Dissertations / Theses on the topic 'Self test'
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Muradali, Fidel. "A self-driven test methodology for built-in self-test of sequential circuits /." Thesis, McGill University, 1996. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=42106.
Full textTest strategies based on pseudorandom test stimuli are attractive since the simplicity of the pattern generation logic facilitates on-chip test application. Unfortunately, until now, these methods have been more appropriate for testing combinational rather than sequential circuits. This is largely because, unlike combinational testing, detection of sequential faults can require specific orderings of circuit operations which are prohibitively difficult to produce using a pseudorandom source.
This thesis introduces a new DFT technique which permits at-speed on-chip sequential testing using parallel pseudorandom test patterns applied only to the primary inputs of the circuit under test. Test network design focuses on adjusting fault free circuit activity and aiding error propagation. This is done via the strategic insertion of a small number of low area test points. The resulting system is unique in that aside from a test mode flag, all I/O signals needed for test system operation are tapped from within the circuit itself. This feature virtually eliminates the control signal generation logic typically needed in other test point strategies. Also, as opposed to the conventional approach of restricting circuit alterations to the state elements, the proposed flexibility in choosing modification sites is beneficial when considering speed constrained designs.
Experiments demonstrate that high single stuck-at fault coverage is achieved for a number of benchmark circuits.
Muradali, Fidel. "A self-driven test methodology for built-in self-test of sequential circuits." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ30348.pdf.
Full textMiller, Ashley K. "Examining the Errors and Self-Corrections on the Stroop Test." Cleveland State University / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=csu1274111033.
Full textZhang, Shujian. "Evaluation in built-in self-test." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ34293.pdf.
Full textPrince, Ryan 1977. "A disposable, self-administered electrolyte test." Thesis, Massachusetts Institute of Technology, 2003. http://hdl.handle.net/1721.1/18029.
Full textIncludes bibliographical references.
This thesis demonstrates the novel concept that it is possible to make a disposable, self-administered electrolyte test to be introduced to the general consumer market. Although ion specific electrodes have been used to perform point of care electrolyte tests in supervised health care environments since 1992, there has never been a personalized self-administered test available in a supermarket or convenience store. This thesis lays out a novel approach to adapting ion specific electrode technology to produce such a test. The suitability and method of integration of miniature ion-specific electrode technology has been analyzed and shown to be viable for such a purpose. A microelectronic chip has been specifically designed to interface to the sensor, perform the necessary calibration and decision making, and indicate the results to the user. It has been determined that the sensor, the electronics, and the supporting structures will be small and inexpensive enough to be included on a commercial sport drink bottle. The blueprints for this extension, including the selection and integration of a suitable power source, and method of result indication have been specified and shown to support this thesis.
by Ryan Prince.
M.Eng.
Khalaf, Arkan. "A self-reconfigurable platform for built-in-self-test applications." Thesis, University of Ottawa (Canada), 2007. http://hdl.handle.net/10393/27865.
Full textOlbrich, Thomas. "Design-for-Test and Built-In-Self-Test for integrated systems." Thesis, Lancaster University, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312594.
Full textHo, Thanh Huong. "Test compaction technique for built-in self-test in VLSI circuits." Thesis, University of Ottawa (Canada), 1994. http://hdl.handle.net/10393/6460.
Full textXIONG, XINGGUO. "BUILT-IN SELF-TEST AND SELF-REPAIR FOR CAPACITIVE MEMS DEVICES." University of Cincinnati / OhioLINK, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1123038236.
Full textJervan, Gert. "Hybrid Built-In Self-Test and Test Generation Techniques for Digital Systems." Doctoral thesis, Linköping : Dept. of Computer and Information Science, Univ, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-2994.
Full textGoodby, James Laurence. "Test synthesis and self-test in high performance VLSI digital signal processing /." Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 1997. http://wwwlib.umi.com/cr/ucsd/fullcit?p9811793.
Full textBogue, Tracey M. "Aliasing reduction in built-in self-test." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk3/ftp04/nq21280.pdf.
