Relevant bibliographies by topics / Testabilità

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
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Academic literature on the topic 'Testabilità'

Author: Grafiati
Published: 10 March 2023

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Journal articles on the topic "Testabilità"

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Wang, Yi Chen, and Feng Xie. "Research on Software Testability Requirement Analysis Method." Advanced Materials Research 760-762 (September 2013): 1084–88. http://dx.doi.org/10.4028/www.scientific.net/amr.760-762.1084.

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Software testability parameter system was constructed by parameters that extracted from software testability influence factors. It established relationships between these parameters and software testability through a target layer which may reflect software inner attributes. In order to carry out the design of software testability in engineering ways, principles of software testability requirements and software testability requirement factor were presented in this article, as well as analysis method for software testability requirement. This method considered software characteristics and software test types as selection criteria to specify the target layer, and then tried to acquire software testability requirement factors with the help of software testability parameter architecture built before. Next, software testability requirement could be obtained by following the steps of software requirement engineering.
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Liu, Ye, and Yi Chen Wang. "The Study of the Requirement of Software Testability Based on Causal Analysis." Applied Mechanics and Materials 513-517 (February 2014): 1944–50. http://dx.doi.org/10.4028/www.scientific.net/amm.513-517.1944.

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Requirements for software testability is an important basis of design for software design of testability. During the software-testability-design work, a series of software design for testability measures must be taken to make software testing stage less detours, and formulation and implementation of requirements for software testing is an important element. This paper introduces a kind of develop-method of requirements for software testability. According as causal analysis, basing on manifestations of software testability, the method develops appropriate requirements for software testability for software system. Preface The software testability is referred to as a kind of attribute that aims to facilitate the application test and improve the location and correction of software error [. To a certain extent, the software testability can solve some problems facing the software test, such as helping the designer to develop the software that is easier to test, so as to reduce the test difficulty, save more test time and optimize the resource allocation. Therefore, the software testability has stood out as quite an important factor that has a great effect on the cost, time and labor allocation of software test, which are also closely related to the quality of software engineering [. Since the 1990s, the software testability has been widely concerned by the scholars both at home and abroad. According to the relevant literatures collected, the general research direction has been toward the measurement and analysis of the software testability [. It should be noted that a well developed scheme of the requirement of software testability can not only enhance the testability of the target software, but also serve as the evaluation criterion of the testability, which means that it will have special reference to the improvement on the software test [. Based on the casual analysis, this paper has sought to provide a whole set of the requirement of software testability and come up with a real case so as to approach the design issues of the software testability [. 1 The requirement of software testability
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Stȩpniak, Czesław. "Towards a notion of testability." Applications of Mathematics 37, no. 4 (1992): 249–55. http://dx.doi.org/10.21136/am.1992.104507.

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Lv, Jian Wei, Zong Ren Xie, and Yi Fan Xu. "A Weighted Optimization Allocation Based on Interval Distribution of Equipment Testability Indicators." Applied Mechanics and Materials 741 (March 2015): 795–800. http://dx.doi.org/10.4028/www.scientific.net/amm.741.795.

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On the basis of conception, the characteristics of current testability indicators allocation methods are analyzed. Due to their shortages, we establish a weighted allocation method based on upper and lower limitation to equipment testability indicators and present the initial value of unit’s testability indicators, upper and lower limitation, adjust means to initial value and whole calculation steps. The illustrated example shows that, by this allocation method, dependence to one’s experience can be decrease to the lowest limitation, control to unit testability indicators’ range is perfect, and we can assign the lowest unit testability indicators’ and their combination to realize system’s testability indicators.
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Khan, Mohammad, M. A. Khanam, and M. H. Khan. "Requirement Based Testability Estimation Model of Object Oriented Software." Oriental journal of computer science and technology 10, no. 04 (October 17, 2017): 793–801. http://dx.doi.org/10.13005/ojcst/10.04.14.

