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Journal articles on the topic 'SEM-BSE imaging'

Author: Grafiati

Published: 5 June 2025

Last updated: 2 August 2025

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1

White, Woody. "Coating Effects On BSE Imaging." Microscopy Today 8, no. 6 (2000): 40–41. http://dx.doi.org/10.1017/s1551929500052858.

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Poorly conducting specimens can be examined without coating by using a variable pressure SEM. However, many labs may only have a high vacuum SEM, or for other reasons, choose a high vacuum mode. In order to examine insulating specimens in a high vacuum SEM (using operating conditions conducive to BSE and X-ray analysis) specimens must be coated with a conductive thin film.The perspective of this article is from a materials point of view, but the principles remain the same for biological examinations requiring similar information.Back Scattered Electron (BSE) image contrast is primarily a funct

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2

Lewczuk, Bogdan, and Natalia Szyryńska. "Field-Emission Scanning Electron Microscope as a Tool for Large-Area and Large-Volume Ultrastructural Studies." Animals 11, no. 12 (2021): 3390. http://dx.doi.org/10.3390/ani11123390.

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The development of field-emission scanning electron microscopes for high-resolution imaging at very low acceleration voltages and equipped with highly sensitive detectors of backscattered electrons (BSE) has enabled transmission electron microscopy (TEM)-like imaging of the cut surfaces of tissue blocks, which are impermeable to the electron beam, or tissue sections mounted on the solid substrates. This has resulted in the development of methods that simplify and accelerate ultrastructural studies of large areas and volumes of biological samples. This article provides an overview of these meth

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Boyde, A., L. Lovicar, and J. Zamecnik. "Combining confocal and BSE SEM imaging for bone block surfaces." European Cells and Materials 9 (April 26, 2005): 33–38. http://dx.doi.org/10.22203/ecm.v009a05.

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4

Robinson, V. N. E. "Factors Affecting the Performance of Backscattered Electron Detectors at Low Beam Accelerating Voltages in SEM." Microscopy and Microanalysis 4, S2 (1998): 252–53. http://dx.doi.org/10.1017/s1431927600021383.

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The use of backscattered electron (BSE) imaging in low voltage scanning electron microscopy (SEM) has increased over the past few years. This appears to be due to several factors including improved performance of SEMs at low voltages, reduced beam penetration, more reliable metrology, improved atomic number (Z) contrast information (for low Z) and reduced charging artefacts over secondary electron (SE) imaging. Understanding the factors involved in low voltage BSE detection may assist in improving the information attainable.It has been shown that the signal Sdet from a BSE detector, for EB ≫ E

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5

Paulin, Jerome J. "Secondary and backscatter electron imaging of silver stained ciliated protozoa." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 230–31. http://dx.doi.org/10.1017/s0424820100142773.

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The use of secondary electron (SE) signals in the scanning electron microscope provides a wealth of information on the cortical topography of the ciliated protozoa. Surface manifestations of such morphogenetic events as cell division and regeneration can easily be visualized in the SE mode of the SEM, but concomitant alterations occurring below the surface of the cell can not be visualized. Ciliatologists have used the "Protargol" (silver protein) method to study the cortical features of the ciliates at the light microscopical level. The protein silver stain clearly reveals cilia, microtubules

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Erlandsen, Stanley L., Ya Chen, and Chris Frethem. "High Resolution Backscatter Electron (BSE) Imaging using the Autrata Modified YAG BSE Detector: Comparison of an In-lens Hitachi S-900 FESEM with the Below-the-Lens Hitachi S-4700 FESEM." Microscopy and Microanalysis 7, S2 (2001): 1046–47. http://dx.doi.org/10.1017/s1431927600031305.

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To obtain high resolution backscatter electron (BSE) images in field emission SEM (FESEM), one must consider selection of accelerating voltage, beam current, working distance between the specimen and the backscatter detector (in-lens or below-the-lens position for the specimen), the type of BSE detector, and the type of metal used to coat the specimen to improve conductivity and signal collection [1]. A new generation of below-the-lens FESEM have been tested for BSE imaging on biological samples, but no information exists on whether or not high resolution imaging is possible. Here we report th

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Lin, Wei-Ruei, Yun-Ju Chuang, Chih-Hao Lee, Fan-Gang Tseng, and Fu-Rong Chen. "Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM." Sensors 18, no. 9 (2018): 3093. http://dx.doi.org/10.3390/s18093093.

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Scanning electron microscopy has been developed for topographic analysis at the nanometer scale. Herein, we present a silicon p-n diode with multi-annular configuration to detect backscattering electrons (BSE) in a homemade desktop scanning electron microscope (SEM). The multi-annular configuration enables the enhancement of the topography contrast of 82.11 nA/μm as compared with the commercial multi-fan-shaped BSE detector of 40.08 nA/μm. Additionally, we integrated it with lateral p-n junction processing and aluminum grid structure to increase the sensitivity and efficiency of the multi-annu

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8

Wells, Oliver C. "Explanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory historical review." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 770–71. http://dx.doi.org/10.1017/s0424820100149684.

