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Journal articles on the topic 'SEM image'

Author: Grafiati

Published: 3 June 2025

Last updated: 20 July 2025

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1

Arti Verma. "Digital Image Processing of SEM image of Polymer Nanocomposite Thin Film Using Java Based Program Image J." Power System Technology 43, no. 2 (2019): 44–46. https://doi.org/10.52783/pst.1135.

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Various images obtain from TEM; SEM can be analyzed with the help of computer image analysis software. Image processing is used to describe the size, shape, surface topography of micro or nano structure materials. In the present paper the characterization analysis is being reported qualitatively by using digital image processing of SEM/TEM image of some nanomaterials. This novel technique is an effective experimental tool for the detailed structural characterization. For image processing Java based software ImageJ is used in the present study.

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Chen, Ya. "Digital Image Acquisition and Presentation for High Resolution SEM." Microscopy and Microanalysis 4, S2 (1998): 68–69. http://dx.doi.org/10.1017/s1431927600020468.

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Images obtained from an analog SEM are traditionally viewed and recorded from a cathode-ray tube (CRT). Many laboratories use instant film (e.g. Polaroid #52, #55 instant film) to justify image quality and obtain permanent image quickly. Digital imaging provides an alternative approach for image acquisition and recording. One major advantage of digital SEM is image averaging that allows one to improve the signal-to-noise ratio (SNR) from a noisy quick-scan image to reduce charging. SEM signal yield is proportional to incident beam intensity, image acquisition time or duration of beam interacti

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Zhang, Rui, Liwen Cao, and Yuliang Guo. "Determining Effective Threshold Range of Image Pixel Values for Municipal Waste-Contaminated Clay." Applied Sciences 14, no. 6 (2024): 2419. http://dx.doi.org/10.3390/app14062419.

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Currently, more attention has been given to the study of the microstructure of contaminated clay, while few studies have focused on the analysis of SEM images of clay from a threshold perspective. The purpose of this paper was to determine the threshold range of image pixel values for municipal waste-contaminated clay by observing and processing SEM images of municipal waste-contaminated clay under different seepage depths and concentrations. In this study, municipal waste-contaminated clay samples were obtained at different depths in a column test exhibiting different CaCO3 and CH3COOH concen

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Sawyer, Linda C. "SEM of polymer materials." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 426–29. http://dx.doi.org/10.1017/s0424820100126913.

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Scanning electron microscopy (SEM) has become an analytical tool widely used in universities, industrial laboratories and modern plants in applications ranging from fundamental research and applied research to quality control. The SEM provides important and insightful observations, in the form of three dimensional images of bulk materials and surfaces, which provide input to conduct process-structure-properties studies of polymer materials. SEM analysis requires knowledge of the instruments, image formation and specimen preparation methods.Consideration must be given to the interaction of the

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Lew, Kai Liang, Kok Swee Sim, and Shing Chiang Tan. "Single Image Estimation Techniques for SEM Imaging System." JOIV : International Journal on Informatics Visualization 9, no. 1 (2025): 104. https://doi.org/10.62527/joiv.9.1.3505.

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Estimating a single image's signal-to-noise ratio (SNR) is a critical challenge in Scanning Electron Microscopy (SEM), impacting image quality and analysis reliability. SEM images are essential for revealing structural details at the micro- or nanoscale, but noise often obscures these details, complicating interpretation. Traditional SNR estimation methods required two images to compare and assess the noise levels. SEM images are usually corrupted by noise through several operating conditions, such as dwell time, probe current, and specimen composition. This paper introduces a novel single-ima

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Ramirez Peña, Luis Esteban, Hector A. Calderon, and Alin Andrai Carsteanu. "Digital Image Processing in C++ in SEM Images." Microscopy and Microanalysis 28, S1 (2022): 2186–88. http://dx.doi.org/10.1017/s1431927622008443.

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Salminen, Turkka, and Lucio Azzari. "Image fusion for 3D reconstruction of SEM images." BIO Web of Conferences 129 (2024): 02010. http://dx.doi.org/10.1051/bioconf/202412902010.

