Relevant bibliographies by topics / Scanning Tunneling

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  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
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Academic literature on the topic 'Scanning Tunneling'

Author: Grafiati
Published: 4 June 2021
Last updated: 14 February 2022

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Journal articles on the topic "Scanning Tunneling"

1

Rozouvan, T. "Spatial resolution of scanning tunneling microscopy." Functional materials 22, no. 3 (2015): 365–69. http://dx.doi.org/10.15407/fm22.03.365.

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Sakurai, Toshio, Akiko Kobayashi, and Akira Sakai. "Scanning tunneling microscopy." Bulletin of the Japan Institute of Metals 25, no. 10 (1986): 821–31. http://dx.doi.org/10.2320/materia1962.25.821.

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SAKURAI, Toshio, Akiko KOBAYASHI, and Akira SAKAI. "Scanning tunneling microscopy." Nihon Kessho Gakkaishi 28, no. 6 (1986): 404–7. http://dx.doi.org/10.5940/jcrsj.28.404.

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LIEBER, CHARLES M. "SCANNING TUNNELING MICROSCOPY." Chemical & Engineering News 72, no. 16 (1994): 28–44. http://dx.doi.org/10.1021/cen-v072n016.p028.

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TOKUMOTO, Hiroshi, Hiroshi BANDO, and Koji KAJIMURA. "Scanning tunneling spectroscopy." Journal of the Spectroscopical Society of Japan 36, no. 6 (1987): 411–12. http://dx.doi.org/10.5111/bunkou.36.411.

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HOSOKI, Shigeyuki. "Scanning tunneling microscopy." Hyomen Kagaku 10, no. 10 (1989): 686–92. http://dx.doi.org/10.1380/jsssj.10.686.

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Zandvliet, Harold J. W., and Arie van Houselt. "Scanning Tunneling Spectroscopy." Annual Review of Analytical Chemistry 2, no. 1 (2009): 37–55. http://dx.doi.org/10.1146/annurev-anchem-060908-155213.

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Park, Sang‐il, and C. F. Quate. "Scanning tunneling microscope." Review of Scientific Instruments 58, no. 11 (1987): 2010–17. http://dx.doi.org/10.1063/1.1139508.

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Rohrer, H. "Scanning tunneling microscopy." Proceedings of the National Academy of Sciences 84, no. 14 (1987): 4666. http://dx.doi.org/10.1073/pnas.84.14.4666.

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TAGAWA, TAKASHI. "Scanning Tunneling Microscopy." Sen'i Gakkaishi 44, no. 6 (1988): P207—P210. http://dx.doi.org/10.2115/fiber.44.6_p207.

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Dissertations / Theses on the topic "Scanning Tunneling"

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Kulawik, Maria. "Low temperature scanning tunneling microscopy." Doctoral thesis, [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=979718848.

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Ding, Haifeng. "Spin-polarized scanning tunneling microscopy." [S.l. : s.n.], 2001. http://deposit.ddb.de/cgi-bin/dokserv?idn=963217186.

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Venkatachalam, Vivek. "Simulating scanning tunneling microscope measurements." Thesis, Massachusetts Institute of Technology, 2006. http://hdl.handle.net/1721.1/36116.

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Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2006.<br>Includes bibliographical references (leaf 25).<br>One of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line preamplifiers that can be placed at low temperatures. This thesis presents a simulation of the STM measurement chain, from tunneling tip to computer control. The goal is to see how noise at different stages of the measurement chain affect th
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Yee, Shannon. "Design of a scanning tunneling microscope." Connect to resource, 2007. http://hdl.handle.net/1811/25190.

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Thesis (Honors)--Ohio State University, 2007.<br>Title from first page of PDF file. Document formatted into pages: contains 110 p.; also includes graphics. Includes bibliographical references (p. 108-110). Available online via Ohio State University's Knowledge Bank.
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Heben, Michael J. Lewis Nathan Saul Lewis Nathan Saul. "Scanning tunneling microscopy in electrochemical environments /." Diss., Pasadena, Calif. : California Institute of Technology, 1990. http://resolver.caltech.edu/CaltechETD:etd-06122007-104233.

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Gustafsson, Alexander. "Theoretical modeling of scanning tunneling microscopy." Doctoral thesis, Linnéuniversitetet, Institutionen för fysik och elektroteknik (IFE), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-69012.

