Log in

Relevant bibliographies by topics / (Sem) Scanning / Journal articles

To see the other types of publications on this topic, follow the link: (Sem) Scanning.

Journal articles on the topic '(Sem) Scanning'

Author: Grafiati

Published: 3 June 2025

Last updated: 31 July 2025

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic '(Sem) Scanning.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Ichinokawa, Takeo. "Scanning Low-Energy Electron Diffraction Microscopy Combined with Scanning Tunnling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 302–3. http://dx.doi.org/10.1017/s0424820100180264.

Full text

Abstract:

A ultra-high vacuum scanning electron microscope (UHV-SEM) with a field emission gun (FEG) has been operated in an energy range of from 100 eV to 3 keV. A new technique of scanning low energy electron diffraction (LEED) microscopy has been added to the other techniques: scanning Auger microscopy (SAM), secondary electron microscopy, electron energy loss microscopy and the others available for the UHV-SEM. In addition to scanning LEED microscopy, a scanning tunneling microscope (STM) has been installed in the UHV-SEM-.The combination of STM with SEM covers a wide magnification range from 105 to

APA, Harvard, Vancouver, ISO, and other styles

2

Sweet, Walter C. "Scanning electron microscopy and photomicrography." Paleontological Society Special Publications 4 (1989): 351–55. http://dx.doi.org/10.1017/s2475262200005347.

Full text

Abstract:

In the last two decades, scanning electron miocroscopy has come to be the technique of choice in studies of microfossil structure and morphology. Scanning electron microscope (SEM) photomicrographs are easy to produce, have great depth of field, and resolve minute details over a wide range of magnifications. Hence photomicrographs of images produced in a SEM are now more widely used than ordinary photographs in the illustration of microfossils. Techniques for preparation, mounting and manipulation of specimens in the SEM vary with the instrument available, aims of the study, and skill of the o

APA, Harvard, Vancouver, ISO, and other styles

3

Collins, George J. "A Scanning Probe Microscope in My Scanning Electron Microscope?" Microscopy Today 3, no. 2 (1995): 22–23. http://dx.doi.org/10.1017/s1551929500063112.

Full text

Abstract:

Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other. The SEM can do things that are hard to do with an SPM, and vice versa.Not long after the introduction of the STM and the AFM, a few re- searchers built custom SPMs and installed them in their SEMs. The reports of these projects to build hybrid microscopes and examples of the

APA, Harvard, Vancouver, ISO, and other styles

4

Balk, Ludwig Josef. "Thermal- and acoustic-wave techniques in scanning electron microscopy." Canadian Journal of Physics 64, no. 9 (1986): 1238–46. http://dx.doi.org/10.1139/p86-216.

Full text

Abstract:

Since their introduction in 1980, thermal- and acoustic-wave techniques utilizing electron-beam excitation, denoted in the following as scanning electron acoustic microscopy (SEAM), have developed to include methods in the realm of scanning electron microscopy (SEM), giving additional and important information on material parameters compared with other SEM techniques. However, the SEAM method still has shortcomings, both theoretically and experimentally. New theories have to consider various principal sound-generation mechanisms, especially for semiconductors, ceramics, and ferromagnets. Furth

APA, Harvard, Vancouver, ISO, and other styles

5

Müllerová, Ilona, Kenji Matsuda, Petr Hrnčiřík, and Luděk Frank. "Enhancement of SEM to scanning LEEM." Surface Science 601, no. 20 (2007): 4768–73. http://dx.doi.org/10.1016/j.susc.2007.05.042.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

LI, Y. L., Z. R. HUANG, Q. D. ZHONG, C. CHEN, and Y. X. XU. "SECM APPLIED FOR RESEARCHING THE MICROSCOPIC MORPHOLOGY AND CORROSION BEHAVIOR OF ENAMEL COATING ON MILD STEEL IN AQUEOUS CHLORIDE SOLUTIONS." Surface Review and Letters 25, no. 05 (2018): 1850094. http://dx.doi.org/10.1142/s0218625x18500944.

