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Relevant bibliographies by topics / Scanning electron microscopy

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Academic literature on the topic 'Scanning electron microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 12 April 2025

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Journal articles on the topic "Scanning electron microscopy"

1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.

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Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (August 1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Dyukov, V. G. "Scanning electron microscopy." Uspekhi Fizicheskih Nauk 152, no. 6 (1987): 357. http://dx.doi.org/10.3367/ufnr.0152.198706q.0357.

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Nada, Majid Hameed. "Scanning Electron Microscopy." BAOJ Microbiology 1, no. 1 (July 13, 2015): 1–8. http://dx.doi.org/10.24947/baojm/1/1/00105.

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Dinnis, A. R. "Scanning Electron Microscopy." Optica Acta: International Journal of Optics 33, no. 10 (October 1986): 1228–29. http://dx.doi.org/10.1080/713821871.

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Dyukov, V. G. "Scanning electron microscopy." Soviet Physics Uspekhi 30, no. 6 (June 30, 1987): 552. http://dx.doi.org/10.1070/pu1987v030n06abeh002866.

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Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (January 16, 1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.

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Sujata, K., and Hamlin M. Jennings. "Advances in Scanning Electron Microscopy." MRS Bulletin 16, no. 3 (March 1991): 41–45. http://dx.doi.org/10.1557/s0883769400057390.

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Scanning electron microscopes offer several unique advantages and they have evolved into complex integrated instruments that often incorporate several important accessories. Their principle advantage stems from the method of constructing an image from a highly focused electron beam that scans across the surface of a specimen. The beam generates backscattered electrons and excites secondary electrons and x-rays in a highly localized “spot.” These signals can be detected, and the results of the analysis are displayed as a specific intensity on a screen at a position that represents the position of the electron spot. As with a television image, after a given period, information about the entire field of view is displayed on the screen, resulting in a complete image. If the specimen is thin, the same type of information can be gathered from the transmitted electrons, and a scanning transmission image is thus constructed.The scanning electron microscope is highly versatile and widely used. The quality of the image is related to its resolution and contrast, which, in turn, depend on the diameter of the focused beam as well as its energy and current. Because electron lenses have inherently high aberrations, the usable aperture angles are much smaller than in a light microscope and, therefore, the electron beam remains focused over a relatively large distance, giving these instruments a very large depth of focus.Scanning electron microscopes are versatile in their ability to detect and analyze a lot of information. As a result, modern versions of these instruments are equipped with a number of detectors. Developments are sometimes related to placing the detectors in a geometrically attractive position close to the specimen.

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Frank, L., Š. Mikmeková, Z. Pokorná, and I. Müllerová. "Scanning Electron Microscopy With Slow Electrons." Microscopy and Microanalysis 19, S2 (August 2013): 372–73. http://dx.doi.org/10.1017/s1431927613003851.

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Dissertations / Theses on the topic "Scanning electron microscopy"

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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Harland, C. J. "Detector and electronic developments for scanning electron microscopy." Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.

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Snella, Michael T. "Drift correction for scanning-electron microscopy." Thesis, Massachusetts Institute of Technology, 2010. http://hdl.handle.net/1721.1/62605.

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Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Cataloged from student submitted PDF version of thesis.
Includes bibliographical references (p. 91-92).
Scanning electron micrographs at high magnification (100,000x and up) are distorted by motion of the sample during image acquisition, a phenomenon called drift. We propose a method for correcting drift distortion in images obtained on scanning electron and other scanned-beam microscopes by registering a series of images to create a drift-free composite. We develop a drift-distortion model for linear drift and use it as a basis for an affine correction between images in the sequence. The performance of our correction method is evaluated with simulated datasets and real datasets taken on both scanning electron and scanning helium-ion microscopes; we compare performance against translation only correction. In simulation, we exhibit a 12.5 dB improvement in SNR of our drift-corrected composite compared to a non-aligned composite, and a 3 dB improvement over translation correction. A more modest 0.4 dB improvement is measured on the real image sets compared to translation correction alone.
by Michael T. Snella.
M.Eng.

