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Journal articles on the topic 'Surface microscopy'

Author: Grafiati

Published: 3 June 2025

Last updated: 31 July 2025

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1

Soyer, H. Peter, Josef Smolle, Stefan Hödl, Heinz Pachernegg, and Helmut Kerl. "Surface Microscopy." American Journal of Dermatopathology 11, no. 1 (1989): 1–10. http://dx.doi.org/10.1097/00000372-198902000-00001.

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2

Kondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi, and Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.

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Recent development of ultra-high vacuum electron microscopy (UHV-EM) is very rapid. This is due to the fact that it can be applied to variety of surface science fields.There are various types of surface imaging in UHV condition; low energy electron microscopy (LEEM) [1], transmission (TEM) and reflection electron microscopy (REM) [2] using conventional transmission electron microscopes (CTEM) (including scanning TEM and REM)), scanning electron microscopy, photoemission electron microscopy (PEEM) [3] and scanning tunneling microscopy (STM including related techniques such as scanning tunneling

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3

Nolle, Daniela, Markus Weigand, Gisela Schütz, and Eberhard Goering. "High Contrast Magnetic and Nonmagnetic Sample Current Microscopy for Bulk and Transparent Samples Using Soft X-Rays." Microscopy and Microanalysis 17, no. 5 (2011): 834–42. http://dx.doi.org/10.1017/s1431927611000560.

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AbstractThe soft X-ray energy range provides important detection capabilities for a wide range of material systems, e.g., the K-edge behavior of biological materials or magnetic contrast imaging at the L2,3- and M4,5-edges, respectively, using the X-ray magnetic circular dichroism effect. The need for thinned samples due to the short penetration depth of soft X-rays is a limiting factor for microscopic imaging in transmission microscopy. In contrast, the more surface sensitive photoelectron emission microscopy allows the X-ray microscopic investigation of nontransparent bulk samples, but only

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4

Anisovich, A. G., M. I. Markevich, and A. N. Malyshko. "Some particularities of microscopic investigation of non-metallic objects." Litiyo i Metallurgiya (FOUNDRY PRODUCTION AND METALLURGY), no. 2 (June 9, 2020): 75–80. http://dx.doi.org/10.21122/1683-6065-2020-2-75-80.

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The article deals with the comparative application of optical and raster microscopy for non-metallic objects and non-conducting surfaces. It is noted that this issue is not covered much in the special literature. There are practically no publications that compare and describe photos of the structure of materials obtained using fundamentally different microscopes, in particular, metallographic and raster. The causes of image distortion in a raster electron microscope in the study of dielectrics are considered. Comparative images of the oxidized surface, fabrics and natural leather obtained usin

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5

Venables, J. A. "Electron microscopy in surface science." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 678–79. http://dx.doi.org/10.1017/s042482010010545x.

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Surface science and electron microscopy are two fields of comparable size. The overlap between the two, the examination of surfaces on a microscopic scale, constitutes a small but important area of both fields. Historically, the area has grown slowly, with relatively few electron microscopy groups worldwide involved in studies of surface structure and reconstructions, small particles and surface reactions, and crystal growth. More recently, activity has intensified with substantial developments based on TEM, STEM, REM and SEM. At the same time surface science instrumentation has been developed

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6

TAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA, and MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION." Surface Review and Letters 04, no. 04 (1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.

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Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (

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7

Yeatman, E., and E. A. Ash. "Surface plasmon microscopy." Electronics Letters 23, no. 20 (1987): 1091. http://dx.doi.org/10.1049/el:19870762.

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8

HICKEL, W., D. KAMP, and W. KNOLL. "Surface-plasmon microscopy." Nature 339, no. 6221 (1989): 186. http://dx.doi.org/10.1038/339186a0.

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9

Rothenhäusler, Benno, and Wolfgang Knoll. "Surface–plasmon microscopy." Nature 332, no. 6165 (1988): 615–17. http://dx.doi.org/10.1038/332615a0.

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10

Stolz, Wilhelm, Peter Bilek, Michael Landthaler, Tanja Merkle, and Otto Braun-Falco. "SKIN SURFACE MICROSCOPY." Lancet 334, no. 8667 (1989): 864–65. http://dx.doi.org/10.1016/s0140-6736(89)93027-4.