Full text

Abstract:

The microstructures, morphology features and the corrosion resistance of the different particle diameters of enamel coating were investigated in this paper. All enamel coating samples were immersed in 5[Formula: see text]wt.% NaCl solution. The effects of the diameter of micron-dimension enamel particles on the mild steel were discussed and the corrosion resistance of the different coatings were characterized by potentiodynamic polarization curves, scanning electron microscopy (SEM) and scanning electrochemical microscopy (SECM), the SECM was employed to identify the local reactivity and then

APA, Harvard, Vancouver, ISO, and other styles

7

Holm, Jason. "A Brief Overview of Scanning Transmission Electron Microscopy in a Scanning Electron Microscope." EDFA Technical Articles 23, no. 4 (2021): 18–26. http://dx.doi.org/10.31399/asm.edfa.2021-4.p018.

Full text

Abstract:

Abstract This article provides a brief overview of STEM-in-SEM, discussing the pros and cons, recent advancements in detector technology, and the emergence of 4D STEM-in-SEM, a relatively new method that uses diffraction patterns recorded at different raster positions to enhance images offline in selected regions of interest.

APA, Harvard, Vancouver, ISO, and other styles

8

Wyler, A., and G. Golan. "Scanning acoustic microscopy investigation of melted collagen in thermoplastic leather." Journal of Materials Research 14, no. 6 (1999): 2446–48. http://dx.doi.org/10.1557/jmr.1999.0328.

Full text

Abstract:

A scanning acoustic microscope (SAM) has been used to investigate the structure of thermoplastic leather. This material is formed by pressing fibers of leather under high pressure and moderate temperature. The result is a matrix from transformed, melted fibers in which leftover fibers act as reinforcement. Unlike the scanning electron microscope (SEM), the SAM is able to distinguish between completely and incompletely transformed fibers and also to penetrate the material beneath the surface. The results show that the matrix is built as a domain structure. The advantages of the SAM over the SEM

APA, Harvard, Vancouver, ISO, and other styles

9

Sawyer, Linda C. "SEM of polymer materials." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 426–29. http://dx.doi.org/10.1017/s0424820100126913.

Full text

Abstract:

Scanning electron microscopy (SEM) has become an analytical tool widely used in universities, industrial laboratories and modern plants in applications ranging from fundamental research and applied research to quality control. The SEM provides important and insightful observations, in the form of three dimensional images of bulk materials and surfaces, which provide input to conduct process-structure-properties studies of polymer materials. SEM analysis requires knowledge of the instruments, image formation and specimen preparation methods.Consideration must be given to the interaction of the

APA, Harvard, Vancouver, ISO, and other styles

10

Wang, Zhi Gang, Lei Shi, Yong Xu, and Qi Lei Sun. "Scanning Electron Microscope in Metallurgical Experiment." Applied Mechanics and Materials 556-562 (May 2014): 275–77. http://dx.doi.org/10.4028/www.scientific.net/amm.556-562.275.

Full text

Abstract:

The precipitated carbides amount change after quenching and tempering the steel can be clearly observed by scanning electron microscope (SEM). The hidden needle martensite in high speed steels can be also clearly showed. Compared with the optical differential microscopy, the result of SEM shows significant differentiation. The application of SEM in metallurgical experimental teaching is feasible and necessary, with excellent experimental teaching effect.

APA, Harvard, Vancouver, ISO, and other styles

11

Darley, Jim. "SEM History." Microscopy Today 5, no. 6 (1997): 25. http://dx.doi.org/10.1017/s1551929500056108.

Full text

Abstract:

Manfred von Ardenne was an EM pioneer and the first to publish a complete concept of a scanning electron microscope. A German overseas newscast reported the death of Manfred von Ardenne on 28 May. During the 1930s he was involved in cathode ray work and later lived In East Germany and did significant cancer research. Not mentioned in the newscast was his conceptual development of the SEM in the late 1930s.He outlined the underlying principles of SEM operation: an electron probe scanning a small region of [fie specimen, the emitled electrons are captured, amplified and time-sequentially display

APA, Harvard, Vancouver, ISO, and other styles

12

Zhang, Xiao Feng. "A 200-kV STEM/SEM Produces 1 Å SEM Resolution." Microscopy Today 19, no. 5 (2011): 26–29. http://dx.doi.org/10.1017/s1551929511000873.

