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Journal articles on the topic 'Scanning Tunneling'

Author: Grafiati

Published: 4 June 2021

Last updated: 14 February 2022

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1

Rozouvan, T. "Spatial resolution of scanning tunneling microscopy." Functional materials 22, no. 3 (2015): 365–69. http://dx.doi.org/10.15407/fm22.03.365.

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2

Sakurai, Toshio, Akiko Kobayashi, and Akira Sakai. "Scanning tunneling microscopy." Bulletin of the Japan Institute of Metals 25, no. 10 (1986): 821–31. http://dx.doi.org/10.2320/materia1962.25.821.

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3

SAKURAI, Toshio, Akiko KOBAYASHI, and Akira SAKAI. "Scanning tunneling microscopy." Nihon Kessho Gakkaishi 28, no. 6 (1986): 404–7. http://dx.doi.org/10.5940/jcrsj.28.404.

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4

LIEBER, CHARLES M. "SCANNING TUNNELING MICROSCOPY." Chemical & Engineering News 72, no. 16 (1994): 28–44. http://dx.doi.org/10.1021/cen-v072n016.p028.

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5

TOKUMOTO, Hiroshi, Hiroshi BANDO, and Koji KAJIMURA. "Scanning tunneling spectroscopy." Journal of the Spectroscopical Society of Japan 36, no. 6 (1987): 411–12. http://dx.doi.org/10.5111/bunkou.36.411.

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6

HOSOKI, Shigeyuki. "Scanning tunneling microscopy." Hyomen Kagaku 10, no. 10 (1989): 686–92. http://dx.doi.org/10.1380/jsssj.10.686.

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7

Zandvliet, Harold J. W., and Arie van Houselt. "Scanning Tunneling Spectroscopy." Annual Review of Analytical Chemistry 2, no. 1 (2009): 37–55. http://dx.doi.org/10.1146/annurev-anchem-060908-155213.

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8

Park, Sang‐il, and C. F. Quate. "Scanning tunneling microscope." Review of Scientific Instruments 58, no. 11 (1987): 2010–17. http://dx.doi.org/10.1063/1.1139508.

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9

Rohrer, H. "Scanning tunneling microscopy." Proceedings of the National Academy of Sciences 84, no. 14 (1987): 4666. http://dx.doi.org/10.1073/pnas.84.14.4666.

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10

TAGAWA, TAKASHI. "Scanning Tunneling Microscopy." Sen'i Gakkaishi 44, no. 6 (1988): P207—P210. http://dx.doi.org/10.2115/fiber.44.6_p207.

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11

Griffith, J. E., and G. P. Kochanski. "Scanning Tunneling Microscopy." Annual Review of Materials Science 20, no. 1 (1990): 219–44. http://dx.doi.org/10.1146/annurev.ms.20.080190.001251.

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12

KAJIMURA, Koji, Hiroshi BANDO, Hiroshi TOKUMOTO, et al. "Scanning tunneling microscopy." Hyomen Kagaku 8, no. 1 (1987): 2–13. http://dx.doi.org/10.1380/jsssj.8.2.

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13

GIMZEWSKI, J. K. "Scanning tunneling microscopy." Le Journal de Physique IV 03, no. C7 (1993): C7–41—C7–48. http://dx.doi.org/10.1051/jp4:1993704.

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14

TSUDA, Nobuhiro. "Scanning Tunneling Microscope." Journal of the Society of Mechanical Engineers 91, no. 832 (1988): 209–15. http://dx.doi.org/10.1299/jsmemag.91.832_209.

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15

Muralt, P., and D. W. Pohl. "Scanning tunneling potentiometry." Applied Physics Letters 48, no. 8 (1986): 514–16. http://dx.doi.org/10.1063/1.96491.

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16

Hansma, Paul K., and Jerry Tersoff. "Scanning tunneling microscopy." Journal of Applied Physics 61, no. 2 (1987): R1—R24. http://dx.doi.org/10.1063/1.338189.

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17

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." IBM Journal of Research and Development 44, no. 1.2 (2000): 279–93. http://dx.doi.org/10.1147/rd.441.0279.

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18

Feenstra, Randall M. "Scanning tunneling spectroscopy." Surface Science 299-300 (January 1994): 965–79. http://dx.doi.org/10.1016/0039-6028(94)90710-2.

