Relevant bibliographies by topics / Surface microscopy

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Surface microscopy'

Author: Grafiati
Published: 3 June 2025
Last updated: 19 July 2025

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Journal articles on the topic "Surface microscopy"

1

Soyer, H. Peter, Josef Smolle, Stefan Hödl, Heinz Pachernegg, and Helmut Kerl. "Surface Microscopy." American Journal of Dermatopathology 11, no. 1 (1989): 1–10. http://dx.doi.org/10.1097/00000372-198902000-00001.

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Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling
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Nolle, Daniela, Markus Weigand, Gisela Schütz, and Eberhard Goering. "High Contrast Magnetic and Nonmagnetic Sample Current Microscopy for Bulk and Transparent Samples Using Soft X-Rays." Microscopy and Microanalysis 17, no. 5 (2011): 834–42. http://dx.doi.org/10.1017/s1431927611000560.

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AbstractThe soft X-ray energy range provides important detection capabilities for a wide range of material systems, e.g., the K-edge behavior of biological materials or magnetic contrast imaging at the L2,3- and M4,5-edges, respectively, using the X-ray magnetic circular dichroism effect. The need for thinned samples due to the short penetration depth of soft X-rays is a limiting factor for microscopic imaging in transmission microscopy. In contrast, the more surface sensitive photoelectron emission microscopy allows the X-ray microscopic investigation of nontransparent bulk samples, but only
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Anisovich, A. G., M. I. Markevich, and A. N. Malyshko. "Some particularities of microscopic investigation of non-metallic objects." Litiyo i Metallurgiya (FOUNDRY PRODUCTION AND METALLURGY), no. 2 (June 9, 2020): 75–80. http://dx.doi.org/10.21122/1683-6065-2020-2-75-80.

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The article deals with the comparative application of optical and raster microscopy for non-metallic objects and non-conducting surfaces. It is noted that this issue is not covered much in the special literature. There are practically no publications that compare and describe photos of the structure of materials obtained using fundamentally different microscopes, in particular, metallographic and raster. The causes of image distortion in a raster electron microscope in the study of dielectrics are considered. Comparative images of the oxidized surface, fabrics and natural leather obtained usin
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Venables, J. A. "Electron microscopy in surface science." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 678–79. http://dx.doi.org/10.1017/s042482010010545x.

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Surface science and electron microscopy are two fields of comparable size. The overlap between the two, the examination of surfaces on a microscopic scale, constitutes a small but important area of both fields. Historically, the area has grown slowly, with relatively few electron microscopy groups worldwide involved in studies of surface structure and reconstructions, small particles and surface reactions, and crystal growth. More recently, activity has intensified with substantial developments based on TEM, STEM, REM and SEM. At the same time surface science instrumentation has been developed
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TAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA, and MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION." Surface Review and Letters 04, no. 04 (1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.

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Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (
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Yeatman, E., and E. A. Ash. "Surface plasmon microscopy." Electronics Letters 23, no. 20 (1987): 1091. http://dx.doi.org/10.1049/el:19870762.

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HICKEL, W., D. KAMP, and W. KNOLL. "Surface-plasmon microscopy." Nature 339, no. 6221 (1989): 186. http://dx.doi.org/10.1038/339186a0.

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Rothenhäusler, Benno, and Wolfgang Knoll. "Surface–plasmon microscopy." Nature 332, no. 6165 (1988): 615–17. http://dx.doi.org/10.1038/332615a0.

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Stolz, Wilhelm, Peter Bilek, Michael Landthaler, Tanja Merkle, and Otto Braun-Falco. "SKIN SURFACE MICROSCOPY." Lancet 334, no. 8667 (1989): 864–65. http://dx.doi.org/10.1016/s0140-6736(89)93027-4.

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Dissertations / Theses on the topic "Surface microscopy"

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Yang, Shuo. "Surface reconstruction through microscopy data fusion." Thesis, Imperial College London, 2015. http://hdl.handle.net/10044/1/31526.