Full text

Abstract:

“Second best no more” was the title of an article written by David C. Joy for Nature Materials. The article was for highlighting a breakthrough made by a team formed between Brookhaven National Laboratory (BNL, USA) and Hitachi High Technologies Corporation (HHT, Japan). Sub-angstrom secondary electron (SE) images were obtained on a Hitachi HD-2700, which is a combined scanning electron microscope (SEM) and scanning transmission electron microscope (STEM) operating at a maximum accelerating voltage of 200 kV. For the first time, single atoms and atomic lattices on crystal surfaces are unambigu

APA, Harvard, Vancouver, ISO, and other styles

13

Lomic, Gizela, Erne Kis, Goran Boskovic, and Radmila Marinkovic-Neducin. "Application of scanning electron microscopy in catalysis." Acta Periodica Technologica, no. 35 (2004): 67–77. http://dx.doi.org/10.2298/apt0435067l.

Full text

Abstract:

A short survey of various information obtained by scanning electron microscopy (SEM) in the investigation of heterogeneous catalysts and nano-structured materials have been presented. The capabilities of SEM analysis and its application in testing catalysts in different fields of heterogeneous catalysis are illustrated. The results encompass the proper way of catalyst preparation, the mechanism of catalyst active sites formation catalysts changes and catalyst degradation during their application in different chemical processes. Presented SEM pictures have been taken on a SEM JOEL ISM 35 over 2

APA, Harvard, Vancouver, ISO, and other styles

14

Sun, Cheng, Erich Müller, Matthias Meffert, and Dagmar Gerthsen. "On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope." Microscopy and Microanalysis 24, no. 2 (2018): 99–106. http://dx.doi.org/10.1017/s1431927618000181.

Full text

Abstract:

AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission ele

APA, Harvard, Vancouver, ISO, and other styles

15

Moldovan, Grigore. "A Robust 3D Scanning Technique for SEM." Microscopy and Microanalysis 23, S1 (2017): 356–57. http://dx.doi.org/10.1017/s143192761700246x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Bomblies, K., V. Shukla, and C. Graham. "Scanning Electron Microscopy (SEM) of Plant Tissues." Cold Spring Harbor Protocols 2008, no. 5 (2008): pdb.prot4933. http://dx.doi.org/10.1101/pdb.prot4933.

Full text

APA, Harvard, Vancouver, ISO, and other styles

17

McMullan, D. "Scanning electron microscopy 1928-1965." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 762–63. http://dx.doi.org/10.1017/s0424820100149647.

Full text

Abstract:

The beginning of the general use of the scanning electron microscope (SEM) can be accurately dated to 1965 when the Cambridge Instrument Company in the U.K. marketed their Stereoscan 1 SEM (to be followed about 6 months later by JEOL in Japan). But development had been in progress intermittently over the previous 30 years in Germany, the U.S.A., France, and the U.K. where in 1948 work was begun in Charles Oatley’s department at the Cambridge University Engineering Department which led directly to the Stereoscan. The purpose of this paper is to trace the development of the SEM and to show that

APA, Harvard, Vancouver, ISO, and other styles

18

Kar, P. K., and Gurmeet Singh. "Evaluation of Nitrilotrimethylene Phosphonic Acid and Nitrilotriacetic Acid as Corrosion Inhibitors of Mild Steel in Sea Water." ISRN Materials Science 2011 (September 11, 2011): 1–6. http://dx.doi.org/10.5402/2011/167487.

Full text

Abstract:

The inhibition efficiency of nitrilotrimethylene phosphonic acid (NTP) in controlling mild steel corrosion in sea water has been evaluated by galvanostatic polarization, electron scanning for chemical analysis (ESCA), and scanning electron microscope (SEM) methods. The results are compared with those obtained for nitrilotriacetic acid (NTA). NTP is found to be more effective in protecting mild steel against sea water corrosion as compared to NTA. The surface of mild steel in presence and absence of NTP and NTA is characterized by ESCA and SEM. From the ESCA studies, it is found that NTP formed

APA, Harvard, Vancouver, ISO, and other styles

19

Yamada, Atsushi, Toshiharu Kobayashi, Tsutomu Negishi, et al. "Remote Control Scanning Electron Microscope with Web Operatoin Interface." Microscopy and Microanalysis 7, S2 (2001): 974–75. http://dx.doi.org/10.1017/s1431927600030944.

