Journal articles: 'SEM-EBSD analysis'

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Goehner, R. P., and J. R. Michael. "Microdiffraction phase identification in the scanning electron microscope (SEM)." Powder Diffraction 19, no. 2 (2004): 100–103. http://dx.doi.org/10.1154/1.1757450.

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The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.

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Picard, Yoosuf N., Ranga Kamaladasa, Marc De Graef, et al. "Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling." Microscopy Today 20, no. 2 (2012): 12–16. http://dx.doi.org/10.1017/s1551929512000077.

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Electron diffraction in both SEM and TEM provides a contrast mechanism for imaging defects as well as a means for quantifying elastic strain. Electron backscatter diffraction (EBSD) is the commercially established method for SEM-based diffraction analysis. In EBSD, Kikuchi patterns are acquired by a charge-coupled device (CCD) camera and indexed using commercial software. Phase and crystallographic orientation information can be extracted from these Kikuchi patterns, and researchers have developed cross-correlation methods to measure strain as well.

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KUBUSHIRO, Keiji, Yohei SAKAKIBARA, and Toshihiro OHTANI. "Creep Strain Analysis of Austenitic Stainless Steel by SEM/EBSD." Journal of the Society of Materials Science, Japan 64, no. 2 (2015): 106–12. http://dx.doi.org/10.2472/jsms.64.106.

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ISHIDA, Kyoichi, Ritsu HIROHARA, and Muneyuki IMAFUKU. "Texture analysis of fine-grained stainless steel by SEM/EBSD." Proceedings of Conference of Kanto Branch 2017.23 (2017): 902. http://dx.doi.org/10.1299/jsmekanto.2017.23.902.

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Guilmeau, E., Catherine Henrist, Tohru Suzuki, et al. "Texture of Alumina by Neutron Diffraction and SEM-EBSD." Materials Science Forum 495-497 (September 2005): 1395–400. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.1395.

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The orientation distributions of α-Al2O3 textured ceramics are determined from neutron diffraction and SEM-EBSD. A curved position-sensitive detector coupled to a tilt angle (χ) scan allowed the whole neutron diffraction pattern treatment in the combined Rietveld-WIMV-Popa algorithm. Analyses from neutron and electron diffraction data gave similar results if EBSD data are smoothed to account for grain statistics. Four textured alumina ceramics were prepared by slipcasting under a high magnetic field and sintered at 800°C, 1300°C, 1400°C and 1600°C. The inverse pole figures and EBSD-mapping highlights the influence of the magnetic field and sintering temperature on the texture development. The inverse pole figures calculated for the fiber direction show a major (001) component for all the samples. With the increasing sintering temperature, the texture strength is enhanced and the c-axis distribution is sharper. The effectiveness of the combined approach for determining the crystallite size is also evident. As a global trend, the calculated crystallite size and observed grain size are similar and increase with the increasing sintering temperature. The mechanism of the texture development in the sintered specimens is certainly initiated from the preferred orientation of the green body after slip-casting under a high magnetic field. The basal texture is enhanced during sintering by selective anisotropic grain growth. We evidenced here the powerfulness of the Rietveld texture analysis correlated to SEM-EBSD calculation to provide a basis for the correlation of texture, microstructural parameters and anisotropic properties.

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Kojima, Yohei, Yuta Matsumoto, Daniel Goran, John Gilbert, and Naoki Kikuchi. "Crystalline analysis by W-SEM using a newly developed EBSD detector." BIO Web of Conferences 129 (2024): 05029. http://dx.doi.org/10.1051/bioconf/202412905029.

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UETSUJI, Yasutomo, Hideyuki NAGAKURA, Yu SATO, and Eiji NAKAMACHI. "308 Crystal Orientation Analysis of Piezoelectric Ceramics by SEM・EBSD Technique." Proceedings of The Computational Mechanics Conference 2006.19 (2006): 149–50. http://dx.doi.org/10.1299/jsmecmd.2006.19.149.

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Strehle, S., S. Menzel, H. Wendrock, J. Acker, and K. Wetzig. "SEM/EBSD Texture Analysis of Electrochemically Deposited CuAg-Alloy Thin Films." Microscopy and Microanalysis 9, S03 (2003): 272–73. http://dx.doi.org/10.1017/s1431927603023304.

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Lyman, Charles. "Small, Focused Technical Conferences." Microscopy Today 18, no. 2 (2010): 5. http://dx.doi.org/10.1017/s1551929510000210.

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The feature article in this issue is a prelude to the Microbeam Analysis Society (MAS) Topical Conference on electron backscatter diffraction (EBSD) to be held at the University of Wisconsin, May 24–26, 2010. The popularity of the EBSD technique is growing rapidly. This analytical method is capable of both identifying crystalline phases and determining the orientation of grains and second phases. Phase analysis by EBSD combined with elemental analysis by x-ray emission spectrometry provides the SEM with extraordinary analytical power. Maps of crystal grain orientations are widely used in metallurgical and geological research.

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Zasada, Dariusz, Wojciech Polkowski, and Robert Jasionowski. "Analysis of the Effect of the Wearing Type on Surface Structural Changes of Ni₃Al-Based Intermetallic Alloy." Solid State Phenomena 225 (December 2014): 25–32. http://dx.doi.org/10.4028/www.scientific.net/ssp.225.25.