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Milillo, Tammy, Robert Hard, Brett Yatzor, Mary Ellen Miller, and Joseph Gardella. "Image fusion combining SEM and ToF-SIMS images." Surface and Interface Analysis 47, no. 3 (2014): 371–76. http://dx.doi.org/10.1002/sia.5719.

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Postek, M. T., and A. E. Vladar. "SEM image sharpness analysis." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 142–43. http://dx.doi.org/10.1017/s0424820100163174.

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Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in thi

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Postek, M. T., and A. E. Vladar. "SEM Image Sharpness Analysis." Microscopy Today 4, no. 8 (1996): 18–19. http://dx.doi.org/10.1017/s1551929500063665.

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Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at IMIST. The fundamentals and results are discussed in this

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Dondero, Maria Giulia. "Visual semiotics and automatic analysis of images from the Cultural Analytics Lab: How can quantitative and qualitative analysis be combined?" Semiotica 2019, no. 230 (2019): 121–42. http://dx.doi.org/10.1515/sem-2018-0104.

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AbstractIn this article we explore the relationship between semiotic analysis of images and quantitative analysis of vast image corpora, in particular the work produced by Lev Manovich and the Cultural Analytics Lab, called “Media Visualization.” Media Visualization has been chosen as corpus because of its metavisual operation (images are visualized and analyzed by images) and its innovating way of conceiving analysis: by visual instruments. In this paper semiotics is used as an approach to Media Visualization and taken as an object of study as well, especially visual semiotics. In this sense,

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Denault, Lauraine, Robin de la Parra, and Claude von Roesgen. "Managing digital images with SEM viewer™." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 460–61. http://dx.doi.org/10.1017/s0424820100170037.

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In 1992 Millipore's Corporate SEM Lab made the transition from conventional analog recording of images to digital acquisition and archival. Commonly requested images could be easily and reliably retrieved, without significant loss of image quality or resolution.In theory, digital images could be sent over a network to desktop PC's for review, (rather than producing hard copy of all images). Using established wide area network system, the scope of incorporating digital images significantly broadened. A significant barrier appeared in that the images were acquired using two different hardware/so

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Kiviniemi, Anne-Laure. "Dire l’indicible et décrire l’indescriptible: Ressources imagières et linguistiques des poilus." Semiotica 2015, no. 207 (2015): 139–74. http://dx.doi.org/10.1515/sem-2015-0054.

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RésuméCet article étudie et confronte les usages que font quatre soldats aux profils scolaires différents des ressources imagières et linguistiques pour exprimer l’inexprimable. Il s’agira de déterminer si leurs utilisations des mots et de l’image attestent d’une “déchirure du pouvoir d’expression” (Balibar 1985: 406) entre bénéficiaires de l’instruction primaire et bénéficiaires de l’instruction secondaire. L’usage concurrent, synergique ou fusionnel des deux systèmes sémiotiques sera étudié via une analyse stylistico-pragmatique. Seront passées en revue les manières dont les soldats parvienn

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Götz, Andreas, Volkmar Senz, Sabine Illner, and Niels Grabow. "Computed fiber evaluation of SEM images using DiameterJ." Current Directions in Biomedical Engineering 6, no. 3 (2020): 438–41. http://dx.doi.org/10.1515/cdbme-2020-3113.

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AbstractFiber materials offer a high potential for improving the surface characteristics of medical implants. For quality assurance of nano- and microfiber structures the morphology is inspected by Scanning Electron Microscopy (SEM) as a standard method. Vast quantities of image data have to be evaluated. Usual practice for obtaining the fiber diameters is the manually setting of measurement points. The software DiameterJ which runs as plugin in ImageJ automatically computes fiber diameters. Here we investigated its capabilities and limitations by comparing the evaluation of selected sample SE

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Moliner, Pascal, and Inna Bovina. "Significations et éléments centraux versus périphériques des représentations visuelles." Semiotica 2022, no. 244 (2022): 27–51. http://dx.doi.org/10.1515/sem-2020-0038.