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11

Puppin, Douglas, Denis Salomon, and Jean-Hilaire Saurat. "Amplified surface microscopy." Journal of the American Academy of Dermatology 28, no. 6 (1993): 923–27. http://dx.doi.org/10.1016/0190-9622(93)70131-c.

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12

Williams, Ellen D., R. J. Phaneuf, N. C. Bartelt, W. Swiech, and E. Bauer. "Stress-induced structures on surfaces observed using Scanning Tunneling Microscopy and low-energy Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 332–33. http://dx.doi.org/10.1017/s042482010012206x.

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Elastic stresses play a well-known and important role in the structure of thin films during growth. However, elastic effects can also greatly influence surface morphology of the substrate. One source of this influence, as has long been recognized is the elastic interactions between steps on surfaces. More recently, Marchenko has shown that surface stress can stabilize finite-size structures in surfaces, such as facets. Traditionally surface morphologies such as steps and facets have been measured by low-energy electron diffraction. However, the more recent development of ultra-high vacuum comp

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13

Guerra, John M. "Photon Tunneling Microscopy." Microscopy Today 00, no. 6 (1992): 8. http://dx.doi.org/10.1017/s1551929500071224.

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The Photon Tunneling Microscope is used to provide high resolution (subnanometer vertical), quantifiable, real-time, 3-D (with continuously variable viewpoint) imaging and profilometry of homogenous dielectric samples, whether transparent or absorbing. A partial list of these includes: thin films (micraroughness. damage evaluation, step height) optical storage media (pit depth and shape measurement), magnetic media (microroughness, wear tracks), polymers (surface characterization), optical surfaces (microroughness, damage, polishing evaluation), diamond-turned optical surfaces (tool and machin

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14

Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as su

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15

McCartney, M. R., and David J. Smith. "Surface studies in UHV: Applications of High-resolution electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 444–45. http://dx.doi.org/10.1017/s0424820100086520.

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The examination of surfaces requires not only that they be free of adsorbed layers but the environment of the sample must also be maintained at high vacuum so that the surfaces remain clean. The possibility of resolving surface structures with atomic resolution has provided the motivation for optimizing intermediate and high voltage electron microscopes for this particular application. Electron microscopy offers a variety of techniques which have the capability of achieving atomic level detail of surfaces including plan-view imaging, REM and profile imaging. Operation at higher voltages permit

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16

Shao, Jianan, Ruiyi Chen, Dehua Zhu, Yu Cao, Wenwen Liu, and Wei Xue. "Meta-Surface Slide for High-Contrast Dark-Field Imaging." Photonics 10, no. 7 (2023): 775. http://dx.doi.org/10.3390/photonics10070775.

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A label-free microscopy technology, dark-field microscopy, is widely used for providing high-contrast imaging for weakly scattering materials and unstained samples. However, traditional dark-field microscopes often require additional components and larger condensers as the numerical aperture increases. A solution to this is the use of a meta-surface slide. This slide utilizes a multilayer meta-surface and quantum dots to convert incident white light into a red glow cone emitted at a larger angle. This enables the slide to be used directly with conventional biological microscopy to achieve dark

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17

Mundschau, M., E. Bauer, and W. ᔒwięch. "Methods and Applications of UV Photoelectron Microscopy in Surface Science." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 564–65. http://dx.doi.org/10.1017/s0424820100181579.

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Photoelectron microscopy is sensitive to single atomic or molecular layers on surfaces at submonolayer coverages. A significant advance for fundamental studies in surface science has been the construction of ultra-high vacuum versions of classical photoelectron microscopes and the combination with other techniques of surface analysis - most notably low-energy electron diffraction and microscopy. This is essential for the proper interpretation of the micrographs. The technique is well suited for in situ studies of large flat samples such as silicon wafers, single crystals and polished metallurg

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18

Zemke, Valentina, Volker Haag, and Gerald Koch. "Wood identification of charcoal with 3D-reflected light microscopy." IAWA Journal 41, no. 4 (2020): 478–89. http://dx.doi.org/10.1163/22941932-bja10033.

