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Journal articles on the topic 'Surface and interface science'

Author: Grafiati

Published: 4 June 2021

Last updated: 6 February 2022

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1

Li, Junbai, and Krister Holmberg. "Surface chemistry and interface science." Physical Chemistry Chemical Physics 19, no. 35 (2017): 23568–69. http://dx.doi.org/10.1039/c7cp90152f.

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2

Eng, P. J., S. K. Ghose, and T. P. Trainor. "Enviromental surface and interface science at GSECARS." Geochimica et Cosmochimica Acta 70, no. 18 (2006): A161. http://dx.doi.org/10.1016/j.gca.2006.06.1388.

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3

Stevens, M. M. "Exploring and Engineering the Cell Surface Interface." Science 310, no. 5751 (2005): 1135–38. http://dx.doi.org/10.1126/science.1106587.

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4

Favaro, Marco, Fatwa Abdi, Ethan Crumlin, Zhi Liu, Roel van de Krol, and David Starr. "Interface Science Using Ambient Pressure Hard X-ray Photoelectron Spectroscopy." Surfaces 2, no. 1 (2019): 78–99. http://dx.doi.org/10.3390/surfaces2010008.

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The development of novel in situ/operando spectroscopic tools has provided the opportunity for a molecular level understanding of solid/liquid interfaces. Ambient pressure photoelectron spectroscopy using hard X-rays is an excellent interface characterization tool, due to its ability to interrogate simultaneously the chemical composition and built-in electrical potentials, in situ. In this work, we briefly describe the “dip and pull” method, which is currently used as a way to investigate in situ solid/liquid interfaces. By simulating photoelectron intensities from a functionalized TiO2 surface buried by a nanometric-thin layer of water, we obtain the optimal photon energy range that provides the greatest sensitivity to the interface. We also study the evolution of the functionalized TiO2 surface chemical composition and correlated band-bending with a change in the electrolyte pH from 7 to 14. Our results provide general information about the optimal experimental conditions for characterizing the solid/liquid interface using the “dip and pull” method, and the unique possibilities offered by this technique.

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5

Zhong, Q., and F. S. Ohuchi. "Surface science studies on the Ni/Al2O3 interface." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 3 (1990): 2107–12. http://dx.doi.org/10.1116/1.577011.

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6

You, Hoydoo, and Zoltán Nagy. "Applications of Synchrotron Surface X-Ray Scattering Studies of Electrochemical Interfaces." MRS Bulletin 24, no. 1 (1999): 36–40. http://dx.doi.org/10.1557/s088376940005171x.

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Aqueous-solution/solid interfaces are ubiquitous in modern manufacturing environments as well as in our living environment, and studies of such interfaces are an active area of science and engineering research. An important area is the study of liquid/solid interfaces under active electrochemical control, which has many immediate technological implications, for example, corrosion/passivation of metals and energy storage in batteries and ultracapacitors. The central phenomenon of electrochemistry is the charge transfer at the interface, and the region of interest is usually wider than a single atomic layer, ranging from a monolayer to thousands of angstroms, extending into both phases.Despite the technological and environmental importance of liquid/solid interfaces, the atomic level understanding of such interfaces had been very much hampered by the absence of nondestructive, in situ experimental techniques. The situation has changed somewhat in recent decades with the development of the largely ex situ ultrahigh vacuum (UHV) surface science, modern spectroscopic techniques, and modern surface microscopy.However in situ experiments of electrochemical interfaces are difficult, stemming from the special nature of these interfaces. These are so-called buried interfaces in which the solid electrode surface is covered by a relatively thick liquid layer. For this reason, the probe we use in the structural investigation must satisfy simultaneously two conditions: (1) the technique must be surface/interface sensitive, and (2) absorption of the probe in the liquid phase must be sufficiently small for penetration to and from the interface of interest without significant intensity loss.

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7

Nagpal, Prashant, Nathan C. Lindquist, Sang-Hyun Oh, and David J. Norris. "Ultrasmooth Patterned Metals for Plasmonics and Metamaterials." Science 325, no. 5940 (2009): 594–97. http://dx.doi.org/10.1126/science.1174655.

