Relevant bibliographies by topics / Scanning probe

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Scanning probe'

Author: Grafiati
Published: 4 June 2021
Last updated: 12 February 2022

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Journal articles on the topic "Scanning probe"

1

Taylor, James D., and Dennis D. Chandler. "SCANNING PROBE." Journal of the Acoustical Society of America 132, no. 3 (2012): 1877. http://dx.doi.org/10.1121/1.4752191.

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Taylor, James D. "Scanning probe." Journal of the Acoustical Society of America 120, no. 6 (2006): 3456. http://dx.doi.org/10.1121/1.2409474.

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Ostromohov, Nadya, Baruch Rofman, Moran Bercovici, and Govind Kaigala. "Electrokinetic Scanning Probes: Electrokinetic Scanning Probe (Small 5/2020)." Small 16, no. 5 (February 2020): 2070028. http://dx.doi.org/10.1002/smll.202070028.

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Lytvyn, P. M. "Mechanical scanning probe nanolithography: modeling and application." Semiconductor Physics Quantum Electronics and Optoelectronics 15, no. 4 (December 12, 2012): 321–27. http://dx.doi.org/10.15407/spqeo15.04.321.

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Akiyama, K., T. Eguchi, T. An, Y. Fujikawa, T. Sakurai, and Y. Hasegawa. "Functional Probes for Scanning Probe Microscopy." Journal of Physics: Conference Series 61 (March 1, 2007): 22–25. http://dx.doi.org/10.1088/1742-6596/61/1/005.

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Oesterschulze, E. "Novel probes for scanning probe microscopy." Applied Physics A: Materials Science & Processing 66, no. 7 (March 1, 1998): S3—S9. http://dx.doi.org/10.1007/s003390051089.

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Kalinin, Sergei. "Measuring Conductivity With Scanning Probe Microscopes." Microscopy Today 10, no. 2 (March 2002): 26–27. http://dx.doi.org/10.1017/s1551929500057837.

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There are two kinds of conductivity measurements possible with scanning probe microscopy (SPM). In the first case, the specific resistance of material directly below the tip is probed. In the second case, SPM probes local potential induced by the lateral current applied through macroscopic contacts, thus providing the information on the mesoscopic transport properties of the sample.The first set of techniques is invariably based on measuring tip-surface current in contact or intermittent tapping mode. If the tip-surface contact resistance is small (good contact), the current will be limited by the spreading resistance of the sample from which specific resistance can be calculated, assuming that the contact area is known.
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FUJII, Masatoshi. "Scanning Probe Microscopy." Journal of Japan Oil Chemists' Society 49, no. 10 (2000): 1181–89. http://dx.doi.org/10.5650/jos1996.49.1181.

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SAKAI, Fumiki. "Scanning Probe Microscope." Journal of the Japan Society of Colour Material 69, no. 5 (1996): 343–50. http://dx.doi.org/10.4011/shikizai1937.69.343.

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MORITA, Seizo. "Scanning Probe Microscopy." Journal of the Vacuum Society of Japan 51, no. 12 (2008): 769–70. http://dx.doi.org/10.3131/jvsj2.51.769.

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Dissertations / Theses on the topic "Scanning probe"

1

Almqvist, Nils. "Scanning probe microscopy : Applications." Licentiate thesis, Luleå tekniska universitet, Materialvetenskap, 1994. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-17980.

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Djuričič, Dejana. "Biological scanning probe microscopy (SPM)." Thesis, University of Oxford, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.403609.

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Pinheiro, Lucidalva dos Santos. "Scanning probe microscopy of adsorbates." Thesis, University of Oxford, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.320589.

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Mueller-Falcke, Clemens T. (Clemens Tobias). "Switchable stiffness scanning microscope probe." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/32349.