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Résumé Cette recherche porte sur le rôle joué par les différents éléments d’une image dans l’interprétation de cette image et dans les émotions qu’elle induit. A partir de l’approche structurale de la théorie des représentations sociales on suppose que certains des éléments d’une image seraient centraux tandis que d’autres seraient périphériques. Pour explorer cette piste on a retouché trois photographies originales afin de supprimer certains des éléments qu’elles montraient. Les photographies originales et les photographies retouchées ont été présentées à trois groupes de participants (n1 = 9

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Pawley, J. B. "The Return of SEM Beam-Tilt Stereo." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 206–7. http://dx.doi.org/10.1017/s0424820100103115.

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Stereo images add much to an accurate interpretation of surface images produced by the scanning electron microscope (SEM). Although the secondary electron (SE) signal contains considerable information about the micro-topography of the specimen, various non-topographic information may also be present. Because the process of binocular stereopsis by which we "see" in stereo depends chiefly on pattern recognition rather than on brightness, it discriminates against brightness artifacts and conveys a more accurate and if necessary, fully quantitative, impression of the actual micro-topography of the

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Furat, Orkun, Thomas Leißner, Ralf Ditscherlein, et al. "Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis." Microscopy and Microanalysis 24, no. 5 (2018): 461–70. http://dx.doi.org/10.1017/s1431927618015076.

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AbstractIn this paper, three-dimensional (3D) image data of ore particle systems is investigated. By combining X-ray microtomography with scanning electron microscope (SEM)-based image analysis, additional information about the mineralogical composition from certain planar sections can be gained. For the analysis of tomographic images of particle systems the extraction of single particles is essential. This is performed with a marker-based watershed algorithm and a post-processing step utilizing a neural network to reduce oversegmentation. The results are validated by comparing the 3D particle

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Moorthy, Chellapilla V. K. N. S. N., Mukesh Kumar Tripathi, Suvarna Joshi, Ashwini Shinde, Tejaswini Kishor Zope, and Vaibhavi Umesh Avachat. "SEM and TEM images’ dehazing using multiscale progressive feature fusion techniques." Indonesian Journal of Electrical Engineering and Computer Science 33, no. 3 (2024): 2007. http://dx.doi.org/10.11591/ijeecs.v33.i3.pp2007-2014.

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<p>We present a highly effective algorithm for image dehazing that leverages the valuable information within the hazy image to guide the haze removal process. Our proposed algorithm begins by employing a neural network that has been trained to establish a mapping between hazy images and their corresponding clear versions. This network learns to identify the shared structural elements and patterns between hazy and clear images through the training process. To enhance the utilization of guidance information from the generated reference image, we introduce a progressive feature fusion modul

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Moorthy, Chellapilla V. K. N. S. N., Mukesh Kumar Tripathi, Suvarna Joshi, Ashwini Shinde, Tejaswini Kishor Zope, and Vaibhavi Umesh Avachat. "SEM and TEM images' dehazing using multiscale progressive feature fusion techniques." Indonesian Journal of Electrical Engineering and Computer Science 33, no. 3 (2024): 2007–14. https://doi.org/10.11591/ijeecs.v33.i3.pp2007-2014.

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We present a highly effective algorithm for image dehazing that leverages the valuable information within the hazy image to guide the haze removal process. Our proposed algorithm begins by employing a neural network that has been trained to establish a mapping between hazy images and their corresponding clear versions. This network learns to identify the shared structural elements and patterns between hazy and clear images through the training process. To enhance the utilization of guidance information from the generated reference image, we introduce a progressive feature fusion module that co

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Tang, Xin, Ruiyu He, Biao Wang, Yuerong Zhou та Hong Yin. "Intelligent Identiﬁcation and Quantitative Characterization of Pores in Shale SEM Images Based on Pore-Net Deep-Learning Network Model". Petrophysics – The SPWLA Journal of Formation Evaluation and Reservoir Description 65, № 2 (2024): 233–45. http://dx.doi.org/10.30632/pjv65n2-2024a6.

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Among the various shale reservoir evaluation methods, the scanning electron microscope (SEM) image method is widely used. Its image can intuitively reflect the development stage of a shale reservoir and is often used for the qualitative characterization of shale pores. However, manual image processing is inefficient and cannot quantitatively characterize pores. The semantic segmentation method of deep learning greatly improves the efficiency of image analysis and can calculate the face rate of shale SEM images to achieve quantitative characterization. In this paper, the high-maturity shale of

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Osten, Evariste F., and John C. Schultz. "A system for fast digital image processing of asynchronous SEM signals." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 676–77. http://dx.doi.org/10.1017/s0424820100105448.

