Relevant bibliographies by topics / STM - Scanning Tunneling Microscope

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'STM - Scanning Tunneling Microscope'

Author: Grafiati
Published: 4 June 2021
Last updated: 13 February 2022

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Journal articles on the topic "STM - Scanning Tunneling Microscope"

1

Wells, Oliver C., and Mark E. Welland. "Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 636–39. http://dx.doi.org/10.1017/s0424820100144620.

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Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample. In the low-end STM, the system has a mechanical stability and a noise level to give a vertical resolution of between 0.1 nm and 1.0 nm. The atomic resolution STM can show individual atoms on the surface of the specimen.A low-end STM has been put into the specimen chamber of a s
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TSUDA, Nobuhiro. "Scanning Tunneling Microscope." Journal of the Society of Mechanical Engineers 91, no. 832 (1988): 209–15. http://dx.doi.org/10.1299/jsmemag.91.832_209.

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Kubby, J. A. "“Stm” Scanning Tunneling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 196–97. http://dx.doi.org/10.1017/s0424820100125889.

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Scanning Tunneling Microscopy is a recently developed technique within the area of Scanned Image Microscopy that is based on tunneling between two conducting electrodes. This method offers, for the first time, the possibility of direct, real space determination of surface atomic and electronic structure in three dimensions on an atomic length scale, including nonperiodic structures.In this technique a sharp metal tip, mounted on a piezoelectric tripod that forms an orthogonal coordinate system, is brought to within a few Angstroms of the sample surface without “touching” the region to be scann
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Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 959. http://dx.doi.org/10.1017/s0424820100162363.

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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM h
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Maaloum, M., D. Chretien, E. Karsenti, and J. K. Horber. "Approaching microtubule structure with the scanning tunneling microscope (STM)." Journal of Cell Science 107, no. 11 (1994): 3127–31. http://dx.doi.org/10.1242/jcs.107.11.3127.

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We demonstrate that the scanning tunneling microscope can be used to obtain information about arrangement of tubulin subunits in the microtubule wall. Long rows of subunits with a periodicity of 3.8 +/- 0.4 nm were clearly visible in the images of microtubules. The separation between the rows of subunits was 4.8 +/- 0.4 nm. Close inspection of two images revealed another periodicity of 7.8 +/- 0.4 nm in the contour levels of the protofilaments. This indicates that alpha and beta tubulin monomers can be resolved. In these areas the monomers were arranged according to a ‘B-type’ lattice. Scannin
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XU, HAI, XIAN NING XIE, M. A. K. ZILANI, WEI CHEN, and ANDREW THYE SHEN WEE. "NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY." COSMOS 03, no. 01 (2007): 23–50. http://dx.doi.org/10.1142/s0219607707000256.

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Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. I
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Stemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.

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Since its invention in the early 1980s the scanning tunneling microscope (STM) has rapidly evolved into a well established tool in solid state physics for surface structure analysis at atomic resolution. Recently a growing interest in the STM for investigating biological matter has been expressed, since surface ‘topographs’ of biomacromolecules can be recorded at ambient pressure or possibly in buffer solutions, thereby eliminating structural alterations induced by specimen dehydration such as required for electron microscopy (EM).As simple as a STM may look, it provides a wealth of informatio
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Kim, Seog-Jun, and Darrell H. Reneker. "Scanning Tunneling Microscopy of Carbon Blacks." Rubber Chemistry and Technology 66, no. 4 (1993): 559–66. http://dx.doi.org/10.5254/1.3538328.

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Abstract Three kinds of carbon black, HAF (high abrasion furnace, N330), MT (medium thermal, N990), and graphitized MT were observed with the scanning tunneling microscope (STM), the transmission electron microscope (TEM), and the scanning electron microscope (SEM) All the STM images are formed from measurements of the x, t, and z position of points on the surface of the particle. The STM images of carbon blacks were compared to transmission electron microscope (TEM) photographs. Pitted and stepped bumps were observed on the surface of HAF carbon black. The surface of MT carbon black was more
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Gómez-Rodríguez, J. M., and Baró A.M. "The use of Scanning Tunneling Microscopy in combination with Scanning Electron Microscopy in the fabrication and imaging of microstructures." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 752–53. http://dx.doi.org/10.1017/s0424820100176897.

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In the last few years, Scanning Tunneling Microscopy (STM), has proven to be a powerful and versatile technique to investigate the topographic and electronic structure of metals and semiconductors with an unprecedent vertical (0.01 nm) and lateral (0.2 nm) resolution. In this paper we are interested in the use of STM to study surfaces having microfabricated structures in the nanometer range, particularly those produced by the STM tip itself.In order to study these samples we have used an STM integrated into a commercial Scanning Electron Microscope (SEM). This allows to address two problems wh
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Wilson, R. J., D. D. Chambliss, S. Chiang, and V. M. Hallmark. "Resolution in the scanning tunneling microscope." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 488–89. http://dx.doi.org/10.1017/s042482010008674x.