Full textDhawan, Sanjay. "A built-in self-test PLA generator." Thesis, This resource online, 1991. http://scholar.lib.vt.edu/theses/available/etd-08042009-040315/.
Full textRose, Vanessa Karen Public Health & Community Medicine Faculty of Medicine UNSW. "Sociostructural determinants of diabetes self-management: test of a self-efficacy model." Awarded by:University of New South Wales. School of Public Health and Community Medicine, 2007. http://handle.unsw.edu.au/1959.4/31881.
Full textJervan, Gert. "High-Level Test Generation and Built-In Self-Test Techniques for Digital Systems." Licentiate thesis, Linköping : Univ, 2002. http://www.ep.liu.se/lic/science_technology/09/73/index.html.
Full textRadecka, Katarzyna. "Arithmetical built-in self test for DSP architectures." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp01/MQ29624.pdf.
Full textCastro, Javier Alejandro. "Robot self-configuration using a physical test harness." Thesis, Massachusetts Institute of Technology, 2008. http://hdl.handle.net/1721.1/46008.
Full textIncludes bibliographical references (leaves 101-102).
Robot control software packages require a configuration step prior to use. The configuration requires that robot parameters such as the dimensions of the robot, the radius of its wheels, and the location of sensors in body coordinates be provided to the system. Typically, this is accomplished through manual measurement. This thesis describes a method for automating the configuration of essential robot parameters - specifically the size of the wheel radii, the dimensions of the chassis, and the location of the wheelbase with respect to the body frame and compares the results of a preliminary configuration system for the CARMEN robot navigation toolkit to the parameters determined via user measurement. The method is able to estimate the parameters of morphologically analogous robots, for which the shape and sensor types are given, through the use of a physical test harness. The targeted family of robots consists of rectangular, two-wheeled, differential drive robots that are equipped with quadrature phase encoders and current-sensing capabilities. Parameters are discovered by placing the robot in a known physical environment and moving it throughout the enclosed area, performing experiments from which each of the parameters can be calculated. The resulting self-configured parameters are then compared quantitatively to user-measured parameters through several methods including a complete system comparison using the University of Michigan Benchmark (UMBmark) as the standard for comparison. The results demonstrate that while the self-configured parameters do not match user-measured values perfectly, the proposed method remains an adequate technique for automating the configuration of microbot-class robots for use with robotics toolkits.
by Javier Alejandro Castro.
M.Eng.
José, Costa Alves Diogo. "A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns." Universidade Federal de Pernambuco, 2009. https://repositorio.ufpe.br/handle/123456789/1831.
Full textA busca por novas funcionalidades no que diz respeito a melhoria da confiabilidade dos sistemas eletrônicos e também a necessidade de gerir o tempo gasto durante o teste faz do mecanismo Built-in-Self-Test (BIST) um característica promissora a ser integrada no fluxo atual de desenvolvimento de Circuitos Integrados (IC). Existem vários tipos de BIST: Memories BIST, Logical BIST (LBIST) e também alguns mecanismos usados para teste as partes analógicas do circuito. O LBIST tradicional usa um hardware on-chip para gerar todos os padrões de teste com um gerador pseudo aleatório (PRPG) e analisa a assinatura de saída gerada por um registrador de assinatura de múltipla entradas (MISR). Essa abordagem requer a inserção de pontos de teste extras or armazenagem de informação fora do chip que tornará possível alcançar uma cobertura de teste > 98%. Também a geração de todos os estímulos de teste implica no sacrifício no tempo aplicação do teste, o qual pode ser aceitável para pequenos sistemas executarem auto-teste durante a inicialização do sistema mas pode tornasse um aspecto negativo quando testando System-on-chip (SOC) ICs. O fluxo corrente de desenvolvimento de um IC insere scan chains e gera automaticamente padrões de teste de scan para alcançar uma alta cobertura para o teste de manufatura. Técnicas de compressão de dados provaram ser muito úteis para reduzir o custo de teste enquanto reduzem o volume de dados e o tempo de aplicação dos testes. Esse trabalho propõe o reuso de padrões de teste comprimidos usados durante o teste de manufatura para implementar um LBIST com objetivo de testar o circuito quando ele já está em campo. O mecanismo LBIST proposto objetiva descobrir defeitos que podem ocorrer devido ao desgasto do circuito. Uma arquitetura e um fluxo de desenvolvimento semi-automático do mecanísmo LBIST baseado em padrões de teste de scan são propostos e validados usando um SoC real como caso de teste
Bou, Sleiman Sleiman. "Built-in-Self-Test and Digital Self-Calibration for Radio Frequency Integrated Circuits." The Ohio State University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=osu1311685013.