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Abstract The present study focusses on the application of 3D-reflected light microscopy (3D-RLM) for the wood anatomical identification of charcoal specimens produced from domestic and tropical timbers. This special microscopic technique offers a detailed investigation of anatomical features in charcoal directly compared with the quality of field emission scanning electron microscopy (FESEM). The advantages of using the 3D-RLM technology are that fresh fracture planes of charcoal can be directly observed under the microscope without further preparation or surface treatment. Furthermore, the 3D

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19

Ai, R. "A Microscope-Compatible Auger Electron Spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.

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With the recent development of ultra-high vacuum high resolution electron microscopes (UHV-HREM), electron microscopes have become valuable tools for surface studies. Techniques such as surface profile image, surface sensitive plane view, and reflection electron microscopy have been developed to take full advantage of the atomic resolution of HREM to study surface structures. However a complete surface study requires information on both the surface structure and surface chemistry. Therefore in order to turn an electron microscope into a real surface analytical tool, the challenge is to develop

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20

ICHIKAWA, M., S. MARUNO, S. FUJITA, H. WATANABE, and Y. KUSUMI. "MICROPROBE RHEED/STM COMBINED MICROSCOPY." Surface Review and Letters 04, no. 03 (1997): 535–42. http://dx.doi.org/10.1142/s0218625x97000511.

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We have developed microprobe reflection high energy electron diffraction combined with scanning tunneling microscope and molecular beam epitaxy equipment. This combination makes it possible to study and control surface processes in the magnification range from several hundred micrometers to the atomic scale. An electron biprism is also attached to the incident electron beam path, which produces a new kind of scanning electron microscopy called scanning interference electron microscopy. The two coherently divided electron beams created by the biprism produce electron interference fringes. The e

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21

Weaver, J. M. R. "Semiconductor characterization by scanning force microscope surface photovoltage microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 3 (1991): 1562. http://dx.doi.org/10.1116/1.585424.

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22

Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demons

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23

Petrov, Yuri V., and Oleg F. Vyvenko. "Scanning reflection ion microscopy in a helium ion microscope." Beilstein Journal of Nanotechnology 6 (May 7, 2015): 1125–37. http://dx.doi.org/10.3762/bjnano.6.114.

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Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM). The reflected ions were detected by their “conversion” to secondary electrons on a platinum surface. An angle of incidence in the range 5–10° was used in the experimental setup. It was shown that the RIM image contrast was determined mostly by surface morphology but not by the atomic comp

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24

Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.

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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in

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25

Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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26

Tsai, Feng, and J. M. Cowley. "Reflection electron microscopy of ferroelectric domains." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 568–69. http://dx.doi.org/10.1017/s0424820100170578.

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The intersections of ferroelectric domain boundaries with crystal surfaces have been studied by optical microscopy. The method is widely used but usually of low resolution. Transmission electron microscopy (TEM) can provide high-resolution images but may not be appropriate for studying crystal surfaces. Scanning electron microscopy (SEM) has also been used to study the intersections of ferroelectric domain boundaries with the surfaces of ferroelectric crystals. However, the resolution is still low and is destructive if an etched crystal surface is used. Other alternatives have also been attemp

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27

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM

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28

Engel, W., B. Rausenberger, W. Swiech, C. S. Rastomjee, A. M. Bradshaw, and E. Zeitler. "In situ studies of heterogeneous reactions using surface electron microscopies LEEM, MEM, and PEEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 998–99. http://dx.doi.org/10.1017/s0424820100150824.

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The preferred imaging techniques for the observation of physical and chemical processes at solid surfaces with high temporal and spatial resolution are low-energy electron microscopy (LEEM), mirror electron microscopy (MEM) and photoemission electron microscopy (PEEM). In these techniques the energy transfer to the surface during the imaging process itself is small so that surface processes such as adsorption, diffusion, chemical reactions etc. remain largely undisturbed.LEEM, MEM and PEEM, which all can be performed in an ultra-high-vacuum surface microscope of the Bauer/Telieps type, have be

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29

Lebedev, Sergey P., P. A. Dement’ev, Alexander A. Lebedev, V. N. Petrov, and Alexander N. Titkov. "Fabrication and Use of Atomically Smooth Steps on 6H-SiC for Calibration of z-Displacements in Scanning Probe Microscopy." Materials Science Forum 645-648 (April 2010): 767–70. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.767.