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The main body of this thesis describes how to calculate scanning tunneling microscopy (STM) images from first-principles methods. The theory is based on localized orbital density functional theory (DFT), whose limitations for large-vacuum STM models are resolved by propagating localized-basis wave functions close to the surface into the vacuum region in real space. A finite difference approximation is used to define the vacuum Hamiltonian, from which accurate vacuum wave functions are calculated using equations based on standard single-particle Green’s function techniques, and ultimately used
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Blackham, Ian George. "Scanning tunneling microscopy of electrode surfaces." Thesis, University of Oxford, 1992. https://ora.ox.ac.uk/objects/uuid:f9d27595-1177-406f-89a2-1448ac654dd3.

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A scanning tunneling microscope (STM) suitable for the in-situ study of electrode surfaces under electrochemical control has been developed. The system consists of commercially available software and feedback electronics, with a custom-built stage and electrochemical control. The stage incorporates an automatic coarse approach mechanism for ease of operation. Gold single crystal spheres (SCS) and gold on mica thin films have been studied as surfaces potentially suitable for samples in in-situ electrochemical STM experiments. Characteristic features of each surface have been identified. High re
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Gallagher, Mark Joseph. "Optical interactions with the scanning tunneling microscope." Diss., The University of Arizona, 1993. http://hdl.handle.net/10150/186450.

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This work investigates optical interactions with scanning tunneling microscopy with the intention of better understanding how light affects the output of the STM for different samples as well as how light can be emitted from the STM, possibly providing additional information about the surfaces examined. In Chapter 1, a variety of topographical, electronic and even magnetic surface maps, which were produced by STM, are presented to demonstrate the capabilities of state-of-the-art probe microscopy techniques. These images represent the results from a variety of materials investigations. The seco
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Henson, Tammy Deanne 1964. "Scanning tunneling microscopy of layered structure semiconductors." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276807.

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Semiconductors are characterized by atomic resolution imaging and density of states measurements (DOS) obtained through the use of a scanning tunneling microscope (STM). The DOS of the conduction and valence bands can be measured separately with a STM as opposed to an optical measurement which measures only the joint DOS. Layered-structure semiconductors are characterized both in the bulk form and in the isolated cluster form. Images of three bulk layered-structure semiconductors, MoS₂, WSe₂, and SnS₂, were obtained with both positive and negative sample-to-tip bias voltages. Curves of tunneli
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Tomic, Aleksandra T. "Scanning tunneling microscopy of complex electronic materials." Diss., Connect to online resource - MSU authorized users, 2008.

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Thesis (Ph.D.)--Michigan State University. Dept. of Physics and Astronomy, 2008.<br>Title from PDF t.p. (viewed on Mar. 27, 2009) Includes bibliographical references (p. 95-102). Also issued in print.
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Books on the topic "Scanning Tunneling"

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Neddermeyer, H., ed. Scanning Tunneling Microscopy. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-642-79366-0.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Springer Berlin Heidelberg, 1994. http://dx.doi.org/10.1007/978-3-642-79255-7.

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Güntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97343-7.

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Wiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5.

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8

Introduction to scanning tunneling microscopy. 2nd ed. Oxford University Press, 2008.

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Chen, C. Julian. Introduction to scanning tunneling microscopy. Oxford University Press, 1993.

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NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy (1989 Erice, Italy). Scanning tunneling microscopy and related methods. Kluwer Academic Publishers, 1990.

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Book chapters on the topic "Scanning Tunneling"

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Binning, G., and H. Rohrer. "Scanning tunneling microscopy." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_3.

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Muralt, P., and D. W. Pohl. "Scanning tunneling potentiometry." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_40.

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Voigtländer, Bert. "Scanning Tunneling Microscopy." In Scanning Probe Microscopy. Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0_20.

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Gerber, Ch, G. Binnig, H. Fechs, O. Marti, and H. Rohrer. "Scanning tunneling microscope combined with a scanning electron microscope." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_8.

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Fink, Hans-Werner. "Mono-atomic tips for scanning tunneling microscopy." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_10.

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Binnig, G., K. H. Frank, H. Fuchs, et al. "Tunneling Spectroscopy and Inverse Photoemission: Image and Field States." In Scanning Tunneling Microscopy. Springer Netherlands, 1985. http://dx.doi.org/10.1007/978-94-011-1812-5_11.

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Hamers, R. J., R. M. Tromp, and J. E. Demuth. "Surface Electronic Structure of Si(111)-(7 × 7) Resolved in Real Space." In Scanning Tunneling Microscopy. Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_12.

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Stroscio, Joseph A., R. M. Feenstra, D. M. Newns, and A. P. Fein. "Voltage-dependent scanning tunneling microscopy imaging of semiconductor surfaces." In Scanning Tunneling Microscopy. Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-011-1812-5_13.

