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Journal articles on the topic 'Scanned electron microscopy. eng'

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Published: 4 June 2021

Last updated: 9 February 2022

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1

Fisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.

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In the past decade a new family of image-forming devices has been developed, machines that do not use lenses and are collectively called scanned probe microscopes (SPM). The SPM family evolved from the scanning tunneling microscope (STM) developed by Binnig and Rohrer in the early 1980s. The tunneling microscope and subsequent probe microscopes, such as the atomic force microscope (AFM), are based on the precise positioning and scanning of a probe within nanometer distances of a surface. Sub-nanometer precision is accomplished using piezoelectric ceramics that change shape with applied electri

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McVitie, S., and U. Hartmann. "A study of the magnetic structure of magnetic force microscope tips using transmission electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 770–71. http://dx.doi.org/10.1017/s0424820100088166.

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Magnetic force microscopy (MFM) has become an important tool in the investigation of the micromagnetic structure of magnetic systems. The interaction of stray magnetic field from a sample with a sharp magnetic tip is measured as the tip is scanned across the surface of the sample. Characterisation of the tip-sample interaction is of paramount importance if the measured signal obtained by MFM is to be put on a quantitative basis. In this paper we describe the preliminary results obtained by studying MFM tips using the Lorentz techniques of transmission electron microscopy.The MFM tips were prep

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Tortonese, M., and F. J. Giessibl. "Atomic-Force Microscopy with piezoresistive cantilevers." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1064–65. http://dx.doi.org/10.1017/s0424820100173054.

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The atomic force microscope (AFM) works by measuring the deflection of a cantilever as it is scanned over a sample. A sharp tip at the end of the cantilever is responsible for the high lateral resolution achieved with the AFM. There are several ways to measure the deflection of the cantilever. The technique used to measure the deflection of the cantilever most often dictates the mechanical complexity and stability of the instrument. Electron tunneling, interferometry and capacitive sensors have been used successfully. The most common way to measure the cantilever deflection is by means of an o

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Wang, Bing Ying, Zhen Bo Hou, Wei Wang, and Bin Zhao. "Investigation of Gas Nitriding on Wear and Corrosion Behavior of 40Cr Steel." Advanced Materials Research 311-313 (August 2011): 674–78. http://dx.doi.org/10.4028/www.scientific.net/amr.311-313.674.

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The influence of gas nitriding on the wear and corrosion resistance of 40Cr steel was investigated. Gas nitriding experiments were carried out at 550°C for 2h and 10h. The microstructure and hardness gradient were observed and analyzed through metallurgical microscope and micro hardness tester. The polarization curves were scanned by the M398 Corrosion Integrated Test System. Using MG-200 high speed friction and wear testing machine did end mill test and calculated the wear rate. By scanning electron microscopy (SEM) observationing the worn surface morphologies. The results show that after dif

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He, Shiqin, Zeyang Cao, Jiajun Ma, Shuai Zeng, Pengfei Li, and Hui Wang. "Influence of Corrosion and Fatigue on the Bending Performances of Damaged Concrete Beams." Advances in Civil Engineering 2021 (May 24, 2021): 1–14. http://dx.doi.org/10.1155/2021/6693224.

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The durability of in-service reinforced concrete bridges will be greatly reduced under the action of corrosion and the repeated load such as vehicles. In this paper, six reinforced concrete beams were cast and subjected to sustained load test for one year, and then, the alternating test of corrosion and fatigue load were carried out with the damaged concrete beams. The long-term deflection, fatigue lifetime, failure modes, and crack growth were investigated under different corrosion and fatigue working conditions. The fracture section of steel bars was scanned by electron microscopy at the end

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Kolodkina, V. I., A. A. Arutyunov, A. A. Ovsyannikova, and S. A. Babichev. "MICROSTRUCTURE OF STOMATOLOGICAL MATERIAL "RESTAVRIN" BEFORE AND AFTER BACTERIAL COLONIZATION IN THE EXPERIMENT." Kuban Scientific Medical Bulletin 25, no. 5 (2018): 53–57. http://dx.doi.org/10.25207/1608-6228-2018-25-5-53-57.

