Log in

Relevant bibliographies by topics / Scanning probe microscopy. Nanoscience / Journal articles

To see the other types of publications on this topic, follow the link: Scanning probe microscopy. Nanoscience.

Journal articles on the topic 'Scanning probe microscopy. Nanoscience'

Author: Grafiati

Published: 4 June 2021

Last updated: 13 February 2022

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic 'Scanning probe microscopy. Nanoscience.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Jesse, Stephen, Amit Kumar, Sergei V. Kalinin, Anil Gannepali, and Roger Proksch. "Band Excitation Scanning Probe Microscopies." Microscopy Today 18, no. 6 (November 2010): 34–40. http://dx.doi.org/10.1017/s155192951000101x.

Full text

Abstract:

Scanning probe microscopy (SPM) techniques have become a mainstay of nanoscience and nanotechnology by providing easy-to-use, gentle, structural imaging and manipulation on nanometer length scales. Beyond topographic imaging, SPMs have an extremely broad range of applications in probing electrical, magnetic, and mechanical properties. Despite impressive growth in applications, the traditional approach to SPM measurements—based on detection of cantilever response to a well-defined periodic excitation at a single frequency—has remained virtually identical for almost twenty years.

APA, Harvard, Vancouver, ISO, and other styles

2

XU, HAI, XIAN NING XIE, M. A. K. ZILANI, WEI CHEN, and ANDREW THYE SHEN WEE. "NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY." COSMOS 03, no. 01 (November 2007): 23–50. http://dx.doi.org/10.1142/s0219607707000256.

Full text

Abstract:

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.

APA, Harvard, Vancouver, ISO, and other styles

3

Ong, Eddie W., B. L. Ramakrishna, W. S. Glaunsinger, V. B. Pizziconi, and A. Razdan. "Remote Scanning Probe Microscopy and its Uses in Distancelearning and Educational Outreach." Microscopy and Microanalysis 7, S2 (August 2001): 810–11. http://dx.doi.org/10.1017/s1431927600030129.

Full text

Abstract:

Abstract: Tele-microscopy has become a very active area of research and development in the 1990s where there was a desire to give researchers better access to expensive and specialized microscopes, breaking geographical and time barriers. Rapid advances in telecommunication, computers, and microscopy technologies make possible the establishment of the World Wide Web and the realization of the goal of developing a “laboratory without walls”. This provides unprecedented opportunities for researchers and educators alike to gain access to shared instrumental and educational resources.In this presentation, a description of the Interactive Nano-Visualization for Science and Engineering Education (IN-VSEE) project will be given. The primary goals of IN-VSEE are to (i) convey the excitement of nanoscience and nanotechnology to promote studentmotivated learning and pursuit of science and engineering careers, (ii) teach fundamental interdisciplinary concepts in science and engineering using a visual format to help students learn and integrate information more effectively, (iii) provide students with the capability to routinely explore materials in three dimensions with resolutions at the nanoscale and even down to the atomic scale, and (iv) demonstrate the feasibility of remote operation of research-grade laboratory instrumentation for development into a powerful educational and collaborative tool.

APA, Harvard, Vancouver, ISO, and other styles

4

Huang, Boyuan, Ehsan Nasr Esfahani, and Jiangyu Li. "Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data." National Science Review 6, no. 1 (September 8, 2018): 55–63. http://dx.doi.org/10.1093/nsr/nwy096.

Full text

Abstract:

Abstract Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interest. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

APA, Harvard, Vancouver, ISO, and other styles

5

Yurtsever, Aycan, Renske M. van der Veen, and Ahmed H. Zewail. "Subparticle Ultrafast Spectrum Imaging in 4D Electron Microscopy." Science 335, no. 6064 (January 5, 2012): 59–64. http://dx.doi.org/10.1126/science.1213504.

Full text

Abstract:

Single-particle imaging of structures has become a powerful methodology in nanoscience and molecular and cell biology. We report the development of subparticle imaging with space, time, and energy resolutions of nanometers, femtoseconds, and millielectron volts, respectively. By using scanning electron probes across optically excited nanoparticles and interfaces, we simultaneously constructed energy-time and space-time maps. Spectrum images were then obtained for the nanoscale dielectric fields, with the energy resolution set by the photon rather than the electron, as demonstrated here with two examples (silver nanoparticles and the metallic copper–vacuum interface). This development thus combines the high spatial resolution of electron microscopy with the high energy resolution of optical techniques and ultrafast temporal response, opening the door to various applications in elemental analysis as well as mapping of interfaces and plasmonics.