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Surface plasmons are electromagnetic waves that can exist at metal interfaces because of coupling between light and free electrons. Restricted to travel along the interface, these waves can be channeled, concentrated, or otherwise manipulated by surface patterning. However, because surface roughness and other inhomogeneities have so far limited surface-plasmon propagation in real plasmonic devices, simple high-throughput methods are needed to fabricate high-quality patterned metals. We combined template stripping with precisely patterned silicon substrates to obtain ultrasmooth pure metal films with grooves, bumps, pyramids, ridges, and holes. Measured surface-plasmon–propagation lengths on the resulting surfaces approach theoretical values for perfectly flat films. With the use of our method, we demonstrated structures that exhibit Raman scattering enhancements above 107 for sensing applications and multilayer films for optical metamaterials.

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8

Kurihara, Kazue. "Surface forces measurement for materials science." Pure and Applied Chemistry 91, no. 4 (2019): 707–16. http://dx.doi.org/10.1515/pac-2019-0101.

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Abstract This article reviews the surface forces measurement as a novel tool for materials science. The history of the measurement is briefly described in the Introduction. The general overview covers specific features of the surface forces measurement as a tool for studying the solid-liquid interface, confined liquids and soft matter. This measurement is a powerful way for understanding interaction forces, and for characterizing (sometime unknown) phenomena at solid-liquid interfaces and soft complex matters. The surface force apparatus (SFA) we developed for opaque samples can study not only opaque samples in various media, but also electrochemical processes under various electrochemical conditions. Electrochemical SFA enables us to determine the distribution of counterions between strongly bound ones in the Stern layer and those diffused in the Gouy-Chapman layer. The shear measurement is another active area of the SFA research. We introduced a resonance method, i.e. the resonance shear measurement (RSM), that is used to study the effective viscosity and lubricity of confined liquids in their thickness from μm to contact. Advantages of these measurements are discussed by describing examples of each measurement. These studies demonstrate how the forces measurement is used for characterizing solid-liquid interfaces, confined liquids and reveal unknown phenomena. The readers will be introduced to the broad applications of the forces measurement in the materials science field.

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9

Magdassi, Shlomo. "Fundamentals of Interface and Colloid Science: Interface Tension by J. Lyklema." Colloids and Surfaces A: Physicochemical and Engineering Aspects 238, no. 1-3 (2004): 159. http://dx.doi.org/10.1016/j.colsurfa.2004.03.002.

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10

Koberstein, Jeffrey T. "Surface and Interface Modification of Polymers." MRS Bulletin 21, no. 1 (1996): 19–23. http://dx.doi.org/10.1557/s0883769400035090.

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The properties of polymeric surfaces and interfaces are ubiquitous in their myriad commercial applications: paints and coatings, adhesives, lubrication, biocompatible materials, flocculation and steric stabilization of colloids, membranes and separation media, immiscible polymer blends, and filled composites. Some of these applications require low-energy surfaces that are chemically inert and are not easily wet with other materials. Other applications require high adhesion and strong interactions between the polymer and substrate. This article discusses fundamental principles governing the behavior of polymer surfaces and interfaces, then illustrates various means available for polymer-interface modification.

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11

Aeschlimann, Martin, and Richard Berndt. "Focus on advances in surface and interface science 2010." New Journal of Physics 15, no. 2 (2013): 025037. http://dx.doi.org/10.1088/1367-2630/15/025037.

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12

Scheffler, Matthias, and Wolf-Dieter Schneider. "Focus on Advances in Surface and Interface Science 2008." New Journal of Physics 10, no. 12 (2008): 125025. http://dx.doi.org/10.1088/1367-2630/10/12/125025.

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13

Aeschlimann, Martin, and Wolf-Dieter Schneider. "Focus on Advances in Surface and Interface Science 2009." New Journal of Physics 11, no. 12 (2009): 125001. http://dx.doi.org/10.1088/1367-2630/11/12/125001.

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14

Styler, S. A., M. E. Loiseaux, and D. J. Donaldson. "Substrate effects in the photoenhanced ozonation of pyrene." Atmospheric Chemistry and Physics 11, no. 3 (2011): 1243–53. http://dx.doi.org/10.5194/acp-11-1243-2011.

