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Relevant bibliographies by topics / SEM-BSE imaging

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Academic literature on the topic 'SEM-BSE imaging'

Author: Grafiati

Published: 5 June 2025

Last updated: 2 August 2025

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Journal articles on the topic "SEM-BSE imaging"

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White, Woody. "Coating Effects On BSE Imaging." Microscopy Today 8, no. 6 (2000): 40–41. http://dx.doi.org/10.1017/s1551929500052858.

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Poorly conducting specimens can be examined without coating by using a variable pressure SEM. However, many labs may only have a high vacuum SEM, or for other reasons, choose a high vacuum mode. In order to examine insulating specimens in a high vacuum SEM (using operating conditions conducive to BSE and X-ray analysis) specimens must be coated with a conductive thin film.The perspective of this article is from a materials point of view, but the principles remain the same for biological examinations requiring similar information.Back Scattered Electron (BSE) image contrast is primarily a funct

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Lewczuk, Bogdan, and Natalia Szyryńska. "Field-Emission Scanning Electron Microscope as a Tool for Large-Area and Large-Volume Ultrastructural Studies." Animals 11, no. 12 (2021): 3390. http://dx.doi.org/10.3390/ani11123390.

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The development of field-emission scanning electron microscopes for high-resolution imaging at very low acceleration voltages and equipped with highly sensitive detectors of backscattered electrons (BSE) has enabled transmission electron microscopy (TEM)-like imaging of the cut surfaces of tissue blocks, which are impermeable to the electron beam, or tissue sections mounted on the solid substrates. This has resulted in the development of methods that simplify and accelerate ultrastructural studies of large areas and volumes of biological samples. This article provides an overview of these meth

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Boyde, A., L. Lovicar, and J. Zamecnik. "Combining confocal and BSE SEM imaging for bone block surfaces." European Cells and Materials 9 (April 26, 2005): 33–38. http://dx.doi.org/10.22203/ecm.v009a05.

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Robinson, V. N. E. "Factors Affecting the Performance of Backscattered Electron Detectors at Low Beam Accelerating Voltages in SEM." Microscopy and Microanalysis 4, S2 (1998): 252–53. http://dx.doi.org/10.1017/s1431927600021383.

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The use of backscattered electron (BSE) imaging in low voltage scanning electron microscopy (SEM) has increased over the past few years. This appears to be due to several factors including improved performance of SEMs at low voltages, reduced beam penetration, more reliable metrology, improved atomic number (Z) contrast information (for low Z) and reduced charging artefacts over secondary electron (SE) imaging. Understanding the factors involved in low voltage BSE detection may assist in improving the information attainable.It has been shown that the signal Sdet from a BSE detector, for EB ≫ E

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Paulin, Jerome J. "Secondary and backscatter electron imaging of silver stained ciliated protozoa." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 230–31. http://dx.doi.org/10.1017/s0424820100142773.

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The use of secondary electron (SE) signals in the scanning electron microscope provides a wealth of information on the cortical topography of the ciliated protozoa. Surface manifestations of such morphogenetic events as cell division and regeneration can easily be visualized in the SE mode of the SEM, but concomitant alterations occurring below the surface of the cell can not be visualized. Ciliatologists have used the "Protargol" (silver protein) method to study the cortical features of the ciliates at the light microscopical level. The protein silver stain clearly reveals cilia, microtubules

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Erlandsen, Stanley L., Ya Chen, and Chris Frethem. "High Resolution Backscatter Electron (BSE) Imaging using the Autrata Modified YAG BSE Detector: Comparison of an In-lens Hitachi S-900 FESEM with the Below-the-Lens Hitachi S-4700 FESEM." Microscopy and Microanalysis 7, S2 (2001): 1046–47. http://dx.doi.org/10.1017/s1431927600031305.

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To obtain high resolution backscatter electron (BSE) images in field emission SEM (FESEM), one must consider selection of accelerating voltage, beam current, working distance between the specimen and the backscatter detector (in-lens or below-the-lens position for the specimen), the type of BSE detector, and the type of metal used to coat the specimen to improve conductivity and signal collection [1]. A new generation of below-the-lens FESEM have been tested for BSE imaging on biological samples, but no information exists on whether or not high resolution imaging is possible. Here we report th

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Lin, Wei-Ruei, Yun-Ju Chuang, Chih-Hao Lee, Fan-Gang Tseng, and Fu-Rong Chen. "Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM." Sensors 18, no. 9 (2018): 3093. http://dx.doi.org/10.3390/s18093093.

