Log in

Relevant bibliographies by topics / Scanning probe microscopy. Nanoscience

Contents

Journal articles
Dissertations / Theses
Books
Book chapters
Conference papers
Reports

Academic literature on the topic 'Scanning probe microscopy. Nanoscience'

Author: Grafiati

Published: 4 June 2021

Last updated: 13 February 2022

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Scanning probe microscopy. Nanoscience.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Scanning probe microscopy. Nanoscience"

1

Jesse, Stephen, Amit Kumar, Sergei V. Kalinin, Anil Gannepali, and Roger Proksch. "Band Excitation Scanning Probe Microscopies." Microscopy Today 18, no. 6 (November 2010): 34–40. http://dx.doi.org/10.1017/s155192951000101x.

Full text

Abstract:

Scanning probe microscopy (SPM) techniques have become a mainstay of nanoscience and nanotechnology by providing easy-to-use, gentle, structural imaging and manipulation on nanometer length scales. Beyond topographic imaging, SPMs have an extremely broad range of applications in probing electrical, magnetic, and mechanical properties. Despite impressive growth in applications, the traditional approach to SPM measurements—based on detection of cantilever response to a well-defined periodic excitation at a single frequency—has remained virtually identical for almost twenty years.

APA, Harvard, Vancouver, ISO, and other styles

2

XU, HAI, XIAN NING XIE, M. A. K. ZILANI, WEI CHEN, and ANDREW THYE SHEN WEE. "NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY." COSMOS 03, no. 01 (November 2007): 23–50. http://dx.doi.org/10.1142/s0219607707000256.

Full text

Abstract:

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.

APA, Harvard, Vancouver, ISO, and other styles

3

Ong, Eddie W., B. L. Ramakrishna, W. S. Glaunsinger, V. B. Pizziconi, and A. Razdan. "Remote Scanning Probe Microscopy and its Uses in Distancelearning and Educational Outreach." Microscopy and Microanalysis 7, S2 (August 2001): 810–11. http://dx.doi.org/10.1017/s1431927600030129.

Full text

Abstract:

Abstract: Tele-microscopy has become a very active area of research and development in the 1990s where there was a desire to give researchers better access to expensive and specialized microscopes, breaking geographical and time barriers. Rapid advances in telecommunication, computers, and microscopy technologies make possible the establishment of the World Wide Web and the realization of the goal of developing a “laboratory without walls”. This provides unprecedented opportunities for researchers and educators alike to gain access to shared instrumental and educational resources.In this presentation, a description of the Interactive Nano-Visualization for Science and Engineering Education (IN-VSEE) project will be given. The primary goals of IN-VSEE are to (i) convey the excitement of nanoscience and nanotechnology to promote studentmotivated learning and pursuit of science and engineering careers, (ii) teach fundamental interdisciplinary concepts in science and engineering using a visual format to help students learn and integrate information more effectively, (iii) provide students with the capability to routinely explore materials in three dimensions with resolutions at the nanoscale and even down to the atomic scale, and (iv) demonstrate the feasibility of remote operation of research-grade laboratory instrumentation for development into a powerful educational and collaborative tool.

APA, Harvard, Vancouver, ISO, and other styles

4

Huang, Boyuan, Ehsan Nasr Esfahani, and Jiangyu Li. "Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data." National Science Review 6, no. 1 (September 8, 2018): 55–63. http://dx.doi.org/10.1093/nsr/nwy096.

Full text

Abstract:

Abstract Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interest. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

APA, Harvard, Vancouver, ISO, and other styles

5

Yurtsever, Aycan, Renske M. van der Veen, and Ahmed H. Zewail. "Subparticle Ultrafast Spectrum Imaging in 4D Electron Microscopy." Science 335, no. 6064 (January 5, 2012): 59–64. http://dx.doi.org/10.1126/science.1213504.