Full textTamarapalli, Nagesh V. "A method of constructive test point insertion for scan-based built-in-self-test /." Thesis, McGill University, 1996. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=34464.
Full textIn general, pseudo-random BIST is effective only for combinational circuits. This is due to the difficulty associated in obtaining a specific sequence of vectors, through a pseudo-random source, that may be necessary for detecting a fault in a sequential circuit. Thus during test mode, the circuit-under-test (CUT) is transformed to a combinational circuit by configuring memory elements into scan chain(s). However, this may not suffice for circuits that contain random pattern resistant faults or faults not easily detected by random patterns.
Two distinct classes of solutions have been proposed to address the random pattern resistance problem--those that modify input patterns and those that modify the CUT. This thesis presents a new, effective circuit modification method for scan-based BIST of integrated circuits. The proposed circuit modification technique utilizes control and observation points to improve the fault coverage, much like the previous techniques. However, unlike the previous methods, the proposed technique is based on a constructive methodology. A divide and conquer approach is used to partition the entire test into multiple phases. In each phase control/observation points targeting a specific set of undetected faults are identified utilizing a new technique called probabilistic fault simulation. This technique blends fault-free simulation and analytical forward fault propagation to accurately compute the information necessary for the identification of control/observation points.
Observation points in the proposed scheme are kept enabled for the entire test. However, control points are enabled during specific test phases by fixed values. The usage of fixed values leads to a simple and inherent sharing of the logic driving them. This sharing, as well as the reduction of number of control points result in significant reduction in area overhead. Furthermore, fixed values reduce power dissipation during test mode, since control points instead of toggling are set to a constant value during the entire phase.
Experimental results indicate that complete or near-complete stuck-at fault coverage can be achieved by the proposed technique with the insertion of few test points and phases. Results show that modification of less than 1% of circuit nodes is sufficient to achieve complete coverage or greater than 99% coverage. In addition, the proposed techniques are fast and hence are applicable to large circuits.
Tamarapalli, Nagesh V. "A method of constructive test point insertion for scan-based built-in self-test." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ30398.pdf.
Full textIsaac, Jolly. "Comparing Basic Computer Literacy Self-Assessment Test and Actual Skills Test in Hospital Employees." Thesis, Walden University, 2015. http://pqdtopen.proquest.com/#viewpdf?dispub=3715299.
Full textA new hospital in United Arab Emirates (UAE) plans to adopt health information technology (HIT) and become fully digitalized once operational. The hospital has identified a need to assess basic computer literacy of new employees prior to offering them training on various HIT applications. Lack of research in identifying an accurate assessment method for basic computer literacy among health care professionals led to this explanatory correlational research study, which compared self-assessment scores and a simulated actual computer skills test to find an appropriate tool for assessing computer literacy. The theoretical framework of the study was based on constructivist learning theory and self-efficacy theory. Two sets of data from 182 hospital employees were collected and analyzed. A t test revealed that scores of self-assessment were significantly higher than they were on the actual test, which indicated that hospital employees tend to score higher on self-assessment when compared to actual skills test. A Pearson product moment correlation revealed a statistically weak correlation between the scores, which implied that self-assessment scores were not a reliable indicator of how an individual would perform on the actual test. An actual skill test was found to be the more reliable tool to assess basic computer skills when compared to self-assessment test. The findings of the study also identified areas where employees at the local hospital lacked basic computer skills, which led to the development of the project to fill these gaps by providing training on basic computer skills prior to them getting trained on various HIT applications. The findings of the study will be useful for hospitals in UAE who are in the process of adopting HIT and for health information educators to design appropriate training curricula based on assessment of basic computer literacy.