Full text

Abstract:

Recently, SEM (Scanning Electron Microscope) and the other observation devices are coming to use a LAN (Local Area Network) to save the image in the database. We developed a remote control system in which SEM image and Control interface is indicated on the WEB Browser. in this system, SEM can be controlled by an external (client) PC installed in a general WEB Browser(Internet Explorer). Accordingly, operation interface can be indicated on the WEB browser.A JSM-6700F is connected to a LAN, and so the microscope can be controlled by a client PC. Figure. 1 shows the block diagram of SEM remote co

APA, Harvard, Vancouver, ISO, and other styles

20

Kohashi, Teruo. "Magnetization Analysis by Spin-Polarized Scanning Electron Microscopy." Scanning 2018 (2018): 1–6. http://dx.doi.org/10.1155/2018/2420747.

Full text

Abstract:

Spin-polarized scanning electron microscopy (spin SEM) is a method for observing magnetic-domain structures by detecting the spin polarization of secondary electrons. It has several unique abilities such as detection of full magnetization orientation and high-spatial-resolution measurement. Several spin-SEM experiments have demonstrated that it is a promising method for studying various types of magnetic materials and devices. This review paper presents several spin-SEM observations to demonstrate the capability and potential of spin SEM.

APA, Harvard, Vancouver, ISO, and other styles

21

Tanaka, Keiichi. "High-resolution scanning electron microscopy in biology." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 14–15. http://dx.doi.org/10.1017/s0424820100157607.

Full text

Abstract:

With the development of scanning electron microscope (SEM) with ultrahigh resolution, SEM became to play an important role in not only cytology but also molecular biology. However, the preparation methods observing tiny specimens with such high resolution SEM are not yet established.Although SEM specimens are usually coated with metals for getting electrical conductivity, it is desirable to avoid the metal coating for high resolution SEM, because the coating seriously affects resolution at this level, unless special coating techniques are used. For avoiding charging effect without metal coatin

APA, Harvard, Vancouver, ISO, and other styles

22

Chumbley, L. S., M. Meyer, K. Fredrickson, and F. Laabs. "Multi-User Scanning Electron Microscope." Microscopy Today 3, no. 2 (1995): 12–15. http://dx.doi.org/10.1017/s1551929500063070.

Full text

Abstract:

Teaching a large number of students simultaneously to use a scanning electron microscope (SEM) has traditionally been difficult. A typical classroom scenario would be of one student seated in front of the SEM next to the instructor while the remaining students stand idly behind the operating student. The truth of the oft repeated sentiment expressed by microscopists, "There is nothing more boring than watching someone else do microscopy", would be proven time and time again in such training sessions as the uninvolved students would quickly lose interest and either fall asleep or talk among the

APA, Harvard, Vancouver, ISO, and other styles

23

Shukla, Shruti. "Studying antimicrobial-induced morphostructural damage of bacteria by Scanning Electron Microscope." Bangladesh Journal of Pharmacology 10, no. 4 (2015): 870. http://dx.doi.org/10.3329/bjp.v10i4.25427.

Full text

Abstract:

<p>In this investigation, a scanning electron microscopy (SEM) method was used to examine the morphostructural changes in bacterial cells induced by antimicrobial agents. SEM-based visual approach is referred the study of bacterial cells and their physiological consequences when affected by antibiotics or antibacterial agents permitting the observation of characteristic morphological defects of cell wall, and provides valuable insights into processes involved in bacterial cell death. This experiment visualized various step-by-step techniques used in the slide preparation of bacterial cel

APA, Harvard, Vancouver, ISO, and other styles

24

González-Díaz, R., D. Fernández-Sánchez, P. Rosendo-Francisco, and G. Sánchez-Legorreta. "Effect of temperature during the synthesis process of CdSe nanoparticles using the colloidal technique." MRS Advances 5, no. 63 (2020): 3389–95. http://dx.doi.org/10.1557/adv.2020.441.

Full text

Abstract:

AbstractIn this work, the first results of the effects of temperature during the production of Se2- ions and the effect during the interaction of Cd2+ and Se2- ions in the synthesis process of CdSe nanoparticles are presented. The synthesis of CdSe was carried out by the colloidal technique, in the first one we used a temperature of 63 °C to produce Se2- ions and in the second one an interaction temperature of 49 °C. The samples were characterized using a Scanning Electron Microscope (SEM) and a Scanning Tunneling Microscope (STM). From the SEM micrographs it was possible to identify the thorn

APA, Harvard, Vancouver, ISO, and other styles

25

Koike, Kazuyuki, and Hideo Matsuyama. "Spin-polarized Scanning Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 768–69. http://dx.doi.org/10.1017/s0424820100176976.

