Books on the topic 'Spectrum analysis Semiconductors'

Mikla, Victor I. Trap level spectroscopy in amorphous semiconductors. London: Elsevier, 2010.

A, Bordovskiĭ G., ed. Termoaktivat͡sionnai͡a tokovai͡a spektroskopii͡a vysokoomnykh poluprovodnikov i diėlektrikov. Moskva: "Nauka," Glav. red., 1991.

1943-, D'Andrea A., Quagliano L. G, and Selci S, eds. Highlights of light spectroscopy on semiconductors: HOLSOS 95 : Villa Tuscolana, Frascati, Roma, Italy, 11-12 September 1995. Singapore: World Scientific, 1996.

Klingshirn, C. F. Semiconductor optics. Berlin: Springer, 1995.

Semiconductor optics. Berlin: Springer, 1997.

Semiconductor optics. Berlin: Springer, 2005.

Semiconductor optics. 3rd ed. Berlin: Springer, 2007.

Antonio, Cricenti, and Epioptics Workshop (8th : 2004 : Erice, Italy), eds. Epioptics-8: Proceedings of the 33rd course of the International School of Solid State Physics : Erice, Italy, 20-26 July 2004. Hackensack, N.J: World Scientific, 2006.

Antonio, Cricenti, and Epioptics Workshop (9th : 2006 : Erice, Italy), eds. Epioptics-9: Proceedings of the 39th course of the International School of Solid State Physics : Erice, Italy, 20-26 July 2006. Singapore: World Scientific, 2008.

Antonio, Cricenti, Ettore Majorana International Centre for Scientific Culture., and Epioptics Workshop (6th : 2000 : Erice, Italy), eds. Epioptics 2000: Proceedings of the 19th course of the International School of Solid State Physics : Erice, Sicily, Italy, 19-25 July 2000. New Jersey: World Scientific, 2001.

Antonio, Cricenti, Ettore Majorana International Centre for Scientific Culture., and Epioptics Workshop (7th : 2000 : Erice, Italy), eds. Epioptics-7: Proceedings of the 24th course of the International School of Solid State Physics : Erice, Italy, 20-26 July 2002. River Edge, N.J: World Scientific, 2004.

Optical absorption of impurities and defects in semiconducting crystals: Hydrogen-like centres. Heidelberg: Springer, 2010.

Optical techniques for solid-state materials characterization. Boca Raton: CRC Press, 2011.

Laino, Valerio. Performance analysis of edge emitting lasers in the mid infra-red and visible spectrum. Konstanz: Hartung-Gorre, 2007.

N, Bagayev S., Chirkin Anatoliĭ Stepanovich, Scientific Council for Coherent and Nonlinear Optics (Rossiīskai͡a︡ akademii͡a︡ nauk., and Society of Photo-optical Instrumentation Engineers., eds. ICONO '95: Atomic and quantum optics : high-precision measurements, 27 June-1 July, 1995, St. Petersburg, Russia. Bellingham, Wash: SPIE, 1996.

V, Shuvalov Vladimir, Zheltikov Alexei M, Scientific Council for Coherent and Nonlinear Optics (Rossiīskai͡a︡ akademii͡a︡ nauk., and Society of Photo-optical Instrumentation Engineers., eds. ICONO '95: Nonlinear spectroscopy and ultrafast phenomena, 27 June-1 July, 1995, St. Petersburg, Russia. Bellingham, Wash: SPIE, 1996.

ICONO '95 (1995 Saint Petersburg, Russia). ICONO '95: Nonlinear optics of low-dimensional structures and new materials, 27 June-1 July, 1995, St. Petersburg, Russia. Edited by Emelʹi͡a︡nov V. I, Panchenko Vladislav I͡A︡kovlevich, Scientific Council for Coherent and Nonlinear Optics (Rossiīskai͡a︡ akademii͡a︡ nauk), and Society of Photo-optical Instrumentation Engineers. Bellingham, Wash: SPIE, 1996.

