Log in

Relevant bibliographies by topics / Scanning electron microscopy / Journal articles

To see the other types of publications on this topic, follow the link: Scanning electron microscopy.

Journal articles on the topic 'Scanning electron microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 12 April 2025

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic 'Scanning electron microscopy.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

Full text

Abstract:

The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.

APA, Harvard, Vancouver, ISO, and other styles

2

Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (August 1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Dyukov, V. G. "Scanning electron microscopy." Uspekhi Fizicheskih Nauk 152, no. 6 (1987): 357. http://dx.doi.org/10.3367/ufnr.0152.198706q.0357.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Nada, Majid Hameed. "Scanning Electron Microscopy." BAOJ Microbiology 1, no. 1 (July 13, 2015): 1–8. http://dx.doi.org/10.24947/baojm/1/1/00105.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Dinnis, A. R. "Scanning Electron Microscopy." Optica Acta: International Journal of Optics 33, no. 10 (October 1986): 1228–29. http://dx.doi.org/10.1080/713821871.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Dyukov, V. G. "Scanning electron microscopy." Soviet Physics Uspekhi 30, no. 6 (June 30, 1987): 552. http://dx.doi.org/10.1070/pu1987v030n06abeh002866.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Dvorachek, Michael, Amnon Rosenfeld, and Avraham Honigstein. "Contaminations of geological samples in scanning electron microscopy." Neues Jahrbuch für Geologie und Paläontologie - Monatshefte 1990, no. 12 (January 16, 1991): 707–16. http://dx.doi.org/10.1127/njgpm/1990/1991/707.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

Full text

Abstract:

The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.

APA, Harvard, Vancouver, ISO, and other styles

9

Sujata, K., and Hamlin M. Jennings. "Advances in Scanning Electron Microscopy." MRS Bulletin 16, no. 3 (March 1991): 41–45. http://dx.doi.org/10.1557/s0883769400057390.

Full text

Abstract:

Scanning electron microscopes offer several unique advantages and they have evolved into complex integrated instruments that often incorporate several important accessories. Their principle advantage stems from the method of constructing an image from a highly focused electron beam that scans across the surface of a specimen. The beam generates backscattered electrons and excites secondary electrons and x-rays in a highly localized “spot.” These signals can be detected, and the results of the analysis are displayed as a specific intensity on a screen at a position that represents the position of the electron spot. As with a television image, after a given period, information about the entire field of view is displayed on the screen, resulting in a complete image. If the specimen is thin, the same type of information can be gathered from the transmitted electrons, and a scanning transmission image is thus constructed.The scanning electron microscope is highly versatile and widely used. The quality of the image is related to its resolution and contrast, which, in turn, depend on the diameter of the focused beam as well as its energy and current. Because electron lenses have inherently high aberrations, the usable aperture angles are much smaller than in a light microscope and, therefore, the electron beam remains focused over a relatively large distance, giving these instruments a very large depth of focus.Scanning electron microscopes are versatile in their ability to detect and analyze a lot of information. As a result, modern versions of these instruments are equipped with a number of detectors. Developments are sometimes related to placing the detectors in a geometrically attractive position close to the specimen.

APA, Harvard, Vancouver, ISO, and other styles

10

Frank, L., Š. Mikmeková, Z. Pokorná, and I. Müllerová. "Scanning Electron Microscopy With Slow Electrons." Microscopy and Microanalysis 19, S2 (August 2013): 372–73. http://dx.doi.org/10.1017/s1431927613003851.

Full text

APA, Harvard, Vancouver, ISO, and other styles

11

Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (March 28, 2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

Full text

Abstract:

AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

APA, Harvard, Vancouver, ISO, and other styles

12

Asenjo, A. "Scanning tunneling microscopy/scanning electron microscopy combined instrument." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 12, no. 3 (May 1994): 1658. http://dx.doi.org/10.1116/1.587256.

