Relevant bibliographies by topics / Scanning

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Scanning'

Author: Grafiati
Published: 4 June 2021
Last updated: 9 June 2025

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Journal articles on the topic "Scanning"

1

Liu, Jie, Haiyan Ou, Hua Wang, Lin Peng, and Wei Shao. "Autofocus by Lissajous scanning in time reversal optical scanning holography." Chinese Optics Letters 22, no. 8 (2024): 080501. http://dx.doi.org/10.3788/col202422.080501.

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Bin Yu, Bin Yu, Wei Jia Wei Jia, Changhe Zhou Changhe Zhou, Hongchao Cao Hongchao Cao, and Wenting Sun Wenting Sun. "Grating imaging scanning lithography." Chinese Optics Letters 11, no. 8 (2013): 080501–80503. http://dx.doi.org/10.3788/col201311.080501.

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Arkhipov, V. V. "Scanning systems of rapid-scanning Fourier spectrometers." Journal of Optical Technology 77, no. 7 (July 1, 2010): 435. http://dx.doi.org/10.1364/jot.77.000435.

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ALVARADO, S. F. "SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY." Surface Review and Letters 02, no. 05 (October 1995): 607–17. http://dx.doi.org/10.1142/s0218625x95000571.

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Bulgaru, Marius, Vlad Bocăneț, and Mircea Muntean. "Research regarding tactile scanning versus optical scanning." MATEC Web of Conferences 299 (2019): 04013. http://dx.doi.org/10.1051/matecconf/201929904013.

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In today’s fast-moving world, the manufacturing industry must keep up with evolving trends. One such trend that has greatly impacted the manufacturing industry is called Industry 4.0 and is regarded as the fourth industrial revolution. In this revolution one important aspect is that of quality. This paper makes a comparative study between tactile and optical measuring machines in the context of Industry 4.0. As the manufacturing industry must be more flexible and solve problems in a timelier manner, it is important to identify the right technologies appropriate for quality control.
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Hamilton, D. K., and T. Wilson. "Scanning optical microscopy by objective lens scanning." Journal of Physics E: Scientific Instruments 19, no. 1 (January 1986): 52–54. http://dx.doi.org/10.1088/0022-3735/19/1/009.

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Mody, Cyrus C. M. "STARS: Scanning Probe Microscopy [Scanning Our Past]." Proceedings of the IEEE 102, no. 7 (July 2014): 1107–12. http://dx.doi.org/10.1109/jproc.2014.2326811.

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Gareau, Daniel S., James G. Krueger, Jason E. Hawkes, Samantha R. Lish, Michael P. Dietz, Alba Guembe Mülberger, Euphemia W. Mu, et al. "Line scanning, stage scanning confocal microscope (LSSSCM)." Biomedical Optics Express 8, no. 8 (July 24, 2017): 3807. http://dx.doi.org/10.1364/boe.8.003807.

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Hsiao, Gregor, and Jezz Leckenby. "Correcting Scanning Errors in Scanning Probe Microscopes." Microscopy Today 7, no. 7 (September 1999): 10–13. http://dx.doi.org/10.1017/s1551929500064737.

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Scanning probe microscopes (SPMs) are a family of instruments used for studying the surface properties of materials on a dimensional scale ranging from the atomic to the micrometer level. As depicted in Figure 1, all SPMs work by scanning a finely tipped probe in a raster pattern over the sample surface while measuring and mapping some interaction between the probe and the surface as a function of x-y position. The piezoelectric scanners used to provide the scanning motion offer very fine positional control but have certain inherent errors that, uncorrected, can distort images, introduce artifacts, and degrade measurement accuracy.
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Fu, J., R. D. Young, and T. V. Vorburger. "Long‐range scanning for scanning tunneling microscopy." Review of Scientific Instruments 63, no. 4 (April 1992): 2200–2205. http://dx.doi.org/10.1063/1.1143139.

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Dissertations / Theses on the topic "Scanning"

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Svahn, Stefan. "3D-scanning : Volymberäkning vid scanning av bergvägg." Thesis, Karlstads universitet, Institutionen för geografi, medier och kommunikation, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-33349.

