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Journal articles on the topic 'Scanning Tunneling Microscopy [Tool]'

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Published: 7 September 2023

Last updated: 31 July 2025

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1

Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.

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2

Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of informatio

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3

Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demons

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4

Denley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.

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Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement

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5

van de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (1987): 108–12. http://dx.doi.org/10.1007/bf00469119.

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6

Rohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.

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7

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and oth

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8

Edel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (1991): 618. http://dx.doi.org/10.1116/1.585471.

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9

Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 959. http://dx.doi.org/10.1017/s0424820100162363.

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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM h

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10

XIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.

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Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typica

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11

SONG, SHAOTANG, JIE SU, XINNAN PENG, XINBANG WU, and MYKOLA TELYCHKO. "RECENT ADVANCES IN BOND-RESOLVED SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 28, no. 08 (2021): 2140007. http://dx.doi.org/10.1142/s0218625x21400072.

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Recent advances in bond-resolved scanning tunneling microscopy (BRSTM) have demonstrated the tremendous potential of this characterization technique to attain an ultra-high spatial resolution at the level of a single chemical bond. Due to such a unique ability to visualize chemical bonds, BRSTM has been recognized as a valuable characterization tool in the rapidly developing field of on-surface chemistry. In this paper, we discuss the recent experimental advances in BRSTM imaging techniques and their applications in the characterization of a wide scope of functional nanostructures, including i

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12

McCord, M. A., and R. F. W. Pease. "Scanning tunneling microscope as a micromechanical tool." Applied Physics Letters 50, no. 10 (1987): 569–70. http://dx.doi.org/10.1063/1.98137.

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13

Yu, Edward T. "Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures." MRS Bulletin 22, no. 8 (1997): 22–26. http://dx.doi.org/10.1557/s0883769400033765.

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As characteristic dimensions in semiconductor devices continue to shrink and as advanced heterostructure devices increase in prominence, the ability to characterize structure and electronic properties in semiconductor materials and device structures at the atomic to nanometer scales has come to be of outstanding and immediate importance. Phenomena such as atomic-scale roughness of heterojunction interfaces, compositional ordering in semiconductor alloys, discreteness and spatial distribution of dopant atoms, and formation of self-assembled nanoscale structures can exert a profound influence on

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14

Farrell, H. H., and M. Levinson. "Scanning tunneling microscope as a structure-modifying tool." Physical Review B 31, no. 6 (1985): 3593–98. http://dx.doi.org/10.1103/physrevb.31.3593.

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15

Reiss, G., and H. Brückl. "Electronic transport in metallic films — a tool for scanning tunneling microscopy investigations." Superlattices and Microstructures 11, no. 2 (1992): 171–74. http://dx.doi.org/10.1016/0749-6036(92)90245-z.

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16

García-García, Ricardo, and Juan JoséSáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science Letters 251-252 (July 1991): A320. http://dx.doi.org/10.1016/0167-2584(91)90859-p.

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17

García-García, Ricardo, and Juan José Sáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science 251-252 (July 1991): 223–27. http://dx.doi.org/10.1016/0039-6028(91)90986-3.

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18

Vang, Ronnie T., Jeppe V. Lauritsen, Erik Lægsgaard, and Flemming Besenbacher. "Scanning tunneling microscopy as a tool to study catalytically relevant model systems." Chemical Society Reviews 37, no. 10 (2008): 2191. http://dx.doi.org/10.1039/b800307f.

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19

Liu, J. B., Boyd Clark, and R. M. Fisher. "Applications of Scanning Tunneling Microscopy in the Materials Characterization Laboratory." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 316–17. http://dx.doi.org/10.1017/s0424820100180331.

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Scanning tunneling microscopy, first developed by G.Binnig, H.Rohrer, Ch.Gerber, and E.Weibel [1] in 1982 as a method of directly observing atom sites at the surface of graphite and other crystalline materials, is now being used in an ever increasing variety of applications as a result of steady and rapid advances in instrumentation, interpretation, and specimen handling techniques [2]. As a result the STM is widely recognized as a powerful method of observing surface structure on an atomic scale and is fast becoming an accessory tool in materials characterization laboratories that are devoted

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20

Mack, James F., Philip B. Van Stockum, Hitoshi Iwadate, and Fritz B. Prinz. "A combined scanning tunneling microscope–atomic layer deposition tool." Review of Scientific Instruments 82, no. 12 (2011): 123704. http://dx.doi.org/10.1063/1.3669774.