Full text

APA, Harvard, Vancouver, ISO, and other styles

13

Novikov, Yu A. "Modern Scanning Electron Microscopy. 2. Test objects for Scanning Electron Microscopy." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 12 (December 1, 2023): 129–46. http://dx.doi.org/10.31857/s102809602312018x.

Full text

Abstract:

The review of the test objects intended for calibration of scanning electron microscopes and researches to secondary electronic emission of a relief surface of a solid state in scanning electron microscope is carried out. The test objects are divided on two parameters – kind of a relief and structure of a relief. By the form of relief the test objects are divided on single, pitch and periodic. On a structure of a relief of the test objects are divided into objects with a rectangular structure and objects with a trapezoid structure with the large and small corners of an inclination of lateral walls. The examples of such the test objects are given. Their characteristics and methods of certification of parameters are described. The advantages and lacks of the test objects are considered. Is shown, that the best characteristics have the tests objects representing pitch structures consisting of trapezoid trenches with the large corners of an inclination of lateral walls. The test objects are created in monosilicon with of a surface orientation by {100} by method liquid anisotropic etching of silicon. These test objects allow defining all characteristics scanning electron microscopes, influencing on measurement of the linear sizes of relief structures used in microelectronics and nanotechnology. With their help it is possible to carry out correlation measurements, which raise accuracy of calibration scanning electron microscopes up to ten times.

APA, Harvard, Vancouver, ISO, and other styles

14

Novikov, Yu A. "Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron Microscopy." Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 17, no. 6 (December 2023): 1422–38. http://dx.doi.org/10.1134/s102745102306040x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

Full text

Abstract:

The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.At California State University-Stanislaus, home of the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system. Our Leica TCS NT confocal system, with an interchangeable upright (DMRXE) and inverted microscope (DMIRBE) set up,

APA, Harvard, Vancouver, ISO, and other styles

16

Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

Full text

Abstract:

Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.

APA, Harvard, Vancouver, ISO, and other styles

17

Peters, Jonathan J. P., Bryan W. Reed, Yu Jimbo, Kanako Noguchi, Karin H. Müller, Alexandra Porter, Daniel J. Masiel, and Lewys Jones. "Event-responsive scanning transmission electron microscopy." Science 385, no. 6708 (August 2, 2024): 549–53. http://dx.doi.org/10.1126/science.ado8579.

Full text

Abstract:

An ever-present limitation of transmission electron microscopy is the damage caused by high-energy electrons interacting with any sample. By reconsidering the fundamentals of imaging, we demonstrate an event-responsive approach to electron microscopy that delivers more information about the sample for a given beam current. Measuring the time to achieve an electron count threshold rather than waiting a predefined constant time improves the information obtained per electron. The microscope was made to respond to these events by blanking the beam, thus reducing the overall dose required. This approach automatically apportions dose to achieve a given signal-to-noise ratio in each pixel, eliminating excess dose that is associated with diminishing returns of information. We demonstrate the wide applicability of our approach to beam-sensitive materials by imaging biological tissue and zeolite.

APA, Harvard, Vancouver, ISO, and other styles

18

You, Yun-Wen, Hsun-Yun Chang, Hua-Yang Liao, Wei-Lun Kao, Guo-Ji Yen, Chi-Jen Chang, Meng-Hung Tsai, and Jing-Jong Shyue. "Electron Tomography of HEK293T Cells Using Scanning Electron Microscope–Based Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 18, no. 5 (October 2012): 1037–42. http://dx.doi.org/10.1017/s1431927612001158.

Full text

Abstract:

AbstractBased on a scanning electron microscope operated at 30 kV with a homemade specimen holder and a multiangle solid-state detector behind the sample, low-kV scanning transmission electron microscopy (STEM) is presented with subsequent electron tomography for three-dimensional (3D) volume structure. Because of the low acceleration voltage, the stronger electron-atom scattering leads to a stronger contrast in the resulting image than standard TEM, especially for light elements. Furthermore, the low-kV STEM yields less radiation damage to the specimen, hence the structure can be preserved. In this work, two-dimensional STEM images of a 1-μm-thick cell section with projection angles between ±50° were collected, and the 3D volume structure was reconstructed using the simultaneous iterative reconstructive technique algorithm with the TomoJ plugin for ImageJ, which are both public domain software. Furthermore, the cross-sectional structure was obtained with the Volume Viewer plugin in ImageJ. Although the tilting angle is constrained and limits the resulting structural resolution, slicing the reconstructed volume generated the depth profile of the thick specimen with sufficient resolution to examine cellular uptake of Au nanoparticles, and the final position of these nanoparticles inside the cell was imaged.