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The time required to examine a specimen's features with an SEM before photographically recording representative images is related to the amount of visual information about that specimen that is available from the SEM's viewing CRT. In a laboratory that examines several thousand specimens each year, many in low signal-to-noise situations, the accumulated examination time can be significant. Image processing to increase the information content of the viewed image can reduce the time needed to examine the specimen. Digital frame integration can be used to improve an image's signal-to-noise ratio

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ZHU, QINGYONG, WEIBIN YANG, and HUAIZHONG YU. "STUDY ON THE PERMEABILITY OF RED SANDSTONE VIA IMAGE ENHANCEMENT." Fractals 25, no. 06 (2017): 1750055. http://dx.doi.org/10.1142/s0218348x17500554.

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Scanning electron microscopy (SEM) is of great importance for studying fractal permeability. In this work, we presented a new technique, by applying the high-order upwind compact difference schemes to solve the hyperbolic conservation laws, to enhance textural differences for accurate segmentation of the SEM images. From the enhanced SEM images, the channels and pores can be obtained by using the two-stage image segmentation. Combining with the box counting method, the key parameters for evaluation of the fractal permeability such as the tortuosity fractal dimension, the pore area fractal dime

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Joy, David C. "Image modelling for SEM-based metrology." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 650–51. http://dx.doi.org/10.1017/s042482010014467x.

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Much of the success of the scanning electron microscope (SEM) can be attributed to the fact that the images that it produces appear similar to those seen by our eyes. Consequently the interpretation of SEM micrographs is perceived as a straightforward process. Although this casual approach works well enough for many qualitative purposes, when the SEM is to be used to make precise dimensional measurements of micron-sized features, such as resist strips or conductor pads, then more care must be paid to the details of image formation.Two types of electron signal, backscattered (BS) and secondary

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Yamada, S., T. Ito, K. Gouhara, and Y. Uchikawa. "Secondary Electron Counting Images in SEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 402–3. http://dx.doi.org/10.1017/s0424820100180768.

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The conventional method of image recording in scanning electron microscopy is photographic recording of the images displayed on a monitor screen of CRT installed with the SEM. An increasing number of works related to the development of computerized systems for digital recording and processing of the image data have been reported But a serious problem exists that the digiatal image data are acquired by discretizing the analogue output of the conventional detector system. In actuality, proportionality between the analogue output and the number of detected electrons is not ensured because of vari

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Grießer, Andreas, Martina Hümbert, Christian Wagner, Ilona Glatt, Sarah Reeb, and Robin White. "Image Segmentation Methods for FIB-SEM Images of Cathodes." Microscopy and Microanalysis 28, S1 (2022): 46–47. http://dx.doi.org/10.1017/s143192762200109x.

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Yamada, A., A. Shibano, K. Harasawa, et al. "Development of a digital SEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 358–59. http://dx.doi.org/10.1017/s042482010008609x.

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A newly developed digital scanning electron microscope, the JSM-6300, has the following features: Equipped with a narrower conical objective lens (OL), it allows high resolution images to be obtained easily at a short working distance (WD) and a large specimen tilt angle. In addition, it is provided with automatic functions and digital image processing functions for ease of operation.Conical C-F lens: The newly developed conical C-F objective lens, having low aberration characteristics over a wide WD range, allows a large-diameter (3-inch) specimen to be tilted up to 60° at short WD, and provi

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Zhang, Huan, Chun Xia He, De Rong Lu, and Min Yu. "SEM Image Processing of PP/Rice Husk Composite Using MATLAB." Applied Mechanics and Materials 214 (November 2012): 27–30. http://dx.doi.org/10.4028/www.scientific.net/amm.214.27.