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Scanning tunneling microscopy (STM) has been used for many atomic scale observations of metal and semiconductor surfaces. The fundamental principle of the microscope involves the tunneling of evanescent electrons through a 10Å gap between a sharp tip and a reasonably conductive sample at energies in the eV range. Lateral and vertical resolution are used to define the minimum detectable width and height of observed features. Theoretical analyses first discussed lateral resolution in idealized cases, and recent work includes more general considerations. In all cases it is concluded that lateral
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Dissertations / Theses on the topic "STM - Scanning Tunneling Microscope"

1

Kulawik, Maria. "Low temperature scanning tunneling microscopy." Doctoral thesis, [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=979718848.

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Babonis, Gregory S. "Low Temperature Scanning Tunneling Microscope for Single Atom Manipulation." Ohio University / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1058475483.

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Salazar, Enríquez Christian David. "Scanning tunneling microscopy on low dimensional systems." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2016. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-211572.

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This thesis contains experimental studies on low dimensional systems by means of scanning tunneling microscopy (STM). These studies include investigations on dinickel molecular complexes and experiments on iron nanostructures used for the implementation of the spin-polarized scanning tunneling microscopy technique at the IFW-Dresden. Additionally, this work provides detailed information of the experimental technique (STM), from the theoretical background to the STM-construction, which was part of this doctoral work. Molecular anchoring and electronic properties of macrocyclic magnetic complex
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Gambrel, Grady A. "Scanning Tunneling Microscopy of Two-Dimensional Materials." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu149424786854182.

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Walton, John Moorcroft. "The acquisition, analysis and processing of Scanning Auger Microscopy (SAM) and Scanning Tunneling Microscopy (STM) data." Thesis, University of York, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.387184.

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吳誼暉 and Yee-fai Ng. "Optimization of etching parameters for STM tips and an STM study of SiC (0001) [square root]3 x [square root]3 reconstruction." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1998. http://hub.hku.hk/bib/B29797834.

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Ng, Yee-fai. "Optimization of etching parameters for STM tips and an STM study of SiC (0001) [square root]3 x [square root]3 reconstruction /." Hong Kong : University of Hong Kong, 1998. http://sunzi.lib.hku.hk/hkuto/record.jsp?B20567583.

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Clark, Kendal W. "STM Study of Molecular and Biomolecular Electronic Systems." Ohio University / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1282363151.

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Burema, Shiri. "Inelastic Electron Tunneling Spectroscopy with the Scanning Tunneling Microscope : a combined theory-experiment approach." Thesis, Lyon, École normale supérieure, 2013. http://www.theses.fr/2013ENSL0821.

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La Spectroscopie par Effet Tunnel Inélastique (IETS) avec un Microscope à Effet Tunnel (STM) est une nouvelle technique de spectroscopie vibrationnelle, qui permet de caractériser des propriétés très fines de molécules adsorbées sur des surfaces métalliques. Des règles de selection d’excitation vibrationnelle basées sur la symétrie ont été proposées, cependant, elles ne semblent pas exhaustives pour expliquer la totalité du mécanisme et des facteurs en jeu; elles ne sont pas directement transposables pour les propriétés d'un adsorbat et sont lourdes d'utilisation. Le but de cette thèse est don
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Tjung, Steven Jason. "Scanning Tunneling Microscopy Studies of Adsorbates on Two-Dimensional Materials." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1524055802947913.

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Books on the topic "STM - Scanning Tunneling Microscope"

1

Wiesendanger, Roland. Scanning Tunneling Microscopy III: Theory of STM and Related Scanning Probe Methods. Springer Berlin Heidelberg, 1993.

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2

International, Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (12th 2003 Eindhoven Netherlands). Scanning tunneling microscopy/spectroscopy and related techniques: 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003. American Institute of Physics, 2003.

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International Conference on Scanning Tunneling Microscopy (1st 1986 Santiago de Compostela, Spain). STM '86: Proceedings of the First International Conference on Scanning Tunneling Microscopy, Santiago de Compostela, Spain, 14-18 July 1986. Edited by García N. North-Holland, 1987.

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Buchner, Florian. STM investigation of molecular architectures of porphyrinoids on a Ag(111) surface: Supramolecular ordering, electronic properties and reactivity. Springer Verlag, 2010.

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5

Abel, Phillip Benjamin. Design and calibration of a vacuum compatible scanning tunneling microscope. National Aeronautics and Space Administration, 1990.

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6

Othmar, Marti, and Amrein Matthias, eds. STM and SFM in biology. Academic Press, 1993.

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Chen, C. Julian. Introduction to Scanning Tunneling Microscopy. 3rd ed. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198856559.001.0001.