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19

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." Surface Science 152-153 (April 1985): 17–26. http://dx.doi.org/10.1016/0039-6028(85)90120-7.

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20

Binnig, G., and H. Rohrer. "Scanning tunneling microscopy." Surface Science Letters 152-153 (April 1985): A106. http://dx.doi.org/10.1016/0167-2584(85)90065-9.

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21

Salemink, H. "Scanning tunneling microscopy." Microelectronic Engineering 5, no. 1-4 (1986): 501–8. http://dx.doi.org/10.1016/0167-9317(86)90083-3.

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22

Schmidt-Ott, A., B. Marsen, and K. Sattler. "Characterizing nanoparticles by scanning tunneling microscopy and scanning tunneling spectroscopy." Journal of Aerosol Science 28 (September 1997): S729—S730. http://dx.doi.org/10.1016/s0021-8502(97)85363-3.

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23

Kubby, J. A. "“Stm” Scanning Tunneling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 196–97. http://dx.doi.org/10.1017/s0424820100125889.

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Abstract:

Scanning Tunneling Microscopy is a recently developed technique within the area of Scanned Image Microscopy that is based on tunneling between two conducting electrodes. This method offers, for the first time, the possibility of direct, real space determination of surface atomic and electronic structure in three dimensions on an atomic length scale, including nonperiodic structures.In this technique a sharp metal tip, mounted on a piezoelectric tripod that forms an orthogonal coordinate system, is brought to within a few Angstroms of the sample surface without “touching” the region to be scanned. A tunneling current I, on the order of 0.1 to 1 nA, is established by applying a bias between the tip and sample. The tunneling current is given to first order by;

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24

Ivanov-Omskii, V. I., A. B. Lodygin, and S. G. Yastrebov. "The scanning tunneling microscopy and scanning tunneling spectroscopy of amorphous carbon." Semiconductors 34, no. 12 (2000): 1355–62. http://dx.doi.org/10.1134/1.1331790.

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25

Pan, J., T. W. Jing, and S. M. Lindsay. "Tunneling Barriers in Electrochemical Scanning Tunneling Microscopy." Journal of Physical Chemistry 98, no. 16 (1994): 4205–8. http://dx.doi.org/10.1021/j100067a001.

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26

Möller, R., A. Esslinger, and M. Rauscher. "Tunneling tips imaged by scanning tunneling microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (1990): 434–37. http://dx.doi.org/10.1116/1.576414.

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27

Kawakatsu, Hideki, and Toshiro Higuchi. "A dual tunneling‐unit scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (1990): 319–23. http://dx.doi.org/10.1116/1.577097.

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28

Gentz, Knud, and Klaus Wandelt. "Electrochemical Scanning Tunneling Microscopy." CHIMIA International Journal for Chemistry 66, no. 1 (2012): 44–51. http://dx.doi.org/10.2533/chimia.2012.44.

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29

GOHSHI, Yohichi. "Analytical scanning tunneling microscope." Journal of the Japan Society for Precision Engineering 53, no. 12 (1987): 1841–44. http://dx.doi.org/10.2493/jjspe.53.1841.

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30

OHTSU, Motoichi, Shudong JIANG, and Hisao OHSAWA. "Photon Scanning Tunneling Microscope." Review of Laser Engineering 19, no. 8 (1991): 839–48. http://dx.doi.org/10.2184/lsj.19.8_839.

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31

WANG, Erkang. "Electrochemical Scanning Tunneling Microscopy." Analytical Sciences 10, no. 1 (1994): 155–56. http://dx.doi.org/10.2116/analsci.10.155.

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32

Binnig, Gerd, and Heinrich Rohrer. "The Scanning Tunneling Microscope." Scientific American 253, no. 2 (1985): 50–56. http://dx.doi.org/10.1038/scientificamerican0885-50.

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33

Guntherodt, H. ‐J, R. Wiesendanger, and Joseph Demuth. "Scanning Tunneling Microscopy I." Physics Today 46, no. 12 (1993): 43–44. http://dx.doi.org/10.1063/1.2809126.

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34

Karapetrov, G., M. Iavarone, W. K. Kwok, G. W. Crabtree, and D. G. Hinks. "Scanning Tunneling Spectroscopy inMgB2." Physical Review Letters 86, no. 19 (2001): 4374–77. http://dx.doi.org/10.1103/physrevlett.86.4374.