Full text

Abstract:

Single-particle imaging of structures has become a powerful methodology in nanoscience and molecular and cell biology. We report the development of subparticle imaging with space, time, and energy resolutions of nanometers, femtoseconds, and millielectron volts, respectively. By using scanning electron probes across optically excited nanoparticles and interfaces, we simultaneously constructed energy-time and space-time maps. Spectrum images were then obtained for the nanoscale dielectric fields, with the energy resolution set by the photon rather than the electron, as demonstrated here with two examples (silver nanoparticles and the metallic copper–vacuum interface). This development thus combines the high spatial resolution of electron microscopy with the high energy resolution of optical techniques and ultrafast temporal response, opening the door to various applications in elemental analysis as well as mapping of interfaces and plasmonics.

APA, Harvard, Vancouver, ISO, and other styles

6

Schmid, I., J. Raabe, B. Sarafimov, C. Quitmann, S. Vranjkovic, Y. Pellmont, and H. J. Hug. "Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience." Ultramicroscopy 110, no. 10 (September 2010): 1267–72. http://dx.doi.org/10.1016/j.ultramic.2010.05.002.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Pathan, Abrarkhan M., Dhawal H. Agrawal, Pina M. Bhatt, Hitarthi H. Patel, and U. S. Joshi. "Design and Construction of Low Temperature Attachment for Commercial AFM." Solid State Phenomena 209 (November 2013): 137–42. http://dx.doi.org/10.4028/www.scientific.net/ssp.209.137.

Full text

Abstract:

With the rapid advancements in the field of nanoscience and nanotechnology, scanning probe microscopy has become an integral part of a typical R&D lab. Atomic force microscope (AFM) has become a familiar name in this category. The AFM measures the forces acting between a fine tip and a sample. The tip is attached to the free end of a cantilever and is brought very close to a surface. Attractive or repulsive forces resulting from interactions between the tip and the surface will cause a positive or negative bending of the cantilever. The bending is detected by means of a laser beam, which is reflected from the backside of the cantilever. Atomic force microscopy is currently applied to various environments (air, liquid, vacuum) and types of materials such as metal semiconductors, soft biological samples, conductive and non-conductive materials. With this technique size measurements or even manipulations of nano-objects may be performed. An experimental setup has been designed and built such that a commercially available Atomic Force Microscope (AFM) (Nanosurf AG, Easyscan 2) can be operated at cryogenic temperature under vacuum and in a vibration-free environment. The design also takes care of portability and flexibility of AFM i.e. it is very small, light weight and AFM can be used in both ambient and cryogenic conditions. The whole set up was assembled in-house at a fairly low cost. It is used to study the surface structure of nanomaterials. Important perovskite manganite Pr0.7Ca0.3MnO3thin films were studied and results such as morphology, RMS area and line roughness as well as the particle size have been estimated at cryogenic temperature.

APA, Harvard, Vancouver, ISO, and other styles

8

Rhodin, T. "Scanning probe microscopies, nanoscience and nanotechnology." Applied Physics A 72, S1 (March 2001): S141—S143. http://dx.doi.org/10.1007/s003390100751.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

FUJII, Masatoshi. "Scanning Probe Microscopy." Journal of Japan Oil Chemists' Society 49, no. 10 (2000): 1181–89. http://dx.doi.org/10.5650/jos1996.49.1181.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

MORITA, Seizo. "Scanning Probe Microscopy." Journal of the Vacuum Society of Japan 51, no. 12 (2008): 769–70. http://dx.doi.org/10.3131/jvsj2.51.769.

Full text

APA, Harvard, Vancouver, ISO, and other styles

More sources

Dissertations / Theses on the topic "Scanning probe microscopy. Nanoscience"

1

Gcwabaza, Thabo. "Scanning probe microscopy and oxidation of silicon at breakdown voltages." Huntington, WV : [Marshall University Libraries], 2006. http://www.marshall.edu/etd/descript.asp?ref=722.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

McCausland, Jeffrey A. "Select Applications of Scanning Probe Microscopy to Group XIV Surfaces and Materials." University of Akron / OhioLINK, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=akron1510327417528433.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Hanyu, Yuki. "Chemical scanning probe lithography and molecular construction." Thesis, University of Oxford, 2010. http://ora.ox.ac.uk/objects/uuid:409308ed-4806-44fc-87c3-5c1fe8971f79.