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Results of an analysis of effect of wearing type on surface structural changes of a Ni3Al intermetallic alloy, are shown in the present paper. A microstructure evaluation was carried out by Quanta 3D FEG field emission gun scanning electron microscope (FEG SEM) equipped with an integrated EDS/WDS/EBSD system. The Ni3Al-based intermetallic alloy with an addition of boron, zirconium and chromium was examined. The investigated material had γ’ single-phase, ordered solid solution structure with 20 μm grain size. An electron backscatter diffraction (EBSD) method was applied to visualize surface structural changes upon an abrasive, a cavitational and a tribological wearing of the material.An observation of surface layer after the abrasive wear was carried out on samples examined in loose abradant by T-07 tester and according to GOST 23.2008-79 norm. An analysis of cavitational wear on changes in the near surface area of Ni3Al-based alloy was performed on an impact-jet stand. Observed structural changes were described based on results of the SEM/EBSD complex structural examination and hardness measurements. It was found, that the EBSD is an effective and sensitive method that allows estimating surface strain introduced during analyzed wearing types.

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Nowell, Matthew M., Ronald A. Witt, and Brian W. True. "EBSD Sample Preparation: Techniques, Tips, and Tricks." Microscopy Today 13, no. 4 (2005): 44–49. http://dx.doi.org/10.1017/s1551929500053669.

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Automated analysis of Electron Backscatter Diffraction (EBSD) patterns for orientation imaging and phase identification in materials and earth sciences has become a widely accepted microstructural analysis tool. To briefly review, EBSD is a scanning electron microscope (SEM) based technique where the sample is tilted approximately 70 degrees and the electron beam is positioned in an analytical spot-mode within a selected grain. An EBSD pattern is formed due to the diffraction of the electron beam by select crystallographic planes within the material. The EBSD pattern is representative of both the phase and crystallographic orientation of the selected area. The pattern is imaged by a phosphor screen and recorded with a digital CCD camera and then analyzed.

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Lloyd, Geoffrey E. "Grain boundary contact effects during faulting of quartzite: an SEM/EBSD analysis." Journal of Structural Geology 22, no. 11-12 (2000): 1675–93. http://dx.doi.org/10.1016/s0191-8141(00)00069-9.

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Mulders, J. J. L., and A. Gholinia. "Three-Dimensional Crystallographic Analysis Beyond EBSD Mapping: The Next Dimension." Microscopy Today 14, no. 3 (2006): 34–37. http://dx.doi.org/10.1017/s1551929500057643.

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Since the early 1990s EBSD (Electron Back Scatter Diffraction) has been developed to become a mature crystallographic analysis technique at the micro and nano-scale. It is applied in a SEM (Scanning Electron Microscope) on samples with a very smooth and clean surface. It provides quantitative orientations of individual grains, and by mapping a larger area, multiple grain analysis, texture, and grain boundaries can be examined. As the useful information for the EBSD technique comes from a very shallow depth in the material (10 to 20nm), it is a surface analysis technique showing lateral 2D distributions of crystal orientations.

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Tao, Xiaodong, and Alwyn Eades. "A Routine to Determine the Shift of Kikuchi Bands in EBSD to Sub-pixel Resolution." Microscopy and Microanalysis 7, S2 (2001): 366–67. http://dx.doi.org/10.1017/s1431927600027902.

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The long-term aim of our research is to detect and image dislocations in the SEM with EBSD. We will apply it first to the characterization of threading dislocations in Si/Si-Ge structures. As an initial step, we set out to detect the shift of the Kikuchi bands in EBSD patterns to sub-pixel precision.In the standard analysis of EBSD patterns, to find the positions of Kikuchi bands, it is usual to use the Hough transform. This transform displays the intensity along all lines in the EBSD pattern, as a function of the position and the angle of the line. Thus linear features in the pattern (Figure 1) appears as peaks in the transform (Figure 2a). in normal EBSD analysis, the aim is to determine the orientation of the grain to a precision of perhaps a degree or two. Therefore, many simplifications are made in the software with the aim of gaining speed.

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Parish, Chad M. "Cluster Analysis of Combined EDS and EBSD Data to Solve Ambiguous Phase Identifications." Microscopy and Microanalysis 28, no. 2 (2022): 371–82. http://dx.doi.org/10.1017/s1431927622000010.

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A common problem in analytical scanning electron microscopy (SEM) using electron backscatter diffraction (EBSD) is the differentiation of phases with distinct chemistry but the same or very similar crystal structure. X-ray energy dispersive spectroscopy (EDS) is useful to help differentiate these phases of similar crystal structures but different elemental makeups. However, open, automated, and unbiased methods of differentiating phases of similar EBSD responses based on their EDS response are lacking. This paper describes a simple data analytics-based method, using a combination of singular value decomposition and cluster analysis, to merge simultaneously acquired EDS + EBSD information and automatically determine phases from both their crystal and elemental data. I use hexagonal TiB2 ceramic contaminated with multiple crystallographically ambiguous but chemically distinct cubic phases to illustrate the method. Code, in the form of a Python 3 Jupyter Notebook, and the necessary data to replicate the analysis are provided as Supplementary material.

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Rößler, Christiane, Dominik Zimmer, Patrick Trimby, and Horst-Michael Ludwig. "Chemical – crystallographic characterisation of cement clinkers by EBSD-EDS analysis in the SEM." Cement and Concrete Research 154 (April 2022): 106721. http://dx.doi.org/10.1016/j.cemconres.2022.106721.

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Erdman, N., M. Shibata, D. Gardiner, and B. Jacobs. "EBSD Analysis of Materials Utilizing High Temperature Protochips Aduro System in FE-SEM." Microscopy and Microanalysis 19, S2 (2013): 740–41. http://dx.doi.org/10.1017/s1431927613005692.

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Zhang, Bo, ShuYu Yan, ZhiDong Gu, and JinJiang Zhang. "SEM/EBSD analysis of quartz cementation and compaction microstructures during diagenesis of sandstone." Science China Earth Sciences 56, no. 8 (2013): 1281–93. http://dx.doi.org/10.1007/s11430-013-4612-7.