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Wintterlin, J., J. Wiechers, H. Brune, T. Gritsch, H. Höfer, and R. J. Behm. "Atomic-Resolution Imaging of Close-Packed Metal Surfaces by Scanning Tunneling Microscopy." In Scanning Tunneling Microscopy. Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-011-1812-5_14.

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Wöll, Ch, S. Chiang, R. J. Wilson, and P. H. Lippel. "Determination of atom positions at stacking-fault dislocations on Au(111) by scanning tunneling microscopy." In Scanning Tunneling Microscopy. Springer Netherlands, 1989. http://dx.doi.org/10.1007/978-94-011-1812-5_15.

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Conference papers on the topic "Scanning Tunneling"

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Biegelsen, D. K. "Scanning Tunneling Spectroscopy." In 1988 Semiconductor Symposium, edited by Orest J. Glembocki, Fred H. Pollak, and Fernando A. Ponce. SPIE, 1988. http://dx.doi.org/10.1117/12.947433.

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Goudonnet, Jean-Pierre, Laurent Salomon, Frederique de Fornel, G. Chabrier, R. J. Warmack, and Trinidad L. Ferrell. "Photon scanning tunneling microscopy." In Singapore, edited by Manfred Lorenzen, Duncan R. J. Campbell, and Craig Johnson. SPIE, 1991. http://dx.doi.org/10.1117/12.47842.

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Reddick, Robin C. "Photon Scanning Tunneling Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41386.

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Xie, Ting, Michael Dreyer, David Bowen, et al. "A simple implementation of scanning tunneling potentiometry with a standard scanning tunneling microscope." In 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2017. http://dx.doi.org/10.1109/nano.2017.8117420.

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Bailey, Sheila. "Scanning Tunneling Optical Resonance Spectroscopy." In 1st International Energy Conversion Engineering Conference (IECEC). American Institute of Aeronautics and Astronautics, 2003. http://dx.doi.org/10.2514/6.2003-6043.

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Schuster, Gerard T., Sherif M. Hanafy, and Yunsong Huang. "Seismic Scanning Tunneling Macroscope: Theory." In SEG Technical Program Expanded Abstracts 2012. Society of Exploration Geophysicists, 2012. http://dx.doi.org/10.1190/segam2012-0434.1.

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Takeuchi, Koichiro, and Akira Mizuhara. "STOEM: Scanning Tunneling Optoelectronic Microscope." In Ultrafast Electronics and Optoelectronics. OSA, 1995. http://dx.doi.org/10.1364/ueo.1995.jwa4.

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T. Schuster, G., S. M. Hanafy, and Y. Huang. "Seismic Scanning Tunneling Macroscope - Theory." In 74th EAGE Conference and Exhibition incorporating EUROPEC 2012. EAGE Publications BV, 2012. http://dx.doi.org/10.3997/2214-4609.20148748.

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Bainier, Claudine, Daniel A. Courjon, J. Salvi, et al. "Resonant scanning tunneling optical microscope." In Lasers, Optics, and Vision for Productivity in Manufacturing I, edited by Christophe Gorecki. SPIE, 1996. http://dx.doi.org/10.1117/12.250788.

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Möller, R., S. Akari, C. Baur, B. Koslowski, and K. Dransfeld. "Scanning Tunneling Microscopy and Photons." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41425.

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Reports on the topic "Scanning Tunneling"

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Dow, John D. Scanning Tunneling Microscopy. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada249262.

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Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

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Taylor, A. J., G. P. Donati, G. Rodriguez, T. R. Gosnell, S. A. Trugman, and D. I. Some. Femtosecond scanning tunneling microscope. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/672306.

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Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/270266.

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Quate, C. F. Scanning Tunneling Microscopy of Semiconductor Surfaces. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada199836.

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Shedd, G. M., and P. E. Russell. Nanofabrication with the Scanning Tunneling Microscope. Office of Scientific and Technical Information (OSTI), 1988. http://dx.doi.org/10.2172/476650.

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Lyding, Joseph W. Cryogenic Ultrahigh Vacuum Scanning Tunneling Microscopy. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada262264.

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Lewis, Nathan S. Applications of Scanning Tunneling Microscopy to Electrochemistry. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada269129.

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Heben, M. J., T. L. Longin, R. Pyllki, R. M. Penner, R. Blumenthal, and N. S. Lewis. Applications of Scanning Tunneling Microscopy to Electrochemistry. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada263326.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/6017304.

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