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Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2005.
Includes bibliographical references (p. 77-80).
Atomic Force Microscopy (AFM) has rapidly gained widespread utilization as an imaging device and micro/nano-manipulator during recent years. This thesis investigates the new concept of a dual stiffness scanning probe with respect to biological applications and determines the resulting requirements for the scanning of soft bio samples, such as low-pressure contact. On this basis, an in-plane AFM probe that is specifically tailored to the needs of biological applications is developed. It features a variable stiffness, which makes the stiffness of the probe adjustable to the surface hardness of the sample, and a very low overall stiffness, which is needed in order to achieve high resolution imaging. The switchable stiffness probe allows the scanning of biological samples with varying surface hardness without changing probes during scanning, and therefore prevents a loss of positional information, as is unavoidable with conventional devices. For the integration of the components into a MEMS device, the conventional cantilever-type design of AFM probes has been abandoned in favor of an in-plane design. The new design has an advantage in that it facilitates a high-density array of AFM probes and allows for easy surface micromachining of the integrated device. It also enables the future integration of micro-fluidic channels for reagent delivery and nanopipetting. For the scanning of nano-scale trenches and grooves, a multi-walled carbon nanotube, embedded in a nanopellet, is planned as a high-aspect-ratio tip. The variable stiffness is accomplished in a mechanical way by engaging or disengaging auxiliary beams to the compliant beam structure by means of electrostatically actuated clutches.
(cont.) For actuation, an electrostatic combdrive is considered to move the probe tip up and down. The vertical displacement of the tip can be measured by a capacitive sensor, which can easily be integrated into the system. A scaled-up proof-of-concept model is manufactured with surface-micromachining processes. The clutch performance is successfully tested and the dual stiffness concept is verified by measuring the stiffness of the device with the clutches engaged and disengaged.
by Clemens T. Mueller-Falcke.
S.M.
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Neubeck, Soeren. "Scanning probe investigations on graphene." Thesis, University of Manchester, 2010. https://www.research.manchester.ac.uk/portal/en/theses/scanning-probe-investigations-on-graphene(e0838733-8f13-4221-ad55-124e3757ba15).html.

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In this thesis, scanning probe microscopy experiments on graphene and chemically modified graphene crystals are discussed. Since its discovery in 2004, graphene has not only impressed researchers and industry because it is a crystal that is only one atom thick, butalso because of its electronic transport properties. However, a major challenge remaining is the task to introduce an energy gap in graphene. One way to open an energy gap in pristine graphene is its confinement to nanometre sizes. To this end, methods were developed to fabricate such nanostructures out of graphene. Here, the atomic force microscope (AFM) based technique of local anodic oxidation was applied to selectively oxidise graphene. Using this technique, graphene nanostructures as small as 20~nm have been fabricated. A graphene quantum dot (QD) created with this technique was measured at low temperatures. It showed quantum Coulomb blockade behaviour, with an energy gap of 10 meV. Furthermore, the transport behaviour of these nanostructures was also investigated under ambient conditions.Scanning gate microscopy measurements carried out on a graphene quantum point contact (QPC) demonstrated the possibility to locally influence the charge carrier concentration in the QPC, and thus alter the resistance of the device. These experiments additionally prove the usefulness of local anodic oxidation to create graphene nanostructures. Equally tempting as opening a gap in graphene and studying the resulting transport properties is the prospect of studying the influence of the edges terminating a graphene crystal on its transport properties. To that end, reliable methods for obtaining the crystallographic orientation of a given edge are needed. While most techniques require either elaborated sample fabrication or modelling, it is shown here how atomically resolved scanning tunnelling microscopy (STM) imaging together with Raman spectroscopy can be used to determine the crystallographic direction of graphene edges without doubt. An alternative way of creating an energy gap in graphene is its modification with atomic hydrogen. Atomic force microscopy was first used to measure the topography of hydrogenated graphene crystals. It is further shown, how the amount of adsorbed hydrogen could be decreased using AFM. The changes induced in the hydrogenated graphene samples in this way have been further corroborated by Raman spectroscopy and low temperature transport experiments, establishing AFM as a method to engineer the resistance of hydrogenated graphene.
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Eves, Brian John. "Scanning probe energy loss spectroscopy." Thesis, University of Birmingham, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251871.

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Howells, Samuel Charles. "Surface studies with scanning probe microscopy." Diss., The University of Arizona, 1992. http://hdl.handle.net/10150/185905.