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To measure testability before the actual development starts will play a crucial role to the developer, designers and end users as well. Early measurement of testability, especially in early requirement stage to assist the developer for the further development process, and will also assures us to produce and deliver the high quality requirement that can surely reduce the overall cost and improves the quality of development process. Taking view of this fact, this paper identifies testability estimation factors namely understandability and modifiability and establishes the correlation among testability, understandability and modifiability. Further, a model is developed to quantify software testability in requirement phase and named as Requirement Testability Model of Object Oriented Software-RTMOOS. Furthermore, the correlation of Testability with these factors has been tested and justified with the help of statistical measures.
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Sober, Elliott. "Testability." Proceedings and Addresses of the American Philosophical Association 73, no. 2 (November 1999): 47. http://dx.doi.org/10.2307/3131087.

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Wang, Chao, Jing Qiu, Guan-jun Liu, and Yong Zhang. "Testability demonstration with component level data from virtual and physical tests." Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science 229, no. 2 (May 8, 2014): 265–72. http://dx.doi.org/10.1177/0954406214532909.

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Testability demonstration plays an important role in assuring the testability capability, which can decrease the fault diagnosis time and accelerate the maintenance actions. However, testability demonstration test with classical planning method has the problems of large fault sample size, high test cost, and long test period. A new testability demonstration planning method is proposed, which takes the component level data from both virtual and physical demonstration tests as prior information. Owing to the limitations of the testability modeling technology and relevant programming tools, the virtual testability prototype of the system level cannot be established and the virtual testability test data is not totally credible. So a data conversion method based on the information entropy theory is proposed to convert the component level virtual and physical test data into equivalent system test data, in which the data credibility is taken into consideration. The equivalent system test data is then used to get the prior probability density function of the testability indexes with an empirical Bayesian method. Then, a testability demonstration planning method of Bayesian posterior risk criteria is presented. Finally, the fault detection rate demonstration tests of a flight control system and a heating controller are taken as examples to verify the proposed method. The results show that the introduction of prior test data can effectively decrease the sample size and the credibility of the virtual testability test data can affect the test plan.
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Cupertino, César Medeiros, and Paulo Roberto Barbosa Lustosa. "Ohlson Model Testability: Empirical Tests Findings." Brazilian Business Review 1, no. 2 (June 30, 2004): 141–55. http://dx.doi.org/10.15728/bbr.2004.1.2.5.

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Di, Peng, Xuan Wang, Tong Chen, and Bin Hu. "Multisensor Data Fusion in Testability Evaluation of Equipment." Mathematical Problems in Engineering 2020 (November 30, 2020): 1–16. http://dx.doi.org/10.1155/2020/7821070.

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The multisensor data fusion method has been extensively utilized in many practical applications involving testability evaluation. Due to the flexibility and effectiveness of Dempster–Shafer evidence theory in modeling and processing uncertain information, this theory has been widely used in various fields of multisensor data fusion method. However, it may lead to wrong results when fusing conflicting multisensor data. In order to deal with this problem, a testability evaluation method of equipment based on multisensor data fusion method is proposed. First, a novel multisensor data fusion method, based on the improvement of Dempster–Shafer evidence theory via the Lance distance and the belief entropy, is proposed. Next, based on the analysis of testability multisensor data, such as testability virtual test data, testability test data of replaceable unit, and testability growth test data, the corresponding prior distribution conversion schemes of testability multisensor data are formulated according to their different characteristics. Finally, the testability evaluation method of equipment based on the multisensor data fusion method is proposed. The result of experiment illustrated that the proposed method is feasible and effective in handling the conflicting evidence; besides, the accuracy of fusion of the proposed method is higher and the result of evaluation is more reliable than other testability evaluation methods, which shows that the basic probability assignment of the true target is 94.71%.
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Wang, Xiu Fang, Bin Chen, Jin Ye Peng, and Wei Qi. "Research on Modeling and Analysis of Testability for Complex Electronic System." Applied Mechanics and Materials 701-702 (December 2014): 236–40. http://dx.doi.org/10.4028/www.scientific.net/amm.701-702.236.