APA, Harvard, Vancouver, ISO, and other styles

6

Schmid, I., J. Raabe, B. Sarafimov, C. Quitmann, S. Vranjkovic, Y. Pellmont, and H. J. Hug. "Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience." Ultramicroscopy 110, no. 10 (September 2010): 1267–72. http://dx.doi.org/10.1016/j.ultramic.2010.05.002.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Pathan, Abrarkhan M., Dhawal H. Agrawal, Pina M. Bhatt, Hitarthi H. Patel, and U. S. Joshi. "Design and Construction of Low Temperature Attachment for Commercial AFM." Solid State Phenomena 209 (November 2013): 137–42. http://dx.doi.org/10.4028/www.scientific.net/ssp.209.137.

Full text

Abstract:

With the rapid advancements in the field of nanoscience and nanotechnology, scanning probe microscopy has become an integral part of a typical R&D lab. Atomic force microscope (AFM) has become a familiar name in this category. The AFM measures the forces acting between a fine tip and a sample. The tip is attached to the free end of a cantilever and is brought very close to a surface. Attractive or repulsive forces resulting from interactions between the tip and the surface will cause a positive or negative bending of the cantilever. The bending is detected by means of a laser beam, which is reflected from the backside of the cantilever. Atomic force microscopy is currently applied to various environments (air, liquid, vacuum) and types of materials such as metal semiconductors, soft biological samples, conductive and non-conductive materials. With this technique size measurements or even manipulations of nano-objects may be performed. An experimental setup has been designed and built such that a commercially available Atomic Force Microscope (AFM) (Nanosurf AG, Easyscan 2) can be operated at cryogenic temperature under vacuum and in a vibration-free environment. The design also takes care of portability and flexibility of AFM i.e. it is very small, light weight and AFM can be used in both ambient and cryogenic conditions. The whole set up was assembled in-house at a fairly low cost. It is used to study the surface structure of nanomaterials. Important perovskite manganite Pr0.7Ca0.3MnO3thin films were studied and results such as morphology, RMS area and line roughness as well as the particle size have been estimated at cryogenic temperature.

APA, Harvard, Vancouver, ISO, and other styles

8

Rhodin, T. "Scanning probe microscopies, nanoscience and nanotechnology." Applied Physics A 72, S1 (March 2001): S141—S143. http://dx.doi.org/10.1007/s003390100751.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

FUJII, Masatoshi. "Scanning Probe Microscopy." Journal of Japan Oil Chemists' Society 49, no. 10 (2000): 1181–89. http://dx.doi.org/10.5650/jos1996.49.1181.

Full text

APA, Harvard, Vancouver, ISO, and other styles

10

MORITA, Seizo. "Scanning Probe Microscopy." Journal of the Vacuum Society of Japan 51, no. 12 (2008): 769–70. http://dx.doi.org/10.3131/jvsj2.51.769.

Full text

APA, Harvard, Vancouver, ISO, and other styles

11

Colton, Richard J., David R. Baselt, Yves F. Dufrêne, John-Bruce D. Green, and Gil U. Lee. "Scanning probe microscopy." Current Opinion in Chemical Biology 1, no. 3 (October 1997): 370–77. http://dx.doi.org/10.1016/s1367-5931(97)80076-2.

Full text

APA, Harvard, Vancouver, ISO, and other styles

12

Poggi, Mark A., Elizabeth D. Gadsby, Lawrence A. Bottomley, William P. King, Emin Oroudjev, and Helen Hansma. "Scanning Probe Microscopy." Analytical Chemistry 76, no. 12 (June 2004): 3429–44. http://dx.doi.org/10.1021/ac0400818.

Full text

APA, Harvard, Vancouver, ISO, and other styles

13

Lillehei, Peter T., and Lawrence A. Bottomley. "Scanning Probe Microscopy." Analytical Chemistry 72, no. 12 (June 2000): 189–96. http://dx.doi.org/10.1021/a10000108.