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Aim. This research was conducted to study the electron microscopic microstructure of the surface of the filling material «Restavrin» coated with the «Easy Glaze» sealant and without it before and after bacterial adhesion by scanning electron microscopy.Materials and methods. There was studied the microrelief of the plates preliminarily made from a polymeric nano-hybrid filling material («Restavrin», Technodent, Russia) with and without the sealant «Easy Glaze» and without it both in the initial state and after being placed in a medium with microorganisms. The material for microbiological exami

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Yang, Jon, Scott Montross, Jim Britton, Mengling Stuckman, Christina Lopano, and Circe Verba. "Microanalytical Approaches to Characterizing REE in Appalachian Basin Underclays." Minerals 10, no. 6 (2020): 546. http://dx.doi.org/10.3390/min10060546.

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The search for a reliable U.S. domestic source of rare earth elements (REE) is necessary to support the demand of advanced energy applications (e.g., catalysts, electronics, magnets). Sedimentary deposits may be sources for selectively recovering REE and critical metals—specifically the interbedded seat rock, or underclay, that underlies or forms the floor of a coal seam. This material is often a major component of coal waste fines and refuse and thus readily available. This study examines several Appalachian Basin underclays associated with actively mined coal seams as potential feedstocks fo

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8

Revel, Jean-Paul. "Prospects for scanned-probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 6–7. http://dx.doi.org/10.1017/s0424820100167767.

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In the last 50+ years the electron microscope and allied instruments have led the way as means to acquire spatially resolved information about very small objects. For the material scientist and the biologist both, imaging using the information derived from the interaction of electrons with the objects of their concern, has had limitations. Material scientists have been handicapped by the fact that their samples are often too thick for penetration without using million volt instruments. Biologists have been handicapped both by the problem of contrast since most biological objects are composed o

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9

McCormick, Kent L., Michael T. Woodside, Mike Huang, Paul L. McEuen, C. I. Duruoz, and J. S. Harris Jr. "Scanned potential microscopy of a two-dimensional electron gas." Physica B: Condensed Matter 249-251 (June 1998): 79–83. http://dx.doi.org/10.1016/s0921-4526(98)00071-4.

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10

Aloni, S., V. Altoe, A. Katan, F. Martin, and M. Salmeron. "Scanned Electron Diffraction Studies of Self-assembled Monolayers." Microscopy and Microanalysis 18, S2 (2012): 1600–1601. http://dx.doi.org/10.1017/s1431927612009853.

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Wells, Oliver C., and Mark E. Welland. "Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 636–39. http://dx.doi.org/10.1017/s0424820100144620.

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Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample. In the low-end STM, the system has a mechanical stability and a noise level to give a vertical resolution of between 0.1 nm and 1.0 nm. The atomic resolution STM can show individual atoms on the surface of the specimen.A low-end STM has been put into the specimen chamber of a s

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12

Saving, K. L., and R. C. Caughey. "Electron Microscopy as an aid to diagnosis in pediatric hematology/oncology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 1062–63. http://dx.doi.org/10.1017/s0424820100157292.

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This presentation is designed to demonstrate how scanning and transmission electron microscopy techniques can be utilized to confirm or support a variety of unusual pediatric hematologic/oncologic disorders. Patients with the following diagnoses will be presented: (1) hereditary pyropoikilocytosis, (2) familial erythrophagocytic lymphohistiocytosis, (3) acute megakaryoblastic leukemia, and (4) pseudo-von Willebrand’s disease.All transmission and scanning electron microscopy samples were fixed in 2.5% glutaraldehyde, rinsed in Millonig’s phosphate buffer, and post-fixed with 1% osmium tetroxide

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HAMMEL, P. C. "FORCE-DETECTED SCANNED PROBE MAGNETIC RESONANCE MICROSCOPY." International Journal of Modern Physics B 16, no. 20n22 (2002): 3378. http://dx.doi.org/10.1142/s0217979202014474.