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Several different “twin-population” theories have been proposed to explain the high resolution backscattered electron (BSE) image in the scanning electron microscope (SEM). In all of these, the BSE are divided into local BSE that give an image having a resolution that is significantly better than the electron penetration depth R and diffused BSE that give a less sharp image. Other theories attach more importance to the diffused BSE.The BSE image was originally proposed by von Ardenne in 1940 with the specimen at right angles to the incident electron beam (Fig. 1). This has been summarised by M

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9

Chen, Ya, and David Wokosin. "Chromium Coating for High Resolution SEM." Microscopy and Microanalysis 3, S2 (1997): 1233–34. http://dx.doi.org/10.1017/s1431927600013052.

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High quality imaging of the macromolecular structure of biological samples can be obtained when combining high resolution SEM with advanced thin metal film coating techniques. A thin layer of fine grain metal film is often necessary to enrich the secondary electron (SE) signal generation and to enhance the contrast of features of interest, because the yield of SE signal from biological samples is low. Secondary electron signals, types SE-I and SE-II, are generated by primary beam at the impact point or by backscattered electrons (BSE) dislocated from the impact point, respectively (Peters, 198

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Peters, Klaus-Ruediger. "In environmental Scanning Electron Microscopy, the secondary electron signal reveals surface information not accessible by conventional backscattered electron signals." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 78–79. http://dx.doi.org/10.1017/s0424820100152367.

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Environmental scanning electron microscopes (ESEM) operate at high as well as at low vacuum (<2.5 kPa: ~20 Torr) but utilize all advantages of conventional high vacuum SEM (large specimen size, high depth of focus and specimen tilt capability, TV-rate scanning for imaging dynamic events). They have the advantage of imaging wet specimens as well as insulators without the need of any specimen preparation. Previously, environmental scanning microscopy was restricted to the BSE signal collected with BSE detectors. SE signals cannot be collected with the Everhart-Thornley detector because it can

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Edwin, Romy Suryaningrat. "Kuantifikasi Porositas Mortar Mutu Tinggi Dengan Image Processing." semanTIK 10, no. 1 (2024): 27. http://dx.doi.org/10.55679/semantik.v10i1.48014.

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Penelitian ini mengkaji porositas pada mortar mutu tinggi menggunakan image processing, yaitu Scanning Electron Microscope Backscaterred Electron Imaging (SEM-BSE) kombinasikan dengan Software Delphi 7 setelah proses image akuisisi. Untuk memastikan hasil yang akurat, area dengan retakan kecil dan bercak hitam akibat lapisan karbon dihindari saat mengambil gambar. Gelembung udara kecil, rongga pori mikro, pori-pori antara agregat halus dan pasta semen, dan pori-pori yang berbentuk pola retakan juga di periksa pada penelitian ini. Proses identifikasi luas porositas dari gambar asli SEM-BSE adal

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Ogura, K., A. Ono, S. Franchi, P. G. Merli, and A. Migliori. "Observation of GaAs/AlAs Superlattice Structures in both Secondary and Backscattcred Electron Imaging Modes with an Ultrahigh Resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 404–5. http://dx.doi.org/10.1017/s042482010018077x.

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In the last few years the development of Scanning Electron Microscopes (SEM), equipped with a Field Emission Gun (FEG) and using in-lens specimen position, has allowed a significant improvement of the instrumental resolution . This is a result of the fine and bright probe provided by the FEG and by the reduced aberration coefficients of the strongly excited objective lens. The smaller specimen size required by in-lens instruments (about 1 cm, in comparison to 15 or 20 cm of a conventional SEM) doesn’t represent a serious limitation in the evaluation of semiconductor process techniques, where t

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Foumelle, J. H., C. A. Nunes, and J. H. Perepezko. "Anomalous backscattered electron behavior of MoB and Mo5SiB2 (T2) phases in an as-cast Mo-B-Si alloy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 1026–27. http://dx.doi.org/10.1017/s0424820100167597.

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It is well established that backscattered electron (BSE) image contrast in SEM is primarily associated with differences in mean atomic number (Z) of the phases. The BSE coefficient increases with higher Z with slight dependence on beam energy (Eo), except for some materials at < 5 keV.We report here the anomalous BSE behavior of MoB and T2 (Mo5SiB2) phases observed imaging a 60Mo-30B-10Si (at%) alloy with a CAMECA SX-50. Specifics of the material and EMPA are reported in a companion communication. Mo-ss and Mo3Si are also present. The drastic differences in BSE behavior are shown in Figures

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Statham, Peter J. "True Colour SEM Imaging for Phase Recognition AMD X-Ray Microanalysis." Microscopy Today 5, no. 3 (1997): 8–18. http://dx.doi.org/10.1017/s1551929500060223.