Full text

Abstract:

Spin-polarized scanning electron microscopy (spin SEM), where the secondary electron spin polarization is used as the image signal, is a novel technique for magnetic domain observation. Since its first development by Koike and Hayakawa in 1984, several laboratories have extensively studied this technique and have greatly improved its capability for data extraction and its range of applications. This paper reviews the progress over the last few years.Almost all the high expectations initially held for spin SEM have been realized. A spatial resolution of several hundreds angstroms has been attai

APA, Harvard, Vancouver, ISO, and other styles

26

Williams, Joseph P. "Scanning Electron Microscope EDucatorS." Microscopy Today 1, no. 2 (1993): 5. http://dx.doi.org/10.1017/s1551929500069339.

Full text

Abstract:

Can you imagine the motivational value of a young adult being exposed to images of common day objects that they have an interest in, magnified ten, one hundred, or one thousand times? Then imagine the student learning the theory and operation of a scanning electron microscope. Finally, imagine walking into a laboratory to see these same students operating an SEM and taking their own micrographs.For the past three years I have had the pleasure of teaching the laboratory portion of the SEMEDS program. The program's goal is not just to motivate high school students in science, but to expose them

APA, Harvard, Vancouver, ISO, and other styles

27

Liu, Ke Gao, and Xi Qiang Sun. "Two Design Projects of Multifunctional Scanning Electron Microscope Sample Stages." Key Engineering Materials 480-481 (June 2011): 406–9. http://dx.doi.org/10.4028/www.scientific.net/kem.480-481.406.

Full text

Abstract:

At present, the use of scanning electron microscope (SEM) is becoming more and more extensive in the field of materials examination. But it may be restricted since most of the SEM sample stages just have single function and the existing multifunctional SEM sample stages are poor practicability. In this schematic design, two multifunctional SEM sample stages are designed by means of reforming the construction of SEM sample stage. Specifically, the aims of conducting structural dynamic observation in the process of stretching or compressing samples and detecting flexible long samples are achieve

APA, Harvard, Vancouver, ISO, and other styles

28

Müller, M., and R. Hermann. "High-Resolution Scanning Electron Microscopy of Biological Specimens." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 186–87. http://dx.doi.org/10.1017/s0424820100103012.

Full text

Abstract:

Three major factors must be concomitantly assessed in order to extract relevant structural information from the surface of biological material at high resolution (2-3nm).Procedures based on chemical fixation and dehydration in graded solvent series seem inappropriate when aiming for TEM-like resolution. Cells inevitably shrink up to 30-70% of their initial volume during gehydration; important surface components e.g. glycoproteins may be lost. These problems may be circumvented by preparation techniques based on cryofixation. Freezedrying and freeze-substitution followed by critical point dryin

APA, Harvard, Vancouver, ISO, and other styles

29

Bentley, J., N. D. Evans, and E. A. Kenik. "Measurement of Scanning Electron Microscope resolution." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1044–45. http://dx.doi.org/10.1017/s0424820100172954.

Full text

Abstract:

The resolution performance of a scanning electron microscope (SEM) is a primary specification of the instrument. For a high-resolution SEM (HRSEM) equipped with a field emission gun (FEG), image resolutions of less than 2 nm are commonly claimed. Generally, both manufacturers and customers identify image resolution as the single most important performance criterion. It is traditionally determined with specimens such as gold islands on bulk carbon supports, where the minimum apparent separation of two islands is claimed as the resolution. This procedure is highly subjective since the spacings a

APA, Harvard, Vancouver, ISO, and other styles

30

Pach, Elzbieta, and Albert Verdaguer. "Studying Ice with Environmental Scanning Electron Microscopy." Molecules 27, no. 1 (2021): 258. http://dx.doi.org/10.3390/molecules27010258.

Full text

Abstract:

Scanning electron microscopy (SEM) is a powerful imaging technique able to obtain astonishing images of the micro- and the nano-world. Unfortunately, the technique has been limited to vacuum conditions for many years. In the last decades, the ability to introduce water vapor into the SEM chamber and still collect the electrons by the detector, combined with the temperature control of the sample, has enabled the study of ice at nanoscale. Astounding images of hexagonal ice crystals suddenly became real. Since these first images were produced, several studies have been focusing their interest on

APA, Harvard, Vancouver, ISO, and other styles

31

Joy, David C. "The Resolution of the SEM." Microscopy and Microanalysis 3, S2 (1997): 1173–74. http://dx.doi.org/10.1017/s1431927600012757.