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Reconstructing the surface microtopography through data fusion from a range of microscopies offers a way to provide considerably more information than any one technique alone. This thesis explores several methods for combining the info rmation from different kinds of microscopes including height data, electron images and optical images. Each microscopy has distinct advantages and disadvantages that can be considered in terms of data leakage in the transfer function from the actual sampl e topography to any individual dataset. These leakage paths are identified for a range of microscopies inclu
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Howells, Samuel Charles. "Surface studies with scanning probe microscopy." Diss., The University of Arizona, 1992. http://hdl.handle.net/10150/185905.

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Using scanning probe microscopy, several studies were carried out to characterize surface topographies and properties. First, utilizing scanning tunneling microscopy (STM), we characterized fullerenes deposited onto gold foils and highly oriented gold films. On gold foils, we found that C₆₀ packed in hexagonally ordered overlayers and that the images showed internal buckyball features that arose from electronic interactions between the molecule and the substrate. On gold films, with an ordered overlayer of methyl isobutyl ketone (MIBK), the isolated C₆₀ molecules showed internal features in a
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Jarvis, Suzanne Philippa. "Atomic force microscopy and tip-surface interactions." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.359441.

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Stabler, Graham. "High resolution wide field surface plasmon microscopy." Thesis, University of Nottingham, 2005. http://eprints.nottingham.ac.uk/12624/.

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This thesis presents the development of a high resolution wide field speckle illuminated interferometric surface plasmon microscope. This system is based on a Linnik interferometer and uses a high NA oil immersion objective for the excitation of surface plasmons. The confocal response of the microscope and high surface field enhancement due to surface plasmon excitation lead to high resolution and high contrast of weak surface structures and films. The microscope was also demonstrated in two other modes of operation, a sensing mode where the distributions seen in the back focal plane of the sa
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Lam, Shu Chiu. "Theoretical studies on Field-Ion Microscopy." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241059.

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Vithayaveroj, Viriya. "Atomic force microscopy for sorption studies." Diss., Available online, Georgia Institute of Technology, 2004:, 2004. http://etd.gatech.edu/theses/available/etd-09282004-121825/unrestricted/vithayaveroj%5Fviriya%5F200412%5Fphd.pdf.

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Thesis (Ph. D.)--Civil and Environmental Engineering, Georgia Institute of Technology, 2005.<br>Dr. Rina Tannenbaum, Committee Member ; Dr. Michael Sacks, Committee Member ; Dr. Sotira Yiacoumi, Committee Chair ; Dr. Costas Tsouris, Committee Co-Chair ; Dr. Ching-Hua Huang, Committee Member. Vita. Includes bibliographical references.
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Lhenry, Sébastien. "Nouveaux développements en microscopie électrochimique (SECM) pour l'analyse de surfaces fonctionnalisées." Thesis, Rennes 1, 2014. http://www.theses.fr/2014REN1S150/document.

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Ce manuscrit décrit les travaux menés pour le développement et l'utilisation du microscope électrochimique (SECM) pour l'étude des surfaces fonctionnelles. Cette microscopie à sonde locale, utilisant les propriétés des ultramicroélectrodes (UMEs), permet l'analyse de la réactivité chimique à la surface d'un échantillon. Le but de ces travaux est alors l'analyse de surfaces fonctionnalisées par une couche organique. Dans un premier temps, nous avons développé la méthodologie du SECM par l'utilisation de sonde redox spécifique. D'abord, cela nous a permis de déterminer la distance entre l'électr
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Whitmore, Lawrence Charles. "Microscopy of nanomachined silicon." Thesis, University of Surrey, 1994. http://epubs.surrey.ac.uk/771883/.

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Fitts, William Patrick. "Variable-temperature scanning tunneling microscopy studies of atomic and molecular level surface phenomena on semiconductor and metal surfaces /." Full text (PDF) from UMI/Dissertation Abstracts International, 2001. http://wwwlib.umi.com/cr/utexas/fullcit?p3008324.