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Abstract. We report the effects of actinic illumination on the heterogeneous ozonation kinetics of solid pyrene films and pyrene adsorbed at air-octanol and air-aqueous interfaces. Upon illumination, the ozonation of solid pyrene films and pyrene at the air-aqueous interface proceeds more quickly than in darkness; no such enhancement is observed for pyrene at the air-octanol interface. Under dark conditions, the reaction of pyrene at all three interfaces proceeds via a Langmuir-Hinshelwood-type surface mechanism. In the presence of light, Langmuir-Hinshelwood kinetics are observed for solid pyrene films but a linear dependence upon gas-phase ozone concentration is observed at the air-aqueous interface. We interpret these results as evidence of the importance of charge-transfer pathways for the ozonation of excited-state pyrene. The dramatically different behaviour of pyrene at the surface of these three simple reaction environments highlights the difficulties inherent in representing complex reactive surfaces in the laboratory, and suggests caution in extrapolating laboratory results to environmental surfaces.

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15

Texter, John. "Colloid and interface science applications." Current Opinion in Colloid & Interface Science 9, no. 3-4 (2004): 199–200. http://dx.doi.org/10.1016/j.cocis.2004.09.007.

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16

Gowda, Arun, David Esler, Sandeep Tonapi, Annita Zhong, K. Srihari, and Florian Schattenmann. "Micron and Submicron-Scale Characterization of Interfaces in Thermal Interface Material Systems." Journal of Electronic Packaging 128, no. 2 (2006): 130–36. http://dx.doi.org/10.1115/1.2188952.

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One of the key challenges in the thermal management of electronic packages are interfaces, such as those between the chip and heat spreader and the interface between a heat spreader and heat sink or cold plate. Typically, thermal interfaces are filled with materials such as thermal adhesives and greases. Interface materials reduce the contact resistance between the mating heat generating and heat sinking units by filling voids and grooves created by the nonsmooth surface topography of the mating surfaces, thus improving surface contact and the conduction of heat across the interface. However, micron and submicron voids and delaminations still exist at the interface between the interface material and the surfaces of the heat spreader and semiconductor device. In addition, a thermal interface material (TIM) may form a filler-depleted and resin-rich region at the interfaces. These defects, though at a small length scale, can significantly deteriorate the heat dissipation ability of a system consisting of a TIM between a heat generating surface and a heat dissipating surface. The characterization of a freestanding sample of TIM does not provide a complete understanding of its heat transfer, mechanical, and interfacial behavior. However, system-level characterization of a TIM system, which includes its freestanding behavior and its interfacial behavior, provides a more accurate understanding. While, measurement of system-level thermal resistance provides an accurate representation of the system performance of a TIM, it does not provide information regarding the physical behavior of the TIM at the interfaces. This knowledge is valuable in engineering interface materials and in developing assembly process parameters for enhanced system-level thermal performance. Characterization of an interface material between a silicon device and a metal heat spreader can be accomplished via several techniques. In this research, high-magnification radiography with computed tomography, acoustic microscopy, and scanning electron microscopy were used to characterize various TIM systems. The results of these characterization studies are presented in this paper. System-level thermal performance results are compared to physical characterization results.

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17

AMEMIYA, Kenta. "Frontier of Surface and Interface Science Developed by Synchrotron Radiation." TRENDS IN THE SCIENCES 15, no. 8 (2010): 36–41. http://dx.doi.org/10.5363/tits.15.8_36.

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18

Pincik, Emil, and Taketoshi Matsumoto. "Progress in applied surface, interface and thin film science 2017." Applied Surface Science 461 (December 2018): 1–2. http://dx.doi.org/10.1016/j.apsusc.2018.07.214.

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19

KOSHIKAWA, Takanori. "Report on the 20^th International Vacuum Congress (IVC-20): Reports on Vacuum Science and Technology/Surface Science/Applied Surface Science at IVC-20." Journal of the Vacuum Society of Japan 60, no. 2 (2017): 70–71. http://dx.doi.org/10.3131/jvsj2.60.70.

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20

Perica, Tina, Yasushi Kondo, Sandhya P. Tiwari, et al. "Evolution of oligomeric state through allosteric pathways that mimic ligand binding." Science 346, no. 6216 (2014): 1254346. http://dx.doi.org/10.1126/science.1254346.