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Mamtani, Manish A. "The Future of Structural Geology in the 21st Century – Moving from Mesoscale to Nanoscale Observations in Tectonically Deformed Rocks." Journal Of The Geological Society Of India 101, no. 1 (2025): 10–23. https://doi.org/10.17491/jgsi/2024/174056.

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ABSTRACT The importance of integrating field studies with various micro-and nano-scale structural geological investigations using petrographic microscope, scanning electron microscope (SEM), electron backscatter diffraction (EBSD) and transmission electron microscope (TEM) is highlighted in this paper. The author’s past studies dealing with SEM-EBSD and TEM investigations to decipher deformation mechanism of magnetite are taken as examples to support the robustness of investigating nanostructures in thin films excavated parallel to the kinematic reference frame. In addition, the author also shares a work flow involving collection of oriented field samples, followed by petrophysical investigations (e.g., porosity, permeability, P-wave velocity of oriented samples, etc.), 3D fabric analysis (e.g., AMS, X-ray micro-CT of oriented samples), 2D-microstructural analysis in oriented thin sections (petrography, SEM imaging including in-lens, EBSD, etc.) and finally nanostructural studies in oriented thin films using TEM (in that order). The importance of this integrated approach to evaluate structures at different scales and utilize the results for fundamental research as well as applications such as in the field of understanding fluid flow, mineralization, geothermal systems and radioactive waste management is discussed. Hence the paper provides an overview to the reader about some of the possibilities that exist today (21st century) in the field of structural geology.

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Mamtani, Manish A. "The Future of Structural Geology in the 21st Century – Moving from Mesoscale to Nanoscale Observations in Tectonically Deformed Rocks." Journal Of The Geological Society Of India 101, no. 1 (2025): 10–23. https://doi.org/10.17491/jgsi/2025/174056.

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ABSTRACT The importance of integrating field studies with various micro-and nano-scale structural geological investigations using petrographic microscope, scanning electron microscope (SEM), electron backscatter diffraction (EBSD) and transmission electron microscope (TEM) is highlighted in this paper. The author’s past studies dealing with SEM-EBSD and TEM investigations to decipher deformation mechanism of magnetite are taken as examples to support the robustness of investigating nanostructures in thin films excavated parallel to the kinematic reference frame. In addition, the author also shares a work flow involving collection of oriented field samples, followed by petrophysical investigations (e.g., porosity, permeability, P-wave velocity of oriented samples, etc.), 3D fabric analysis (e.g., AMS, X-ray micro-CT of oriented samples), 2D-microstructural analysis in oriented thin sections (petrography, SEM imaging including in-lens, EBSD, etc.) and finally nanostructural studies in oriented thin films using TEM (in that order). The importance of this integrated approach to evaluate structures at different scales and utilize the results for fundamental research as well as applications such as in the field of understanding fluid flow, mineralization, geothermal systems and radioactive waste management is discussed. Hence the paper provides an overview to the reader about some of the possibilities that exist today (21st century) in the field of structural geology.

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Mingard, Ken, and Bryan Roebuck. "Interlaboratory Measurements of Contiguity in WC-Co Hardmetals." Metals 9, no. 3 (2019): 328. http://dx.doi.org/10.3390/met9030328.

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The contiguity of a hardmetal is a measure of the proportion of the carbide grain boundaries that are in direct contact with other carbide grain boundaries. Recent analysis of data available in the literature shows a large scatter in results and a significant difference in values measured from scanning electron microscope (SEM) images and from electron backscatter diffraction (EBSD) mapping. An interlaboratory exercise has been carried out with the measurement of a range of WC-Co hardmetal grades. For each grade, SEM images were acquired from both an etched surface and an ion beam polished surface and EBSD maps with two different processing routes. These maps and images were provided to the participants for measurement to eliminate variability from sample preparation and image acquisition. It was shown that measurement of contiguity from EBSD maps is likely to lead to an overestimation of contiguity, largely because EBSD maps do not have the resolution of SEM images to identify small binder phase regions between WC grains. Ion beam polishing combined with backscattered electron imaging was found to provide the best images of the microstructure to underpin a confident measurement of contiguity. However, high resolution SEM images of etched surfaces gave values close to those from ion beam polished samples so it is recommended that, as etching is much more widely available, high-resolution imaging of a lightly etched WC surface should be promoted as the preferred method for measurement of contiguity, in combination with backscattered imaging where possible. Even with good images, variation between operators can give uncertainties of approximately ±10%.

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Rauch, Edgar F., Muriel Véron, Stavros Nicolopoulos, and Daniel Bultreys. "Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science." Solid State Phenomena 186 (March 2012): 13–15. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.13.

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EBSD is a well known technique that allows orientation and phase mapping using an SEM. Although the technique is very powerful, has serious limitations related with a) special resolution limited to 50 nm (SEM-FEG) and b) specimen preparation issues as is not possible to obtain EBSD signal from rough surfaces or strained materials , nanoparticles etc.. To address those difficulties , a novel technique has been developed recently (EBSD-TEM like) allowing automatic orientation and phase mapping using template matching analysis of acquired diffraction patterns in TEM. Electron beam is scanned through the sample area of interest ; the acquired electron diffraction patterns from several sample locations are compared via cross-correlation matching techniques with pre-calculted simulated templates to reveal local crystal orientation and phases. The dedicated device (ASTAR) allows orientation and phase identification of crystallographic orientation in a region of interest up to 10µm2, with a step size ranging from 1nm to 20nm depending on the transmission electron microscope setting (FEG or LaB6).

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Berent, Katarzyna, and Marek Faryna. "High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks." Solid State Phenomena 186 (March 2012): 62–65. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.62.