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Magnetic Resonance Force Microscopy (MRFM) is a novel scanned probe technique that combines the three-dimensional imaging capabilities of magnetic resonance imaging (MRI) with the high sensitivity and resolution of atomic force microscopy (AFM). This emerging technology holds clear potential for resolution at the atomic scale. When fully realized, MRFM will provide a unique method for non-destructive, chemically specifc, subsurface imaging with applicability to a wide variety of materials. I will review results to date spanning applications of MRFM to nuclear spin, electron spin, and ferromagn

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14

Fisher, K. A., M. B. Shattuck, M. G. L. Gustafsson, and J. Clarke. "Scanning Tunneling Microscopy and low-temperature force microscopy of freeze-fractured samples." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 58–59. http://dx.doi.org/10.1017/s0424820100146138.

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Monolayer freeze-fracture combined with scanned probe microscopy (SPM) offers unique advantages for studies of biological structure. The freeze-fracture methodology incorporates rapid freezing approaches for sample preservation and stabilization, and the scanned probe microscopies, especially scanning tunneling microscopy (STM) and atomic force microscopy (AFM), allow high resolution examination of surface features including digital mapping, quantification, and display. In routine biological STM a sharp conductive probe is positioned with piezoelectric transducers close to a conductive surface

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15

Weiss, J. K., W. J. de Ruijter, and Douglas W. Cosart. "Integrated computer data acquisition and control in analytical electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 570–71. http://dx.doi.org/10.1017/s0424820100165318.

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Computers were considered to be mainly “add-on” equipment for analytical electron microscopes until only the last several years. Before that time, although most microscopes had been microprocessor-controlled for at least five years, the only use of more conventional computers was for controlling spectrometers connected to the microscope. The fundamental limitation of computers for scanned imaging was mostly one of speed. Spectra could be acquired and displayed in real time even by computers of early 1980’s vintage, whereas only modern computers are capable of acquiring and displaying video rat

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16

Lyman, Charles. "Eliminate Optical Microscopy." Microscopy Today 19, no. 4 (2011): 7. http://dx.doi.org/10.1017/s1551929511000575.

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This special issue of Microscopy Today is devoted to light microscopy. Light microscopy is microscopy that employs light as a medium, or so I thought. Every week I see “optical microscopy” used as a synonym for light microscopy. I cannot understand the popularity of this confusing term. For people outside our field, the term “optical microscopy” must be perplexing: does it mean electron optical or light optical? My point is that we should present the techniques we use in clear unambiguous language: light microscopy, electron microscopy, scanned probe microscopy, etc. Regardless of logic, there

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17

Fishbine, Brian H., and Robert J. Macy. "Fsem: Fast Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 606–7. http://dx.doi.org/10.1017/s0424820100181798.

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Commercially available SEM‘s offer a maximum “TV” framing rate of ∼30 Hz. We have obtained a digitally-acquired framing rate of 381 Hz with submicron resolution [1]. This is at a 25 MHz pixel rate, compared with the ≤4 MHz video bandwidth of TV-rate machines. We have also performed analog-acquired experiments at effective framing rates of 4.9 kHz and effective pixel rates of >50 MHz. Our present detection and recording system is capable of 200 MHz pixel rates, with reduced contrast range at higher rates. Extrapolating current technology suggests that GHz pixel rates with useable final image

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18

Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 6, no. 4 (2000): 291–96. http://dx.doi.org/10.1017/s1431927602000521.

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AbstractIn large bandgap semiconductors and insulators, the threshold energies for e–h pair production and ionization damage can lie above the vacuum level. For low energy imaging, a window is then opened whose width is potentially sensitive to local changes in work function, doping level, or acidity. Recent progress and future opportunities for damage-free imaging of these properties using low energy electrons are discussed in the light of the underlying physics, as well as of recent instrumental developments in low energy electron microscopy (LEEM), environmental scanning electron microscopy

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Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 6, no. 4 (2000): 291–96. http://dx.doi.org/10.1007/s100050010042.