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Evolution and design of protein complexes are almost always viewed through the lens of amino acid mutations at protein interfaces. We showed previously that residues not involved in the physical interaction between proteins make important contributions to oligomerization by acting indirectly or allosterically. In this work, we sought to investigate the mechanism by which allosteric mutations act, using the example of the PyrR family of pyrimidine operon attenuators. In this family, a perfectly sequence-conserved helix that forms a tetrameric interface is exposed as solvent-accessible surface in dimeric orthologs. This means that mutations must be acting from a distance to destabilize the interface. We identified 11 key mutations controlling oligomeric state, all distant from the interfaces and outside ligand-binding pockets. Finally, we show that the key mutations introduce conformational changes equivalent to the conformational shift between the free versus nucleotide-bound conformations of the proteins.

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21

Minato, Taketoshi, and Takeshi Abe. "Surface and interface sciences of Li-ion batteries." Progress in Surface Science 92, no. 4 (2017): 240–80. http://dx.doi.org/10.1016/j.progsurf.2017.10.001.

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22

Degiorgio, Vittorio, and Roberto Piazza. "Light scattering in colloid and interface science." Current Opinion in Colloid & Interface Science 1, no. 1 (1996): 11–16. http://dx.doi.org/10.1016/s1359-0294(96)80038-0.

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23

Grier, David G. "Optical tweezers in colloid and interface science." Current Opinion in Colloid & Interface Science 2, no. 3 (1997): 264–70. http://dx.doi.org/10.1016/s1359-0294(97)80034-9.

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24

Javili, Ali, Niels Saabye Ottosen, Matti Ristinmaa, and Jörn Mosler. "Aspects of interface elasticity theory." Mathematics and Mechanics of Solids 23, no. 7 (2017): 1004–24. http://dx.doi.org/10.1177/1081286517699041.

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Interfaces significantly influence the overall material response especially when the area-to-volume ratio is large, for instance in nanocrystalline solids. A well-established and frequently applied framework suitable for modeling interfaces dates back to the pioneering work by Gurtin and Murdoch on surface elasticity theory and its generalization to interface elasticity theory. In this contribution, interface elasticity theory is revisited and different aspects of this theory are carefully examined. Two alternative formulations based on stress vectors and stress tensors are given to unify various existing approaches in this context. Focus is on the hyper-elastic mechanical behavior of such interfaces. Interface elasticity theory at finite deformation is critically reanalyzed and several subtle conclusions are highlighted. Finally, a consistent linearized interface elasticity theory is established. We propose an energetically consistent interface linear elasticity theory together with its appropriate stress measures.

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25

Vezzoli, Andrea. "Klaus Wandelt (Ed): Surface and Interface Science. Volume 5: Solid–Gas Interfaces I/Volume 6: Solid–Gas Interfaces II." Chromatographia 81, no. 1 (2017): 171. http://dx.doi.org/10.1007/s10337-017-3398-8.

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26

Oksengendler, B. L., N. R. Ashurov, S. E. Maksimov, O. V. Karpova, and S. Sh Rashidova. "Role of Fractals in Perovskite Solar Cells." Eurasian Chemico-Technological Journal 18, no. 4 (2017): 293. http://dx.doi.org/10.18321/ectj471.

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The interface engineering plays important role in fabrication of the tandem and perovskite based solar cells. Recent experiments show that the interface effects caused by the coupling of the electron bands and the pairing of geometry of contacting surfaces. In particular, it has been experimentally revealed that the transition from planar to the rough interface improves many photoelectric parameters of the<br />device. It means that the value of the fractal dimension of the interface may be key factor in device performance. It is possible to formulate two problems: firstly, the understanding on simple models why the electrical properties at fractal interfaces are improved, and, secondly, to discuss one of the most promising approaches in modern electronics, namely technology of radiation applications in the creation of rough interfaces. Thirdly, the problem of photodegradation is analyzed in detail in the structures containing the fractal interfaces. On the basis of the constructed models, it was found: i) increase of roughness (fractal) of interface structure can enhance the role of total internal light reflection effect, thereby increasing the effective light path, and therefore, the number of generated e-h-pairs; ii) the curvature of the surface leads to the shift of Tamm levels both to the borders of allowed bands, and to the middle of the band gap; it opens the way of the control of carrier recombination on the interface; iii) surface Tamm orbitals interact differently each with other on the convex and concave areas; it leads to the different probability of defect formation and, consequently, reduces the fractal interface, inhibiting the effect of increasing of the photocurrent associated with the fractal interface (new channel of photodegradation).

