Academic literature on the topic 'Scanned electron microscopy. eng'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Scanned electron microscopy. eng.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Journal articles on the topic "Scanned electron microscopy. eng"
Fisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.
Full textMcVitie, S., and U. Hartmann. "A study of the magnetic structure of magnetic force microscope tips using transmission electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 770–71. http://dx.doi.org/10.1017/s0424820100088166.
Full textTortonese, M., and F. J. Giessibl. "Atomic-Force Microscopy with piezoresistive cantilevers." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1064–65. http://dx.doi.org/10.1017/s0424820100173054.
Full textWang, Bing Ying, Zhen Bo Hou, Wei Wang, and Bin Zhao. "Investigation of Gas Nitriding on Wear and Corrosion Behavior of 40Cr Steel." Advanced Materials Research 311-313 (August 2011): 674–78. http://dx.doi.org/10.4028/www.scientific.net/amr.311-313.674.
Full textHe, Shiqin, Zeyang Cao, Jiajun Ma, Shuai Zeng, Pengfei Li, and Hui Wang. "Influence of Corrosion and Fatigue on the Bending Performances of Damaged Concrete Beams." Advances in Civil Engineering 2021 (May 24, 2021): 1–14. http://dx.doi.org/10.1155/2021/6693224.
Full textKolodkina, V. I., A. A. Arutyunov, A. A. Ovsyannikova, and S. A. Babichev. "MICROSTRUCTURE OF STOMATOLOGICAL MATERIAL "RESTAVRIN" BEFORE AND AFTER BACTERIAL COLONIZATION IN THE EXPERIMENT." Kuban Scientific Medical Bulletin 25, no. 5 (2018): 53–57. http://dx.doi.org/10.25207/1608-6228-2018-25-5-53-57.
Full textYang, Jon, Scott Montross, Jim Britton, Mengling Stuckman, Christina Lopano, and Circe Verba. "Microanalytical Approaches to Characterizing REE in Appalachian Basin Underclays." Minerals 10, no. 6 (2020): 546. http://dx.doi.org/10.3390/min10060546.
Full textRevel, Jean-Paul. "Prospects for scanned-probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 6–7. http://dx.doi.org/10.1017/s0424820100167767.
Full textMcCormick, Kent L., Michael T. Woodside, Mike Huang, Paul L. McEuen, C. I. Duruoz, and J. S. Harris Jr. "Scanned potential microscopy of a two-dimensional electron gas." Physica B: Condensed Matter 249-251 (June 1998): 79–83. http://dx.doi.org/10.1016/s0921-4526(98)00071-4.
Full textAloni, S., V. Altoe, A. Katan, F. Martin, and M. Salmeron. "Scanned Electron Diffraction Studies of Self-assembled Monolayers." Microscopy and Microanalysis 18, S2 (2012): 1600–1601. http://dx.doi.org/10.1017/s1431927612009853.
Full textDissertations / Theses on the topic "Scanned electron microscopy. eng"
Fernandes, Filho Romeu Belon. "Avaliação da rugosidade, corrosão e aderência bacteriana no titânio comercialmente puro após ação de fluoretos em diferentes períodos /." Araraquara : [s.n.], 2008. http://hdl.handle.net/11449/96194.
Full textIshi, Eduardo de Paula. "Eficácia do cloridrato de tetraciclina na remoção da smear layer e na exposição do colágeno da matriz dentinária /." Araraquara : [s.n.], 2007. http://hdl.handle.net/11449/104729.
Full textCardwell, Drew. "Investigation of electrically-active defects in AlGaN/GaN high electron mobility transistors by spatially-resolved spectroscopic scanned probe techniques." The Ohio State University, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=osu1373894407.
Full textPorto, Thiago Soares. "Estudo dos procedimentos utilizados para obtenção de microrretenções na superfície interna da porcelana : avaliação por meio de testes de rugosimetria e microscopia eletrônica de varredura /." Araraquara : [s.n.], 2006. http://hdl.handle.net/11449/89669.
Full textSanches, Juliana. "Efeito de injúrias mecânicas na qualidade pós-colheita de abacates /." Jaboticabal : [s.n.], 2006. http://hdl.handle.net/11449/105275.
Full textVolanti, Diogo Paschoalini. "Morfologias de óxido de cobre (II) na mesoescala : síntese hidrotérmica assistida por micro-ondas, mecanismo de crescimento e atividade catalítica na reação de desidrogenação do etanol /." Araraquara : [s.n.], 2011. http://hdl.handle.net/11449/102564.
Full textIsola, José Geraldo Meirelles Palma. "Morfologia, ultraestrutura e morfometria do tegumento da paca (Cuniculus paca) /." Jaboticabal : [s.n.], 2010. http://hdl.handle.net/11449/89040.
Full textNozaki, Denise Nakada 1972. "Estudos biológicos e moleculares de begomovirus infectando pimentão (Capsicum annuum) no Estado de São Paulo /." Botucatu : [s.n.], 2007. http://hdl.handle.net/11449/105407.
Full textSouza, Niélli Caetano de. "Avaliação da influência da técnica de fotopolimerização da resina composta e diferentes materiais protetores pulpares na formação de fendas /." Araraquara : [s.n.], 2007. http://hdl.handle.net/11449/101378.
Full textConti, Elaine Cristina Guerbach. "Estudo da interface titânio/porcelana, com três porcelanas de ultra baixa fusão, empregando-se microscopia eletrônica de varredura e dilatometria /." Araraquara : [s.n.], 2002. http://hdl.handle.net/11449/89679.