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Abstract In large bandgap semiconductors and insulators, the threshold energies for e–h pair production and ionization damage can lie above the vacuum level. For low energy imaging, a window is then opened whose width is potentially sensitive to local changes in work function, doping level, or acidity. Recent progress and future opportunities for damage-free imaging of these properties using low energy electrons are discussed in the light of the underlying physics, as well as of recent instrumental developments in low energy electron microscopy (LEEM), environmental scanning electron microscop

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20

Julthongpiput, Duangrut, Michael J. Fasolka, and Eric J. Amis. "Gradient Reference Specimens for Advanced Scanned Probe Microscopy." Microscopy Today 12, no. 4 (2004): 48–51. http://dx.doi.org/10.1017/s1551929500054845.

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Scanned Probe Microscopy (SPM) techniques are attractive because they provide easily acquired micrographs that map specimen properties with nanometer scale resolution. SPM micrographs can be collected without the use of high vacuum (as opposed to many electron microscopies). Moreover, SPM methods allow in-situ imaging of specimens in a variety of environments, including under liquids and at higher temperatures. However, from a metrology perspective, the great promise of SPM must be balanced by the fact that SPM techniques generally provide qualitative data unless supplementary actions are take

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Richards, J. F., and R. J. Kline. "Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry." Microscopy and Microanalysis 5, S2 (1999): 956–57. http://dx.doi.org/10.1017/s1431927600018109.

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Scanning Probe Microscopy (SPM), in particular Atomic Force Microscopy (AFM), has become well establish member of the IC metrology tool arsenal which few IC manufacturers are without. Although Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) remain the “workhorse” metrology techniques, SPM (standard AFM, as well as Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM), Scanning Kelvin probe, Nanoindentaion and others) are being increasingly called upon to help solve IC production problems and to aid in research and development for n

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Russell, Phillip E., and A. D. Batchelor. "Scanned Probe Microscopy (AFM, et al.): How to Choose and Use." Microscopy and Microanalysis 4, S2 (1998): 894–95. http://dx.doi.org/10.1017/s1431927600024594.

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Virtually everyone associated with a science or engineering discipline has some baseline knowledge of optical microscopy; and most attendees at this conference have a reasonable exposure to at least some form of electron microscopy. The many developments in instrumentation and application require the modern microscopist to continuously follow the literature to stay aware of the ongoing improvements and advances in these microscopies. While electron and optical microscopes have been around for many decades, the family of microscopes known as Scanned Probe Microscopy (SPM) are just entering thei

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23

Lo, W., J. C. H. Spence, and M. Kuwabara. "Study of Tip-Surface Interactions in Scanning Tunneling Microscopy (STM) by Reflection Electron Microscopy (REM)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 320–21. http://dx.doi.org/10.1017/s0424820100180355.

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Work on the integration of STM with REM has demonstrated the usefulness of this combination. The STM has been designed to replace the side entry holder of a commercial Philips 400T TEM. It allows simultaneous REM imaging of the tip/sample region of the STM (see fig. 1). The REM technique offers nigh sensitivity to strain (<10−4) through diffraction contrast and high resolution (<lnm) along the unforeshortened direction. It is an ideal technique to use for studying tip/surface interactions in STM.The elastic strain associated with tunnelling was first imaged on cleaved, highly doped (S do

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Franceschi, J. L., R. Murillo, A. Bastié, M. Ez-Zejjari, H. El Abdary, and N. Boughanmi. "In Situ Scanning Electron Acoustic Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 408–9. http://dx.doi.org/10.1017/s0424820100180793.

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A mini scanning electron microscope, the MEBIS [1] (“Microscope Electronique à Balayage In situ”) is used to inspect “in situ” bulk specimens. The electron-optical column which has been made small and light, can be placed just over the sample. With a specially designed control circuitry, a chopped electron beam is used as a source of thermoelastic waves at the surface of specimen. The induced thermal and ultrasonic waves are used for detection and, by combining this acoustic signal with the scanned electron beam, imaging of the subsurface is possible.The accelerating potential used is 10 kV an

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Fontaine, Arthur B., Kurt Koelling, Susan Dos Passos, Jody Cearlock, Randy Hoffman, and Dimitrios G. Spigos. "Polymeric Surface Modifications of Tantalum Stents." Journal of Endovascular Therapy 3, no. 3 (1996): 276–83. http://dx.doi.org/10.1177/152660289600300306.