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27

HASEGAWA, SHUJI, and SHOZO INO. "CORRELATION BETWEEN ATOMIC-SCALE STRUCTURES AND MACROSCOPIC ELECTRICAL PROPERTIES OF METAL-COVERED Si(111) SURFACES." International Journal of Modern Physics B 07, no. 22 (1993): 3817–76. http://dx.doi.org/10.1142/s0217979293003504.

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In this review, we discuss the relation between the atomic-scale structures (atomic arrangements and electronic states) and the macroscopic electrical properties (surface conductance and Schottky barriers) of metal(Ag, Au, or In)-covered Si (111) surfaces. These surfaces have been one of the most intensively investigated systems with the use of a variety of modern surface science techniques, and diversified information at atomic scales has been obtained. The data of reflection high-energy electron diffraction, scanning tunneling microscopy/spectroscopy, photoemission spectroscopies, and others are utilized here for characterizing the structures. Surface conductance and Schottky barriers, on the other hand, have also been the major areas in semiconductor physics for, especially device-oriented, research, but these have rarely been studied in combination with atomic-scale structures. These electrical properties have recently been found to be crucially dependent on the local atomic structures of well-defined surfaces/interfaces. The atomic arrangements and the resulting surface/interface electronic states govern the Fermi-level pinning and band bending which determine the electrical properties of semiconductor surfaces/interfaces.

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28

Grunthaner, F. J. "Fundamentals of X-Ray Photoemission Spectroscopy." MRS Bulletin 12, no. 6 (1987): 60–64. http://dx.doi.org/10.1557/s0883769400067245.

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AbstractRapid progress in the development of new electronic materials and the steady maturation of silicon-based technologies has resulted in a host of novel electronic devices in which the active region of the structure is confined to an interface or a surface. The chemical, electronic, and physical characterization of surfaces and interfaces in semiconductors and insulators is of critical importance to manufacturing process control as well as to the fundamental electron physics and materials science which support microelectronic device research.

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29

Falicov, L. M., Daniel T. Pierce, S. D. Bader, et al. "Surface, interface, and thin-film magnetism." Journal of Materials Research 5, no. 6 (1990): 1299–340. http://dx.doi.org/10.1557/jmr.1990.1299.

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A comprehensive review and state of the art in the field of surface, interface, and thin-film magnetism is presented. New growth techniques which produce atomically engineered novel materials, special characterization techniques to measure magnetic properties of low-dimensional systems, and computational advances which allow large complex calculations have together stimulated the current activity in this field and opened new opportunities for research. The current status and issues in the area of material growth techniques and physical properties, characterization methods, and theoretical methods and ideas are reviewed. A fundamental understanding of surface, interface, and thin-film magnetism is of importance to many applications in magnetics technology, which is also surveyed. Questions of fundamental and technological interest that offer opportunities for exciting future research are identified.

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30

Rasing, Th, and Y. R. Shen. "Interface Studies with Nonlinear Optics." MRS Bulletin 13, no. 7 (1988): 28–30. http://dx.doi.org/10.1557/s0883769400065234.

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The importance of interfaces for material science and electronic devices has stimulated great interest in the development of surface analytical tools. Among them, modern optical techniques using lasers have attracted the most attention in recent years. They have the advantage of being applicable to all interfaces accessible by light, and the high temporal, spatial, and spectral resolutions offer unique opportunities for studying ultrafast molecular dynamics and other transient phenomena at interfaces. Optical second harmonic generation (SHG) and sum-frequency generation (SFG) are particularly being noticed because of the many recent successful demonstrations of their versatility. This article briefly introduces these newly developed surface probes, first outlining the basic principles behind surface SHG and SFG, and then illustrating the power of the techniques with selected examples. A more complete treatment of the theory can be found in References 4–6. An overview of the earlier applications can be found in Reference 3.SHG arises from the nonlinear polarization P(2)(2ω) induced in a medium by an incident laser field E(ω). In the electric dipole approximation, P is given by:where is a second-order nonlinear susceptibility. For a medium with inversion symmetry, it follows directly from Eq. 1 that = 0. However, at an interface the surface nonlinear susceptibility is nonvanishing because there the inversion symmetry is necessarily broken.