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Secondary (SE) and backscattered electron (BSE) signals in the SEM provide high resolution monochrome images. BSE signal strength is modulated by mean atomic number and ‘false” colour can be introduced to enhance material contrast. Colour can also be introduced using multiple SE detectors, each with a different sensitivity to topographic and compositional information: by controlling signal mixtures and colours, the operator effectively has access to a powerful “studio” to generate aesthetically pleasing colour images. In both these examples, the correspondence between local elemental content a

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Peters, Klaus-Ruediger. "Detector strategies for environmental scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1296–97. http://dx.doi.org/10.1017/s0424820100131115.

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Environmental SEM operate at specimen chamber pressures of ∼20 torr (2.7 kPa) allowing stabilization of liquid water at room temperature, working on rugged insulators, and generation of an environmental secondary electron (ESE) signal. All signals available in conventional high vacuum instruments are also utilized in the environmental SEM, including BSE, SE, absorbed current, CL, and X-ray. In addition, the ESEM allows utilization of the flux of charge carriers as information, providing exciting new signal modes not available to BSE imaging or to conventional high vacuum SEM.In the ESEM, at lo

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Ng, B. C., T. R. Bieler, and M. A. Crimp. "Imaging Dislocations in Duplex Tial Using Electron Channeling Contrast." Microscopy and Microanalysis 5, S2 (1999): 882–83. http://dx.doi.org/10.1017/s1431927600017736.

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Electron channeling contrast imaging (ECCI), performed using a scanning electron microscope, has been used to observe dislocations in bulk TiAl with a duplex microstructure. The ECCI technique is based on the dependence of the back-scattered electron (BSE) yield (of the incident beam orientation) on the crystal lattice and defect orientation near the specimen surface. This allows nearsurface defects to be imaged in bulk specimens [1, 2]. ECCI was carried out in a Camscan 44FE FEG-SEM operated at 25 kV using a beam divergence of ∽8 mrad and a beam current of ∽ 2nA. Specimens were observed at a

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Buckman, James O., Patrick W. M. Corbett, and Lauren Mitchell. "Charge Contrast Imaging (CCI): Revealing Enhanced Diagenetic Features of A Coquina Limestone." Journal of Sedimentary Research 86, no. 6 (2016): 734–48. http://dx.doi.org/10.2110/jsr.2016.20.

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Abstract: Charge Contrast Imaging (CCI) is a low-vacuum scanning electron microscope (LV-SEM) technique that can be induced through partial surface charge suppression of uncoated nonconductive samples, imaged with a suitable detector such as a gaseous secondary electron detector (GSED). The technique commonly produces results similar in style to that of SEM-cathodoluminescence (SEM-CL), providing information on zoning, twinning, annealed fractures, and subtle chemical changes. The current work outlines an example from a Brazilian Lower Cretaceous coquina limestone, in which both optical and SE

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Statham, Peter J. "True Colour SEM Imaging for Phase Recognition and X-Ray Microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 428–29. http://dx.doi.org/10.1017/s042482010016460x.

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Secondary (SE) and backscattered electron (BSE) signals in the SEM provide high resolution monochrome images. BSE signal strength is modulated by mean atomic number and “false” colour can be introduced to enhance material contrast. Colour can also be introduced using multiple SE detectors, each with a different sensitivity to topographic and compositional information: by controlling signal mixtures and colours, the operator effectively has access to a powerful “studio” to generate aesthetically pleasing colour images. In both these examples, the correspondence between local elemental content a

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Reichelt, Mike, Meredith Sagolla, Anand K. Katakam, and Joshua D. Webster. "Unobstructed Multiscale Imaging of Tissue Sections for Ultrastructural Pathology Analysis by Backscattered Electron Scanning Microscopy." Journal of Histochemistry & Cytochemistry 68, no. 1 (2019): 9–23. http://dx.doi.org/10.1369/0022155419868992.

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Ultrastructural analysis of healthy, diseased, or experimental tissues is essential in diagnostic and investigative pathology. Evaluation of large tissue areas with suborganelle resolution is challenging because biological structures ranging from several millimeters to nanometers in size need to be identified and imaged while maintaining context over multiple scales. Imaging with field emission scanning electron microscopes (FE-SEMs) is uniquely suited for this task. We describe an efficient workflow for the preparation and unobstructed multiscale imaging of tissue sections with backscattered

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Wells, Oliver C., and P. C. Cheng. "High-resolution backscattered electron images in the scanning electron microscope." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1608–9. http://dx.doi.org/10.1017/s0424820100132674.