APA, Harvard, Vancouver, ISO, and other styles

19

Baba-Kishi, K. Z. "Scanning reflection electron microscopy of surface topography by diffusely scattered electrons in the scanning electron microscope." Scanning 18, no. 4 (December 6, 2006): 315–21. http://dx.doi.org/10.1002/sca.1996.4950180408.

Full text

APA, Harvard, Vancouver, ISO, and other styles

20

Fishbine, Brian H., and Robert J. Macy. "Fsem: Fast Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 606–7. http://dx.doi.org/10.1017/s0424820100181798.

Full text

Abstract:

Commercially available SEM‘s offer a maximum “TV” framing rate of ∼30 Hz. We have obtained a digitally-acquired framing rate of 381 Hz with submicron resolution [1]. This is at a 25 MHz pixel rate, compared with the ≤4 MHz video bandwidth of TV-rate machines. We have also performed analog-acquired experiments at effective framing rates of 4.9 kHz and effective pixel rates of >50 MHz. Our present detection and recording system is capable of 200 MHz pixel rates, with reduced contrast range at higher rates. Extrapolating current technology suggests that GHz pixel rates with useable final image signal-to-noise ratios are possible [2].In large part, the success of electron microscopy is due to: the high resolution possible with the small de Broglie wavelength of even keV electrons, small effective electron source diameters, and small optical aberrations of well-designed electron optics. With this resolution, SEM also attains large depth of focus with scanned, narrow electron beams. SEM micrographs are generally noted for exceptional sharpness and large depth of focus. The highest quality micrographs require scan times of tens of seconds or more.

APA, Harvard, Vancouver, ISO, and other styles

21

Ichinokawa, Takeo. "Scanning Low-Energy Electron Diffraction Microscopy Combined with Scanning Tunnling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 302–3. http://dx.doi.org/10.1017/s0424820100180264.

Full text

Abstract:

A ultra-high vacuum scanning electron microscope (UHV-SEM) with a field emission gun (FEG) has been operated in an energy range of from 100 eV to 3 keV. A new technique of scanning low energy electron diffraction (LEED) microscopy has been added to the other techniques: scanning Auger microscopy (SAM), secondary electron microscopy, electron energy loss microscopy and the others available for the UHV-SEM. In addition to scanning LEED microscopy, a scanning tunneling microscope (STM) has been installed in the UHV-SEM-.The combination of STM with SEM covers a wide magnification range from 105 to 107 and is very effective for observation of surface structures with a high resolution of about 1 Å.A UHV-FEG-SEM is equipped in a chamber in which the vacuum is better than 2×10-10 Torr. A movable cylindrical mirror analyzer (CMA), a two dimensional detector of diffracted LEED beams, an ion gun and a deposition source are installed in this chamber. The concept of the scanning LEED microscope is comprised of two steps: (1) the formation of a selected area LEED pattern and (2) the generation of raster images with information contained in the diffraction pattern. In the present experiment, the LEED detector assembly shown in Fig.l has been used; it consists of two hemisherical grids, a two-stage channel-plate amplifier and a position-sensitive detector. The selection of one (or more) diffracted beam is performed electronically by a window using the two-dimensional analogue comparators. The intensity of a particular beam selected by the window modulates the brightness of the scanning image and a dark field image sensitive to the surface structure is formed. The experimental spatial resolutions of 150 Å and 500 Å have been attained at the primary electron energy 1 keV and 250 eV, respectively.