Full text

Abstract:

The initiation and high resolution control of surface confined chemical reactions would be both beneficial for nanofabrication and fundamentally interesting. In this work, spatially controlled scanning probe directed organometallic coupling, patterned functional protein immobilisation and highly localised reversible redox reactions on SAMs were investigated. Catalytically active palladium nanoparticles were mounted on a scanning probe and an appropriate reagent SAM was scanned in a reagent solution. This instigated a spatially resolved organometallic coupling reaction between the solution and SAM-phase reagents. Within this catalytic nanolithography a spatial resolution of ~10nm is possible, equating to zeptomole-scale reaction. The methodology was applied to reactions such as Sonogashira coupling and local oligo(phenylene vinylene) synthesis. By altering the experimental protocols, relating probe scan velocity to reaction yield and characterising the nanopattern, a PVP matrix model describing a proposed mechanism of catalytic nanolithography, was presented. Though ultimately limited by probe deactivation, calculations indicated that activity per immobilised nanoparticle is very high in this configuration. For biopatterning, surface nanopatterns defined by carboxylic functionality were generated from methyl-terminated SAMs by local anodic oxidation (LAO) initiated by a conductive AFM probe. By employing suitable linker compounds, avidin and Stefin-A quadruple Mutant (SQM) receptive peptide aptamers were patterned at sub-100nm resolution. The multiplexed sensing capability of an SQM array was demonstrated by reacting generated patterns with single or a mixture of multiple antibodies. The reversible redox conversion and switching of reactivity of hydroquinone-terminated SAMs was electrochemically demonstrated prior to an application in redox nanolithography. In this methodology, spatially controlled probe-induced in situ "writing" and "erasing" based on reversible redox conversion were conducted on hydroquinone terminated SAM. In combination with dip-pen nanolithography, a novel method of redox electro-pen nanolithography was designed and the method’s application for lithography was examined.

APA, Harvard, Vancouver, ISO, and other styles

4

Ferguson, Josephus Daniel III. "Investigation of Surface Properties for Ga- and N-polar GaN using Scanning Probe Microscopy Techniques." VCU Scholars Compass, 2013. http://scholarscompass.vcu.edu/etd/3089.

Full text

Abstract:

Because the surface plays an important role in the electrical and optical properties of GaN devices, an improved understanding of surface effects should help optimize device performance. In this work, atomic force microscopy (AFM) and related techniques have been used to characterize three unique sets of n-type GaN samples. The sample sets comprised freestanding bulk GaN with Ga polar and N polar surfaces, epitaxial GaN films with laterally patterned Ga- and N-polar regions on a common surface, and truncated, hexagonal GaN microstructures containing Ga-polar mesas and semipolar facets. Morphology studies revealed that bulk Ga-polar surfaces treated with a chemical-mechanical polish (CMP) were the flattest of the entire set, with rms values of only 0.4 nm. Conducting AFM (CAFM) indicated unexpected insulating behavior for N-polar GaN bulk samples, but showed expected forward and reverse-bias conduction for periodically patterned GaN samples. Using scanning Kelvin probe microscopy, these same patterned samples demonstrated surface potential differences between the two polarities of up to 0.5 eV, where N-polar showed the expected higher surface potential. An HCl cleaning procedure used to remove the surface oxide decreased this difference between the two regions by 0.2 eV. It is possible to locally inject surface charge and measure the resulting change in surface potential using CAFM in conjunction with SKPM. After injecting electrons using a 10 V applied voltage between sample and tip, the patterned polarity samples reveal that the N-polar regions become significantly more negatively charged as compared to Ga-polar regions, with up to a 2 eV difference between charged and uncharged N polar regions. This result suggests that the N-polar regions have a thicker surface oxide that effectively stores charge. Removal of this oxide layer using HCl results in significantly decreased surface charging behavior. A phenomenological model was then developed to fit the discharging behavior of N-polar GaN with good agreement to experimental data. Surface photovoltage (SPV) measurements obtained using SKPM further support the presence of a thicker surface oxide for N polar GaN based on steady state and restoration SPV behaviors. Scanning probe microscopy techniques have therefore been used to effectively discriminate between the surface morphological and electrical behaviors of Ga- vs. N-polar GaN.