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Modern scanning electron microscopes (SEMs) increase the ability to study a wide range of materials. Especially, an application of low vacuum conditions enables characterization of nonconductive samples without complicated preparation procedure. However, the operator must be aware of several problems he may encounter collecting electron diffractions in the SEM with variable pressure. The charge control and quality of the surface are the challenges when running experiments on insulators. Specimen charging obscures forward scatter electrons images and decreases the EBSD pattern quality making indexing difficult or even impossible. Another crucial question is how to limit the influence of so called "skirt effect" caused by ionization of gas molecules followed by electron beam broading above the sample. The influence of several important parameters (gas pressure, a type of gas, working distance and energy of electron beam) on the EBSD pattern quality must also be considered. When it is properly done, a coupling of crystallographic information with the chemical data obtained from Energy Dispersive Spectroscopy (EDS) in the LV-SEM allows to perform phase identification of insulators. The paper presents some ideas how to deal with the (Pb, La)(Zr, Ti)O3 ceramics in high resolution Quanta 3D SEM (with thermally assisted Schottky type FEG) equipped with EDAX-TSL system in low vacuum environment. The problems occurring during EBSD analysis of the PLZT ceramics are discussed and some solutions are suggested. Paper summarizes the results obtained from PLZT ferroelectric ceramics in the low vacuum FEGSEM and shows how to optimise experimental parameters in order to achieve the best quality of orientation maps acquired from nonconductive samples.

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Michael, J. R. "Phase Identification Using EBSD in the SEM: What Can be Done Today and What we Hope to do Tomorrow." Microscopy and Microanalysis 5, S2 (1999): 220–21. http://dx.doi.org/10.1017/s1431927600014422.

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Phase identification using electron backscatter diffraction (EBSD) in the SEM has become a useful and important tool for the characterization of crystalline materials. Phase identification is accomplished using EBSD in the following manner. First, a high quality camera must be added to the SEM. Suitable cameras use slow scan CCD imagers coupled either by a lens or a fiber optic bundle to a phosphor screen that is situated near the sample. A EBSD pattern is collected and EDS or WDS is used to determine qualitatively the chemistry of the area. An automated routine is then used to extract the positions and widths of the lines in the pattern followed by a calculation of the unit cell volume. This information coupled with the chemistry of the sample is then used to search a database of crystal structures. Currently, the ICDD's Powder Diffraction file of over 100,000 compounds is used. Once a list of potential matches is found the patterns are indexed and then simulated to demonstrate that the phase has been identified. This paper will demonstrate use of EBSD for phase identification and then will speculate on future developments.A particularly nice application of EBSD is the use of the technique for the identification of phases that form in welds. Figure 1a is an EBSD pattern obtained from a acicular phase in a superalloy weld. The phase was determined to be primarily Ti and Ni. Analysis of the patterns showed that the phase is Ni3Ti. Figure 1b shows the simulation for Ni3Ti overlaid on the experimental pattern demonstrating that the phase has been identified.

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Picard, Yoosuf N., Christopher Locke, Christopher L. Frewin, Mark E. Twigg, and Stephen E. Saddow. "Crystalline Quality and Surface Morphology of 3C-SiC Films on Si Evaluated by Electron Channeling Contrast Imaging." Materials Science Forum 615-617 (March 2009): 435–38. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.435.

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Electron channeling contrast imaging (ECCI) has been utilized to evaluate the surface morphology and crystalline quality of 3C-SiC films grown by chemical vapor deposition (CVD) on (100) and (111) Si substrates. ECCI in this study was performed using an electron backscatter diffraction (EBSD) system equipped with forescatter diode detectors and mounted inside a commercial scanning electron microscope (SEM). This nondestructive method permits direct dislocation imaging through local fluctuations in forescattered electron yield attributable to lattice strain. Coordinated ECCI, SEM, and EBSD analysis of film surfaces allowed correlations between film orientation, surface morphology, and dislocation behavior. Evidence of lateral dislocations parallel to <110> directions and atomic step pinning by dislocations was observed.

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Cao, Jie, Jian Can Yang, and Wen Guang Zhu. "Effect of Pulse Current on the Microstructure of Tungsten Electrode in Tensile Process." Materials Science Forum 817 (April 2015): 104–8. http://dx.doi.org/10.4028/www.scientific.net/msf.817.104.

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The forming of rare earth tungsten electrode is difficult. The mechanical properties and microstructure evolution of several φ2.4mm rare earth tungsten electrodes were studied by SEM, EBSD and TEM technology. The static tensile test was carried out in different pulse current density, and the temperature of the samples in processing was measured with K thermocouple. The results showed that the sample had the best elongation of 8.87% when the pulse current density was 800 A/mm2. SEM analysis showed that the second phase was broken and some of them were spheroidized in electric sample. It is indicated that the electric pulse accelerated the formation of [110] texture and the low angle boundaries decreased by EBSD, and TEM analysis revealed that the dislocation cell wall was thinner and the adjacent cell got merged in electric sample.

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Królicka, Aleksandra, Aleksandra Janik, Andrzej Żak, and Krzysztof Radwański. "The qualitative–quantitative approach to microstructural characterization of nanostructured bainitic steels using electron microscopy methods." Materials Science-Poland 39, no. 2 (2021): 188–99. http://dx.doi.org/10.2478/msp-2021-0017.