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Scanning är ett verktyg som har utvecklats mycket och används mer och mer inom geodetisk mätning. Instrumenten har blivit mer pålitliga med högre kvalité på resultaten, därför är det viktigt att eliminera de problem som kan skada scanningens pålitlighet. Det problemet som ska undersökas och testas i det här examensarbetet uppstår när man till exempel scannar en bergvägg. Man vill få en så lik avbildning av bergväggen som möjligt för att sedan kunna göra volymberäkningar emot bergväggen. Avbildningen av bergväggen består av ett moln av punkter som tillsammans skapar en 3D-modell av bergväggen.   Om det ska fyllas med betong emot bergväggen så måste man veta vilken volym betong det kommer gå åt, därför är det viktigt att modellen av bergväggen stämmer. Problemet är att modellen kan visa sig att vara fel beroende på hur man har scannat. Det är när bergväggen är så pass ojämn och att man inte kan scanna från alla vinklar som det uppstår så kallade skuggor i modellen, en hålighet i berget kan då i modellen istället vara fylld. Detta gör att det går åt mer volym när man ska fylla igen vilket kan bli dyrt för alla inblandade.   För att testa detta ska flera olika metoder testas under arbetet, olika typer av instrument, täthet mellan punkter, olika infallsvinklar och manuell scanning. Det som är intressant att se är hur pass mycket metoderna skiljer sig mellan varandra och genom att jämföra dessa så kan man få fram ett resultat som visar vilken metod som är mest trovärdig.   Arbetets resultat och analys finns att läsa senare i den här rapporten där man också får svar hur arbetet genomfördes och hur metoderna skilde sig emot varnadra.
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Raspin, P. "Scanning business environments : an investigation into managerial scanning behaviour." Thesis, Cranfield University, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.401662.

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Niblock, Trevor. "Micro scanning probes." Thesis, University of Southampton, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.395357.

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Leane, Robert B. "Scanning tunnelling microscopy." Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291716.

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Hyde, Neville. "Environmental scanning : the need for and overview of environmental scanning system." Thesis, Stellenbosch : University of Stellenbosch, 2000. http://hdl.handle.net/10019.1/4595.

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Thesis (MBA (Business Management))--University of Stellenbosch, 2000.<br>ENGLISH ABSTRACT: Historically organisations have had the "luxury" of being able to anticipate future developments and respond to them in good time due to, firstly, the comparatively slow pace of change and, secondly, the past being a relatively good predictor of the future. The second half of the 20th Century bears witness to some of the most dramatic changes and developments experienced by mankind. Most notable of these were globalisation, de-regulation, the emergence of the information/knowledge economy and, perhaps most significant of all, the changes brought about by the Internet. The underlying assertion of this report is that, given the current, complex, dynamic and sometimes volatile nature of changes in the external environment, in order to ensure a sustainable competitive advantage, organisations will be forced to consider carefully the dynamics of the environment in which they operate and to build their plans around these dynamics. This report briefly traces the evolution of strategic planning to its current status prior to providing a detailed analysis of the nature of environmental scanning and its applicability to strategic planning. The report provides a theoretical rerview of environmental scanning and a discussion of some of the tools and techniques of environmental scanning. Within this context the report provides a brief indication of the extent of the practice of environmental scanning within the financial services sector of South Africa. The conclusion assesses the findings of the current state of the practice of environmental scanning against the theory, with the view to providing an insight into the extent to which environmental scanning is applied in South Africa. Possible future directions of research and development of the practice are also identified.<br>AFRIKAANSE OPSOMMING: Histories gesproke, het instansies oor die "luukse" beskik om toekomstige ontwikkelinge vooruit te kon waarneem en betyds op hulle te reageer, eerstens weens die betreklike stadige pas van verandering en tweedens, omdat die verlede 'n betreklike goeie voorspeller van die toekoms was. Die tweede helfte van die 20ste eeu getuig van sommige van die mees dramatiese veranderinge en ontwikkelinge wat deur die mens ondervind is. Die mees uitstaande was globalisering, deregulering, die verskyning van die inligting/kennis-ekonomie en, dalk die mees uitstaande van almal, die veranderinge wat deur die Internet teweeggebring is. Die onderliggende stelling van hierdie verslag is dat, gegewe die huidige, komplekse, dinamiese en soms onbestendige aard van veranderinge in die eksterne omgewing, om 'n mededingende voordeel te verseker, sal instansies geforseer word om die dinamika van die omgewing waarin hulle werk, versigtig te oorweeg en om hulle planne om hierdie dinamika te bou. Hierdie verslag speur kortliks die ewolusie na van strategiese beplanning tot sy huidige status gevolg deur 'n omvattende analise van die aard van omgewingsondersoeke en die toepaslikheid daarvan op strategiese beplanning. Die verslag voorsien 'n teoretiese oorsig tot omgewingsondersoeke en 'n bespreking van sommige van die instrumente en tegnieke van omgewingsondersoeke. Binne hierdie konteks voorsien die verslag 'n kort aanduiding van die omvang van die uitvoering van omgewingsondersoeke binne die finansiele dienstesektor van Suid-Afrika. Die slot som die bevindings op van die huidige toestand van die praktyk van omgewingsondersoeke volgens die teorie, met die oog op voorsiening van 'n insig in die mate waartoe omgewingsondersoeke in Suid-Afrika toegepas word. Moontlike toekomstige rigtings van navorsing en ontwikkeling van die praktyk word ook geidentifiseer.
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Hyde, Neville, and Johan Burger. "Environmental scanning : the need for and overview of environmental scanning systems." Thesis, Stellenbosch : University of Stellenbosch, 2000. http://hdl.handle.net/10019.1/4656.