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Purpose: To compare two kinds of polymer-coated tantalum stents with bare tantalum stents (control) to determine if the coatings can improve thromboresistance. Methods: Twenty-seven Fontaine-Dake stents were balloon expanded in three 8-mm × 80-cm.polytetrafluoroethylene (PTFE) grafts; 9 stents were bare tantalum (T); 9 were coated with polyetherurethane (PL); and 9 were coated with parylene (PA). There were 9 stents placed in each graft as follows: 3 tantalum, 3 polyetherurethane, and 3 parylene. In swine whose platelets had been radiolabeled with indium 111, the ends of each stented graft wer

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Phillips, J. R., D. P. Griffis, and P. E. Russell. "The Nc State Analytical Instrumentation Facility." Microscopy and Microanalysis 5, S2 (1999): 10–11. http://dx.doi.org/10.1017/s1431927600013374.

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The Analytical Instrumentation Facility (AIF) is a laboratory composed of scientists and engineers specializing in the development and application of advanced techniques for materials characterization (http://spm.aif.ncsu.edu/aif/index.html)http://www.nice.org.uk/page.aspx?o=43210. AIF facilities include an extensive collection of analytical instrumentation utilized in teaching, research, and in support of academic and industrial programs. General forms of analysis include: electron, ion, and photon microscopies, surface science and analysis, and scanned probe microscopies. An abbreviated list

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Meyer, Jannik C., Jani Kotakoski, Giacomo Argentero, et al. "Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy." Microscopy and Microanalysis 21, S3 (2015): 1147–48. http://dx.doi.org/10.1017/s1431927615006522.

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Apkarian, R. P., and K. Gopalkrishnan. "Ultrastructural assessment of cryofractured primate spermatozoon by analytical scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 246–47. http://dx.doi.org/10.1017/s0424820100142852.

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A cryofracture technique for scanning electron microscopy (SEM) was developed to provide an ultrastructural assessment of large numbers of chimpanzee sperm from a single centrifuged pellet. Normal spermatozoon observed in an analytical SEM at high magnification were used to determine the suitability of this technique for preserving the ultrastructural features of many sperm fractured through different regions. Although transmission electron microscopy (TEM) provides fine ultrastructural imaging of primate spermatozoon, this imaging mode does not provide large numbers of sperm in a single sampl

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McFadyen, Ian R. "Differential phase contrast Lorentz microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 758–59. http://dx.doi.org/10.1017/s0424820100176927.

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Transmission electron microscopy can provide high spatial resolution information on domain structures in thin magnetic films provided the interaction between the electron beam and the magnetic sample is correctly utilised: As an electron beam passes through a magnetic sample it suffers a phase shift due to the magnetic induction of the sample and the associated stray fields. The derivative of this phase shift is a direct measure of the in-plane magnetic induction integrated along the electron trajectory, Therefore measurement of this phase derivative would provide the integrated in-plane induc

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Mallamaci, Michael P. "Scanned-Probe Microscopy of Elastomer Blends: Morphology and Mechanical Properties." Microscopy and Microanalysis 4, S2 (1998): 824–25. http://dx.doi.org/10.1017/s1431927600024247.

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Scanned-probe microscopy (SPM) has found application to a variety of polymer systems, primarily for the examination of surface morphology and the assessment of surface properties. In fact, SPM is unique in its ability to probe both phase morphology and mechanical properties simultaneously. The examination of industrial elastomers and their blends by SPM techniques can provide morphological information historically obtained only by transmission-electron microscopy (TEM). Since contrast with the SPM can be generated by differences in mechanical response of the constituent phases, polymer blends

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Howie, A. "Progress Towards More Realistic In-Situ Microscopy Observations." Microscopy Today 10, no. 4 (2002): 5–7. http://dx.doi.org/10.1017/s1551929500058120.