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Atomic-force microscopy and scanning tunnel electron microscopy have been used to study the surface of single-crystal 6H-SiC (0001) substrates subjected to step-by-step high-temperature annealing in vacuum. An annealing procedure leading to surface structuring by atomically smooth steps with heights of 0.75 and 1.5 nm has been found. It is suggested to use the structured surfaces as test objects for z-calibration of scanning probe microscopes.

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30

Takayanagi, Kunio. "High-Resolution UHV Electron Microscopy of Reconstructed and Adsorbed Surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 298–99. http://dx.doi.org/10.1017/s0424820100180240.

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High-resolution electron microscopy (HREM) has been applied for structure analyses of reconstructed and adsorbed surfaces at atomic resolution in transmission (TEM) and reflection (REM) mode by using an UHV electron microscope (modified 2000 FXV). In the last ICEM conference, we reported instrumental design of the new UHV electron microscopet[1] with a review on atomic structure study by UHV -EM[2]. In this review we show dynamic structural studies of surfaces which have been revealed by using a TV camera-and-video recording system. Details of each topic shown here are given in original papers

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31

Yagi, Katsumichi. "Surface Electron Microscopy / Oberflächenelektronenmikroskopie." Practical Metallography 24, no. 5 (1987): 222–32. http://dx.doi.org/10.1515/pm-1987-240504.

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32

Bahmer, Friedrich A., Peter Fritsch, Juergen Kreusch, et al. "Terminology in surface microscopy." Journal of the American Academy of Dermatology 23, no. 6 (1990): 1159–62. http://dx.doi.org/10.1016/s0190-9622(08)80916-4.

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33

Wessel, John. "Surface-enhanced optical microscopy." Journal of the Optical Society of America B 2, no. 9 (1985): 1538. http://dx.doi.org/10.1364/josab.2.001538.

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34

Ugbabe, G. E., E. Owen-Obaseki, S. O. Abdulahi, S. R. Chinonyerem, S. E. Okhale, and J. A. Ibrahim. "Leaf Epidermal Microscopy, Chemo-Microscopy and GC-MS Analyses of Three Ocimum Species from Nigeria." Asian Plant Research Journal 11, no. 2 (2023): 10–23. http://dx.doi.org/10.9734/aprj/2023/v11i2206.

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Comparative analyses of the leaf epidermal microscopy, chemo-microscopy and GCMS analysis of essential oils from three Ocimum species were analyzed. Ocimum belong to the family Lamiaceae. Leaf epidermal microscopy revealed anomocytic stomata in the species studied. Ocimum basilicum has anomocytic stomata on both surfaces but were more abundant on the lower surface; cell walls were wavy on the upper surface and had glandular trichomes on both surfaces. Ocimum canum had anomocytic stomata on both surfaces; cell walls were wavy and trichomes were glandular and non-glandular occurring on both surf

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35

Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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36

Taneja, Atul. "Macro-microscopy: clinical surface microscopy using digital cameras." International Journal of Dermatology 55, no. 8 (2016): e460-e462. http://dx.doi.org/10.1111/ijd.13254.

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37

Zhou, Ming, Jia Hong Yang, Xia Ye, et al. "Blood Platelet’s Behavior on Nanostructured Superhydrophobic Surface." Journal of Nano Research 2 (August 2008): 129–36. http://dx.doi.org/10.4028/www.scientific.net/jnanor.2.129.

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Regular arrays of micro-pillars and nano-grooves structures on the silicon wafer are fabricated by using soft lithography, and the three dimension morphology of textured surface is observed by using scanning electron microscopy (SEM) and atomic force microscope (AFM). The static water contact angles are measured by using contact angle meter to characterize the wettabilities of these surfaces. To investigate how the presence of topography and the variations of wettability affect the haemocompatibility of textured surface contacted with blood, different patterned surfaces are designed and fabric

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38

Collazo-Davila, C., E. Landree, D. Grozea, et al. "Design and Initial Performance of an Ultrahigh Vacuum Sample Preparation Evaluation Analysis and Reaction (SPEAR) System." Microscopy and Microanalysis 1, no. 6 (1995): 267–79. http://dx.doi.org/10.1017/s1431927695112672.