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In this discussion the words “high resolution imaging” of a solid sample in the scanning electron microscope (SEM) mean that details can be resolved that are considerably smaller than the penetration depth of the incident electron beam (EB) into the specimen. “Atomic resolution” in either the transmission electron microscope (TEM) or scanning transmission electron microscope (STEM) means that columns of atoms are resolved.Image contrasts in the backscattered electron (BSE) image are strongly affected by the specimen tilt and by the position and energy sensitivity of the BSE detector. The expre

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Franchi, S., P. G. Merli, A. Migliori, K. Ogura, and A. Ono. "High-Resolution Backscattered Electron Imaging of GaAs/Ga1-xAlxAs Superlattice Structures with a Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 380–81. http://dx.doi.org/10.1017/s0424820100180653.

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It has been shown that using a Scanning Electron Microscope (SEM), equipped with a Field Emission Gun (FEG) and in-lens specimen position (ultrahigh resolution SEM), operating in the backscattered electron (BSE) mode, it is possible to obtain correct characterization of a superlattice with an image contrast related to the atomic number variation (1).In order to check the performance of a JEOL JSM 890 SEM in the BSE imaging mode, a GaAs/ Ga1-xAlxAs superlattice structure, whose cross section is reported in Fig. 1, has been characterized. On the top there are layers with a fixed value of the mol

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Hashimoto, Y., T. Matsuzaki, H. Ito, M. Konno, and S. Takeuchi. "High contrast BSE Imaging under Ultra Low Voltage condition by FE-SEM with Energy Filtering." Microscopy and Microanalysis 19, S2 (2013): 1176–77. http://dx.doi.org/10.1017/s1431927613007873.

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Griffin, Brendan J. "Things That Go “Bump” in the VPSEM - and How We Image with Them." Microscopy and Microanalysis 7, S2 (2001): 772–73. http://dx.doi.org/10.1017/s1431927600029937.

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Variable pressure scanning electron microscopes (VPSEM) differ from conventional SEM by operating at pressures ranging from the ‘high vacuum’ SEM levels of 10-6 torr up to typically around 2 torr. The environmental SEM or ESEM is a commercial variant which employs an unique multistage pressure-limiting aperture (PLA) system to attain specimen chamber operating pressures of up to 50 torr. Early instruments used air or argon as the imaging gas but more commonly today water vapour is used. A wide range of gases have been employed, including potentially explosive hydrogen-methane mixtures. The cho

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Bao, X., L. Liu, S. Huang, Y. Jiang, X. Wang, and L. Zhang. "Phase relationships in the Al-rich region of the Al-Y-Zr system." Journal of Mining and Metallurgy, Section B: Metallurgy 53, no. 1 (2017): 9–12. http://dx.doi.org/10.2298/jmmb151011019b.

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The phase relations in the Al-Y-Zr ternary system at 873 K have been investigated by X-ray powder diffraction (XRD) and scanning electron microscopy (SEM) with energy dispersive X-ray spectroscopy (EDS) in backscattered electron imaging (BSE) modes. Six three-phase equilibria are determined and no ternary compound is observed. In the meantime, first principle calculations are used to provide theoretical guidance to understand the experimental results.

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Todd, Clifford S., and Valentina Kuznetsova. "Closed-Cell Foam Skin Thickness Measurement Using a Scanning Electron Microscope." Microscopy and Microanalysis 17, no. 5 (2011): 772–78. http://dx.doi.org/10.1017/s1431927611000420.

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AbstractClosed cell polymer foam skin thickness can be assessed by taking backscatter electron (BSE) images in a scanning electron microscope (SEM) at a series of accelerating voltages. Under a given set of experimental conditions, the electron beam mostly passes through thin polymer skin cell walls. That cell appears dark compared to adjacent thicker-skinned cells. Higher accelerating voltages lead to a thicker skin being penetrated. Monte Carlo modeling of beam-sample interactions indicates that at 5 keV, skin less than ∼0.5 μm in thickness will appear dark, whereas imaging at 30 keV allows

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Lowther, J. S., and K. A. Brunstad. "Backscattered Electron Imaging and Microanalysis of Iron-Titanium Oxide Minerals in Fine-Grained Igneous Rocks." Microscopy and Microanalysis 6, S2 (2000): 428–29. http://dx.doi.org/10.1017/s1431927600034632.

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Oxides of iron, titanium, and iron & titanium occur as accessory mineral components of most igneous rocks and generally comprise 1-2% of the total rock volume. In the fine-grained rocks the crystals are usually equidimensional and less than 1 mm across. Because most of them are opaque they cannot be examined using polarized transmitted light in the standard petrographic microscope and must be identified by reflected light (1). We have chosen to study these minerals in the SEM using BSE imaging and EDS microanalysis of carbon-coated polished sections of the rocks which contain them. Alhough

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Skoupy, Radim, Tomas Fort, and Vladislav Krzyzanek. "Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration." Nanomaterials 10, no. 2 (2020): 332. http://dx.doi.org/10.3390/nano10020332.

