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Journal articles on the topic 'Selected area electron diffraction'

Author: Grafiati

Published: 2 June 2025

Last updated: 31 July 2025

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1

Turner, Shirley, Vicky L. Karen, and David S. Bright. "Phase Identification by Selected Area Electron Diffraction." Microscopy and Microanalysis 9, S02 (2003): 862–63. http://dx.doi.org/10.1017/s1431927603444310.

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2

Benner, G., J. Bihr, and E. Weimer. "Advantages of Koehler illumination for selected area diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1008–9. http://dx.doi.org/10.1017/s0424820100089354.

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The advantages of Koehler illumination for imaging are well known. This new mode of illumination in the Transmission Electron Microscope (TEM), however, provides advantageous results for all modes of operation of a TEM, in particular for Selected Area (SA) diffraction.In a conventional TEM, the last condenser lens is strongly excited (coherent illumination) to obtain selected area diffraction. The size of the diffraction spots is determined by the demagnified image of the electron source (cross-over) in the back focal plane of the objective lens. Since a large area of the specimen is illuminat

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3

Tivol, William F. "Selected Area Electron Diffraction and its Use in Structure Determination." Microscopy Today 18, no. 4 (2010): 22–28. http://dx.doi.org/10.1017/s1551929510000441.

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One of the capabilities of electron microscopes is to obtain diffraction patterns, which can be analyzed to give information about the structure of the specimen. This brief review discusses some of the technical considerations in using electron diffraction patterns for structural analysis. The technique of selected-area electron diffraction uses diffraction obtained from a limited region of the specimen.

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4

Delong, A., and V. Kolařík. "Selected area low energy electron diffraction and microscopy." Ultramicroscopy 17, no. 1 (1985): 67–72. http://dx.doi.org/10.1016/0304-3991(85)90178-0.

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5

Walck, Scott D. "Recipes for Consistent Selected Area Electron Diffraction Results: Part 3: Electron Diffraction Analysis Software." Microscopy Today 28, no. 4 (2020): 46–53. http://dx.doi.org/10.1017/s1551929520001066.

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6

YAMASAKI, Jun, and Nobuo TANAKA. "Electron Diffractive Imaging with Atomic Resolution by Using Selected Area Nano Diffraction." Nihon Kessho Gakkaishi 53, no. 5 (2011): 346–52. http://dx.doi.org/10.5940/jcrsj.53.346.

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7

Yamasaki, J., K. Ohta, S. Morishita, and N. Tanaka. "Quantitative phase imaging of electron waves using selected-area diffraction." Applied Physics Letters 101, no. 23 (2012): 234105. http://dx.doi.org/10.1063/1.4769457.

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8

Walck, S. D., and P. Ruzakowski-Athey. "Analysis of Selected Area Diffraction Patterns With Winjade." Microscopy and Microanalysis 4, S2 (1998): 342–43. http://dx.doi.org/10.1017/s1431927600021838.

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The analysis of Selected Area Diffraction (SAD) patterns that are collected from a single phase material having sufficient crystallites to provide continuous rings is relatively straightforward. However, when this condition is not met and there may be several phases present having rings of a spotty nature, the pattern is complex and can be quite difficult to analyze manually because of the vast number of discrete spots. WinJade from MDI is an X-ray diffraction (XRD) analysis program with an Electron Diffraction Program Module (EDPM) that can be used to aid in the analysis of SAD patterns. The

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9

Woodward, David I., and Ian M. Reaney. "Electron diffraction of tilted perovskites." Acta Crystallographica Section B Structural Science 61, no. 4 (2005): 387–99. http://dx.doi.org/10.1107/s0108768105015521.

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Simulations of electron diffraction patterns for each of the known perovskite tilt systems have been performed. The conditions for the appearance of superlattice reflections arising from rotations of the octahedra are modified to take into account the effects of different tilt systems for kinematical diffraction. The use of selected-area electron diffraction as a tool for perovskite structure determination is reviewed and examples are included.