APA, Harvard, Vancouver, ISO, and other styles

22

Yang, D. S., O. F. Mohammed, and A. H. Zewail. "Scanning ultrafast electron microscopy." Proceedings of the National Academy of Sciences 107, no. 34 (August 9, 2010): 14993–98. http://dx.doi.org/10.1073/pnas.1009321107.

Full text

APA, Harvard, Vancouver, ISO, and other styles

23

BROWN, L. M. "Scanning transmission electron microscopy." Le Journal de Physique IV 03, no. C7 (November 1993): C7–2073—C7–2080. http://dx.doi.org/10.1051/jp4:19937331.

Full text

APA, Harvard, Vancouver, ISO, and other styles

24

Flesner, L. D., and M. E. O’Brien. "Photovoltage scanning electron microscopy." Applied Physics Letters 54, no. 13 (March 27, 1989): 1259–61. http://dx.doi.org/10.1063/1.100732.

Full text

APA, Harvard, Vancouver, ISO, and other styles

25

Holm, Jason. "A Brief Overview of Scanning Transmission Electron Microscopy in a Scanning Electron Microscope." EDFA Technical Articles 23, no. 4 (November 1, 2021): 18–26. http://dx.doi.org/10.31399/asm.edfa.2021-4.p018.

Full text

Abstract:

Abstract This article provides a brief overview of STEM-in-SEM, discussing the pros and cons, recent advancements in detector technology, and the emergence of 4D STEM-in-SEM, a relatively new method that uses diffraction patterns recorded at different raster positions to enhance images offline in selected regions of interest.

APA, Harvard, Vancouver, ISO, and other styles

26

Joy, David C., and Dale E. Newbury. "Low Voltage Scanning Electron Microscopy." Microscopy and Microanalysis 7, S2 (August 2001): 762–63. http://dx.doi.org/10.1017/s1431927600029883.

Full text

Abstract:

Low Voltage Scanning Electron Microscopy (LVSEM), defined as operation in the energy range below 5keV, has become perhaps the most important single operational mode of the SEM. This is because the LVSEM offers advantages in the imaging of surfaces, in the observation of poorly conducting and insulating materials, and for high spatial resolution X-ray microanalysis. These benefits all occur because a reduction in the energy E0 of the incident beam leads to a rapid fall in the range R of the electrons since R ∼ k.E01.66. The reduction in the penetration of the beam has important consequences. Firstly, volume of the specimen that is sampled by the beam shrinks dramatically (varying as about E05 ) and so the information generated by the beam is confined to the surface of the sample. Secondly, the yield 8 of secondary electrons is increased from a typical value of 0.1 at 20keV to a value that may be in excess of 1.0 at 1keV.

APA, Harvard, Vancouver, ISO, and other styles

27

Joy, David C., and Dale E. Newbury. "Low Voltage Scanning Electron Microscopy." Microscopy Today 10, no. 2 (March 2002): 22–23. http://dx.doi.org/10.1017/s1551929500057813.

Full text

Abstract:

Low Voltage Scanning Electron Microscopy (LVSEM), defined as operation in the energy range below 5 keV, has become perhaps the most important single operational mode of the SEM. This is because the LVSEM offers advantages in the imaging of surfaces, in the observation of poorly conducting and insulating materials, and for high spatial resolution X-ray microanalysis. These benefits all occur because a reduction in the energy Eo of the incident beam leads to a rapid fall in the range R of the electrons since R ∼k.E01.66. The reduction in the penetration of the beam has important consequences.

APA, Harvard, Vancouver, ISO, and other styles

28

Urchulutegui, M. "Scanning Electron-Acoustic Microscopy: Do You Know Its Capabilities?" MRS Bulletin 21, no. 10 (October 1996): 42–46. http://dx.doi.org/10.1557/s0883769400031638.

