Academic literature on the topic 'Testability'
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Journal articles on the topic "Testability"
Wang, Yi Chen, and Feng Xie. "Research on Software Testability Requirement Analysis Method." Advanced Materials Research 760-762 (September 2013): 1084–88. http://dx.doi.org/10.4028/www.scientific.net/amr.760-762.1084.
Full textSober, Elliott. "Testability." Proceedings and Addresses of the American Philosophical Association 73, no. 2 (November 1999): 47. http://dx.doi.org/10.2307/3131087.
Full textLiu, Ye, and Yi Chen Wang. "The Study of the Requirement of Software Testability Based on Causal Analysis." Applied Mechanics and Materials 513-517 (February 2014): 1944–50. http://dx.doi.org/10.4028/www.scientific.net/amm.513-517.1944.
Full textTing-Hua Chen and M. A. Breuer. "Automatic Design for Testability Via Testability Measures." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 4, no. 1 (January 1985): 3–11. http://dx.doi.org/10.1109/tcad.1985.1270093.
Full textLv, Jian Wei, Zong Ren Xie, and Yi Fan Xu. "A Weighted Optimization Allocation Based on Interval Distribution of Equipment Testability Indicators." Applied Mechanics and Materials 741 (March 2015): 795–800. http://dx.doi.org/10.4028/www.scientific.net/amm.741.795.
Full textKhan, Mohammad, M. A. Khanam, and M. H. Khan. "Requirement Based Testability Estimation Model of Object Oriented Software." Oriental journal of computer science and technology 10, no. 04 (October 17, 2017): 793–801. http://dx.doi.org/10.13005/ojcst/10.04.14.
Full textWang, Chao, Jing Qiu, Guan-jun Liu, and Yong Zhang. "Testability demonstration with component level data from virtual and physical tests." Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science 229, no. 2 (May 8, 2014): 265–72. http://dx.doi.org/10.1177/0954406214532909.
Full textDi, Peng, Xuan Wang, Tong Chen, and Bin Hu. "Multisensor Data Fusion in Testability Evaluation of Equipment." Mathematical Problems in Engineering 2020 (November 30, 2020): 1–16. http://dx.doi.org/10.1155/2020/7821070.
Full textHarman, M., Lin Hu, R. Hierons, J. Wegener, H. Sthamer, A. Baresel, and M. Roper. "Testability transformation." IEEE Transactions on Software Engineering 30, no. 1 (January 2004): 3–16. http://dx.doi.org/10.1109/tse.2004.1265732.
Full textNagle, H. T., R. R. Fritzemeier, J. E. Van Well, and M. G. McNamer. "Microprocessor testability." IEEE Transactions on Industrial Electronics 36, no. 2 (May 1989): 151–63. http://dx.doi.org/10.1109/41.19064.
Full textDissertations / Theses on the topic "Testability"
Zhou, Lixin. "Testability Design and Testability Analysis of a Cube Calculus Machine." PDXScholar, 1995. https://pdxscholar.library.pdx.edu/open_access_etds/4911.
Full textLindström, Birgitta. "Methods for Increasing Software Testability." Thesis, University of Skövde, Department of Computer Science, 2000. http://urn.kb.se/resolve?urn=urn:nbn:se:his:diva-494.
Full textWe present a survey over current methods for improving software testability. It is a well-known fact that the cost for testing of software takes 50\% or more of the development costs. Hence, methods to improve testability, i.e. reduce the effort required for testing, have a potential to decrease the development costs. The test effort needed to reach a level of sufficient confidence for the system is dependent on the number of possible test cases, i.e., the number of possible combinations of system state and event sequences. Each such combination results in an execution order. Properties of the execution environment that affect the number of possible execution orders can therefore also affect testability. Which execution orders that are possible and not are dependent of processor scheduling and concurrency control policies. Current methods for improving testability are investigated and their properties with respect to processor scheduling and concurrency control analyzed. Especially, their impact on the number of possible test cases is discussed. The survey revealed that (i) there are few methods which explicitly address testability, and (ii) methods that concern the execution environment suggest a time-triggered design. It is previously shown that the effort to test an event-triggered real-time system is inherently higher than testing a time-triggered real-time system. Due to the dynamic nature of the event-triggered system the number of possible execution orders is high. A time-triggered design is, however, not always suitable. The survey reveals an open research area for methods concerning improvement of testability in event-triggered systems. Moreover, a survey and analysis of processor scheduling and concurrency control properties and their effect on testability is presented. Methods are classified into different categories that are shown to separate software into different levels of testability. These categories can form a basis of taxonomy for testability. Such taxonomy has a potential to be used by system designers and enable them to perform informed trade-off decisions.