Isaac, Jolly Peter. "Comparing Basic Computer Literacy Self-Assessment Test and Actual Skills Test in Hospital Employees." ScholarWorks, 2015. http://scholarworks.waldenu.edu/dissertations/1294.
Full textSundström, Anna. "Developing and validating self-report instruments : assessing perceived driver competence." Doctoral thesis, Umeå universitet, Beteendevetenskapliga mätningar, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-26764.
Full textHuang, Li. "Family processes, low self-control, and deviance a longitudinal test of self-control theory /." Auburn, Ala., 2007. http://repo.lib.auburn.edu/2007%20Spring%20Dissertations/HUANG_LI_23.pdf.
Full textBlackley, William Sinclair. "Self test and self repair strategies in VLSI architectures for high speed digital correlation." Thesis, University of Edinburgh, 1985. http://hdl.handle.net/1842/14106.
Full textPedersen, Trond Jarle. "Automated Self-Test of an Analog Delta-Sigma Modulator." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon, 2007. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-16752.
Full textGopalan, Anand. "Built-in-self-test of RF front-end circuitry /." Link to online version, 2005. https://ritdml.rit.edu/dspace/handle/1850/942.
Full textDahir, Sarmad Jamal. "Functional Self-Test of DSP cores in a SOC." Thesis, KTH, Microelectronics and Information Technology, IMIT, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-4612.
Full textThe rapid progress made in integrating enormous numbers of transistors on a single chip is making it possible for hardware designers to implement more complex hardware architectures in their designs. Nowadays digital telecommunication systems are implementing several forms of SOC (System-On-Chip) structures. These SOCs usually contain a microprocessor, several DSP cores (Digital-Signal-Processors), other hardware blocks, on-chip memories and peripherals.
As new IC process technologies are deployed, with decreasing geometrical dimensions, the probabilities of hardware faults to occur during operation are increasing. Testing SOCs is becoming a very complex issue due to the increasing complexity of the design and the increasing need of a test mechanism that is able to achieve acceptable fault coverage in a short test application time with low power consumption without the use of external logic testers.
As a part of the overall test strategy for a SOC, functional self-testing of a DSP core is considered in this project to be applied in the field. This test is used to verify whether fault indications in systems are caused by permanent hardware faults in the DSP. If so, the DSP where the fault is located needs to be taken out of operation, and the board it sits on will be later replaced. If not, the operational state can be restored, and the system will become fully functional again.
The main purpose of this project is to develop a functional self-test of a DSP core, and to evaluate the characteristics of the test. This project also involves proposing a scheme on how to apply a functional test on a DSP core in an embedded environment, and how to retrieve results from the test. The test program shall run at system speed.
To develop and measure the quality of the test program, two different coverage metrics were used. The first is the code coverage metric achieved by simulating the test program on the RTL representation of the DSP. The second metric used was the fault coverage achieved. The fault coverage of the test was calculated using a commercial Fault Simulator working on a gate-level representation of the DSP. The results achieved in this report show that this proposed approach can achieve acceptable levels of fault coverage in short execution time without the need for external testers which makes it possible to perform the self-test in the field. This approach has the unique property of not requiring any hardware modifications in the DSP design, and the ability of testing several DSPs in parallel.
Lee, Catharine H. "The Parenting Styles Self-Test, reliability and construct validity." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape10/PQDD_0029/MQ62237.pdf.
Full textBale, Christopher. "Attractiveness and self-esteem : a test of sociometer theory." Thesis, University of Central Lancashire, 2010. http://clok.uclan.ac.uk/1860/.
Full textEl-Mahlawy, Mohamed Hassan Mohamed. "Pseudo-exhaustive built-in self-test for boundary scan." Thesis, University of Kent, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.324714.