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ENGLISH ABSTRACT: Historically organisations have had the "luxury" of being able to anticipate future developments and respond to them in good time due to, firstly, the comparatively slow pace of change and, secondly, the past being a relatively good predictor of the future. The second half of the 20th Century bears witness to some of the most dramatic changes and developments experienced by mankind. Most notable of these were globalisation,de-regulation, the emergence of the information/knowledge economy and, perhaps most significant of all, the changes brought about by the Internet. The underlying assertion of this report is that, given the current, complex, dynamic and sometimes volatile nature of changes in the external environment, in order to ensure a sustainable competitive advantage, organisations will be forced to consider carefully the dynamics of the environment in which they operate and to build their plans around these dynamics. This report briefly traces the evolution of strategic planning to its current status prior to providing a detailed analysis of the nature of environmental scanning and its applicability to strategic planning. The report provides a theoretical overview Qf environmental scanning and a discussion of some of the tools and techniques of environmental scanning. Within this context the report provides a brief indication of the extent of the practice of environmental scanning within the financial services sector of South Africa. The conclusion assesses the findings of the current state of the practice of environmental scanning against the theory, with the view to providing an insight into the extent to which environmental scanning is applied in South Africa Possible future directions of research and development of the practice are also identified.<br>AFRIKAANSE OPSOMMING: Histories gesproke, het instansies oor die "luukse" beskik om toekomstige ontwikkelinge vooruit te kon waarneem en betyds op hulle te reageer, eerstens weens die betreklike stadige pas van verandering en tweedens, omdat die verlede 'n betreklike goeie voorspeller van die toekoms was. Die tweede helfte van die 20ste eeu getuig van sommige van die mees dramatiese veranderinge en ontwikkelinge wat deur die mens ondervind is. Die mees uitstaande was globalisering, deregulering, die verskyning van die inligting/kennis-ekonomie en, dalk die mees uitstaande van almal, die veranderinge wat deur die Internet teweeggebring is. Die onderliggende stelling van hierdie verslag is dat, gegewe die huidige, komplekse,dinamiese en soms onbestendige aard van veranderinge in die eksterne omgewing, om 'n mededingende voordeel te verseker, sal instansies geforseer word om die dinamika van die omgewing waarin hulle werk, versigtig te oorweeg en om hulle planne om hierdie dinamika te bou. Hierdie verslag speur kortliks die ewolusie na van strategiese beplanning tot sy huidige status gevolg deur 'n omvattende analise van die aard van omgewingsondersoeke en die toepaslikheid daarvan op strategiese beplanning. Die verslag voorsien 'n teoretiese oorsig tot omgewingsondersoeke en 'n bespreking van sommige van die instrurnente en tegnieke van omgewingsondersoeke. Binne hierdie konteks voorsien die verslag 'n kort aanduiding van die omvang van die uitvoering van omgewingsondersoeke binne die finansiele dienstesektor van Suid-Afrika. Die slot som die bevindings op van die huidige toestand van die praktyk van omgewingsondersoeke volgens die teorie, met die oog op voorsiening van 'n insig in die mate waartoe omgewingsondersoeke in Suid-Afrika toegepas word. Moontlike toekomstige rigtings van navorsing en ontwikkeling van die praktyk word ook geidentifiseer.
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Weise, Thibaut. "Real-time 3D scanning." Konstanz Hartung-Gorre, 2009. http://d-nb.info/1000182894/04.