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Abstract Both qualitative and quantitative analyses play a key role in the microstructural characterization of nanobainitic steels focused on their mechanical properties. This research demonstrates various methods of microstructure analysis using transmission electron microscopy (TEM), scanning electron microscopy (SEM), and electron backscatter diffraction (EBSD) techniques, taking into account these two approaches. The structural constituents have been qualitatively characterized using TEM and selected area electron diffraction (SAED), together with quantitative analysis based on the misorientation angle (EBSD). Besides, quantitative measurement of austenite with both blocky and film-like morphologies has been carried out. Due to the scale of nanostructured bainite, it is also important to control the thickness of bainitic ferrite and film-like austenite; hence, a method for measuring their thickness is presented. Finally, the possibility of measuring the prior-austenite grain size by the EBSD method is also demonstrated and compared with the conventional grain boundary etching method. The presented methods of qualitative and quantitative analyses form a complementary procedure for the microstructural characterization of nanoscale bainitic steels.

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Kitahara, Hiromoto, Rintaro Ueji, Masato Ueda, Nobuhiro Tsuji, and Yoritoshi Minamino. "Crystallographic analysis of plate martensite in Fe–28.5 at.% Ni by FE-SEM/EBSD." Materials Characterization 54, no. 4-5 (2005): 378–86. http://dx.doi.org/10.1016/j.matchar.2004.12.015.

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Gussev, M. N., and K. J. Leonard. "In situ SEM-EBSD analysis of plastic deformation mechanisms in neutron-irradiated austenitic steel." Journal of Nuclear Materials 517 (April 2019): 45–56. http://dx.doi.org/10.1016/j.jnucmat.2019.01.034.

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Sequeiros, E. W., R. F. Santos, M. T. Vieira, and M. F. Vieira. "Impact of Binder on AISI 316L Microcomponents Produced by Hot Embossing: SEM/EBSD Analysis." Microscopy and Microanalysis 22, S4 (2016): 50–51. http://dx.doi.org/10.1017/s1431927616000441.

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Mamtani, Manish A., Ritwik Chakraborty, Santu Biswas, Abhijeet Suryawanshi, Shalini Goswami, and Sandeep Bhatt. "SEM-EBSD Analysis of Broad Ion Beam Polished Rock Thin Sections — The MFAL Protocol." Journal of the Geological Society of India 95, no. 4 (2020): 337–42. http://dx.doi.org/10.1007/s12594-020-1441-0.

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Engstler, M., and F. Mücklich. "FIB/SEM serial sectioning as a versatile tool for microstructural analysis." Practical Metallography 61, no. 11 (2024): 865–78. http://dx.doi.org/10.1515/pm-2024-0076.

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Abstract FIB/SEM tomography is a serial sectioning method in which the cross-sectional area of the sample is stepwise removed with a focused ion beam (FIB) and the exposed cross-sectional area is imaged with a scanning electron microscope (SEM). All imaging techniques of the SEM can be used, which allows the application to a wide range of materials science questions. On the one hand, resolutions of a few nm can be achieved, and on the other hand, volumes with edge lengths of 100 μm and more can be examined. This article gives an overview of the current state of the art and the practical implementation of FIB/ SEM serial sectioning. The special aspects of the integration of energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) are also discussed.

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Brandaleze, Elena, Valeria Peirani, and Martina Ávalos. "Mould Fluxes Viscosity and Surface Tension Influence on the Wear Mechanisms of Al₂O₃-C Nozzle." Advances in Science and Technology 92 (October 2014): 226–31. http://dx.doi.org/10.4028/www.scientific.net/ast.92.226.

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A deep understanding of the mould flux effect on the wear mechanisms of Al2O3-C nozzles (AG) is relevant to avoid premature damage and to decrease the cost of black refractories in the industry. In this paper, a post mortem study on a nozzle was carried out to identify the causes of the wear mechanisms during the continuous casting of billets. Physical properties such as viscosity and surface tension of the mould fluxes were determined at operation temperature (1550oC), in order to correlate with microstructural results obtained by light and scanning electron microscopy (SEM). Also dihedral angle φ measurements were carried out at high magnification by SEM. Applying EDS analysis the infiltrated mould flux chemical composition was determined. The study was completed by EBSD. The EBSD technique contributed to increase the knowledge on wear mechanisms because of the possibility of identifying and localizing phases together with crystalline condition. The phases, the grain orientations and the properties of grain boundaries, have a large influence on the corrosion behaviour. Therefore, it is essential to have a characterization technique that can provide information such as: grain size, orientation, misorientation angle and the present phases. In this context, EBSD can provide relevant information on crystallographic and structural analysis of AG nozzle including the insert of ZrO2-C.

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Grajcar, Adam, Krzysztof Radwański, and Hanna J. Krztoń. "Microstructural Analysis of a Thermomechanically Processed Si-Al TRIP Steel Characterized by EBSD and X-Ray Techniques." Solid State Phenomena 203-204 (June 2013): 34–37. http://dx.doi.org/10.4028/www.scientific.net/ssp.203-204.34.

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The work focuses on the analysis of microstructural features of retained austenite in a thermomechanically processed Si-Al TRIP-type steel microalloyed with Nb and Ti. Austenite amount was determined using XRD and EBSD. Combined methods of LM, SEM and EBSD were applied to reveal the morphology, grain size and distribution of structural constituents. It is possible to retain 14% of  phase enriched in C to about 1.14 wt.%. Retained austenite is uniformly located as blocky grains with a diameter up to 4.5 m in a fine-grained ferritic matrix or between bainitic ferrite laths as thin layers. Special crystallographic relationships between bainitic ferrite and retained austenite were identified on the basis of the analysis of misorientation angles and image quality values.

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Chen, Zhong Wei, Hai Fang Zhang, and Jiang Chao Zhao. "Electron Back Scattering Diffraction Analysis of A357 Alloy Modified by Sr." Advanced Materials Research 160-162 (November 2010): 831–35. http://dx.doi.org/10.4028/www.scientific.net/amr.160-162.831.