Zhang, Wendong, and Chenyang Xue. Ban dao ti bo mo guang pu xue. Bei jing: Ke xue chu ban she, 2008.

ICONO '98 (1998 Moscow, Russia). ICONO '98: Ultrafast phenomena and interaction of superstrong laser fields with matter--nonlinear optics and high-field physics : 29 June-3 July 1998, Moscow, Russia. Edited by Fedorov M. V. 1940-, Scientific Council for Coherent and Nonlinear Optics (Rossiĭskai͡a akademii͡a nauk), and Russia (Federation). Ministerstvo nauki i tekhnologiĭ. Bellingham, Wash: SPIE--the International Society for Optical Engineering, 1999.

ICONO '98 (1998 Moscow, Russia). ICONO '98: Quantum optics, interference phenomena in atomic systems, and high-precision measurements : 29 June-3 July 1998, Moscow, Russia. Edited by Andreev A. V, Scientific Council for Coherent and Nonlinear Optics (Rossiĭskai͡a akademii͡a nauk), and Russia (Federation). Ministerstvo nauki i tekhnologiĭ. Bellingham, Wash: SPIE--the International Society for Optical Engineering, 1999.

Yu, Chikishev Andrey, Zadkov V. N, Zheltikov Alexei M, Scientific Council for Coherent and Nonlinear Optics (Rossiĭskai͡a︡ akademii͡a︡ nauk), Russia (Federation). Ministerstvo nauki i tekhnologiĭ., and Society of Photo-optical Instrumentation Engineers., eds. ICONO '98: Laser spectroscopy and optical diagnostics : novel trends in laser chemistry, biophysics, and biomedicine : 29 June-3 July, 1998, Moscow, Russia. Bellingham, Wash: SPIE, 1999.

S, Chesnokov Sergei, Kandidov V. P, Koroteev N. I, Scientific Council for Coherent and Nonlinear Optics (Rossiĭskai͡a︡ akademii͡a︡ nauk), and Russia (Federation). Ministerstvo nauki i tekhnologiĭ., eds. ICONO '98: Nonlinear optical phenomena and coherent optics in information technologies : 29 June-3 July 1998, Moscow, Russia. Bellingham, Wash., USA: SPIE, 1999.

N, Drabovich Konstantin, Scientific Council for Coherent and Nonlinear Optics (Rossiĭskai͡a︡ akademii͡a︡ nauk), and Russia (Federation). Ministerstvo nauki i tekhnicheskoĭ politiki., eds. ICONO '98: Fundamental aspects of laser-matter interaction and new nonlinear optical materials and physics of low-dimensional structures : 29 June-3 July 1998, Moscow, Russia. Bellingham, Wash: SPIE--the International Society for Optical Engineering, 1999.

M, Skok Ė, and Institut fiziki poluprovodnikov (Akademii͡a︡ nauk SSSR), eds. Metody spektroskopii poluprovodnikov. Novosibirsk: In-t fiziki poluprovodnikov SO AN SSSR, 1986.

Mikla, Victor I., and Victor V. Mikla. Trap Level Spectroscopy in Amorphous Semiconductors. Elsevier, 2010.

Spectroscopic Characterization Techniques for Semiconductor Technology V. Society of Photo Optical, 1994.

Gerhard, Abstreiter, Aydinli Atilla, Leburton J. P. 1949-, and NATO Advanced Study Institute on Optical Spectroscopy of Low Dimensional Semiconductors (1996 : Ankara and Antalya, Turkey), eds. Optical spectroscopy of low dimensional semiconductors. Dordrecht: Kluwer Academic Publishers, 1997.

J, Glembocki O., Pollak Fred H, Ponce Fernando, Optical Society of America, Society of Photo-optical Instrumentation Engineers., and Metallurgical Society (U.S.), eds. Spectroscopic characterization techniques for semiconductor technology III: 14-15 March 1988, Newport Beach, California. Bellingham, Wash., USA: SPIE, 1988.

