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Relevant bibliographies by topics / Scanning optical microscopy

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Academic literature on the topic 'Scanning optical microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 15 February 2022

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Journal articles on the topic "Scanning optical microscopy"

1

Battistella, Florent, Steven Berger, and Andrew Mackintosh. "Scanning Optical Microscopy via a Scanning Electron Microscope." Journal of Electron Microscopy Technique 6, no. 4 (1987): 377–84. http://dx.doi.org/10.1002/jemt.1060060408.

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Wilson, T. "Scanning optical microscopy." Scanning 7, no. 2 (1985): 79–87. http://dx.doi.org/10.1002/sca.4950070203.

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3

Kino, G. S. "Scanning optical microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 8, no. 6 (1990): 1652. http://dx.doi.org/10.1116/1.585134.

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Wilke, V. "Optical scanning microscopy-The laser scan microscope." Scanning 7, no. 2 (1985): 88–96. http://dx.doi.org/10.1002/sca.4950070204.

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Pylkki, Russell J., Patrick J. Moyer, and Paul E. West. "Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy." Japanese Journal of Applied Physics 33, Part 1, No. 6B (1994): 3785–90. http://dx.doi.org/10.1143/jjap.33.3785.

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Kino, Gordon S., and Timothy R. Corle. "Confocal Scanning Optical Microscopy." Physics Today 42, no. 9 (1989): 55–62. http://dx.doi.org/10.1063/1.881183.

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Courjon, D., K. Sarayeddine, and M. Spajer. "Scanning tunneling optical microscopy." Optics Communications 71, no. 1-2 (1989): 23–28. http://dx.doi.org/10.1016/0030-4018(89)90297-6.

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Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolut

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9

Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.

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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in

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Attota, Ravi Kiran, and Haesung Park. "Optical microscope illumination analysis using through-focus scanning optical microscopy." Optics Letters 42, no. 12 (2017): 2306. http://dx.doi.org/10.1364/ol.42.002306.

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Dissertations / Theses on the topic "Scanning optical microscopy"

1

Hewlett, Simon J. "Imaging strategies in scanning optical microscopy." Thesis, University of Oxford, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.302904.

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Higdon, Paul D. "Polarisation effects in scanning optical microscopy." Thesis, University of Oxford, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.299817.

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Tan, Juan Boon. "Image enhancement in scanning optical microscopy." Thesis, University of Oxford, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.306886.

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McCabe, Eithne. "Scanning optical microscopy of semiconductor devices." Thesis, University of Oxford, 1987. http://ora.ox.ac.uk/objects/uuid:aec769d9-5c8a-48d6-88fe-3a1632e0888d.

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A new method to display low contrast OBIC images has been used to highlight defects in semiconductor devices. In addition an exciting novel method to obtain spatial information on the distribution of defects at the silicon/silicon-dioxide interface in metal oxide semiconductor devices has been found. This method can examine many defects which cause serious problems for device manufacturers including the effect of radiation damage on device performance. Other non-destructive techniques which can complement OBIC imaging are explored including photoluminescence and infrared transmission imaging.

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Leong, Siang Huei. "Apertureless scanning near-field optical microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615953.

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Carlini, A. R. "Imaging modes of confocal scanning microscopy." Thesis, University of Oxford, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.233485.

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LeBlanc, Philip R. "Dual-wavelength scanning near-field optical microscopy." Thesis, McGill University, 2002. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=82911.

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A dual-wavelength Scanning Near-Field Optical Microscope was developed in order to investigate near-field contrast mechanisms as well as biological samples in air. Using a helium-cadmium laser, light of wavelengths 442 and 325 nanometers is coupled into a single mode optical fiber. The end of the probe is tapered to a sub-wavelength aperture, typically 50 nanometers, and positioned in the near-field of the sample. Light from the aperture is transmitted through the sample and detected in a confocal arrangement by two photomultiplier tubes. The microscope has a lateral topographic resolut

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Schilling, Bradley Wade Jr. "Three-Dimensional Fluorescence Microscopy by Optical Scanning Holography." Diss., Virginia Tech, 1997. http://hdl.handle.net/10919/29829.