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Microstructure of A357 alloy modified by Sr has been investigated by the Electron Back Scattering Diffraction (EBSD) mapping technique using a Field Emission Gun Scanning Electron Microscopy (FEG-SEM). An appropriate sample preparation technique by ion milling was applied to obtain a sufficiently smooth surface for EBSD mapping. Results show that the eutectic morphology in microstructure of A357 alloy modified by Sr was changed to fine fibrous, and the grain size was refined. By comparing the orientation of the aluminum in the eutectic to that of the primary aluminum dendrites, the nucleation and growth mechanism of the eutectic solidification in A357 cast alloy was determined. The eutectic Si phase of the modified sample nucleates on the heterogeneous nuclei located in the region between primary α-Al dendrites and grows up, while the eutectic Si phase of the sample without modification nucleates on the primary α-Al dendrites and grows up.

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Schneider, B., C. Bouchet, P. Perodeaud, et al. "Identification of phases in corium held at high temperature in a tungsten crucible by SEM, EPMA, and EBSD." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 504–5. http://dx.doi.org/10.1017/s0424820100164982.

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Heat treatments of U − Zr − O mixtures of different oxygen contents (ranging from 1 to 35 at. %) and of a constant U/Zr ratio (U/Zr = 1.35 which is characteristic of the inner part of a pressurized-water reactor) were performed in order to study the high temperature behavior of corium. The selected U-Zr-O mixtures were put in a tungsten crucible and heated to 2050°C. The specimens were thereafter analyzed by Scanning Electron Microscopy (SEM), Electron Probe Micro Analysis (EPMA) and Electron BackScattering Diffraction (EBSD).SEM surface analysis showed a complex system (Fig. 1). Four different phases were characterized. The uranium-rich matrix (noted P1) gave no diffraction pattern by EBSD. The average composition of the sharp grains (P2) located near the tungsten crucible surface was 66 at. % of W and 34 at. % of Zr. The diffraction pattern of this phase was accurately indexed with the fee structure parameters of W2Zr (Fig. 2).

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NAKAMACHI, Eiji, Hideo MORIMOTO, Takahiko ARIYOSHI, and Yasuhiro KOBAYASHI. "543 Experimental analysis of Plastic behavior of pure Aluminum single crystal by using SEM・EBSD." Proceedings of the 1992 Annual Meeting of JSME/MMD 2001 (2001): 567–68. http://dx.doi.org/10.1299/jsmezairiki.2001.0_567.

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NAKAMACHI, Eiji, Masumi AKAMATSU, Hideo MORIMOTO, and Eiji MIYAKE. "601 BCC Polycrystal Material Deformation Analysis Considering Ironing Texture by Using SEM, EBSD and FEM." Proceedings of Conference of Kansai Branch 2001.76 (2001): _6–1_—_6–2_. http://dx.doi.org/10.1299/jsmekansai.2001.76._6-1_.

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Borkar, Hemant, Salem Seifeddine, and Anders E. W. Jarfors. "Microstructure analysis of Al–Si–Cu alloys prepared by gradient solidification technique." International Journal of Modern Physics B 29, no. 10n11 (2015): 1540015. http://dx.doi.org/10.1142/s0217979215400159.

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Al – Si – Cu alloys were cast with the unique gradient solidification technique to produce alloys with two cooling rates corresponding to secondary dendrite arm spacing (SDAS) of ~9 and ~27 μm covering the microstructural fineness of common die cast components. The microstructure was studied with optical microscopy and scanning electron microscopy (SEM) equipped with energy dispersive spectroscopy (EDS) and electron backscattered diffraction (EBSD). The alloy with higher cooling rate, lower SDAS, has a more homogeneous microstructure with well distributed network of eutectic and intermetallic phases. The results indicate the presence of Al – Fe – Si phases, Al – Cu phases and eutectic Si particles but their type, distribution and amount varies in the two alloys with different SDAS. EBSD analysis was also performed to study the crystallographic orientation relationships in the microstructure. One of the major highlights of this study is the understanding of the eutectic formation mechanism achieved by studying the orientation relationships of the aluminum in the eutectic to the surrounding primary aluminum dendrites.

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Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.

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Microstructural internal lengths play an important role on the local and macroscopic mechanical behaviors of steels. In this study, the dislocation density gradients near grain boundaries in a ferritic steel are investigated using SEM/EBSD together with instrumented nanoindentation for undeformed and pre-deformed aluminum-killed steels (Al-k) at 3% and 18% tensile plastic strains. The effect of the distance to grain boundaries on Geometrically Necessary Dislocations (GND) densities is first determined by analyzing orientation gradients from 2D-EBSD maps. Then, nanohardness measurements are performed in the vicinity of grain boundaries. Data analyses show a clear correlation between the spatial gradients of GND density and the ones of nanohardness. Using a mechanistic model, the total dislocation densities are estimated from the measured nanohardness values. From both GND and total dislocation density profiles, the value of an internal length, denoted λ, is estimated from the analysis of dislocation density gradients near grain boundaries. At the end, the capabilities of 2D-EBSD and nanoindentation methods to assess this value are discussed.

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Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.

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Microstructural internal lengths play an important role on the local and macroscopic mechanical behaviors of steels. In this study, the dislocation density gradients near grain boundaries in a ferritic steel are investigated using SEM/EBSD together with instrumented nanoindentation for undeformed and pre-deformed aluminum-killed steels (Al-k) at 3% and 18% tensile plastic strains. The effect of the distance to grain boundaries on Geometrically Necessary Dislocations (GND) densities is first determined by analyzing orientation gradients from 2D-EBSD maps. Then, nanohardness measurements are performed in the vicinity of grain boundaries. Data analyses show a clear correlation between the spatial gradients of GND density and the ones of nanohardness. Using a mechanistic model, the total dislocation densities are estimated from the measured nanohardness values. From both GND and total dislocation density profiles, the value of an internal length, denoted λ, is estimated from the analysis of dislocation density gradients near grain boundaries. At the end, the capabilities of 2D-EBSD and nanoindentation methods to assess this value are discussed.