Full textGaur, Manoj Singh. "Integration of built in self test during behavioural synthesis." Thesis, University of Southampton, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.427421.
Full textBayraktaroğlu, I̊smet. "Extending the reach of self-test approaches in VLSI /." Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 2001. http://wwwlib.umi.com/cr/ucsd/fullcit?p3029651.
Full textKwan, Tinna. "Psychometric properties of the Draw-A-Person Test." Thesis, The University of Arizona, 1989. http://hdl.handle.net/10150/277147.
Full textGarrison, Brooks Stroud Charles E. "Analysis and improvement of Virtex-4 block RAM Built-In Self-Test and introduction to Virtex-5 block RAM Built-In Self-Test." Auburn, Ala, 2009. http://hdl.handle.net/10415/1667.
Full textJessica, Lennvall. "OMFATTNING AV STI-TEST BLAND HÖGSKOLESTUDENTER." Thesis, Mälardalens högskola, Akademin för hälsa, vård och välfärd, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-32053.
Full textDe hälsorisker som kan förknippas med sexuellt beteende kan förebyggas genom att stärka individens identitet och självkänsla samt förmågan att hantera relationer till andra människor. Att öka kondomanvändningen bland unga och unga vuxna, 15 till 29 år, är ett sätt att minska smittspridningen av klamydia som är den vanligaste förekommande sexuellt överförbara infektionen (STI). Projektet Kärleksambassadörerna verkar på Mälardalens högskola och arbetar enligt metoden peer-to-peer education som innebär att studenter utbildar studenter. I denna studie beskrivs diffusionsteorin som handlar om spridningen av kunskap och self-efficacy som innebär tron på den egna förmågan att kunna påverka händelser som influerar individens liv. Syftet med denna studie var att undersöka utsträckning av testningen av STI och hiv bland högskolestudenter och om det fanns könsskillnader samt vilken kunskap om sexuell hälsa som efterfrågas. Som metod valdes en kvantitativ ansats med en tvärsnittsdesign. Sekundär data användes från en webbaserad enkätstudie som tillhandahölls från Landstinget Sörmland. Resultatet visar att den mest efterfrågade kunskapen gällande sexuell hälsa bland studenterna gäller smittvägar för STI och hur man får en relation att fungera bra. Nyckelord: högskolestudenter, Kärleksambassadörerna, self-efficacy, sexualitet, STI, tvärsnittsstudie.
Lloyd, David W. "Design methods for asynchronous circuits." Thesis, University of Nottingham, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.282817.
Full textZöllin, Christian G. [Verfasser], and Hans-Joachim [Akademischer Betreuer] Wunderlich. "Test planning for low-power built-in self test / Christian G. Zöllin. Betreuer: Hans-Joachim Wunderlich." Stuttgart : Universitätsbibliothek der Universität Stuttgart, 2015. http://d-nb.info/1065235917/34.
Full textLynch, Bridget Petersen. "Do Autonomous Individuals Strive for Self Positivity? A Test of the Universality of Self-Enhancement." University of Dayton / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=dayton1366371829.
Full textAnderson, Nicholas Lee. "A test of two models of non-suicidal self-injury." [Kent, Ohio] : Kent State University, 2009. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=kent1240238153.
Full textTitle from PDF t.p. (viewed Jan 12, 2010). Advisor: Janis Crowther. Keywords: worry, rumination, experiential avoidance, non-suicidal self-injury, functional model. Includes bibliographical references (p. 44-55).
Muradali, Fidel. "A new procedure for weighted random built-in self-test /." Thesis, McGill University, 1990. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=59424.
Full textMuch work has been done on the off-line development of compact test sets, but a problem which still remains is how to efficiently apply them on-chip. A means of transforming a given test set into a relatively short weighted sequence and pseudorandom sequence, whose cumulative fault coverages approximate that guaranteed by the original test set, is proposed.