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Due to the lack of effective modeling and analysis methods for testability of complex electronic system, a testability index model is established to resolve this problem. First of all, the existing testability demonstration test and evaluation method are analyzed. On this basis, testability indexes statistical models based on the binomial distribution, or Beta distribution and F distribution are established. What’s more, the relationship and principle between the fault detection or isolation data and the confidence level are analyzed in these models. Finally, the result of simulation shows that these models are practical and effective, which provides a new way of effectively analyzing and evaluating testability indexes of complex electronic system.
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Dissertations / Theses on the topic "Testabilità"

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Zhou, Lixin. "Testability Design and Testability Analysis of a Cube Calculus Machine." PDXScholar, 1995. https://pdxscholar.library.pdx.edu/open_access_etds/4911.

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Cube Calculus is an algebraic model popular used to process and minimize Boolean functions. Cube Calculus operations are widely used in logic optimization, logic synthesis, computer image processing and recognition, machine learning, and other newly developing applications which require massive logic operations. Cube calculus operations can be implemented on conventional general-purpose computers by using the appropriate "model" and software which manipulates this model. The price that we pay for this software based approach is severe speed degradation which has made the implementation of several high-level formal systems impractical. A cube calculus machine which has a special data path designed to execute multiplevalued input, and multiple-valued output cube calculus operations is presented in this thesis. This cube calculus machine can execute cube calculus operations 10-25 times faster than the software approach. For the purpose of ensuring the manufacturing testability of the cube calculus machine, emphasize has been put on the testability design of the cube calculus machine. Testability design and testability analysis of the iterative logic unit of the cube calculus machine was accomplished. Testability design and testability analysis methods of the cube calculus machine are weli discussed in this thesis. Full-scan testability design method was used in the testability design and analysis. Using the single stuck-at fault model, a 98.30% test coverage of the cube calculus machine was achieved. A Povel testability design and testability analysis approach is also presented in this thesis.
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Rabhi, Issam. "Testabilité des services Web." Phd thesis, Université Blaise Pascal - Clermont-Ferrand II, 2012. http://tel.archives-ouvertes.fr/tel-00738936.

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Cette thèse s'est attaquée sous diverses formes au test automatique des services Web : une première partie est consacrée au test fonctionnel à travers le test de robustesse. La seconde partie étend les travaux précédents pour le test de propriétés non fonctionnelles, telles que les propriétés de testabilité et de sécurité. Nous avons abordé ces problématiques à la fois d'un point de vue théorique et pratique. Nous avons pour cela proposé une nouvelle méthode de test automatique de robustesse des services Web non composés, à savoir les services Web persistants (stateful) et ceux non persistants. Cette méthode consiste à évaluer la robustesse d'un service Web par rapport aux opérations déclarées dans sa description WSDL, en examinant les réponses reçues lorsque ces opérations sont invoquées avec des aléas et en prenant en compte l'environnement SOAP. Les services Web persistants sont modélisés grâce aux systèmes symboliques. Notre méthode de test de robustesse dédiée aux services Web persistants consiste à compléter la spécification du service Web afin de décrire l'ensemble des comportements corrects et incorrects. Puis, en utilisant cette spécification complétée, les services Web sont testés en y intégrant des aléas. Un verdict est ensuite rendu. Nous avons aussi réalisé une étude sur la testabilité des services Web composés avec le langage BPEL. Nous avons décrit précisément les problèmes liés à l'observabilité qui réduisent la faisabilité du test de services Web. Par conséquent, nous avons évalué des facteurs de la testabilité et proposé des solutions afin d'améliorer cette dernière. Pour cela, nous avons proposé une approche permettant, en premier lieu, de transformer la spécification ABPEL en STS. Cette transformation consiste à convertir successivement et de façon récursive chaque activité structurée en un graphe de sous-activités. Ensuite, nous avons proposé des algorithmes d'améliorations permettant de réduire ces problèmes de testabilité. Finalement, nous avons présenté une méthode de test de sécurité des services Web persistants. Cette dernière consiste à évaluer quelques propriétés de sécurité, tel que l'authentification, l'autorisation et la disponibilité, grâce à un ensemble de règles. Ces règles ont été crée, avec le langage formel Nomad. Cette méthodologie de test consiste d'abord à transformer ces règles en objectifs de test en se basant sur la description WSDL, ensuite à compléter, en parallèle, la spécification du service Web persistant et enfin à effectuer le produit synchronisé afin de générer les cas de test.
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Karel, Amit. "Comparative Study of FinFET and FDSOI Nanometric Technologies Based on Manufacturing Defect Testability." Thesis, Montpellier, 2017. http://www.theses.fr/2017MONTS084/document.