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Results concerning the calibration and use of a new ultrahigh vacuum (UHV) surface preparation and analysis system are reported. This Sample Preparation Evaluation Analysis and Reaction (SPEAR) side chamber system replaces an older surface side chamber that was attached to a Hitachi UHV H-9000 microscope. The system combines the ability to prepare clean surfaces using sample heating, cooling, ion milling, or thin film growth with surface analytical tools such as Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM), along with atomic

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39

Smith, David J., M. Gajdardziska-Josifovska, and M. R. McCartney. "Surface studies with a UHV-TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.

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The provision of ultrahigh vacuum capabilities, as well as in situ specimen treatment and annealing facilities, makes the transmission electron microscope into a potentially powerful instrument for the characterization of surfaces. Several operating modes are available, including surface profile imaging, reflection electron microscopy (REM), and reflection high energy electron diffraction (RHEED), as well as conventional transmission imaging and diffraction. All of these techniques have been utilized in our recent studies of surface structures and reactions for various metals, oxides and semic

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40

Lai, Quintin J., Stuart L. Cooper, and Ralph M. Albrecht. "Thrombus formation on artificial surfaces: Correlative microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (1990): 840–41. http://dx.doi.org/10.1017/s042482010016176x.

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Thrombus formation and embolization are significant problems for blood-contacting biomedical devices. Two major components of thrombi are blood platelets and the plasma protein, fibrinogen. Previous studies have examined interactions of platelets with polymer surfaces, fibrinogen with platelets, and platelets in suspension with spreading platelets attached to surfaces. Correlative microscopic techniques permit light microscopic observations of labeled living platelets, under static or flow conditions, followed by the observation of identical platelets by electron microscopy. Videoenhanced, dif

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41

Cowley, J. M., and P. A. Crozier. "Surface resonance channelling in scanning reflection electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 692–93. http://dx.doi.org/10.1017/s0424820100105527.

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The phenomena of the channelling of electrons along planes or rows of atoms in the surface layers of crystals has been investigated recently in relation to microdiffraction and RHEED, REM, (reflection electron microscopy) and REELS (reflection electron energy loss spectroscopy) by using a conventional TEM in the reflection mode.The renewed interest in this phenomenon, known for many years, is the evidence from calculations of dynamical diffraction effect at surfaces that the electrons may be channelled along the topmost layers of atoms on a crystal surface and that the RHEED, REM and REELS sig

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42

Castell, Martin R., Sergei L. Dudarev, Christiane Muggelberg, Adrian P. Sutton, G. Andrew D. Briggs, and David T. Goddard. "Microscopy of Metal Oxide Surfaces." Microscopy and Microanalysis 6, no. 4 (2000): 324–28. http://dx.doi.org/10.1017/s1431927602000569.

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AbstractElevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO2 have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in the images. Low voltage scanning electron microscopy is used to image small equilibrium pores in

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43

Castell, Martin R., Sergei L. Dudarev, Christiane Muggelberg, Adrian P. Sutton, G. Andrew D. Briggs, and David T. Goddard. "Microscopy of Metal Oxide Surfaces." Microscopy and Microanalysis 6, no. 4 (2000): 324–28. http://dx.doi.org/10.1007/s100050010029.

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Abstract Elevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO2 have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in the images. Low voltage scanning electron microscopy is used to image small equilibrium pores in

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Castano, V., and W. Krakow. "High-resolution electron microscopy of Cu2O surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 396–97. http://dx.doi.org/10.1017/s0424820100143584.

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In non-UHV microscope environments atomic surface structure has been observed for flat-on for various orientations of Au thin films and edge-on for columns of atoms in small particles. The problem of oxidation of surfaces has only recently been reported from the point of view of high resolution microscopy revealing surface reconstructions for the Ag2O system. A natural extension of these initial oxidation studies is to explore other materials areas which are technologically more significant such as that of Cu2O, which will now be described.