Full text

APA, Harvard, Vancouver, ISO, and other styles

14

Bottomley, Lawrence A., Joseph E. Coury, and Phillip N. First. "Scanning Probe Microscopy." Analytical Chemistry 68, no. 12 (January 1996): 185–230. http://dx.doi.org/10.1021/a1960008+.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

Bottomley, Lawrence A. "Scanning Probe Microscopy." Analytical Chemistry 70, no. 12 (June 1998): 425–76. http://dx.doi.org/10.1021/a1980011o.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Welland, M. E., A. W. McKinnon, J. R. Barnes, and S. J. O'Shea. "Scanning probe microscopy." Engineering Science and Education Journal 1, no. 5 (1992): 203. http://dx.doi.org/10.1049/esej:19920042.

Full text

APA, Harvard, Vancouver, ISO, and other styles

17

Poggi, Mark A., Lawrence A. Bottomley, and Peter T. Lillehei. "Scanning Probe Microscopy." Analytical Chemistry 74, no. 12 (June 2002): 2851–62. http://dx.doi.org/10.1021/ac025695w.

Full text

APA, Harvard, Vancouver, ISO, and other styles

18

Louder, Darrell R., and B. A. Parkinson. "Scanning Probe Microscopy." Analytical Chemistry 66, no. 12 (June 1994): 84–105. http://dx.doi.org/10.1021/ac00084a005.

Full text

APA, Harvard, Vancouver, ISO, and other styles

19

Weeks, Brandon L. "SCANNING: Probe Microscopy." Scanning 30, no. 2 (2008): 58. http://dx.doi.org/10.1002/sca.20102.

Full text

APA, Harvard, Vancouver, ISO, and other styles

20

Maddocks, J. L., and W. M. Heckl. "Scanning probe microscopy." Lancet 340, no. 8819 (September 1992): 600–601. http://dx.doi.org/10.1016/0140-6736(92)92126-z.

Full text

APA, Harvard, Vancouver, ISO, and other styles

21

Аkhmetova, А., and I. Yaminskiy. "Fast-scanning probe microscopy." Nanoindustry Russia 11, no. 7-8 (2018): 530–33. http://dx.doi.org/10.22184/1993-8578.2018.11.7-8.530.533.

Full text

APA, Harvard, Vancouver, ISO, and other styles

22

Chang, A. M., H. D. Hallen, L. Harriott, H. F. Hess, H. L. Kao, J. Kwo, R. E. Miller, R. Wolfe, J. van der Ziel, and T. Y. Chang. "Scanning Hall probe microscopy." Applied Physics Letters 61, no. 16 (October 19, 1992): 1974–76. http://dx.doi.org/10.1063/1.108334.

Full text

APA, Harvard, Vancouver, ISO, and other styles

23

Weiss, S., D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla. "Ultrafast scanning probe microscopy." Applied Physics Letters 63, no. 18 (November 1993): 2567–69. http://dx.doi.org/10.1063/1.110435.

Full text

APA, Harvard, Vancouver, ISO, and other styles

24

Michels, Thomas, and Ivo W. Rangelow. "Review of scanning probe micromachining and its applications within nanoscience." Microelectronic Engineering 126 (August 2014): 191–203. http://dx.doi.org/10.1016/j.mee.2014.02.011.

Full text

APA, Harvard, Vancouver, ISO, and other styles

25

Mody, Cyrus C. M. "STARS: Scanning Probe Microscopy [Scanning Our Past]." Proceedings of the IEEE 102, no. 7 (July 2014): 1107–12. http://dx.doi.org/10.1109/jproc.2014.2326811.

Full text

APA, Harvard, Vancouver, ISO, and other styles

26

Cambel, V., D. Gregušová, J. Fedor, R. Kúdela, and S. J. Bending. "Scanning vector Hall probe microscopy." Journal of Magnetism and Magnetic Materials 272-276 (May 2004): 2141–43. http://dx.doi.org/10.1016/j.jmmm.2003.12.865.

Full text

APA, Harvard, Vancouver, ISO, and other styles

27

SUGIMURA, Hiroyuki. "Nanofabrication Using Scanning Probe Microscopy." Journal of the Surface Finishing Society of Japan 49, no. 10 (1998): 1061–66. http://dx.doi.org/10.4139/sfj.49.1061.