Shi, Cheng. "High-level design for testability." Thesis, University of Southampton, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.336135.
Full textBhattacharyya, Arnab. "Testability of linear-invariant properties." Thesis, Massachusetts Institute of Technology, 2011. http://hdl.handle.net/1721.1/68435.
Full textCataloged from PDF version of thesis.
Includes bibliographical references (p. 75-80).
Property Testing is the study of super-efficient algorithms that solve "approximate decision problems" with high probability. More precisely, given a property P, a testing algorithm for P is a randomized algorithm that makes a small number of queries into its input and distinguishes between whether the input satisfies P or whether the input is "far" from satisfying P, where "farness" of an object from P is measured by the minimum fraction of places in its representation that needs to be modified in order for it to satisfy P. Property testing and ideas arising from it have had significant impact on complexity theory, pseudorandomness, coding theory, computational learning theory, and extremal combinatorics. In the history of the area, a particularly important role has been played by linearinvariant properties, i.e., properties of Boolean functions on the hypercube which are closed under linear transformations of the domain. Examples of such properties include linearity, homogeneousness, Reed-Muller codes, and Fourier sparsity. In this thesis, we describe a framework that can lead to a unified analysis of the testability of all linear-invariant properties, drawing on techniques from additive combinatorics and from graph theory. We also show the first nontrivial lowerbound for the query complexity of a natural testable linear-invariant property.
by Arnab Bhattacharyya.
Ph.D.
Hock, Joel M. (Joel Michael) 1977. "Exposing testability in GUI objects." Thesis, Massachusetts Institute of Technology, 2000. http://hdl.handle.net/1721.1/86608.
Full textIncludes bibliographical references (leaf 28).
by Joel M. Hock.
M.Eng.and S.B.
Kito, Nobutaka, and Naofumi Takagi. "Level-Testability of Multi-operand Adders." IEEE, 2008. http://hdl.handle.net/2237/12025.
Full textLindström, Birgitta. "Testability of Dynamic Real-Time Systems." Doctoral thesis, Linköpings universitet, ESLAB - Laboratoriet för inbyggda system, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-16486.
Full textYu, Hua-Long. "Testability-directed specification of communications software." Thesis, University of Ottawa (Canada), 1992. http://hdl.handle.net/10393/7560.
Full textKumar, Mahilchi Milir Vaseekar. "Testability considerations in delay fault testing /." Available to subscribers only, 2006. http://proquest.umi.com/pqdweb?did=1232421401&sid=5&Fmt=2&clientId=1509&RQT=309&VName=PQD.
Full textAl-Khanjari, Zuhoor Abdullah. "Investigations into testability and related concepts." Thesis, University of Liverpool, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.366661.
Full textBooks on the topic "Testability"
Weyerer, Manfred. Testability of electronic circuits. Munich: Carl Hanser Verlag, 1992.
Find full textUnited States. Environmental Protection Agency. Transportation and Climate Division. OBD readiness testability issues. 2nd ed. Washington, D.C.]: Transportation and Climate Division, Office of Transportation and Air Quality, U.S. Environmental Protection Agency, 2012.
Find full textM, Voas Jeffrey, ed. Software assessment: Reliability, safety, testability. New York: Wiley, 1995.
Find full textBeenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2365-9.
Full textHuhn, Sebastian, and Rolf Drechsler. Design for Testability, Debug and Reliability. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-69209-4.
Full textEngineering design: Reliability, maintainability, and testability. Blue Ridge Summit, PA: TAB Professional and Reference Books, 1988.
Find full textBook chapters on the topic "Testability"
Vennaro, Eric. "Testability." In iOS Development at Scale, 409–36. Berkeley, CA: Apress, 2023. http://dx.doi.org/10.1007/978-1-4842-9456-7_12.
Full textChen, Tinghuai. "Testability Design via Testability Measures." In Fault Diagnosis and Fault Tolerance, 95–118. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-77179-8_3.
Full textSayil, Selahattin. "Testability Design." In Contactless VLSI Measurement and Testing Techniques, 9–15. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-69673-7_2.
Full textDaggett, Mark E. "Improving Testability." In Expert JavaScript, 199–218. Berkeley, CA: Apress, 2013. http://dx.doi.org/10.1007/978-1-4302-6098-1_10.
Full textTurino, Jon L. "Testability Busses." In Design to Test, 225–49. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5_10.
Full textTurino, Jon L. "Testability Documentation." In Design to Test, 283–90. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-011-6044-5_14.
Full textParsa, Saeed. "Software Testability." In Software Testing Automation, 3–43. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-22057-9_1.
Full textChakradhar, Srimat T., Vishwani D. Agrawal, and Michael L. Bushneil. "Polynomial-time Testability." In Neural Models and Algorithms for Digital Testing, 123–39. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3958-2_11.