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The thickness of electron transparent samples can be measured in an electron microscope using several imaging techniques like electron energy loss spectroscopy (EELS) or quantitative scanning transmission electron microscopy (STEM). We extrapolate this method for using a back-scattered electron (BSE) detector in the scanning electron microscope (SEM). This brings the opportunity to measure the thickness not just of the electron transparent samples on TEM mesh grids, but, in addition, also the thickness of thin films on substrates. Nevertheless, the geometry of the microscope and the BSE detect

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., Luc The Trinh, Tuan Van Pham, Bui Hoang Bac ., et al. "Some applications of Scanning Electron Microscopy to the study of reservoir rock." Journal of Mining and Earth Sciences 64, no. 3 (2023): 32–40. http://dx.doi.org/10.46326/jmes.2023.64(3).04.

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Scanning electron microscopy (SEM) is a powerful tool for visualising reservoir pore and grain framework systems which (SEM) provides qualitative information about pore geometry through direct observation of a rock or a pore cast of the rock. This aids in understanding reservoir productivity capabilities. The SEM is useful for locating and identifying minerals, particularly clay minerals - an aid when designing drilling and completion programs. SEM unlike conventional light microscopy, produces images by recording various signals resulting from interactions of an electron beam with the sample

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Hashimoto, Yoichiro, Hiroyuki Ito, and Masahiro Sasajima. "Enhancement of image contrast for carbon nanotube and polymer composite film in scanning electron microscope." Microscopy 69, no. 3 (2020): 167–72. http://dx.doi.org/10.1093/jmicro/dfaa006.

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Abstract Image contrast between carbon nanotubes (CNTs) and polytetrafluoroethylene (PTFE) in a CNT/PTFE composite film, which is difficult to obtain by conventional backscattered electron (BSE) imaging, was optimized to better elucidate the distribution of CNT in the film. Ultra-low landing energy condition (0.3 keV in this study) was used to prevent specimen damage due to electron beam irradiation. Signal acceptance maps, which represent the distributions of energy and take-off angle, were calculated to evaluate the features of the signal detection system used in this study. SEM images of th

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Hari, Sangeetha, P. H. F. Trompenaars, J. J. L. Mulders, Pieter Kruit, and C. W. Hagen. "Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting Material." Micromachines 12, no. 1 (2020): 8. http://dx.doi.org/10.3390/mi12010008.

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High resolution dense lines patterned by focused electron beam-induced deposition (FEBID) have been demonstrated to be promising for lithography. One of the challenges is the presence of interconnecting material, which is often carbonaceous, between the lines as a result of the Gaussian line profile. We demonstrate the use of focused electron beam-induced etching (FEBIE) as a scanning electron microscope (SEM)-based direct-write technique for the removal of this interconnecting material, which can be implemented without removing the sample from the SEM for post processing. Secondary electron (

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Apkarian, R. P. "High-resolution signal detection of specimen-specific secondary electrons in an analytical SEM." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 658–59. http://dx.doi.org/10.1017/s042482010014470x.

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Field emission scanning electron microscopy (SEM) has produced high resolution images of secondary electron-I (SE-I) edge brightness contrast on small particles by the elimination of SE-III produced from backscattered electrons (BSE) within the microscope (SE-I image mode). The resolution of surface fine structure at high magnification is dependent upon signal type and collection efficiency, beam diameter and current, acceleration voltage, and the topography of the specimen. In an analytical SEM, an efficient detector placed above the objective lens specimen stage and a high brightness LaB6 em

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Chen, Ya, Alexander B. Verkhovsky, and Gary G. Borisy. "3-D imaging of freeze-dried actin filaments in fibroblast using high-resolution cryo-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 120–21. http://dx.doi.org/10.1017/s0424820100146448.

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A new approach to image the macromolecular structure of actin filaments from detergent-extracted cultured cells using high resolution low-temperature scanning electron microscopy (cryo-SEM) is described. An advantage of studying the cytoskeleton by SEM is its large depth of focus which makes it easy to reveal the three-dimensional relationship between the cytoskeleton filaments. Recently, procedures have been investigated for high resolution visualization of biological samples by SEM. These studies have demonstrated the importance of cryo preparation techniques for preserving the morphology of

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James, Kelsey C., Uwe Kierdorf, Victoria Cooley, Viktor Nikitin, Stuart R. Stock, and Horst Kierdorf. "Characterization of Incremental Markings in the Sagittal Otolith of the Pacific Sardine (Sardinops sagax) Using Different Imaging Modalities." Minerals 14, no. 7 (2024): 705. http://dx.doi.org/10.3390/min14070705.