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Deux innovations en matière de procédés technologiques des semi-conducteurs sont des alternatives à la technologie traditionnelle des transistors MOS (« Metal-Oxide-Semiconductor ») « Bulk » planaires : d’une part le silicium totalement déserté sur isolant (FDSOI – « Fully Depleted Silicon on Insulator ») et d’autre part les transistors à effet de champ à aileron (FinFET – « Fin Field Effect Transistor »). En effet, alors que la technologie « Bulk » arrive à ses limites de miniaturisation des composants et systèmes, notamment du fait de l’effet de canal court, ces deux technologies présentent des propriétés prometteuses pour poursuivre cette réduction des dimensions, grâce à un meilleur contrôle électrostatique de la grille sur le canal du transistor. La technologie FDSOI est, comme l’historique « Bulk », une technologie MOS planaire, ce qui la place naturellement davantage dans la continuité technologique que les ailerons verticaux des transistors FinFETs. La compétition entre ces deux technologies est rude et de nombreuses études publiées dans la littérature comparent ces technologies en termes de performance en vitesse de fonctionnement, de consommation, de coût, etc. Néanmoins, aucune étude ne s’était encore penchée sur leurs propriétés respectives en termes de testabilité ; pourtant l’impact de défauts sur les circuits réalisés en technologies FDSOI et FinFET est susceptible d’être significativement de celui induit par des défauts similaires sur des circuits planaires MOS.Le travail présenté dans cette thèse se concentre sur la conception de circuits d’étude similaires dans chacune des trois technologies et l’analyse comparative de leur comportement électrique sous l’effet d’un même défaut. Les défauts considérés dans notre étude sont les courts-circuits résistifs inter-portes, court-circuit résistif à la masse (GND), court-circuit résistif à l’alimentation (VDD), et circuits ouverts résistifs. La détectabilité des défauts est évaluée pour le test logique statique et le test dynamique en « délai ». Des simulations HSPICE et Cadence SPECTRE ont été effectuées en faisant varier la valeur de la résistance du défaut et le concept de résistance critique est utilisé afin de comparer la plage de détectabilité du défaut dans les différentes technologies. Les conditions optimales de polarisation du substrat (« body-biasing »), de tension d’alimentation et de température en vue d’obtenir la meilleure couverture de défauts possible sont déterminées pour chaque type de défaut. Un modèle analytique, basé sur la résistance équivalente des réseaux de transistors N et P actifs (« ON-resistance »), est proposé pour les courts-circuits résistifs, et permet d’évaluer la valeur de la résistance critique sans effectuer de simulation de fautes. Les propriétés en termes de testabilité sont également établies en tenant compte des variations de procédés, par des simulations Monte-Carlo réalisées aussi bien pour les dispositifs à tension de seuil nominale (« Regular-VT devices » : FDSOI-RVT et Bulk-LR) que pour les dispositifs à tension de seuil basse (« Low-VT devices » : FDSOI-LVT et Bulk-LL) disponibles pour les technologies 28 nm Bulk et FDSOI
Fully Depleted Silicon on Insulator (FDSOI) and Fin Field Effect Transistor (FinFET) are new innovations in silicon process technologies that are likely alternatives to traditional planar Bulk transistors due to their respective promising ways of tackling the scalability issues with better short channel characteristics. Both these technologies are aiming in particular at regaining a better electrostatic control by the gate over the channel of the transistor. FDSOI is a planar MOS technology and as a result it is much more in continuity with planar Bulk as compared to the vertical FinFET transistors. The competition between these two technologies is fierce and many studies have been reported in the literature to compare these technologies in terms of speed performance, power consumption, cost, etc. However, these studies have not yet focused on their testability properties while the impact of defects on circuits implemented in FDSOI and FinFET technologies might be significantly different from the impact of similar defects in planar MOS circuit.The work of this thesis is focused on implementing similar design in each technology and comparing the electrical behavior of the circuit with the same defect. The defects that are considered for our investigation are inter-gate resistive bridging, resistive short to ground terminal (GND), resistive short to power supply (VDD) and resistive open defects. Defect detectability is evaluated in the context of either logic or delay based test. HSPICE and Cadence SPECTRE simulations are performed varying the value of the defect resistance and the concept of critical resistance is used to compare the defect detectability range in different technologies. The optimal body-biasing, supply voltage and temperature settings to achieve the maximum defect coverage are determined for these defect types. An analytical analysis is proposed for short defects based on the ON-resistance of P and N networks, which permits to evaluate the value of the critical resistance without performing fault simulations. Testability properties are also established under the presence of process variations based on Monte-Carlo simulations for both Regular-VT devices (FDSOI-RVT and Bulk-LR) and Low-VT devices (FDSOI-LVT and Bulk-LL) available for 28nm Bulk and FDSOI technologies
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Lindström, Birgitta. "Methods for Increasing Software Testability." Thesis, University of Skövde, Department of Computer Science, 2000. http://urn.kb.se/resolve?urn=urn:nbn:se:his:diva-494.