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21

Shedd, G. M., and P. Russell. "The scanning tunneling microscope as a tool for nanofabrication." Nanotechnology 1, no. 1 (1990): 67–80. http://dx.doi.org/10.1088/0957-4484/1/1/012.

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22

Joy, David C. "The Resolution of the SEM." Microscopy and Microanalysis 3, S2 (1997): 1173–74. http://dx.doi.org/10.1017/s1431927600012757.

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The resolution of any microscope is usually taken as the benchmark of its quality. When thinking about the scanning electron microscope(SEM) a comparison of its resolution to the resolutions quot-ed for other comparable instruments such as the transmission EM or the scanning tunneling micro-scope has unfortunately led some users to the view that the SEM is only a second best choice. In fact the spatial resolution that can be anticipated for an optimized SEM is highly competitive with its peers making it clearly the microscopy of choice.The resolution of the SEM depends on two classes of factor

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23

Hesjedal, T. "Scanning acoustic tunneling microscopy and spectroscopy: A probing tool for acoustic surface oscillations." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 15, no. 4 (1997): 1569. http://dx.doi.org/10.1116/1.589402.

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24

Ávila Bernal, Alba Graciela, and Ruy Sebastián Bonilla Osorio. "A study of surfaces using a scanning tunneling microscope (STM)." Ingeniería e Investigación 29, no. 3 (2009): 121–27. http://dx.doi.org/10.15446/ing.investig.v29n3.15194.

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Sweeping/scanning microscopes have become an experimental scientist's hands and eyes in this century; they have become a powerful and necessary tool for nanoscale characterisation in education and research laboratories all around the world. This article presents the modifications made in the mechanical (isolation or designing an antivibration system) and electrical (piezoelectric and scanning system characterisation) implementation of a scanning tunnelling microscope (STM), thereby allowing nanoscale surfaces to be visualised and modified. A methodology for visualising and characterising surfa

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25

Hsu, Julia W. P. "Semiconductor Defect Studies Using Scanning Probes." Microscopy and Microanalysis 6, S2 (2000): 704–5. http://dx.doi.org/10.1017/s1431927600036011.

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Understanding how defects alter physical properties of materials has lead to improvements in materials growth as well as device performance. Transmission electron microscopy (TEM) provides an invaluable tool for structural characterization of defects. Our current knowledge of crystallographic defects, such as dislocations, would not have been possible without TEM. Recently, scanning tunneling microscopy and scanning force microscopy (SFM) have shown the capability of imaging surface defects with atomic or near-atomic resolution in topographic images. What is more important is to gain knowledge

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26

Chernoff, Donald A. "Atomic-force microscopy: Exotic invention or practical tool?" Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 526–27. http://dx.doi.org/10.1017/s0424820100148460.

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The Scanning Tunneling and Atomic Force Microscopes are well-known due to their extraordinary capability of imaging atoms using a simple mechanism. However, atomic resolution is usually not needed to solve most problems in development and manufacturing. So, many scientists and engineers (mistakenly) regard these new microscopes as more “exotic” than practical.Both the AFM and the STM make 3-dimensional images of solid surfaces, but the AFM has much broader applications. The reason for this is that the AFM uses a universal sensing mechanism (repulsive and attractive mechanical forces), whereas

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27

Schönenberger, C., S. F. Alvarado, and C. Ortiz. "Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films." Journal of Applied Physics 66, no. 9 (1989): 4258–61. http://dx.doi.org/10.1063/1.343967.

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28

Ju, Bing-Feng, Wu-Le Zhu, Shunyao Yang, and Keji Yang. "Scanning tunneling microscopy-basedin situmeasurement of fast tool servo-assisted diamond turning micro-structures." Measurement Science and Technology 25, no. 5 (2014): 055004. http://dx.doi.org/10.1088/0957-0233/25/5/055004.

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29

Drost, Robert, Maximilian Uhl, Piotr Kot, et al. "Combining electron spin resonance spectroscopy with scanning tunneling microscopy at high magnetic fields." Review of Scientific Instruments 93, no. 4 (2022): 043705. http://dx.doi.org/10.1063/5.0078137.

