus. First, the impact-damaged specimens were inspected by a mechanical scanning acoustic reflection microscope (SAM). The SAM images revealed that the initial
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Bhaskaran, Harish, Denis Pelekhov, P. Chris Hammel, and Keith Schwab. "Development of Ultra-Sensitive Capacitive Readout for Magnetic Resonance Force Microscopy." In ASME 4th Integrated Nanosystems Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/nano2005-87052.

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The use of nanomechanical devices to develop a scanned probe imaging technique known as “magnetic resonance force microscopy” (MRFM) has been among the most exciting thrust areas in nanomechanics in the last decade and a half. MRFM is a visionary project with the ultimate goal of imaging and identifying individual atomic species, both on the surface and below it [1]. This would be a revolutionary tool for material science, electronic device development, and imaging biological structures. Considerable progress has been made in the development of MRFM [2] in the past decade including the detecti
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Yeo, Seung Min, Spyros I. Tseregounis, Andreas A. Polycarpou, Adam Fruehling, and Dimitrios Peroulis. "Analysis of Topographical Changes and Adhesion Failures in Gold-to-Gold Metal RF MEMS Switches With Cycling." In ASME/STLE 2009 International Joint Tribology Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/ijtc2009-15120.

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Topographical changes within the contact area as a function of cycling could be a critical factor causing failure and reliability issues in RF MEMS switch operation. In this paper, gold-to-gold contact, cantilever-type RF MEMS switches were tested (cold-switching mode) for different number of cycles, namely, 10, 102, 103, 104, 105, and 106. After the cycling tests, the contact area of each switch was scanned using optical microscopy, scanning electron microscopy and atomic force microscopy to quantify the exact gold-to-gold contact surface changes, leading to adhesion failures (at about 106 cy
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Chen, Yu-Chen, Wen-Kai Chen, Jing-Chi Huang, and Jia-Yang Juang. "Deposition of Highly Transparent and Conductive Films on Tilted Substrates by Atmospheric Pressure Plasma Jet." In ASME 2019 28th Conference on Information Storage and Processing Systems. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/isps2019-7423.

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Abstract We study the influence of the substrate tilt angle on the microstructure and optoelectronic properties of gallium-doped zinc oxide (GZO) thin films deposited by the atmosphere pressure plasma jet (APPJ) method. The nozzle trajectories play a key role in oblique angle deposition. In the process of oblique angle deposition, if the nozzle scanned from the upstream side to the downstream side, the electrical properties such as resistivity, carrier concentration and mobility deteriorate considerably. The optical properties also worsen — specular transmittance goes down and diffuse transmit
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Sadeh, Sepehr, and Kunal Mitra. "Laser Induced Implantation Doping of Glass Substrates." In ASME 2016 Heat Transfer Summer Conference collocated with the ASME 2016 Fluids Engineering Division Summer Meeting and the ASME 2016 14th International Conference on Nanochannels, Microchannels, and Minichannels. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/ht2016-7402.

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Lasers are widely used as high-accuracy tools for material processing. Different types of lasers such as CO2, Nd:YAG, and excimer lasers are used in different operating modes such as continuous wave, pulsed or Q-switched. Volumes of materials and their composition, structure, and properties can be controlled or modified by varying laser pulses. In this research, by using laser as a material processing tool, an experimental method was developed for laser induced implantation doping of glass substrates with conductive metals. Experiments were performed on glass samples using Q-switched Nd:YAG la
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