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Almqvist, Nils. "Scanning probe microscopy : Applications." Licentiate thesis, Luleå tekniska universitet, Materialvetenskap, 1994. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-17980.

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Donnermeyer, Achim. "Scanning ion-conductance microscopy." [S.l.] : [s.n.], 2007. http://nbn-resolving.de/urn/resolver.pl?urn=urn:nbn:de:hbz:361-11593.

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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Books on the topic "Scanning"

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Ponzio, Nicola. Scanning. Mantova: Corraini edizioni, 2014.

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Kassing, Rainer, ed. Scanning Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0.

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F, Marshall Gerald, ed. Optical scanning. New York: Marcel Dekker, Inc., 1991.

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International, Scanning Microscopy. Scanning microscopy. Chicago: Scanning Microscopy International, 1987.

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Beiser, Leo. Holographic scanning. New York: Wiley, 1988.

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Tally, Taz. Avoiding the scanning blues: A desktop scanning primer. Upper Saddle River, NJ: Prentice Hall PTR, 2001.

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Marshall, Gerald, ed. Laser Beam Scanning. Taylor & Francis Group, 6000 Broken Sound Parkway NW, Suite 300, Boca Raton, FL 33487-2742: CRC Press, 2017. http://dx.doi.org/10.4324/9780203749142.

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Meyer, Ernst, Roland Bennewitz, and Hans J. Hug. Scanning Probe Microscopy. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-37089-3.

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Reimer, Ludwig. Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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Neddermeyer, H., ed. Scanning Tunneling Microscopy. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.

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Book chapters on the topic "Scanning"

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Rey, Enno, Michael Thumann, and Dominick Baier. "Scanning." In Mehr IT-Sicherheit durch Pen-Tests, 25–37. Wiesbaden: Vieweg+Teubner Verlag, 2005. http://dx.doi.org/10.1007/978-3-322-80257-6_5.

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Bishop, Peter C., and Andy Hines. "Scanning." In Teaching about the Future, 176–93. London: Palgrave Macmillan UK, 2012. http://dx.doi.org/10.1057/9781137020703_7.

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Weik, Martin H. "scanning." In Computer Science and Communications Dictionary, 1519. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_16636.

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Martin, Yves. "Performance and selection criteria of critical components of STM and AFM." In Scanning Microscopy, 1–10. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_1.

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Briggs, G. A. D., R. Gundle, C. W. Lawrence, A. Rodriguez-Rey, and C. B. Scruby. "Acoustic Microscopy: Pictures to Ponder." In Scanning Microscopy, 153–66. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_10.

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Sure, T. "Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution." In Scanning Microscopy, 167–85. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_11.

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Pohl, D. W. "On the Search for Last Frontiers Scanning Tunneling Microscopy and Related Techniques (Abstract)." In Scanning Microscopy, 186. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_12.

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Wickramasinghe, H. K. "STM and AFM extensions (Abstract)." In Scanning Microscopy, 187. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_13.