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The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to
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STM and SFM in Biology, First Edition. Academic Press, 1993.

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(Editor), Othmar Marti, and Matthias Amrein (Editor), eds. STM and SFM in Biology, First Edition. Academic Press, 1993.

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10

1961-, Wiesendanger R., and Güntherodt H. J. 1939-, eds. Scanning tunneling microscopy: Theory of STM and related scanning probe methods. Springer-Verlag, 1993.

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Book chapters on the topic "STM - Scanning Tunneling Microscope"

1

Gooch, Jan W. "Scanning Tunneling Microscope (STM)." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_14744.

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He, Yi, Shengfu Chen, and Qiuming Yu. "Scanning Tunneling Microscope (STM)." In Encyclopedia of Tribology. Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_1225.

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Siegenthaler, H. "STM in Electrochemistry." In Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-642-79366-0_2.

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Siegenthaler, H. "STM in Electrochemistry." In Scanning Tunneling Microscopy II. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5_2.

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Friedbacher, Gernot. "Scanning Tunneling Microscopy (STM)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch30.

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Chen, C. J. "Unified Perturbation Theory for STM and SFM." In Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0_7.

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Chen, C. J. "Unified Perturbation Theory for STM and SFM." In Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1_7.

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van Bentum, P. J. M., L. E. C. van de Leemput, R. T. M. Smokers, and H. van Kempen. "Single-electron effects observed with a low-temperature STM." In Scanning Tunneling Microscopy. Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-011-1812-5_39.

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Lang, N. D. "STM Imaging of Single-Atom Adsorbates on Metals." In Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0_2.

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Lang, N. D. "STM Imaging of Single-Atom Adsorbates on Metals." In Scanning Tunneling Microscopy III. Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1_2.

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Conference papers on the topic "STM - Scanning Tunneling Microscope"

1

Callaghan, F. D. "Cryogenic Magnetic Force Microscope." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639694.

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Libioulle, Laurent. "Low-Temperature Ultrahigh-Vacuum Atomic Force Microscope." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639695.

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Yasutake, M. "Tungsten Deposited Scanning Probe Microscope Tips for Critical Dimension Measurement." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639704.

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Iwata, Nobuya. "Microfabrication of Gallium Arsenide Cantilever for Scanning Probe Microscope Application." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639711.

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Fornaro, P. "Development and Applications for the Remote Controllable Atomic Force Microscope." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639714.

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Yoshida, N. "Resolution of Magnetic Force Microscope with Metal-Capped Carbon Nanotube Tips." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639712.

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Hwang, Ing-Souh. "Scanning Tunneling Microscope Study of Structural Transformations on One Monolayer Pb/Si(111)." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639780.

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Hameroff, S., C. Schneiker, M. Voelker, J. He, E. Dereniak, and R. McCuskey. "Scanning tunneling microscopy (STM) applications to molecular electronics." In Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE, 1988. http://dx.doi.org/10.1109/iembs.1988.95319.

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Gerritsen, J. W. "STM in a Gel Environment." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639719.

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Wakayama, Takayuki. "Microfabrication of Silicon/Ceramic Hybrid Cantilever for Scanning Probe Microscope and Sensor Applications." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639705.

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Reports on the topic "STM - Scanning Tunneling Microscope"

1

Dunphy, James Christopher. Toward quantitative STM: Scanning tunneling microscopy study of structure and dynamics of adsorbates on transition metal surfaces. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/96935.

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Taylor, A. J., G. P. Donati, G. Rodriguez, T. R. Gosnell, S. A. Trugman, and D. I. Some. Femtosecond scanning tunneling microscope. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/672306.

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Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

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Shedd, G. M., and P. E. Russell. Nanofabrication with the Scanning Tunneling Microscope. Office of Scientific and Technical Information (OSTI), 1988. http://dx.doi.org/10.2172/476650.

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Jarasch, Markus. Interfacing a Computer to a Scanning Tunneling Microscope. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.6923.

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De Lozanne, Alejandro. Nanofabrication of Electronic Devices With the Scanning Tunneling Microscope. Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada292463.

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Dovek, Moris M., Michael J. Heben, Christoph A. Lang, Nathan S. Lewis, and Calvin F. Quate. Design of a Scanning Tunneling Microscope for Electrochemical Applications. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada201952.

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Madey, Theodore E. A Proposal to Acquire a Variable Temperature Scanning Tunneling Microscope System. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada396338.

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Manuel, Lozano. A study of surface diffusion with the scanning tunneling microscope from fluctuations of the tunneling current. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/211377.

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Grigg, D. A., P. E. Russell, and T. A. Dow. Design and calibration of a scanning tunneling microscope for large machined surfaces. Office of Scientific and Technical Information (OSTI), 1988. http://dx.doi.org/10.2172/476625.

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