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Books on the topic 'Scanning electron microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 12 April 2025

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1

Reimer, Ludwig. Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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2

Reimer, Ludwig. Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5.

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3

Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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4

M, Prutton, and El Gomati Mohamed M, eds. Scanning Auger electron microscopy. Hoboken, NJ: Wiley, 2006.

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5

International, Scanning Microscopy. Scanning microscopy. Chicago: Scanning Microscopy International, 1987.

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6

Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998.

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7

Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

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8

L, Olsen Sandra, ed. Scanning electron microscopy in archaeology. Oxford, England: B.A.R., 1988.

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9

Shimizu, Kenichi. New horizons of applied scanning electron microscopy. Heidelberg: Springer-Verlag, 2010.

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10

Lawes, Grahame. Scanning electron microscopy and x-ray microanalysis. Edited by James Arthur M and ACOL. Chichester: Published on behalf of ACOL by Wiley, 1987.

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11

J, Schwartz Adam, Kumar Mukul, and Adams B. L, eds. Electron backscatter diffraction in materials science. New York: Kluwer Academic, 2000.

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12

Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1.

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13

Chescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford: Oxford University Press, 1990.

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14

1963-, Zhang Xiao-Feng, and Zhang Ze 1953-, eds. Progress in transmission electron microscopy. Berlin: Springer, 2001.

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15

J, Keyse Robert, and Royal Microscopial Society, eds. Introduction to scanning transmission electron microscopy. Singapore: Bio scientific/Springer, 1998.

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16

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. New York: Kluwer Academic / Plenum Publishers, 2003.

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17

Schatten, Heide, and James B. Pawley, eds. Biological Low-Voltage Scanning Electron Microscopy. New York, NY: Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-72972-5.

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18

Castejón, Orlando J. Scanning Electron Microscopy of Cerebellar Cortex. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0159-6.

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19

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Chichester, UK: John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.

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20

J, Keyse Robert, and Royal Microscopical Society (Great Britain), eds. Introduction to scanning transmission electron microscopy. Oxford: BIOS Scientific Publishers, 1998.

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21

Castejón, Orlando J. Scanning electron microscopy of cerebellar cortex. New York, NY: Kluwer Academic / Plenum Publishers, 2004.

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22

Lothar, Engel, ed. Scanning electron microscopy of plastics failure. Munich: Hanser Publishers, 2010.

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23

Johari, Om. Scanning electron microscopy/1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Levenson L. L, Roomans Godfried M, and Scanning Electron Microscopy Inc. [Elk Grove Village, IL]: Scanning Electron Microscopy, 1986.

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24

Roomans, G. M., R. P. Becker, and L. L. Levenson. Scanning electron microscopy / 1986: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Scanning Electron Microscopy Inc. Chicago, Ill: Scanning Electron Microscopy, 1986.

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25

Roomans, Godfried M. Scanning electron microscopy, 1985: An international journal of scanning electron microscopy, related techniques, and applications. [Elk Grove Village, Ill.]: Scanning Electron Microscopy, 1985.

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26

Johari, Om. Scanning electron microscopy/1985: An international journal of scanning electron microscopy, related techniques, and applications. Edited by Becker Robert P, Roomans Godfried M, Levenson L. L, and Scanning Electron Microscopy Inc. [Elk Grove Village, IL]: Scanning Electron Microscopy, 1985.

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27

1948-, Gai Pratibha L., ed. In-situ microscopy in materials research: Leading international research in electron and scanning probe microscopies. Boston: Kluwer Academic Publishers, 1997.

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28

Kassing, R. Scanning Microscopy: Symposium Proceedings. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992.

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29

Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. New York, NY: Springer Science+Business Media, LLC, 2011.

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30

G, Rickerby David, Valdrè Giovanni, and Valdrè U, eds. Impact of electron and scanning probe microscopy on materials research. Dordrecht: Kluwer Academic Publishers, 1999.

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31

E, Newbury Dale, ed. Advanced scanning electron microscopy and X-ray microanalysis. New York: Plenum Press, 1986.

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32

J, Bard Allen, and Mirkin Michael V. 1961-, eds. Scanning electrochemical microscopy. New York: Marcel Dekker, 2001.

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33

Schatten, Heide. Scanning electron microscopy for the life sciences. Cambridge: Cambridge University Press, 2012.

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34

European Congress on Optics (1st 1988 Hamburg, Germany). Scanning imaging: ECO1, 21-23 September 1988, Hamburg, Federal Republic of Germany. Edited by Wilson Tony, Association nationale de la recherche technique., European Federation for Applied Optics., European Physical Society, Society of Photo-optical Instrumentation Engineers., and International Congress on Optical Science and Engineering (1988 : Hamburg, Germany). Bellingham, Wash., USA: SPIE--The International Society for Optical Engineering, 1989.

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35

J, Colton Richard, ed. Procedures in scanning probe microscopies. Chichester: Wiley, 1998.

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36

Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-Ray Microanalysis. New York, NY: Springer New York, 2018. http://dx.doi.org/10.1007/978-1-4939-6676-9.

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37

Aharinejad, S. H., and A. Lametschwandtner. Microvascular Corrosion Casting in Scanning Electron Microscopy. Vienna: Springer Vienna, 1992. http://dx.doi.org/10.1007/978-3-7091-9230-6.

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38

Shimizu, Kenichi, and Tomoaki Mitani. New Horizons of Applied Scanning Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-03160-1.

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39

Goldstein, Joseph I., Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, and Eric Lifshin. Scanning Electron Microscopy and X-Ray Microanalysis. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4613-0491-3.

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40

Kazmiruk, Viacheslav, ed. Scanning Electron Microscopy. InTech, 2012. http://dx.doi.org/10.5772/1973.

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41

Scanning Electron Microscopy. NY RESEARCH PRESS, 2015.

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42

Prutton, Martin, and Mohamed M. El Gomati, eds. Scanning Auger Electron Microscopy. Wiley, 2005. http://dx.doi.org/10.1002/9780470866795.

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43

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2006.

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44

Bruma, Alina. Scanning Transmission Electron Microscopy. Taylor & Francis Group, 2020.

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45

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2006.

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46

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Incorporated, John, 2007.

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47

Prutton, Martin, and Mohamed M. El Gomati. Scanning Auger Electron Microscopy. Wiley & Sons, Limited, John, 2007.

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48

Marshall, D. J., L. Balk, and G. Remond. Luminescence Vol. 9: Scanning Microscopy Supplement (Scanning Microscopy Supplement,). Scanning Microscopy International, 1998.

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49

Pennycook, S. J., M. Varela, M. F. Chisholm, A. Y. Borisevich, A. R. Lupini, K. van Benthem, M. P. Oxley, et al. Scanning transmission electron microscopy of nanostructures. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533053.013.6.

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Abstract:
This article investigates nanostructures by means of scanning transmission electron microscopy. The electron microscope is uniquely suited to the study of individual nanostructures, allowing differentiation of different structures and properties that is difficult or impossible to do with techniques that provide a spatial average. The present generation of aberration correctors, which correct all aberrations up to third order, makes it possible to obtain sufficient sensitivity to image and spectroscopically analyze single atoms. This article begins with a brief overview of the correction of lens aberration in electron microscopy, followed by several examples of insights into nanomaterials and the atomic origins of their functionality. In particular, it considers semiconductor nanocrystals, semiconductor quantum wires, and nanocatalysts. It also discusses magnetism in gold and silver nanoclusters as well as charge ordering in manganites.
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50

Encyclopedia of Scanning Electron Microscopy. NY RESEARCH PRESS, 2015.

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