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As a novel environmental protection, sustainable and energy-saving building material, Wood Plastic Composites (WPC) has been acknowledged gradually and has been used extensively in the trade of building materials in Chinese mainland. By acquiring SEM images of PP/rice husk composite and using digital image processing based on MATLAB, the composite microstructure images were subsequently processed, e.g. image gray adjust, filtering, smoothing, region segmentation, morphological processing, etc. The image processing results show that the processed images are clearer and more discriminative than

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YIN, Changchang, Meng ZHAO, Xiaohan WANG, and Xuezhen CHENG. "A dataset of SEM images of atmospheric particles in Qingdao." China Scientific Data 9, no. 2 (2024): 1–5. http://dx.doi.org/10.11922/11-6035.csd.2022.0101.zh.

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In this paper, we selected seven representative sampling points in Qingdao to collect atmospheric particulate samples in different periods, and then obtained the SEM (Scanning Electron Microscope) images of particulate matters through scanning electron microscopy. By observing and analyzing the morphological characteristics of the images, we identified and selected 334 SEM images of particles with distinct morphological characteristics. Based on the obtained SEM images of atmospheric particles, the particles are divided into seven categories according to their morphological characteristics: ch

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Choi, Youngwoo, and Seungbum Hong. "Development of a Machine Learning Model for Quantifying SEM Images of Electrode Materials Based on AFM Topography Image." ECS Meeting Abstracts MA2024-02, no. 3 (2024): 353. https://doi.org/10.1149/ma2024-023353mtgabs.

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Scanning electron microscopy (SEM) is a tool that allows for easy visualization of surface morphology of materials, but it has the drawback of difficulty in quantitative shape analysis. On the other hand, atomic force microscopy (AFM) enables quantitative analysis of material surface morphology with very high precision; however, it suffers from long analysis times and difficulties in analyzing a wide area. In particular, materials like graphite, used in electrode materials for batteries, possess high roughness, which poses additional challenges for AFM analysis. To extend the spatial precision

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Yamada, M., T. Yoshihara, H. Arima, Y. Nimura, T. Kobayashi, and C. Nielsen. "Development of High-Definition Image Processing System for a FE-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 458–59. http://dx.doi.org/10.1017/s0424820100164751.

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This paper presents the development of a new, fully digital image processing system for a field emission SEM (FE-SEM) which can eliminate fluctuations in the emission current. The system can display, in real time, images with 1280 × 1024 pixels on a viewing CRT, allowing direct observation of high definition SEM images on the FE-SEM.In the past, even though image was acquired and recorded (photographed) with the resolution higher than 1,000 x 1,000 pixels, it was generally observed on the viewing CRT at the resolution of only about 500 x 500 pixels for real-time observation. This created a dif

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Edwards, R. M., J. Lebiedzik, and G. Stone. "Fully automated SEM image analysis." Scanning 8, no. 5 (1986): 221–31. http://dx.doi.org/10.1002/sca.4950080505.

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Park, You-Jin, Rong Pan, and Douglas C. Montgomery. "Analysis of Electromagnetic Interference Effect on Semiconductor Scanning Electron Microscope Image Distortion." Applied Sciences 14, no. 1 (2023): 223. http://dx.doi.org/10.3390/app14010223.

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Most electronic devices are susceptible to electromagnetic interference (EMI); thus, it is necessary to recognize and identify the cause and effect of EMI as it can corrupt electronic signals and degrade equipment performance. Particularly, in semiconductor manufacturing, the equipment used for image capturing is subject to various noises induced by EMI, causing the image analysis to be unreliable during the image recognition and digitization process. Thus, in this research, we aim to detect and quantify the influence of EMI on semiconductor SEM (scanning electron microscope) images. For this,

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Yamada, Atsushi, Toshiharu Kobayashi, Tsutomu Negishi, et al. "Remote Control Scanning Electron Microscope with Web Operatoin Interface." Microscopy and Microanalysis 7, S2 (2001): 974–75. http://dx.doi.org/10.1017/s1431927600030944.