Full text

Abstract:

Characterization of materials usually requires microscopy techniques. Some of the most useful are based on a scanning microscope and involve scanning the sample surface with a focused beam (e.g., photons, electrons, ions, etc.). For example, photoacoustic microscopy uses a laser beam, acoustic microscopy uses an ultrasound beam, and scanning electron microscopy uses an electron beam. The interaction between the material and the beam produces a signal that can be used to generate a two-dimensional image.In scanning photoacoustic microscopy (SPAM), an intensity-modulated light beam is used to produce oscillations in the surface temperature of the sample. These oscillations induce changes in the pressure of a fluid in the photoacoustic cell as a consequence of the periodic heat conduction from the surface to the cell fluid. Subsequently many material-characterization methods have employed the same philosophy as SPAM, using a modulated beam as an excitation probe. The breadth of such techniques is due to the large number of possible excitation sources and signal detectors that have been proposed to probe the specimen response. In particular, scanning electron-acoustic microscopy (SEAM), also referred to as thermal wave microscopy, is a technique based on the utilization of a scanning electron microscope developed in 1980 and applied in recent years to material characterization. It can be considered an additional mode of scanning electron microscopy (SEM), which uses the generation of acoustic waves in the sample. Most reviews have concentrated on the application of SEAM to metals and semiconductors. However many other possibilities exist.

APA, Harvard, Vancouver, ISO, and other styles

29

Radzimski, Z. J. "Image simulation in scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 544–45. http://dx.doi.org/10.1017/s0424820100148551.

Full text

Abstract:

The development of image acquisition and processing software has made microscopy, including scanning electron microscopy (SEM), a very precise tool. Various processing techniques for image quality enhancement and image quantification have been introduced. However, the theoretical bases for SEM analysis are not always fully understood. Using Monte-Carlo (MC) methods several important issues have been successfully addressed, for example, X-ray production and backscattered electron (BSE) simulation. MC methods provide insight into the physical basis of electron beam/solid interactions and offer a wide degree of freedom in setting the simulation conditions regarding sample geometry, the electron beam, and signal collection. The results can be extracted at any stage of electron-target interactions to determine energy, angular and/or spatial distributions. MC programs with a single scattering approach, Mott scattering cross section and corrected Bethe's formula for energy loss can be used for both low and high energy electrons. The simulation can be performed for complicated structures with multi-element phases of various shapes.

APA, Harvard, Vancouver, ISO, and other styles

30

Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

Full text

Abstract:

Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling spectroscopy (STS), atom force microscopy and magnetic force microscopy)[4]. These methods can be classified roughly into two; in one group image contrast is mainly determined by surface atomic structure and in the other it is determined by surface electronic structure. Information obtained by two groups of surface microscopy is complementary with each other. A combination of the two methods may give images of surface crystallography and surface electronic structure. STM-STS[4] and LEEM-PEEM [3] so far developed are typical examples.In the present work a combination of REM(TEM) and PEEM (Fig. 1) was planned with use of a UHV CTEM. Several new designs were made for the new microscope.

APA, Harvard, Vancouver, ISO, and other styles

31

Schwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope." Practical Metallography 51, no. 3 (March 17, 2014): 160–79. http://dx.doi.org/10.3139/147.110280.

Full text

APA, Harvard, Vancouver, ISO, and other styles

32

Hetherington, Craig L., Connor G. Bischak, Claire E. Stachelrodt, Jake T. Precht, Zhe Wang, Darrell G. Schlom, and Naomi S. Ginsberg. "Superresolution Fluorescence Microscopy within a Scanning Electron Microscope." Biophysical Journal 108, no. 2 (January 2015): 190a—191a. http://dx.doi.org/10.1016/j.bpj.2014.11.1054.

Full text

APA, Harvard, Vancouver, ISO, and other styles

33

Ueno, Masaki. "Excellent methods for processing crustacean larvae for scanning electron microscopy." Crustacean Research 38 (2009): 12–20. http://dx.doi.org/10.18353/crustacea.38.0_12.

Full text

APA, Harvard, Vancouver, ISO, and other styles

34

Neronov, A., P. Giurov, M. Cholakova, M. Dimitrova, and E. Nikolova. "Cryoprotection of porcine cornea: a scanning electron microscopy study ." Veterinární Medicína 50, No. 5 (March 28, 2012): 219–24. http://dx.doi.org/10.17221/5618-vetmed.