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We present a survey over current methods for improving software testability. It is a well-known fact that the cost for testing of software takes 50\% or more of the development costs. Hence, methods to improve testability, i.e. reduce the effort required for testing, have a potential to decrease the development costs. The test effort needed to reach a level of sufficient confidence for the system is dependent on the number of possible test cases, i.e., the number of possible combinations of system state and event sequences. Each such combination results in an execution order. Properties of the execution environment that affect the number of possible execution orders can therefore also affect testability. Which execution orders that are possible and not are dependent of processor scheduling and concurrency control policies. Current methods for improving testability are investigated and their properties with respect to processor scheduling and concurrency control analyzed. Especially, their impact on the number of possible test cases is discussed. The survey revealed that (i) there are few methods which explicitly address testability, and (ii) methods that concern the execution environment suggest a time-triggered design. It is previously shown that the effort to test an event-triggered real-time system is inherently higher than testing a time-triggered real-time system. Due to the dynamic nature of the event-triggered system the number of possible execution orders is high. A time-triggered design is, however, not always suitable. The survey reveals an open research area for methods concerning improvement of testability in event-triggered systems. Moreover, a survey and analysis of processor scheduling and concurrency control properties and their effect on testability is presented. Methods are classified into different categories that are shown to separate software into different levels of testability. These categories can form a basis of taxonomy for testability. Such taxonomy has a potential to be used by system designers and enable them to perform informed trade-off decisions.

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Shi, Cheng. "High-level design for testability." Thesis, University of Southampton, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.336135.

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Bhattacharyya, Arnab. "Testability of linear-invariant properties." Thesis, Massachusetts Institute of Technology, 2011. http://hdl.handle.net/1721.1/68435.