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Recently, SEM (Scanning Electron Microscope) and the other observation devices are coming to use a LAN (Local Area Network) to save the image in the database. We developed a remote control system in which SEM image and Control interface is indicated on the WEB Browser. in this system, SEM can be controlled by an external (client) PC installed in a general WEB Browser(Internet Explorer). Accordingly, operation interface can be indicated on the WEB browser.A JSM-6700F is connected to a LAN, and so the microscope can be controlled by a client PC. Figure. 1 shows the block diagram of SEM remote co

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Ahamad, Mohd Sanusi S., and Elly Nur Myaisara Maizul. "Digital Analysis of Geo-Referenced Concrete Scanning Electron Microscope (SEM) Images." Civil and Environmental Engineering Reports 30, no. 2 (2020): 65–79. http://dx.doi.org/10.2478/ceer-2020-0020.

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AbstractThe microstructural evaluation of complex cementitious materials has been made possible by the microscopic imaging tools such as Scanning Electron Microscope (SEM) and X-Ray Microanalysis. Particularly, the application of concrete SEM imaging and digital image analysis have become common in the analysis and mapping of concrete technology. In this study, six samples of two-dimensional (2D) SEM images were spatially resampled to produce Geo-referenced SEM sample images. Subsequently, they were analyzed and the intensity histogram plot was produced to facilitate visual interpretation. The

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Panchal, Suresh, Suwarna Datar, and Unnikrishnan Gopinathan. "Performance enhancement of a scanning electron microscope using a deep convolutional neural network." Measurement Science and Technology 33, no. 6 (2022): 065403. http://dx.doi.org/10.1088/1361-6501/ac4a19.

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Abstract We report noise reduction and image enhancement in scanning electron microscope (SEM) imaging while maintaining a fast scan rate during imaging, using a deep convolutional neural network (D-CNN). SEM images of non-conducting samples without a conducting coating always suffer from charging phenomenon, giving rise to SEM images with low contrast or anomalous contrast and permanent damage to the sample. One of the ways to avoid this effect is to use fast scan mode, which suppresses the charging effect fairly well. Unfortunately, this also introduces noise and gives blurred images. The D-

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Dondero, Maria Giulia. "Le plan de l’expression des images: Quelques réflexions sur support et apport." Semiotica 2020, no. 234 (2020): 253–70. http://dx.doi.org/10.1515/sem-2018-0124.

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AbstractIn this article we plan to revisit the notion of substance of the plane of expression, as found in semiotic studies of the image, and how this notion relates to the concepts of purport and form. The article is divided into three parts: The first section gives a brief history of the various ways substance has been addressed in (or excluded from) image analyses based on Greimassian semiotics and Groupe μ rhetoric. Drawing upon Jacques Fontanille’s semiotics of practices and Jean-François Bordron’s theory of iconicity, the second section concerns proposals that attempt to address the “mom

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Oho, Eisaku, Kazuhiko Suzuki, and Sadao Yamazaki. "Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy." Scanning 2020 (March 31, 2020): 1–9. http://dx.doi.org/10.1155/2020/4979431.

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This study proposes an efficient and fast method of scanning (e.g., television (TV) scan) coupled with digital image processing technology to replace the conventional slow-scan mode as a standard model of acquisition for general-purpose scanning electron microscopy (SEM). SEM images obtained using the proposed method had the same quality in terms of sharpness and noise as slow-scan images, and it was able to suppress the adverse effects of charging in a full-vacuum condition, which is a challenging problem in this area. Two problems needed to be solved in designing the proposed method. One was

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Hesham Samir. "CD-SEM Image Defect Detection and Classification Using Transformers." Journal of Electrical Systems 20, no. 10s (2024): 4259–66. http://dx.doi.org/10.52783/jes.6062.

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In the integrated circuits manufacturing process, a critical dimension scanning electron microscope machine provides high-resolution images of geometries on semiconductor wafers and measurements of the printed polygons after the photolithography process. These images and measurements are crucial for calibrating lithography process models such as the etch model, optical proximity correction model, and resist model, which are necessary for simulating the photolithography process and hence reducing the probability of defects occurrence. However, The test chips used for model calibration often con

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Wijayanti, Anies, Andre Dwijanto Witjaksono, and Anang Kistyanto. "The Impact of Human Resource Competency and Transformational Leadership on Employee Performance with Motivation as a Mediating Variable." Image : Jurnal Riset Manajemen 12, no. 2 (2024): 228–38. https://doi.org/10.17509/image/2024.017.