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As progress indicators in electron microscopy, advances in spatial resolution and in spectroscopy probably attract most frequent attention. Improved user-friendliness has also been significant even when judged in comparison with scanned probe microscopy. Evidence for developments in in-situ microscopy at least equally impressive can be found by comparing the relevant sections of the book by Hirsch et al. and a more recent compilation.Peter Hirsch's research group swiftly discovered the power and frustrations of in-situ microscopy. The cine film of dislocation motion observed in the earliest di

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Farley, A. N., A. Beckett, and J. S. Shah. "Comparison of Beam Damage of Hydrated Biological Specimens in High-Pressure Scanning Electron Microscopy and Low-Temperature Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 386–87. http://dx.doi.org/10.1017/s0424820100180689.

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High Pressure Scanning Electron Microscopy (HPSEM) is a technique in which biological materials are viewed close to their natural state in a saturated water vapour environment and at ambient temperatures. The absence of chemical or cryogenic fixation in this technique can offer considerable advantages in the reduction of preparative artifacts in labile specimens but it is also necessary to consider the effects of the electron beam interaction with the specimen. A comparative study has been undertaken with low temperature scanning electron microscopy (LTSEM) to evaluate the relative damage rate

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Wickramasinghe, H. K. "High resolution scanned tip microscopies." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 1002–3. http://dx.doi.org/10.1017/s0424820100107071.

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The invention of Scanning Tunneling Microscopy (STM) which won the 1986 Nobel Prize in Physics has allowed one to image atoms on the surface of a metal or semiconductor by scanning a fine tip (whose diameter is 1000 Å in a controlled fashion very close (2Å) to the sample surface.In the STM, the tip to sample distance is controlled by measuring the tunneling current -i.e. the current that flows between the tip and sample when a voltage is applied between them- (which changes very rapidly with this distance) and using piezoelectric transducers to precisely position the tip in 3-dimensional space

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GRAHAM, RION, and DONG YU. "SCANNING PHOTOCURRENT MICROSCOPY IN SEMICONDUCTOR NANOSTRUCTURES." Modern Physics Letters B 27, no. 25 (2013): 1330018. http://dx.doi.org/10.1142/s0217984913300184.

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Scanning photocurrent microscopy (SPCM) is a powerful experimental tool used to investigate spatially resolved optoelectronic properties of semiconductors and their nanostructures. Raster-scanned laser excitation generates a position-dependent photocurrent map from which carrier diffusion length, electric field distribution, doping concentration and more can be explored. In this review, we will briefly discuss the history of the technique, the theory behind locally injected carrier transport in semiconductors, the SPCM experimental setup, and recent applications of SPCM in semiconductor nanost

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Anderson, Ron. "Analytical Microscopy in the Real Semiconductor Processing World." Microscopy and Microanalysis 4, no. 5 (1998): 467–74. http://dx.doi.org/10.1017/s1431927698980436.

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In the microelectronic semiconductor world we are bombarded with reports of how the drive toward faster, denser, lower power-consuming and more reliable semiconductor products will accelerate with time. This paper discusses the instrumental evolution from visible light microscopy to scanning electron microscopy and on to transmission electron microscopy and scanned probe microscopy. The increased demands placed on specimen preparation of precise locations in a semiconductor chip for microscopy are discussed. Analytical microscopy has to be timely in order to be a viable adjunct to semiconducto

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Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demons

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Chiang, Chun Ling, C. M. Cheng, J. H. Liao, et al. "Deposition Wet-Etching Deposition (DWD) Method for Polysilicon Gate Fill-In at Flash Memory." Solid State Phenomena 187 (April 2012): 49–52. http://dx.doi.org/10.4028/www.scientific.net/ssp.187.49.

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The present study aims at polysilicon material fill-in at re-entrant profile at flash memory product. The void was observed after polysilicon fill-in. In order to prevent the void formation, the multi-step process of deposition wet-etching deposition (DWD) method was evaluated. The DWD method is found to play beneficial roles in achieving void-free in the floating gate. The high concentration of NH4OH in APM was choosing for wet etching solution. Scanned electron microscopy (SEM) and transmission electron microscopy (TEM) were employed to measure the polysilicon thickness and cross-section pro

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Clayton Teague, E. "Scanning tip microscopies: An overview and some history." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 1004–5. http://dx.doi.org/10.1017/s0424820100107083.