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Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2011.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 75-80).
Property Testing is the study of super-efficient algorithms that solve "approximate decision problems" with high probability. More precisely, given a property P, a testing algorithm for P is a randomized algorithm that makes a small number of queries into its input and distinguishes between whether the input satisfies P or whether the input is "far" from satisfying P, where "farness" of an object from P is measured by the minimum fraction of places in its representation that needs to be modified in order for it to satisfy P. Property testing and ideas arising from it have had significant impact on complexity theory, pseudorandomness, coding theory, computational learning theory, and extremal combinatorics. In the history of the area, a particularly important role has been played by linearinvariant properties, i.e., properties of Boolean functions on the hypercube which are closed under linear transformations of the domain. Examples of such properties include linearity, homogeneousness, Reed-Muller codes, and Fourier sparsity. In this thesis, we describe a framework that can lead to a unified analysis of the testability of all linear-invariant properties, drawing on techniques from additive combinatorics and from graph theory. We also show the first nontrivial lowerbound for the query complexity of a natural testable linear-invariant property.
by Arnab Bhattacharyya.
Ph.D.
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Hock, Joel M. (Joel Michael) 1977. "Exposing testability in GUI objects." Thesis, Massachusetts Institute of Technology, 2000. http://hdl.handle.net/1721.1/86608.

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Thesis (M.Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
Includes bibliographical references (leaf 28).
by Joel M. Hock.
M.Eng.and S.B.
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Malla, Prakash, and Bhupendra Gurung. "Adaptation of Software Testability Concept for Test Suite Generation : A systematic review." Thesis, Blekinge Tekniska Högskola, Sektionen för datavetenskap och kommunikation, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:bth-4322.

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Context: Software testability, which is the degree to which a software artifact facilitates process of testing, is not only the indication of the test process effectiveness but also gives the new perspective on code development. Since more than fifty percent of total software development costs is related to testing process activities, Software testability has always been the improving area in software domain so that we can make the software development process effective with respect to test cases writing and fault detection process. Objectives: The research though this thesis will have the objective of proposing a conceptual framework considering the testability issues for the simpler test suite generation and facilitating the concerned persons with better effectiveness of testing. We investigate the testability factors and testability metrics basically with the help of the systematic literature review and the proposed framework’s feasibility is evaluated with case study. Methods: Initially, we conduct the literature review to get broad knowledge on this domain as well for the key documents. Then study starts with the systematic literature review process guided by the review protocol to collect the testability factors and measurements. The framework is validated with the case study. The research documents are included from highly trusted e-database including Compendex, Inspec, IEEE Xplore, ACM Digital Library, Springer Link and Scopus. Altogether 36 primary documents are included for the study and results are extracted. Results: From the results of systematic literature review, Software testability factors and associated measurements are found and the construction of framework for simple test generation as guidelines evaluate with case study. To make the test suite generation simpler, we propped a framework based on the FTA concepts and breakdown of high level testability factors to its simpler form of measureable level. Conclusions: Numbers of different software testability factors are presented in different researches in different perspectives. We collect important testability factors and associated measurement methods and we concluded the effect of testability in simpler test suite generation with the help of framework evaluated by case study.
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Kito, Nobutaka, and Naofumi Takagi. "Level-Testability of Multi-operand Adders." IEEE, 2008. http://hdl.handle.net/2237/12025.

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Lindström, Birgitta. "Testability of Dynamic Real-Time Systems." Doctoral thesis, Linköpings universitet, ESLAB - Laboratoriet för inbyggda system, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-16486.