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10

Russ, J. C., T. Taguchi, P. M. Peters, E. Chatfield, J. C. Russ, and W. D. Stewart. "Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals." Advances in X-ray Analysis 32 (1988): 593–600. http://dx.doi.org/10.1154/s0376030800020954.

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Conventional selected area diffraction patterns as obtained in the TEM present difficulties for identification of materials such as asbestifonn minerals, although diffraction data is considered to be one of the preferred methods for making this identification. The preferred orientation of the fibers in each field of measurement, and the spotty patterns that are obtained, do not readily lend themselves to measurement of the integrated intensity values for each dspacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires esti

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11

Eades, J. A. "Topics in Electron Diffraction (TEM): A Tutorial." Microscopy and Microanalysis 7, S2 (2001): 764–65. http://dx.doi.org/10.1017/s1431927600029895.

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Introduction. Electron diffraction is sometimes considered to be a “difficult subject”. It is certainly one that can not be covered in the space available here. Rather this tutorial will present a few specific aspects of the topic. The topics have been chosen in the hope that they will provide illumination that spreads more widely than just onto the material presented. Several books treat electron diffraction with more generality.Kikuchi lines Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD

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12

Liu, Delu. "Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy." Microscopy and Microanalysis 19, S5 (2013): 207–9. http://dx.doi.org/10.1017/s1431927613012671.

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AbstractInternational standard ISO-25498 specifies the method of selected area electron diffraction (SAED) analysis in TEM. It is applicable to the acquisition of SAED patterns, indexing the patterns and calibration of diffraction constant. Several features of this standard are introduced. As an example of the applications, phosphide with nanometer scale in a low-carbon steel produced by compact strip production process was analyzed by SAED and EDX. The phosphide precipitates in the steel are identified as MxP, where x is 2–3 and M is Fe, Ti, Cr, or Ni. It possesses a hexagonal lattice with la

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13

Daykin, A. C. "A report on speckle and coherent diffraction phenomena in selected-area transmission electron diffraction patterns." Ultramicroscopy 55, no. 2 (1994): 121–25. http://dx.doi.org/10.1016/0304-3991(94)90163-5.

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14

Li, Xing-Zhong. "QPCED2.0: a computer program for the processing and quantification of polycrystalline electron diffraction patterns." Journal of Applied Crystallography 45, no. 4 (2012): 862–68. http://dx.doi.org/10.1107/s0021889812027173.

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The processing and quantification of electron diffraction patterns have become vital in advanced electron crystallographic analysis work. A computer program,QPCED2.0, has been developed for the handling of selected-area electron diffraction patterns for polycrystalline materials.QPCED2.0can be used to enhance the visibility of electron diffraction patterns, to convert electron diffraction patterns into intensity profiles, and to retrieve precisely the latticedspacings and the integral intensities of the diffraction rings. The design and implementation ofQPCED2.0are elucidated and application e

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15

Ma, Jing Ling, Jiu Ba Wen, and Yan Fu Yan. "HRTEM Investigation of Precipitates in Al-Zn-In-Mg-Ti-Ce Anode Alloy." Advanced Materials Research 189-193 (February 2011): 1036–39. http://dx.doi.org/10.4028/www.scientific.net/amr.189-193.1036.

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The precipitates of Al-5Zn-0.02In-1Mg-0.05Ti-0.5Ce (wt %) anode alloy were studied by scanning electron microscopy, X-ray microanalysis, high resolution transmission electron microscopy and selected area electron diffraction analyses in the present work. The results show that the alloy mainly contains hexagonal structure MgZn2 and tetragonal structure Al2CeZn2 precipitates. From high resolution transmission electron microscopy and selected area electron diffraction, aluminium, Al2CeZn2 and MgZn2 phases have [0 1 -1]Al|| [1 -10]Al2CeZn2|| [-1 1 0 1]MgZn2orientation relation, and Al2CeZn2 and Mg

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16

Schwarzer, R. A. "The Determination of Local Texture by Electron Diffraction–A Tutorial Review." Textures and Microstructures 20, no. 1-4 (1993): 7–27. http://dx.doi.org/10.1155/tsm.20.7.