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Teleost fish possess calcium carbonate otoliths located in separate chambers (utriculus, sacculus, and lagena) of their membranous labyrinth. This study analyzed the surface topography of the sagittal otolith of the Pacific sardine (Sardinops sagax) and the daily and annual increments in these otoliths. The otolith surface, characterized by laser scanning confocal microscopy for the first time, consisted of a system of prominent ridges and valleys (grooves), but it is unclear whether these structures are functional or represent time-resolving markings reflecting growth periodicity. Within the

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Bogdanowicz, Włodzimierz, Robert Albrecht, Jan Sieniawski, Krzysztof Kubiak, and Arkadiusz Onyszko. "Correlation between SEM and X-Ray Diffraction Imaging of Defect Structure in Single-Crystal Ni-Based Superalloy." Solid State Phenomena 186 (March 2012): 135–38. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.135.

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In the work the single-crystalline alloy CMSX-4 was studied. The main aim of the study was an attempt to find correlations between images of X-Ray topography, X-ray diffraction maps of lattice parameter and misorientation angle and Scanning Electron Microscopy (SEM) images obtained by back-scattered electron (BSE) technique. Topography images were obtained by Auleytner method with wide beam. Diffractometer provided by EFG company was used for obtaining orientation and lattice parameter maps. Material for research was produced in Research and Development Laboratory for Aerospace Materials of Rz

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Talbot, H., D. Jeulin, and L. W. Hobbs. "Scanning Electron Microscopy image analysis of fiber glass insulation." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 994–95. http://dx.doi.org/10.1017/s0424820100129607.

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Glass wool, made of chemically bound glass fibers which trap stagnant air, has been used in a variety of applications as phonic and thermic insulation material. Mechanical and insulating qualities of the material depend heavily on the characteristics of the fibers themselves. Aside from the composition of the glass, the length and diameter distributions of the fibers within the material can be related to these characteristics. A fast and reliable means for obtaining these size distributions is therefore a crucial issue for quality control.Scanning electron microscopy (SEM) imaging was used to

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Polkowska, Adelajda, Małgorzata Warmuzek, Julia Kalarus, Wojciech Polkowski, and Natalia Sobczak. "A comparison of various imaging modes in scanning electron microscopy during evaluation of selected Si/refractory sessile drop couples after wettability tests at ultra-high temperature." Prace Instytutu Odlewnictwa (Transactions of Foundry Research Institute) 57, no. 4 (2017): 337–44. https://doi.org/10.7356/iod.2017.35.

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In this work, FEI SciosTM field emission gun scanning electron microscope (FEG SEM) equipped with a unique combination of analytical and imaging detectors was utilized to examine structure and chemistry of selected Si/refractory couples. The couples were obtained in wettability tests performed by the sessile drop method coupled with contact heating of a refractory substrate (h-BN, SiC) at ultra-high temperature (up to 1750°C). The SEM observations were carried out on top-views of the couples, in order to evaluate surface and interfacial phenomena in Si/h-BN and Si/SiC systems. A full range

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Hazra, Bodhisatwa, Prakash K. Singh, Chinmay Sethi, and Jai Krishna Pandey. "Application of Optical-electron Correlative Microscopy for Characterization of Organic Matter." Journal Of The Geological Society Of India 100, no. 10 (2024): 1385–94. http://dx.doi.org/10.17491/jgsi/2024/173994.

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ABSTRACT Application of coal petrology is known to play significant role in several industrial sectors viz. thermal industries, steel industries, unconventional oil and gas fields. One important aspect of organic matter characterization, especially for unconventional oil and gas fields is the development of organic matter hosted porosity, and commonly Scanning Electron Microscopy (SEM) is used to study the same. While, SEM helps in understanding the nature of porosity developed in coals and shales, one significant limitation is that under SEM the different organic matter types can’t be disting

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Rau, E. I., and VNE Robinson. "Sub Surface Imaging Using a Toroidal Backscattered Electron Energy Spectrometer in a Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 432–33. http://dx.doi.org/10.1017/s0424820100164623.

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In a SEM, an object under examination is scanned by a focused electron beam, of energy typically 2-30 keV. Some of the incident electrons are scattered out of the sample, carrying with them depth information from the internal structure of the sample. By detecting BSEs in a definite energy range, it is theoretically possible to separate images of individual layers of a three-dimensional sample, ie, perform a kind of instrumental tomography. Additionally, detecting BSEs on an energy separation basis gives another degree of freedom to microscopists to determine greater specimen information. To do

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Bache, I. C., B. L. Thiel, N. Stelmashenko, and A. M. Donald. "Transport of Secondary Electrons Through a Film of Condensed Water; Implications for Imaging Wet Samples." Microscopy and Microanalysis 3, S2 (1997): 1199–200. http://dx.doi.org/10.1017/s1431927600012885.