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This dissertation concerns testability of event-triggered real-time systems. Real-time systems are known to be hard to test because they are required to function correct both with respect to what the system does and when it does it. An event-triggered real-time system is directly controlled by the events that occur in the environment, as opposed to a time-triggered system, which behavior with respect to when the system does something is constrained, and therefore more predictable. The focus in this dissertation is the behavior in the time domain and it is shown how testability is affected by some factors when the system is tested for timeliness. This dissertation presents a survey of research that focuses on software testability and testability of real-time systems. The survey motivates both the view of testability taken in this dissertation and the metric that is chosen to measure testability in an experiment. We define a method to generate sets of traces from a model by using a meta algorithm on top of a model checker. Defining such a method is a necessary step to perform the experiment. However, the trace sets generated by this method can also be used by test strategies that are based on orderings, for example execution orders. An experimental study is presented in detail. The experiment investigates how testability of an event-triggered real-time system is affected by some constraining properties of the execution environment. The experiment investigates the effect on testability from three different constraints regarding preemptions, observations and process instances. All of these constraints were claimed in previous work to be significant factors for the level of testability. Our results support the claim for the first two of the constraints while the third constraint shows no impact on the level of testability. Finally, this dissertation discusses the effect on the event-triggered semantics when the constraints are applied on the execution environment. The result from this discussion is that the first two constraints do not change the semantics while the third one does. This result indicates that a constraint on the number of process instances might be less useful for some event-triggered real-time systems.
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Books on the topic "Testabilità"

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Weyerer, Manfred. Testability of electronic circuits. Munich: Carl Hanser Verlag, 1992.

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United States. Environmental Protection Agency. Transportation and Climate Division. OBD readiness testability issues. 2nd ed. Washington, D.C.]: Transportation and Climate Division, Office of Transportation and Air Quality, U.S. Environmental Protection Agency, 2012.

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Weyerer, Manfred. Testability of electronic circuits. Munich: C. Hanser, 1991.

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Tsui, Frank F. LSI/VLSI testability design. New York: McGraw-Hill, 1987.

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M, Voas Jeffrey, ed. Software assessment: Reliability, safety, testability. New York: Wiley, 1995.

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Beenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2365-9.

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Digital circuit testing and testability. San Diego: Academic Press, 1997.

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Logic testing and design for testability. Cambridge, Mass: MIT Press, 1985.

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Huhn, Sebastian, and Rolf Drechsler. Design for Testability, Debug and Reliability. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-69209-4.

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Engineering design: Reliability, maintainability, and testability. Blue Ridge Summit, PA: TAB Professional and Reference Books, 1988.

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Book chapters on the topic "Testabilità"

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Chen, Tinghuai. "Testability Design via Testability Measures." In Fault Diagnosis and Fault Tolerance, 95–118. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-77179-8_3.

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Sayil, Selahattin. "Testability Design." In Contactless VLSI Measurement and Testing Techniques, 9–15. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-69673-7_2.

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Daggett, Mark E. "Improving Testability." In Expert JavaScript, 199–218. Berkeley, CA: Apress, 2013. http://dx.doi.org/10.1007/978-1-4302-6098-1_10.

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Turino, Jon L. "Testability Busses." In Design to Test, 225–49. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5_10.

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Turino, Jon L. "Testability Documentation." In Design to Test, 283–90. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5_14.

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Chakradhar, Srimat T., Vishwani D. Agrawal, and Michael L. Bushneil. "Polynomial-time Testability." In Neural Models and Algorithms for Digital Testing, 123–39. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3958-2_11.

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Kurup, Pran, and Taher Abbasi. "Design for Testability." In Logic Synthesis Using Synopsys®, 197–241. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4757-2370-0_6.

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Shapere, Dudley. "Testability and Empiricism." In The Reality of the Unobservable, 153–64. Dordrecht: Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-015-9391-5_11.

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Rülling, Wolfgang. "Design for Testability." In The Electronic Design Automation Handbook, 339–81. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-0-387-73543-6_15.

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Gardiner, Stewart N. "Designing for Testability." In Testing Safety-Related Software, 59–82. London: Springer London, 1999. http://dx.doi.org/10.1007/978-1-4471-3277-6_3.