Full text

Abstract:

The resolution of any microscope is usually taken as the benchmark of its quality. When thinking about the scanning electron microscope(SEM) a comparison of its resolution to the resolutions quot-ed for other comparable instruments such as the transmission EM or the scanning tunneling micro-scope has unfortunately led some users to the view that the SEM is only a second best choice. In fact the spatial resolution that can be anticipated for an optimized SEM is highly competitive with its peers making it clearly the microscopy of choice.The resolution of the SEM depends on two classes of factor

APA, Harvard, Vancouver, ISO, and other styles

32

Postek, M. T., and A. E. Vladar. "SEM image sharpness analysis." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 142–43. http://dx.doi.org/10.1017/s0424820100163174.

Full text

Abstract:

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in thi

APA, Harvard, Vancouver, ISO, and other styles

33

Imashuku, Susumu, Kazuaki Wagatsuma, and Jun Kawai. "Scanning Electron Microscope-Cathodoluminescence Analysis of Rare-Earth Elements in Magnets." Microscopy and Microanalysis 22, no. 1 (2016): 82–86. http://dx.doi.org/10.1017/s1431927615015676.

Full text

Abstract:

AbstractScanning electron microscope-cathodoluminescence (SEM-CL) analysis was performed for neodymium–iron–boron (NdFeB) and samarium–cobalt (Sm–Co) magnets to analyze the rare-earth elements present in the magnets. We examined the advantages of SEM-CL analysis over conventional analytical methods such as SEM-energy-dispersive X-ray (EDX) spectroscopy and SEM-wavelength-dispersive X-ray (WDX) spectroscopy for elemental analysis of rare-earth elements in NdFeB magnets. Luminescence spectra of chloride compounds of elements in the magnets were measured by the SEM-CL method. Chloride compounds w

APA, Harvard, Vancouver, ISO, and other styles

34

Gómez, J., L. Vázquez, A. M. Baró, et al. "Scanning tunneling microscopy (STM) and scanning electron microscopy (SEM) of electrodispersed gold electrodes." Journal of Electroanalytical Chemistry and Interfacial Electrochemistry 240, no. 1-2 (1988): 77–87. http://dx.doi.org/10.1016/0022-0728(88)80314-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

35

Kenzaka, Takehiko, Ai Ishidoshiro, Nobuyasu Yamaguchi, Katsuji Tani, and Masao Nasu. "rRNA Sequence-Based Scanning Electron Microscopic Detection of Bacteria." Applied and Environmental Microbiology 71, no. 9 (2005): 5523–31. http://dx.doi.org/10.1128/aem.71.9.5523-5531.2005.

Full text

Abstract:

ABSTRACT A new scanning electron microscopic method was developed for gaining both phylogenetic and morphological information about target microbes using in situ hybridization with rRNA-targeted oligonucleotide probes (SEM-ISH). Target cells were hybridized with oligonucleotide probes after gold labeling. Gold enhancement was used for amplification of probe signals from hybridized cells. The hybridized cells released a strong backscatter electron signal due to accumulation of gold atoms inside cells. SEM-ISH was applied to analyze bacterial community composition in freshwater samples, and bact

APA, Harvard, Vancouver, ISO, and other styles

36

Wolff, E. W., and A. P. Reid. "Capture and scanning electron microscopy of individual snow crystals." Journal of Glaciology 40, no. 134 (1994): 195–97. http://dx.doi.org/10.1017/s0022143000003981.

Full text

Abstract:

AbstractA snow crystal has been successfully collected on to a scanning electron microscope (SEM) stub in central Greenland. It was preserved at liquid-nitrogen temperature for 5 months, prior to examination in the SEM. This is believed to be the first time a snow crystal has been observed directly in the SEM and offers some new experimental methods for understanding crystals and their chemistry.

APA, Harvard, Vancouver, ISO, and other styles

37

Wolff, E. W., and A. P. Reid. "Capture and scanning electron microscopy of individual snow crystals." Journal of Glaciology 40, no. 134 (1994): 195–97. http://dx.doi.org/10.3189/s0022143000003981.

Full text

Abstract:

AbstractA snow crystal has been successfully collected on to a scanning electron microscope (SEM) stub in central Greenland. It was preserved at liquid-nitrogen temperature for 5 months, prior to examination in the SEM. This is believed to be the first time a snow crystal has been observed directly in the SEM and offers some new experimental methods for understanding crystals and their chemistry.