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Electron diffraction methods are briefly reviewed for the determination of individual grain orientations and for the measurement of SAD pole figures. The standard techniques of orientation determination grain by grain using a TEM are the interpretation of selected area electron spot and microbeam Kikuchi diffraction patterns. Electron-transparent thin samples are required. Specimen regions smaller than 500 nm or 10 nm in diameter, respectively, can be studied. Alternatively, quantitative pole figures can be measured using a TEM from selected areas down to 0.5 μm in diameter.The orientations of

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17

Eades, Alwyn. "Insights on Diffraction." Microscopy Today 10, no. 2 (2002): 34–35. http://dx.doi.org/10.1017/s1551929500057874.

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This article presents ideas on some topics related to electron diffraction in the TEM. These are in regard to topics that I have come to think of as standard parts of what it means to do microscopy. However, they represent insights that not all users share (or even agree with, maybe).Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD). This is because immersion lenses send parallel electrons, from different parts of the sample (like the Kikuchi lines from a flat specimen), to different places

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18

Barckhaus, R. H., I. Fromm, H. J. Höhling, and L. Reimer. "Advantage of Electron Spectroscopic Diffraction on Calcified Tissue Sections." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 362–63. http://dx.doi.org/10.1017/s0424820100135411.

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Different stages in the mineralization of calcified tissues can be investigated by electron diffraction. A disadvantage is the strong background below the Debye—Scherrer rings caused by the large massthickness of calcified products and the high ratio (≃ 3) of the inelastic—to—elastic scattering cross—sections of the embedding material. Therefore, a large fraction of the background consists of inelastically scattered electrons with energy losses. The electron spectroscopic diffraction (ESD) mode of an energy—filtering microscope (ZEISS EM902) allows to record diffraction patterns using only the

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19

Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure." Nanomaterials 11, no. 4 (2021): 962. http://dx.doi.org/10.3390/nano11040962.

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We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array

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20

Champness, P. E. "Convergent beam electron diffraction." Mineralogical Magazine 51, no. 359 (1987): 33–48. http://dx.doi.org/10.1180/minmag.1987.051.359.04.

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AbstractIn convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (⩽50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from the symmetry within the individual discs and the overall pattern. In order to determine the point group, it is usually necessary to record a number of CBED patterns with the electron beam aligned al

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21

Snigirev, L. A., D. A. Kirilenko, and N. A. Bert. "Strain determination in heterostructures by TEM in selected area electron diffraction mode." Journal of Physics: Conference Series 1697 (December 2020): 012119. http://dx.doi.org/10.1088/1742-6596/1697/1/012119.

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22

Weirich, Thomas E., Xiaodong Zou, Reiner Ramlau, et al. "Structures of nanometre-size crystals determined from selected-area electron diffraction data." Acta Crystallographica Section A Foundations of Crystallography 56, no. 1 (2000): 29–35. http://dx.doi.org/10.1107/s0108767399009605.

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23

Walck, Scott D. "Recipes for Consistent Selected Area Electron Diffraction Results: Part 1: Microscope Setup." Microscopy Today 28, no. 2 (2020): 40–44. http://dx.doi.org/10.1017/s1551929520000255.

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24

Mugnaioli, E., G. Capitani, F. Nieto, and M. Mellini. "Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope." American Mineralogist 94, no. 5-6 (2009): 793–800. http://dx.doi.org/10.2138/am.2009.2994.

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25

Bauer, R., W. Probst, and W.I. Miller. "Elemental imaging of thin specimens with an energy filtering electron microscope (EFEM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 524–25. http://dx.doi.org/10.1017/s0424820100104686.