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Kassing, Rainer. "Investigations on the SFM." In Scanning Microscopy, 11–31. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_2.

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Möller, R. "New Scanning Microscopy Techniques: Scanning Noise Microscopy Scanning Tunneling Microscopy Assisted by Surface Plasmons." In Scanning Microscopy, 32–48. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_3.

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Conference papers on the topic "Scanning"

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Chiu, Ming-Hung, Chin-Fa Lai, Chen-Tai Tan, and Yi-Zhi Lin. "Transmission-type angle deviation microscope with NA=0.65 for 3D measurement." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.850984.

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SPIE, Proceedings of. "Front Matter: Volume 7378." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.835753.

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Schwoeble, A. J., Brian R. Strohmeier, and John D. Piasecki. "The influence of surface chemistry on GSR particles: using XPS to complement SEM/EDS analytical techniques." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.863906.

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Leroy, E., S. Mamedov, E. Teboul, A. Whitley, D. Meyer, and L. Casson. "Complementing and adding to SEM performance with the addition of XRF, Raman, CL and PL spectroscopy and imaging." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.864236.

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Campo, E. M., A. Meléndez, K. Morales, J. Poplawsky, J. J. Santiago-Avilés, and I. Ramos. "Electron microscopy and cathodoluminescence in electrospun nanodimensional structures: challenges and opportunities." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.866761.

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Campo, E. M., H. Campanella, Y. Y. Huang, K. Zinoviev, N. Torras, C. Tamargo, D. Yates, L. Rotkina, J. Esteve, and E. M. Terentjev. "Electron microscopy of polymer-carbon nanotubes composites." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.867718.

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Pfeiffer, Hans C. "New prospects for electron beams as tools for semiconductor lithography." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822771.

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De, Arijit K., and Debabrata Goswami. "Three-dimensional image formation under single-photon ultra-short pulsed illumination." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822773.

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Cizmar, Petr, András E. Vladár, and Michael T. Postek. "Optimization of accurate SEM imaging by use of artificial images." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.823415.

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Haegel, Nancy M., Chun-Hong Low, Lee Baird, and Goon-Hwee Ang. "Transport imaging with near-field scanning optical microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824114.

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Reports on the topic "Scanning"

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Dow, John D. Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1992. http://dx.doi.org/10.21236/ada249262.

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Marangoni, Alejandro G., and M. Fernanda Peyronel. Differential Scanning Calorimetry. AOCS, April 2014. http://dx.doi.org/10.21748/lipidlibrary.40884.

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Melloch, Michael R. Scanning Probe Microscope. Fort Belvoir, VA: Defense Technical Information Center, March 2001. http://dx.doi.org/10.21236/ada388569.

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Swartzentruber, B. S., A. M. Bouchard, and G. C. Osbourn. Adaptive scanning probe microscopies. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/446386.

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Taylor, A. J., G. P. Donati, G. Rodriguez, T. R. Gosnell, S. A. Trugman, and D. I. Some. Femtosecond scanning tunneling microscope. Office of Scientific and Technical Information (OSTI), November 1998. http://dx.doi.org/10.2172/672306.

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Webber, Nels W. LANL Robotic Vessel Scanning. Office of Scientific and Technical Information (OSTI), November 2015. http://dx.doi.org/10.2172/1227254.

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Leckey, J. H., and M. D. Boeckmann. Rapid scanning mass spectrometer. Office of Scientific and Technical Information (OSTI), November 1996. http://dx.doi.org/10.2172/459358.

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Gharavi, Hamid, K. Venkatesh Prasad, and Petros Ioannou. Scanning advanced automobile technology. Gaithersburg, MD: National Institute of Standards and Technology, 2007. http://dx.doi.org/10.6028/nist.ir.7421.

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Crooks, R. M., T. S. Corbitt, C. B. Ross, M. J. Hampden-Smith, and J. K. Schoer. Scanning Probe Surface Modification. Fort Belvoir, VA: Defense Technical Information Center, November 1993. http://dx.doi.org/10.21236/ada273178.

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Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/270266.

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