Full text

Abstract:

Porcine corneas were frozen with Me<sub>2</sub>SO, glycerol, 1,2-propanediol and PEG-400. The effects of the range of concentrations (5% and 10%) and temperature regimen (1ºC/min and 5ºC/min) were investigated. The integrity of corneal endothelial cells was evaluated by scanning electron microscopy and trypan blue staining. The presence of 5–10% PEG-400 in the protective medium was the most effective in minimizing changes in the integrity of the corneal endothelium during freezing-thawing procedures.

APA, Harvard, Vancouver, ISO, and other styles

35

Wortmann, F. J., and G. Wortmann. "Quantitative Fiber Mixture Analysis by Scanning Electron Microscopy." Textile Research Journal 62, no. 7 (July 1992): 423–31. http://dx.doi.org/10.1177/004051759206200710.

Full text

Abstract:

Labeling textile blends requires identification and quantification of their fibrous components. Blends of specialty animal fibers with sheep's wool are of special, practical importance; for these the light microscope is the traditional tool of analysis. To investigate the actual applicability of light microscopy for analyzing such blends as an alternative to the scanning electron microscope (SEM), we analyzed in detail the results of round trials conducted in the seventies. The results confirm that light microscopy, in general, is neither an objective nor a reproducible method for analyzing wool/specialty fiber blends. Though there was substantial progress with subsequent round trials, the data suggest that there is a fundamental statistical limit to the pass/fail rate, i.e., the ratio of correct versus incorrect analyses in a round trial that can be achieved by light microscopy. Even allowing for generous error limits, this effect leaves an intolerable element of chance for the correctness of analysis. Such performance is in pronounced contrast to that of the SEM method, where round trials have shown that laboratories that perform well reach analysis errors for specialty fiber/wool blends that are within or close to the natural error limits of microscopic analyses.

APA, Harvard, Vancouver, ISO, and other styles

36

Cudby, Paul E. F., and Barry A. Gilbey. "Scanning Transmission Imaging of Elastomer Blends Using an Unmodified Conventional Scanning Electron Microscope." Rubber Chemistry and Technology 68, no. 2 (May 1, 1995): 342–50. http://dx.doi.org/10.5254/1.3538747.

Full text

Abstract:

Abstract A novel method for carrying out scanning transmission electron microscopy on a standard scanning electron microscope is described. This method involves the addition of a specially fabricated mount and is accomplished without carrying out any form of modification on the microscope. The method is compared to more conventional microscopy techniques and examples are given showing the advantages of this system.

APA, Harvard, Vancouver, ISO, and other styles

37

Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (September 1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.

Full text

Abstract:

In recent years there have been a growing number of facilities interested in developing remote access capabilities to a variety of microscopy systems. While certain types of microscopes, such as electron microscopes and scanning probe microscopes have been well established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal microscope.At California State University, home to the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system.

APA, Harvard, Vancouver, ISO, and other styles

38

Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (August 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

Full text

Abstract:

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.

APA, Harvard, Vancouver, ISO, and other styles

39

McMullan, D. "Scanning electron microscopy 1928-1965." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 762–63. http://dx.doi.org/10.1017/s0424820100149647.

Full text

Abstract:

The beginning of the general use of the scanning electron microscope (SEM) can be accurately dated to 1965 when the Cambridge Instrument Company in the U.K. marketed their Stereoscan 1 SEM (to be followed about 6 months later by JEOL in Japan). But development had been in progress intermittently over the previous 30 years in Germany, the U.S.A., France, and the U.K. where in 1948 work was begun in Charles Oatley’s department at the Cambridge University Engineering Department which led directly to the Stereoscan. The purpose of this paper is to trace the development of the SEM and to show that some of the ideas pul forward by the early workers were well ahead of their time and only became technologically practicable much later.The First proposal for the application of scanning to microscopy was made in 1928 by Synge, an Irish scientific dilettante, who conceived the near-field scanning optical microscope but did not attempt to build one.