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42

Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.

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Microstructural internal lengths play an important role on the local and macroscopic mechanical behaviors of steels. In this study, the dislocation density gradients near grain boundaries in a ferritic steel are investigated using SEM/EBSD together with instrumented nanoindentation for undeformed and pre-deformed aluminum-killed steels (Al-k) at 3% and 18% tensile plastic strains. The effect of the distance to grain boundaries on Geometrically Necessary Dislocations (GND) densities is first determined by analyzing orientation gradients from 2D-EBSD maps. Then, nanohardness measurements are performed in the vicinity of grain boundaries. Data analyses show a clear correlation between the spatial gradients of GND density and the ones of nanohardness. Using a mechanistic model, the total dislocation densities are estimated from the measured nanohardness values. From both GND and total dislocation density profiles, the value of an internal length, denoted λ, is estimated from the analysis of dislocation density gradients near grain boundaries. At the end, the capabilities of 2D-EBSD and nanoindentation methods to assess this value are discussed.

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Nebbar, Mohamed Chaouki, Mosbah Zidani, Salim Messaoudi, Taher Abid, Ahmed Kisrane-Bouzidi, and Thierry Baudin. "Wire Drawing Effect on Microstructural and Textural Evolution in Medium Carbon Steel Wires." Defect and Diffusion Forum 406 (January 2021): 505–10. http://dx.doi.org/10.4028/www.scientific.net/ddf.406.505.

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This study was mainly oriented on the evolution of the crystallographic texture as a function of the deformation resulting from the industrial wire drawing process. This, in fact, will make it possible to establish a relationship between the microstructure and the crystallographic texture in the medium carbon steel wires obtained by industrial wire drawing process and used in the manufacture of spring mattresses in order to minimize the loss of material and to satisfy the users of this product.During this study, a medium-carbon steel wires was characterized by two analytical techniques. The scanning electron microscopy (SEM) to monitor the microstructure evolution and the electron backscatter diffraction (EBSD) for the crystallographic texture analysis. The EBSD results are processed with OIM (Orientation Imaging Microscopy) analysis software.

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Nebbar, Mohamed Chaouki, Mosbah Zidani, Salim Messaoudi, Taher Abid, Ahmed Kisrane-Bouzidi, and Thierry Baudin. "Wire Drawing Effect on Microstructural and Textural Evolution in Medium Carbon Steel Wires." Defect and Diffusion Forum 406 (January 2021): 505–10. http://dx.doi.org/10.4028/www.scientific.net/ddf.406.505.

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This study was mainly oriented on the evolution of the crystallographic texture as a function of the deformation resulting from the industrial wire drawing process. This, in fact, will make it possible to establish a relationship between the microstructure and the crystallographic texture in the medium carbon steel wires obtained by industrial wire drawing process and used in the manufacture of spring mattresses in order to minimize the loss of material and to satisfy the users of this product.During this study, a medium-carbon steel wires was characterized by two analytical techniques. The scanning electron microscopy (SEM) to monitor the microstructure evolution and the electron backscatter diffraction (EBSD) for the crystallographic texture analysis. The EBSD results are processed with OIM (Orientation Imaging Microscopy) analysis software.

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Camus, Patrick. "EBSD in FESEM and LVSEM." Microscopy and Microanalysis 6, S2 (2000): 942–43. http://dx.doi.org/10.1017/s143192760003720x.

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BackgroundElectron backscattered diffraction (EBSD) is a very powerful analysis technique to understand the crystallography of a sample in the SEM. Typically, a high beam current is needed to obtain good results because of inefficient collection of the patterns. In W-filament SEM's, the high beam current necessitates a large spot size and requisite low image resolution. The large beam current can also be a source of problems for insulating samples or sample mounts by causing charging and the resulting image drift.To reduce the spot size with adequate beam currents for imaging, field-emission (FE) guns are used. For most FESEM's, the beam current is markedly reduced from that produced by W-filament instruments. Even though the image resolution is better, the EBSD performance tends to suffer at low beam currents for standard hardware configurations. To regain the performance of a comparable W-filament system, the EBSD hardware should be changed for the low beam current operation. This paper will address the hardware considerations for low beam current applications.

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Russakova, Alyona, Darya Alontseva, and Tatyana Kolesnikova. "The Effect of Deformation and Irradiation with High-Energy Krypton Ions on the Structure and Phase Composition of Reactor Steels." Advanced Materials Research 702 (May 2013): 88–93. http://dx.doi.org/10.4028/www.scientific.net/amr.702.88.

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The paper presents some results of a complex research of 12Cr18Ni10Ti stainless steel in the initial, deformed and irradiated ( 8436Kr+14, E=130MeV, Fmax=9x1015 ions/сm2) states using magnetometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM) with electron backscattered diffraction (EBSD – analysis). Application of the EBSD method revealed differences between the non-irradiated and irradiated 12Cr18Ni10Ti steel specimens consisting in the fact that in the surface layer of an irradiated sample α-and ε - phases are formed. It was established that the fluence value affects the amount of magnetic α-phase. The study of the martensite α-phase morphology showed that in the deformed steel specimens there is αʹ- martensite of two scale levels.

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Hiraoka, Yuki, Yoshiharu Murase, Hideki Katayama, et al. "Multimodal Analysis of Corrosion for AA6016 Alloy at the Boundaries between Aluminum Matrix/Intermetallic Particles." ECS Meeting Abstracts MA2024-02, no. 67 (2024): 4568. https://doi.org/10.1149/ma2024-02674568mtgabs.

