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Books on the topic 'Scanning electron microscoppy'

Author: Grafiati

Published: 2 June 2025

Last updated: 31 July 2025

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1

Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

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2

Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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3

Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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4

Shimizu, Kenichi. New horizons of applied scanning electron microscopy. Springer-Verlag, 2010.

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5

J, Schwartz Adam, Kumar Mukul, and Adams B. L, eds. Electron backscatter diffraction in materials science. Kluwer Academic, 2000.

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6

Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Published on behalf of ACOL by Wiley, 1987.

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7

Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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8

M, Prutton, and El Gomati Mohamed M, eds. Scanning Auger electron microscopy. Wiley, 2006.

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9

Chescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford University Press, 1990.

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10

1963-, Zhang Xiao-Feng, and Zhang Ze 1953-, eds. Progress in transmission electron microscopy. Springer, 2001.

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11

International, Scanning Microscopy. Scanning microscopy. Scanning Microscopy International, 1987.

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12

1948-, Gai Pratibha L., ed. In-situ microscopy in materials research: Leading international research in electron and scanning probe microscopies. Kluwer Academic Publishers, 1997.

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13

G, Rickerby David, Valdrè Giovanni, and Valdrè U, eds. Impact of electron and scanning probe microscopy on materials research. Kluwer Academic Publishers, 1999.

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14

E, Newbury Dale, ed. Advanced scanning electron microscopy and X-ray microanalysis. Plenum Press, 1986.

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15

Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

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16

L, Olsen Sandra, ed. Scanning electron microscopy in archaeology. B.A.R., 1988.

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17

European Congress on Optics (1st 1988 Hamburg, Germany). Scanning imaging: ECO1, 21-23 September 1988, Hamburg, Federal Republic of Germany. Edited by Wilson Tony, Association nationale de la recherche technique., European Federation for Applied Optics., European Physical Society, Society of Photo-optical Instrumentation Engineers., and International Congress on Optical Science and Engineering (1988 : Hamburg, Germany). SPIE--The International Society for Optical Engineering, 1989.

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18

Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer Science+Business Media, LLC, 2011.

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19

J, Colton Richard, ed. Procedures in scanning probe microscopies. Wiley, 1998.

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20

Othmar, Marti, Möller Rolf, North Atlantic Treaty Organization. Scientific Affairs Division., and NATO Advanced Research Workshop on Photons and Local Probes (1994 : Reichenau, Baden-Württemberg, Germany), eds. Photons and local probes. Kluwer Academic Pub., 1995.

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21

Schatten, Heide. Scanning electron microscopy for the life sciences. Cambridge University Press, 2012.

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22

Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, et al. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1.

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23

E, Reuss Laura, ed. Biological electron microscopy: Theory, techniques, and troubleshooting. 2nd ed. Kluwer Academic/Plenum Publishers, 2003.

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24

J, Keyse Robert, and Royal Microscopial Society, eds. Introduction to scanning transmission electron microscopy. Bio scientific/Springer, 1998.

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25

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. Kluwer Academic / Plenum Publishers, 2003.

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26

Schatten, Heide, and James B. Pawley, eds. Biological Low-Voltage Scanning Electron Microscopy. Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-72972-5.

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27

Castejón, Orlando J. Scanning Electron Microscopy of Cerebellar Cortex. Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0159-6.

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28

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.

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29

J, Keyse Robert, and Royal Microscopical Society (Great Britain), eds. Introduction to scanning transmission electron microscopy. BIOS Scientific Publishers, 1998.

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30

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. Kluwer Academic / Plenum Publishers, 2004.

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31

Lothar, Engel, ed. Scanning electron microscopy of plastics failure. Hanser Publishers, 2010.

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32

Johari, Om. Scanning electron microscopy/1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Levenson L. L, Roomans Godfried M, and Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1986.

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33

Roomans, G. M., R. P. Becker, and L. L. Levenson. Scanning electron microscopy / 1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1986.

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34

Roomans, Godfried M. Scanning electron microscopy, 1985: An international journal of scanning electron microscopy, related techniques, and applications. Scanning Electron Microscopy, 1985.

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35

Johari, Om. Scanning electron microscopy/1985: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Roomans Godfried M, Levenson L. L, and Scanning Electron Microscopy Inc. Scanning Electron Microscopy, 1985.

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36

J, Bard Allen, and Mirkin Michael V. 1961-, eds. Scanning electrochemical microscopy. Marcel Dekker, 2001.

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37

D, Claugher, and Systematics Association, eds. Scanning electron microscopy in taxonomy and functional morphology. Published for the Systematics Association by Clarendon Press, 1990.

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38

Kassing, R. Scanning Microscopy: Symposium Proceedings. Springer Berlin Heidelberg, 1992.

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39

Vaughan, David. 2. Studying minerals. Oxford University Press, 2014. http://dx.doi.org/10.1093/actrade/9780199682843.003.0002.

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The study of minerals begins with their characterization, identification, and classification determined from their chemical compositions and crystallographic properties. ‘Studying minerals’ shows that historically this was based on properties observable in hand specimens, but the development of wide-ranging techniques has allowed the study of all aspects of minerals: their structures, chemistries, surface chemistries, and reactivities. Techniques described include transmitted light and reflected light microscopy using thin and polished sections; X-ray crystallography based on Bragg’s Law; tech

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40

Reimer, Ludwig. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences). Springer, 1986.

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41

Kazmiruk, Viacheslav, ed. Scanning Electron Microscopy. InTech, 2012. http://dx.doi.org/10.5772/1973.

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42

Scanning Electron Microscopy. NY RESEARCH PRESS, 2015.

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43

Shimizu, Kenichi, and Tomoaki Mitani. New Horizons of Applied Scanning Electron Microscopy. Springer, 2010.

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44

Shimizu, Kenichi, and Tomoaki Mitani. New Horizons of Applied Scanning Electron Microscopy. Springer, 2012.

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45

Dykstra, Michael J., and Laura E. Reuss. Biological Electron Microscopy: Theory, Techniques, and Troubleshooting. Springer London, Limited, 2011.

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46

Dykstra, Michael J. Biological Electron Microscopy: Theory, Techniques, and Troubleshooting. Springer London, Limited, 2012.

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47

Schwartz, Adam J. Electron Backscatter Diffraction in Materials Science. Springer, 2014.

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48

Pennycook, S. J., M. Varela, M. F. Chisholm, et al. Scanning transmission electron microscopy of nanostructures. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.6.

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This article investigates nanostructures by means of scanning transmission electron microscopy. The electron microscope is uniquely suited to the study of individual nanostructures, allowing differentiation of different structures and properties that is difficult or impossible to do with techniques that provide a spatial average. The present generation of aberration correctors, which correct all aberrations up to third order, makes it possible to obtain sufficient sensitivity to image and spectroscopically analyze single atoms. This article begins with a brief overview of the correction of len

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49

Prutton, Martin, and Mohamed M. El Gomati, eds. Scanning Auger Electron Microscopy. Wiley, 2005. http://dx.doi.org/10.1002/9780470866795.

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50

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2006.

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