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The generic concept of scanned tip microscopy is much the same as the conventional scanning electron microscope. Both provide a one-to-one mapping between a point sampling of some physical property of a probe-sample surface interaction and a corresponding point in an image. Correspondence between points on the sample surface and image points is achieved by synchronizing the image generation process with probe motion. Probe motion is generally in a rastered or boustrophedon path over a selected area of the sample (Fig.1). A very lucid description of this generic microscope concept is given in a

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Mascorro, Josè A. "Utilizing Original TEM Negatives and Micrographs For Teaching in the Digital Domain." Microscopy Today 10, no. 3 (2002): 33–35. http://dx.doi.org/10.1017/s1551929500058053.

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Original transmission electron micrographs illustrating a variety of biological tissues are excellent tools that can be used in the education and examination of first year medical students. Many of these valued micrographs (and the negatives that produced them) date back to the 1960s, to the time when this researcher started a career in microscopy that continues to this day, To avoid returning to the darkroom and laborious photographic techniques, original negatives were scanned to produce micrographs for use in written or laboratory examinations or as images transported into Power Point lectu

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Natchimuthu, N. "AFM Studies on Silica Dispersion in EPDM Rubber." Rubber Chemistry and Technology 83, no. 2 (2010): 123–32. http://dx.doi.org/10.5254/1.3548270.

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Abstract EPDM rubber formulations filled with precipitated silica and cross-linked by peroxide vulcanization have been investigated with the objective of realizing better processing characteristics and vulcanizate properties. Dispersion of silica in EPDM rubber in the presence of conventional coupling agents and in the presence of an epoxy resin has been investigated using atomic force microscopy (AFM) and scanning electron microscopy (SEM). AFM results of EPDM rubber compounds containing silica fillers in the presence of the epoxy resin have exhibited improved silica dispersion in terms of sc

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Buchko, Christopher J., Margaret J. Slattery, Kenneth M. Kozloff, and David C. Martin. "Mechanical properties of biocompatible protein polymer thin films." Journal of Materials Research 15, no. 1 (2000): 231–42. http://dx.doi.org/10.1557/jmr.2000.0038.

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A silklike protein with fibronectin functionality (SLPF) (ProNectin F®, Protein Polymer Technologies, Inc.) is a genetically engineered protein polymer containing structural and biofunctional segments. The mechanical properties and deformation mechanisms of electrostatically deposited SLPF thin films were examined by scratch testing, tensile testing, and nanoindentation. Scanning electron microscopy and scanned probe microscopy revealed that the macroscopic properties were a sensitive function of microstructure. The SLPF films were relatively brittle in tension, with typical elongation-to-brea

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McMahon, Jim. "AFM Measurements of DNA Molecule Electron Transport Properties." Microscopy Today 18, no. 5 (2010): 20–23. http://dx.doi.org/10.1017/s1551929510000830.

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Deoxyribonucleic acid (DNA) has been considered as a possibility for molecular electronics. Because DNA is able to recognize other molecules—other strands of DNA—and because it binds together with similar DNA strands in a very unique way, scientists have suggested the possibility of using DNA as an electronic circuit without having to build in any other circuitry. The DNA would bind with other similar DNA strands that it recognizes and then use the connecting properties of the DNA to create a self-assembled biological wire for electrical conduction. Until recently, uncertainty existed about wh

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KLAUSER, RUTH, I. H. HONG, T. H. LEE, et al. "ZONE-PLATE-BASED SCANNING PHOTOELECTRON MICROSCOPY AT SRRC: PERFORMANCE AND APPLICATIONS." Surface Review and Letters 09, no. 01 (2002): 213–22. http://dx.doi.org/10.1142/s0218625x0200180x.

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Adapting classical spectroscopic methods to the new challenge of studying nanomaterials, imaging techniques are the trendsetter in recent years. Among them is scanning photoelectron microscopy (SPEM) with submicron spatial resolution, where the sample surface is raster-scanned by a focused soft X-ray beam, and the emitted photoelectrons are collected at each point by the input optics of an electron energy analyzer. We have constructed such a station at SRRC in Taiwan, which is now fully in operation. In this paper, we introduce the specific features of the instrument and discuss application ex

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Griffin, Brenden J. "Meeting of the Australian Microbeam Analysis Society, University of Sydney, February 16–19, 1999: Introduction." Microscopy and Microanalysis 6, no. 1 (2000): 11. http://dx.doi.org/10.1017/s1431927600010114.