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McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

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Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI, Ca XVIII, Ti XX, Cr XXII, Fe XXIV and Ni XXVI. Including relativistic effects in the calculations leads to the generation of 24 fine-structure energy levels when orbitals with 11,/ =:; 5 are considered. Oscillator strengths, were generated for all 276 transitions arising amongst these levels when maintaining a frozen core of Is2 Ã‚Â• Comparisons were made with both theoretical and experimental data available from the publications of Nahar & Pradhan (1999), Nahar (2002), Whiteford et al (2002) and Del Zanna (2006), along with NIST data. Collisional calculations were performed for Fe XXIV, an abundant ion in solar and fusion plasmas, which has the potential to be employed in photo-pumping schemes for X-ray lasers. The calculations were performed using the Dirac Atomic Relativistic Code (DARC; Ait-Tahar, Grant & Norrington 1996), which is a fully relativistic code based on R-matrix theory. In addition to carrying out these calculations, DARC was further developed to provide a solution to the problem of convergence which affects optically allowed transitions in the above threshold energy region. Comparison of these results was made with data already available in the literature, with discrepancies being highlighted and discussed. The work of Berrington & Tully (1997) did not include the n=5 orbital, and comparisons with the results presented here showed how important these are for low temperatures. Discrepancies between this work and that of Whiteford et al (2002) were also identified. Despite being given access to their unpublished data, the source of the identified discrepancies remains elusive. The problems identified require further investigation which lies beyond the scope and resources of the present work.

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.

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Nellist, Peter David. "Image resolution improvement in scanning transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361613.

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Stevens, Sam. "Understanding Porous Crystal Growth By Scanning Electron Microscopy." Thesis, University of Manchester, 2010. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.532223.

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Ramasse, Quentin Mathieu. "Diagnosis of aberrations in scanning transmission electron microscopy." Thesis, University of Cambridge, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615070.

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Waller, Deborah. "Environmental scanning electron microscopy of freezing aqueous solutions." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613409.

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Books on the topic "Scanning electron microscopy"

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Reimer, Ludwig. Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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Reimer, Ludwig. Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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M, Prutton, and El Gomati Mohamed M, eds. Scanning Auger electron microscopy. Hoboken, NJ: Wiley, 2006.

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International, Scanning Microscopy. Scanning microscopy. Chicago: Scanning Microscopy International, 1987.

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Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998.

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Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

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L, Olsen Sandra, ed. Scanning electron microscopy in archaeology. Oxford, England: B.A.R., 1988.

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Shimizu, Kenichi. New horizons of applied scanning electron microscopy. Heidelberg: Springer-Verlag, 2010.

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10

Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Chichester: Published on behalf of ACOL by Wiley, 1987.

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Book chapters on the topic "Scanning electron microscopy"

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Reimer, Ludwig. "Electron Optics of a Scanning Electron Microscope." In Scanning Electron Microscopy, 13–56. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.

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Baumeister, Martin, and Thomas Kohnen. "Scanning Electron Microscopy." In Encyclopedia of Ophthalmology, 1–2. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35951-4_420-3.

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Zhu, Yimei, and Hiromi Inada. "Scanning Electron Microscopy." In Encyclopedia of Nanotechnology, 1–10. Dordrecht: Springer Netherlands, 2015. http://dx.doi.org/10.1007/978-94-007-6178-0_110-2.

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Montaña, Ana Vicente, Alfredo Fernández Larios, and Alfonso Rodríguez Muñoz. "Scanning Electron Microscopy." In Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine, 905–14. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-09522-6_49.

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Han, Wei, Huisheng Jiao, and Daniel Fox. "Scanning Electron Microscopy." In Springer Tracts in Modern Physics, 35–68. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-0454-5_2.

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Erdman, Natasha, David C. Bell, and Rudolf Reichelt. "Scanning Electron Microscopy." In Springer Handbook of Microscopy, 229–318. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-00069-1_5.

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Zhu, Yimei, and Hiromi Inada. "Scanning Electron Microscopy." In Encyclopedia of Nanotechnology, 3499–507. Dordrecht: Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_110.

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Okano, Yasuyuki. "Scanning Electron Microscopy." In Compendium of Surface and Interface Analysis, 563–69. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_91.

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Wang, Yi, and Vania Petrova. "Scanning Electron Microscopy." In Nanotechnology Research Methods for Foods and Bioproducts, 103–26. Oxford, UK: Wiley-Blackwell, 2012. http://dx.doi.org/10.1002/9781118229347.ch6.