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Transformational Leadership at DLH has been applied but there is still no evidence that the application of transformational leadership at DLH Kota Surabaya can improve overall employee performance. This research aims to analyze the influence of competence and transformational leadership on employee performance through the role of motivation as an intervening variable using the SEM-PLS method on a sample of DLH Surabaya City employees. SEM-PLS is used because of its ability to obtain relationship results between variables. The results show good validity and reliability of the instrument. Motiva

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Gupta, Yubraj, Carlos Costa, Eduardo Pinho, Luís A. Bastião Silva, and Rainer Heintzmann. "IMAGE-IN: Interactive web-based multidimensional 3D visualizer for multi-modal microscopy images." PLOS ONE 17, no. 12 (2022): e0279825. http://dx.doi.org/10.1371/journal.pone.0279825.

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Advances in microscopy hardware and storage capabilities lead to increasingly larger multidimensional datasets. The multiple dimensions are commonly associated with space, time, and color channels. Since “seeing is believing”, it is important to have easy access to user-friendly visualization software. Here we present IMAGE-IN, an interactive web-based multidimensional (N-D) viewer designed specifically for confocal laser scanning microscopy (CLSM) and focused ion beam scanning electron microscopy (FIB-SEM) data, with the goal of assisting biologists in their visualization and analysis tasks a

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Regez, Brad, Ying Zhang, Tsuchin Chu, Jarlen Don, and Ajay Mahajan. "In-plane bulk material displacement and deformation measurements using digital image correlation of ultrasonic C-scan images." Structural Engineering and Mechanics 29, no. 1 (2008): 113–16. http://dx.doi.org/10.12989/sem.2008.29.1.113.

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Cizmar, Petr, András E. Vladár, and Michael T. Postek. "Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift." Microscopy and Microanalysis 17, no. 2 (2010): 302–8. http://dx.doi.org/10.1017/s1431927610094250.

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AbstractIn this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift distortion commonly causes blur and distortions in the SEM images. Such corruption ordinarily appears when conventional image-acquisition methods, i.e., “slow scan” and “fast scan,” are applied. The damage is often very significant; it may render images unusable for metrology applications, especially where subnanometer accuracy is required. The described correction technique works with a large number of quickly taken f

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Choudhari, Khoobaram S., Pacheeripadikkal Jidesh, Parampalli Sudheendra, and Suresh D. Kulkarni. "Quantification and Morphology Studies of Nanoporous Alumina Membranes: A New Algorithm for Digital Image Processing." Microscopy and Microanalysis 19, no. 4 (2013): 1061–72. http://dx.doi.org/10.1017/s1431927613001542.

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AbstractA new mathematical algorithm is reported for the accurate and efficient analysis of pore properties of nanoporous anodic alumina (NAA) membranes using scanning electron microscope (SEM) images. NAA membranes of the desired pore size were fabricated using a two-step anodic oxidation process. Surface morphology of the NAA membranes with different pore properties was studied using SEM images along with computerized image processing and analysis. The main objective was to analyze the SEM images of NAA membranes quantitatively, systematically, and quickly. The method uses a regularized shoc

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Götz, Andreas, Niels Grabow, Sabine Illner, and Volkmar Senz. "Fiber statistics of nonwoven materials by SEM images - influence of number of images." Current Directions in Biomedical Engineering 7, no. 2 (2021): 652–55. http://dx.doi.org/10.1515/cdbme-2021-2166.

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Abstract Electrospun nonwovens are widely applied in biomedicine and various other fields. For control of the manufacturing process and quality assurance Scanning electron microscopy (SEM) imaging is one standard practice. In this study, statistical datasets of 60 SEM images of three nonwoven samples were evaluated using Gaussian fit to obtain numerical results of their fiber diameter distributions. The question of how much effort is required for acceptable imaging and processing is being discussed. As determined here, for reliable statistics, a minimum surface area of the nonwoven has to be e

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Aeles, Jeroen, Glen A. Lichtwark, Sietske Lenchant, Liesbeth Vanlommel, Tijs Delabastita, and Benedicte Vanwanseele. "Information from dynamic length changes improves reliability of static ultrasound fascicle length measurements." PeerJ 5 (December 15, 2017): e4164. http://dx.doi.org/10.7717/peerj.4164.

