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1

Reliability of electronic packages and semiconductor devices. McGraw-Hill, 1997.

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2

IEEE/UCS/SEMI, International Symposium on Semiconductor Manufacturing (4th 1995 Austin Tex ). Fourth IEEE/UCS/SEMI International Symposium on Semiconductor Manufacturing: [proceedings]. Institute of Electrical and Electronics Engineers, 1995.

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3

Randa, J. Noise temperature measurements on wafer. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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4

N, Buckley D., Ringel S. A, Ren F, Electrochemical Society Electronics Division, and State-of-the-Art Program on Compound Semiconductors (20th : 1994 : San Francisco, Calif.), eds. Proceedings of the Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices and the Twentieth State-of-the Art Program on Compound Semiconductors (SOTAPOCS XX). The Electrochemical Society, 1995.

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5

Yong, Liu, and Shichun Qu. Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications. Springer, 2014.

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6

Yong, Liu, and Shichun Qu. Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications. Springer, 2016.

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7

J, Kowalski G., American Society of Mechanical Engineers. Electrical and Electronic Packaging Division., International Mechanical Engineering Congress and Exposition (2000 : Orlando, Fla.), and Symposium on Mechanics of SMT and Photonic Structures (12th : 2000 : Orlando, Fla.), eds. Packaging of electronic and photonic devices: Presented at the 2000 ASME International Mechanical Engineering Congress and Exposition, November 5-10, 2000, Orlando, Florida. American Society of Mechanical Engineers, 2000.

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8

Microelectronics Packaging Handbook, Part II: Semiconductor Packaging (Microelectronics Packaging Handbook). Springer, 1997.

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9

Zhao, Wei, Hui Liu, Xingsheng Liu, and Lingling Xiong. Packaging of High Power Semiconductor Lasers. Springer, 2014.

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10

Zhao, Wei, Hui Liu, Xingsheng Liu, and Lingling Xiong. Packaging of High Power Semiconductor Lasers. Springer, 2016.

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11

A, Neugebauer C., ed. The Packaging of power semiconductor devices. Gordon and Breach Science Publishers, 1986.

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12

Microelectronics Packaging Handbook, 3-part set: Part I: Technology Drivers Part II: Semiconductor Packaging Part III: Subsystem Packaging. 2nd ed. Springer, 1997.

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13

James, Moyne, Del Castillo Enrique, and Hurwitz Arnon Max, eds. Run-to-run control in semiconductor manufacturing. CRC Press, 2001.

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14

(Editor), James Moyne, Enrique Del Castillo (Editor), and Arnon M. Hurwitz (Editor), eds. Run-to-Run Control in Semiconductor Manufacturing. CRC, 2000.

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15

Proceedings of the symposia on interconnects, contact metallization, and multilevel metallization and reliability for semiconductor devices, interconnects, and thin insulator materials. Electrochemical Society, 1993.

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16

Fourth IEEE/UCS/SEMI International Symposium on Semiconductor Manufacturing: [proceedings]. Additional copies may be purchased from IEEE Service Center, 1995.

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17

Buckley, D. N., S. A. Ringel, J. P. Vilcot, C. Kusano, and G. J. Valco. Large Area Wafer Growth & Processing for Electronic & Photonic Devices State of the Art Program on Compound Semiconductors XX (Process Engineering Handbook Series). Electrochemical Society, 1995.

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18

H, Temkin, and Society of Photo-optical Instrumentation Engineers., eds. Processing and packaging of semiconductor lasers and optoelectronic devices: 20-21 January 1993, Los Angeles, California. SPIE, 1993.

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19

Kwok-Kit, Wong Alfred, Singh Vivek K, Society of Photo-optical Instrumentation Engineers., and International SEMATECH, eds. Design for manufacturability through design-process integration: 28 February-2 March 2007, San Jose, California, USA. SPIE, 2007.

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