Books on the topic 'Test automation'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 books for your research on the topic 'Test automation.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse books on a wide variety of disciplines and organise your bibliography correctly.
Matsinopoulos, Panos. Practical Test Automation. Berkeley, CA: Apress, 2020. http://dx.doi.org/10.1007/978-1-4842-6141-5.
Full text1959-, Fewster Mark, ed. Experiences of test automation: Case studies of software test automation. Upper Saddle River, NJ: Addison-Wesley, 2011.
Find full textPajankar, Ashwin. Python Unit Test Automation. Berkeley, CA: Apress, 2017. http://dx.doi.org/10.1007/978-1-4842-2677-3.
Full textPajankar, Ashwin. Python Unit Test Automation. Berkeley, CA: Apress, 2022. http://dx.doi.org/10.1007/978-1-4842-7854-3.
Full textChandrasekara, Chaminda, and Pushpa Herath. Hands-On Functional Test Automation. Berkeley, CA: Apress, 2019. http://dx.doi.org/10.1007/978-1-4842-4411-1.
Full textAxelrod, Arnon. Complete Guide to Test Automation. Berkeley, CA: Apress, 2018. http://dx.doi.org/10.1007/978-1-4842-3832-5.
Full text1944-, Graham Dorothy, ed. Software test automation: Effective use of test execution tools. New York: ACM Press, 1999.
Find full textMcCartney, Timothy P. A test matrix sequencer for research test facility automation. [Washington, D.C.]: NASA, 1990.
Find full textLauwereins, Rudy, and Jan Madsen, eds. Design, Automation, and Test in Europe. Dordrecht: Springer Netherlands, 2008. http://dx.doi.org/10.1007/978-1-4020-6488-3.
Full text1969-, Janssen Dennis, and Pinkster Iris 1972-, eds. Integrated test design and automation: Using the test frame method. Reading, Mass: Addison-Wesley, 2001.
Find full textM, Rudnick Elizabeth, ed. Genetic algorithms for VLSI design, layout & test automation. Upper Saddle River, NJ: Prentice Hall PTR, 1999.
Find full textLi, Kanglin. Effective GUI test automation: Developing an automated GUI testing tool. San Francisco, Calif: SYBEX, 2005.
Find full textEffective GUI test automation: Developing an automated GUI testing tool. San Francisco, Calif: SYBEX, 2005.
Find full textMengqi, Wu, ed. Effective software test automation: Developing an automated software testing tool. San Francisco, Calif: SYBEX, 2004.
Find full textChakrabarty, Krishnendu, ed. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/978-1-4757-6527-4.
Full textChakrabarty, Krishnendu. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. Boston, MA: Springer US, 2002.
Find full textFrance), DATE (1998 Paris. Design, automation, and test in Europe: Proceedings, February 23-26, 1998, Paris, France. Los Alamitos, CA: IEEE Computer Society, 1998.
Find full textGermany), DATE (2006 Munich. Design, automation, and test in Europe: Proceedings, Munich, Germany, March 6-10, 2006. [S.l.]: IEEE, 2006.
Find full textDesign, Automation and Test in Europe Conference and Exhibition (2005 Munich Germany). Design, Automation, and Test in Europe: Proceedings : Munich, Germany, March 7-11, 2005, sponsored by European Design and Automation Association ... [et al.]. Los Alamitos, Calif: IEEE Computer Society, 2005.
Find full textDesign, Automation and Test in Europe Conference and Exhibition (2007 Nice France). 2007 Design, Automation & Test in Europe Conference & Exhibition: Nice, France, 16-20 April 2007. Piscataway, NJ: IEEE, 2007.
Find full textDesign, Automation, and Test in Europe Conference and Exhibition (1999 Munich, Germany). Design, Automation, and Test in Europe Conference and Exhibition: Proceedings, March 9-12, 1999, Munich, Germany. Edited by Borrione Dominique, Ernst Rolf, EDA Association, and IEEE Computer Society. Los Alamitos, CA: IEEE Computer Society, 1999.
Find full textInternational Symposium on VLSI Design, Automation, and Test (2007 Hsin-chu shih, Taiwan). 2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT): April 25-27, 2007, Hsinchu, Taiwan. Hsinchu, Taiwan: ITRI, 2007.
Find full textZhuang jia che liang fu za xi tong gu zhang zhen duan fang fa: Complex system fault diagnoses of armored vehicle. Beijing Shi: Guo fang gong ye chu ban she, 2009.