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As three-dimensional (3D) imaging and fluorescence techniques become standard in optical microscopy, novel approaches to 3D fluorescence microscopy are emerging. One such approach is based on the incoherent holography technique called optical scanning holography (OSH). The main advantage of OSH-based microscopy is that only a single two-dimensional (2D) scan is required to record 3D information, whereas most current 3D microscopes rely on sectioning techniques. To acquire a 3D representation of an object, current microscopes must physically scan the specimen in a series of 2D sections along th

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Kohlgraf-Owens, Dana. "Optically Induced Forces in Scanning Probe Microscopy." Doctoral diss., University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5649.

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The focus of this dissertation is the study of measuring light not by energy transfer as is done with a standard photodetector such as a photographic film or charged coupled device, but rather by the forces which the light exerts on matter. In this manner we are able to replace or complement standard photodetector-based light detection techniques. One key attribute of force detection is that it permits the measurement of light over a very large range of frequencies including those which are difficult to access with standard photodetectors, such as the far IR and THz. The dissertation address

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Hadjipanayi, Maria. "Scanning near-field optical microscopy of semiconducting nano-structures." Thesis, University of Oxford, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.442754.

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Books on the topic "Scanning optical microscopy"

1

Corle, Timothy R. Confocal scanning optical microscopy and related imaging systems. Academic Press, 1996.

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2

Yamashita, Mikio, Hidemi Shigekawa, and Ryuji Morita, eds. Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy. Springer-Verlag, 2005. http://dx.doi.org/10.1007/b138671.

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Pennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer Science+Business Media, LLC, 2011.

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Keates, Sarah E. Techniques for preparing plant tissues for optical and scanning electron microscopy. Forestry Canada, 1990.

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5

International Conference on Scanning Tunneling Microscopy/Spectroscopy (5th 1990 Baltimore, Md.). Proceedings of the Fifth International Conference on Scanning Tunneling Microscopy/Spectroscopy and the First International Conference on Nanometer Scale Science and Technology, 23-27 July 1990, Hyatt Regency, Baltimore, Maryland, USA. Edited by Colton Richard J, Marrian Christie R. K, Stroscio Joseph Anthony 1956-, American Vacuum Society, and International Conference on Nanometer Scale Science and Technology (1st : 1990 : Baltimore, Md.). Published for the American Vacuum Society by the American Institute of Physics, 1991.

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6

Microcantilevers for atomic force microscope data storage. Kluwer Academic Publishers, 1998.

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7

Image formation in low-voltage scanning electron microscopy. SPIE Optical Engineering Press, 1993.

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8

Cheng, Shih-Tung. A scanning force microscope based on an optical interferometer detection system. University of Manchester, 1994.

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9

Zhang, Peng. Development of a near-field scanning optical microscope and its application in studying the optical mode localization of self-affine Ag colloidal films. National Library of Canada = Bibliothèque nationale du Canada, 1998.

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10

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/978-3-540-28472-7.

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Book chapters on the topic "Scanning optical microscopy"

1

Fischer, U. Ch. "Scanning Near Field Optical Microscopy." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_5.

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Fischer, U. C. "Scanning Near-Field Optical Microscopy." In Scanning Probe Microscopy. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-662-03606-8_7.

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3

Sure, T. "Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_11.

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Narushima, Tetsuya. "Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_93.

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5

de Fornel, Frédärique. "Scanning Tunneling Optical Microscopy." In Springer Series in Optical Sciences. Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-540-48913-9_10.

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6

Courjon, Daniel. "Scanning Tunneling Optical Microscopy." In Scanning Tunneling Microscopy and Related Methods. Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-015-7871-4_28.

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7

Pohl, D. W. "Nano-optics and Scanning Near-Field Optical Microscopy." In Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-642-79366-0_7.

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Pohl, D. W. "Nano-optics and Scanning Near-Field Optical Microscopy." In Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5_7.

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9

Delaney, Peter, and Martin Harris. "Fiber-Optics in Scanning Optical Microscopy." In Handbook Of Biological Confocal Microscopy. Springer US, 2006. http://dx.doi.org/10.1007/978-0-387-45524-2_26.

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Masters, Barry R. "Confocal Laser Scanning Microscopy." In Handbook of Coherent Domain Optical Methods. Springer US, 2004. http://dx.doi.org/10.1007/0-387-29989-0_21.

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Conference papers on the topic "Scanning optical microscopy"

1

Haegel, Nancy M., Chun-Hong Low, Lee Baird, and Goon-Hwee Ang. "Transport imaging with near-field scanning optical microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824114.