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In conventional TEM (CTEM), image contrast is determined by scattering absorption contrast, diffraction contrast and phase contrast. Phase contrast is produced by the interference of unscattered electrons and elastically scattered electrons. Scattering absorption contrast and diffraction contrast are produced by angle selection of the scattered electrons using an objective aperture diaphragm for brightfield, darkfield and diffraction images.In an EFEM, with an integrated imaging electron energy-loss spectrometer, angle selection is used as in CTEM, but, additionally, it is possible to perform

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26

Reyes-Gasga, J., J. M. Montejano-Carrizales, and Miguel José-Yacamán. "Electron Diffraction Study of Pentagonal Cross-Sections Nanowires." Materials Science Forum 644 (March 2010): 91–95. http://dx.doi.org/10.4028/www.scientific.net/msf.644.91.

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The selected area electron diffraction patterns and structure of pentagonal cross-section nanowires reported for silver are commented and interpreted in is work. We show that they are closely related to a decahedron-base structure.

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27

Schwarzer, R. A. "Measurement of Local Textures With Transmission and Scanning Electron Microscopes." Textures and Microstructures 13, no. 1 (1990): 15–30. http://dx.doi.org/10.1155/tsm.13.15.

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Transmission and scanning electron microscopy methods are discussed for the determination of grain orientations. For the study of local textures with a TEM electron-transparent thin samples are required. The standard techniques of orientation determination grain by grain are the interpretation of selected area electron spot and microbeam Kikuchi diffraction patterns. Specimen areas smaller than 500 nm or 50 nm in diameter can be selected. More recently selected area pole-figures can be measured directly with a TEM technique similar to the conventional transmission X-ray method.The orientation

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28

Thompson, Michael R., Brian J. Riley, Mark E. Bowden, et al. "Crystal structure and chemistry of tricadmium digermanium tetraarsenide, Cd3Ge2As4." Acta Crystallographica Section E Crystallographic Communications 75, no. 9 (2019): 1291–96. http://dx.doi.org/10.1107/s2056989019010636.

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A cadmium germanium arsenide compound, Cd3Ge2As4, was synthesized using a double-containment fused quartz ampoule method within a rocking furnace and a melt-quench technique. The crystal structure was determined from single-crystal X-ray diffraction (SC-XRD), scanning and transmission electron microscopies (i.e. SEM, STEM, and TEM), and selected area diffraction (SAD) and confirmed with electron backscatter diffraction (EBSD). The chemistry was verified with electron energy loss spectroscopy (EELS).

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29

Barriga-Castro, Enrique Díaz, Javier García, Raquel Mendoza-Reséndez, Víctor M. Prida, and Carlos Luna. "Pseudo-monocrystalline properties of cylindrical nanowires confinedly grown by electrodeposition in nanoporous alumina templates." RSC Advances 7, no. 23 (2017): 13817–26. http://dx.doi.org/10.1039/c7ra00691h.

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Four different cylindrical nanowires systems with single-crystal-like properties have been characterized by transmission electron microscopy and selected area electron diffraction (SAED) under different tilting angles.

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30

Altınçekiç, Tuba Gürkaynak, Ismail Boz, and Selçuk Aktürk. "Synthesis and Characterization of Nanosized Cu/ZnO Catalyst by Polyol Method." Journal of Nanoscience and Nanotechnology 8, no. 2 (2008): 874–77. http://dx.doi.org/10.1166/jnn.2008.c197.

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Nanosized catalysts composed of metallic copper supported on zinc oxide have been synthesized by the polyol process. Average crystallite size of copper was between 10 and 45 nm. Cu/ZnO catalyst particles were characterized by various techniques, such as X-ray Powder Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Selected Area Electron Diffraction (SAED), and dynamic light scattering analysis (DLS).

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31

Diociaiuti, M., P. Picozzi, S. Santucci, L. Lozzi, and M. Crescenzi. "Extended electron energy-loss fine structure and selected-area electron diffraction studies of small palladium clusters." Journal of Microscopy 166, no. 2 (1992): 231–45. http://dx.doi.org/10.1111/j.1365-2818.1992.tb01521.x.

