Books on the topic 'Silica (SiO2)'
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Consult the top 31 books for your research on the topic 'Silica (SiO2).'
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Devine, Roderick A. B. The Physics and Technology of Amorphous SiO2. Springer US, 1988.
Find full textInternational, Symposium on SiO2 Advanced Dielectrics and Related Devices (10th 2014 Cagliari Italy). Fundamentals and Applications in Silica and Advanced Dielectrics (SiO2014): X International Symposium on SiO2, Advanced Dielectrics and Related Devices, Cagliari, Italy, 16-18 June 2014. AIP Publishing, 2014.
Find full textAngeles, CA) International Symposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface (5th 2005 Los. The physics and chemistry of SiO₂ and the Si-SiO₂ interface--5. Electrochemical Society, 2005.
Find full textInternational Symposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface (3rd 1996 Los Angeles, Calif.). The physics and chemistry of SiO₂ and the Si-SiO₂ interface-3, 1996: Proceedings of the Third International Symposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface. Edited by Massoud Hisham Z, Poindexter Edward H, and Helms C. Robert. Electrochemical Society, 1996.
Find full textRobert, Helms C., Deal Bruce E, Electrochemical Society Electronics Division, Electrochemical Society. Dielectric Science and Technology Division., and Symposium on the Physics and Chemistry of the SiO₂ and Si-SiO₂ Interface (2nd : 1992 : St. Louis, Mo.), eds. The Physics and chemistry of SiO₂ and the Si-SiO₂ interface 2. Plenum Press, 1993.
Find full textInternational Symposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface (4th 2000 Toronto, Ont.). The physics and chemistry of SiO₂ and the Si-SiO₂ interface--4, 2000: Proceedings of the Fourth International Symposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface, Toronto, Canada, May 15-18, 2000. Edited by Massoud Hisham Z, Electrochemical Society Electronics Division, and Electrochemical Society. Dielectric Science and Technology Division. Electrochemical Society, 2000.
Find full textB, Devine Roderick A., Duraud J. -P, and Dooryhée E, eds. Structure and imperfections in amorphous and crystalline SiO₂. Wiley, 2000.
Find full textSymposium on the Physics and Chemistry of SiO₂ and the Si-SiO₂ Interface (1st 1988 Atlanta, Ga.). The physics and chemistry of SiO₂ and the Si-SiO₂ interface. Plenum Press, 1988.
Find full textB, Devine Roderick A., ed. The physics and technology of amorphous SiO₂. Plenum Press, 1988.
Find full textR.A. Weeks International Symposium on Science and Technology of SiO₂̳ and Related Materials (1993 Honolulu, Hawaii). The R.A. Weeks International Symposium on Science and Technology of SiO₂ and Related Materials. American Ceramic Society, 1994.
Find full textBaraban, A. P. Ėlektronika sloev SiO₂ na kremnii. Izd-vo Leningradskogo universiteta, 1988.
Find full text1954-, Pacchioni G., Skuja L, Griscom David L, and NATO Advanced Study Institute on Defects in SiOb2s and Related Dielectrics: Science and Technology( 2000 : Erice, Italy), eds. Defects in SiO₂ and related dielectrics: Science and technology. Kluwer Academic Publishers, 2000.
Find full text1954-, Pacchioni G., Skuja L, Griscom David L, and NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology (2000 : Erice, Italy), eds. Defects in SiO₂ and related dielectrics: Science and technology. Kluwer Academic Publishers, 2000.
Find full textT, Pantelides Sokrates, and Lucovsky G, eds. SiO2 and its interfaces: Symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A. Materials Research Society, 1988.
Find full textGalashev, Alexander Y. Computer investigation of the stability and structure of Si and SiO2 nanoparticles. Nova Science Publishers, 2011.
Find full textUnited States. National Aeronautics and Space Administration., ed. SiC recession due to SiO₂ scale volatility under combustor conditions. NYMA, Inc., 1997.
Find full textUnited States. National Aeronautics and Space Administration., ed. SiC recession due to SiO₂ scale volatility under combustor conditions. NYMA, Inc., 1997.
Find full textP, Wittenauer J., Mendez D. J, and United States. National Aeronautics and Space Administration., eds. Physical characterization of SiO₂ aerogel: Phase II, final report, subcontract number: 565-9204. Lockheed Martin, Lockheed Martin Missiles & Space, Advanced Technology Center, 1996.
Find full textCleac'h, A. Le. Contribution à l étude des propriétés physiques des minéraux à haute pression: Spectroscopie et calcul des grandeurs thermodynamiques de la lawsonite, des épidotes et des polymorphes de Si02. Centre armoricain d'étude structurale des socles, LP CNRS no 4661, Université de Rennes I, 1990.
Find full textDeal, B. E., and C. R. Helms. Physics and Chemistry of SiO2 and the Si-SiO2 Interface. Springer London, Limited, 2013.
Find full textDeal, B. E., and C. R. Helms. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface. Springer, 2013.
Find full textDeal, B. E., and C. R. Helms. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2. Springer, 2013.
Find full text(Editor), B. E. Deal, and C. R. Helms (Editor), eds. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2. Springer, 1993.
Find full textA, International Symposium on the Physics, and Hisham Z. Massoud. Physics and Chemistry of Si02 and the Si-Si02 Interface-4: Proceedings of the Fourth International Symposium on the Physics and Chemistry of Sio2 and the ... Division Proceedings Volume 2000-2). Electrochemical Society, 1996.
Find full textDefects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and Chemistry, Volume 2) (NATO Science Series II: Mathematics, Physics and Chemistry). Springer, 2000.
Find full text(Editor), Gianfranco Pacchioni, Linards Skuja (Editor), and David L. Griscom (Editor), eds. Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and Chemistry, Volume 2) (NATO Science Series II: Mathematics, Physics and Chemistry). Springer, 2000.
Find full text(Editor), H. Z. Massoud, C. R. Helms (Editor), and Edward H. Poindexter (Editor), eds. Physics & Chemistry of Si02 & the Si-Si02 Interface: 3rd International Symposium (Proceedings Series Volume 96-1). Electrochemical Society, 1996.
Find full textPantelides, S. T., and G. Lucovsky. SiO2 and Its Interfaces: Volume 105. University of Cambridge ESOL Examinations, 2014.
Find full textLin, Dah-cheng. Kinetic study on the synthesis of Si₃N₄ via the ammonization of SiO vapor. 1995.
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