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The continuous increase in storage densities and the desire for quantum memories and computers push the limits of magnetic characterization techniques. Ultimately, a tool that is capable of coherently manipulating and detecting individual quantum spins is needed. Scanning tunneling microscopy (STM) is the only technique that unites the prerequisites of high spatial and energy resolution, low temperature, and high magnetic fields to achieve this goal. Limitations in the available frequency range for electron spin resonance STM (ESR-STM) mean that many instruments operate in the thermal noise re

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30

Bilger, R., H. J. Cantow, J. Heinze, and S. Magonov. "Scanning tunneling microscope images of doped polypyrrole on ITO glass." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 16–17. http://dx.doi.org/10.1017/s0424820100152057.

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Scanning tunneling microscopy (STM) becomes an excellent tool for surface structure studies in the case of conductive and semiconductive materials. The STM has advantage of extending the range of SEM and TEM studies to topography measurements in the angstrom scale. This method also does not require special sample preparations and can be used in air. The polymers with electronic conductivity are among compounds to be studied by STM. Recently the STM images of doped polypyrrole were obtained for polymer molecules deposited on graphite. The authors claimed the observation of single polypyrrole ch

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31

Wang, Xuewen, Xuexia He, Hongfei Zhu, et al. "Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films." Science Advances 2, no. 7 (2016): e1600209. http://dx.doi.org/10.1126/sciadv.1600209.

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Driven by the development of high-performance piezoelectric materials, actuators become an important tool for positioning objects with high accuracy down to nanometer scale, and have been used for a wide variety of equipment, such as atomic force microscopy and scanning tunneling microscopy. However, positioning at the subatomic scale is still a great challenge. Ultrathin piezoelectric materials may pave the way to positioning an object with extreme precision. Using ultrathin CdS thin films, we demonstrate vertical piezoelectricity in atomic scale (three to five space lattices). With an in sit

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32

Kossakovski, Dmitri A., John D. Baldeschwieler, and J. L. Beauchamp. "Chemical Imaging With a Scanning Probe Microscope." Microscopy and Microanalysis 5, S2 (1999): 970–71. http://dx.doi.org/10.1017/s1431927600018171.

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Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning

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33

Bonnell, Dawn A., and Qian Zhong. "Local geometric and electronic structure of oxides using scanning tunneling microscopy/spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1480–81. http://dx.doi.org/10.1017/s0424820100132030.

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The potential of scanning tunneling microscopy (STM) and related scanning probe microscopies is amply demonstrated by the geometric increase in the number of papers utilizing the techniques that are published each year. The power of STM derives, not only from imaging capabilities, but also from associated spectroscopies which can provide local information about the density of states and work function. Although the technique has been applied to a wide range of metal and semiconductor surfaces, application to large bandgap materials such as oxides is difficult. We demonstrate the successful appl

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34

Revel, Jean-Paul. "Attaboy! Attoboys, or the new Zeptoscopists." Microscopy Today 1, no. 8 (1993): 2–3. http://dx.doi.org/10.1017/s1551929500069029.

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As the year ends there is a bumper crop of announcements of advances that I find absolutely amazing. First of course is the continued clever use of light as a veritable tool in manipulating everything from atoms (entrapping them in “atomic molasses”) to having tugs of war with biological motors (using “light tweezers”). But these developments will be for discussion another time. What I want to talk about in this installment are advances in Near Field Scanning Optical Microscopy (NSOM), which has now been used by Chichester and Betzig to visualize single molecules.In classical (far field) optic

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35

Yao, J. E., and G. Y. Shang. "A Simple Scanning Tunneling Microscope with Very Wide Scanning Range." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 314–15. http://dx.doi.org/10.1017/s042482010018032x.

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Scanning Tunneling Microscope (STM) has been a powerful tool for study of surfaces in the range of about 1 micrometer. The small field of view is enough for imaging homogeneous surfaces with atomic or near-atomic resolution. If, however, integrated circuits, gratings and other small “man-made” structures have to be observed, a STM with very wide scan range, for example, 10 to 100 micrometers is needed. In most of the STMs currently in use, three-dimensional scanner are fabricated from piezoceramic stacks, tubes and beams. The maximum scanning range is restricted to about a micrometer because o

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36

Rakovan, John, and F. Hochella Michael. "Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study." Microscopy and Microanalysis 4, S2 (1998): 600–601. http://dx.doi.org/10.1017/s1431927600023126.

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Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the inte

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37

Li, Weixuan, Jihao Wang, Jing Zhang, et al. "Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy." Micromachines 14, no. 2 (2023): 287. http://dx.doi.org/10.3390/mi14020287.