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32

Bekarevich, Raman, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, and Masaki Takeguchi. "Accurate determination of strains at layered materials by selected area electron diffraction mapping." Japanese Journal of Applied Physics 58, SI (2019): SIIA03. http://dx.doi.org/10.7567/1347-4065/ab19ac.

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33

Schofield, M. A., E. C. Mattson, S. H. Rhim, et al. "Quantitative In Situ Selected Area Electron Diffraction of Vacuum Thermally Reduced Graphene Oxide." Microscopy and Microanalysis 18, S2 (2012): 1576–77. http://dx.doi.org/10.1017/s1431927612009737.

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34

Gaillot, Anne-Claire, Victor A. Drits, and Bruno Lanson. "POLYMORPH AND POLYTYPE IDENTIFICATION FROM INDIVIDUAL MICA PARTICLES USING SELECTED AREA ELECTRON DIFFRACTION." Clays and Clay Minerals 68, no. 4 (2020): 334–46. http://dx.doi.org/10.1007/s42860-020-00075-9.

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35

Qi, Lehua, Miaoling Li, Hejun Li, Guozhong Xu, and Chuang Wang. "Research on precision-calibration techniques for selected area electron diffraction patterns of pyrocarbon." Microscopy Research and Technique 72, no. 4 (2009): 338–42. http://dx.doi.org/10.1002/jemt.20658.

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36

Weirich, Thomas E. "FINDS: an ImageJ script for rapid non-matrix diffraction spot identification in selected area electron diffraction patterns." Powder Diffraction 40, no. 1 (2024): 36–43. https://doi.org/10.1017/s0885715624000538.

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Phase characterization with selected area electron diffraction (SAED) represents a significant challenge when the pattern contains a substantial number of diffraction spots arranged in concentric but incomplete rings. This is a common situation when the crystallites are neither large enough to form a single crystal pattern nor sufficiently small and numerous to form continuous Debye-Scherrer rings. In such circumstances, it is often extremely difficult to distinguish between reflections belonging to a specific phase or to identify reflections that originate from secondary phases. To facilitate

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37

Tivol, W. F., J. N. Turner, and D. L. Dorset. "Ab initio structure analysis of copper perbromophthalocyanine." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1446–47. http://dx.doi.org/10.1017/s0424820100131863.

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The use of high-energy (1200 kV) electrons has been shown to be advantageous in the ab initio structure analysis from electron diffraction of organic compounds. Dynamical scattering from compounds containing heavy atoms may make such an analysis difficult or impossible with data obtained at conventional voltages. In the case that even high-energy electrons do not produce diffraction intensities sufficiently close to the kinematic values, criteria other than the simple minimization of the R-factor must be used to seek the correct structure solution.Copper perbromophthalocyanine (Cu-BrPTCY) was

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38

Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

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AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.

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39

Tsai, C., W. Gerberich, Z. P. Lu, J. Heberlein, and E. Pfender. "Characterization of thermal plasma CVD diamond coatings and the intermediate SiC phase." Journal of Materials Research 6, no. 10 (1991): 2127–33. http://dx.doi.org/10.1557/jmr.1991.2127.

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Diamond films have been successfully deposited by DC thermal plasma jet CVD at a rate of 40 μm/h under atmospheric and subatmospheric pressures. Transmission electron microscopy (TEM) has been used for the characterization of the diamond films and the intermediate phase. The orientation and the distribution of β-SiC at the interface between the diamond and silicon substrate have been observed using selected-area electron diffraction with the associated dark-field images. X-ray diffraction, scanning electron microscopy, and Raman spectroscopy are used for the characterization of the produced di

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40

Ma, Hongqiang, Kun Lin, Laijun Liu, et al. "Structure and electrical properties of tetragonal tungsten bronze Ba2CeFeNb4O15." RSC Advances 5, no. 94 (2015): 76957–62. http://dx.doi.org/10.1039/c5ra16115k.

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The crystal structure and electrical property of a tetragonal tungsten bronze ceramic, BaCeFeNb<sub>4</sub>O<sub>15</sub>, were investigated by synchrotron X-ray powder diffraction, selected area electron diffraction, and AC impedance spectroscopy.