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Tsai, Feng, and J. M. Cowley. "Contrasts of planar defects in reflection electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1004–5. http://dx.doi.org/10.1017/s042482010015085x.

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Reflection electron microscopy (REM) has been used to study surface defects such as surface steps, dislocations emerging on crystal surfaces, and surface reconstructions. However, only a few REM studies have been reported about the planar defects emerging on surfaces. The interaction of planar defects with surfaces may be of considerable practical importance but so far there seems to be only one relatively simple theoretical treatment of the REM contrast and very little experimental evidence to support its predications. Recently, intersections of both 90° and 180° ferroelectric domain boundari

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Ren, Guan Hui, Cong Zhou, and Bi Zhang. "Effect of Cutting Fluid on Milling of Additively Manufactured Inconel 738LC." Materials Science Forum 1027 (April 2021): 117–22. http://dx.doi.org/10.4028/www.scientific.net/msf.1027.117.

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This study focuses on the effect of cutting fluid on sample surface integrity and tool wear in milling additively manufactured Inconel 738LC. Sample surface integrity and tool wear characterization was undertaken using scanning electron microscopy, backscatter electron microscopy, energy dispersive spectroscopy, laser scanning confocal microscopy, ultra-depth of field digital microscope system and digital display hardness tester. Compared with dry milling, wet milling not only provides an entirely different result on surface morphology, but also shows less surface plastic deformation, and smal

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Murthy, N., J. G. White, and G. H. R. Rao. "Imaging of surface-adherent human-blood platelets by atomic-force microscopy (AFM)." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 872–73. http://dx.doi.org/10.1017/s0424820100166828.

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Studies in our laboratory over the past three decades have explored platelet ultrastructural morphology by light microscopy as well as transmission, scanning and low-voltage, high-resolution scanning electron microscopy. Unlike these optical microscopes, scanning probe microscopes measure real space images of cells on flat surfaces. In brief, the AFM works by scanning a very sharp conducting tip (SiN) over the surface of a conducting biological membrane. Cantilivers used for probing were short tipped with thin legs (0.22 nm spring constant). Scanning was done with the J size scanner (150 x 150

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Hwang, J., E. Betzig, and M. Edidin. "Near-field microscopy of membrane domains." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 778–79. http://dx.doi.org/10.1017/s0424820100140269.

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Results from several different methods for probing the lateral organization of cell surface membranes indicate that these membranes are patchy, divided into domains. The data suggest that on average these domains are 0.1-1 μm across and that they persist for 10’s to 1000’s of seconds. At least some domains in this size range, when labeled by fluorescent proteins or lipids ought to be detectable by conventional, far-field, fluorescence microscopy. However, though some images are consistent with a domain structure for membranes, most far-field images of fluorescent cell surfaces lack the detail

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Yagi, K. "Reflection electron microscopy." Journal of Applied Crystallography 20, no. 3 (1987): 147–60. http://dx.doi.org/10.1107/s0021889887086916.

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Reflection electron microscopy (REM) in ultra-high vacuum (UHV) conditions is reviewed. UHV-REM can characterize surface structures of monolayer levels such as steps, domains of reconstructed surface structures and their boundaries and these capabilities are used to observe surface dynamic processes such as phase transitions of reconstructed surface structures and adsorbate structures and adsorption processes, oxidations, sublimations and ion-sputtering and annealing. The method is compared with other surface-imaging techniques.

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Newbury, Dale E. "Ion microscope and microprobe studies of surfaces and interfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 856–57. http://dx.doi.org/10.1017/s0424820100150113.

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Secondary ion mass spectrometry (SIMS) in its spatially-resolved forms, the ion microscope and ion microprobe, offers elemental, isotopic, and molecular detection, wide dynamic intensity range spanning major to trace concentrations in the part per million (ppm) range or lower, high lateral spatial resolution in the micrometer to sub-micrometer range, shallow sampling depths to the nanometer range, and the possibility of "microanalytical tomography", the reconstruction of three-dimensional distributions. With this broad range of capabilities, SIMS has special advantages for the characterization

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