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Kenny, Daniel James. "Scanning tunnelling microscopy studies of cluster-surface interactions." Thesis, University of Birmingham, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.394708.

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Books on the topic "Surface microscopy"

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Bai, Chunli. Scanning tunneling microscopy and its application. Scientific & Technical Publishers, 1995.

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Bai, Chunli. Scanning tunneling microscopy and its application. 2nd ed. Springer, 2000.

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Wang, Zhong Lin. Reflection electron microscopy and spectroscopy for surface analysis. Cambridge University Press, 1996.

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Bauer, Ernst. Surface Microscopy with Low Energy Electrons. Springer New York, 2014. http://dx.doi.org/10.1007/978-1-4939-0935-3.

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Kenny, Daniel James. Scanning tunnelling microscopy studies of cluster-surface interactions. University of Birmingham, 2001.

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Rapp, Micah. Visualizing cell surface interactions using cryogenic electron microscopy. [publisher not identified], 2021.

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NATO, Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques (1987 Erice Italy). Surface and interface characterization by electron optical methods. Plenum Press, 1988.

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W, Menzies Scott, ed. An Atlas of surface microscopy of pigmented skin lesions. McGraw-Hill Book Co., 1996.

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Peter, Frank. Piezoresponse force microscopy and surface effects of perovskite ferroelectric nanostructures. Forschungszentrum Jülich GmbH, Zentralbibliothek, 2006.

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W, Menzies Scott, ed. An atlas of surface microscopy of pigmented skin lesions: Dermoscopy. 2nd ed. McGraw-Hill, 2003.

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Book chapters on the topic "Surface microscopy"

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Smith, Graham T. "Surface microscopy." In Industrial Metrology. Springer London, 2002. http://dx.doi.org/10.1007/978-1-4471-3814-3_3.

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Jensen, Lindsay G., Loren K. Mell, Christin A. Knowlton, et al. "Surface Microscopy." In Encyclopedia of Radiation Oncology. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-540-85516-3_536.

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Voigtländer, Bert. "Surface States." In Scanning Probe Microscopy. Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0_10.

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Maas, Diederik J., and Raoul van Gastel. "Helium Ion Microscopy." In Surface Science Techniques. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_16.

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Della Pia, Ada, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Surface Science Techniques. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_19.

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Colton, Richard J., Eric I. Altman, and Steven M. Hues. "Surface Science at the Nanoscale: Molecular Imaging and Surface Forces." In Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_31.

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Russ, John C. "Surface Image Measurements." In Computer-Assisted Microscopy. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0563-7_10.

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Golovchenko, J. A. "Tunneling Microscopy." In Solvay Conference on Surface Science. Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/978-3-642-74218-7_17.

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Suga, Shigemasa, Akira Sekiyama, and Christian Tusche. "Momentum Microscopy." In Springer Series in Surface Sciences. Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-64073-6_11.

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de la Figuera, Juan, and Kevin F. McCarty. "Low-Energy Electron Microscopy." In Surface Science Techniques. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_18.

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Conference papers on the topic "Surface microscopy"

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Pickering, Howard W., and Toshio Sakurai. "Scanning Tunneling Microscopy and Its Applications in Corrosion Science." In CORROSION 1991. NACE International, 1991. https://doi.org/10.5006/c1991-91081.

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Abstract Scanning tunneling microscopy (STM) is described with a view to its application for the study of corrosion reactions. The principles of STM are presented in terms of the theory, construction of the microscope including field ion capability for characterizing the probe tip, and its applications for characterizing surfaces. Recent results will be presented to illustrate its versatility for the study of surface structure, chemisorption and surface reactions, including the study of atomic hydrogen adsorption on the Si(111)-7 x 7 surface and real time (in-situ) studies of anodic copper dis
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Nazirizadeh, Yousef, Uli Lemmer, and Martina Gerken. "Surface contrast microscopy." In Novel Techniques in Microscopy. OSA, 2011. http://dx.doi.org/10.1364/ntm.2011.ntuc3.