Full text

APA, Harvard, Vancouver, ISO, and other styles

28

Wickramasinghe, H. K. "Progress in scanning probe microscopy." Acta Materialia 48, no. 1 (January 2000): 347–58. http://dx.doi.org/10.1016/s1359-6454(99)00303-1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

29

Glaunsinger, William S., B. L. Ramakrishna, Antonio A. Garcia, and Vincent Pizziconi. "Multidisciplinary Scanning Probe Microscopy Laboratory." Journal of Chemical Education 74, no. 3 (March 1997): 310. http://dx.doi.org/10.1021/ed074p310.

Full text

APA, Harvard, Vancouver, ISO, and other styles

30

Yeung, King Lun, and Nan Yao. "Scanning Probe Microscopy in Catalysis." Journal of Nanoscience and Nanotechnology 4, no. 7 (September 1, 2004): 647–90. http://dx.doi.org/10.1166/jnn.2004.097.

Full text

APA, Harvard, Vancouver, ISO, and other styles

31

Blücher, D. Bengtsson, J. E. Svensson, L. G. Johansson, M. Rohwerder, and M. Stratmann. "Scanning Kelvin Probe Force Microscopy." Journal of The Electrochemical Society 151, no. 12 (2004): B621. http://dx.doi.org/10.1149/1.1809590.

Full text

APA, Harvard, Vancouver, ISO, and other styles

32

Bacsa, W. S., and A. Kulik. "Interference scanning optical probe microscopy." Applied Physics Letters 70, no. 26 (June 30, 1997): 3507–9. http://dx.doi.org/10.1063/1.119215.

Full text

APA, Harvard, Vancouver, ISO, and other styles

33

Reneker, Darrell H., Rajkumari Patil, Seog J. Kim, and Vladimir Tsukruk. "Scanning-probe microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 874–75. http://dx.doi.org/10.1017/s0424820100150204.

Full text

Abstract:

Scanning probe microscopy techniques, particularly atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are finding a rapidly growing number of applications to both synthetic and biological polymers. Segments of individual polymer molecules can often be observed with atom scale resolution. Observation of polymeric objects as large as 100 microns with nanometer resolution is possible with contemporary AFM, although features caused by the convolution of the shape of the sample and the shape of the tip must be recognized and properly interpreted. The vertical resolution of the atomic force microscope readily provides precise data about the heights of molecules, crystals, and other objects.Lamellar crystals of polyethylene are well characterized objects with many features which can be observed with scanning probe microscopes. Figure 1 shows the fold surface near a fold domain boundary of a lamellar crystal of polyethylene, as observed with an AFM. The folded chain crystal is about 15 nm thick.

APA, Harvard, Vancouver, ISO, and other styles

34

Deshpande, Aparna, and Brian J. LeRoy. "Scanning probe microscopy of graphene." Physica E: Low-dimensional Systems and Nanostructures 44, no. 4 (January 2012): 743–59. http://dx.doi.org/10.1016/j.physe.2011.11.024.

Full text

APA, Harvard, Vancouver, ISO, and other styles

35

Chassagne, L., S. Blaize, P. Ruaux, S. Topçu, P. Royer, Y. Alayli, and G. Lérondel. "Note: Multiscale scanning probe microscopy." Review of Scientific Instruments 81, no. 8 (August 2010): 086101. http://dx.doi.org/10.1063/1.3473935.

Full text

APA, Harvard, Vancouver, ISO, and other styles

36

MURAMATSU, Hiroshi. "Scanning probe microscopy in water." Seibutsu Butsuri 36, no. 4 (1996): 189–91. http://dx.doi.org/10.2142/biophys.36.189.

Full text

APA, Harvard, Vancouver, ISO, and other styles

37

BOTTOMLEY, L. A. "ChemInform Abstract: Scanning Probe Microscopy." ChemInform 29, no. 34 (June 20, 2010): no. http://dx.doi.org/10.1002/chin.199834352.

Full text

APA, Harvard, Vancouver, ISO, and other styles

38

Gierling, M., P. Schneeweiss, G. Visanescu, P. Federsel, M. Häffner, D. P. Kern, T. E. Judd, A. Günther, and J. Fortágh. "Cold-atom scanning probe microscopy." Nature Nanotechnology 6, no. 7 (May 29, 2011): 446–51. http://dx.doi.org/10.1038/nnano.2011.80.

Full text

APA, Harvard, Vancouver, ISO, and other styles

39

Christmann, K. "Scanning Probe Microscopy — Analytical Methods." Zeitschrift für Physikalische Chemie 212, Part_2 (January 1999): 238–40. http://dx.doi.org/10.1524/zpch.1999.212.part_2.238.