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Rangasami, C., P. Malar, T. Osipowicz, Mahaveer K. Jain, and S. Kasiviswanathan. "Structure of melt-quenched AgIn3Te5." Powder Diffraction 26, no. 3 (2011): 248–55. http://dx.doi.org/10.1154/1.3624887.

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Polycrystalline AgIn3Te5 synthesized by melt-quench technique has been analyzed using proton induced X-ray emission (PIXE), X-ray diffraction (XRD), and selected area electron diffraction. PIXE analysis yielded the content of Ag, In, and Te, respectively, to be 9.76%, 31.18%, and 59.05% by weight. Structure refinement was carried out considering those space groups from I- and P-type tetragonal systems which possess 4 symmetry and preserve the anion sublattice arrangement of the chalcopyrite structure (space group: I42d) as well. The results showed that AgIn3Te5 synthesized by melt-quench metho

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42

Houšková, Vendula, Václav Štengl, Snejana Bakardjieva, Nataliya Murafa, and Václav Tyrpekl. "Photocatalytic properties of Ru-doped titania prepared by homogeneous hydrolysis." Open Chemistry 7, no. 2 (2009): 259–66. http://dx.doi.org/10.2478/s11532-009-0019-x.

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AbstractNanocrystalline titania particles doped with ruthenium oxide have been prepared by the homogenous hydrolysis of TiOSO4 in aqueous solutions in the presence of urea. The synthesized particles were characterized by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), High Resolution Transmission Electron Microscopy (HRTEM), Selected Area Electron Diffraction (SAED) and Nitrogen adsorption-desorption was used for surface area (BET) and porosity determination (BJH). The photocatalytic activity of the Ru-doped titania samples were determined by photocatalytic decomposition of Orange

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Xie, Juan, Wei Zhao, Li Bian, Ru Bin Feng, and Yan Xie. "Influence of External Factors on Anisotropic Growth Habit of ZnO Crystal." Advanced Materials Research 148-149 (October 2010): 1440–43. http://dx.doi.org/10.4028/www.scientific.net/amr.148-149.1440.

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Monodispersed ZnO micro/nanocrystals with various morphologies were successfully prepared via a simple solution route at low temperature. The products were characterized by means of scanning electron microscopy (SEM), X-ray diffraction (XRD), high-resolution transmission electron microscope (HRTEM), and selected area electron diffraction (SAED). Results suggest a close relationship between the morphology of ZnO and the external factors. Possible mechanisms for the controllable synthesis of ZnO particles are preliminarily discussed.

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44

Wang, Yan, Jian Liang Cao, Guang Sun та Zhan Ying Zhang. "Hydrothermal Synthesis of Porous α-Fe₂O₃ Nanorods". Materials Science Forum 694 (липень 2011): 195–99. http://dx.doi.org/10.4028/www.scientific.net/msf.694.195.

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Porous α-Fe2O3 nanorods were successfully prepared by the hydrothermal method. The structure and morphology of the as-prepared α-Fe2O3 nanorods were characterized by powder X-ray diffracton (XRD), scanning electron microscope (SEM), transmission electron microscopy (TEM), selected area electron diffraction (SAED) and N2-sorption analysis. XRD studies ind icated that the as-prepared product was well-crystallized hematite phase of α-Fe2O3. The SEM and TEM images showed that the obtained α-Fe2O3 sample consisted of porous nanorods with the length of about 200 nm and diameter of about 50 nm. N2-so

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Sławiński, Wojciech A., Øystein S. Fjellvåg, Amund Ruud та Helmer Fjellvåg. "A novel polytype – the stacking fault based γ-MoO3nanobelts". Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials 72, № 2 (2016): 201–8. http://dx.doi.org/10.1107/s2052520615024804.