APA, Harvard, Vancouver, ISO, and other styles

5

Doutt, Daniel R. "THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE." The Ohio State University, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=osu1366199639.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Almqvist, Nils. "Scanning probe microscopy : Applications." Licentiate thesis, Luleå tekniska universitet, Materialvetenskap, 1994. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-17980.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

DjuricÌŒicÌŒ, Dejana. "Biological scanning probe microscopy (SPM)." Thesis, University of Oxford, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.403609.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Pinheiro, Lucidalva dos Santos. "Scanning probe microscopy of adsorbates." Thesis, University of Oxford, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.320589.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Howells, Samuel Charles. "Surface studies with scanning probe microscopy." Diss., The University of Arizona, 1992. http://hdl.handle.net/10150/185905.

Full text

Abstract:

Using scanning probe microscopy, several studies were carried out to characterize surface topographies and properties. First, utilizing scanning tunneling microscopy (STM), we characterized fullerenes deposited onto gold foils and highly oriented gold films. On gold foils, we found that C₆₀ packed in hexagonally ordered overlayers and that the images showed internal buckyball features that arose from electronic interactions between the molecule and the substrate. On gold films, with an ordered overlayer of methyl isobutyl ketone (MIBK), the isolated C₆₀ molecules showed internal features in a "doughnut" shape, different than those seen previously. We also imaged gold foils on which a significant number of larger fullerene molecules were deposited, and found only spherical molecules in our images. A theoretical analysis of the optical beam deflection atomic force microscope (AFM) predicted sufficient sensitivity to measure atomic corrugations greater than 1 A. This agreed with experimental results showing atomically resolvable images. Another theoretical investigation probe the relative magnitude of the forces between the tip, sample, and an adsorbed atom on a surface. Experimentally, we investigated cleaved multiple quantum wells ans showed surface corrugations with a period equal to the quantum well spacing. The third technique used was magnetic force microscopy (MFM). We analyzed a novel system that combined the tunneling aspects of STM with the force-sensing attributes of force microscopy, and provided the ability to simultaneously image surface features as well as magnetic domains with a sensitivity that depended on the spring constant of the tunneling tip. Experimentally, we used this system to image magnetic domains and reveal the surface roughness of magnetic recording media. The second MFM technique involved spin-coating a magnetic surface with a ferrofliud, then over-coating with gold, and finally imaging the surface with STM. The STM revealed raised ridges where the ferromagnetic particles clumped in regions of high magnetic field gradient. The finally MFM we utilized imaged magnetic fields using a beam deflection force microscope by modulating a magnetic disk head and detecting the vibration of the magnetic tip. We were able to image the fields of a floppy disk head.

APA, Harvard, Vancouver, ISO, and other styles

10

Liou, Je-Wen. "Scanning probe microscopy of photosynthetic membranes." Thesis, Imperial College London, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.398112.