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Scanning electron microscopy has been developed for topographic analysis at the nanometer scale. Herein, we present a silicon p-n diode with multi-annular configuration to detect backscattering electrons (BSE) in a homemade desktop scanning electron microscope (SEM). The multi-annular configuration enables the enhancement of the topography contrast of 82.11 nA/μm as compared with the commercial multi-fan-shaped BSE detector of 40.08 nA/μm. Additionally, we integrated it with lateral p-n junction processing and aluminum grid structure to increase the sensitivity and efficiency of the multi-annu

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Wells, Oliver C. "Explanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory historical review." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 770–71. http://dx.doi.org/10.1017/s0424820100149684.

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Several different “twin-population” theories have been proposed to explain the high resolution backscattered electron (BSE) image in the scanning electron microscope (SEM). In all of these, the BSE are divided into local BSE that give an image having a resolution that is significantly better than the electron penetration depth R and diffused BSE that give a less sharp image. Other theories attach more importance to the diffused BSE.The BSE image was originally proposed by von Ardenne in 1940 with the specimen at right angles to the incident electron beam (Fig. 1). This has been summarised by M

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Chen, Ya, and David Wokosin. "Chromium Coating for High Resolution SEM." Microscopy and Microanalysis 3, S2 (1997): 1233–34. http://dx.doi.org/10.1017/s1431927600013052.

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High quality imaging of the macromolecular structure of biological samples can be obtained when combining high resolution SEM with advanced thin metal film coating techniques. A thin layer of fine grain metal film is often necessary to enrich the secondary electron (SE) signal generation and to enhance the contrast of features of interest, because the yield of SE signal from biological samples is low. Secondary electron signals, types SE-I and SE-II, are generated by primary beam at the impact point or by backscattered electrons (BSE) dislocated from the impact point, respectively (Peters, 198

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Peters, Klaus-Ruediger. "In environmental Scanning Electron Microscopy, the secondary electron signal reveals surface information not accessible by conventional backscattered electron signals." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 78–79. http://dx.doi.org/10.1017/s0424820100152367.

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Environmental scanning electron microscopes (ESEM) operate at high as well as at low vacuum (<2.5 kPa: ~20 Torr) but utilize all advantages of conventional high vacuum SEM (large specimen size, high depth of focus and specimen tilt capability, TV-rate scanning for imaging dynamic events). They have the advantage of imaging wet specimens as well as insulators without the need of any specimen preparation. Previously, environmental scanning microscopy was restricted to the BSE signal collected with BSE detectors. SE signals cannot be collected with the Everhart-Thornley detector because it can

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Book chapters on the topic "SEM-BSE imaging"

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Dyukov, Valentin G., and Sergej A. Nepijko. "Progress in determining of compound composition by BSE imaging in a SEM and the relevant detector disadvantages." In Advances in Imaging and Electron Physics. Elsevier, 2020. http://dx.doi.org/10.1016/bs.aiep.2020.06.004.

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Kovaleva, Elizaveta, and Dmitry A. Zamyatin. "Revealing microstructural properties of shocked and tectonically deformed zircon from the Vredefort impact structure: Raman spectroscopy combined with SEM microanalyses." In Large Meteorite Impacts and Planetary Evolution VI. Geological Society of America, 2021. http://dx.doi.org/10.1130/2021.2550(18).

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ABSTRACT Finite deformation patterns of accessory phases can indicate the tectonic regime and deformation history of the host rocks and geological units. In this study, tectonically deformed, seismically deformed, and shocked zircon grains from a granite sample from the core of the Vredefort impact structure were analyzed in situ, using a combination of Raman spectroscopy, backscatter electron (BSE) imaging, electron backscattered diffraction (EBSD) mapping, electron probe microanalyses (EPMA), energy-dispersive X-ray spectroscopy (EDS) qualitative chemical mapping, and cathodoluminescence (CL

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Conference papers on the topic "SEM-BSE imaging"

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Galliopoulou, Eirini C., Christopher Jones, Lawrence Coghlan, et al. "Creep Cavitation Imaging and Analysis in 9%Cr-1%Mo P91 Steels." In AM-EPRI 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.am-epri-2024p0219.

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Abstract The current research adopts a novel approach by integrating correlative microscopy and machine learning in order to study creep cavitation in an ex-service 9%Cr 1%Mo Grade 91 ferritic steel. This method allows for a detailed investigation of the early stages of the creep life, enabling identification of features most prone to damage such as precipitates and the ferritic crystal structure. The microscopy techniques encompass Scanning Electron Microscopy (SEM) imaging and Electron Back-scattered Diffraction (EBSD) imaging, providing insights into the two-dimensional distribution of cavi

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Demarest, J., K. Chanda, S. Klepeis, et al. "Image Intensity Analysis for Defect Localization Utilizing SEM BSE Imaging." In ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0289.