The single weight set is formulated using a method which does not explicitly consider the circuit structure. Instead, sufficient circuit information contained in the given test set can be extracted using simulation techniques. This is done by analyzing a random pattern detection profile and isolating the vectors which cover faults difficult to detect using random patterns. After extracting the useful bits from these vectors, a weight set characteristic of the corresponding faults is estimated as the ratio of 1's to 0's at each bit (input) position.
The generation scheme is evaluated using five large scannable circuits. A local approach to on-chip pattern generation is examined.
Kantasuwan, Thana. "RF front-end CMOS design for build-in-self-test." Thesis, Linköping University, Department of Electrical Engineering, 2004. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-2642.
Full textIn this master degree work, a digital attenuator and a low noise amplifier (LNA) have been designed and integrated with the RF front-end receiver for IEEE 802.11b Wireless LAN standard. Firstly, the 4-bit digitally controlled attenuator has been designed with theattenuation range of 50 to 80 dB and reflection coefficient less than -25 dB. Next, the single stage wide band low noise amplifier with voltage gain larger than 14 dB and noise figure below 4 dB has been designed to operate at frequency 2.4 GHz. Finally, the integration with a down-conversion mixer has been done and evaluated its performance.
The attenuator and low noise amplifier desired in this thesis have been implemented using standard CMOS 0.35µm technology and validated by the simulation tools Cadence Spectre-RF.
Creighton-Lacroix, Wendy Denise. "The self-regulation of test anxiety using metacognitive strategy instruction." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 2000. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape3/PQDD_0014/NQ59617.pdf.
Full textHerbert, Carey Lynn 1967. "A test of self-control explanations of white-collar crime." Diss., The University of Arizona, 1997. http://hdl.handle.net/10150/288709.
Full textBarus, Jasa. "An analysis of aliasing in built-in self test procedure." Thesis, Monterey, California. Naval Postgraduate School, 1991. http://hdl.handle.net/10945/27945.
Full textTaylor, David. "Design of certain silicon semi-customised structures incorporating self-test." Thesis, University of Huddersfield, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329218.
Full textHsu, An-Chi, and 許安琪. "A Novel Test Pattern Generator for Built-In-Self-Test." Thesis, 2003. http://ndltd.ncl.edu.tw/handle/94567365087518651005.
Full text義守大學
電子工程學系
91
ABSTRACT The built-in-self-test (BIST) is a powerful test strategy for very large scale integrated circuit. The test pattern generator is a critical portion of an efficient BIST structure. In this paper, we blend the weighted-random-pattern generator and controllable-linear-feedback-shift register to develop a novel test pattern generator for BIST. The whole testing is performed in two phases. The weighted-random-pattern generator generates the test patterns to drop some of the faults from the fault list during the first phase fault simulations. During the second-phase fault simulations, remain faults will be tested by the test patterns generated by the controllable-linear-feedback-shift register. We adopt controllable-linear-feedback-shift register to generate the deterministic patterns instead of modifying the configuration of the weighted-random-pattern generator such that a better fault coverage can be achieved with a lower hardware cost and shorter test length. (Keywords: BIST; WRPG; CLFSR; Fault Coverage; Test Pattern Length)
Qi, Dandan. "Modified Geffe test pattern generator for built-in self-test." Thesis, 2005. http://hdl.handle.net/1828/2210.
Full textChen, Yi-Hoang, and 陳奕宏. "Innovation Battery Self-Discharge Characteristic Test." Thesis, 2019. http://ndltd.ncl.edu.tw/handle/b7jszp.
Full text遠東科技大學
電機工程研究所
107
AbstractCurrently, widely used mobile device battery or vehicle battery designers, in the past, it is a great challenge to quickly measure the self-discharge characteristics of their battery design. A large amount of space and personnel costs are required to store the batteries, and the data reproducibility of the test results is also problematic, time cost, and safety issues arise. This paper proposes a solution to solve the small cylindrical battery such as the 18650 or 21700 battery that is commonly used in the market. It can quickly determine the stable self-discharge current in 30 minutes to 2 hours, effectively reducing the time pressure and cost of product testing.Keywords: Boost converter, Buck converter,Pulse width modulation