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Using scanning probe microscopy, several studies were carried out to characterize surface topographies and properties. First, utilizing scanning tunneling microscopy (STM), we characterized fullerenes deposited onto gold foils and highly oriented gold films. On gold foils, we found that C₆₀ packed in hexagonally ordered overlayers and that the images showed internal buckyball features that arose from electronic interactions between the molecule and the substrate. On gold films, with an ordered overlayer of methyl isobutyl ketone (MIBK), the isolated C₆₀ molecules showed internal features in a "doughnut" shape, different than those seen previously. We also imaged gold foils on which a significant number of larger fullerene molecules were deposited, and found only spherical molecules in our images. A theoretical analysis of the optical beam deflection atomic force microscope (AFM) predicted sufficient sensitivity to measure atomic corrugations greater than 1 A. This agreed with experimental results showing atomically resolvable images. Another theoretical investigation probe the relative magnitude of the forces between the tip, sample, and an adsorbed atom on a surface. Experimentally, we investigated cleaved multiple quantum wells ans showed surface corrugations with a period equal to the quantum well spacing. The third technique used was magnetic force microscopy (MFM). We analyzed a novel system that combined the tunneling aspects of STM with the force-sensing attributes of force microscopy, and provided the ability to simultaneously image surface features as well as magnetic domains with a sensitivity that depended on the spring constant of the tunneling tip. Experimentally, we used this system to image magnetic domains and reveal the surface roughness of magnetic recording media. The second MFM technique involved spin-coating a magnetic surface with a ferrofliud, then over-coating with gold, and finally imaging the surface with STM. The STM revealed raised ridges where the ferromagnetic particles clumped in regions of high magnetic field gradient. The finally MFM we utilized imaged magnetic fields using a beam deflection force microscope by modulating a magnetic disk head and detecting the vibration of the magnetic tip. We were able to image the fields of a floppy disk head.
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Liou, Je-Wen. "Scanning probe microscopy of photosynthetic membranes." Thesis, Imperial College London, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.398112.

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Williams, P. M. "Computational studies in scanning probe microscopy." Thesis, University of Nottingham, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294243.

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Bond, Stephen Francis. "Scanning probe microscopy of conjugated polymers." Thesis, University of Cambridge, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.339756.

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Books on the topic "Scanning probe"

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Soh, Hyongsok T. Scanning probe lithography. Boston: Kluwer Academic Publishers, 2001.

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Soh, Hyongsok T. Scanning Probe Lithography. Boston, MA: Springer US, 2001.

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Voigtländer, Bert. Scanning Probe Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0.

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Meyer, Ernst, Hans Josef Hug, and Roland Bennewitz. Scanning Probe Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-09801-1.

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Kalinin, Sergei, and Alexei Gruverman, eds. Scanning Probe Microscopy. New York, NY: Springer New York, 2007. http://dx.doi.org/10.1007/978-0-387-28668-6.

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Foster, Adam, and Werner Hofer. Scanning Probe Microscopy. New York, NY: Springer New York, 2006. http://dx.doi.org/10.1007/0-387-37231-8.

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Soh, Hyongsok T., Kathryn Wilder Guarini, and Calvin F. Quate. Scanning Probe Lithography. Boston, MA: Springer US, 2001. http://dx.doi.org/10.1007/978-1-4757-3331-0.

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Wiesendanger, Roland, ed. Scanning Probe Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-662-03606-8.

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Soh, Hyongsok T. Scanning probe lithography. Boston: Kluwer Academic Publishers, 2001.

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Inc, ebrary, ed. Scanning probe microscopy. Singapore: World Scientific Pub. Co., 2011.

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Book chapters on the topic "Scanning probe"

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Nakayama, Tomonobu. "Multiple-Probe Scanning Probe Microscope." In Compendium of Surface and Interface Analysis, 387–94. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_64.

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Butler, David Lee. "Scanning Probe Microscopy." In Encyclopedia of Microfluidics and Nanofluidics, 2952–58. New York, NY: Springer New York, 2015. http://dx.doi.org/10.1007/978-1-4614-5491-5_1385.

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Nawrocki, Waldemar. "Scanning Probe Microscopes." In Introduction to Quantum Metrology, 237–56. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15669-9_11.

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Hermann, Bianca A., and Regina Hoffmann-Vogel. "Scanning Probe Microscopy." In Analytical Methods in Supramolecular Chemistry, 499–557. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527644131.ch11.

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Guo, Jing. "Scanning Probe Microscopy." In Springer Theses, 23–41. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-1663-0_2.

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Grigg, D. A., and P. E. Russell. "Scanning Probe Microscopy." In Microanalysis of Solids, 389–447. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-1492-7_14.

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Wiek, Alexander, and Rudolf Holze. "Scanning Probe Methods." In Encyclopedia of Applied Electrochemistry, 1836–51. New York, NY: Springer New York, 2014. http://dx.doi.org/10.1007/978-1-4419-6996-5_239.