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Conference papers on the topic "Testabilità"

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Pardo Garcia Morelli, Camila, Vânia De Oliveira Neves, and Luciana Salgado. "Investigando Comunicabilidade e Testabilidade com a ferramenta Signifying APIs." In Computer on the Beach. São José: Universidade do Vale do Itajaí, 2021. http://dx.doi.org/10.14210/cotb.v12.p443-450.

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Abstract:
Given the diversity of information systems today, communicationbetween services requires that APIs be well designed and understoodby both services producers and consumers. Poorly documentedAPIs lead to misunderstandings by developers and testersteams who end up designing ineffective test cases. As a result, theymay produce software with low quality and avoidable errors. Thisstudy investigates the ability of the SigniFYIng APIs tool to supportthe testability of the applications consuming APIs. In this paper, weproposed a process to support APIs’ testability with the SigniFYIngAPIs tool. We validated the process with a real case study basedon two Brazilian federal government APIs: the leniency agreementAPI and the federal servants API. As a result, it was possible todevelop better test cases for the chosen APIs, bringing evidencethat the proposed process can support designing more suitable testcases for APIs and improving the testability of the software to beproduced.
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Flynn, D. W. "Modular bus design supports on-chip testability." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950548.

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Grist, D. A. "The cost of C-testability in terms of silicon area and design complexity." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950549.

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Russell, G. "Teaching of testing techniques: the why, what and how?" In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950550.

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Wilkins, B. R. "Stretching the boundary: mixed-signals and P1149.4." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950551.

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Robson, M. "Digital techniques for testing analogue functions." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950552.

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Moorehead, J. D. "Testability aspects of a DSP based image processing system." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950553.

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Cooper, R. "The development and application of intelligent self test concepts in reconfigurable modular avionic systems." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950554.

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O'Dare, M. J. "System design for test using a genetically based hierarchical ATPG system." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950555.

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Maunder, C. "Design for test standards - where are they taking us?" In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950547.

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Reports on the topic "Testabilità"

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Simpson, William R., John H. Bailey, Katherine B. Barto, and Eugene Esker. Prediction and Analysis of Testability Attributes: Organizational-Level Testability Prediction. Fort Belvoir, VA: Defense Technical Information Center, February 1986. http://dx.doi.org/10.21236/ada167957.

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Zhou, Lixin. Testability Design and Testability Analysis of a Cube Calculus Machine. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.6787.

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McNamer, Michael G., and Walter W. Weber. Chip to System Testability. Fort Belvoir, VA: Defense Technical Information Center, October 1997. http://dx.doi.org/10.21236/ada342380.

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Debany, Jr, and Warren H. Digital Logic Testing and Testability. Fort Belvoir, VA: Defense Technical Information Center, February 1991. http://dx.doi.org/10.21236/ada234123.

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Flater, David, and KC Morris. Testability of product data management interfaces. Gaithersburg, MD: National Institute of Standards and Technology, 1999. http://dx.doi.org/10.6028/nist.ir.6429.

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Press, Ronald E., Michael E. Keller, and Gregory J. Maguire. Testability Design Rating System: Analytical Procedure. Volume 2. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada254334.

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Sarabi, Andisheh. Logic Synthesis with High Testability for Cellular Arrays. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.6638.

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Santos, Andres, Ivan A. Canay, and Azeem M. Shaikh. On the testability of identification in some nonparametric models with endogeneity. Cemmap, July 2012. http://dx.doi.org/10.1920/wp.cem.2012.1812.

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Elks, Carl R., Ashraf Tantawy, Rick Hite, Smitha Gauthem, and Athira Jayakumar. Defining and Characterizing Methods, Tools, and Computing Resources to Support Pseudo Exhaustive Testability of Software Based I&C Devices. Office of Scientific and Technical Information (OSTI), September 2018. http://dx.doi.org/10.2172/1495188.

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