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31

Huang, John S., and Ramesh Varadaraj. "Colloid and interface science in the oil industry." Current Opinion in Colloid & Interface Science 1, no. 4 (1996): 535–39. http://dx.doi.org/10.1016/s1359-0294(96)80124-5.

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32

Deschênes, Louise, and Johannes Lyklema. "Entropy studies in interface science: An ageless tool." Current Opinion in Colloid & Interface Science 44 (December 2019): 220–24. http://dx.doi.org/10.1016/j.cocis.2019.11.006.

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33

Kerker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 112, no. 1 (1986): 302–5. http://dx.doi.org/10.1016/0021-9797(86)90098-6.

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34

Kerker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 113, no. 2 (1986): 589–93. http://dx.doi.org/10.1016/0021-9797(86)90193-1.

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35

Kerker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 114, no. 1 (1986): 295–97. http://dx.doi.org/10.1016/0021-9797(86)90269-9.

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36

Kerker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 116, no. 1 (1987): 296–99. http://dx.doi.org/10.1016/0021-9797(87)90123-8.

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Kerker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 119, no. 2 (1987): 602–4. http://dx.doi.org/10.1016/0021-9797(87)90311-0.

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Keker, Milton. "Classics and classicists of colloid and interface science." Journal of Colloid and Interface Science 124, no. 2 (1988): 697–99. http://dx.doi.org/10.1016/0021-9797(88)90210-x.

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39

Baer, Don R. "Interface Science, Passion and Impact." Surface and Interface Analysis 43, no. 9 (2011): 1189. http://dx.doi.org/10.1002/sia.3772.

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40

Bigelow, L. K., and M. P. D'Evelyn. "Role of surface and interface science in chemical vapor deposition diamond technology." Surface Science 500, no. 1-3 (2002): 986–1004. http://dx.doi.org/10.1016/s0039-6028(01)01545-x.

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41

Stuve, E. M., and N. Kizhakevariam. "Chemistry and physics of the ‘‘liquid’’/solid interface: A surface science perspective." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11, no. 4 (1993): 2217–24. http://dx.doi.org/10.1116/1.578395.

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42

KURAHASHI, Mitsunori. "On the Special Issue of “Plasma-induced Interface Reaction and Surface Science”." Vacuum and Surface Science 63, no. 12 (2020): 613. http://dx.doi.org/10.1380/vss.63.613.

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43

Britten, Michel, Margaret L. Green, Marcel Boulet, and Paul Paquin. "Deposit formation on heated surfaces: effect of interface energetics." Journal of Dairy Research 55, no. 4 (1988): 551–62. http://dx.doi.org/10.1017/s0022029900033331.

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SummaryDeposit formation was measured in a model laboratory plant in which whole milk was in contact with a heated surface at 100 °C for 1 h. The effect of the interfacial properties of various poly mer-coated surfaces on the amount and the adhesion strength of deposit was determined. The nature of the surface influenced the formation of deposit only slightly, but had a large effect on its adhesion strength. From correlation analysis, the polar contribution to surface energy was identified as the main factor influencing the deposit adhesion strength. These results suggest that the type of interactions at the surface govern the ease of removal of deposit.

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44

Kim, Youngbeom, Sungho Choi, Kyung-Young Jhang, and Taehyeon Kim. "Experimental Verification of Contact Acoustic Nonlinearity at Rough Contact Interfaces." Materials 14, no. 11 (2021): 2988. http://dx.doi.org/10.3390/ma14112988.

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When a longitudinal wave passes through a contact interface, second harmonic components are generated due to contact acoustic nonlinearity (CAN). The magnitude of the generated second harmonic is related to the contact state of the interface, of which a model has been developed using linear and nonlinear interfacial stiffness. However, this model has not been sufficiently verified experimentally for the case where the interface has a rough surface. The present study verifies this model through experiments using rough interfaces. To do this, four sets of specimens with different interface roughness values (Ra = 0.179 to 4.524 μm) were tested; one set consists of two Al6061-T6 blocks facing each other. The second harmonic component of the transmitted signal was analyzed while pressing on both sides of the specimen set to change the contact state of the interface. The experimental results showed good agreement with the theoretical prediction on the rough interface. The magnitude of the second harmonic was maximized at a specific contact pressure. As the roughness of the contact surface increased, the second harmonic was maximized at a higher contact pressure. The location of this maximal point was consistent between experiments and theory. In this study, an FEM simulation was conducted in parallel and showed good agreement with the theoretical results. Thus, the developed FEM model allows parametric studies on various states of contact interfaces.

