Academic literature on the topic 'Surface Film Analysis'
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Journal articles on the topic "Surface Film Analysis"
Kim, Joon Hyun, and Joo-Hyun Kim. "Thermohydrodynamic Analysis of Surface Roughness in the Flow Field." Journal of Tribology 127, no. 2 (2005): 293–301. http://dx.doi.org/10.1115/1.1828072.
Full textMohd Dahan, Rozana, Muhamad Naiman Sarip, Yap Seong Ling, et al. "Surface Modification of Polyvinylidenefluoride-Trifluoroethylene Film Using Argon Gas Plasma." Advanced Materials Research 626 (December 2012): 317–23. http://dx.doi.org/10.4028/www.scientific.net/amr.626.317.
Full textPeng, X. F., and G. P. Peterson. "Analysis of Rewetting for Surface Tension Induced Flow." Journal of Heat Transfer 114, no. 3 (1992): 703–7. http://dx.doi.org/10.1115/1.2911337.
Full textZheng, You Yi, Chun Lin Zhang, and Xing Xin Xu. "Preparation and Film-Substrate Stress Analysis of CVD Diamond Film Coating Tools." Advanced Materials Research 619 (December 2012): 589–93. http://dx.doi.org/10.4028/www.scientific.net/amr.619.589.
Full textPranchov, R. B., and D. S. Campbell. "Stability Observations and Surface Analysis of Air Fired Nickel Thick Film Conductors." ElectroComponent Science and Technology 11, no. 4 (1985): 291–97. http://dx.doi.org/10.1155/apec.11.291.
Full textCheng, Dan Dan, Yun Cheng Shi, Wei Ping Yang, Yan Feng Xie, and Ze Yuan Zong. "Analysis on Wrinkling of Polyimide-Base Metal Film Prepared by Pulse Arc." Advanced Materials Research 482-484 (February 2012): 1097–100. http://dx.doi.org/10.4028/www.scientific.net/amr.482-484.1097.
Full textKong, Yeo Lee, S. V. Muniandy, M. S. Fakir, and K. Sulaiman. "Fractal Analysis of Morphological Image of Organic Phthalocyanine Tetrasulfonic Acid Tetrasodium (TsNiPc) Film." Advanced Materials Research 895 (February 2014): 407–10. http://dx.doi.org/10.4028/www.scientific.net/amr.895.407.
Full textIwata, Nobuyuki, Takuji Kuroda, and Hiroshi Yamamoto. "Crystal Structure Analysis of the Cr2O3 thin films." MRS Proceedings 1454 (2012): 33–38. http://dx.doi.org/10.1557/opl.2012.1111.
Full textSapers, S. P., R. Clark, and P. Somerville. "Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1068–69. http://dx.doi.org/10.1017/s0424820100173078.
Full textZhang, Yu Ting, Qiao Lei, Yi Ni Zhao, and Jian Qiang Bao. "Analysis of Packaging Properties of Composite Antibacterial Films by Response Surface Model." Applied Mechanics and Materials 799-800 (October 2015): 8–15. http://dx.doi.org/10.4028/www.scientific.net/amm.799-800.8.
Full textDissertations / Theses on the topic "Surface Film Analysis"
Craib, Glenn R. G. "Thin film structural determination and surface analysis." Thesis, University of Aberdeen, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.320771.
Full textMcAnally, Gerard David. "Analysis of polymer surfaces and thin-film coatings with Raman and surface enhanced Raman scattering." Thesis, University of Strathclyde, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.248360.
Full textWilliams, Joanne. "Thin film rimming flow subject to droplet impact at the surface." Thesis, University of Nottingham, 2009. http://eprints.nottingham.ac.uk/10670/.
Full textHurley, Belinda L. "Characterization and growth analysis of two types of thin films formed on copper surfaces an inorganic chromium containing film and an organic film formed via reduction of diazonium ions /." Connect to this title online, 2004. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1094253940.
Full textInoo, Akane. "Electrochemical Analysis on Reaction Sites of Graphite Electrodes with Surface Film in Lithium-ion Batteries." Kyoto University, 2020. http://hdl.handle.net/2433/253292.
Full textWang, Zuocheng. "Etude par couplage de méthodes spectroscopiques et électrochimiques des facteurs responsables de la stabilité de couches d'oxydes sur des alliages contenant du chrome et du molybdène." Thesis, Paris Sciences et Lettres (ComUE), 2019. http://www.theses.fr/2019PSLEC036.