APA, Harvard, Vancouver, ISO, and other styles

40

Dillé, John E., Douglas C. Bittel, Kathleen Ross, and J. Perry Gustafson. "Preparing plant chromosomes for scanning electron microscopy." Genome 33, no. 3 (June 1, 1990): 333–39. http://dx.doi.org/10.1139/g90-052.

Full text

Abstract:

The scanning electron microscope may be useful in the analysis of plant chromosomes treated with in situ hybridization, especially when the probes and (or) chromosomes are near or beyond the resolution of the light microscope. Usual methods of plant chromosome preparation are unsuitable for scanning electron microscope observation as a result of cellular debris, which also interferes with probe hybridization. A method is described whereby protoplasts are obtained from fixed root tips by enzymatic digestion and applied to slides in a manner that produces little or no cellular debris overlying the chromosomes. The slides were examined by scanning electron microscopy and light microscopy after C-banding and in situ hybridization with a rye nucleolus organizer region spacer probe. This technique, which allows for scanning electron microscope visualization of bands and probes not easily identified with light microscopy, should prove useful in the physical mapping of low copy number or unique DNA sequences.Key words: protoplasts, rice, wheat, rye, physical maps, in situ hybridization.

APA, Harvard, Vancouver, ISO, and other styles

41

Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

Full text

Abstract:

The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of theoretical and experimental materials to researches of a secondary electron emission is given. Practically all known laws are checked up in experiments and have received the physical explanation. However, the application of a secondary electronic emission in a scanning electron microscopy, used in micro- both nanoelectronic and nanotechnology, requires knowledge of laws, which are shown on relief surfaces. Is demonstrated, what laws can be applied in a scanning electron microscope to measurement of linear sizes of relief structures. Is judged necessity of an influence study of a surface relief on a secondary electron emission.

APA, Harvard, Vancouver, ISO, and other styles

42

Jones, Arthur V. "Novel Approaches to Low-Voltage Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 366–67. http://dx.doi.org/10.1017/s0424820100180586.

Full text

Abstract:

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

APA, Harvard, Vancouver, ISO, and other styles

43

Celotta, R. J., J. Unguris, and D. T. Pierce. "Scanning Electron Microscopy with Polarization Analysis – SEMPA." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 178–79. http://dx.doi.org/10.1017/s0424820100125828.

Full text

Abstract:

The advancement of magnetics science and technology requires the ability to image magnetic microstructure, i.e. domains, below the 1 micron optical resolution limit. As an alternative to Lorentz microscopy, SEMPA was proposed in 1982 after it was realized that the secondary electrons ejected from a ferromagnetic surface are spin polarized. That is, they retain both the degree and direction of polarization characteristic of the spin alignment within the ferromagnet. By replacing the secondary electron detector in a UHV SEM with a detector capable of measuring both the number and polarization of the secondary electrons, it has been possible to simultaneously image both physical and magnetic microstructure. A conceptually similar microscope has been under development by Koike et alSEMPA depends on the availability of a efficient way to measure the spin polarization of a free electron beam. Traditionally, Mott scattering has been used. Mott detection is based on the small spatial asymmetry that occurs when electrons are scattered from a high-Z material at 120KeV.

APA, Harvard, Vancouver, ISO, and other styles

44

Joy, David C. "Image simulation in scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 74–75. http://dx.doi.org/10.1017/s042482010012535x.

Full text

Abstract:

Image simulation, as a means of image interpretation, has been an important component of high resolution transmission electron microscopy for many years. By contrast scanning electron microscopists have relied almost exclusively on simple visual analogies to understand the micrographs that they produce. However with the development of SEMs capable of near atomic levels of resolution, and with the requirement for accurate dimensional metrology of sub-micron features in semiconductor devices using the SEM, a more quantitative approach to image formation and analysis is needed.Image simulation in the SEM encounters several special problems. Firstly, the signal displayed to form the micrograph is not well defined in terms of either the contrast mechanisms which give rise to it, or the energy and origin of the electrons actually collected to produce the signal.