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35

Lewis, R. A., S. A. Gower, P. Groombridge, D. T. W. Cox, and L. G. Adorni‐Braccesi. "Student scanning tunneling microscope." American Journal of Physics 59, no. 1 (1991): 38–42. http://dx.doi.org/10.1119/1.16703.

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36

Kuk, Y., and P. J. Silverman. "Scanning tunneling microscope instrumentation." Review of Scientific Instruments 60, no. 2 (1989): 165–80. http://dx.doi.org/10.1063/1.1140457.

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37

Aguilar, M., P. J. Pascual, and A. Santisteban. "Scanning tunneling microscope automation." IBM Journal of Research and Development 30, no. 5 (1986): 525–32. http://dx.doi.org/10.1147/rd.305.0525.

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38

Reddick, R. C., R. J. Warmack, D. W. Chilcott, S. L. Sharp, and T. L. Ferrell. "Photon scanning tunneling microscopy." Review of Scientific Instruments 61, no. 12 (1990): 3669–77. http://dx.doi.org/10.1063/1.1141534.

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39

Friesen, Cody, Hermann Osterhage, Johannes Friedlein, Anika Schlenhoff, Roland Wiesendanger, and Stefan Krause. "Scanning Seebeck tunneling microscopy." Journal of Physics D: Applied Physics 51, no. 32 (2018): 324001. http://dx.doi.org/10.1088/1361-6463/aacfab.

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40

Dalidchik, F. I., M. V. Grishin, S. A. Kovalevskii, N. N. Kolchenko, and B. R. Shub. "Scanning Tunneling Vibrational Spectroscopy." Spectroscopy Letters 30, no. 7 (1997): 1429–40. http://dx.doi.org/10.1080/00387019708006735.

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41

Collins, Philip G., Jeffrey C. Grossman, Michel Côté, et al. "Scanning Tunneling Spectroscopy ofC36." Physical Review Letters 82, no. 1 (1999): 165–68. http://dx.doi.org/10.1103/physrevlett.82.165.

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42

Grafström, Stefan. "Photoassisted scanning tunneling microscopy." Journal of Applied Physics 91, no. 4 (2002): 1717–53. http://dx.doi.org/10.1063/1.1432113.

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43

Aiello, Clarice D. "Coherent scanning tunneling microscopy." Science 367, no. 6476 (2020): 368. http://dx.doi.org/10.1126/science.aba0714.

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44

Akamine, S., T. R. Albrecht, M. J. Zdeblick, and C. F. Quate. "Microfabricated scanning tunneling microscope." IEEE Electron Device Letters 10, no. 11 (1989): 490–92. http://dx.doi.org/10.1109/55.43113.

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45

Courjon, D., K. Sarayeddine, and M. Spajer. "Scanning tunneling optical microscopy." Optics Communications 71, no. 1-2 (1989): 23–28. http://dx.doi.org/10.1016/0030-4018(89)90297-6.

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46

Bapst, U. H. "Automated scanning tunneling microscope." Surface Science Letters 181, no. 1-2 (1987): A89. http://dx.doi.org/10.1016/0167-2584(87)90720-1.

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47

Bapst, U. H. "Automated scanning tunneling microscope." Surface Science 181, no. 1-2 (1987): 157–64. http://dx.doi.org/10.1016/0039-6028(87)90153-1.

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48

van de Walle, G. F. A., H. Van Kempen, P. Wyder, and C. J. Flipse. "Scanning tunneling microscopy and (scanning) tunneling spectroscopy on stepped Ni(111) / H." Surface Science Letters 181, no. 1-2 (1987): A82—A83. http://dx.doi.org/10.1016/0167-2584(87)90705-5.

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49

Van De Walle, G. F. A., H. Van Kempen, P. Wyder, and C. J. Flipse. "Scanning tunneling microscopy and (scanning) tunneling spectroscopy on stepped Ni(111)/H." Surface Science 181, no. 1-2 (1987): 27–36. http://dx.doi.org/10.1016/0039-6028(87)90138-5.

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50

ALVARADO, S. F. "SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY." Surface Review and Letters 02, no. 05 (1995): 607–17. http://dx.doi.org/10.1142/s0218625x95000571.

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