Full text

APA, Harvard, Vancouver, ISO, and other styles

More sources

Books on the topic "Scanning probe microscopy. Nanoscience"

1

service), SpringerLink (Online, ed. Scanning Probe Microscopy in Nanoscience and Nanotechnology. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2010.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

2

Bhushan, Bharat, ed. Scanning Probe Microscopy in Nanoscience and Nanotechnology. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-03535-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Bhushan, Bharat. Scanning Probe Microscopy in Nanoscience and Nanotechnology 3. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

4

Bhushan, Bharat, ed. Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-10497-8.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Bhushan, Bharat, ed. Scanning Probe Microscopy in Nanoscience and Nanotechnology 3. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-25414-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Handbook of nanofabrication. Amsterdam: Elsevier, 2010.

Find full text

APA, Harvard, Vancouver, ISO, and other styles

7

Voigtländer, Bert. Scanning Probe Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Meyer, Ernst, Hans Josef Hug, and Roland Bennewitz. Scanning Probe Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-09801-1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Kalinin, Sergei, and Alexei Gruverman, eds. Scanning Probe Microscopy. New York, NY: Springer New York, 2007. http://dx.doi.org/10.1007/978-0-387-28668-6.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Foster, Adam, and Werner Hofer. Scanning Probe Microscopy. New York, NY: Springer New York, 2006. http://dx.doi.org/10.1007/0-387-37231-8.

Full text

APA, Harvard, Vancouver, ISO, and other styles

More sources

Book chapters on the topic "Scanning probe microscopy. Nanoscience"

1

Li, Yan, Mengkun Yue, Xue Feng, and Xufei Fang. "High-Temperature Scanning Probe Microscopy." In 21st Century Nanoscience – A Handbook, 1–1. Boca Raton, Florida : CRC Press, [2020]: CRC Press, 2020. http://dx.doi.org/10.1201/9780429340420-1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Peng, Luohan, Hyungoo Lee, and Hong Liang. "Scanning Probe Alloying Nanolithography." In Scanning Probe Microscopy in Nanoscience and Nanotechnology, 813–32. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03535-7_23.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Shigekawa, Hidemi, and Shoji Yoshida. "Ultrafast Optical Pump-Probe Scanning Probe Microscopy/Spectroscopy." In 21st Century Nanoscience – A Handbook, 3–1. Boca Raton, Florida : CRC Press, [2020]: CRC Press, 2020. http://dx.doi.org/10.1201/9780429340420-3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Nafari, Alexandra, Johan Angenete, Krister Svensson, Anke Sanz-Velasco, and Håkan Olin. "Combining Scanning Probe Microscopy and Transmission Electron Microscopy." In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 59–99. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-10497-8_3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Lee, Kiejin, Harutyun Melikyan, Arsen Babajanyan, and Barry Friedman. "Near-Field Microwave Microscopy for Nanoscience and Nanotechnology." In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 135–71. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-10497-8_5.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Peng, Luohan, Huiliang Zhang, Philip Hemmer, and Hong Liang. "Laser-Assisted Scanning Probe Alloying Nanolithography (LASPAN)." In Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, 3–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-25414-7_1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Leite, Fabio Lima, Alexandra Manzoli, Paulo Sérgio Paula de Herrmann, Osvaldo Novais Oliveira, and Luiz Henrique Capparelli Mattoso. "Scanning Probe Microscopy as a Tool Applied to Agriculture." In Scanning Probe Microscopy in Nanoscience and Nanotechnology, 915–44. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03535-7_26.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Hölscher, Hendrik, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, and Boris Anczykowski. "Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids." In Scanning Probe Microscopy in Nanoscience and Nanotechnology, 3–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03535-7_1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Ebner, A., L. A. Chtcheglova, J. Preiner, J. Tang, L. Wildling, H. J. Gruber, and P. Hinterdorfer. "Simultaneous Topography and Recognition Imaging." In Scanning Probe Microscopy in Nanoscience and Nanotechnology, 325–62. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03535-7_10.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Ziebarth, Noël M., Felix Rico, and Vincent T. Moy. "Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM." In Scanning Probe Microscopy in Nanoscience and Nanotechnology, 363–93. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03535-7_11.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Scanning probe microscopy. Nanoscience"