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Scanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of directly positioning and imaging a micron-sized sample with atomic resolution. Traditional STMs are designed to study the material behavior induced by temperature variation, while the physical properties induced by magnetic fields are rarely studied. In this paper, we present the design and construction

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38

Bogy, D. B. "Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip." Journal of Tribology 114, no. 3 (1992): 493–98. http://dx.doi.org/10.1115/1.2920910.

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Scanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and

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39

Wang, Meng-Jiao, Siegfried Wolff, and Burkhard Freund. "Filler-Elastomer Interactions. Part XI. Investigation of the Carbon-Black Surface by Scanning Tunneling Microscopy." Rubber Chemistry and Technology 67, no. 1 (1994): 27–41. http://dx.doi.org/10.5254/1.3538665.

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Abstract Scanning tunneling microscopy (STM) has recently been demonstrated to be a powerful and versatile tool to image the microstructure of the surface of carbonaceous materials. In this study, the surfaces of carbon blacks, both graphitized and nongraphitized, were investigated with this technique. The STM images show that the carbon-black surface can be classified into two domains, an organized and an unorganized one. The degree of carbon atom organization varies with the carbon-black grade and increases drastically upon graphitization. The surface energies and energy distributions of gra

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40

Ale Crivillero, Maria Victoria, Jean C. Souza, Vicky Hasse, et al. "Detection of Surface States in Quantum Materials ZrTe2 and TmB4 by Scanning Tunneling Microscopy." Condensed Matter 8, no. 1 (2023): 9. http://dx.doi.org/10.3390/condmat8010009.

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Scanning Tunneling Microscopy and Spectroscopy (STM/S), with its exceptional surface sensitivity and exquisite energy resolution, is well suited for the investigation of surface states down to atomic length scales. As such, it became an essential tool to probe the surface states of materials, including those with non-trivial topology. One challenge, however, can be the preparation of clean surfaces which allow the study of preferably unchanged surface properties with respect to the bulk amount. Here, we report on the STM/S of two materials, ZrTe2 and TmB4. The former cleaves easily and defects

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41

Barbier, Luc, and Denis Gratias. "High resolution scanning tunneling microscopy studies of quasicrystal surfaces: an efficient tool to investigate quasiperiodic atomic structures." Progress in Surface Science 75, no. 3-8 (2004): 177–89. http://dx.doi.org/10.1016/j.progsurf.2004.05.006.

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42

Wang, X., A. P. Liu, and X. H. Yang. "System design and new applications for atomic force microscope based on tunneling." International Journal of Modern Physics B 29, no. 25n26 (2015): 1542039. http://dx.doi.org/10.1142/s0217979215420394.

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The design of atomic force microscopy (AFM) with high resolution is introduced in this paper. Mainly, we have developed the system design of the apparatus based on tunneling. AFM.IPC-208B, this kind of apparatus combines scanning tunnel microscopy (STM) and AFM availability, and its lens body with original frame enhances the capability of the machine. In order to analyze the performance of AFM.IPC-208B, as a new tool in the field of Life Science, we make use of the system to study natural mica and molecular protein structures of Cattle-insulin and human antibody immunoglobulin G (IgG) coupled

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43

Wang, Tingting, Lingtao Zhan, Teng Zhang, et al. "Atomic Manipulation of 2D Materials by Scanning Tunneling Microscopy: Advances in Graphene and Transition Metal Dichalcogenides." Nanomaterials 15, no. 12 (2025): 888. https://doi.org/10.3390/nano15120888.

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This review provides a comprehensive overview of recent advances in atomic-scale manipulation of two-dimensional (2D) materials, particularly graphene and transition metal dichalcogenides (TMDs), using scanning tunneling microscopy (STM). STM, originally developed for high-resolution imaging, has evolved into a powerful tool for precise manipulation of 2D materials, enabling translational, rotational, folding, picking, and etching operations at the nanoscale. These manipulation techniques are critical for constructing custom heterostructures, tuning electronic properties, and exploring dynamic

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44

De Feyter, Steven, André Gesquière, Mohamed M. Abdel-Mottaleb, et al. "Scanning Tunneling Microscopy: A Unique Tool in the Study of Chirality, Dynamics, and Reactivity in Physisorbed Organic Monolayers." Accounts of Chemical Research 33, no. 8 (2000): 520–31. http://dx.doi.org/10.1021/ar970040g.