Pollak, Fred H., and Orest J. Glembocki. Spectroscopic Characterization Techniques for Semiconductor Technology III: 14-15 March 1988, Newport Beach, California (Proceedings of Spie--the). Society of Photo Optical, 1988.

Spectroscopy and optoelectronics in semiconductors and related materials: Proceedings of the Sino-Soviet seminar, Shanghai, China, 27-31 May 1990. Singapore: World Scientific, 1990.

Weaire, Denis, Charles Patterson, and John F. McGilp. Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces. Springer, 2011.

Spectroscopy and Optoelectronics in Semiconductors and Related Materials: Proceedings of the Sino-Soviet Seminar. World Scientific Pub Co Inc, 1991.

J, Glembocki O., Society of Photo-optical Instrumentation Engineers., and City University of New York. Center for Advanced Technology for Ultrafast Photonic Materials and Applications., eds. Spectroscopic characterization techniques for semiconductor technology V: 25-26 January 1994, Los Angeles, California. Bellingham, Wash., USA: SPIE, 1994.

J, Glembocki O., and Society of Photo-optical Instrumentation Engineers., eds. Spectroscopic characterization techniques for semiconductor technology IV: 25-26 March 1992, Somerset, New Jersey. Bellingham, Wash., USA: SPIE, 1992.

H, Pollak Fred, and Society of Photo-optical Instrumentation Engineers., eds. Spectroscopic characterization techniques for semiconductor technology II: January 21-22, 1985, Los Angeles, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.

Brillson, Leonard J. Essential Guide to Electronic Material Surfaces and Interfaces. Wiley & Sons, Incorporated, John, 2016.

Mathematical and Physical Aspects of Experimental Investigations on Electron and Relaxation Time Spectra in Bulk and Nano-Structured Semiconductors and Insulators. Nova Science Publishers, Incorporated, 2018.

Godbole, Hemendra G. An investigation of bulk stacking faults in silicon using photocapacitance transient spectroscopy. 1989.

1929-, Landwehr G., and Rashba Ė I. 1927-, eds. Landau level spectroscopy. Amsterdam: North-Holland, 1991.

J, McGilp, Weaire D. L, and Patterson C. H. 1961-, eds. Epioptics: Linear and nonlinear optical spectroscopy of surfaces and interfaces. Berlin: Springer, 1995.

(Editor), J. McGilp, D. Weaire (Editor), and C. H. Patterson (Editor), eds. Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (Esprit Basic Research Series). Springer-Verlag Telos, 1995.

Cricenti, Antonio, International School of Solid State Phys, and Italy Epioptics Workshop 2004 Erice. Epioptics-8 (Science and Culture Series -- Physics). World Scientific Publishing Company, 2006.

Cricenti, Antonio. Epioptics-10 - Proceedings of the 43Rd Course of the International School of Solid State Physics. World Scientific Publishing Co Pte Ltd, 2010.

Prasankumar, Rohit P., and Antoinette J. Taylor. Optical Techniques for Solid-State Materials Characterization. Taylor & Francis Group, 2016.

Quantum Kinetics in Transport and Optics of Semiconductors (Springer Series in Solid-State Sciences). Springer, 2007.

Brillson, Leonard J. Surfaces and Interfaces of Electronic Materials. Wiley & Sons, Incorporated, John, 2012.

Brillson, Leonard J. Surfaces and Interfaces of Electronic Materials. Wiley & Sons, Limited, John, 2012.

Brillson, Leonard J. Surfaces and Interfaces of Electronic Materials. Wiley & Sons, Incorporated, John, 2012.

Surfaces And Interfaces Of Electronic Materials. IEEE Computer Society Press, 2010.

Brillson, Leonard J. Surfaces and Interfaces of Electronic Materials. Wiley & Sons, Incorporated, John, 2012.