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Chumbley, L. S., D. J. Eisenmann, M. Morris, et al. "Use of a scanning optical profilometer for toolmark characterization." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.825185.

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Poon, Ting-Chung, Kyu B. Doh, Bradley W. Schilling, Ming H. Wu, Kazunori K. Shinoda, and Yoshiji Suzuki. "Optical scanning holographic microscopy." In IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology, edited by Tony Wilson and Carol J. Cogswell. SPIE, 1995. http://dx.doi.org/10.1117/12.205342.

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Bource, Leonard J. "Scanning Laser Acoustic Microscopy." In 1984 European Conference on Optics, Optical Systems and Applications, edited by Bouwe Bolger and Hedzer A. Ferwerda. SPIE, 1985. http://dx.doi.org/10.1117/12.943770.

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Conkey, Donald B., Antonio Caravaca, and Rafael Piestun. "Backscattering Scanning Fluorescence Microscopy." In Computational Optical Sensing and Imaging. OSA, 2011. http://dx.doi.org/10.1364/cosi.2011.ctua2.

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Kohlgraf-Owens, D. C., L. Greusard, S. Sukhov, R. Colombelli, Y. De Wilde, and A. Dogariu. "Optical Multifrequency Scanning Probe Microscopy." In Frontiers in Optics. OSA, 2012. http://dx.doi.org/10.1364/fio.2012.fw2f.3.

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Sukharenko, Vitaly, and Roger Dorsinville. "Evanescent field scanning optical microscopy." In SPIE OPTO, edited by Michel J. F. Digonnet and Shibin Jiang. SPIE, 2014. http://dx.doi.org/10.1117/12.2035166.

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Wang, Lin, Qihao Song, Hongbo Zhang, Yu Xin, and Ting-Chung Poon. "Optical Scanning Fourier Ptychographic Microscopy." In Digital Holography and Three-Dimensional Imaging. OSA, 2019. http://dx.doi.org/10.1364/dh.2019.w3a.10.

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Attota, Ravikiran, Ronald G. Dixson, and Andras E. Vladár. "Through-focus scanning optical microscopy." In SPIE Defense, Security, and Sensing, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, and Tim K. Maugel. SPIE, 2011. http://dx.doi.org/10.1117/12.884706.

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Wang, Yuan, Werayut Srituravanich, Cheng Sun, and Xiang Zhang. "Plasmonic nearfield scanning optical microscopy." In SPIE Optics + Photonics, edited by Satoshi Kawata, Vladimir M. Shalaev, and Din Ping Tsai. SPIE, 2006. http://dx.doi.org/10.1117/12.681482.

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Reports on the topic "Scanning optical microscopy"

1

Nakakura, Craig Y., and Aaron Michael Katzenmeyer. Novel Applications of Near-Field Scanning Optical Microscopy (NSOM). Office of Scientific and Technical Information (OSTI), 2018. http://dx.doi.org/10.2172/1475250.

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Yan, M., J. McWhirter, T. Huser, and W. Siekhaus. Defect studies of optical materials using near-field scanning optical microscopy and spectroscopy. Office of Scientific and Technical Information (OSTI), 2001. http://dx.doi.org/10.2172/15004114.

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Prabhakaran, Ramprashad, Vineet V. Joshi, Mark A. Rhodes, Alan L. Schemer-Kohrn, Anthony D. Guzman, and Curt A. Lavender. U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1339911.

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Prabhakaran, Ramprashad, Vineet V. Joshi, Mark A. Rhodes, Alan L. Schemer-Kohrn, Anthony D. Guzman, and Curt A. Lavender. U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1339912.

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Hemminger, John C. Optical Spectroscopy and Scanning Tunneling Microscopy Studies of Molecular Adsorbates and Anisotropic Ultrathin Films. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1542895.

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Hemminger, J. C. Optical spectroscopy and scanning tunneling microscopy studies of molecular adsorbates and anisotropic ultrathin films. Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/656637.

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Barbara, Paul F. Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics,. Defense Technical Information Center, 1995. http://dx.doi.org/10.21236/ada294879.

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Nowak, Derek. The Design of a Novel Tip Enhanced Near-field Scanning Probe Microscope for Ultra-High Resolution Optical Imaging. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.361.

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Lawrence, Andrew. Development of a Hybrid Atomic Force and Scanning Magneto-Optic Kerr Effect Microscope for Investigation of Magnetic Domains. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.147.

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