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In February 1999, an international workshop on environmental scanning electron microscopy (ESEM) was held following the fifth biennial symposium of the Australian Microbeam Analysis Society (AMAS V) in Sydney, Australia. In conjunction with this meeting was the second conference of the Australian Scanned Probe Microscope Society (SPM II). The coincidence of timing allowed a strong international flavor at these sessions, which attracted 160 microscopists and microanalysts from around the world. This issue of Microscopy and Microanalysis presents a selection of full-length papers on ESEM, and th

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West, Paul E., Sid Marchesse-Rugona, and Zhuoning Li. "Fractal analysis with scanning probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1046–47. http://dx.doi.org/10.1017/s0424820100129863.

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Surface roughness determined qualitatively by direct visualization can be correlated to several physical properties. However, finding a suitable method of quantifying surface roughness, until recently, has been difficult. The concept of Fractal Dimension, recently popularized by Mandelbrot(1982) has been extremely successful in quantifying surface roughness and relating it to such measurable physical properties such as; cleanability, catalytic activity, rate of corrosion, and even flavor.Atomic Force Microscopes permit direct three dimensional measurements of surface microstructure. AFM images

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Rauch, Edgar F., Muriel Véron, Stavros Nicolopoulos, and Daniel Bultreys. "Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science." Solid State Phenomena 186 (March 2012): 13–15. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.13.

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EBSD is a well known technique that allows orientation and phase mapping using an SEM. Although the technique is very powerful, has serious limitations related with a) special resolution limited to 50 nm (SEM-FEG) and b) specimen preparation issues as is not possible to obtain EBSD signal from rough surfaces or strained materials , nanoparticles etc.. To address those difficulties , a novel technique has been developed recently (EBSD-TEM like) allowing automatic orientation and phase mapping using template matching analysis of acquired diffraction patterns in TEM. Electron beam is scanned thro

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Fan, G. Y., and M. H. Ellisman. "Current State of the Art of Digital Imaging in TEM." Microscopy and Microanalysis 3, S2 (1997): 1087–88. http://dx.doi.org/10.1017/s1431927600012320.

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The increasingly wide use of digital computers, the world-wide-web and electronic publishing has had a fundamental impact on the way scientists conduct research in every discipline of science. Electron microscopy is no exception. A considerable amount of effort has been devoted to the development of digital imaging acquisition systems for transmission electron microscopy (TEM). Digital image acquisition systems for TEM, including complete systems, have been produced by several companies, including: Advanced Microscopy Techniques (Rowley, MA), JEOL (Peabody, MA), Gatan (Warrendale, PA), Princet

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Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and oth

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COBLEY, R. J., K. S. TENG, M. R. BROWN, T. G. G. MAFFEÏS, and S. P. WILKS. "CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY OF BURIED HETEROSTRUCTURE LASERS." International Journal of Nanoscience 03, no. 04n05 (2004): 525–31. http://dx.doi.org/10.1142/s0219581x04002334.

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A single-mode buried heterostructure laser has been imaged using Cross-Sectional Scanning Tunneling Microscopy (X-STM). The problem of positioning the tip on the restricted active region on the (110) face has been overcome using combined Scanning Electron Microscopy (SEM). In order to understand the change in the STM scans when biased, particularly the physical change in surface step defects caused by commercial sample preparation, the experimental setup has been modified to allow the sample to be biased. A simpler double quantum well test structure has been biased and it has been demonstrated

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Ahmed, Hafiz, and Mohamed Benbouzid. "Gradient Estimator-Based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modeling and Tuning." Sensors 20, no. 9 (2020): 2703. http://dx.doi.org/10.3390/s20092703.

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Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing the topography of the surface. Existing approaches on this topic either have slow dynamic response e.g., lock-in-amplifier or high computational complexity e.g., Kalman filter. In this context, gradient estimator can be considered as a trade-off between fast dynamic response and high computational comple

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