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45

Ammon, Maximilian, Tim Sander, and Sabine Maier. "On-Surface Synthesis of Porous Carbon Nanoribbons from Polymer Chains." J. Am. Chem. Soc. 139, no. 37 (2017): 12976–84. https://doi.org/10.1021/jacs.7b04783.

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We demonstrate the on-surface synthesis of porous carbon nanoribbons on Ag(111) via a preprogrammed isomerization of conformationally flexible polymer chains followed by dehydrogenation reactions using thermal annealing. The carbon chains are fabricated by polymerization of prochiral 1,3,5-tris(3-bromophenyl)benzene (<em>m</em>TBPB) directly on the surface using an Ullmann-type reaction. At room temperature, <em>m</em>TBPB partially self-assembles in halogen-bonded 2D networks, which transform into organometallic chains and rings after debromination. The chain and ring formation is facilitated

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46

Jeon, Sangjun, Yonglong Xie, Jian Li, Zhijun Wang, B. Andrei Bernevig, and Ali Yazdani. "Distinguishing a Majorana zero mode using spin-resolved measurements." Science 358, no. 6364 (2017): 772–76. http://dx.doi.org/10.1126/science.aan3670.

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One-dimensional topological superconductors host Majorana zero modes (MZMs), the nonlocal property of which could be exploited for quantum computing applications. We use spin-polarized scanning tunneling microscopy to show that MZMs realized in self-assembled Fe chains on the surface of Pb have a spin polarization that exceeds that stemming from the magnetism of these chains. This feature, captured by our model calculations, is a direct consequence of the nonlocality of the Hilbert space of MZMs emerging from a topological band structure. Our study establishes spin-polarization measurements as

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Cui, Daling, Jennifer M. MacLeod, and Federico Rosei. "Probing functional self-assembled molecular architectures with solution/solid scanning tunnelling microscopy." Chemical Communications 54, no. 75 (2018): 10527–39. http://dx.doi.org/10.1039/c8cc04341h.

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Abstract:

STM is emerging as a tool to elucidate and guide the use of self-assembled molecular systems in practical applications, including small molecule device engineering, molecular recognition and sensing and electronic modification of 2D materials.

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Liang, Ying-Xin. "Ultra-low-noise transimpedance amplifier in cryogenic STM for studying novel quantum states by measuring shot noise." Low Temperature Physics 49, no. 5 (2023): 619. http://dx.doi.org/10.1063/10.0017824.

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An ultra-low-noise large-bandwidth transimpedance amplifier (TIA) for cryogenic scanning tunneling microscope (CryoSTM) is proposed. The TIA connected with the tip-sample component in CryoSTM is called as CryoSTM-TIA. Its transimpedance gain is as high as 1 GΩ, and its bandwidth is over 300 kHz, but its equivalent input noise current power spectral density is less than 4 (fA)2/Hz at 100 kHz. The low inherent noise for the CryoSTM-TIA is due to its special design: (1) its pre-amplifier is made of a pair of low-noise cryogenic high electron mobility transistors (HEMTs); (2) the noise generated b

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Gao, Shang, Felix Flicker, Raman Sankar, et al. "Atomic-scale strain manipulation of a charge density wave." Proceedings of the National Academy of Sciences 115, no. 27 (2018): 6986–90. http://dx.doi.org/10.1073/pnas.1718931115.

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A charge density wave (CDW) is one of the fundamental instabilities of the Fermi surface occurring in a wide range of quantum materials. In dimensions higher than one, where Fermi surface nesting can play only a limited role, the selection of the particular wavevector and geometry of an emerging CDW should in principle be susceptible to controllable manipulation. In this work, we implement a simple method for straining materials compatible with low-temperature scanning tunneling microscopy/spectroscopy (STM/S), and use it to strain-engineer CDWs in 2H-NbSe2. Our STM/S measurements, combined wi

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Jalili, Nader, Mohsen Dadfarnia, and Darren M. Dawson. "A Fresh Insight Into the Microcantilever-Sample Interaction Problem in Non-Contact Atomic Force Microscopy." Journal of Dynamic Systems, Measurement, and Control 126, no. 2 (2004): 327–35. http://dx.doi.org/10.1115/1.1767852.

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Abstract:

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The non-contact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy, especially when utilized for reliable measurements of soft samples (e.g., biological species). Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) representation of t

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