Full textKurup, Pran, and Taher Abbasi. "Design for Testability." In Logic Synthesis Using Synopsys®, 197–241. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4757-2370-0_6.
Full textShapere, Dudley. "Testability and Empiricism." In The Reality of the Unobservable, 153–64. Dordrecht: Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-015-9391-5_11.
Full textConference papers on the topic "Testability"
Voas, J., J. Payne, R. Mills, and J. McManus. "Software testability." In the 1995 Symposium. New York, New York, USA: ACM Press, 1995. http://dx.doi.org/10.1145/211782.211854.
Full textGhafari, Mohammad, Markus Eggiman, and Oscar Nierstrasz. "Testability First!" In 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM). IEEE, 2019. http://dx.doi.org/10.1109/esem.2019.8870170.
Full textHevery, Misko. "Testability explorer." In Companion to the 23rd ACM SIGPLAN conference. New York, New York, USA: ACM Press, 2008. http://dx.doi.org/10.1145/1449814.1449842.
Full textIwama, Kazuo, and Yuichi Yoshida. "Parameterized testability." In ITCS'14: Innovations in Theoretical Computer Science. New York, NY, USA: ACM, 2014. http://dx.doi.org/10.1145/2554797.2554843.
Full text"Testability for PHM." In 2017 Prognostics and System Health Management Conference (PHM-Harbin). IEEE, 2017. http://dx.doi.org/10.1109/phm.2017.8079171.
Full textDiCesare, James. "Testability Design and Testability Rating for Better Built In Test." In 2023 Annual Reliability and Maintainability Symposium (RAMS). IEEE, 2023. http://dx.doi.org/10.1109/rams51473.2023.10088236.
Full textFlynn, D. W. "Modular bus design supports on-chip testability." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950548.
Full textFU, JIANPING, MINYAN LU, SHUNKUN YANG, and ZHEN LI. "METHOD TO ANALYZING SOFTWARE TESTABILITY AFFECTING FACTORS BASED ON TESTABILITY TREE." In Proceedings of the International Conference on ICSTE 2009. WORLD SCIENTIFIC, 2009. http://dx.doi.org/10.1142/9789814289986_0038.
Full textWang, Weichao, Weiqiang Zhan, Sheng Xiong, and Hailang Xie. "Testability Study of Medium Voltage DC Switchboard Based on Testability Index." In 2019 22nd International Conference on Electrical Machines and Systems (ICEMS). IEEE, 2019. http://dx.doi.org/10.1109/icems.2019.8921561.
Full textGrist, D. A. "The cost of C-testability in terms of silicon area and design complexity." In IEE Colloquium on `Systems Design for Testability'. IEE, 1995. http://dx.doi.org/10.1049/ic:19950549.
Full textReports on the topic "Testability"
Simpson, William R., John H. Bailey, Katherine B. Barto, and Eugene Esker. Prediction and Analysis of Testability Attributes: Organizational-Level Testability Prediction. Fort Belvoir, VA: Defense Technical Information Center, February 1986. http://dx.doi.org/10.21236/ada167957.
Full textZhou, Lixin. Testability Design and Testability Analysis of a Cube Calculus Machine. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.6787.
Full textMcNamer, Michael G., and Walter W. Weber. Chip to System Testability. Fort Belvoir, VA: Defense Technical Information Center, October 1997. http://dx.doi.org/10.21236/ada342380.
Full textDebany, Jr, and Warren H. Digital Logic Testing and Testability. Fort Belvoir, VA: Defense Technical Information Center, February 1991. http://dx.doi.org/10.21236/ada234123.
Full textFlater, David, and KC Morris. Testability of product data management interfaces. Gaithersburg, MD: National Institute of Standards and Technology, 1999. http://dx.doi.org/10.6028/nist.ir.6429.
Full textPress, Ronald E., Michael E. Keller, and Gregory J. Maguire. Testability Design Rating System: Analytical Procedure. Volume 2. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada254334.
Full textSarabi, Andisheh. Logic Synthesis with High Testability for Cellular Arrays. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.6638.
Full textSantos, Andres, Ivan A. Canay, and Azeem M. Shaikh. On the testability of identification in some nonparametric models with endogeneity. Cemmap, July 2012. http://dx.doi.org/10.1920/wp.cem.2012.1812.
Full textElks, Carl R., Ashraf Tantawy, Rick Hite, Smitha Gauthem, and Athira Jayakumar. Defining and Characterizing Methods, Tools, and Computing Resources to Support Pseudo Exhaustive Testability of Software Based I&C Devices. Office of Scientific and Technical Information (OSTI), September 2018. http://dx.doi.org/10.2172/1495188.
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