APA, Harvard, Vancouver, ISO, and other styles

38

Krause, S. J., W. W. Adams, S. Kumar, T. Reilly, and T. Suziki. "Low-voltage, high-resolution scanning electron microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 466–67. http://dx.doi.org/10.1017/s0424820100127037.

Full text

Abstract:

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have

APA, Harvard, Vancouver, ISO, and other styles

39

Joy, David C. "SEM for the 21st Century—Scanning Ion Microscopy." EDFA Technical Articles 14, no. 1 (2012): 4–12. http://dx.doi.org/10.31399/asm.edfa.2012-1.p004.

Full text

Abstract:

Abstract This article provides an introduction to scanning ion microscopy, explaining how it overcomes one of the biggest limitations of SEMs, namely the tradeoff between spatial resolution and depth of field, while also providing significantly more surface detail, a wide range of novel and familiar contrast mechanisms, and the potential for new microanalytical techniques that combine nanometer spatial resolution and single monolayer sensitivity. In addition to describing the capabilities of scanning ion microscopes, the article also addresses the issue of sample charging and the potential for

APA, Harvard, Vancouver, ISO, and other styles

40

Joy, David C. "SEM for the 21st Century: Scanning Ion Microscopy." Metallography, Microstructure, and Analysis 1, no. 2 (2012): 115–21. http://dx.doi.org/10.1007/s13632-012-0013-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

41

Maher, E. F. "The “SOMSEM”-An SEM-based scanning optical microscope." Scanning 7, no. 2 (1985): 61–65. http://dx.doi.org/10.1002/sca.4950070201.

Full text

APA, Harvard, Vancouver, ISO, and other styles

42

Pignolet-Brandom, S., and K. J. Reid. "Quantitative evaluation of materials by scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 674–75. http://dx.doi.org/10.1017/s0424820100105436.

Full text

Abstract:

QEM*SEM, or quantitative evaluation of materials by scanning electron microscopy, is a fully automated scanning electron microscope system that was designed and engineered by CSIRO in Australia for applications to the minerals industry. It is an integrated system in which the computer and its associated hardware and software control SEM operations. Minerals can be identified in point, linear or area scans. Depending on the type of scan, information is extracted from the data files and summarized in tables and graphs covering mineral abudances, associations, sizes, free surface area and the deg

APA, Harvard, Vancouver, ISO, and other styles

43

Vanderlinde, William. "Breaking the Resolution Barrier in the Scanning Electron Microscope." EDFA Technical Articles 6, no. 4 (2004): 32–40. http://dx.doi.org/10.31399/asm.edfa.2004-4.p032.

Full text

Abstract:

Abstract This article describes two innovative methods that can significantly improve the resolution of SEM imaging: scanning transmission electron microscopy in a scanning electron microscope (STEM-in-SEM) and forward-scattered electron imaging (FSEI). Both methods can be implemented in any SEM using special sample holders. No other modifications are required. Test results presented in the article show that 1 to 2 nm resolution is possible in thin sections, uncoated polysilicon gates, and photoresist.

APA, Harvard, Vancouver, ISO, and other styles

44

Shakya, Subarna. "Automated Nanopackaging using Cellulose Fibers Composition with Feasibility in SEM Environment." June 2021 3, no. 2 (2021): 114–25. http://dx.doi.org/10.36548/jei.2021.2.004.

Full text

Abstract:

By contributing to the system enhancement, the integration of Nano systems for nanosensors with biomaterials proves to be a unique element in the development of novel innovative systems. The techniques by which manipulation, handling, and preparation of the device are accomplished with respect to industrial use are a critical component that must be considered before the system is developed. The approach must be able to be used in a scanning electron microscope (SEM), resistant to environmental changes, and designed to be automated. Based on this deduction, the main objective of this research w

APA, Harvard, Vancouver, ISO, and other styles

45

Boyes, E. D. "Low Voltage Scanning Electron Microscopy (LVSEM) in Perspective." Microscopy and Microanalysis 5, S2 (1999): 674–75. http://dx.doi.org/10.1017/s143192760001669x.