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Aluminum alloys are attracting attention as lightweight materials for automobiles, and the fact that intermetallic particles indispensable for improving strength of the alloys can be harmful to the corrosion resistance has become an issue. However, the initial corrosion behavior at the interface of intermetallic particles for aluminum alloys has been hardly examined using a comprehensive analysis method. In this study, a nano-micro scale multimodal analysis of Energy Dispersive X-ray Analysis (EDS), Electron Backscatter Diffraction (EBSD), and Kelvin Force Microscopy (KFM) was performed to clarify the initial corrosion behavior for AA6016. AA6016 specimens (20 × 20 × 1 mm) were subjected to SEM-EDS/EBSD measurements after mirror polishing, followed by continuous KFM measurements after ion milling. The specimens were then immersed in 100 mL of 0.5 wt% NaCl solution for 1 hour at a corrosion test. The surfaces of the specimens were cleaned with distilled water, dried and subjected to subsequent KFM measurements. The measurement of SEM-EDS was conducted again after the series of KFM measurements prior and post corrosion test. Fig. 1 shows SEM images of the typical specimen surface for AA6016 before corrosion tests. As shown in Fig. 1, two types of intermetallic particles: Al-Fe-Si and Mg-Si were identified by EDS measurements. The KFM measurements of the potential distribution on specimen surfaces confirmed that both intermetallic particles were noble in potential relative to the aluminum matrix. However, less significant difference in the potential was detected at the grain boundaries identified by the EBSD measurements. After the corrosion test, some trenches were formed at the boundaries of the Al-Fe-Si type particle, and the noble potential area expanded around the particle. As for the Mg-Si type particles, a dissolution of Mg was detected at the particle, and the noble potential region disappeared at the particles immediately after the corrosion test but reappeared with time. Furthermore, the formation of thick oxide films was implied after the corrosion test, especially at the boundaries of Al-Fe-Si type particle as well as at the Mg-Si type particle. Thus, the initial corrosion behaviors of AA6016 related to the compositional/electrochemical modifications at and around intermetallic particles were demonstrated by using the nano-micro scale multimodal (EDS-EBSD-KFM) analysis. Although the modifications of compositions (Mg and O) as well as noble potential distribution were restricted within the particle for Mg-Si type particle, they were expanded at the boundaries and around the particle for Al-Fe-Si type particle. The Al-Fe-Si type intermetallic particles would play more important role than those of Mg-Si type particles in promoting localized corrosion for AA6016. Figure 1

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Ito, Hiroyuki, Yoichiro Hashimoto, Shuichi Takeuchi, Masahiro Sasajima, Hirofumi Sato, and Hirobumi Morita. "Application of a Semi-in-Lens FE-SEM to the Crystallographic Analysis with the EBSD Technique." Microscopy and Microanalysis 21, S3 (2015): 147–48. http://dx.doi.org/10.1017/s1431927615001531.

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Sugiyama, M., M. Takei, S. Sekida, and N. Maruyama. "Characterization of hierarchical lath martensite microstructure in low carbon steels using ultra-high voltage TEM and SEM-EBSD analysis." IOP Conference Series: Materials Science and Engineering 1249, no. 1 (2022): 012020. http://dx.doi.org/10.1088/1757-899x/1249/1/012020.

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Abstract Lath martensite is a heterogenous microstructure in low carbon steels and plays an important part in microstructure for the high strength steels. The complex martensitic structure has been clarified as the hierarchical block and packet structures using SEM observations and electron backscatter diffraction (EBSD) analysis. As the result of variant analysis, it is found that the block consists of sub-blocks and the block size and distribution seem to be new key factors to control the mechanical properties. Each block is further subdivided by laths, which are the finest structural units in lath martensite. The morphology of laths and their variants in low carbon steels has been further investigated using the ultra-high voltage TEM (UHVEM) with 3MeV in accelerated voltage. Based on a comparison of UHVEM and SEM observations for the same field of view, it is found that the laths have a further hierarchical organization with twinned morphology and the fragmented structure within the laths. Two plane crystal analysis of the twin in a lath has been carried out using SEM-EBSD analysis after Xe-FIB large area fabrication process, resulting in the identification of the twin morphology such as the {112} twin plane perpendicular to the {110} habit plane and along the <111> direction. Although several types of twinned morphology such as the long and short length are observed in the lath microstructure under TEM observations, the twinning structure observed in various forms is explained by a simple model in the present study.

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Raanes, M., and J. Hjelen. "Analysis of Asbestos Fibres in The Scanning Electron Microscope (SEM) by The Use of Electron Backscattering Diffraction (Ebsd)." Microscopy and Microanalysis 3, S2 (1997): 767–68. http://dx.doi.org/10.1017/s1431927600010722.

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Asbestos is a common name of a number of fibrous mineral silicates which differ in chemical composition. The asbestos fibres are classified into two groups: serpentine (chrysotile) and amphiboles (anthophyllite, amosite, actinolite, tremolite, crocidolite).Inhalation of asbestos dust fibres involves a health risk. It is therefore of great importance to develop quick and reliable methods to check for the presence of asbestos fibres in suspected materials. Some common analysis methods for asbestos detection are: optical microscopy scanning or transmission electron microscopies (SEM ,TEM) often combined with energy dispersive X-ray analysis (EDX) and selected area electron diffraction (SAED) in the TEM where the crystal structure is determined.The EBSD technique in the SEM has in this work been applied to achieve electron backscattering patterns (EBSP) from four types of asbestos fibres. The pattern quality has been studied as a function of specimen preparation and SEM settings.

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Journal articles on the topic 'SEM-EBSD analysis'

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