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We have performed a theoretical and experimental study of the the effect that a surface layer of condensed water has on the emission of secondary electrons from the surface. This is an issue of considerable interest to users of the Environmental SEM (ESEM) when imaging wet samples. Previous work has been performed to investigate the effect of a layer of water on back scattered electrons (BSE), but secondary electron (SE) imaging is more commonly used in ESEM, so an understanding of the interactions of SE with water is important. The aim of this work is to quantify the thickness of water throug

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Zhang, Run Lan, Xiang Rong Liu, Tan Wei Zhou, and Jian Li Yang. "Microstructure of Magnesium-Aluminum Metal Matrix Composites Reinforced with 2wt.% SiC Particles." Advanced Materials Research 413 (December 2011): 207–12. http://dx.doi.org/10.4028/www.scientific.net/amr.413.207.

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SiCp/Mg-Al composites with 5μm 2wt.% SiC particles as reinforcement were prepared under the protection of inorganic flux. The microstructures, textures and components of the composites were investigated using optical microscope (OM), scanning electron microscope (SEM), X-ray diffraction (XRD) and backscattered electron imaging (BSE). The results indicate that SiC particles are mainly distributed along grain boundaries, retarding grain growth and conducing to the refinement of the matrix. Interfacial reaction can occur between SiCp and Mg but not between SiCp and Al. There are α-Mg and β-Mg17Al

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Miyajima, Nobuyoshi, Danielle Silva Souza, and Florian Heidelbach. "Dauphiné twin in a deformed quartz: characterization by electron channelling contrast imaging and large-angle convergent-beam diffraction." European Journal of Mineralogy 36, no. 5 (2024): 709–19. http://dx.doi.org/10.5194/ejm-36-709-2024.

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Abstract. A Dauphiné twin (DT) in a deformed quartz was visualized for the first time by using orientation-optimized electron channelling contrast imaging (ooECCI) under Bragg conditions of the rhombohedral planes. The visualization in backscattered electron (BSE) imaging with a scanning electron microscope (SEM) is possible due to the electron excitations of positive and negative rhombohedral planes from respective twin domains. Those diffraction planes have different structure factors and scattering amplitudes in electron diffraction and are exchanged in a pair of DT domains. The large-angle

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Wepf, R., U. Aebi, A. Bremer, et al. "High-resolution SEM of biological macromolecular complexes." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1026–27. http://dx.doi.org/10.1017/s0424820100172863.

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For HRSEM imaging of insulating specimens, thin “homogeneous” metal films with a thickness smaller than the SE-escape depth (1-2 nm for metals) and with a neglectable or very low BSE-coefficient (low Z e.g. Cr or Ge), continuous enveloping the surface fine structures, are supposed to reveal a high resolution topographic SE-1 signal (Joy 1984). Hermann and Müller (1991) have reported a resolution of about 3-4 nm on freeze-dried thin biological specimens, coated with Cr at low temperature (−80°C). High resolution SE-images were also shown on ft or W sputter coated, frozen-hydrated yeast cells (W

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Lu, Zhaolin, Xiaojuan Hu, and Yao Lu. "Particle Morphology Analysis of Biomass Material Based on Improved Image Processing Method." International Journal of Analytical Chemistry 2017 (2017): 1–9. http://dx.doi.org/10.1155/2017/5840690.

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Particle morphology, including size and shape, is an important factor that significantly influences the physical and chemical properties of biomass material. Based on image processing technology, a method was developed to process sample images, measure particle dimensions, and analyse the particle size and shape distributions of knife-milled wheat straw, which had been preclassified into five nominal size groups using mechanical sieving approach. Considering the great variation of particle size from micrometer to millimeter, the powders greater than 250 μm were photographed by a flatbed scanne

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Yehia, Hossam M., Omayma Elkady, and Mohamed Elmahdy. "Tungsten Carbide Matrix Nanocomposite." International Journal of Engineering and Advanced Technology 11, no. 5 (2022): 82–85. http://dx.doi.org/10.35940/ijeat.e3526.0611522.

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Tungsten carbide is one of the ceramic materials characterized by high hardness. It has many uses in manufacturing, including cutting tools, die inserts and other parts that need materials with high mechanical wear resistance. In this study, tungsten carbide was reinforced with alumina and different ratios of graphene to improve its mechanical properties. The BSE mode used the electronic imaging device (SEM) to study the powders and manufactured sample's microstructure. The densification, hardness, and toughness of fabricated specimens were evaluated. The results proved that the density of sam

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Relucenti, Michela, Selenia Miglietta, Gabriele Bove, et al. "SEM BSE 3D Image Analysis of Human Incus Bone Affected by Cholesteatoma Ascribes to Osteoclasts the Bone Erosion and VpSEM dEDX Analysis Reveals New Bone Formation." Scanning 2020 (February 17, 2020): 1–9. http://dx.doi.org/10.1155/2020/9371516.