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Abstract Failure analysts occasionally find themselves faced with the problem of having one of the various defect isolation techniques indicating a defect location, and yet no defect is readily visible through the various imaging methods available. Many common conventional imaging tools, such as scanning electron microscopes (SEM), display images in shades of gray. The human eye is inherently more sensitive to changes in color rather than changes in grayscale. As a result, subtle variations in grayscale which could indicate the defect location can go unobserved unless a careful examination of

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Žnidaršič, Nada. "Correlative TEM - SEM BSE imaging and elemental analysis of mineralizing epithelial cells." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.784.

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Rau, Eduard. "Improved 3D imaging of the topography with novel BSE detectors arrangement in SEM." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.548.

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Chiu, Re-Long, Hui Zhang, Wen-Szu Chung, Mark Cherng, and Xu Liu. "Beam-Based Localization Techniques for 0.18um IC Failure Analysis After Reliability Test." In ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0245.

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Abstract Locating the defect site in current devices is complicated by their density and size. Voltage contrast (VC) imaging and backscattered electron (BSE) imaging are non-destructive beam-based location techniques. We can locate the defect to single poly line, contact and via by combining EMMI, LC, layout and bit map address information. Some reliability failure analysis cases are presented to demonstrate the effectiveness of the beam-based techniques. VC imaging and BSE imaging are used to locate the defect site precisely. The subsequent steps include deprocess and precision FIB cut for sa

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Al-Sayegh, Saleh, Ralph Flori, Waleed Al-Bazzaz, et al. "Practical Imaging Applications of Wettability Contact Angles on Kuwaiti Tight Carbonate Reservoir with Different Rock Types." In Gas & Oil Technology Showcase and Conference. SPE, 2023. http://dx.doi.org/10.2118/214165-ms.

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Abstract This study focuses on a tight carbonate reservoir which is located in Northern Kuwait and is classified as an unconventional reservoir. A practical imaging technique of wettability contact angle (θ°) presents "big data" as well as relative-permeability (Krw and Kro) measurements. Also, modeling, through rock image technology, the vast well-documented grain/pore boundary morphology available inside fresh rock fragments have achieved good results. Conventional laboratory relative-permeability experiments are expensive and time-consuming. This study introduces a novel method to measure/c

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Campbell, Ann N., William F. Filter, and Nicholas Antoniou. "Die Backside FIB Preparation for Identification and Characterization of Metal Voids." In ISTFA 1999. ASM International, 1999. http://dx.doi.org/10.31399/asm.cp.istfa1999p0317.

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Abstract Both the increased complexity of integrated circuits, resulting in six or more levels of integration, and the increasing use of flip-chip packaging have driven the development of integrated circuit (IC) failure analysis tools that can be applied to the backside of the chip. Among these new approaches are focused ion beam (FIB) tools and processes for performing chip edits/repairs from the die backside. This paper describes the use of backside FIB for a failure analysis application rather than for chip repair. Specifically, we used FIB technology to prepare an IC for inspection of void

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Al-Sayegh, Saleh, Ralph Flori, Waleed Al-Bazzaz, Abdulaziz Abbas, Ali Qubian, and Hasan Al-Saedi. "A Novel Technique for the Quantitative Determination of Wettability of a Severely Heterogeneous Tight Carbonate Reservoir." In Gas & Oil Technology Showcase and Conference. SPE, 2023. http://dx.doi.org/10.2118/214114-ms.

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Abstract The objective of this study is to accurately measure the wettability contact angle of a cretaceous carbonate reservoir in a vertical well set-up known for as an unconventional tight carbonate oil reservoir. Also, to investigate the relative heterogeneity of these samples using digitally captured images; these images accurately capture natural pore-system in this carbonate rock samples and their wettability performance attributed towards building a vertical depth wettability/ heterogeneity model. To capture, measure and model natural tight matrix static contact angle wettability in ord

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Al-Sayegh, Saleh, Ralph Flori, Waleed Hussien Al-Bazzaz, Hasan Al-Saedi, Mostafa Al-Kaouri, and Ali Qubian. "Kuwaiti Carbonate Reservoir Oil Recovery Prediction Through Static Wettability Contact Angle Using Machine Learning Modeling." In SPE/IATMI Asia Pacific Oil & Gas Conference and Exhibition. SPE, 2023. http://dx.doi.org/10.2118/215260-ms.

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Abstract The objective of this study is to predict EOR efficiencies through static wettability contact angle measurement by Machine Learning (ML) modeling. Unlike conventional methods of measuring static wettability contact angle, the unconventional digital static wettability contact angle is captured and measured, then (ML) modeled in order to forecast the recovery based on wettability distribution phenomenon. Due to success in big data collection from reservoir imaging samples, this study applies data science lifecycle logic and utilizes Machine Learning (ML) models that can predict the reco

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