Full textInamoto, Jun-ichi, and Junichi Inamoto. "Electrochemical Characterization of Surface-State of Positive Thin-Film Electrodes in Lithium-Ion Batteries." Kyoto University, 2017. http://hdl.handle.net/2433/226784.
Full textLi, Zuoli. "Studies of Thin Liquid Films Confined between Hydrophobic Surfaces." Diss., Virginia Tech, 2012. http://hdl.handle.net/10919/49557.
Full textJiang, Hao. "Numerical Modeling and Analysis of Micro-structuring on Silicon on Insulator (SOI) Film under Localized Single Pulse Laser Irradiation." University of Toledo / OhioLINK, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1302280541.
Full textBandegi, Mahdi. "A Coupled PDE Model for the Morphological Instability of a Multi-Component Thin Film During Surface Electromigration." TopSCHOLAR®, 2014. http://digitalcommons.wku.edu/theses/1386.
Full textBooks on the topic "Surface Film Analysis"
Friedbacher, Gernot, and Henning Bubert, eds. Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.
Full text1930-, Mayer James W., ed. Fundamentals of surface and thin film analysis. North-Holland, 1986.
Find full textFriedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. Wiley-VCH, 2011.
Find full textFriedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. 2nd ed. Wiley-VCH, 2011.
Find full textClaybourn, Michael. Infrared reflectance spectroscopy of polymers: Analysis of films, surfaces and interfaces. Global Press, 1998.
Find full textKirovskai͡a, I. A. Poverkhnostnye svoĭstva almazopodobnykh poluprovodnikov, khimicheskiĭ sostav poverkhnosti, kataliz. Izd-vo Irkutskogo universiteta, 1988.
Find full textJames, Howe, and SpringerLink (Online service), eds. Transmission Electron Microscopy and Diffractometry of Materials. 4th ed. Springer Berlin Heidelberg, 2013.
Find full textBubert, Henning, and Holger Jenett, eds. Surface and Thin Film Analysis. Wiley, 2002. http://dx.doi.org/10.1002/3527600167.
Full textBook chapters on the topic "Surface Film Analysis"
Morris, G. C. "Thin Film Analysis." In Springer Series in Surface Sciences. Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-662-05227-3_21.
Full textMorris, G. C. "Thin Film Analysis." In Springer Series in Surface Sciences. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-662-02767-7_21.
Full textHill, Wieland, and Bernhard Lendl. "Surface Raman Spectroscopy." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch24.
Full textBenka, Oswald. "Nuclear Reaction Analysis (NRA)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch14.
Full textHergenröder, Roland, and Michail Bolshov. "Surface Analysis by Laser Ablation." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch21.
Full textBenka, Oswald. "Elastic Recoil Detection Analysis (ERDA)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch13.
Full textRupertus, Volker. "Ion Beam Spectrochemical Analysis (IBSCA)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch22.
Full textPalmetshofer, Leopold. "Rutherford Backscattering Spectroscopy (RBS)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch11.
Full textFriedbacher, Gernot. "Introduction." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch28.
Full textRivière, John C., and Henning Bubert. "Introduction." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch1.
Full textConference papers on the topic "Surface Film Analysis"
Liang, Yueshan, and Pengfei Zhou. "Adhesive analysis of the thin film on the different optical polishing surface." In International Symposium on Optical Fabrication, Testing, and Surface Evaluation, edited by Jumpei Tsujiuchi. SPIE, 1992. http://dx.doi.org/10.1117/12.132144.
Full textKlein, David, and Gerard H. Vurens. "Measurements of thin film disks by surface reflectance analysis." In Optoelectronics '99 - Integrated Optoelectronic Devices, edited by John C. Stover. SPIE, 1999. http://dx.doi.org/10.1117/12.343708.
Full textLi, Xianchang, and Ting Wang. "Computational Analysis of Surface Curvature Effect on Mist Film Cooling Performance." In ASME Turbo Expo 2007: Power for Land, Sea, and Air. ASMEDC, 2007. http://dx.doi.org/10.1115/gt2007-27434.
Full textMcGettrick, James, Trystan Watson, Katherine Hooper, Adam Pockett, Matthew Carnie, and Joel Troughon. "Perovskite Materials for Scale-Up: Surface Analysis of a Range of Scalable Architectures." In 3rd International Conference on Perovskite Thin Film Photovoltaics, Photonics and Optoelectronics. Fundació Scito, 2017. http://dx.doi.org/10.29363/nanoge.abxpvperopto.2018.076.