Full text

APA, Harvard, Vancouver, ISO, and other styles

40

Kassing, R., I. W. Rangelow, E. Oesterschulze, and M. Stuke. "Sensors for scanning probe microscopy." Applied Physics A: Materials Science & Processing 76, no. 6 (April 1, 2003): 907–11. http://dx.doi.org/10.1007/s00339-002-1974-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

41

Firtel, M., and T. J. Beveridge. "Scanning probe microscopy in microbiology." Micron 26, no. 4 (1995): 347–62. http://dx.doi.org/10.1016/0968-4328(95)00012-7.

Full text

APA, Harvard, Vancouver, ISO, and other styles

42

Bloom, D. M. "Voltage-contrast scanning probe microscopy." Microelectronic Engineering 24, no. 1-4 (March 1994): 3–9. http://dx.doi.org/10.1016/0167-9317(94)90049-3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

43

Cocker, T. L., V. Jelic, R. Hillenbrand, and F. A. Hegmann. "Nanoscale terahertz scanning probe microscopy." Nature Photonics 15, no. 8 (July 30, 2021): 558–69. http://dx.doi.org/10.1038/s41566-021-00835-6.

Full text

APA, Harvard, Vancouver, ISO, and other styles

44

Coffey, Tonya, Gabor Zsuppan, and Robert Corbin. "Exploring Nanoscience and Scanning Electron Microscopy in K–12 Classrooms." Microscopy Today 23, no. 1 (January 2015): 44–47. http://dx.doi.org/10.1017/s1551929514001321.

Full text

APA, Harvard, Vancouver, ISO, and other styles

45

O’Neil, Glen D., Han-wen Kuo, Duncan N. Lomax, John Wright, and Daniel V. Esposito. "Scanning Line Probe Microscopy: Beyond the Point Probe." Analytical Chemistry 90, no. 19 (August 28, 2018): 11531–37. http://dx.doi.org/10.1021/acs.analchem.8b02852.

Full text

APA, Harvard, Vancouver, ISO, and other styles

46

Andreyuk, Denis. "NanoLaboratory Concept: A Platform Combining Advanced Scanning Probe Microscopy and Non-Scanning Probe Microscopy Methods." Journal of Scanning Probe Microscopy 1, no. 1 (June 1, 2006): 51–54. http://dx.doi.org/10.1166/jspm.2006.005.

Full text

APA, Harvard, Vancouver, ISO, and other styles

47

Miller, Steve. "Webworks: Scanning the Web for scanning probe microscopy." Analytical Chemistry 75, no. 19 (October 2003): 433 A—434 A. http://dx.doi.org/10.1021/ac031395i.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Hagmann, M. J. "Scanning frequency comb microscopy—A new method in scanning probe microscopy." AIP Advances 8, no. 12 (December 2018): 125203. http://dx.doi.org/10.1063/1.5047440.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

TAMAYO, Javier, and Mervyn MILES. "Scanning Probe Microscopy for Chromosomal Research." Archives of Histology and Cytology 65, no. 5 (2002): 369–76. http://dx.doi.org/10.1679/aohc.65.369.

Full text

APA, Harvard, Vancouver, ISO, and other styles

50

Meyer, Ernst, Suzanne P. Jarvis, and Nicholas D. Spencer. "Scanning Probe Microscopy in Materials Science." MRS Bulletin 29, no. 7 (July 2004): 443–48. http://dx.doi.org/10.1557/mrs2004.137.

Full text

Abstract:

AbstractThis brief article introduces the July 2004 issue of MRS Bulletin, focusing on Scanning Probe Microscopy in Materials Science.Those application areas of scanning probe microscopy (SPM) in which the most impact has been made in recent years are covered in the articles in this theme.They include polymers and semiconductors, where scanning force microscopy is now virtually a standard characterization method; magnetism, where magnetic force microscopy has served both as a routine analytical approach and a method for fundamental studies;tribology, where friction force microscopy has opened entirely new vistas of investigation;biological materials, where atomic force microscopy in an aqueous environment allows biosystems to be imaged and measured in a native (or near-native) state;and nanostructured materials, where SPM has often been the only approach capable of elucidating nanostructures.

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!