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PurposeVarious strategies for improving reliability of fascicle identification on ultrasound images are used in practice, yet these strategies are untested for effectiveness. Studies suggest that the largest part of differences between fascicle lengths on one image are attributed to the error on the initial image. In this study, we compared reliability results between different strategies.MethodsStatic single-image recordings and image sequence recordings during passive ankle rotations of the medial gastrocnemius were collected. Images were tracked by three different raters. We compared result

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Wells, Oliver C. "Optimizing the collector solid angle for the low-loss electron image in the Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 548–49. http://dx.doi.org/10.1017/s042482010012730x.

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The low-loss electron (LLE) image in the scanning electron microscope (SEM) is formed by collecting backscattered electrons (BSE) that have lost less than a specified energy. Compared to the secondary electron (SE) image, these images are less affected by specimen charging and show the surface topography clearly when examining uncoated photoresist. However, LLE images sometimes contain dark shadows caused by the limited solid angle of the LLE detector. Here, we describe a way to position the sample (with a given LLE detector) so as to reduce these shadows as far as possible.The SEM was a Cambr

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Chien, Yung-Ching, Alfonso Mucci, Jeanne Paquette, S. Kelly Sears, and Hojatollah Vali. "Comparative Study of Nanoscale Surface Structures of Calcite Microcrystals Using FE-SEM, AFM, and TEM." Microscopy and Microanalysis 12, no. 4 (2006): 302–10. http://dx.doi.org/10.1017/s1431927606060247.

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The bulk morphology and surface features that developed upon precipitation on micrometer-size calcite powders and millimeter-size cleavage fragments were imaged by three different microscopic techniques: field-emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM) of Pt-C replicas, and atomic force microscopy (AFM). Each technique can resolve some nanoscale surface features, but they offer different ranges of magnification and dimensional resolutions. Because sample preparation and imaging is not constrained by crystal orientation, FE-SEM and TEM of Pt-C replica

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Gross, U., and J. C. Mulder. "Performance and Capabilities of a New, Integrated SEM Image Store." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 436–37. http://dx.doi.org/10.1017/s0424820100180938.

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Loosely-coupled, add-on image stores have been used in electron microscopy for some years. Only recently have they been more closely integrated into the system architecture. With the introduction of the new XL series of scanning electron microscopes Philips goes one step further by making the image store the central image information switchboard with one common user interface for all microscope functions (Fig. 1).Fig. 2 shows the functional structure of the XL image store.Each of the dual-port, dual-speed memory boards (MEM) stores two 8 bit planes of 680 lines (of which 525 are used complying

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Lormand, Charline, Georg F. Zellmer, Károly Németh, et al. "Weka Trainable Segmentation Plugin in ImageJ: A Semi-Automatic Tool Applied to Crystal Size Distributions of Microlites in Volcanic Rocks." Microscopy and Microanalysis 24, no. 6 (2018): 667–75. http://dx.doi.org/10.1017/s1431927618015428.

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AbstractCrystals within volcanic rocks record geochemical and textural signatures during magmatic evolution before eruption. Clues to this magmatic history can be examined using crystal size distribution (CSD) studies. The analysis of CSDs is a standard petrological tool, but laborious due to manual hand-drawing of crystal margins. The trainable Weka segmentation (TWS) plugin in ImageJ is a promising alternative. It uses machine learning and image segmentation to classify an image. We recorded back-scattered electron (BSE) images of three volcanic samples with different crystallinity (35, 50 a

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Scott, George. "Digital imagery for making plates." Journal of Micropalaeontology 14, no. 2 (1995): 118. http://dx.doi.org/10.1144/jm.14.2.118.

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Abstract. Although the resolution and depth of focus provided by scanning electron microscopy (SEM) revolutionized the examination of several groups of microfossils, conventional photographic techniques are normally outlined in instructions for preparation of micrographs for publication (Whittaker &amp; Hodgkinson, 1991). While the quality of results attainable by following these methods is very high, digital image recording and processing techniques are now well developed and readily available. This note outlines some advantages of digital techniques in the preparation of SEM images for p

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