Full textPerfilyev, V., A. Moshkovich, K. Lutudjean, and L. Rapoport. "Friction and Wear of MoS2 Films on Etched Steel Surfaces." In ASME 2008 9th Biennial Conference on Engineering Systems Design and Analysis. ASMEDC, 2008. http://dx.doi.org/10.1115/esda2008-59076.
Full textPanigrahi, Shrabani, Santanu Jana, Tomás Calmeiro, Daniela Nunes, Rodrigo Martins, and Elvira Fortunato. "Cross-sectional Analysis of Surface Potential inside Solar Cells Using Kelvin Probe Force Microscopy." In 3rd International Conference on Perovskite Thin Film Photovoltaics, Photonics and Optoelectronics. Fundació Scito, 2017. http://dx.doi.org/10.29363/nanoge.abxpvperopto.2018.038.
Full textHuang, Lu, Jing Jin, Weimin Shi, et al. "Analysis on the surface uniformity and edge recombination of single-crystalline silicon solar cells on electrical parameters." In Seventh International Conference on Thin Film Physics and Applications, edited by Junhao Chu and Zhanshan Wang. SPIE, 2010. http://dx.doi.org/10.1117/12.888223.
Full textJentzsch, Bruno, Alvaro Gomez-Iglesias, Alexander Tonkikh, and Bernd Witzigmann. "Analysis of surface-emitting thin-film superluminescent diodes with high efficiency." In Integrated Optics: Design, Devices, Systems and Applications, edited by Pavel Cheben, Jiří Čtyroký, and Iñigo Molina-Fernández. SPIE, 2019. http://dx.doi.org/10.1117/12.2519731.
Full textLalezari, Ramin, and Robert G. Knollenberg. "Surface Analysis For The Characterization Of Defects In Thin Film Processes." In 33rd Annual Techincal Symposium, edited by John E. Greivenkamp and Matthew Young. SPIE, 1989. http://dx.doi.org/10.1117/12.962826.
Full textMosharov, V. E., A. A. Orlov, and V. N. Radchenko. "Application of correlation analysis in surface flow visualization with oil film." In SPIE Proceedings, edited by Yuri N. Dubnistchev and Bronyus S. Rinkevichyus. SPIE, 2006. http://dx.doi.org/10.1117/12.683012.
Full textReports on the topic "Surface Film Analysis"
Stoffer, James, George D. Weddill, Thomas O'Keefe, Richard Brow, and Matt O'Keefe. Acquisition of Surface/Thin Film Analysis System. Defense Technical Information Center, 2002. http://dx.doi.org/10.21236/ada402919.
Full textCollins, W. E., and B. Rambabu. Experimental thin film deposition and surface analysis techniques. Office of Scientific and Technical Information (OSTI), 1986. http://dx.doi.org/10.2172/5705694.
Full textMehta, P., C. S. Feigerle, R. E. Clausing, L. Heatherly, and T. Thundat. Analysis of the surface structure of HFCVD diamond films. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/106570.
Full textBerney, Ernest, Naveen Ganesh, Andrew Ward, J. Newman, and John Rushing. Methodology for remote assessment of pavement distresses from point cloud analysis. Engineer Research and Development Center (U.S.), 2021. http://dx.doi.org/10.21079/11681/40401.
Full textSmith, Randall. Investigations of the Air-Water Interface: A Structural Analysis of Metallic Surface Films and Aquatic Surface Films by Comparative Microscopy. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.2303.
Full textSitek, M., and S. Lottes. Computational Analysis of Water Film Thickness During Rain Events for Assessing Hydroplaning Risk Part 2: Rough Road Surfaces. Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1677647.
Full textLottes, S., M. Sitek, and N. Sinha. Computational Analysis of Water Film Thickness During Rain Events for Assessing Hydroplaning Risk, Part 1: Nearly Smooth Road Surfaces. Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1674976.
Full textBauer, Andrew, James Forsythe, Jayanarayanan Sitaraman, Andrew Wissink, Buvana Jayaraman, and Robert Haehnel. In situ analysis and visualization to enable better workflows with CREATE-AV™ Helios. Engineer Research and Development Center (U.S.), 2021. http://dx.doi.org/10.21079/11681/40846.
Full textBerney, Ernest, Andrew Ward, and Naveen Ganesh. First generation automated assessment of airfield damage using LiDAR point clouds. Engineer Research and Development Center (U.S.), 2021. http://dx.doi.org/10.21079/11681/40042.
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