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Neumann, Burkhard, Horst Engel, and Bernd Schleifenbaum. "Surface Tension Microscopy." In 33rd Annual Techincal Symposium, edited by John E. Wampler. SPIE, 1989. http://dx.doi.org/10.1117/12.962712.

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Yeatman, Eric M., and Eric A. Ash. "Computerized Surface Plasmon Microscopy." In 1988 International Congress on Optical Science and Engineering. SPIE, 1989. http://dx.doi.org/10.1117/12.950350.

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Yeatman, Eric M., and Eric A. Ash. "Surface Plasmon Scanning Microscopy." In 1988 Los Angeles Symposium--O-E/LASE '88, edited by E. Clayton Teague. SPIE, 1988. http://dx.doi.org/10.1117/12.944524.

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Williams, C. C., J. Slinkman, D. W. Abraham, and H. K. Wickramasinghe. "Nanoscale Surface Characterization by Scanning Capacitance Microscopy." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41427.

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Lee, Byron S., and T. C. Strand. "Scanning Interference Microscopy for Surface Characterization." In Optical Fabrication and Testing. Optica Publishing Group, 1988. http://dx.doi.org/10.1364/oft.1988.tha8.

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Recent work has introduced the concept of scanning interference microscopy which has 3-D resolution comparable to a confocal microscope (1). This is obtained by performing interference microscopy with spatially incoherent and broadband illumination. By scanning along the optical axis, one can measure the coherence function at each point in the image. This coherence function can be processed to obtain various pieces of information. The maximum of the envelope of the coherence function corresponds to the surface height. By Fourier processing of the fringes at each point, the spectral reflectivit
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Acosta, Dwight, Jose Salmones, Jesus Morales, and Maria Limon. "Electron microscopy and catalytical studies of the ceramic superconductor Bi2CaSr2Cu2Ox." In The 8th Latin American congress on surface science: Surfaces , vacuum, and their applications. AIP, 1996. http://dx.doi.org/10.1063/1.51194.

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GAUTRON, ERIC. "MXenes surface chemistry investigated by monochromated EELS." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.219.

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Tragl, Amadeus. "Surface Structure of Titanium Silicalite-1 Zeolites." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1080.

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Reports on the topic "Surface microscopy"

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Bryant, Michael, Miles Beaux, Victor Siller, and Igor Usov. Plutonium Dedicated Surface Probe Microscopy Capability. Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1671071.

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Williams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Defense Technical Information Center, 1988. http://dx.doi.org/10.21236/ada192710.

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Meissner, K. E., P. L. Gourley, T. M. Brennan, B. E. Hammons, and A. E. McDonald. Surface-emitting semiconductor laser for intracavity spectroscopy and microscopy. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/28233.

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Chueh, William. Surface-Modified Electrodes: Enhancing Performance Guided by Insitu Spectroscopy and Microscopy. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1369243.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/6017304.

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Coleman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/5879901.

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Cahill, David G., and R. J. Hamers. Surface Photovoltage of Ag on Si(111)-7X7 by Scanning Tunneling Microscopy. Defense Technical Information Center, 1991. http://dx.doi.org/10.21236/ada236971.

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Coleman, R. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), 1990. http://dx.doi.org/10.2172/5216448.

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Coleman, R. V., Zhenxi Dai, W. W. McNairy, C. G. Slough, and Chen Wang. Surface structure and spectroscopy of charge-density wave materials using scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/5901839.

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Cai, Tanhong. Scanning Tunneling Microscopy Studies of Surface Structures of Icosahedral Al-Cu-Fe Quasicrystals. Office of Scientific and Technical Information (OSTI), 2001. http://dx.doi.org/10.2172/802957.

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