APA, Harvard, Vancouver, ISO, and other styles

45

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (June 1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

Full text

Abstract:

For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM and SEM, they are direct imaging techniques, using magnifying lenses. Both use an aperture to select a particular diffracted beam, which determines the nature of the contrast. If the direct beam is selected (no parallel momentum transfer), a bright field image is formed, and contrast arises primarily from differences in the scattering factor. A dark field image is formed with any other beam in the diffraction pattern, allowing contrast due to differences in symmetry. In LEEM, phase contrast is the third important mechanism by which surface and interface features such as atomic steps and dislocations may be imaged. One major difference between TEM and LEEM is the electron energy: 100 keV and above in TEM, 100 eV and below in LEEM. In LEEM, the imaging electrons are reflected from the sample surface, unlike TEM where the electrons zip right through the sample, encountering top surface, bulk, and bottom surface. STM and TEM are capable of ~2 Å resolution, while LEEM and SEM can observe surface features (including atomic steps) with -100 Å resolution.

APA, Harvard, Vancouver, ISO, and other styles

46

Rigler, Mark, and William Longo. "High Voltage Scanning Electron Microscopy Theory and Applications." Microscopy Today 2, no. 5 (August 1994): 12–13. http://dx.doi.org/10.1017/s1551929500066256.

Full text

Abstract:

A variety of energy emissions occur as a result of primary beam interaction with the specimen surface. Secondary electrons, x-rays, visible photons, near IR photons, and Auger electrons are emitted during inelastic scattering of electrons. Backscattered electrons (BSE) are emitted during elastic scattering of primary electrons. Backscattered electrons are those electrons which pass through the electron cloud of an atom and change direction without much energy loss. BSEs may diffuse into the sample or may escape from the sample surface. In practice, the primary electron beam penetrates deeply into low Z (atomic number) materials and produces few BSEs while high Z materials retard primary beam penetration and emit large numbers of BSEs. According to Murata et al., the higher the atomic number, the smaller the mean free path between electron scattering events (i.e. 528 Å for Al vs. 50 Å for Au at 30 KeV) and the higher the probability of scattering.

APA, Harvard, Vancouver, ISO, and other styles

47

KOHASHI, Teruo. "Spin-Polarized Scanning Electron Microscopy." Journal of the Vacuum Society of Japan 57, no. 10 (2014): 371–76. http://dx.doi.org/10.3131/jvsj2.57.371.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Quintana, Felipe Simões Lopes, Hiram Larangeira de Almeida Jr., Caroline Pires Ruas, and Valéria Magalhães Jorge. "Scanning electron microscopy of dermatofibroma." Anais Brasileiros de Dermatologia 94, no. 3 (May 2019): 358–60. http://dx.doi.org/10.1590/abd1806-4841.20197906.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

Harada, Ken, Keiko Shimada, and Yoshio Takahashi. "Lorentz scanning electron/ion microscopy." Microscopy 71, no. 2 (December 3, 2021): 93–97. http://dx.doi.org/10.1093/jmicro/dfab054.

Full text

Abstract:

Abstract We have developed an observation and measurement method for spatial electromagnetic fields by using scanning electron/ion microscopes, combined with electron holography reconstruction technique. A cross-grating was installed below the specimen, and the specimens were observed under the infocus condition, and the grating was simultaneously observed under the defocus condition. Electromagnetic fields around the specimen were estimated from grating-image distortions. This method is effective for low and middle magnification and resolution ranges; furthermore, this method can in principle be realizable in any electron/ion beam instruments because it is based on the Lorentz force model for charged particle beams.

APA, Harvard, Vancouver, ISO, and other styles

50

Koike, Kazuyuki, Hideo Matsuyama, Hideo Todokoro, and Kazunobu Hayakawa. "Spin-Polarized Scanning Electron Microscopy." Japanese Journal of Applied Physics 24, Part 1, No. 8 (August 20, 1985): 1078–81. http://dx.doi.org/10.1143/jjap.24.1078.

Full text

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!