Full textBooks on the topic "Scanned electron microscopy. eng"
Ash, Eric. Scanned Image Microscopy (Rank Prize Funds Opto-Electronics Biennial Symposia). Academic Press, 1997.
Find full textAsh, Eric. Scanned Image Microscopy (Rank Prize Funds Opto-Electronics Biennial Symposia). Academic Press, 1997.
Find full textBook chapters on the topic "Scanned electron microscopy. eng"
Krishnan, Kannan M. "Scanning Electron Microscopy." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0010.
Full text"Towards scanned neutral particle microscopy: developing neutral particle analogues of charged particle lenses." In Electron Microscopy and Analysis 2001. CRC Press, 2001. http://dx.doi.org/10.1201/9781482289510-129.
Full textKrishnan, Kannan M. "Transmission and Analytical Electron Microscopy." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0009.
Full text"about chemical bonding and molecular structure. This information can be used to detect th e types of organic materials present on the surface. 4.3.2.2. Raman spectroscopy (RS) [7, 8] It is used to examine the energy levels of molecules that cannot be well character-ized via infrared spectroscopy. Th e two techniques, however, are complimentary. In the RS, a sample is irradiated with a strong monochromatic light source (usu-ally a laser). Most of the radiation will scatter or "reflect off' the sample at the same energy as the incoming laser radiation. However, a small amount will scat-ter from the sample at a wavelength slightly shifted from the original wavelength. It is possible to study the molecular structure or determine the chemical identity of the sample. It is quite straightforward to identify compounds by spectral library search. Due to extensive library spectral information, the unique spectral finger-print of every compound, and the ease with which such analyses can be per-formed, the RS is a very useful technique for various applications. An important application of the RS is the rapid, nondestructive characterization of diamond, diamond-like, and amorphous-carbon films. 4.3.2.3. Scanning electron microscopy (SEM) / energy dispersive X-ra y analysis (EDX) [7, 8] The SEM produce s detailed photographs that provide important information about the surface structure and morphology of almost any kind of sample. Image analy-sis is often the first and most important step in problem solving and failure analy-sis. With SEM, a focused beam of high-energy electrons is scanned over the sur-face of a material, causing a variety of signals, secondary electrons, X-rays, photons, etc. - each of which may be used to characterize the material with re-spect to specific properties . The signals are used to modulate the brightness on a CRT display, thereb y providing a high-resolution map of the selected material property. It is a surface imaging technique, but with Energy Dispersive X-ray (EDX) it can identify elements in the near-surface region. This technique is most useful for imaging particles. 4.3.2.4. X-ray fluorescence (XRF) [7, 8] Incident X-rays are used to excite surface atoms. The atoms relax through the emission of an X-ray with energy characteristic of the parent atoms and the inten-sity proportional to the amount of the element present. It is a bulk or "total mate-rials" characterization technique for rapid, simultaneous, and nondestructive analysis of elements having an atomic number higher than that of boron. Tradi-tional bulk analysis applications include identifying metals and alloys, detecting trace elements in liquids, and identifying residues and deposits. 4.3.2.5. Total-reflection X-ray fluorescence (TXRF) [7, 8] It is a special XRF technique that provides extremely sensitive measures of the elements present in a material's outer surface. Applications include searching for metal contamination in thin films on silicon wafers and detecting picogram-levels o f arsenic, lead, mercury and cadmium on hazardous, chemical fume hoods." In Surface Contamination and Cleaning. CRC Press, 2003. http://dx.doi.org/10.1201/9789047403289-9.
Full textConference papers on the topic "Scanned electron microscopy. eng"
Dewolf, T., D. Cooper, N. Bernier, et al. "Investigation of Switching Mechanism in HfO2-Based Oxide Resistive Memories by In-Situ Transmission Electron Microscopy and Electron Energy Loss Spectroscopy." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0371.
Full textKasano, Hideaki, and Chiaki Miyasaka. "Experimental Study on Impact-Induced Damage in CFRP Laminated Composites With Scanned Image Microscopy." In ASME 2003 Pressure Vessels and Piping Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/pvp2003-1860.
Full textKasano, Hideaki, and Chiaki Miyasaka. "Transverse Impact of CFRP Laminates Under Static Load of Axial Compression With Scanned Image Microscopy." In ASME 2003 Pressure Vessels and Piping Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/pvp2003-1863.
Full textBhaskaran, Harish, Denis Pelekhov, P. Chris Hammel, and Keith Schwab. "Development of Ultra-Sensitive Capacitive Readout for Magnetic Resonance Force Microscopy." In ASME 4th Integrated Nanosystems Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/nano2005-87052.
Full textYeo, Seung Min, Spyros I. Tseregounis, Andreas A. Polycarpou, Adam Fruehling, and Dimitrios Peroulis. "Analysis of Topographical Changes and Adhesion Failures in Gold-to-Gold Metal RF MEMS Switches With Cycling." In ASME/STLE 2009 International Joint Tribology Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/ijtc2009-15120.
Full textChen, Yu-Chen, Wen-Kai Chen, Jing-Chi Huang, and Jia-Yang Juang. "Deposition of Highly Transparent and Conductive Films on Tilted Substrates by Atmospheric Pressure Plasma Jet." In ASME 2019 28th Conference on Information Storage and Processing Systems. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/isps2019-7423.
Full textSadeh, Sepehr, and Kunal Mitra. "Laser Induced Implantation Doping of Glass Substrates." In ASME 2016 Heat Transfer Summer Conference collocated with the ASME 2016 Fluids Engineering Division Summer Meeting and the ASME 2016 14th International Conference on Nanochannels, Microchannels, and Minichannels. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/ht2016-7402.
Full text