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45

Lamichhane, SK. "Morphology and AFM Spectroscopy of Irradiated Interface of Silicon." Nepal Journal of Science and Technology 14, no. 2 (2014): 155–60. http://dx.doi.org/10.3126/njst.v14i2.10430.

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In covalent solids, more energetic irradiation sources are necessary to produce detectable level of damage. The atomic force microscopic (AFM) studies of mega electron-volt (MeV) ions irradiated silicon surfaces have been studied to a fluence of 5×108 ions cm-2 and surface morphology has been studied with AFM. Interesting features of cracks of ~ 50 nm in depth and ~ 100 nm in width have been observed on the irradiated surface. The features seemed to have been caused by the irradiation-induced stress in the irradiated regions of the target surface. The observed feature of cracks seems to be mainly due to the high electronic energy loss of the irradiated ions on the surface induces the stress in it. It confirms that the coarseness of the microstructure of a material directly affects the mechanical properties. DOI: http://dx.doi.org/10.3126/njst.v14i2.10430 Nepal Journal of Science and Technology Vol. 14, No. 2 (2013) 155-160

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Taylor, Christopher D. "Atomistic Modeling of Corrosion Events at the Interface between a Metal and Its Environment." International Journal of Corrosion 2012 (2012): 1–13. http://dx.doi.org/10.1155/2012/204640.

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Abstract:

Atomistic simulation is a powerful tool for probing the structure and properties of materials and the nature of chemical reactions. Corrosion is a complex process that involves chemical reactions occurring at the interface between a material and its environment and is, therefore, highly suited to study by atomistic modeling techniques. In this paper, the complex nature of corrosion processes and mechanisms is briefly reviewed. Various atomistic methods for exploring corrosion mechanisms are then described, and recent applications in the literature surveyed. Several instances of the application of atomistic modeling to corrosion science are then reviewed in detail, including studies of the metal-water interface, the reaction of water on electrified metallic interfaces, the dissolution of metal atoms from metallic surfaces, and the role of competitive adsorption in controlling the chemical nature and structure of a metallic surface. Some perspectives are then given concerning the future of atomistic modeling in the field of corrosion science.

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47

McGilp, J. F. "Probing surface and interface structure using optics." Journal of Physics: Condensed Matter 22, no. 8 (2010): 084018. http://dx.doi.org/10.1088/0953-8984/22/8/084018.

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48

Many, A., M. Wolovelsky, Y. Goldstein, S. Z. Weisz, and M. Gomez. "Surface states at the silicon-electrolyte interface." Journal of Physics: Condensed Matter 5, no. 33A (1993): A133—A134. http://dx.doi.org/10.1088/0953-8984/5/33a/028.

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49

Datsko, Bogdan, Vitaliy Meleshko, Zbigniew Świątek, Ivan Mohylyak, Lidia Lityńska-Dobrzyńska, and Paweł Zięba. "Interface Dynamics of Melt Instabilities on Semiconductor Surface." Solid State Phenomena 129 (November 2007): 137–43. http://dx.doi.org/10.4028/www.scientific.net/ssp.129.137.

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At uniform excitation of semiconductors by laser radiation with pre-threshold power, locally melted regions are formed on irradiated surfaces. This is induced by thermo diffusive instability of a distribution of uniformly generated electron-hole plasma. The shapes of locally melted regions give rise to a great variety of interesting surface patterns. A mathematical model of the surface dynamics, when the instability of the melt front arises along a chosen wave vector, is proposed. The results of computer simulation of interface dynamics of solitary melted region are compared with experimental data.

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50

Glendening, John W., and James D. Doyle. "Mesoscale Response to a Meandering Surface Temperature Interface." Journal of the Atmospheric Sciences 52, no. 5 (1995): 505–18. http://dx.doi.org/10.1175/1520-0469(1995)052<0505:mrtams>2.0.co;2.

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