Find full textDesign, Automation, and Test in Europe Conference and Exhibition (2001 Munich, Germany). Design, Automation, and Test in Europe Conference and Exhibition 2001: Proceedings : Munich, Germany, March 13-16, 2001. Edited by Nebel Wolfgang, Jerraya Ahmed A, EDA Association, IEEE Computer Society, and ACM Special Interest Group on Design Automation. Los Alamitos, California: IEEE Computer Society, 2001.
Find full textDesign, Automation, and Test in Europe Conference and Exhibition (2000 Paris, France). Design, Automation, and Test in Europe Conference and Exhibition 2000: Proceedings, Paris, France, March 27-30, 2000. Edited by Marwedel Peter and Bolsens Ivo. Los Alamitos, Calif: IEEE Computer Society, 2000.
Find full textAssociation, EDA, and IEEE Computer Society, eds. Design, Automation, and Test in Europe Conference and Exhibition 2002: Proceedings : Paris, France, March 4-8, 2002. Los Alamitos, Calif: IEEE Computer Society, 2002.
Find full textAssociation, EDA, and IEEE Computer Society, eds. Design, Automation, and Test in Europe Conference and Exhibition 2003: Proceedings : Munich, Germany, March 3-7, 2003. Los Alamitos, Calif: IEEE Computer Society, 2003.
Find full textO, Agnew Brandy, United States. Office of Aviation Medicine., and Civil Aeromedical Institute, eds. The effects of previous computer experience on air traffic-selection and training (AT-SAT) test performance: Final report. Washington, D.C: U.S. Dept. of Transportation, Federal Aviation Administration, Office of Aviation Medicine, 2000.
Find full textInternational Symposium on VLSI Design, Automation, and Test (2006 Hsin-chu shih, Taiwan). International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers : April 26-28, 2006 : Hsinchu, Taiwan. Hsinchu, Taiwan: Industrial Technology Research Group, 2006.
Find full textYang, Bo-Suk. Introduction to intelligent machine fault diagnosis and prognosis. New York: Nova Science Publishers, 2009.
Find full text.NET Test Automation Recipes. Apress, 2006. http://dx.doi.org/10.1007/978-1-4302-0163-2.
Full textGraham, Dorothy, and Mark Fewster. Software Test Automation (ACM Press). Addison-Wesley Professional, 1999.
Find full textPosey, Bruce A., and Daniel J. Mosley. Just Enough Software Test Automation. Prentice Hall PTR, 2002.
Find full textLauwereins, Rudy, and Jan Madsen. Design, Automation, and Test in Europe. Springer, 2008.
Find full textGraham, Dorothy, and Seretta Gamba. A Journey through Test Automation Patterns: One team’s adventures with the Test Automation Patterns wiki. CreateSpace Independent Publishing Platform, 2018.
Find full textLatvakoski, Juhani. Integration test automation of embedded communication software. 1997.
Find full textLaung-Terng, Wang, Chang Yao-Wen, and Cheng Kwang-Ting 1961-, eds. Electronic design automation: Synthesis, verification, and test. Burlington, MA: Morgan Kaufmann Publishers/Elsevier, 2008.
Find full textMcCaffrey, James. .NET Test Automation Recipes: A Problem-Solution Approach. Apress, 2012.
Find full textMcCaffrey, James. .NET Test Automation Recipes: A Problem-Solution Approach. Apress, 2016.
Find full textGarg, Mr Navneesh, and Mr Vaibhav Mittal. Test Automation using Selenium Webdriver 3.0 with C#. Adactin Group Pty Ltd, 2018.
Find full textRudnick, Elizabeth, and Pinaki Mazumder. Genetic Algorithms for Vlsi Design, Layout & Test Automation. Prentice Hall PTR, 1998.
Find full textRudnick, Elizabeth, and Pinaki Mazumder. Genetic Algorithms for Vlsi Design, Layout & Test Automation. Prentice Hall PTR, 1998.
Find full textFrance) DATE (1998 : Paris. 1998 Design Automation and Test in Europe, Date '98. Institute of Electrical & Electronics Enginee, 1998.
Find full textEdward, Flinn, and Defense Marketing Services inc, eds. Military automatic test equipment: Market study and forecast. Greenwich, CT., U.S.A. (P.O. Box 4585, Greenwich 06830): Defense Marketing Services, 1985.
Find full textWu, Mengqi, and Kanglin Li. Effective Software Test Automation: Developing an Automated Software Testing Tool. Wiley & Sons, Incorporated, John, 2006.
Find full textAutomation, and Test in Europe Conference and Exhibition (2004 :. Paris France) Design. 2004 Design, Automation And Test In Europe Conference Date 2004. Institute of Electrical & Electronics Enginee, 2004.
Find full text