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Bone erosion is considered a typical characteristic of advanced or complicated cholesteatoma (CHO), although it is still a matter of debate if bone erosion is due to osteoclast action, being the specific literature controversial. The purpose of this study was to apply a novel scanning characterization approach, the BSE 3D image analysis, to study the pathological erosion on the surface of human incus bone involved by CHO, in order to definitely assess the eventual osteoclastic resorptive action. To do this, a comparison of BSE 3D image of resorption lacunae (resorption pits) from osteoporotic

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Adeola, Ibukunoluwa S., Jim Buckman, Gary Couples, and Adewole John Adeola. "Digital Rock Approaches to Estimate the Impact of Early Quartz Cementation in Miocene Deepwater Sands Niger Delta Basin, Nigeria." Earth Science Research 6, no. 2 (2017): 138. http://dx.doi.org/10.5539/esr.v6n2p138.

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Quartz cement forming as syntaxial overgrowths is one of the most abundant cement type in sandstones. The rim and occluding cements develop around the surfaces of frame work grains and fill up pore spaces with no preferred orientation with grain surfaces. Imaging the various forms of quartz cement generation and development in 3D as it increases through time will help in further evaluation and better understanding of a reservoir in deep water sands in Niger Delta Basin.Petrographic analysis was performed on 10 Samples with micron resolutions of 0.675 and 0.337 per pixel. Scanning Electron Micr

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Hossam, M. Yehia, Elkady Omayma, and Elmahdy Mohamed. "Tungsten Carbide Matrix Nanocomposite." International Journal of Engineering and Advanced Technology (IJEAT) 11, no. 5 (2022): 82–85. https://doi.org/10.35940/ijeat.E3526.0611522.

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<strong>Abstract: </strong>Tungsten carbide is one of the ceramic materials characterized by high hardness. It has many uses in manufacturing, including cutting tools, die inserts and other parts that need materials with high mechanical wear resistance. In this study, tungsten carbide was reinforced with alumina and different ratios of graphene to improve its mechanical properties. The BSE mode used the electronic imaging device (SEM) to study the powders and manufactured sample's microstructure. The densification, hardness, and toughness of fabricated specimens were evaluated. The results

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Buckman, Jim, and Vladimir Krivtsov. "The Mineral Composition and Grain Distribution of Difflugia Testate Amoebae: Through SEM-BEX Mapping and Software-Based Mineral Identification." Minerals 15, no. 1 (2024): 1. https://doi.org/10.3390/min15010001.

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We tested a scanning electron microscope equipped with the newly developed Unity-BEX detector (SEM-BEX) system to study thirty-nine samples of the testate amoeba Difflugia. This produces fast single-scan backscattered (BSE) and combined elemental X-ray maps of selected areas, resulting in high-resolution data-rich composite colour X-ray and combined BSE maps. Using a suitably user-defined elemental X-ray colour palette, minerals such as orthoclase, albite, quartz and mica were highlighted in blue, purple, magenta and green, respectively. Imaging was faster than comparable standard energy dispe

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Prior, David J., Patrick W. Trimby, Ursula D. Weber, and David J. Dingley. "Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope." Mineralogical Magazine 60, no. 403 (1996): 859–69. http://dx.doi.org/10.1180/minmag.1996.060.403.01.

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AbstractWe have developed a system using ‘forescatter detectors’ for backscattered imaging of specimen surfaces inclined at 50–80° to the incident beam (inclined-scanning) in the SEM. These detectors comprise semiconductor chips placed below the tilted specimen. Forescatter detectors provide an orientation contrast (OC) image to complement quantitative crystallographic data from electron backscatter patterns (EBSP). Specimens were imaged using two detector geometries and these images were compared to those collected with the specimen surface normal to the incident beam (normal-scanning) using

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Sui, Tan, Jiří Dluhoš, Tao Li, et al. "Structure-Function Correlative Microscopy of Peritubular and Intertubular Dentine." Materials 11, no. 9 (2018): 1493. http://dx.doi.org/10.3390/ma11091493.

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Peritubular dentine (PTD) and intertubular dentine (ITD) were investigated by 3D correlative Focused Ion Beam (FIB)-Scanning Electron Microscopy (SEM)-Energy Dispersive Spectroscopy (EDS) tomography, tapping mode Atomic Force Microscopy (AFM) and scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) mapping. The brighter appearance of PTD in 3D SEM-Backscattered-Electron (BSE) imaging mode and the corresponding higher grey value indicate a greater mineral concentration in PTD (~160) compared to ITD (~152). However, the 3D FIB-SEM-EDS reconstruction and high resolution, quantitative 2

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