Full text

Abstract:

In the past quarter century low voltage SEM (LVSEM) has been developed for use in a wide range of applications, and it has become the main area of innovation in SEM, and now perhaps more widely in electron microscopy. The intellectual challenge (1,2) has been transformed into a vital tool of modern technology in the semiconductor, polymer and chemical industries, and is widely used in the materials and biological sciences (3, 4). It has been claimed by this author and others that LVSEM is the rational and preferred state of SEM, but unfortunately at the time of the first SEMs only higher volta

APA, Harvard, Vancouver, ISO, and other styles

46

Postek, Michael T., Andras E. Vladar, Samuel N. Jones, and William J. Keery. "Scanning Electron Microscope magnification calibration interlaboratory study." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 776–77. http://dx.doi.org/10.1017/s0424820100149714.

Full text

Abstract:

The National Institute of Standards and Technology (NIST) is in the process of developing a new scanning electron microscope (SEM) magnification calibration reference standard useful at both high and low accelerating voltages. This standard will be useful for all applications to which the SEM is currently being used, but it has been specifically tailored to meet many of the particular needs of the semiconductor industry. A small number of test samples with the pattern were prepared on silicon substrates using electron beam lithography at the National Nanofabrication Facility at Cornell Univers

APA, Harvard, Vancouver, ISO, and other styles

47

Peters, Klaus-Ruediger. "Detector strategies for environmental scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1296–97. http://dx.doi.org/10.1017/s0424820100131115.

Full text

Abstract:

Environmental SEM operate at specimen chamber pressures of ∼20 torr (2.7 kPa) allowing stabilization of liquid water at room temperature, working on rugged insulators, and generation of an environmental secondary electron (ESE) signal. All signals available in conventional high vacuum instruments are also utilized in the environmental SEM, including BSE, SE, absorbed current, CL, and X-ray. In addition, the ESEM allows utilization of the flux of charge carriers as information, providing exciting new signal modes not available to BSE imaging or to conventional high vacuum SEM.In the ESEM, at lo

APA, Harvard, Vancouver, ISO, and other styles

48

Wang, Qinghua, Satoshi Kishimoto, and Hiroshi Tsuda. "Formation of Three-Way Scanning Electron Microscope Moiré on Micro/Nanostructures." Scientific World Journal 2014 (2014): 1–8. http://dx.doi.org/10.1155/2014/281954.

Full text

Abstract:

Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM. The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the periodic cells are arranged in a triangular manner. The deformation and the structure information of the specimen grating in three directions can be simultaneously obtained from the three-way SEM moiré. The design considerations of the three-way EB were discussed. As an illustration, the three-way SEM moiré spots produced on a silicon slide were

APA, Harvard, Vancouver, ISO, and other styles

49

van Samkar, Ganapathy, Payal P. S. Balraadjsing, Henning Hermanns, et al. "Microbiological and scanning electron microscopic evaluation of epidural catheters." Regional Anesthesia & Pain Medicine 45, no. 5 (2020): 381–85. http://dx.doi.org/10.1136/rapm-2019-101180.

Full text

Abstract:

BackgroundEpidural catheters are frequently colonized by gram-positive bacteria. Although the incidence of associated epidural infections is low, their consequences can be devastating. We investigated bacterial growth on epidural catheters by quantitative bacterial culture and scanning electron microscopy (SEM) in order to explore the patterns of epidural catheter colonization.Methods28 patients undergoing major abdominal surgery with thoracic epidurals (treatment ≥72 hours) were studied. Before the removal of the catheter, the skin surrounding the insertion site was swabbed. The entire cathet

APA, Harvard, Vancouver, ISO, and other styles

50

Syafari, S. "OPTIMIZATION OF THE USE OF SCANNING ELECTRON MICROSCOPY (SEM) EQUIPMENT IN THE CHEMICAL ENGINEERING DEPARTMENT OF LHOKSEUMAWE STATE POLYTECHNIC." Jurnal Sains dan Teknologi Reaksi 22, no. 01 (2024): 29. https://doi.org/10.30811/jstr.v22i01.5736.

Full text

Abstract:

The purpose of this training is to optimize the use of chemical engineering laboratory equipment, namely Scanning Electro Microscopy (SEM), to improve the understanding and experience of students of the Lhokseumawe State Polytechnic, Department of Chemical Engineering. The methods used in this community service activity are intensive training, preparation of efficient usage protocols, and integration of SEM analysis results in research and teaching projects. At the end of this training activity, a question and answer session and assistance in the use of the tool were held to strengthen student

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!