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γ-MoO3nanobelts prepared by hydrothermal synthesis were studied by synchrotron radiation powder diffraction, scanning electron microscopy, transmission electron microscopy and selected area electron diffraction. Their nm dimensions, in particular in two crystallographic directions, have a profound influence on electrochemical properties during cycling as the cathode material in lithium-ion batteries (LIBs). The diffraction analysis shows clearly that the crystal structure for the γ-MoO3nanobelts differs significantly from that of bulk α-MoO3. The observed powder diffraction pattern, with asymm

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Van Buskirk, Peter C., Robin Gardiner, Peter S. Kirlin, and Steven Nutt. "Reduced-pressure MOCVD of highly crystalline BaTiO3 thin films." Journal of Materials Research 7, no. 3 (1992): 542–45. http://dx.doi.org/10.1557/jmr.1992.0542.

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Epitaxial BaTi3 films have been grown on NdGaO3 [100] substrates by reduced pressure MOCVD for the first time. The substrate temperature was 1000 °C and the total pressure was 4 Torr. Electron and x-ray diffraction measurements indicate highly textured, single phase films on the NdGaO3 substrate which are predominantly [100], with [110] also present. TEM and selected area electron diffraction (SAED) indicate two specific orientational relationships between the [110] and the [001] diffraction patterns.

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CHEN, H., X. K. LU, S. Q. ZHOU, X. H. HAO, and Z. X. WANG. "FABRICATION AND CHARACTERISTICS OF ALN NANOWIRES." Modern Physics Letters B 15, no. 30 (2001): 1455–58. http://dx.doi.org/10.1142/s0217984901003068.

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Single phase AlN nanowires are fabricated by a sublimation method. They were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), typical selected area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM). The SEM and TEM images show that most of the nanowires have diameters of about 10–60 nm. The crystal structure of AlN nanowires revealed by XRD, SAED and HRTEM shows the AlN nanowires have a wurtzite structure.

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Kenik, Edward A. "Spatial Resolution of Electron Backscatter Diffraction in a FEG-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 348–49. http://dx.doi.org/10.1017/s0424820100164209.

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Crystallographic information can be determined for bulk specimens in a SEM by utilizing electron backscatter diffraction (EBSD), which is also referred to as backscatter electron Kikuchi diffraction. This technique provides similar information to that provided by selected area electron channeling (SAEC). However, the spatial resolutions of the two techniques are limited by different processes. In SAEC patterns, the spatial resolution is limited to ˜2 μm by the motion of the beam on the specimen, which results from the angular rocking of the beam and the aberration of the probe forming lens. Th

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Kumar, Brajesh, Kumari Smita, Luis Cumbal, Alexis Debut, and Ravinandan Nath Pathak. "Sonochemical Synthesis of Silver Nanoparticles Using Starch: A Comparison." Bioinorganic Chemistry and Applications 2014 (2014): 1–8. http://dx.doi.org/10.1155/2014/784268.

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A novel approach was applied to synthesize silver nanoparticles using starch under sonication. Colloidal silver nanoparticles solution exhibited an increase of absorption from 420 to 440 nm with increase starch quantity. Transmission electron microscopy followed by selected area electron diffraction pattern analysis indicated the formation of spherical, polydispersed, amorphous, silver nanoparticles of diameter ranging from 23 to 97 nm with mean particle size of 45.6 nm. Selected area electron diffraction (SAED) confirmed partial crystalline and amorphous nature of silver nanoparticles. Silver

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Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "High Resolution Powder Electron Diffraction in Scanning Electron Microscopy." Materials 14, no. 24 (2021): 7550. http://dx.doi.org/10.3390/ma14247550.

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A modern scanning electron microscope equipped with a pixelated detector of transmitted electrons can record a four-dimensional (4D) dataset containing a two-dimensional (2D) array of 2D nanobeam electron diffraction patterns; this is known as a four-dimensional scanning transmission electron microscopy (4D-STEM). In this work, we introduce a new version of our method called 4D-STEM/PNBD (powder nanobeam diffraction), which yields high-resolution powder diffractograms, whose quality is fully comparable to standard TEM/SAED (selected-area electron diffraction) patterns. Our method converts a co

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