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Baumeister, Martin, and Thomas Kohnen. "Scanning Electron Microscopy." In Encyclopedia of Ophthalmology, 1581–82. Berlin, Heidelberg: Springer Berlin Heidelberg, 2018. http://dx.doi.org/10.1007/978-3-540-69000-9_420.

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Conference papers on the topic "Scanning electron microscopy"

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Stegmann, Heiko. "Basics and Current Aspects of Scanning Electron Microscopy." In ISTFA 2024, p1—p72. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024tpp1.

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Monasterios, Guillermo, Martin Musumano, Jorge Campbell, and Maria Soledad Pereda. "Scanning Electron Microscopy Applied to RF Primary Reference Standards." In 2024 IEEE Biennial Congress of Argentina (ARGENCON), 1–6. IEEE, 2024. http://dx.doi.org/10.1109/argencon62399.2024.10735857.

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Galand, R., L. Clément, P. Waltz, and Y. Wouters. "Microstructure and texture analysis of advanced copper using electron backscattered diffraction and scanning transmission electron microscopy." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.852908.

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Campo, E. M., H. Campanella, Y. Y. Huang, K. Zinoviev, N. Torras, C. Tamargo, D. Yates, L. Rotkina, J. Esteve, and E. M. Terentjev. "Electron microscopy of polymer-carbon nanotubes composites." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.867718.

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Young, Richard, Sander Henstra, Jarda Chmelik, Trevor Dingle, Albert Mangnus, Gerard van Veen, and Ingo Gestmann. "XHR SEM: enabling extreme high resolution scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824749.

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Babin, S., S. Borisov, and A. Ivanchikov. "Modeling of charge and discharge in scanning electron microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.828575.

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Pfeiffer, Hans C. "New prospects for electron beams as tools for semiconductor lithography." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822771.

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Ghosh, Nabarun, Amiyanghshu Chatterjee, and Don W. Smith. "Scanning electron microscopy in characterizing seeds of some leguminous trees." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821814.

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Roussel, Laurent Y., Debbie J. Stokes, Ingo Gestmann, Mark Darus, and Richard J. Young. "Extreme high resolution scanning electron microscopy (XHR SEM) and beyond." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821826.

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Postek, Michael T., András E. Vladár, William Keery, Michael Bishop, Benjamin Bunday, and John Allgair. "NEW scanning electron microscope magnification calibration reference material (RM) 8820." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.859118.

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Reports on the topic "Scanning electron microscopy"

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Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Fort Belvoir, VA: Defense Technical Information Center, June 2006. http://dx.doi.org/10.21236/ada455461.

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Sickafus, Kurt. History of Scanning Electron Microscopy (SEM). Office of Scientific and Technical Information (OSTI), June 2024. http://dx.doi.org/10.2172/2372668.

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), June 2008. http://dx.doi.org/10.2172/939888.

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Bertness, K. A. Dimensional measurement of nanostructures with scanning electron microscopy. Gaithersburg, MD: National Institute of Standards and Technology, September 2017. http://dx.doi.org/10.6028/nist.sp.250-96.

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Nakakura, Craig Y., and Kimberlee Chiyoko Celio. Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM). Office of Scientific and Technical Information (OSTI), September 2019. http://dx.doi.org/10.2172/1564040.

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Mikula, R. J. Application of scanning electron microscopy to tar sands emulsions. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1986. http://dx.doi.org/10.4095/304896.

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Stutzman, Paul E. Serial sectioning of hardened cement paste for scanning electron microscopy. Gaithersburg, MD: National Institute of Standards and Technology, 1990. http://dx.doi.org/10.6028/nist.ir.90-4235.

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Dordević, Milena, Radoslav Cerović, Dragan Nikolić, Sanja Radičević, Ivana Glišić, and Nebojša Milošević. Using Scanning Electron Microscopy to Characterise Plum (Prunus domestica L.) Genotypes. "Prof. Marin Drinov" Publishing House of Bulgarian Academy of Sciences, October 2020. http://dx.doi.org/10.7546/crabs.2020.10.08.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), January 1992. http://dx.doi.org/10.2172/6017304.

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Prabhakaran, Ramprashad, Vineet V. Joshi, Mark A. Rhodes, Alan L. Schemer-Kohrn, Anthony D. Guzman, and Curt A. Lavender. U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy. Office of Scientific and Technical Information (OSTI), March 2016. http://dx.doi.org/10.2172/1339911.

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