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Nölting, Bengt. "Scanning probe microscopy." In Methods in Modern Biophysics, 121–45. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03022-2_7.

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Nishikawa, Osamu. "Scanning Atom Probe." In Roadmap of Scanning Probe Microscopy, 71–76. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_9.

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Papadopoulos, Christo. "Scanning-Probe Methods." In SpringerBriefs in Materials, 29–35. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-31742-7_5.

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Conference papers on the topic "Scanning probe"

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Bard, Allen J., Patrick R. Unwin, David O. Wipf, and Feimeng Zhou. "Scanning Electrochemical Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41416.

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Reddick, Robin C. "Photon Scanning Tunneling Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41386.

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Möller, R., S. Akari, C. Baur, B. Koslowski, and K. Dransfeld. "Scanning Tunneling Microscopy and Photons." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41425.

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Craighead, H. G. "Nanotechnology Prospects of Scanning Probes." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41402.

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Völcker, M., W. Krieger, and H. Walther. "A Laser-Driven Scanning Tunneling Microscope." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41397.

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Nyamjav, Dorjderem, and Albena Ivanisevic. "Scanning probe lithography." In Microlithography 2003, edited by Roxann L. Engelstad. SPIE, 2003. http://dx.doi.org/10.1117/12.484991.

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Grigg, David A., Joseph E. Griffith, G. P. Kochanski, Michael J. Vasile, and Phillip E. Russell. "Scanning probe metrology." In Micro - DL Tentative, edited by Michael T. Postek, Jr. SPIE, 1992. http://dx.doi.org/10.1117/12.59814.

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Mulhern, P. J., B. L. Blackford, and M. H. Jericho. "Scanning Force Microscopy of a Cell Sheath." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41413.

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Williams, C. C., J. Slinkman, D. W. Abraham, and H. K. Wickramasinghe. "Nanoscale Surface Characterization by Scanning Capacitance Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41427.

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Hörber, J. K. H., F. M. Schuler, V. Witzemann, H. Müller, and J. P. Ruppersberg. "Imaging Biological Membrane Structures with a Scanning Tunneling Microscope." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41414.

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Reports on the topic "Scanning probe"

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Melloch, Michael R. Scanning Probe Microscope. Fort Belvoir, VA: Defense Technical Information Center, March 2001. http://dx.doi.org/10.21236/ada388569.

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Swartzentruber, B. S., A. M. Bouchard, and G. C. Osbourn. Adaptive scanning probe microscopies. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/446386.

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Crooks, R. M., T. S. Corbitt, C. B. Ross, M. J. Hampden-Smith, and J. K. Schoer. Scanning Probe Surface Modification. Fort Belvoir, VA: Defense Technical Information Center, November 1993. http://dx.doi.org/10.21236/ada273178.

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Hawley, M. E., D. W. Reagor, and Quan Xi Jia. Scanning probe microscopy competency development. Office of Scientific and Technical Information (OSTI), December 1998. http://dx.doi.org/10.2172/562576.

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Sarid, Dror. Studies in Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, November 1995. http://dx.doi.org/10.21236/ada307654.

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Kelly, James J., and Dean C. Dibble. In-situ scanning probe microscopy of electrodeposited nickel. Office of Scientific and Technical Information (OSTI), October 2004. http://dx.doi.org/10.2172/920120.

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Enikov, Eniko T. Multimode Scanning Probe Microscope System for Nanocomposite Actuators. Fort Belvoir, VA: Defense Technical Information Center, July 2002. http://dx.doi.org/10.21236/ada406940.

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Williams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Fort Belvoir, VA: Defense Technical Information Center, March 1988. http://dx.doi.org/10.21236/ada192710.

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Adams, D. P., J. D. Houston, T. M. Mayer, and B. S. Swartzentruber. Scanning Probe-Based Processes for Nanometer-Scale Device Fabrication. Office of Scientific and Technical Information (OSTI), January 1999. http://dx.doi.org/10.2172/3196.

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Kim, Kristopher T., Bradley A. Kramer, John A. Schindler, and Hans Steyskal. Theory of Near-Field Scanning with a Probe Array. Fort Belvoir, VA: Defense Technical Information Center, January 2014. http://dx.doi.org/10.21236/ada595015.

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