1

Watson, Jolanta, Christopher Brown, Sverre Myhra, and Gregory Watson. "Polymeric Surface Alteration via Scanning Probe Microscopy." In 2006 International Conference on Nanoscience and Nanotechnology. IEEE, 2006. http://dx.doi.org/10.1109/iconn.2006.340687.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Filippov, M. N., V. P. Gavrilenko, V. B. Mityukhlyaev, A. V. Rakov, and P. A. Todua. "Advance in dimensional measurements of nano-objects based on defocusing of the electron probe of a scanning electron microscope." In SPIE NanoScience + Engineering, edited by Michael T. Postek and Ndubuisi George Orji. SPIE, 2013. http://dx.doi.org/10.1117/12.2023056.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Bard, Allen J., Patrick R. Unwin, David O. Wipf, and Feimeng Zhou. "Scanning Electrochemical Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41416.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Reddick, Robin C. "Photon Scanning Tunneling Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41386.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Botkin, David, Shimon Weiss, D. F. Ogletree, Miguel Salmeron, and Daniel S. Chemla. "Ultrafast scanning probe microscopy." In OE/LASE '94, edited by Rick P. Trebino and Ian A. Walmsley. SPIE, 1994. http://dx.doi.org/10.1117/12.175874.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Möller, R., S. Akari, C. Baur, B. Koslowski, and K. Dransfeld. "Scanning Tunneling Microscopy and Photons." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41425.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Craighead, H. G. "Nanotechnology Prospects of Scanning Probes." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41402.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Völcker, M., W. Krieger, and H. Walther. "A Laser-Driven Scanning Tunneling Microscope." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41397.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Mulhern, P. J., B. L. Blackford, and M. H. Jericho. "Scanning Force Microscopy of a Cell Sheath." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41413.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Williams, C. C., J. Slinkman, D. W. Abraham, and H. K. Wickramasinghe. "Nanoscale Surface Characterization by Scanning Capacitance Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41427.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Scanning probe microscopy. Nanoscience"

1

Hawley, M. E., D. W. Reagor, and Quan Xi Jia. Scanning probe microscopy competency development. Office of Scientific and Technical Information (OSTI), December 1998. http://dx.doi.org/10.2172/562576.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Sarid, Dror. Studies in Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, November 1995. http://dx.doi.org/10.21236/ada307654.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Kelly, James J., and Dean C. Dibble. In-situ scanning probe microscopy of electrodeposited nickel. Office of Scientific and Technical Information (OSTI), October 2004. http://dx.doi.org/10.2172/920120.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Williams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Fort Belvoir, VA: Defense Technical Information Center, March 1988. http://dx.doi.org/10.21236/ada192710.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Foster, Mark D., and Seung-ho Moon. Nanomechanical Study of Model Pressure Sensitive Adhesives by Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, June 2002. http://dx.doi.org/10.21236/ada429212.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Fernandez Rodriguez, Rodolfo. Development and Implementation of Acoustic Feedback Control for Scanning Probe Microscopy. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.548.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

LeRoy, Brian. Understanding and Controlling the Electronic Properties of Graphene Using Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, July 2014. http://dx.doi.org/10.21236/ada612223.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Guikema, Janice Wynn. Scanning Hall Probe Microscopy of Magnetic Vortices inVery Underdoped yttrium-barium-copper-oxide. Office of Scientific and Technical Information (OSTI), December 2005. http://dx.doi.org/10.2172/877527.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Hsu, Julia. Surface structure and analysis with scanning probe microscopy and electron tunneling spectroscopy. Final report. Office of Scientific and Technical Information (OSTI), May 1998. http://dx.doi.org/10.2172/758935.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

Wu, Weida. In situ scanning probe microscopy studies of cross-coupled domains and domain walls. Final technical report. Office of Scientific and Technical Information (OSTI), October 2019. http://dx.doi.org/10.2172/1568814.

Full text

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!